TestGroup
Test digitale di sistemi, progettazione, affidabilità e verifica sono i principali temi di ricerca del TestGroup. La ricerca in questo gruppo si propone di progettare sistemi integrati facilmente verificabili, affidabili e convenienti. Vengono anche affrontati problemi relativi test off-line e on-line di sistemi integrati complessi.
Progetti e pubblicazioni
-
Selezione di progetti di ricerca finanziati
-
CAN BUS PROTOCOL FOR EXOMAR ROVER
PRINETTO PAOLO ERNESTO
2016 - 2017 (Concluso) -
SALVEREMO - SISTEMA AUTOMATICO DI LOCALIZZAZIONE E AVVISTAMENTO ESCURSIONISTI IN AREE REMOTE MONTANE
PRINETTO PAOLO ERNESTO
2014 - 2016 (Concluso) -
LIS4ALL - LINGUA ITALIANA DEI SEGNI PER L'ACCESSO SU LARGA SCALA AD INFORMAZIONI LOCALIZZATE
PRINETTO PAOLO ERNESTO
2012 - 2014 (Concluso) -
AUTHOMATIC TRANSLATION INTO SIGN LANGUAGES - ATLAS
PRINETTO PAOLO ERNESTO
2009 - 2012 (Concluso) -
DEFECT BASED TESTING AND DIAGNOSIS OF SRAM MEMORIES
PRINETTO PAOLO ERNESTO
2009 - 2011 (Concluso) -
STUDIO DI FATTIBILITA' DELL'INTEGRAZIONE DEL SOTTOSISTEMA DI CONTROLLO ACCESSI E RILEVAZIONE PRESENZE A SISTEMA DI SUPERVISIONE PER BULLDOG AUTOMATION MICRONTEL
PRINETTO PAOLO ERNESTO
2009 - 2010 (Concluso) -
ANALISI E INDIVIDUAZIONE DI UNA NUOVA PIATTAFORMA A MICROPROCESSORE (32 BIT)
PRINETTO PAOLO ERNESTO
2008 - 2008 (Concluso) -
DEFINIZIONE DI UN'ARCHITETTURA DI ELABORAZIONE RICONFIGURABILE E RIPARABILE TRAMITE AGENTI MOBILI
PRINETTO PAOLO ERNESTO
2006 - 2008 (Concluso) -
UN PROCESSO DI COLLAUDO UNIFICATO: DALLE SPECIFICHE AL TEST FUNZIONALE DI FINE PRODUZIONE
PRINETTO PAOLO ERNESTO
2001 - 2003 (Concluso) -
EUNICE-TEST EUROPEAN NETWORK FOR INITIAL AND CONTINUING EDUCATION IN VLSI/SOC ETSTING USING REMOTE ATE FACILITIES
PRINETTO PAOLO ERNESTO
2001 - 2003 (Concluso)
-
CAN BUS PROTOCOL FOR EXOMAR ROVER
-
Selezione di pubblicazioni recenti
In stampa
-
Resiliency approaches in Convolutional, Photonic, and Spiking Neural Networks
proceeding
Bosio, Alberto; Gomes, Mauricio; Pavanello, Fabio; Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto; Vatajelu, Elena Ioana
In: Titolo volume non avvalorato
IEEE
25th IEEE Latin American Test Symposium (LATS)
-
New Metrics for Spin Transfer Torque (STT) MRAM Cell Robustness Estimation
proceeding
Vatajelu, ELENA IOANA; R., Rodriguez Montañés; Indaco, Marco; M., Renovell; Prinetto, Paolo Ernesto; J., Figueras
In: Proceedings of Design, Automation & Test in Europe Conference
Design, Automation & Test in Europe Conference 2015
pp.6 -
On the impact of supply voltage variation on the statistical reliability of a Spin-transfer-torque MRAM (STT-MRAM)
proceeding
Vatajelu, ELENA IOANA; R., Rodriguez Montañés; Indaco, Marco; M., Renovell; Prinetto, Paolo Ernesto; J., Figueras
In: Proceedings of Design of Circuits and Integrated Systems
Design of Circuits and Integrated Systems (Madrid)
pp.6
-
Memory Integrity Techniques for Memory-Unsafe Languages: A Survey
articolo
EFTEKHARI MOGHADAM, Vahid; Serra, Gabriele; Aromolo, Federico; Buttazzo, Giorgio; Prinetto, Paolo
IEEE ACCESS
IEEE
pp.21 ISSN:2169-3536 DOI:10.1109/ACCESS.2024.3380478
-
Safeguarding Inter-Device Communications for Connected Systems: A Holistic Security Framework
proceeding
Eftekhari Moghadam, Vahid; Prinetto, Paolo
In: Proceedings of the 3rd International Conference on Electrical, Computer, Communications and Mechatronics Engineering (ICECCME) (2023)
IEEE
3rd International Conference on Electrical, Computer, Communications and Mechatronics Engineering (ICECCME) (2023) (Tenerife (ESP)) 19-21 July, 2023
pp.6 (pp.1-6) ISBN:9798350322989 DOI:10.1109/ICECCME57830.2023.10252717
-
ThreMA: Ontology-based Automated Threat Modelling for ICT Infrastructures
articolo
De Rosa, Fabio; Maunero, Nicolò; Prinetto, Paolo; Talentino, Federico; Trussoni, Martina
IEEE ACCESS
IEEE
Vol.10 pp.13 (pp.116514-116526) ISSN:2169-3536 DOI:10.1109/ACCESS.2022.3219063 -
Ontology for Cybersecurity Governance of ICT Systems
proceeding
De Rosa, Fabio; Maunero, Nicolò; Nicoletti, Luca; Prinetto, Paolo; Trussoni, Martina
CEUR WORKSHOP PROCEEDINGS
In: Proceedings of the Italian Conference on Cybersecurity (ITASEC22) (2022)
CEUR Workshop Proceedings
Italian Conference on Cybersecurity (ITASEC22) (2022) (Rome (ITA)) 20-23 June, 2022
Vol.3260 pp.12 (pp.52-63) ISSN:1613-0073 -
A Secure Canary-Based Hardware Approach Against ROP
proceeding
Sadeghipourrudsari, Mahboobe; Prinetto, Paolo; Nouri, Ebrahim; Sheikhshoaei, Fatemeh; Navabi, Zainalabedin
In: Title of the volume not validated
CEUR Workshop Proceedings
ITASEC'22: Italian Conference on Cybersecurity (Rome, Italy) June 20--23, 2022
Vol.6 pp.12 -
Remotizing and Virtualizing Chips and Circuits for Hardware-based Capture-the-Flag Challenges
proceeding
Roascio, Gianluca; Cerini, Samuele Yves; Prinetto, Paolo
In: Proceedings of the 2022 IEEE European Symposium on Security and Privacy Workshops (EuroS&PW)
Institute of Electrical and Electronics Engineers Inc.
2022 IEEE European Symposium on Security and Privacy Workshops (EuroS&PW) (Genoa (ITA)) 06-10 June 2022
pp.9 (pp.477-485) ISBN:9781665495608 DOI:10.1109/EuroSPW55150.2022.00057 -
Real-Time Control-Flow Integrity for Multicore Mixed-Criticality IoT Systems
proceeding
Eftekhari Moghadam, Vahid; Prinetto, Paolo; Roascio, Gianluca
In: Proceedings of the 2022 IEEE European Test Symposium (ETS)
Institute of Electrical and Electronics Engineers Inc.
2022 IEEE European Test Symposium (ETS) (Barcelona (ESP)) 23-27 May 2022
pp.4 (pp.1-4) ISBN:9781665467063 DOI:10.1109/ETS54262.2022.9810441
-
Control-flow integrity for real-time operating systems: open issues and challenges
proceeding
Eftekhari Moghadam, Vahid; Meloni, Marco; Prinetto, Paolo
In: 2021 IEEE East-West Design & Test Symposium (EWDTS) Proceedings
Institute of Electrical and Electronics Engineers Inc.
19th IEEE EAST-WEST DESIGN & TEST SYMPOSIUM (EWDTS-2021) (Batumi, Georgia) September 10-13. 2021
pp.6 (pp.1-6) DOI:10.1109/EWDTS52692.2021.9581003 -
Prolepsis: binary analysis and instrumentation of iot software for control-flow integrity
proceeding
Forte, Valentina; Maunero, Nicolò; Prinetto, Paolo; Roascio, Gianluca
In: 2021 IEEE International Conference on Electrical, Computer, Communications and Mechatronics Engineering (ICECCME) Proceedings
Institute of Electrical and Electronics Engineers Inc.
IEEE International Conference on Electrical, Computer, Communications and Mechatronics Engineering (ICECCME) (Mauritius) October 7-8, Mauritius
pp.6 (pp.1-6) ISBN:9781665412629 DOI:10.1109/ICECCME52200.2021.9591080 -
Aftab: a risc-v implementation with configurable gateways for security
proceeding
Rajabalipanah, Maryam; Sadeghipourrudsari, Mahboobe; Jahanpeima, Zahra; Roascio, Gianluca; Prinetto, Paolo; Navabi, Zainalabedin
In: 2021 IEEE East-West Design & Test Symposium (EWDTS) Proceedings
Institute of Electrical and Electronics Engineers Inc.
19th IEEE East-West Design & Test Symposium (EWDTS-2021) (Batumi, Georgia) September 10-13, 2021
pp.6 (pp.1-6) ISBN:9781665445030 DOI:10.1109/EWDTS52692.2021.9580979 -
Paideusis: a remote hybrid cyber range for hardware, network, and iot security training
proceeding
Berra, Giulio; Ferraro, Gaspare; Fornero, Matteo; Maunero, Nicolò; Prinetto, Paolo; Roascio, Gianluca
CEUR WORKSHOP PROCEEDINGS
In: Proceedings of the Italian Conference on Cybersecurity (ITASEC 2021)
CEUR-WS
ITASEC 2021 - Italian Conference on Cybersecurity 2021 (All Digital Event) April 7-9, 2021
Vol.2940 pp.14 (pp.284-297) ISSN:1613-0073
-
SEkey: a distributed hardware-based key management system
proceeding
Fornero, Matteo; Maunero, Nicolò; Prinetto, Paolo; Varriale, Antonio
In: 2020 IEEE East-West Design & Test Symposium (EWDTS)
Institute of Electrical and Electronics Engineers Inc.
2020 IEEE East-West Design & Test Symposium (EWDTS) (Varna (BG)) September 4-7, 2020
pp.7 (pp.1-7) ISBN:9781728198989 DOI:10.1109/EWDTS50664.2020.9225107 -
Hardware-based capture-the-flag challenges
proceeding
Prinetto, Paolo; Roascio, Gianluca; Varriale, Antonio
In: 2020 IEEE East-West Design & Test Symposium (EWDTS) Proceedings
IEEE
18th IEEE East-West Design & Test Symposium (EWDTS-2020) (Varna (BG)) 04-07 September 2020
pp.8 (pp.1-8) ISBN:9781728198996 DOI:10.1109/EWDTS50664.2020.9224932 -
A FPGA-based control-flow integrity solution for securing bare-metal embedded systems
proceeding
Maunero, N.; Prinetto, P.; Roascio, G.; Varriale, A.
In: Proceedings - 2020 15th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2020
Institute of Electrical and Electronics Engineers Inc.
15th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2020 (Marrakech (MA)) 2020
pp.10 (pp.1-10) ISBN:9781728154268 DOI:10.1109/DTIS48698.2020.9081314 -
EVA: a hybrid cyber range
proceeding
Ahmad, Shabeer; Maunero, Nicolò; Prinetto, Paolo Ernesto
CEUR WORKSHOP PROCEEDINGS
In: Proceedings of the Fourth Italian Conference on Cyber Security
CEUR Workshop Proceedings
ITASEC 2020 - Italian Conference on Cyber Security (Ancona (IT)) February 4th-7th, 2020
Vol.Vol-2597 pp.12 (pp.12-23) ISSN:1613-0073 -
Hardware security, vulnerabilities, and attacks: a comprehensive taxonomy
proceeding
Prinetto, Paolo; Roascio, Gianluca
CEUR WORKSHOP PROCEEDINGS
In: Proceedings of the Fourth Italian Conference on Cyber Security
CEUR Workshop Proceedings
ITASEC20 - Italian Conference on Cybersecurity (Ancona (ITA)) February 4th-7th, 2020
Vol.Vol-2597 pp.13 (pp.177-189) ISSN:1613-0073
-
CFI: control flow integrity or control flow interruption?
proceeding
Maunero, N.; Prinetto, P.; Roascio, G.
In: 2019 IEEE East-West Design and Test Symposium, EWDTS 2019
Institute of Electrical and Electronics Engineers Inc.
2019 IEEE East-West Design and Test Symposium, EWDTS 2019 (Batumi (GE)) 2019
pp.6 (pp.1-6) ISBN:9781728110035 DOI:10.1109/EWDTS.2019.8884464 -
Synetgy: Algorithm-hardware Co-design for ConvNet Accelerators on Embedded FPGAs
proceeding
Yang, Yifan; Huang, Qijing; Wu, Bichen; Zhang, Tianjun; Ma, Liang; Gambardella, Giulio; Blott, Michaela; Lavagno, Luciano; Vissers, Kees; Wawrzynek, John; Keutzer, Kurt
In: Machine Learning
Association for Computing Machinery
27th ACM/SIGDA International Symposium on Field-Programmable Gate Arrays
pp.10 (pp.23-32) ISBN:9781450361378 DOI:10.1145/3289602.3293902
-
Securing bitstream integrity, confidentiality and authenticity in reconfigurable mobile heterogeneous systems
proceeding
Carelli, Alberto; Cristofanini, Carlo Alberto; Vallero, Alessandro; Basile, Cataldo; Prinetto, Paolo; Di Carlo, Stefano
In: Proceedings of the 2018 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR 2018)
Institute of Electrical and Electronics Engineers Inc. (STATI UNITI D'AMERICA)
IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR 2018) (Cluj-Napoca (Romania)) 24-26 May 2018
pp.6 (pp.1-6) ISBN:9781538622049 DOI:10.1109/AQTR.2018.8402795
-
Side-channel analysis of SEcube™ platform
proceeding
Bollo, Matteo; Carelli, Alberto; Di Carlo, Stefano; Prinetto, Paolo
In: Proceedings of the 2017 IEEE East-West Design & Test Symposium (EWDTS)
IEEE (STATI UNITI D'AMERICA)
2017 IEEE East-West Design & Test Symposium (EWDTS) (Novi Sad, (Serbia)) 29 Sept.-2 Oct. 2017
pp.5 (pp.1-5) ISBN:9781538632994 DOI:10.1109/EWDTS.2017.8110067 -
Scan chain encryption for the test, diagnosis and debug of secure circuits
proceeding
Da Silva, Mathieu; Flottes, Marie Lise; DI NATALE, Giorgio; Rouzeyre, Bruno; Prinetto, Paolo Ernesto; Restifo, Marco
In: Proceedings of the European Test Workshop
Institute of Electrical and Electronics Engineers Inc. (STATI UNITI D'AMERICA)
22nd IEEE European Test Symposium, ETS 2017 (cyp) 2017
pp.6 (pp.1-6) ISBN:9781509054572 DOI:10.1109/ETS.2017.7968248
-
Towards Model Driven Design of Crypto Primitives and Processes
proceeding
Carelli, Alberto; Di Natale, Giorgio; Trotta, Pascal; Margaria, TIZIANA MARIA
In: Proceedings of The 2016 World Congress in Computer Science, Computer Engineering, and Applied Computing
CSREA Press
SAM'16 - The 2016 International Conference on Security and Management (Las Vegas (USA)) Luglio 2016
Vol.1 pp.7 (pp.152-158) ISBN:9781601324450 -
SEcube™: Data at Rest and Data in Motion Protection
proceeding
Varriale, Antonio; Prinetto, Paolo Ernesto; Carelli, Alberto; Trotta, Pascal
In: Proceedings of The 2016 World Congress in Computer Science, Computer Engineering, and Applied Computing
CSREA Press
SAM'16 - The 2016 International Conference on Security and Management (Las Vegas (USA))
Vol.1 pp.7 (pp.138-144) ISBN:9781601324450 -
Model driven design of secure properties for vision-based applications: A case study
proceeding
AIRO' FARULLA, Giuseppe; Indaco, Marco; Legay, Axel; Margaria, Tiziana
In: Proceedings of the International Conference on Security and Management (SAM), The Steering Committee of The World Congress in Computer Science, Computer Engineering and Applied Computing
The 2016 International Conference on Security and Management (SAM'16) (Las Vegas, USA) 25-28 July 2016
Vol.1 pp.9 (pp.159-167) ISBN:9781601324450 -
A Low-cost Open Source 3D-Printable Dexterous Anthropomorphic Robotic Hand with a Parallel Spherical Joint Wrist for Sign Languages Reproduction
articolo
Bulgarelli, Andrea; Toscana, Giorgio; Russo, LUDOVICO ORLANDO; AIRO' FARULLA, Giuseppe; Indaco, Marco; Bona, Basilio
INTERNATIONAL JOURNAL OF ADVANCED ROBOTIC SYSTEMS
INTECH
Vol.13 pp.12 ISSN:1729-8806 DOI:10.5772/64113 -
Towards a Highly Reliable SRAM-based PUFs
proceeding
Vatajelu, ELENA IOANA; Di Natale, Giorgio; Prinetto, Paolo Ernesto
In: Proceedings of 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE)
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE)
pp.4 (pp.273-276) ISBN:9783981537079 DOI:10.3850/9783981537079_0753 -
Security Primitives (PUF and TRNG) with STT-MRAM
proceeding
Vatajelu, ELENA IOANA; Di Natale, G.; Prinetto, Paolo Ernesto
2016 IEEE 34th VLSI Test Symposium (VTS)
In: Proceedings of 2016 IEEE 34th VLSI Test Symposium (VTS)
IEEE
2016 IEEE 34th VLSI Test Symposium (VTS)
Vol.2016 IEEE 34th VLSI Test Symposium (VTS) pp.4 (pp.1-4) ISBN:9781467384544 DOI:10.1109/VTS.2016.7477292 -
STT-MRAM-based PUF architecture exploiting magnetic tunnel junction fabrication-induced variability
articolo
Vatajelu, ELENA IOANA; Di Natale, Giorgio; Barbareschi, Mario; Torres, Lionel; Indaco, Marco; Prinetto, Paolo Ernesto
ACM JOURNAL ON EMERGING TECHNOLOGIES IN COMPUTING SYSTEMS
Association for Computing Machinery
Vol.13 pp.21 (pp.1-21) ISSN:1550-4832 DOI:10.1145/2790302 -
Enhancing Real-time Embedded Image Processing Robustness on Reconfigurable Devices for Critical Applications
tesi dottorato
Trotta, Pascal
Politecnico di Torino
pp.184 DOI:10.6092/polito/porto/2641174 -
Vision-based pose estimation for robot-mediated hand telerehabilitation
articolo
AIRO' FARULLA, Giuseppe; Pianu, Daniele; Cempini, Marco; Cortese, Mario; Russo, LUDOVICO ORLANDO; Indaco, Marco; Nerino, Roberto; Chimienti, Antonio; Oddo, Calogero M.; Vitiello, Nicola
SENSORS
MDPI AG
Vol.16 pp.16 (pp.208-223) ISSN:1424-8220 DOI:10.3390/s16020208
-
Read/Write Robustness Estimation Metrics for Spin Transfer Torque (STT) MRAM Cell
proceeding
Vatajelu, ELENA IOANA; Rodriguez Montañés, Rosa; Indaco, Marco; Renovell, Michel; Prinetto, Paolo Ernesto; Figueras, Joan
In: Proceedings of 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE)
2015 Design, Automation & Test in Europe Conference & Exhibition (DATE)
pp.6 (pp.447-452) ISBN:9783981537048 DOI:10.7873/DATE.2015.0822 -
STT-MRAM cell reliability evaluation under process, voltage and temperature (PVT) variations
proceeding
Vatajelu, ELENA IOANA; Rodriguez Montanes, Rosa; Indaco, Marco; Prinetto, Paolo Ernesto; Figueras, Joan
In: Proceedings - 2015 10th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2015
Institute of Electrical and Electronics Engineers Inc.
2015 10th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2015 (ita) 2015
pp.6 (pp.1-6) ISBN:9781479919994 DOI:10.1109/DTIS.2015.7127377 -
STT-MRAM-based strong PUF architecture
proceeding
Vatajelu, ELENA IOANA; Di Natale, Giorgio; Torres, Lionel; Prinetto, Paolo Ernesto
In: Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI
IEEE Computer Society
IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2015 (fra) 2015
Vol.07-10- pp.6 (pp.467-472) ISBN:9781479987184 DOI:10.1109/ISVLSI.2015.128 -
PORTING LEON3FT/GRLIB TO 4th GENERATION FLASH-BASED DEVICES
proceeding
Andersson, Jan; Habinc, Sandi; Prinetto, Paolo Ernesto; Trotta, Pascal
In: DASIA 2015: The International Space System Engineering Conference
DASIA 2015: The International Space System Engineering Conference (Barcelona) 19-21 May 2015
pp.4 -
An efficient many-core architecture for Elliptic Curve Cryptography security assessment
proceeding
Indaco, Marco; Lauri, Fabio; Miele, Andrea; Trotta, Pascal
In: Proceedings of the 25th International Conference on Field Programmable Logic and Applications (FPL)
25th International Conference on Field Programmable Logic and Applications (FPL) (London (UK)) 2-4 September 2015
pp.6 (pp.1-6) ISBN:9780993428005 DOI:10.1109/FPL.2015.7293950 -
A portable open-source controller for safe Dynamic Partial Reconfiguration on Xilinx FPGAs
proceeding
DI CARLO, Stefano; Prinetto, Paolo Ernesto; Trotta, Pascal; Andersson, Jan
In: Proceedings of the 25th International Conference on Field Programmable Logic and Applications (FPL)
IEEE (STATI UNITI D'AMERICA)
25th International Conference on Field Programmable Logic and Applications (FPL) (London, UK) 2-4 Sept. 2015
pp.4 (pp.1-4) ISBN:9780993428005 DOI:10.1109/FPL.2015.7294002 -
Power-aware voltage tuning for STT-MRAM reliability
proceeding
Vatajelu, ELENA IOANA; Rodriguez Montanes, R.; DI CARLO, Stefano; Indaco, Marco; Renovell, M.; Prinetto, Paolo Ernesto; Figueras, J.
In: Proceedings of the 20th IEEE European Test Symposium (ETS)
IEEE Computer Society (STATI UNITI D'AMERICA)
20th IEEE European Test Symposium (ETS) (Cluj-Napoca, RO) 25-29 May 2015
pp.6 (pp.1-6) ISBN:9781479976034 DOI:10.1109/ETS.2015.7138748 -
SSDExplorer: A Virtual Platform for Performance/Reliability-Oriented Fine-Grained Design Space Exploration of Solid State Drives
articolo
Zuolo, Lorenzo; Zambelli, Cristian; Micheloni, Rino; Indaco, Marco; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Bertozzi, Davide; Olivo, Piero
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
IEEE
Vol.34 pp.12 (pp.1627-1638) ISSN:0278-0070 DOI:10.1109/TCAD.2015.2422834 -
A cloud robotics system for telepresence enabling mobility impaired people to enjoy the whole museum experience
proceeding
KAOUK NG, MIGUEL EFRAIN; Primatesta, Stefano; Giuliano, Luca; Lupetti, MARIA LUCE; Russo, LUDOVICO ORLANDO; AIRO' FARULLA, Giuseppe; Indaco, Marco; Rosa, Stefano; Germak, Claudio; Bona, Basilio
In: 2015 10th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
IEEE
Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2015 10th International Conference on (Naples (IT)) 21-23 April 2015
pp.6 (pp.1-6) ISBN:9781479919994 DOI:10.1109/DTIS.2015.7127391 -
ORIENTOMA: A novel platform for autonomous and safe navigation for blind and visually impaired
proceeding
AIRO' FARULLA, Giuseppe; Russo, LUDOVICO ORLANDO; Rosa, Stefano; Indaco, Marco
In: 2015 10th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
IEEE
Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2015 10th International Conference on (Naples (IT)) 21-23 April 2015
pp.6 (pp.1-6) ISBN:9781479919994 DOI:10.1109/DTIS.2015.7127390 -
A Novel Architectural Pattern to Support the Development of Human-Robot Interaction (HRI) Systems Integrating Haptic Interfaces and Gesture Recognition Algorithms
proceeding
AIRO' FARULLA, Giuseppe; Russo, LUDOVICO ORLANDO; Gallifuoco, Vincenzo; Indaco, Marco
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
In: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
IEEE
VLSI (ISVLSI), 2015 IEEE Computer Society Annual Symposium on (Montpellier (Fr)) 8-10 July 2015
pp.6 (pp.386-391) ISSN:1063-8210 ISBN:9781479987184 DOI:10.1109/ISVLSI.2015.112 -
Dynamic Partial Reconfiguration for Dependable Systems
tesi dottorato
Gambardella, Giulio
Politecnico di Torino
DOI:10.6092/polito/porto/2617020 -
High-performance hardware accelerators for image processing in space applications
tesi dottorato
Rolfo, Daniele
Politecnico di Torino
pp.228 DOI:10.6092/polito/porto/2616951 -
PARLOMA – A Novel Human-Robot Interaction System for Deaf-blind Remote Communication
articolo
Russo, LUDOVICO ORLANDO; AIRO' FARULLA, Giuseppe; Pianu, D.; Salgarella, A. R.; Controzzi, M.; Cipriani, C.; Oddo, C. M.; Geraci, C.; Rosa, Stefano; Indaco, Marco
INTERNATIONAL JOURNAL OF ADVANCED ROBOTIC SYSTEMS
INTECH
Vol.12 pp.13 (pp.1-13) ISSN:1729-8806 DOI:10.5772/60416 -
STT MRAM-Based PUFs
proceeding
Vatajelu, ELENA IOANA; G., Di Natale; Indaco, Marco; Prinetto, Paolo Ernesto
In: Proceedings of Design, Automation and Test in Europe
IEEE
Design, Automation and Test in Europe
pp.4 (pp.872-875) DOI:10.7873/DATE.2015.0505 -
Nonvolatile Memories: Present and Future Challenges
proceeding
Vatajelu, ELENA IOANA; H., Aziza; C., Zambelli
In: Proceedings of International Test Symposium
IEEE
International Test Symposium 2014
pp.6 -
SATTA: a Self-Adaptive Temperature-based TDF awareness methodology for dynamically reconfigurable FPGAs
articolo
DI CARLO, Stefano; Gambardella, Giulio; Prinetto, Paolo Ernesto; Rolfo, Daniele; Trotta, Pascal
ACM TRANSACTIONS ON RECONFIGURABLE TECHNOLOGY AND SYSTEMS
ACM
Vol.8 pp.22 (pp.1-22) ISSN:1936-7406 DOI:10.1145/2659001 -
SA-FEMIP: A Self-Adaptive Features Extractor and Matcher IP-Core Based on Partially Reconfigurable FPGAs for Space Applications
articolo
DI CARLO, Stefano; Gambardella, Giulio; Prinetto, Paolo Ernesto; Rolfo, Daniele; Trotta, Pascal
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
IEEE / Institute of Electrical and Electronics Engineers
Vol.23 pp.10 (pp.2198-2208) ISSN:1063-8210 DOI:10.1109/TVLSI.2014.2357181 -
Usability of Online Assistance From Semi-literate Users’ Perspective
articolo
Ahmad, Nadeem; Shoaib, Umar; Prinetto, Paolo Ernesto
INTERNATIONAL JOURNAL OF HUMAN-COMPUTER INTERACTION
Taylor Francis Online
Vol.31 pp.10 (pp.55-64) ISSN:1044-7318 DOI:10.1080/10447318.2014.925772 -
Performance and Reliability Analysis of Cross-Layer Optimizations of NAND Flash Controllers
articolo
Bertozzi, D.; DI CARLO, Stefano; Galfano, S.; Indaco, M.; O. l. i. v. o., P.; Prinetto, Paolo Ernesto; Zambelli, C.
ACM TRANSACTIONS ON EMBEDDED COMPUTING SYSTEMS
ACM
Vol.14 pp.24 (pp.1-24) ISSN:1539-9087 DOI:10.1145/2629562
-
Integration of STT-MRAM model into CACTI simulator
proceeding
Indaco, M.; DI CARLO, Stefano; Vatajelu, E. I.; Prinetto, Paolo Ernesto; Arcaro, S.; Pala, D.
In: Proceedings of the 9th IEEE International Design and Test Symposium
IEEE (STATI UNITI D'AMERICA)
9th IEEE International Design and Test Symposium (IDT) (Algiers, DZ) 16-18 Dec. 2014
pp.6 (pp.67-72) ISBN:9781479982004 DOI:10.1109/IDT.2014.7038589 -
On the impact of process variability and aging on the reliability of emerging memories (Embedded tutorial)2014 19th IEEE European Test Symposium (ETS)
proceeding
Indaco, Marco; Prinetto, Paolo Ernesto; Vatajelu, ELENA IOANA
In: 2014 19th IEEE European Test Symposium (ETS)
IEEE
European Test Symposium 2014
pp.10 (pp.1-10) DOI:10.1109/ETS.2014.6847813 -
Service Oriented Non-Volatile Memories
tesi dottorato
Indaco, Marco
Politecnico di Torino
pp.173 DOI:10.6092/polito/porto/2572951 -
A novel approach for video-based absolute navigation in space exploration missions
proceeding
Tadewos Getahun, T.; Prinetto, Paolo Ernesto; Rolfo, Daniele; Trotta, Pascal; Lanza, P.; Martelli, A.; Tramutola, A.
In: Proceedings of the DASIA 2014 - DAta Systems In Aerospace - Conference
ESA Publications Division (PAESI BASSI)
Data Systems in Aerospace 2014 (Warsaw, Poland) 3-5 June, 2014
pp.5 -
A cloud-based Cyber-Physical System for environmental monitoring
proceeding
Sanislav, T.; Mois, G.; Folea, S.; Miclea, L.; Gambardella, Giulio; Prinetto, Paolo Ernesto
In: Proceedings of the 3rd Mediterranean Conference on Embedded Computing (MECO) 2014
IEEE (STATI UNITI D'AMERICA)
3rd Mediterranean Conference on Embedded Computing (MECO) (Budva, ME) 15-19 June 2014
pp.4 (pp.6-9) DOI:10.1109/MECO.2014.6862654 -
Real-time single camera hand gesture recognition system for remote deaf-blind communication
proceeding
AIRO' FARULLA, Giuseppe; Russo, LUDOVICO ORLANDO; Chiara, Pintor; Daniele, Pianu; Giorgio, Micotti; Alice Rita, Salgarella; Domenico, Camboni; Marco, Controzzi; Christian, Cipriani; Calogero Maria, Oddo; Rosa, Stefano; Indaco, Marco
LECTURE NOTES IN COMPUTER SCIENCE
In: 1st International Conference on Augmented and Virtual Reality - Salento AVR 2014
Springer
1st International Conference on Augmented and Virtual Reality - Salento AVR 2014 (Lecce) 17-20 September 2014
Vol.1 pp.18 (pp.35-52) ISSN:0302-9743 DOI:10.1007/978-3-319-13969-2_3 -
ABLUR: An FPGA-based adaptive deblurring core for real-time applications
proceeding
AIRO' FARULLA, Giuseppe; Indaco, Marco; Prinetto, Paolo Ernesto; Rolfo, Daniele; Trotta, Pascal
In: Adaptive Hardware and Systems (AHS), 2014 NASA/ESA Conference on
IEEE / Institute of Electrical and Electronics Engineers
Adaptive Hardware and Systems (AHS), 2014 NASA/ESA Conference on (Leicester) 14-17 July 2014
pp.8 (pp.104-111) DOI:10.1109/AHS.2014.6880165 -
Evaluation of image deblurring algorithms for real-time applications
proceeding
AIRO' FARULLA, Giuseppe; Indaco, Marco; Rolfo, Daniele; Russo, LUDOVICO ORLANDO; Trotta, Pascal
In: Design & Technology of Integrated Systems In Nanoscale Era (DTIS), 2014 9th IEEE International Conference On
IEEE
Design & Technology of Integrated Systems In Nanoscale Era (DTIS), 2014 9th IEEE International Conference On (Santorini) 6-8 May 2014
pp.6 (pp.1-6) DOI:10.1109/DTIS.2014.6850668 -
An improved fault mitigation strategy for CUDA Fermi GPUs
proceeding
DI CARLO, Stefano; Gambardella, G.; Martella, I.; Prinetto, Paolo Ernesto; Rolfo, D.; Trotta, P.
In: Proceedings of the Dependable GPU Computing workshop 2014
Dependable GPU Computing workshop 2014 (Dresden, DE) 28 March 2014
pp.6 (pp.1-6) -
Reliability Estimation at Block-Level Granularity of Spin-Transfer-Torque MRAMs
proceeding
Vatajelu, E. I.; Indaco, M.; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Rodriguez Montañés, R.; Figueras, J.
In: Proceedings of the 27th IEEE Defect and Fault Tolerance in VLSI and Nanotechnology Systems Symposium (DFTS) 2014
IEEE (STATI UNITI D'AMERICA)
27th IEEE Defect and Fault Tolerance in VLSI and Nanotechnology Systems Symposium (DFTS) (Amsterdam, NL) 1-3 Oct. 2014
pp.6 (pp.75-80) ISBN:9781479961559 DOI:10.1109/DFT.2014.6962093 -
A Fault Injection Methodology and Infrastructure for Fast Single Event Upsets Emulation on Xilinx SRAM-based FPGAs
proceeding
DI CARLO, Stefano; Prinetto, Paolo Ernesto; Rolfo, D.; Trotta, P.
In: Proceedings of the 27th IEEE Defect and Fault Tolerance in VLSI and Nanotechnology Systems Symposium (DFTS) 2014
IEEE (STATI UNITI D'AMERICA)
27th IEEE Defect and Fault Tolerance in VLSI and Nanotechnology Systems Symposium (DFTS) (Amsterdam, NL) 1-3 Oct. 2014
pp.6 (pp.159-164) ISBN:9781479961559 DOI:10.1109/DFT.2014.6962073 -
On Enhancing Fault Injection's Capabilities and Performances for Safety Critical Systems
proceeding
DI CARLO, Stefano; Gambardella, G.; Prinetto, Paolo Ernesto; Reichenbach, F.; Lokstad, T.; Rafiq, G.
In: Proceedings of the 17th Euromicro Conference on Digital System Design (DSD) 2014
IEEE (STATI UNITI D'AMERICA)
17th Euromicro Conference on Digital System Design (DSD) (Verona, IT) 27-29 Aug. 2014
pp.8 (pp.583-590) ISBN:9781479957934 DOI:10.1109/DSD.2014.12 -
A novel algorithm and hardware architecture for fast video-based shape reconstruction of space debris
articolo
DI CARLO, Stefano; Prinetto, Paolo Ernesto; Rolfo, D.; Sansonne, N.; Trotta, P.
EURASIP JOURNAL ON ADVANCES IN SIGNAL PROCESSING
Springer
Vol.2014:147 pp.19 (pp.1-19) ISSN:1687-6180 DOI:10.1186/1687-6180-2014-147 -
A novel methodology to increase fault tolerance in autonomous FPGA-based systems
proceeding
DI CARLO, Stefano; Gambardella, Giulio; Prinetto, Paolo Ernesto; Rolfo, Daniele; Trotta, Pascal; Vallero, Alessandro
In: Proceedings of the IEEE 20th International On-Line Testing Symposium (IOLTS) 2014
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 20th International On-Line Testing Symposium (IOLTS) (Platja d'Aro, Girona (ES)) 7-9 July 2014
pp.6 (pp.87-92) ISBN:9781479953240 DOI:10.1109/IOLTS.2014.6873677 -
FLARES: an aging aware algorithm to autonomously adapt the error correction capability in NAND Flash memories
articolo
DI CARLO, Stefano; Galfano, Salvatore; Indaco, Marco; Prinetto, Paolo Ernesto; Bertozzi, D.; Olivo, P.; Zambelli, C.
ACM TRANSACTIONS ON ARCHITECTURE AND CODE OPTIMIZATION
ACM
Vol.11 pp.25 (pp.26:1-26:25) ISSN:1544-3566 DOI:10.1145/2631919 -
SSDExplorer: a Virtual Platform for Fine-Grained Design Space Exploration of Solid State Drives
proceeding
Zuolo, L.; Zambelli, C.; Micheloni, R.; Galfano, Salvatore; Indaco, Marco; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Olivo, P.; Bertozzi, D.
In: Proceedings of Design, Automation and Test in Europe, Conference and Exhibition (DATE)
IEEE (STATI UNITI D'AMERICA)
Design, Automation and Test in Europe, Conference and Exhibition (DATE) (Dresden, DE) 24-28 Mar. 2014
pp.6 (pp.1-6) DOI:10.7873/DATE.2014.297 -
Integrating MultiWordNet with Italian Sign Language lexical resources
articolo
Shoaib, Umar; Ahmad, Nadeem; Prinetto, Paolo Ernesto; Tiotto, Gabriele
EXPERT SYSTEMS WITH APPLICATIONS
ELSEVIER
Vol.41 pp.9 (pp.2300-2308) ISSN:0957-4174 DOI:10.1016/j.eswa.2013.09.027
-
Blurring Prediction in Monocular SLAM
proceeding
Russo, LUDOVICO ORLANDO; AIRO' FARULLA, Giuseppe; Indaco, Marco; Rosa, Stefano; Rolfo, Daniele; Bona, Basilio
In: Proceedings of the 8th International Design & Test Symposium (IDT) 2013
8th IEEE International Design & Test Symposium 2013 (Marrakesh, Morocco) December 16-18, 2013
DOI:10.1109/IDT.2013.6727095 -
Stereo vision system for capture and removal of space debris
proceeding
Rosso, Francesco; Gallo, F.; Allasia, W.; Licata, E.; Prinetto, Paolo Ernesto; Rolfo, Daniele; Trotta, Pascal; Favetto, Alain; Paleari, M.; Ariano, Paolo
In: Titolo volume non avvalorato
5th European Conference for Aeronautics and Space Sciences EUCASS 2013 (Munich, Germany) 1-5 July 2013
pp.9 -
Fault mitigation strategies for CUDA GPUs
proceeding
DI CARLO, Stefano; Gambardella, G.; Martella, I.; Prinetto, Paolo Ernesto; Rolfo, D.; Trotta, P.
In: IEEE International Test Conference (ITC) 2013
IEEE (STATI UNITI D'AMERICA)
IEEE International Test Conference (ITC) (Anaheim (CA), USA) 6-13 Sept., 2013
pp.8 (pp.1-8) ISBN:9781479908592 DOI:10.1109/TEST.2013.6651908 -
FEMIP: A high performance FPGA-based features extractor & matcher for space applications
proceeding
DI CARLO, Stefano; Gambardella, Giulio; Prinetto, Paolo Ernesto; Rolfo, Daniele; Trotta, Pascal; Lanza, L.
In: 23rd International Conference on Field programmable Logic and Applications (FPL) 2013
IEEE (STATI UNITI D'AMERICA)
23rd International Conference on Field programmable Logic and Applications (FPL) (Porto, PT) 2-4 Sept., 2013
pp.4 (pp.1-4) ISBN:9781479900046 DOI:10.1109/FPL.2013.6645606 -
Dependable Dynamic Partial Reconfiguration with minimal area & time overheads on Xilinx FPGAS
proceeding
DI CARLO, Stefano; Gambardella, Giulio; Indaco, Marco; Prinetto, Paolo Ernesto; Rolfo, Daniele; Trotta, Pascal
In: 23rd International Conference on Field programmable Logic and Applications (FPL) 2013
IEEE (STATI UNITI D'AMERICA)
23rd International Conference on Field programmable Logic and Applications (FPL) (Porto, PT) 2-4 Sept., 2013
pp.4 (pp.1-4) ISBN:9781479900046 DOI:10.1109/FPL.2013.6645549 -
AIDI: An adaptive image denoising FPGA-based IP-core for real-time applications
proceeding
DI CARLO, Stefano; Prinetto, Paolo Ernesto; Rolfo, Daniele; Trotta, Pascal
In: NASA/ESA Conference on Adaptive Hardware and Systems (AHS) 2013
IEEE (STATI UNITI D'AMERICA)
NASA/ESA Conference on Adaptive Hardware and Systems (AHS) (Torino, IT) 24-27 June, 2013
pp.8 (pp.99-106) ISBN:9781467363839 DOI:10.1109/AHS.2013.6604232 -
Increasing the robustness of CUDA Fermi GPU-based systems
proceeding
DI CARLO, Stefano; Gambardella, G.; Indaco, M.; Martella, I.; Prinetto, Paolo Ernesto; Rolfo, D.; Trotta, P.
In: Proceedings of the IEEE 19th International On-Line Testing Symposium (IOLTS) 2013
IEEE (STATI UNITI D'AMERICA)
IEEE 19th International On-Line Testing Symposium (IOLTS) (Crete, GR) 8-10 July, 2013
pp.2 (pp.234-235) ISBN:9781479906642 DOI:10.1109/IOLTS.2013.6604088 -
Advanced image processing in space applications: the new trend to increase the success rate of exploration space missions
proceeding
Lanza, P.; Martelli, A.; Prinetto, Paolo Ernesto; Rolfo, Daniele; Tramutola, A.; Trotta, Pascal
In: Titolo volume non avvalorato
5th European Conference for Aeronautics and Space Sciences (EUCASS 2013) 1-5 July 2013
pp.12 -
FPGA-based IP-cores library for advanced image processing in space applications
proceeding
Lanza, P.; Martelli, A.; Prinetto, Paolo Ernesto; Rolfo, Daniele; Tramutola, A.; Trotta, Pascal
In: Proceedings of the DASIA 2013 - DAta Systems In Aerospace - Conference
ESA Publications Division (PAESI BASSI)
Data Systems in Aerospace 2013 (Porto, Portugal) 14-16 May, 2013
pp.8 -
Stereo vision system for capture and removal of space debris
proceeding
Walter, Allasia; Ariano, Paolo; Favetto, Alain; Francesco, Gallo; Enrico, Licata; Marco, Paleari; Prinetto, Paolo Ernesto; Rolfo, Daniele; Francesco, Rosso; Trotta, Pascal
In: IEEE Conference on Design and Architectures for Signal and Image Processing (DASIP) 2013
IEEE (STATI UNITI D'AMERICA)
IEEE Conference on Design and Architectures for Signal and Image Processing (DASIP) (Cagliari (IT)) 08-13 Oct., 2013
pp.7 (pp.201-207) -
Ef3S: An evaluation framework for flash-based systems
proceeding
DI CARLO, Stefano; Galfano, Salvatore; Indaco, Marco; Prinetto, Paolo Ernesto
In: IEEE 19th International On-Line Testing Symposium (IOLTS) 2013
IEEE (STATI UNITI D'AMERICA)
IEEE 19th International On-Line Testing Symposium (IOLTS) (Crete, GR) 8-10 July, 2013
pp.6 (pp.199-204) ISBN:9781479906642 DOI:10.1109/IOLTS.2013.6604079 -
A software-based self test of CUDA Fermi GPUs
proceeding
DI CARLO, Stefano; Gambardella, G.; Indaco, M.; Martella, I.; Prinetto, Paolo Ernesto; Rolfo, D.; Trotta, P.
In: Proceedings of the IEEE 18th European Test Symposium (ETS)
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 18th European Test Symposium (ETS) (Avignon (F)) 27-30 May 2013
pp.6 (pp.1-6) DOI:10.1109/ETS.2013.6569353 -
Design and Optimization of Adaptable BCH Codecs for NAND Flash Memories
articolo
Fabiano, Michele; Indaco, Marco; DI CARLO, Stefano; Prinetto, Paolo Ernesto
MICROPROCESSORS AND MICROSYSTEMS
Butterworth Heinemann Publishers:Linacre Editore attuale..ELSEVIER SCI LTD, THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD, ENGLAND, OXON, OX5 1GB. House Jordan Hill, Oxford OX2 8DP United Kingdom:011 44 1865 314569, EMAIL: bhmarketing@repp.co.uk, INTERNET: http://www.laxtonsprices.co.uk, Fax: 011 44 1865 314569
Vol.37 pp.13 (pp.407-419) ISSN:0141-9331 DOI:10.1016/j.micpro.2013.03.002 -
ZipStream: improving dependability in Dynamic Partial Reconfiguration
proceeding
DI CARLO, Stefano; Gambardella, Giulio; Huynh Bao, T.; Prinetto, Paolo Ernesto; Rolfo, Daniele; Trotta, Pascal
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 8th International Design and Test Symposium (IDT) (Marrakesh, MA) 16-18 Dec. 2013
pp.6 (pp.1-6) DOI:10.1109/IDT.2013.6727128 -
SAFE: a Self Adaptive Frame Enhancer FPGA-based IP-core for real-time space applications
proceeding
DI CARLO, Stefano; Gambardella, Giulio; Lanza, P.; Prinetto, Paolo Ernesto; Rolfo, Daniele; Trotta, Pascal
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 8th International Design and Test Symposium (IDT) (Marrakesh, MA) 16-18 Dec. 2013
pp.6 (pp.1-6) DOI:10.1109/IDT.2013.6727127
-
Efficient system-level aging prediction
proceeding
HATAMI MAZINANI, Nadereh; Baranowski, R.; Prinetto, Paolo Ernesto; Wunderlich, H.
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 17th European Test Symposium (ETS) (Annecy, FR) 28-31 May 2012
pp.6 (pp.1-6) ISBN:9781467306966 DOI:10.1109/ETS.2012.6233028 -
ADAGE: An Automated Synthesis tool for Adaptive BCH-based ECC IP-Cores
proceeding
DI CARLO, Stefano; Fabiano, Michele; Indaco, Marco; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE COMPUTER SOCIETY (STATI UNITI D'AMERICA)
ITC - IEEE International Test Conference (Anaheim) 4-9 November, 2012
pp.1 -
A Virtual Character based Italian Sign Language Dictionary
proceeding
Ahmad, Nadeem; Barberis, Davide; Garazzino, Nicola; Prinetto, Paolo Ernesto; Shoaib, Umar; Tiotto, Gabriele
In: Proceedings of the Conference Universal Learning Design, ICCHP
Masaryk University (REPUBBLICA CECA)
Universal Learning Design International Conference (Linz (Austria)) 11-13 Jul. 2012
pp.8 -
NBTI Mitigation by Dynamic Partial Reconfiguration
proceeding
DI CARLO, Stefano; Galfano, Salvatore; Gambardella, Giulio; Indaco, Marco; Prinetto, Paolo Ernesto; Rolfo, Daniele; Trotta, Pascal
In: Proceedings of the IEEE 13th Biennal Baltic Electronics Conference 2013
IEEE (STATI UNITI D'AMERICA)
IEEE 13th Biennal Baltic Electronics Conference (BEC) (Tallin, EE) 03-05 Oct., 2012
pp.4 (pp.93-96) DOI:10.1109/BEC.2012.6376823 -
A platform-independent user-friendly dictionary from Italian to LIS
proceeding
Shoaib, Umar; Ahmad, Nadeem; Prinetto, Paolo Ernesto; Tiotto, Gabriele
In: LREC'12 : 8th International Conference on Language Resources and Evaluation
LREC'12 : 8th International Conference on Language Resources and Evaluation (Istanbul (Turkey)) May 23-25, 2012
ISBN:9782951740877 -
A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories
proceeding
Zambelli, C.; Indaco, Marco; Fabiano, Michele; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Olivo, P.; Bertozzi, D.
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
Design, Automation and Test in Europe, Conference and Exhibition (DATE) (Dresden, DE) 12-16 March 2012
pp.6 (pp.881-886) ISBN:9781457721458 DOI:10.1109/DATE.2012.6176622
-
The Italian Sign Language Sign Bank: Using WordNet for Sign Language corpus creation
proceeding
Prinetto, Paolo Ernesto; Shoaib, Umar; Tiotto, Gabriele
In: Titolo volume non avvalorato
IEEE International Conference on Communications and Information Technology (Aqaba (Jordan)) 29-31 March 2011
pp.4 (pp.134-137) ISBN:9781457704017 DOI:10.1109/ICCITECHNOL.2011.5762664 -
Language Resources for Computer Assisted Translation from Italian to Italian Sign Language of Deaf People
proceeding
Barberis, Davide; Garazzino, Nicola; Savino, Alessandro; Ahmad, Nadeem; Shoaib, Umar; Prinetto, Paolo Ernesto; Tiotto, Gabriele
In: Titolo volume non avvalorato
Accessibility Reaching Everywhere International Conference (Brussels (Belgium)) 28-30 November 2011
pp.6 (pp.363-369) -
Validation & Verification of an EDA automated synthesis tool
proceeding
DI CARLO, Stefano; Gambardella, Giulio; Indaco, Marco; Rolfo, Daniele; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 6th International Design and Test Workshop (IDT) (Beirut, LI) 11-14 Dec. 2011
pp.5 (pp.48-52) ISBN:9781467304689 DOI:10.1109/IDT.2011.6123100 -
An area-efficient 2-D convolution implementation on FPGA for space applications
proceeding
DI CARLO, Stefano; Gambardella, Giulio; Indaco, Marco; Rolfo, Daniele; Tiotto, Gabriele; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 6th International Design and Test Workshop (IDT) (Beirut, LI) 11-14 Dec. 2011
pp.5 (pp.88-92) ISBN:9781467304689 DOI:10.1109/IDT.2011.6123108 -
MarciaTesta: An Automatic Generator of Test Programs for Microprocessors' Data Caches
proceeding
DI CARLO, Stefano; Gambardella, Giulio; Indaco, Marco; Rolfo, Daniele; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 20th Asian Test Symposium (ATS) (New Delhi, IN) 20-23 Nov. 2011
pp.6 (pp.401-406) ISBN:9781457719844 DOI:10.1109/ATS.2011.78 -
A unifying formalism to support automated synthesis of SBSTs for embedded caches
proceeding
DI CARLO, Stefano; Gambardella, Giulio; Indaco, Marco; Rolfo, Daniele; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE East-West Design & Test Symposium (EWDTS) (Sebastopoli, UA) 9-12 Sept. 2011
pp.4 (pp.39-42) ISBN:9781457719578 DOI:10.1109/EWDTS.2011.6116421 -
Efficient Multi-level Fault Simulation of HW/SW Systems for Structural Faults
articolo
Baranowski, R.; DI CARLO, Stefano; Hatami, N.; Imhof, M. E.; Kochte, M.; Prinetto, Paolo Ernesto; Wunderlich, H. J.; Zoellin, C. G.
SCIENCE CHINA. INFORMATION SCIENCES
Science China Press, co-published with Springer
Vol.54 pp.13 (pp.1784-1796) ISSN:1674-733X DOI:10.1007/s11432-011-4366-9 -
Design Issues and Challenges of File Systems for Flash Memories
capitolo
DI CARLO, Stefano; Fabiano, Michele; Prinetto, Paolo Ernesto; Cramia, M.
Flash Memories
InTech (CROAZIA)
pp.28 (pp.3-30) ISBN:9789533072722 DOI:10.5772/22976 -
Genetic Defect Based March Test Generation for SRAM
proceeding
DI CARLO, Stefano; Politano, GIANFRANCO MICHELE MARIA; Prinetto, Paolo Ernesto; Savino, Alessandro; Scionti, A.
LECTURE NOTES IN COMPUTER SCIENCE
In: Titolo volume non avvalorato
Springer
EvoCOMNET, EvoFIN, EvoHOT, EvoMUSART, EvoSTIM, and EvoTRANSLOG, EvoApplications 2011 (Torino (IT)) April 27-29 2011
Vol.6625 pp.10 (pp.141-150) ISSN:0302-9743 ISBN:9783642205194 DOI:10.1007/978-3-642-20520-0_15 -
Software-Based Self-Test of Set-Associative Cache Memories
articolo
DI CARLO, Stefano; Prinetto, Paolo Ernesto; Savino, Alessandro
IEEE TRANSACTIONS ON COMPUTERS
IEEE Computer Society
Vol.60 pp.15 (pp.1030-1044) ISSN:0018-9340 DOI:10.1109/TC.2010.166
-
System Reliability Evaluation Using Concurrent Multi-Level Simulation of Structural Faults
proceeding
Kochte, M. A.; Zoellin, C. G.; Baranowski, R.; Imhof, M. E.; Wunderlich, H. J.; Hatami, N.; DI CARLO, Stefano; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE (STATI UNITI D'AMERICA)
IEEE International Test Conference (ITC) (Austin (TX), USA) 31 Oct.- 5 Nov. 2010
pp.1 ISBN:9781424472062 DOI:10.1109/TEST.2010.5699309 -
Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level
proceeding
Kochte, M. A.; Zoellin, C. G.; Baranowski, R.; Imhof, M. E.; Wunderlich, H. J.; Hatami, N.; DI CARLO, Stefano; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 19th Asian Test Symposium (ATS) (Shanghai, CN) 1-4 Dec. 2010
pp.6 (pp.3-8) ISBN:9781424488414 DOI:10.1109/ATS.2010.10 -
Effiziente Simulation von strukturellen Fehlern für die Zuverlässigkeitsanalyse auf Systemebene
proceeding
Kochte, M. A.; Zoellin, C. G.; Baranowski, R.; Imhof, M. E.; Wunderlich, H. J.; Hatami, N.; DI CARLO, Stefano; Prinetto, Paolo Ernesto
In: GMM/GI/ITG-Fachtagung
VDE Verag (GERMANIA)
Zuverlässigkeit und Entwurf (GMM-FB 66) (Wildbad Kreuth, DE) 13-15 Sep. 2010
Vol.13. bis 15 pp.8 (pp.25-32) ISBN:9783800732999 -
Microprocessor fault-tolerance via on-the-fly partial reconfiguration
proceeding
DI CARLO, Stefano; Miele, Andrea; Prinetto, Paolo Ernesto; Trapanese, Antonio
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 15th European Test Symposium (ETS) (Praga, CZ) 24-28 May 2010
pp.6 (pp.201-206) ISBN:9781424458349 DOI:10.1109/ETSYM.2010.5512759 -
Defective Behaviour of an 8T SRAM Cell with Open Defects
proceeding
Rodríguez Montañés, R.; Arumí, D.; Manich, S.; Figueras, J.; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Scionti, A.
In: Proceeding of the IEEE 2nd International Conference on Advances in System Testing and Validation Lifecycle (VALID)
IEEE (STATI UNITI D'AMERICA)
IEEE 2nd International Conference on Advances in System Testing and Validation Lifecycle (VALID) (Nice, FR) 22-27 Aug. 2010
pp.6 (pp.81-86) ISBN:9781424477845 DOI:10.1109/VALID.2010.19 -
8T SRAM Defective Cell with Open Defects
proceeding
Rodríguez Montañés, R.; Arumí, D.; Manich, S.; Figueras, J.; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Scionti, A.
In: Titolo volume non avvalorato
IEEE (STATI UNITI D'AMERICA)
IEEE 25th Conference on Design of Circuits and Integrated Systems (DCIS) (Lanzarote, ES) 17-19 Nov. 2010
pp.6 (pp.492-497) ISBN:9788469373934 -
EDACs and test integration strategies for NAND flash memories
proceeding
DI CARLO, Stefano; Fabiano, Michele; Piazza, R.; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE East-West Design & Test Symposium (EWDTS) (St. Petersburg, RU) 17-20 Sept. 2010
pp.4 (pp.218-221) ISBN:9781424495559 DOI:10.1109/EWDTS.2010.5742060 -
Exploring modeling and testing of NAND flash memories
proceeding
DI CARLO, Stefano; Fabiano, M.; Piazza, R.; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE East-West Design & Test Symposium (EWDTS) (St. Petersburg, RU) 17-20 Sept. 2010
pp.4 (pp.47-50) ISBN:9781424495559 DOI:10.1109/EWDTS.2010.5742059 -
A Multilanguage Database for Supporting Sign Language Translation and Synthesis
proceeding
Borgotallo, R.; Marino, C.; Piccolo, Elio; Prinetto, Paolo Ernesto; Tiotto, Gabriele; Rossini, M.
In: Proceedings of the 4th Workshop on the Representation and Processing of Sign Languages: Corpora and Sign Language Technologies
European Language Resources Association
International Conference on Language Resources and Evaluation (La Valletta, Malta) 17-23 May 2010
Vol.W13 pp.4 (pp.23-26) ISBN:9782951740860 -
On the creation and the annotation of a large-scale Italian-LIS parallel corpus
proceeding
Bertoldi, N.; Tiotto, Gabriele; Prinetto, Paolo Ernesto; Piccolo, Elio; Nunnari, F.; Lombardo, V.; Mazzei, A.; Damiano, R.; Lesmo, L.; DEL PRINCIPE, A.
In: Proceedings of the 4th Workshop on the Representation and Processing of Sign Languages: Corpora and Sign Language Technologies
European Language Resources Association
International Conference on Language Resources and Evaluation (La Valletta, Malta) 17-23 May 2010
Vol.W13 pp.4 (pp.19-22) ISBN:9782951740860 -
A Web Based Platform for Sign Language Corpus Creation
proceeding
Barberis, Davide; Garazzino, Nicola; Piccolo, Elio; Prinetto, Paolo Ernesto; Tiotto, Gabriele
LECTURE NOTES IN COMPUTER SCIENCE
In: Titolo volume non avvalorato
Springer
12th International Conference, ICCHP 2010 (Vienna (AT)) July14-16, 2010
Vol.6180 pp.7 (pp.193-199) ISSN:0302-9743 ISBN:9783642140990 DOI:10.1007/978-3-642-14100-3_29 -
Automated synthesis of EDACs for FLASH Memories with User-Selectable Correction Capability
proceeding
Caramia, M.; Fabiano, Michele; Miele, A.; Piazza, R.; Prinetto, Paolo Ernesto
In: Proceedings of HLDVT 2010: IEEE International High Level Design Validation and Test Workshop 2010
IEEE Computer Society (STATI UNITI D'AMERICA)
HLDVT 2010: IEEE International High Level Design Validation and Test Workshop 2010 (Anaheim, FL (USA)) 10-12 June 2010
pp.8 (pp.113-120) ISBN:9781424478057 DOI:10.1109/HLDVT.2010.5496653 -
Models in Memory Testing, From functional testing to defect-based testing
capitolo
DI CARLO, Stefano; Prinetto, Paolo Ernesto
Models in Hardware Testing
Springer (GERMANIA)
pp.29 (pp.157-185) ISBN:9789048132812 DOI:10.1007/978-90-481-3282-9_6
-
Synthesizing TLM-2.0 Communication Interfaces
proceeding
HATAMI MAZINANI, Nadereh; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
SPD FL Stepanov V.V.Ukraine, 61168, Kharkov, Ak. Pavlova st., 311 (UCRAINA)
EWDTS 2009: 7th IEEE East-West Design & Test Symposium (Moscow (Russian Federation)) Sept 18-21. 2009
pp.4 (pp.442-446) -
Testing Methodologies on Communication Networks
proceeding
HATAMI MAZINANI, Nadereh; Prinetto, Paolo Ernesto; Tiotto, Gabriele
In: EWDTS 2009: 7th IEEE East-West Design & Test Symposium
SPD FL Stepanov V.V.Ukraine, 61168, Kharkov, Ak. Pavlova st., 311 (UCRAINA)
EWDTS 2009: 7th IEEE East-West Design & Test Symposium (Moscow (Russian Federation)) Sept 18-21, 2009
pp.4 (pp.456-459) -
An Editor for Assisted Translation of Italian Sign Language
proceeding
HATAMI MAZINANI, Nadereh; Prinetto, Paolo Ernesto; Tiotto, Gabriele
In: EWDTS 2009: 7th IEEE East-West Design & Test Symposium
SPD FL Stepanov V.V.Ukraine, 61168, Kharkov, Ak. Pavlova st., 311 (UCRAINA)
EWDTS 2009: 7th IEEE East-West Design & Test Symposium (Moscow (Russian Federation)) Sept 18-21. 2009
pp.4 (pp.415-418) -
TLM 2.0 simple sockets synthesis to RTL
proceeding
HATAMI MAZINANI, Nadereh; Ghofrani, A.; Prinetto, Paolo Ernesto; Navabi, Z.
In: DTIS '09: IEEE Design & Technology of Integrated Systems in Nanoscale Era, 2009
IEEE Computer Society (STATI UNITI D'AMERICA)
DTIS '09: IEEE Design & Technology of Integrated Systems in Nanoscale Era, 2009 (Cairo (Egypt)) Apr 6-9, 2009
Vol.4th International Conference on Design & Technology of Integrated Systems in Nanoscal Era DTIS '09 pp.6 (pp.3-8) ISBN:9781424443208 DOI:10.1109/DTIS.2009.4938013 -
A FPGA-Based Reconfigurable Software Architecture for Highly Dependable Systems
proceeding
DI CARLO, Stefano; Prinetto, Paolo Ernesto; Scionti, A.
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE Asian Test Symposium (ATS) (Taichung, TW) 23-26 Nov. 2009
pp.6 (pp.125-130) ISBN:9780769538648 DOI:10.1109/ATS.2009.53 -
Exploring Design Dimensions in Flash-based Mass-memory Devices
proceeding
Caramia, M.; DI CARLO, Stefano; Fabiano, Michele; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
ACM (STATI UNITI D'AMERICA)
ACM 4th International Workshop on Software Support for Portable Storage (IWSSPS) (Grenoble, F) 15 Oct. 2009
pp.6 (pp.43-48) -
Flash-memories in Space Applications: Trends and Challenges
proceeding
Caramia, M.; DI CARLO, Stefano; Fabiano, Michele; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 7th East-West Design & Test Symposium (EWDTS) (Moscow, RU) 18-21 Sep. 2009
pp.4 (pp.429-432) -
FLARE: A design environment for FLASH-based space applications
proceeding
Caramia, M.; DI CARLO, Stefano; Fabiano, Michele; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE (STATI UNITI D'AMERICA)
IEEE International High Level Design Validation and Test Workshop (HLDVT) (San Francisco (CA), USA) 4-6 Nov. 2009
pp.6 (pp.14-19) ISBN:9781424448234 DOI:10.1109/HLDVT.2009.5340180 -
Test infrastructures evaluation at transaction level
proceeding
DI CARLO, Stefano; Hatami, N.; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE (STATI UNITI D'AMERICA)
IEEE International Test Conference (ITC) (Austin (TX), USA) 1-6 Nov. 2009
pp.1 ISBN:9781424448685 DOI:10.1109/TEST.2009.5355830 -
System Level Testing via TLM 2.0 Debug Transport Interface
proceeding
DI CARLO, Stefano; Hatami, N.; Prinetto, Paolo Ernesto; Savino, Alessandro
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 24th International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTS) (Chicago (IL), USA) 7-9 Oct. 2009
pp.9 (pp.286-294) ISBN:9780769538396 DOI:10.1109/DFT.2009.46 -
A Low-Cost FPGA-Based Test and Diagnosis Architecture for SRAMs
proceeding
DI CARLO, Stefano; Prinetto, Paolo Ernesto; Scionti, A.; Figueras, J.; Manch, S.; Rodriguez Montanes, R.
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE First International Conference on Advances in System Testing and Validation Lifecycle (VALID) (Lisbon, PT) 20-25 Sept. 2009
pp.6 (pp.141-146) ISBN:9781424448623 DOI:10.1109/VALID.2009.29 -
Test exploration and validation using transaction level models
proceeding
Kochte, M. A; Zollen, C. G; Imhof, M. E; Khaligh, R. S; Radetzki, M.; Wunderlich, H. J; DI CARLO, Stefano; Prinetto, Paolo Ernesto
In: Design, Automation and Test in Europe, Conference and Exhibition (DATE)
IEEE Computer Society (STATI UNITI D'AMERICA)
DATE '09 : Design, Automation & Test in Europe Conference & Exhibition, 2009 (Nice, FR) 20-24 Apr. 2009
pp.4 (pp.1250-1253) ISBN:9781424437818 DOI:10.1109/DATE.2009.5090856 -
Are IEEE 1500 compliant cores really compliant to the standard?
articolo
Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; Prinetto, Paolo Ernesto
IEEE DESIGN & TEST OF COMPUTERS
IEEE Computer Society
Vol.26 pp.9 (pp.16-24) ISSN:0740-7475 DOI:10.1109/MDT.2009.46
-
Using ER Models for Microprocessor Functional Test Coverage Evaluation
proceeding
Benso, Alfredo; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Savino, Alessandro; Scionti, A.
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 11th International Biennial Baltic Electronics Conference (BEC) (Tallinn, EE) 6-8 Oct. 2008
pp.4 (pp.139-142) ISBN:9781424420599 DOI:10.1109/BEC.2008.4657498 -
Functional Testing Approaches for "BIFST-able" tlm_fifo
proceeding
Alemzadeh, H.; Navabi, Z.; DI CARLO, Stefano; Scionti, A.; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE (STATI UNITI D'AMERICA)
IEEE International High Level Design, Validation and Test Workshop (HLDVT) (Hyatt Regency Lake Tahoe Resort Incline Village (NV), USA) 19-21 Nov. 2008
pp.8 (pp.85-92) ISBN:9781424429226 DOI:10.1109/HLDVT.2008.4695882 -
Influence of parasitic capacitance variations on 65 nm and 32 nm predictive technology model SRAM core-cells
proceeding
DI CARLO, Stefano; Prinetto, Paolo Ernesto; Savino, Alessandro; Scionti, A.
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 17th Asian Test Symposium (ATS) (Sapporo, JP) 24-27 Nov. 2008
pp.6 (pp.411-416) ISBN:9780769533964 DOI:10.1109/ATS.2008.13 -
Applying March Tests to K-Way Set-Associative Cache Memories
proceeding
Alpe, Simone; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Savino, Alessandro
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 13th European Test Symposium (ETS) (Verbania, IT) 25-29 May 2008
pp.7 (pp.77-83) ISBN:9780769531502 DOI:10.1109/ETS.2008.25 -
March Test Generation Revealed
articolo
Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
IEEE TRANSACTIONS ON COMPUTERS
IEEE Computer Society
Vol.57 pp.10 (pp.1704-1713) ISSN:0018-9340 DOI:10.1109/TC.2008.105 -
A Systematic Approach for Evaluating Satellite Communications Systems
proceeding
DI CARLO, Stefano; Prinetto, Paolo Ernesto; Savino, Alessandro; Tiotto, Gabriele; Elia, P.
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 6th East-West Design & Test Symposium (EWDTS) (Lviv, UA) 9-12 Oct. 2008
pp.4 (pp.13-16) -
Automating defects simulation and fault modeling for SRAMs
proceeding
DI CARLO, Stefano; Prinetto, Paolo Ernesto; Scionti, A.; Al Ars, Z.
In: Titolo volume non avvalorato
IEEE (STATI UNITI D'AMERICA)
IEEE International High Level Design Validation and Test Workshop (HLDVT) (The Hyatt Regency Lake Tahoe Resort (NE), USA) 19-21 Nov. 2008
pp.8 (pp.169-176) ISBN:9781424429226 DOI:10.1109/HLDVT.2008.4695898 -
Reliability in Application Specific Mesh-based NoC Architectures
proceeding
Alemzadeh, H.; Refan, F.; Navabi, Z.; Prinetto, Paolo Ernesto; Safari, S.
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IOLTS 2008 : 14th IEEE International On-Line Testing Symposium (Rhodes (Greece)) July 6-9, 2008
pp.6 (pp.207-212) ISBN:9780769532646 DOI:10.1109/IOLTS.2008.53 -
"Plug & Test" at System Level via Testable TLM Primitives
proceeding
Alemzadeh, H.; DI CARLO, Stefano; Refan, F.; Navabi, Z.; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE (STATI UNITI D'AMERICA)
IEEE International Test Conference (ITC) (Santa Clara (CA), USA) 28-30 Oct., 2008
pp.10 (pp.1-10) ISBN:9781424424023 DOI:10.1109/TEST.2008.4700610 -
IEEE Standard 1500 Compliance Verification for Embedded Cores
articolo
Benso, Alfredo; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Zorian, Y.
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
IEEE
Vol.16 pp.11 (pp.397-407) ISSN:1063-8210 DOI:10.1109/TVLSI.2008.917412
-
Automating the IEEE std. 1500 compliance verification for embedded cores
proceeding
Benso, Alfredo; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Bosio, Alberto
In: Proceedings of IEEE International High Level Design Validation and Test Workshop (HLDVT), 2007
IEEE (STATI UNITI D'AMERICA)
IEEE International High Level Design Validation and Test Workshop (HLDVT) (Irvine (CA), USA) 7-9 Nov. 2007
pp.8 (pp.171-178) DOI:10.1109/HLDVT.2007.4392810 -
Analysis of System-Failure Rate Caused by Soft-Errors using a UML-Based Systematic Methodology in an SoC
proceeding
Hosseinabady, M.; Neishaburi, M. H.; Navabi, Z.; Benso, Alfredo; DI CARLO, Stefano; Prinetto, Paolo Ernesto; DI NATALE, Giorgio
In: Proceedings of IEEE 13th International On-Line Testing Symposium (IOLTS) 2007
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 13th International On-Line Testing Symposium (IOLTS) (Crete, GR) 8-11 July 2007
pp.2 (pp.205-206) DOI:10.1109/IOLTS.2007.17 -
Academic Network for Microelectronic Test Education
articolo
Novak, F.; Biasizzo, A.; Bertrand, Y.; Flottes, M.; Balado, L.; Figueras, J.; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Pricopi, N.; Wunderlich, H. J.; Van Der Hayden, J. P.
INTERNATIONAL JOURNAL OF ENGINEERING EDUCATION
TEMPUS Publications
Vol.23 pp.9 (pp.1245-1253) ISSN:0949-149X -
March AB, a State-of-the-Art March Test for Realistic Static Linked Faults and Dynamic Faults in SRAMs
articolo
Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
IET COMPUTERS & DIGITAL TECHNIQUES
IET - The Institution of Engineering and Technology
Vol.1 pp.9 (pp.237-245) ISSN:1751-8601 DOI:10.1049/iet-cdt:20060137
-
A Black-Box-Oriented Test Methodology
proceeding
Benso, Alfredo; Bosio, Alberto; Prinetto, Paolo Ernesto; Savino, Alessandro
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE East-West Design & Test Workshop (EWDTW06) (Sochi (Russia)) Sept. 15-19, 2006
pp.5 (pp.11-15) ISBN:9789666591244 -
An on-line software-based self-test framework for microprocessor cores
proceeding
Benso, Alfredo; Bosio, A; Prinetto, Paolo Ernesto; Savino, Alessandro
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006 (Tunis (Tunisia)) Sept. 5-7 2006
pp.6 (pp.394-399) ISBN:9780780397262 DOI:10.1109/DTIS.2006.1708654 -
Automatic March tests generation for multi-port SRAMs
proceeding
Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE (STATI UNITI D'AMERICA)
IEEE 3rd International Workshop on Electronic Design, Test and Applications (DELTA) (Kuala Lumpur, MY) 17-19 Jan. 2006
pp.8 (pp.385-392) ISBN:9780769525006 DOI:10.1109/DELTA.2006.17 -
A 22n March Test for Realistic Static Linked Faults in SRAMs
proceeding
Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
In: IEEE 11th European Test Symposium (ETS), 2006
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 11th European Test Symposium (ETS) (SouthAmpton, UK) 21-24 May 2006
pp.6 (pp.49-54) DOI:10.1109/ETS.2006.2 -
Memory Fault Simulator for Static-Linked Faults
proceeding
Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 15th AsianTest Symposium (ATS) (Fukuoka, JP) 20-23 Nov. 2006
pp.6 (pp.31-36) ISBN:9780769526287 DOI:10.1109/ATS.2006.260989 -
ATPG for Dynamic Burn-In Test in Full-Scan Circuits
proceeding
Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
In: IEEE 15th Asian Test Symposium (ATS), 2006
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 15th Asian Test Symposium (ATS) (Fukuoka, JP) 20-23 Nov. 2006
pp.8 (pp.75-82) DOI:10.1109/ATS.2006.260996 -
Single-Event Upset Analysis and Protection in High Speed Circuits
proceeding
Hosseinabady, M.; Lofti Kamran, P.; DI NATALE, Giorgio; DI CARLO, Stefano; Benso, Alfredo; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 11th European Test Symposium (ETS) (SouthAmpton (UK)) 21-24 May 2006
pp.6 (pp.29-34) ISBN:9780769525662 DOI:10.1109/ETS.2006.41 -
A Unique March Test Algorithm for the Wide Spread of Realistic Memory Faults in SRAMs
proceeding
Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
In: IEEE 9th Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2006
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 9th Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS) (Prague, CZ) 18-21 Apr. 2006
pp.2 (pp.155-156) DOI:10.1109/DDECS.2006.1649602 -
Automatic March Tests Generations for Static Linked Faults in SRAMs
proceeding
Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
Design, Automation and Test in Europe, Conference and Exhibition (DATE) (Munich, DE) 6-10 Mar. 2006
Vol.1 pp.6 (pp.1-6) ISBN:9783981080117 DOI:10.1109/DATE.2006.244097
-
A Dependable Autonomic Computing Environment for Self-Testing of Complex Heterogeneous Systems
articolo
Baldini, A.; Benso, A.; Prinetto, P.
ELECTRONIC NOTES IN THEORETICAL COMPUTER SCIENCE
Elsevier
Vol.116 pp.13 (pp.45-57) ISSN:1571-0661 DOI:10.1016/j.entcs.2004.02.087 -
AFSM-based deterministic hardware TPG
proceeding
Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 8th Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS) (Sopron, HU) 13-16 Apr. 2005
pp.4 (pp.178-181) ISBN:9789639364486 -
PROMON: a profile monitor of software applications
proceeding
Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto; Tagliaferri, Luca; Tibaldi, Clara
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 8th Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS) (Sopron, HU) 13-16 Apr. 2005
pp.6 (pp.81-86) ISBN:9789639364486 -
March AB, March AB1: new March tests for unlinked dynamic memory faults
proceeding
Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
In: IEEE International Test Conference (ITC), 2005
IEEE (STATI UNITI D'AMERICA)
IEEE International Test Conference (ITC) (Austin (TX), USA) 8-10 Nov. 2005
pp.8 (pp.834-841) DOI:10.1109/TEST.2005.1584047 -
Automatic March tests generation for static and dynamic faults in SRAMs
proceeding
Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
In: IEEE 10th European Test Symposium (ETS) , 2005
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 10th European Test Symposium (ETS) (Tallin, EE) 22-25 May 2005
pp.6 (pp.122-127) DOI:10.1109/ETS.2005.8 -
Agent Based Test and Repair of Distributed Systems
articolo
Miclea, L.; Szilárd, E.; Benso, Alfredo; Prinetto, Paolo Ernesto
JOURNAL OF EMBEDDED COMPUTING
IOS Press
Vol.1 pp.10 (pp.405-414) ISSN:1740-4460
-
Towards microagent based DBIST/DBISR
proceeding
Miclea, L.; Enyedi, S.; Toderean, G.; Benso, Alfredo; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE (STATI UNITI D'AMERICA)
IEEE International Test Conference (ITC) (Charlotte (NC), USA) 26-28 Oct. 2004
pp.8 (pp.867-874) ISBN:9780780385801 DOI:10.1109/TEST.2004.1387350 -
Digital, memory and mixed-signal test engineering education: five centres of competence in Europe
proceeding
Flottes, M. L.; Bertrand, Y.; Balado, L.; Lupon, E.; Biasizzo, A.; Novak, F.; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Pricopi, N.; Wunderlich, H. J.
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 2nd International Workshop on Electronic Design, Test and Applications (DELTA) (Perth, AU) 28-30 Jan. 2004
pp.5 (pp.135-139) ISBN:9780769520810 DOI:10.1109/DELTA.2004.10024 -
System Level Functional Testing from UML Specifications in End-Of-Production Industrial Environments
articolo
Baldini, A; Benso, Alfredo; Prinetto, Paolo Ernesto
INTERNATIONAL JOURNAL ON SOFTWARE TOOLS FOR TECHNOLOGY TRANSFER
SPRINGER-VERLAG BERLIN
Vol.7 pp.15 (pp.326-340) ISSN:1433-2779 DOI:10.1007/s10009-004-0147-8
-
Designing and Testing High Dependable Memories for Aerospace Applications
proceeding
Brogna, A; Bigongiari, F; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto; Saletti, R.
In: Titolo volume non avvalorato
IFIP International Conference on Very Large Scale Integration of System-on-Chip (IFIP VLSI-SoC) (Darmstadt (Germany)) 1-3 December 2003
ISBN:9783901882173 -
Test engineering education in Europe: the EuNICE-Test project
proceeding
Bertrand, Y.; Flottes, M. L.; Balado, L.; Figueras, J.; Biasizzo, A.; Novak, F.; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Pricopi, N.; Wunderlich, H. J.; Van Der Heyden, J. P.
In: Titolo volume non avvalorato
IEEE (STATI UNITI D'AMERICA)
IEEE International Conference on Microelectronic Systems Education (ICMSE) (Anaheim (CA), USA) 1-2 Jun. 2003
pp.2 (pp.85-86) ISBN:9780769519739 DOI:10.1109/MSE.2003.1205266 -
A watchdog processor to detect data and control flow errors
proceeding
Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 9th International On-Line Testing Symposium (IOLTS) (Kos, GR) 7-9 July 2003
pp.5 (pp.144-148) ISBN:9780769519685 DOI:10.1109/OLT.2003.1214381 -
Data criticality estimation in software applications
proceeding
Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto; Tagliaferri, Luca
In: Titolo volume non avvalorato
IEEE (STATI UNITI D'AMERICA)
IEEE International Test Conference (ITC) (Charlotte (NC), USA) 30 Sept. - 2 Oct., 2003
Vol.1 pp.9 (pp.802-810) ISBN:9780780381063 DOI:10.1109/TEST.2003.1270912 -
Online self-repair of FIR filters
articolo
Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
IEEE DESIGN & TEST OF COMPUTERS
IEEE Computer Society
Vol.20 pp.8 (pp.50-57) ISSN:0740-7475 DOI:10.1109/MDT.2003.1198686 -
FAUST: fault-injection script-based tool
proceeding
Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto; Solcia, Ivano; Tagliaferri, Luca
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 9th On-Line Testing Symposium (IOLTS) (Kos, GR) 7-9 July 2003
pp.1 ISBN:9780769519685 DOI:10.1109/OLT.2003.1214386 -
Programmable built-in self-testing of embedded RAM clusters in system-on-chip architectures
articolo
Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Lobetti Bodoni, M.; Prinetto, Paolo Ernesto
IEEE COMMUNICATIONS MAGAZINE
IEEE
Vol.41 pp.8 (pp.90-97) ISSN:0163-6804 DOI:10.1109/MCOM.2003.1232242 -
A Hierachical Infrastrucutre for SOC Test Management
articolo
Benso, Alfredo; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Zorian, Y.
IEEE DESIGN & TEST OF COMPUTERS
IEEE Computer Society
Vol.20 pp.8 (pp.32-39) ISSN:0740-7475 DOI:10.1109/MDT.2003.1214350 -
Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation
monografia
Benso, Alfredo; Prinetto, Paolo Ernesto
Kluver Academic Publishers (PAESI BASSI)
pp.245 ISBN:9781402075896
-
Initializability Analysis of Synchronous Sequential Circuits
articolo
Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; Squillero, Giovanni
ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS
Vol.7 pp.16 (pp.249-264) ISSN:1084-4309 DOI:10.1145/544536.544538 -
On Using COTS/CAM Equipments in Space Applications
articolo
Benso, Alfredo; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto; Zanello, R.
MSSU: MICROGRAVITY AND SPACE STATION UTILIZATION
Liguori Editore SRL
Vol.2 pp.3 ISSN:0958-5036 -
An optimal algorithm for the automatic generation of March tests
proceeding
Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
Design, Automation and Test in Europe, Conference and Exhibition (DATE) (Paris, FR) 4-8 Mar. 2002
pp.6 (pp.938-943) ISBN:9780769514710 DOI:10.1109/DATE.2002.998412 -
Static analysis of SEU effects on software applications
proceeding
Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE (STATI UNITI D'AMERICA)
IEEE International Test Conference (ITC) (Baltimore (MD), USA) 7-10 Oct. 2002
pp.9 (pp.500-508) ISBN:9780780375420 DOI:10.1109/TEST.2002.1041800 -
Specification and design of a new memory fault simulator
proceeding
Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 11th AsianTest Symposium (ATS) (Guam, USA) 18-20 Nov. 2002
pp.6 (pp.92-97) ISBN:9780769518251 DOI:10.1109/ATS.2002.1181693 -
Automated Synthesis of SEU Tolerant Architectures from OO Descriptions
proceeding
Chiusano, SILVIA ANNA; DI CARLO, Stefano; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 8th International On-Line Testing Workshop (IOLTW) (Isle of Bendor, FR) 8-10 July 2002
pp.6 (pp.26-31) ISBN:9780769516417 DOI:10.1109/OLT.2002.1030179 -
DFT and BIST of a multichip module for high-energy physics experiments
articolo
Benso, Alfredo; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto
IEEE DESIGN & TEST OF COMPUTERS
IEEE
Vol.19/3 pp.12 (pp.92-103) ISSN:0740-7475 DOI:10.1109/MDT.2002.1003804 -
An On-line BIST RAM Architecture with Self Repair Capabilities
articolo
Benso, Alfredo; Chiusano, SILVIA ANNA; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
IEEE TRANSACTIONS ON RELIABILITY
IEEE
Vol.51 pp.6 (pp.123-128) ISSN:0018-9529 DOI:10.1109/24.994929
-
A genetic algorithm for the computation of initialization sequences for synchronous sequential circuits
proceeding
Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; Squillero, Giovanni
In: 10th anniversary compendium of papers from Asian Test Symposium : proceedings : 1992-2001
IEEE
ATS '97 (Akita (JPN)) 19-21 Nov. 1997
pp.6 (pp.213-218) ISBN:9780769512334 DOI:10.1109/ATS.2001.10066 -
Validation of a software dependability tool via fault injection experiments
proceeding
Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Tagliaferri, Luca; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 7th International On-Line Testing Workshop (IOLTW) (Taormina, IT) 9-11 July 2001
pp.6 (pp.3-8) ISBN:9780769512907 DOI:10.1109/OLT.2001.937809 -
Software dependability techniques validated via fault injection experiments
proceeding
Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto; Tagliaferri, Luca
In: Titolo volume non avvalorato
IEEE (STATI UNITI D'AMERICA)
IEEE 6th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (Grenoble, FR) 10-14 Sept. 2001
pp.6 (pp.269-274) ISBN:9780780373136 DOI:10.1109/RADECS.2001.1159292 -
Memory read faults: taxonomy and automatic test generation
proceeding
Benso, Alfredo; DI CARLO, Stefano; Di Natale, Giorgio; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 10th AsianTest Symposium (ATS) (Kyoto, JP) 19-21 Nov. 2001
pp.7 (pp.157-163) ISBN:9780769513782 DOI:10.1109/ATS.2001.990275 -
Control-flow checking via regular expressions
proceeding
Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto; Tagliaferri, Luca
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE 10th Asian Test Symposium (ATS) (Kyoto, JP) 19-21 Nov. 2001
pp.5 (pp.299-303) ISBN:9780769513782 DOI:10.1109/ATS.2001.990300 -
On applying the set covering model to reseeding
proceeding
Chiusano, SILVIA ANNA; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Wunderlich, H. J.
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
Design, Automation and Test in Europe, Conference and Exhibition (DATE) (Munich, DE) 13-16 March 2001
pp.5 (pp.156-160) ISBN:9780769509938 DOI:10.1109/DATE.2001.915017 -
SEU effect analysis in a open-source router via a distributed fault injection environment
proceeding
Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
Design, Automation and Test in Europe, Conference and Exhibition (DATE) (Munich, DE) 13-16 Mar. 2001
pp.5 (pp.219-223) ISBN:9780769509938 DOI:10.1109/DATE.2001.915028 -
GRAAL: a tool for highly dependable SRAMs generation
proceeding
Chiusano, SILVIA ANNA; DI NATALE, G.; Prinetto, Paolo Ernesto; Bigongiari, F.
In: Titolo volume non avvalorato
IEEE International Test Conference 30 October - 1 November 2001
(pp.250-257) ISBN:9780780371699 -
A Self-Repairing Execution Unit for Microprogrammed Processors
articolo
Benso, Alfredo; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto
IEEE MICRO
IEEE COMPUTER SOCIETY
Vol.21, Issue: 5 pp.7 (pp.16-22) ISSN:0272-1732 DOI:10.1109/40.958696 -
Online and Offline BIST in IP-Core Design
articolo
Benso, Alfredo; Chiusano, SILVIA ANNA; DI NATALE, Giorgio; Prinetto, Paolo Ernesto; Lobetti Bodoni, M.
IEEE DESIGN & TEST OF COMPUTERS
IEEE
Vol.18(5) pp.8 (pp.92-99) ISSN:0740-7475 DOI:10.1109/54.953276
-
Self-repairing in a micro-programmed processor for dependable applications
proceeding
Benso, Alfredo; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto; Simonotti, P; Ugo, G.
In: Titolo volume non avvalorato
IEEE Press (STATI UNITI D'AMERICA)
DFT 2000: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Yamanashi, Japan) 25-27 Sept. 2000
pp.9 (pp.231-239) ISBN:9780769507194 DOI:10.1109/DFTVS.2000.887161 -
A programmable BIST architecture for clusters of Multiple-Port SRAMs
proceeding
Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto; Lobetti Bodoni, M.
In: Titolo volume non avvalorato
IEEE (STATI UNITI D'AMERICA)
IEEE International Test Conference (ITC) (Atlantic City (NJ), USA) 3-5 Oct. 2000
pp.10 (pp.557-566) ISBN:9780780365469 DOI:10.1109/TEST.2000.894249 -
A family of Self-Repair SRAM cores
proceeding
Benso, Alfredo; Chiusano, SILVIA ANNA; DI NATALE, G; LOBETTI BODONI, M; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE Press (STATI UNITI D'AMERICA)
IOLTW 2000: IEEE International On-Line Test Workshop July 2000
(pp.214-218) ISBN:9780765916419 -
HD2BIST: a hierarchical framework for BIST scheduling, data patterns delivering and diagnosis in SoCs
proceeding
Benso, Alfredo; Chiusano, SILVIA ANNA; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Ricciato, F.; Spadari, M.; Zorian, Y.
In: Titolo volume non avvalorato
IEEE (STATI UNITI D'AMERICA)
IEEE International Test Conference (ITC) (Atlantic City (NJ), USA) 3-5 Oct. 2000
pp.10 (pp.892-901) ISBN:9780780365469 DOI:10.1109/TEST.2000.894300 -
An effective distributed BIST architecture for RAMs
proceeding
Benso, Alfredo; Chiusano, SILVIA ANNA; DI CARLO, Stefano; DI NATALE, Giorgio; LOBETTI BODONI, M.; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE European Test Workshop (ETW) (Cascais, PT) 23-26 May 2000
pp.6 (pp.119-124) ISBN:9780769507019 DOI:10.1109/ETW.2000.873788 -
On integrating a proprietary and a commercial architecture for optimal BIST performances in SoCs
proceeding
Benso, Alfredo; DI CARLO, Stefano; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto; Ricciato, F.; Lobetti Bodoni, M.; Spadari, M.
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE International Conference on Computer Design (ICCD) (Austin (TX), USA) 17-20 Sept. 2000
pp.2 (pp.539-540) ISBN:9780769508016 DOI:10.1109/ICCD.2000.878335 -
Optimal Hardware Pattern Generation for Functional BIST
proceeding
Cataldo, S.; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto; Wunderlich, H. J.
In: Titolo volume non avvalorato
IEEE Design, Automation and Test in Europe 27-30 March 2000
(pp.292-297) ISBN:9780769505374 -
A C/C++ Source-to-Source Compiler for Dependable Applications
proceeding
Benso, Alfredo; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto; Tagliaferri, L.
In: Titolo volume non avvalorato
IEEE International Conference on Dependable Systems and Networks 25-28 June 2000
(pp.71-78) ISBN:9780769507071 -
A COTS Wrapping Toolkit for Fault Tolerant Applications under Windows NT
proceeding
Benso, Alfredo; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE International On-Line Testing Workshop 3-5 July 2000
(pp.9-16) ISBN:9780769506463 -
'BOND': An Interposition Agents Based Fault Injector for Windows NT
proceeding
Baldini, A.; Benso, Alfredo; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems 25-27 October 2000
(pp.387-395) ISBN:9780769507194 -
A software development kit for dependable applications in embedded systems
proceeding
Benso, Alfredo; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE International Test Conference 3-5 October 2000
pp.9 (pp.170-178) ISBN:9780780365469 -
Non-intrusive BIST for systems-on-a-chip
proceeding
Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto; Wunderlich, H. J.
In: Titolo volume non avvalorato
IEEE International Test Conference 3-5 October 2000
pp.8 (pp.644-651) ISBN:9780780365469 -
A High-level EDA Environment for the Automatic Insertion of HD-BIST Structures
articolo
Benso, Alfredo; Cataldo, Silvia; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto; Zorian, Y.
JOURNAL OF ELECTRONIC TESTING
Springer Netherlands
Vol.16 pp.6 (pp.179-184) ISSN:0923-8174 DOI:10.1023/A:1008326928340
-
RT-level TPG Exploiting High-Level Synthesis Information
proceeding
Chiusano, SILVIA ANNA; Corno, Fulvio; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE VLSI Test Symposium 25-30 April 1999
(pp.341-353) ISBN:9780769501468 -
HD-BIST: a hierarchical framework for BIST scheduling and diagnosis in SOCs
proceeding
Benso, Alfredo; Cataldo, S.; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto; Zorian, Y.
In: Titolo volume non avvalorato
IEEE International Test Conference (Atlantic City, NJ) 27-30 September 1999
pp.7 (pp.1038-1044) ISBN:9780780357532 -
Testing an MCM for high-energy physics experiments: a case study
proceeding
Benso, Alfredo; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto; Giovannetti, S.; Mariani, R.; Motto, S.
In: Titolo volume non avvalorato
IEEE International Test Conference (Atlantic City, NJ) 27-30 September 1999
pp.9 (pp.38-46) ISBN:9780780357532 -
SymFony: a hybrid topological-symbolic ATPG exploiting RT-level information
articolo
Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo; Violante, Massimo; U., Glaeser; H. T., Vierhaus
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
Vol.18 pp.12 (pp.191-202) ISSN:0278-0070 DOI:10.1109/43.743731 -
Testing Embedded Memories in Telecommunication Systems
articolo
Barbagallo, S.; Benso, Alfredo; Chiusano, SILVIA ANNA; Lobetti Bodoni, M.; Prinetto, Paolo Ernesto
IEEE COMMUNICATIONS MAGAZINE
IEEE
Vol.37 , Issue: 6 pp.6 (pp.84-89) ISSN:0163-6804 DOI:10.1109/35.769279 -
Exploiting Behavioral Information in Gate-Level ATPG
articolo
Chiusano, SILVIA ANNA; Corno, Fulvio; Prinetto, Paolo Ernesto
JOURNAL OF ELECTRONIC TESTING
Vol.14(1-2) (pp.141-148) ISSN:0923-8174 DOI:10.1023/A:1008322011010
-
Exploiting symbolic techniques for partial scan flip flop selection
proceeding
Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo; Violante, Massimo
In: DATE 1998 : IEEE Design Automation and Test Conference in Europe, 1998
IEEE Computer Society (STATI UNITI D'AMERICA)
DATE 1998 : IEEE Design Automation and Test Conference in Europe, 1998 (Paris (France)) Feb 23-26, 1998
pp.10 (pp.670-679) ISBN:9780818683596 DOI:10.1109/DATE.1998.655930 -
Exploiting the background debugging mode in a fault injection system
proceeding
Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
In: IPDS'98: IEEE International Computer Performance and Dependability Symposium
IEEE Computer Society Press (STATI UNITI D'AMERICA)
IPDS'98: IEEE International Computer Performance and Dependability Symposium (Durham, NC (USA)) Sep 07-09, 1998
pp.1 ISBN:9780818686795 DOI:10.1109/IPDS.1998.707736 -
A Hybrid Fault Injection Methodology for Real Time Systems
proceeding
Benso, Alfredo; Civera, Pierluigi; Rebaudengo, Maurizio; SONZA REORDA, Matteo; Ferro, ANTONIO VITO; Macchiarulo, Luca; Violante, Massimo; Prinetto, Paolo Ernesto; R., Ubar; J., Raik
In: FTCS-28: 28th Annual International Symposium on Fault-Tolerant Computing
IEEE Computer Society Press (STATI UNITI D'AMERICA)
FTCS-28: 28th Annual International Symposium on Fault-Tolerant Computing (Munich (Germany)) Jun 23-25, 1998
pp.2 (pp.74-75) ISBN:9780818684708 -
A test pattern generation methodology for low power consumption
proceeding
Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
16th IEEE VLSI Test Symposium (Monterey (CA)) Apr 26-30 1998
pp.5 (pp.453-457) ISBN:9780818684364 DOI:10.1109/VTEST.1998.670912 -
Fast sequential circuit test generation using high-level and gate-level techniques
proceeding
Rudnick, E. M.; Vietti, R.; Ellis, A.; Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: Titolo volume non avvalorato
Design, Automation and Test in Europe, 1998
ISBN:9780818683596 DOI:10.1109/DATE.1998.655915 -
A Fault Injection Environment for Microprocessor-based Board
proceeding
Benso, Alfredo; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
In: Titolo volume non avvalorato
IEEE (STATI UNITI D'AMERICA)
IEEE International Test Conference (ITC) (Washington (DC), USA) 18-23 Oct. 1998
pp.5 (pp.768-773) ISBN:9780780350939 DOI:10.1109/TEST.1998.743259 -
On the Identification of Optimal Cellular Automata for Built-In Self-Test of Sequential Circuits
proceeding
Prinetto, Paolo Ernesto; SONZA REORDA, Matteo; Gaudenzi, N.; Corno, Fulvio
In: Titolo volume non avvalorato
VTS'98 : 16th IEEE VLSI Test Symposium (Monterey CA, (USA)) Apr 26-30, 1998
pp.6 (pp.424-429) ISBN:9780818684364 DOI:10.1109/VTEST.1998.670902 -
A Test Pattern Generation Algorithm Exploiting Behavioral Information
proceeding
Chiusano, SILVIA ANNA; Corno, Fulvio; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE Asian Test Symposium 2-4 December 1998
(pp.480-485) ISBN:9780818682773 -
Integrating On-Line and Off-Line Testing of a Switching Memory in a Telecommunication System
articolo
S., Barbagallo; Corno, Fulvio; D., Medina; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
IEEE DESIGN & TEST OF COMPUTERS
Vol.Vol. 15, No. 1 ISSN:0740-7475 -
EXFI: a low cost Fault Injection System for embedded Microprocessor-based Boards
articolo
Benso, Alfredo; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS
ACM
Vol.5 pp.9 (pp.626-634) ISSN:1084-4309 DOI:10.1145/296333.296351 -
Integrating Online and Offline Testing of a Switching Memory
articolo
Barbagallo, S; Corno, Fulvio; Medina, D; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
IEEE DESIGN & TEST OF COMPUTERS
Vol.15 , Issue: 1 , Jan-March 1998 (pp.63-70) ISSN:0740-7475 DOI:10.1109/54.655184 -
The General Product Machine: a New Model for Symbolic FSM Traversal
articolo
Cabodi, Gianpiero; Camurati, Paolo Enrico; Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
FORMAL METHODS IN SYSTEM DESIGN
Vol.12 (pp.267-289) ISSN:0925-9856
-
A new approach to build a low-level Malicious Fault List starting from High-level description and Alternative Graphs
proceeding
Benso, Alfredo; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; R., Ubar
In: Titolo volume non avvalorato
EDTC '97 Proceedings of the 1997 European conference on Design and Test
pp.6 (pp.560-565) ISBN:9780818677861 -
Optimizing area loss in flat glass cutting
proceeding
Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; S., Bisotto
In: Titolo volume non avvalorato
Second International Conference on Genetic Algorithms in Engineering Systems (Glasgow, UK) 2-4 Sept. 1997
pp.6 (pp.450-455) ISBN:9780852966938 DOI:10.1049/cp:19971222 -
Exploiting Logic Simulation to Improve Simulation-based Sequential ATPG
proceeding
Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; Violante, Massimo
In: Titolo volume non avvalorato
Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian (Akita, J) 17-19 Nov 1997
pp.6 (pp.68-73) ISBN:9780818682094 DOI:10.1109/ATS.1997.643922 -
Exploiting high-level descriptions for circuits fault tolerance assessment
proceeding
Benso, Alfredo; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; J., Raik; R., Ubar
In: Titolo volume non avvalorato
Defect and Fault Tolerance in VLSI Systems, 1997. Proceedings., 1997 IEEE International Symposium on (Paris, F) 20-22 Oct 1997
pp.5 (pp.212-216) ISBN:9780818681684 DOI:10.1109/DFTVS.1997.628327 -
New Static Compaction Techniques of Test Sequences for Sequential Circuits
proceeding
Corno, Fulvio; Rebaudengo, Maurizio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: Titolo volume non avvalorato
EDTC '97 Proceedings of the 1997 European conference on Design and Test
pp.7 (pp.37-43) ISBN:9780818677861 -
SAARA: a simulated annealing algorithm for test pattern generation for digital circuits
proceeding
Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
In: Titolo volume non avvalorato
SAC '97 Proceedings of the 1997 ACM symposium on Applied computing
pp.5 (pp.228-232) ISBN:9780897918503 DOI:10.1145/331697.331745 -
Reti Logiche (Esercizi commentati e risolti)
monografia
Benso, Alfredo; Corno, Fulvio; Prinetto, Paolo Ernesto
Ed. Esculapio (ITALIA)
pp.100 -
Simulation-Based Verification of Network Protocols Performance
proceeding
Baldi, Mario; Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; Squillero, Giovanni
In: Proceedings of the IFIP WG 10.5 International Conference on Correct Hardware Design and Verification Methods: Advances in Hardware Design and Verification
Chapman & Hall, Ltd (REGNO UNITO DI GRAN BRETAGNA)
CHARME
pp.16 (pp.236-251) ISBN:9780412813306 -
A genetic algorithm for the computation of initialization sequences for synchronous sequential circuits
proceeding
Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; Squillero, Giovanni
In: Titolo volume non avvalorato
IEEE
ATS '97, 6th Asian Test Symposium (Akita (JPN)) 17-19 Nov 1997
pp.6 (pp.56-61) ISBN:9780818682094 DOI:10.1109/ATS.1997.643917 -
A New Approach for Initialization Sequences Computation for Synchronous Sequential Circuits
proceeding
Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; Squillero, Giovanni
In: 1997 IEEE Proceedings of the International Conference on Computer Design
IEEE
International Conference on Computer Design
(pp.381-386) -
Testability analysis and ATPG on behavioral RT-level VHDL
proceeding
Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
ITC 1997: IEEE International Test Conference (Washington DC (USA)) Nov 1-6, 1997
pp.7 (pp.753-759) ISBN:9780780342095 DOI:10.1109/TEST.1997.639688 -
Hybrid Symbolic-Explicit Techniques for the Graph Coloring Problem
proceeding
Chiusano, SILVIA ANNA; Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: Titolo volume non avvalorato
IEEE European Design and Test Conference (Paris) March 1997
pp.5 (pp.422-426) ISBN:9780818677861 -
Exploiting Symbolic Techniques within Genetic Algorithms for Power Optimization
proceeding
Chiusano, SILVIA ANNA; Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
In: Titolo volume non avvalorato
IEEE International Conference on Tools with Artificial Intelligence 3-8 Nov 1997
(pp.133-140) ISBN:9780818682032 -
Cellular automata for deterministic sequential test pattern generation
proceeding
Chiusano, SILVIA ANNA; Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: Titolo volume non avvalorato
IEEE VLSI Test Symposium April 27-May 1, 1997
(pp.60-67) ISBN:9780818678103 -
Guaranteeing Testability in Re-encoding for Low Power.
proceeding
Chiusano, SILVIA ANNA; Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
In: Titolo volume non avvalorato
IEEE Asian Test Symposium 17-18 November 1997
(pp.30-35) ISBN:9780818682094
-
A genetic algorithm for automatic generation of test logic for digital circuits
proceeding
Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo; ,
In: ICTAI 1996 : 8th IEEE International Conference on Tools with Artificial Intelligence, 1996
IEEE Computer Society (STATI UNITI D'AMERICA)
ICTAI 1996 : 8th IEEE International Conference on Tools with Artificial Intelligence, 1996 (Toulouse (France)) Nov 16-19, 1996
pp.7 (pp.10-16) ISBN:9780818676864 DOI:10.1109/TAI.1996.560394 -
Scan insertion criteria for low design impact
proceeding
Barbagallo, S.; Lobetti Bodoni, M.; Medina, D.; Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: VTS 1996 : IEEE VLSI Test Symposium
IEEE Computer Society (STATI UNITI D'AMERICA)
VTS 1996 : IEEE VLSI Test Symposium (Princeton, NJ (USA)) Apr 26 - May 1, 1996
pp.6 (pp.26-31) ISBN:9780818673047 DOI:10.1109/VTEST.1996.510831 -
Self-checking and Fault Tolerant approaches can help BIST fault coverage: a case study
proceeding
Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: ED&TC 96: IEEE European Conference on Design and Test 1996
IEEE Computer Society (STATI UNITI D'AMERICA)
ED&TC 96: IEEE European Conference on Design and Test 1996 (Paris (Francia)) Mar 11-14, 1996
pp.1 ISBN:9780818674235 DOI:10.1109/EDTC.1996.494374 -
Fault Tolerant and BIST design of a FIFO cell
proceeding
Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: Euro-DAC '96: IEEE European Design Automation Conference with Euro-VHDL '96 and Exhibition
IEEE Computer Society (STATI UNITI D'AMERICA)
Euro-DAC '96: IEEE European Design Automation Conference with Euro-VHDL '96 and Exhibition (Geneva (CH)) Sep 16-20, 1996
pp.6 (pp.233-238) ISBN:9780818675737 DOI:10.1109/EURDAC.1996.558210 -
Partial scan flip flop selection for simulation-based sequential ATPGs
proceeding
Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
In: Titolo volume non avvalorato
Test Conference, 1996. Proceedings., International (Washington, DC, USA) 20-25 Oct 1996
pp.7 (pp.558-564) ISBN:9780780335417 DOI:10.1109/TEST.1996.557088 -
Comparing topological, symbolic and GA-based ATPGs: an experimental approach
proceeding
Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
In: Titolo volume non avvalorato
Test Conference, 1996. Proceedings., International (Washington, DC) 20-25 Oct 1996
pp.9 (pp.39-47) ISBN:9780780335417 DOI:10.1109/TEST.1996.556941 -
Fault Behavior Observation of a Microprocessor System through a VHDL Simulation-Based Fault Injection Experiment
proceeding
Amendola, A.; Benso, Alfredo; Corno, Fulvio; Impagliazzo, L.; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
In: Titolo volume non avvalorato
Design Automation Conference, 1996, with EURO-VHDL '96 and Exhibition, Proceedings EURO-DAC '96, European (Geneva, CH) 16 - 20 Sep 1996
pp.6 (pp.536-541) ISBN:9780818675737 DOI:10.1109/EURDAC.1996.558255 -
Advanced Techniques for GA-based sequential ATPGs
proceeding
Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; Mosca, R.
In: Titolo volume non avvalorato
European Design and Test Conference, 1996. ED&TC 96. Proceedings (Paris, F) 11-14 Mar 1996
pp.5 (pp.375-379) ISBN:9780818674242 DOI:10.1109/EDTC.1996.494328 -
A parallel genetic algorithm for Automatic Generation of Test Sequences for digital circuits
proceeding
Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
LECTURE NOTES IN COMPUTER SCIENCE
In: Titolo volume non avvalorato
Springer
High-Performance Computing and Networking International Conference and Exhibition HPCN EUROPE 1996 (Brussels (BEL)) April 15–19, 1996
Vol.1067 pp.6 (pp.454-459) ISSN:0302-9743 ISBN:9783540611424 DOI:10.1007/3-540-61142-8_583 -
Exploiting competing subpopulations for automatic generation of test sequences for digital circuits
proceeding
Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
LECTURE NOTES IN COMPUTER SCIENCE
In: Parallel Problem Solving from Nature — PPSN IV
Springer
International Conference on Evolutionary Computation — The 4th International Conference on Parallel Problem Solving from Nature (Berlin (DEU)) September 22–26, 1996
Vol.1141 pp.10 (pp.791-800) ISSN:0302-9743 ISBN:9783540617235 DOI:10.1007/3-540-61723-X_1042 -
On-line testing of an off-the-shelf microprocessor board for safety-critical applications
proceeding
Corno, Fulvio; M., Damiani; L., Impagliazzo; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; G., Sartore; SONZA REORDA, Matteo
LECTURE NOTES IN COMPUTER SCIENCE
In: Titolo volume non avvalorato
Springer
Dependable Computing — EDCC-2, 2nd European Dependable Computing Conference (Taormina (ITA)) October 2–4, 1996
Vol.1150 pp.12 (pp.190-201) ISSN:0302-9743 ISBN:9783540617723 DOI:10.1007/3-540-61772-8_38 -
Il ruolo delle tecniche di fault injection nell’analisi dell’affidabilità dei sistemi
articolo
Benso, Alfredo; Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
AEI AUTOMAZIONE ENERGIA INFORMAZIONE
Association Elettrotecnica Elettronic: AEI Uffic Center, Piaz Morandi 2, 20121 Milan Italy:011 39 02 77790223, EMAIL: soci@aei.it, Fax: 011 39 02 798817
Vol.83 pp.7 (pp.63-69) ISSN:1122-2824 -
Role of fault injection techniques in system dependability analysis
articolo
Benso, Alfredo; Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
AEI AUTOMAZIONE ENERGIA INFORMAZIONE
Vol.83 (pp.63-69) ISSN:1122-2824 -
Testable Synthesis of Control Units via Circular Self-Test Path: Problems and Solutions
articolo
Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
IEEE DESIGN & TEST OF COMPUTERS
(pp.50-60) ISSN:0740-7475 -
Circular self-test path for FSMs
articolo
Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
IEEE DESIGN & TEST OF COMPUTERS
Vol.13 , Issue: 4 , Winter 1996 (pp.50-60) ISSN:0740-7475 DOI:10.1109/54.544536 -
GATTO: A Genetic Algorithm for Automatic Test Pattern Generation for Large Synchronous Sequential Circuits
articolo
Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
Vol.15(8) (pp.991-1000) ISSN:0278-0070 DOI:10.1109/43.511578
-
Uso di Tecniche Evolutive per la Risoluzione di Problemi di CAD Elettronico
capitolo
Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
Processori dedicati
Franco Angeli (ITALIA)
pp.5 (pp.39-43) ISBN:9788820494834 -
Testing a Switching Memory in a Telecommunication System
proceeding
Barbagallo, S.; Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: ITC 1995 : IEEE International Test Conference, 1995
IEEE Computer Society (STATI UNITI D'AMERICA)
ITC 1995 : IEEE International Test Conference, 1995 (Washington DC (USA)) Oct 21-25, 1995
pp.10 (pp.947-956) ISBN:9780780329928 DOI:10.1109/TEST.1995.529941 -
Proving testing preorders for process algebra descriptions
proceeding
Corno, Fulvio; Cusinato, Marco; Ferrero, M.; Prinetto, Paolo Ernesto
In: ED&TC 1995: IEEE European Design and Test Conference, 1995
IEEE Computer Society Press (STATI UNITI D'AMERICA)
ED&TC 1995: IEEE European Design and Test Conference, 1995 (Paris (France)) Mar 6-9, 1995
pp.5 (pp.333-337) ISBN:9780818670398 DOI:10.1109/EDTC.1995.470375 -
Using symbolic techniques to find the maximum clique in very large sparse graphs
proceeding
Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: Titolo volume non avvalorato
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
European Design and Test Conference, 1995. ED&TC 1995
ISBN:9780818670398 DOI:10.1109/EDTC.1995.470377 -
A portable ATPG tool for parallel and distributed systems
proceeding
Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; Veiluva, E.
In: Titolo volume non avvalorato
13th IEEE VLSI Test Symposium (VTS'95) (Princeton, NJ, USA) April 30 - May 03 1995
pp.6 (pp.29-34) ISBN:9780818670008 DOI:10.1109/VTEST.1995.512613 -
GARDA: a Diagnostic ATPG for Large Synchronous Sequential Circuits
proceeding
Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
In: Titolo volume non avvalorato
European Design and Test Conference, 1995. ED&TC 1995, Proceedings. (Paris, F) 6-9 Mar 1995
pp.5 (pp.267-271) ISBN:9780818670398 DOI:10.1109/EDTC.1995.470385 -
Improving topological ATPG with symbolic techniques
proceeding
Corno, Fulvio; U., Gläser; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; T., Vierhaus
In: Titolo volume non avvalorato
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
IEEE VLSI Test Symposium
pp.6 (pp.338-343) ISBN:9780818670008 DOI:10.1109/VTEST.1995.512658 -
A PVM tool for automatic test generation on parallel and distributed systems
proceeding
Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; Enzo, Veiluva
LECTURE NOTES IN COMPUTER SCIENCE
In: Titolo volume non avvalorato
Springer
High-Performance Computing and Networking International Conference and Exhibition (Milan (ITA)) May 3–5, 1995
Vol.919 pp.6 (pp.39-44) ISSN:0302-9743 ISBN:9783540593935 DOI:10.1007/BFb0046607 -
Reti Logiche (Raccolta di lucidi)
monografia
Corno, Fulvio; Prinetto, Paolo Ernesto
Libreria Editrice Universitaria Levrotto & Bella (ITALIA)
-
Making the circular self-test path technique effective for real circuits
proceeding
Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: ITC 1994 : IEEE International Test Conference, 1994
IEEE Computer Society (STATI UNITI D'AMERICA)
ITC 1994 : IEEE International Test Conference, 1994 (Washington DC (USA)) Oct 2-6, 1994
pp.9 (pp.949-957) ISBN:9780780321038 DOI:10.1109/TEST.1994.528044 -
A process algebra interpretation of a verification oriented overlanguage of VHDL
proceeding
Bayol, C.; Soulas, B.; Borrione, D.; Corno, Fulvio; Prinetto, Paolo Ernesto
In: EURO-DAC '94: IEEE European Design Automation Conference
IEEE Computer Society (STATI UNITI D'AMERICA)
EURO-DAC '94: IEEE European Design Automation Conference (Grenoble (France)) Sep 19-22, 1994
pp.6 (pp.506-511) ISBN:9780897916851 DOI:10.1145/198174.198314 -
An industrial experience in the built-in self test of embedded RAM
proceeding
Camurati, Paolo Enrico; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo; barbagallo, S.; burri, A.; medina, D.
In: VTS 1994 : IEEE 12th VLSI Test Symposium
IEEE Computer Society (STATI UNITI D'AMERICA)
VTS 1994 : IEEE 12th VLSI Test Symposium (Cherry Hill, NJ (USA)) Apr 25-28, 1994
pp.6 (pp.306-311) ISBN:9780818654404 DOI:10.1109/VTEST.1994.292296 -
System-Level Modeling and Verification: a Comprehensive Design Methodology
proceeding
Camurati, Paolo Enrico; Corno, Fulvio; Prinetto, Paolo Ernesto; bayol, C.; soulas, B. .
In: ED&TC 1994 : IEEE European Design and Test Conference EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design
IEEE Computer Society (STATI UNITI D'AMERICA)
ED&TC 1994 : IEEE European Design and Test Conference EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design (Paris (France)) Feb 28 - Mar 03, 1994
pp.5 (pp.636-640) ISBN:9780818654107 DOI:10.1109/EDTC.1994.326811 -
An experimental analysis of the effectiveness of the circular self-test path technique
proceeding
Prinetto, Paolo Ernesto; Corno, Fulvio; SONZA REORDA, Matteo
In: EURO-DAC '94: IEEE European design automation Conference
IEEE Computer Society Press (STATI UNITI D'AMERICA)
EURO-DAC '94: IEEE European design automation Conference (Grenoble (France)) Sep 19-22, 1994
pp.6 (pp.246-251) ISBN:9780897916851 DOI:10.1145/198174.198254 -
GATTO: an Intelligent Tool for Automatic Test Pattern Generation for Digital Circuits
proceeding
Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; Veiluva, E.
In: Titolo volume non avvalorato
Tools with Artificial Intelligence, 1994. Proceedings., Sixth International Conference on (New Orleans, LA, USA) 6-9 Nov 1994
pp.7 (pp.411-417) ISBN:9780818667855 DOI:10.1109/TAI.1994.346463 -
An automatic test pattern generator for large sequential circuits based on Genetic Algorithms
proceeding
Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
In: Titolo volume non avvalorato
Test Conference, 1994. Proceedings., International (Washington, DC, USA) 2-6 Oct 1994
ISBN:9780780321038 DOI:10.1109/TEST.1994.527955 -
A New Functional Fault Model for System-Level Descriptions
proceeding
P., Camurati; Corno, Fulvio; Meo, Michela; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
2th IEEE VLSI Test Symposium (NJ (USA)) April 1994
ISBN:9780818654404 DOI:10.1109/VTEST.1994.292310
-
Finding the Maximurn Clique in a Graph Using BDDs
proceeding
Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: ICVC93: IEEE 3rd International Conference on VLSI and CAD
ICVC93: IEEE 3rd International Conference on VLSI and CAD. (Taejon (Korea).) Nov 1993
pp.4 (pp.269-272) -
A verifiable design methodology at system-level
proceeding
Camurati, Paolo Enrico; Corno, Fulvio; Prinetto, Paolo Ernesto; C., Bayol; B., Soulas
In: ICVC93: IEEE 3rd International Conference on VLSI and CAD
ICVC93: IEEE 3rd International Conference on VLSI and CAD (Taejon (Korea)) Nov 1993
pp.4 (pp.364-367) -
Hybrid Genetic Algorithms for the Travelling Salesman Problem
proceeding
Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
In: ICANNGA 1993: Artificial Neural Nets and Genetic Algorithms
Springer-Verlag (AUSTRIA)
ICANNGA 1993: Artificial Neural Nets and Genetic Algorithms (Innsbruck (Austria)) Feb 1993
pp.8 (pp.559-566) ISBN:9783211007433 -
System-level fault modeling and test pattern generation with process algebras
proceeding
Camurati, Paolo Enrico; Corno, Fulvio; Prinetto, Paolo Ernesto
In: ETC-93: IEEE 3rd European Test Conference
IEEE Computer Society (STATI UNITI D'AMERICA)
ETC-93: IEEE 3rd European Test Conference (Rotterdam (The Netherlands)) Apr 19-22, 1993
pp.10 (pp.47-56) ISBN:9780818633607 DOI:10.1109/ETC.1993.246534 -
Exploiting symbolic traversal techniques for efficient Process Algebra Manipulation
proceeding
Camurati, Paolo Enrico; Corno, Fulvio; Prinetto, Paolo Ernesto
In: CHDL'93: 11th IFIP WG10.2 International Conference on Computer Hardware Description Languages and their Applications
North-Holland Publishing Co. (PAESI BASSI)
CHDL'93: 11th IFIP WG10.2 International Conference on Computer Hardware Description Languages and their Applications (Ottawa, Ontario (Canada)) Apr 26-28, 1993
pp.14 (pp.31-44) ISBN:9780444816412 -
An efficient tool for system-level verification of behaviors and temporal properties
proceeding
Camurati, Paolo Enrico; Corno, Fulvio; Prinetto, Paolo Ernesto
In: EURO-DAC '93: IEEE European Design Automation Conference, 1993, with EURO-VHDL '93
IEEE Computer Society (STATI UNITI D'AMERICA)
EURO-DAC '93: IEEE European Design Automation Conference, 1993, with EURO-VHDL '93 (Hamburg (Germany)) Sep 20-24, 1993
pp.6 (pp.124-129) ISBN:9780818643507 DOI:10.1109/EURDAC.1993.410626 -
VOVHDL: A verification-oriented dialect of VHDL
proceeding
Camurati, Paolo Enrico; Corno, Fulvio; Prinetto, Paolo Ernesto; C., Bayol; B., Soulas
In: VFE'93: VHDL Forum for CAD in Europe: Fall '93 Meeting
VFE'93: VHDL Forum for CAD in Europe: Fall '93 Meeting (Hamburg (Germany)) Sept 23, 1993
pp.11 (pp.37-47) -
A methodology for system-level design for verifiability
proceeding
Camurati, Paolo Enrico; Corno, Fulvio; Prinetto, Paolo Ernesto
LECTURE NOTES IN COMPUTER SCIENCE
In: Correct Hardware Design and Verification Methods
Springer
IFIPWG10.2 Advanced Research Working Conference, CHARME'93 (Arles (FRA)) May 24–26, 1993
Vol.683 pp.12 (pp.80-91) ISSN:0302-9743 ISBN:9783540567783 DOI:10.1007/BFb0021716 -
An Approach to Sequential Circuit Diagnosis Based on Formal Verification Techniques
articolo
Cabodi, Gianpiero; Camurati, Paolo Enrico; Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
JOURNAL OF ELECTRONIC TESTING
Vol.4 pp.7 (pp.11-17) ISSN:0923-8174
-
Centralized vs. distributed implementation of FSM equivalence verification on a parallel system
proceeding
Camurati, Paolo Enrico; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
In: EWPC '92 : the European Workshops on Parallel Computing: from theory to sound practic
IOS Press (STATI UNITI D'AMERICA)
EWPC '92 : the European Workshops on Parallel Computing: from theory to sound practic (Barcelona (Spain)) Mar 23-24, 1992
pp.4 (pp.554-557) ISBN:9789051990805 -
A simulation-based approach to test pattern generation for synchronous circuits
proceeding
Camurati, Paolo Enrico; Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: Titolo volume non avvalorato
IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667
IEEE VLSI Test Symposium
pp.5 (pp.263-267) ISBN:9780780306233 DOI:10.1109/VTEST.1992.232763 -
Improved techniques for multiple stuck-at fault analysis using single stuck-at fault test sets
proceeding
Camurati, Paolo Enrico; Rebaudengo, Maurizio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: Titolo volume non avvalorato
Circuits and Systems, 1992. ISCAS '92. Proceedings., 1992 IEEE International Symposium on 10-13 May 1992
pp.4 (pp.383-386) ISBN:9780780305939 DOI:10.1109/ISCAS.1992.229933 -
Efficient Verification of Sequential Circuits on a Parallel System
proceeding
Camurati, Paolo Enrico; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
In: Titolo volume non avvalorato
EDAC'92: IEEE European Design Automation Conference (Brussels)
pp.5 (pp.64-68) ISBN:9780818626456 DOI:10.1109/EDAC.1992.205895 -
Sequential circuit diagnosis based on formal verification techniques
proceeding
Cabodi, Gianpiero; Camurati, Paolo Enrico; Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: ITC 1992: IEEE International Test Conference 1992
IEEE Computer Society (STATI UNITI D'AMERICA)
ITC 1992: IEEE International Test Conference 1992 (Baltimore MD (USA)) Sept. 20-24 1992
(pp.187-196) -
A new model for improving symbolic Product Machine traversal
proceeding
Cabodi, Gianpiero; Camurati, Paolo Enrico; Corno, Fulvio; S., Gai; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: Titolo volume non avvalorato
DAC-29: 29th ACM/IEEE Design Automation Conference (Anaheim, CA (USA)) June 1992
pp.6 (pp.614-619) -
Cross-fertilizing FSM Verification Techniques and Sequential Diagnosis
proceeding
Cabodi, Gianpiero; Camurati, Paolo Enrico; Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: Proceedings of the 1992 IEEE EURO-DAC
IEEE EURO-DAC'92 (Hamburg (Germany)) September 1992
(pp.306-311)
-
The use of model checking in ATPG for sequential circuits
proceeding
Camurati, Paolo Enrico; Gilli, Marco; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
LECTURE NOTES IN COMPUTER SCIENCE
In: Titolo volume non avvalorato
Springer
Computer-Aided Verification 2nd International Conference, CAV '90 (New Brunswick, NJ (USA)) June 18-21, 1990
Vol.531 pp.10 (pp.86-95) ISSN:0302-9743 ISBN:9783540544777 DOI:10.1007/BFb0023722 -
The Product Machine and Implicit Enumeration to prove FSMs correct
proceeding
Camurati, Paolo Enrico; Gilli, Marco; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: Correct Hardware Design Methodologies
CHARME 1991: Advanced Research Workshop on Correct Hardware Design Methodologies (Torino (Italy)) June 1991
pp.12 (pp.51-62) ISBN:9780444893673 -
An experimental comparison of different approaches to ROM BIST
proceeding
Barbagallo, S.; Burri, A.; Medina, D.; Camurati, Paolo Enrico; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: CompEuro’91: IEEE 5th Annual European Computer Conference on VLSI and Computers
IEEE Computer Society (STATI UNITI D'AMERICA)
CompEuro’91: IEEE 5th Annual European Computer Conference on VLSI and Computers (Bologna (Italy)) 13-16 May 1991
pp.5 (pp.567-571) ISBN:9780818621413 DOI:10.1109/CMPEUR.1991.257450 -
Comparing ATPGs for synchronous sequential circuits
proceeding
Camurati, Paolo Enrico; Gilli, Marco; Meo, ANGELO RAFFAELE; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: CompEuro’91: IEEE 5th Annual European Computer Conference on VLSI and Computers
IEEE Computer Society (STATI UNITI D'AMERICA)
CompEuro’91: IEEE 5th Annual European Computer Conference on VLSI and Computers (Bologna (Italy)) 13-16 May 1991
pp.5 (pp.224-228) ISBN:9780818621413 DOI:10.1109/CMPEUR.1991.257386 -
Proving finite state machines correct with an automaton-based method
proceeding
Camurati, Paolo Enrico; Gilli, Marco; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: IEEE First Great Lakes Symposium on VLSI
IEEE Computer Society (STATI UNITI D'AMERICA)
IEEE First Great Lakes Symposium on VLSI (Kalamazoo MI (USA),) 1-2 March 1991
pp.4 (pp.255-258) ISBN:9780818621703 DOI:10.1109/GLSV.1991.143975 -
TPDL*: Extended Temporal Profile Description Language
articolo
Cabodi, Gianpiero; Camurati, Paolo Enrico; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
SOFTWARE-PRACTICE & EXPERIENCE
Vol.21 pp.20 (pp.355-374) ISSN:0038-0644
-
Diagnosis Oriented Test Pattern Generation
proceeding
Camurati, Paolo Enrico; Lioy, Antonio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: Titolo volume non avvalorato
IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667
IEEE European Design Automation Conference
pp.5 (pp.470-474) ISBN:9780818620249 DOI:10.1109/EDAC.1990.136693 -
Model Checking and Graph Theory in sequential ATPG
proceeding
Camurati, Paolo Enrico; Gilli, Marco; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: CAV 1990: Workshop on Computer-Aided Verification
CAV 1990: Workshop on Computer-Aided Verification, (Rutgers NJ (USA)) June 1990
pp.13 (pp.505-517) ISBN:9780821865941 -
A new algorithm for diagnosis-oriented automatic test pattern generation
proceeding
Camurati, Paolo Enrico; Medina, D.; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: EuroASIC 1990: IEEE EURO ASIC
IEEE Computer Society (STATI UNITI D'AMERICA)
EuroASIC 1990: IEEE EURO ASIC (Paris (France)) 29 May-1 June 1990
pp.5 (pp.332-336) ISBN:9780818620669 DOI:10.1109/EASIC.1990.207964 -
A diagnostic test pattern generation algorithm
proceeding
Camurati, Paolo Enrico; Medina, D.; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: ITC 1990: IEEE International Test Conference 1990
IEEE Computer Society (STATI UNITI D'AMERICA)
ITC 1990: IEEE International Test Conference 1990 (Washington DC (USA)) 10-14 Sept. 1990
pp.7 (pp.52-58) ISBN:9780818690648 DOI:10.1109/TEST.1990.114000 -
Exact Probabilistic Testability Measures for Multi-Output Circuits
articolo
Camurati, P; Lioy, A; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
JOURNAL OF ELECTRONIC TESTING
Kluwer Academic Publishers
Vol.1, Number 3, October 1990 pp.6 (pp.229-234) ISSN:0923-8174 DOI:10.1007/BF00938686
-
Probabilistic Testability Analysis
proceeding
Camurati, Paolo Enrico; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: CAD&CG 1989: International Conference on Computer-Aided Design & Computer Graphics
IAP – International Academic Publisher - Pergamom Press (REGNO UNITO DI GRAN BRETAGNA)
CAD&CG 1989: International Conference on Computer-Aided Design & Computer Graphics (Beijing (China)) Aug 10-12, 1989
pp.6 (pp.640-645) -
Exact probabilistic testability measures for multi-output circuits
proceeding
Camurati, Paolo Enrico; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: Robotic systems and AMT: IFIP TC5/WG5.3 International Conference on CAD/CAM and AMT, 1989
North-Holland (PAESI BASSI)
Robotic systems and AMT: IFIP TC5/WG5.3 International Conference on CAD/CAM and AMT, 1989 (Jerusalem (Israel)) Dc 11-14, 1989
ISBN:9780444888280 -
Testability measures with concurrent good simulation
proceeding
Cabodi, Gianpiero; Camurati, Paolo Enrico; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: ETC'89: IEEE 1st European Test Conference
IEEE Computer Society (STATI UNITI D'AMERICA)
ETC'89: IEEE 1st European Test Conference (Paris (France)) 12-14 April 1989
(pp.144-149) DOI:10.1109/ETC.1989.36236 -
Expressing logical and temporal conditions in simulation environments: TPDL*
articolo
Cabodi, Gianpiero; Camurati, Paolo Enrico; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
MICROPROCESSING AND MICROPROGRAMMING
Vol.26 pp.12 (pp.241-252) ISSN:0165-6074 -
Aritmetica dei Calcolatori e Codifica dell'Informazione
monografia
Mezzalama, Marco; N., Montefusco; Prinetto, Paolo Ernesto
UTET (ITALIA)
-
Random Testability Analysis: comparing and evaluating existing approaches
proceeding
Camurati, Paolo Enrico; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
In: Titolo volume non avvalorato
IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667
IEEE International Conference on Computer Design
pp.4 (pp.70-73) ISBN:9780818608728 DOI:10.1109/ICCD.1988.25662
-
Improving Diagnostic capabilities of ATEs via AI techniques
proceeding
Camurati, Paolo Enrico; Mezzalama, Marco; Prinetto, Paolo Ernesto
In: 2nd European Workshop on Fault Diagnostics, Reliability and Related Knowledge-based Approaches
Pergamon (REGNO UNITO DI GRAN BRETAGNA)
2nd European Workshop on Fault Diagnostics, Reliability and Related Knowledge-based Approaches (Manchester (UK)) April 1987
ISBN:9780080349220
-
C_TPDL* : adapting TPDL* to concurrent simulation environments
articolo
Cabodi, Gianpiero; Camurati, Paolo Enrico; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
MICROPROCESSING AND MICROPROGRAMMING
Elsevier
Vol.18 pp.8 (pp.39-46) ISSN:0165-6074 -
Experiences in Prolog based DFT rule checking
proceeding
Cabodi, Gianpiero; Camurati, Paolo Enrico; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
FJCC'86: IEEE Fall Joint Computer Conference (Dallas, Texas (USA)) November 1986
(pp.909-914)
-
Testing Strategy and Technique for Macro-Based Circuits
articolo
Somenzi, F; Gai, S; Mezzalama, Marco; Prinetto, Paolo Ernesto
IEEE TRANSACTIONS ON COMPUTERS
Vol.C-34, Issue 1, Jan. 1985 (pp.85-90) ISSN:0018-9340 DOI:10.1109/TC.1985.1676519
-
Microprogram Simulation Using a Structured Microcode Model
articolo
Mezzalama, Marco; Prinetto, Paolo Ernesto
MICROPROCESSORS AND MICROSYSTEMS
Butterworth Heinemann
Vol.13 pp.16 (pp.299-314) ISSN:0141-9331 -
PART: Programmable Array Testing Based on a Partitioning Algorithm
articolo
Somenzi, F.; Gai, Silvano; Mezzalama, Marco; Prinetto, Paolo Ernesto
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
IEEE
Vol.3 pp.8 (pp.142-149) ISSN:0278-0070 DOI:10.1109/TCAD.1984.1270068
-
``Experiments in Automatic Classification of Laringeal Pathology
articolo
B., Morra; Mezzalama, Marco; Prinetto, Paolo Ernesto
MEDICAL & BIOLOGICAL ENGINEERING & COMPUTING
Peter Peregrinus
Vol.21 pp.9 (pp.603-611) ISSN:0140-0118 -
A Review of Fault Models for LSI/VLSI Devices
articolo
S., Gai; Mezzalama, Marco; Prinetto, Paolo Ernesto
SOFTWARE & MICROSYSTEMS
stevenage
Vol.2 pp.10 (pp.44-53) ISSN:0261-3182 -
ORION: an integrated system for LSI-VLSI automated synthesis
proceeding
Gai, S.; Mezzalama, Marco; Prinetto, Paolo Ernesto
In: MELECON '83: 2nd IEEE Mediterranean Electrotechnical Conference
IEEE Computer Society (STATI UNITI D'AMERICA)
MELECON '83: 2nd IEEE Mediterranean Electrotechnical Conference (Athens (Greece)) May 24-26, 1983
ISBN:9789994603565 -
PLA simulation in a RTL environment
proceeding
Gai, S.; Mezzalama, Marco; Prinetto, Paolo Ernesto
In: MELECON '83: 2nd IEEE Mediterranean Electrotechnical Conference
IEEE Computer Society (STATI UNITI D'AMERICA)
MELECON '83: 2nd IEEE Mediterranean Electrotechnical Conference (Athens (Greece)) May 24-26, 1983
ISBN:9789994603565 -
PART: Programmable ARray Testing based on PARTitioning algorithm
proceeding
Somenzi, F.; Gai, S.; Mezzalama, Marco; Prinetto, Paolo Ernesto
In: Titolo volume non avvalorato
IEEE Computer Society (STATI UNITI D'AMERICA)
ISCAS'83: IEEE 1983 International Symposium on Circuits and Systems. (Newport Beach, CA (USA).) May 2-4, 1983
pp.4 (pp.1298-1301) ISBN:9789993993957 -
Testing strategies for PLA based circuits
proceeding
Somenzi, F.; Gai, S.; Mezzalama, Marco; Prinetto, Paolo Ernesto
In: ISCAS'83: IEEE 1983 International Symposium on Circuits and Systems
IEEE Computer Society (STATI UNITI D'AMERICA)
ISCAS'83: IEEE 1983 International Symposium on Circuits and Systems (Newport Beach, CA (USA)) May 2-4, 1983
pp.4 (pp.1302-1305) ISBN:9789993993957 -
Testable design with PLA macros
proceeding
Gai, S.; Mezzalama, Marco; Prinetto, Paolo Ernesto; Somenzi, F.
In: VLSI'83: IFIP TC 10/WG 10.5 International Conference on Very Large Scale Integration, 1983
North-Holland Publishing Co. (PAESI BASSI)
VLSI'83: IFIP TC 10/WG 10.5 International Conference on Very Large Scale Integration, 1983 (Trondheim (Norway),) Aug 16-19, 1983
pp.10 (pp.373-382) ISBN:9780444883445 -
PART: Programmable ARray Testing based on PARTitioning algorithm
proceeding
Somenzi, F.; Gai, S.; Mezzalama, Marco; Prinetto, Paolo Ernesto
In: FTCS-13: IEEE 13th International Conference on Fault Tolerant Computing
IEEE Computer Society (STATI UNITI D'AMERICA)
FTCS-13: IEEE 13th International Conference on Fault Tolerant Computing (Milano (Italy)) June 1983
pp.4 (pp.430-433) ISBN:9780818600203 -
A New Integrated System for PLA Testing and Verification
proceeding
Somenzi, F.; Gai, S.; Mezzalama, Marco; Prinetto, Paolo Ernesto
In: DAC 1983 : 20th Conference on Design Automation 1983
IEEE Computer Society (STATI UNITI D'AMERICA)
DAC 1983 : 20th Conference on Design Automation 1983 (Miami, FL (USA)) 27-29 June 1983
pp.7 (pp.57-63) ISBN:9780818600265 -
A Hierarchical Description Model for Microcode
articolo
Mezzalama, Marco; Prinetto, Paolo Ernesto
IEEE TRANSACTIONS ON COMPUTERS
Vol.C-32, Issue 5, May 1983 (pp.478-487) ISSN:0018-9340 DOI:10.1109/TC.1983.1676259
-
A Machine-Independent Approach to Microprogram Synthesis
articolo
Mezzalama, Marco; Prinetto, Paolo Ernesto
SOFTWARE-PRACTICE & EXPERIENCE
WILEY
Vol.12 pp.26 (pp.985-1010) ISSN:0038-0644 -
A Microcomputer-based eye movement automatic analysis system
proceeding
Albera, R.; Massia, G.; Mezzalama, Marco; Monetti, M.; Morra, B.; Prinetto, Paolo Ernesto
In: MEDCOMP '82: first IEEE Computer Society International Conference on Medical Computer Science/Computational Medicine
IEEE Computer Society (STATI UNITI D'AMERICA)
MEDCOMP '82: first IEEE Computer Society International Conference on Medical Computer Science/Computational Medicine (Philadelphia PE (USA),) Sept 23-25, 1982
pp.6 (pp.248-253) -
Microcode compaction via microblock definition
proceeding
Mezzalama, Marco; Prinetto, Paolo Ernesto; Filippi, G.
In: MICRO 15 : IEEE 15th annual workshop on Microprogramming
IEEE Computer Society (STATI UNITI D'AMERICA)
MICRO 15 : IEEE 15th annual workshop on Microprogramming
pp.9 (pp.134-142) -
Eye Movement Automated Analysis: A New Improved Approach
proceeding
Morra, B.; Albera, R.; Massia, G.; Mezzalama, Marco; Monetti, M.; Prinetto, Paolo Ernesto
In: ISMII’82: IEEE 1st International Symposium on Medical Imaging and Image Interpretation
ISMII’82: IEEE 1st International Symposium on Medical Imaging and Image Interpretation (Berlin (Germany)) Oct 1982
pp.7 (pp.203-209) ISBN:9780892524105 DOI:10.1117/12.934629
-
A Strategy for Simulating Bit-Slice Based Microprogrammable Systems
articolo
Mezzalama, Marco; Prinetto, Paolo Ernesto
MICROPROCESSING AND MICROPROGRAMMING
ELSEVIER
Vol.7 pp.10 (pp.334-343) ISSN:0165-6074 -
DEFASM: a Microprogram Meta-assembler With Semantic Capability
articolo
Mezzalama, Marco; Prinetto, Paolo Ernesto; S., Romani
SOFTWARE & MICROSYSTEMS
Stevenage, Herts.: Institution of Electrical Engineers
Vol.128 pp.10 (pp.133-142) ISSN:0261-3182 -
Microinstruction Modeling using timing and semantic constraints
proceeding
Mezzalama, Marco; Prinetto, Paolo Ernesto
In: SMD’81 : Simulation, Modeling and Development
Acta Press (STATI UNITI D'AMERICA)
SMD’81 : Simulation, Modeling and Development (Cairo (Egypt)) Sep 1-3, 1981
pp.4 (pp.32-35) ISBN:9780889860308 -
A hierarchical integrated system for microcode development
proceeding
Mezzalama, Marco; Prinetto, Paolo Ernesto; Visintin, I.
In: EUROMICRO `81: 7th Euromicro Symposium on Implementing Functions: Microprocessing and Firmware
Elsevier Science Ltd
EUROMICRO `81: 7th Euromicro Symposium on Implementing Functions: Microprocessing and Firmware (Paris (France)) Sept 1981
pp.10 (pp.251-260) ISBN:9780444862822 -
Testing strategies for VLSI’s
proceeding
Mezzalama, Marco; Prinetto, Paolo Ernesto
In: ICCSCS 1981: 4th Int. Conference on Control System and Computer Science
I.P.B. Centrul de multiplicare - Str Splaiul Independentei, 313 (ROMANIA)
ICCSCS 1981: 4th Int. Conference on Control System and Computer Science (Bucharest (Rumania)) June 17-20, 1981
Vol.1 pp.7 (pp.287-293) -
Firmware description languages for a microprogram meta assembler
proceeding
Mezzalama, Marco; Prinetto, Paolo Ernesto
In: CHDL'81: IFIP TC-10 Fifth International Conference on Computer Hardware Description Languages and Their Applications, 1981
North-Holland Publishing Co. (PAESI BASSI)
CHDL'81: IFIP TC-10 Fifth International Conference on Computer Hardware Description Languages and Their Applications, 1981 (Kaiserslautern (Germany)) Sept 7-9, 1981
pp.14 (pp.267-280) ISBN:9780444862792 -
Timing analysis and logic verification via user selectable multiple value logics
proceeding
Mezzalama, Marco; Prinetto, Paolo Ernesto; Visintin, I.
In: ECCTD’81
Delft University Press - North-Holland Publishing Company
ECCTD’81 : IEEE European Conference on Circuit Theory and Design (The Hague (The Netherlands)) August 1981
pp.6 (pp.346-351) -
Needs and trends on host computer organization to aid VLSI design
proceeding
Mezzalama, Marco; Prinetto, Paolo Ernesto
In: MELECON `81 : IEEE 1st Mediterranean Electrotechnical Conference
IEEE (STATI UNITI D'AMERICA)
MELECON `81 : IEEE 1st Mediterranean Electrotechnical Conference (Tel Aviv (Israel)) May 24-28, 1981
pp.1 ISBN:9789991737010 -
Optimal choice of multiple value sets for logic design verification
proceeding
Mezzalama, Marco; Prinetto, Paolo Ernesto; Visintin, I.
In: APCMS 1981 : 12th annual Pittsburg Conference on Modelling and Simulation
School of Engineering, University of Pittsburgh (STATI UNITI D'AMERICA)
APCMS 1981 : 12th annual Pittsburg Conference on Modelling and Simulation (Pittsburg PE (USA)) Apr 30-May 1, 1981
Vol.12 - part 4 pp.7 (pp.1513-1519) ISBN:9780876645628
-
A machine instruction level concurrent simulator for multiprocessor systems
proceeding
Meo, ANGELO RAFFAELE; Mezzalama, Marco; Prinetto, Paolo Ernesto
In: EUROMICRO’80 : Microprocessor systems
EUROMICRO’80 : Microprocessor systems (London (U.K.)) September 1980
pp.10 (pp.125-134) -
DESMI: a procedual H.D.L. for machine instruction specification
proceeding
Mezzalama, Marco; Prinetto, Paolo Ernesto
In: MIMI’80 : Mini and microcomputers and their applications
Acta Press (STATI UNITI D'AMERICA)
MIMI’80 : Mini and microcomputers and their applications (Budapest (Hungary)) September 1980
pp.7 (pp.302-308) ISBN:9780889860247
-
Design and implementation of a flexible and interactive microprogram simulator
proceeding
Mezzalama, Marco; Prinetto, Paolo Ernesto
In: MICRO 12 : IEEE 12th Annual Microprogramming Workshop
IEEE Computer Society (STATI UNITI D'AMERICA)
MICRO 12 : IEEE 12th Annual Microprogramming Workshop (Hershey, PE (USA)) Nov 18-21, 1979
pp.7 (pp.42-48) -
Hardware-software trade-offs in evaluation of mathematical functions in microcomputers
proceeding
Mezzalama, Marco; Prinetto, Paolo Ernesto
In: Informatica 1979 : XIV Yugoslav International Symposium on Information Processing
INFORMATIKA, Slovene Computer Society
Informatica 1979 : XIV Yugoslav International Symposium on Information Processing (Bled (Yugoslavia)) Oct 1-6, 1979
-
An interactive microprogram simulator
proceeding
Mezzalama, Marco; Prinetto, Paolo Ernesto
In: MIMI 1979 : IEEE 1st International Micro and Mini Computer Conference
IEEE Computer Society (STATI UNITI D'AMERICA)
MIMI 1979 : IEEE 1st International Micro and Mini Computer Conference (Houston, TX (USA)) November 1979
pp.6 (pp.159-164)
-
MAP: a proposal for a microprogrammable arithmetic processor
proceeding
Mezzalama, Marco; Prinetto, Paolo Ernesto
In: Informatica 1978 : XIII Yugoslav International Symposium on Information Processing
Informatica 1978 : XIII Yugoslav International Symposium on Information Processing (Bled (Yugoslavia)) Oct 2-7, 1978
-
Resiliency approaches in Convolutional, Photonic, and Spiking Neural Networks