Michelangelo Grosso

Master of Science

• System and device programming. A.A. 2023/24, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso
• System and device programming. A.A. 2022/23, INGEGNERIA INFORMATICA (COMPUTER ENGINEERING). Collaboratore del corso

Bachelor of Science

• Calcolatori elettronici. A.A. 2021/22, INGEGNERIA INFORMATICA. Collaboratore del corso
• Calcolatori elettronici. A.A. 2020/21, INGEGNERIA INFORMATICA. Collaboratore del corso
• Calcolatori elettronici. A.A. 2019/20, INGEGNERIA INFORMATICA. Collaboratore del corso
• Calcolatori elettronici. A.A. 2018/19, INGEGNERIA INFORMATICA. Collaboratore del corso

• Reza Khoshzaban. Programme in Ingegneria Informatica E Dei Sistemi (39^th cycle, 2023-in progress)
• Nunzio Mirabella. Programme in Ingegneria Informatica E Dei Sistemi (36^th cycle, 2020-in progress)
  Thesis: New techniques for quality and reliability enhancement in electronic systems
  
  Cybersecurity
  Cybersecurity
  Cybersecurity

• Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza ... (In stampa)
  Targeting different defect-oriented fault models in IC testing: an experimental approach. In: 26th Euromicro Conference Series on Digital System Design (DSD), Durres (ALB), 6-8 September, 2023, pp. 1-6
  Contributo in Atti di Convegno (Proceeding)
• Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza ... (2022)
  A comparative overview of ATPG flows targeting traditional and cell-aware fault models. In: 29th IEEE International Conference on Electronics Circuits and Systems (ICECS), Glasgow, 24th - 26th October 2022, pp. 1-4
  Contributo in Atti di Convegno (Proceeding)
• Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; ... (2022)
  Recent Trends and Perspectives on Defect-Oriented Testing. In: The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), Torino (Italy), 12-14 September 2022
  Contributo in Atti di Convegno (Proceeding)
• Mirabella, N.; Grosso, M.; Franchino, G.; Rinaudo, S.; Deretzis, I.; La Magna, A.; ... (2022)
  An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells. In: ELECTRONICS, vol. 11. ISSN 2079-9292
  Contributo su Rivista
• Mirabella, Nunzio; Ricci, Maurizio; Calà, Ignazio; Lanza, Roberto; Grosso, Michelangelo (2021)
  Testing single via related defectsin digital VLSI designs. In: MICROELECTRONICS RELIABILITY, vol. 120. ISSN 0026-2714
  Contributo su Rivista