Docente esterno e/o collaboratore didattico
Scuola di Dottorato (SCDOTT)
Didattica
Insegnamenti
Dottorato di ricerca
- Advanced techniques for digital testing. A.A. 2023/24, INGEGNERIA INFORMATICA E DEI SISTEMI. Collaboratore del corso
- Advanced techniques for digital testing. A.A. 2022/23, INGEGNERIA INFORMATICA E DEI SISTEMI. Collaboratore del corso
- Advanced techniques for digital testing. A.A. 2021/22, INGEGNERIA INFORMATICA E DEI SISTEMI. Collaboratore del corso
- Advanced techniques for digital testing. A.A. 2020/21, INGEGNERIA INFORMATICA E DEI SISTEMI. Collaboratore del corso
Pubblicazioni
Pubblicazioni più recenti Vedi tutte le pubblicazioni su Porto@Iris
- Ahmadilivani, Mh; Barbareschi, M; Barone, S; Bosio, A; Daneshtalab, M; Della Torca, S; ... (2023)
Special Session: Approximation and Fault Resiliency of DNN Accelerators. In: 2023 IEEE 41st VLSI Test Symposium (VTS), San Diego (USA), 24-26 April 2023, pp. 1-10. ISBN: 979-8-3503-4630-5
Contributo in Atti di Convegno (Proceeding) - Bosio, Alberto; Di Carlo, Stefano; Girard, Patrick; Ruospo, Annachiara; Sanchez, ... (2022)
Design, Verification, Test, and In-Field Implications of Approximate Digital Integrated Circuits. In: Approximate Computing Techniques From Component- to Application-Level / Bosio A., Ménard D., Sentieys O., S.L., Springer Nature, pp. 349-385. ISBN: 978-3-030-94704-0
Contributo in Volume - Bosio, A.; Canal, R.; Di Carlo, S.; Gizopoulos, D.; Savino, A. (2020)
Cross-layer soft-error resilience analysis of computing systems. In: 50th Annual IEEE/IFIP International Conference on Dependable Systems and Networks: Supplemental Volume, DSN-S 2020, Valencia, Spain, Spain, 29 June-2 July 2020, pp. 79-79. ISBN: 978-1-7281-7260-6
Contributo in Atti di Convegno (Proceeding) - Mamone, Dario; Bosio, Alberto; Savino, Alessandro; Hamdioui, Said; Rebaudengo, Maurizio (2020)
On the Analysis of Real-time Operating System Reliability in Embedded Systems. In: 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Frascati, Italy, Italy, 19-21 Oct. 2020, pp. 1-6. ISBN: 978-1-7281-9457-8
Contributo in Atti di Convegno (Proceeding) - Bosio, A.; Di Carlo, S.; Girard, P.; Sanchez, E.; Savino, A.; Sekanina, L.; Traiola, M.; ... (2020)
Design, Verification, Test and In-Field Implications of Approximate Computing Systems. In: 2020 IEEE European Test Symposium (ETS), Tallinn, Estonia, Estonia, 25-29 May 2020, pp. 1-10. ISBN: 978-1-7281-4312-5
Contributo in Atti di Convegno (Proceeding) - Ruospo, Annachiara; Balaara, Angelo; Bosio, Alberto; Ernesto, Sanchez (2020)
A Pipelined Multi-Level Fault Injector for Deep Neural Networks. In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), ESA-ESRIN, Frascati (Rome) Italy, October 19 – October 21, 2020
Contributo in Atti di Convegno (Proceeding) - Ruospo, Annachiara; Bosio, Alberto; Ianne, Alessandro; Ernesto, Sanchez (2020)
Evaluating Convolutional Neural Networks Reliability depending on their Data Representation. In: Euromicro Conference on Digital System Design (DSD) 2020, Kranj, Slovenia (virtual event), August 26 – 28, 2020, pp. 672-679
Contributo in Atti di Convegno (Proceeding) - Bernardi, Paolo; Bosio, Alberto; Di Natale, Giorgio; Guerriero, Andrea; Sanchez, ... (2017)
Improving stress quality for SoC using faster-than-at-speed execution of functional programs. In: IFIP Advances in Information and Communication Technology / Bernardi, Paolo, S.L., Springer New York LLC, pp. 130-151. ISBN: 9783319671031
Contributo in Volume - Touati, A.; Girard, P.; Virazel, A.; Bosio, Alberto; Bernardi, Paolo; SONZA REORDA, ... (2017)
Microprocessor Testing: Functional Meets Structural Test. In: JOURNAL OF CIRCUITS, SYSTEMS, AND COMPUTERS, vol. 26, pp. 1-18. ISSN 0218-1266
Contributo su Rivista - Harcha, Ghita; Girard, Patrick; Virazel, Arnaud; Bosio, Alberto; Bernardi, Paolo (2017)
An Effective Fault-Injection Framework for Memory Reliability Enhancement Perspectives. In: Design &Technology of Integrated Systems in Nanoscale Era
Contributo in Atti di Convegno (Proceeding) - Touati, A.; Bosio, Alberto; Girard, P.; Virazel, A.; Bernardi, Paolo; SONZA REORDA, ... (2016)
An effective approach for functional test programs compaction. In: 19th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2016, svk, 2016, pp. 1-6. ISBN: 9781509024674
Contributo in Atti di Convegno (Proceeding) - Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; Prinetto, Paolo Ernesto (2009)
Are IEEE 1500 compliant cores really compliant to the standard?. In: IEEE DESIGN & TEST OF COMPUTERS, vol. 26, pp. 16-24. ISSN 0740-7475
Contributo su Rivista - Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo ... (2008)
March Test Generation Revealed. In: IEEE TRANSACTIONS ON COMPUTERS, vol. 57, pp. 1704-1713. ISSN 0018-9340
Contributo su Rivista - Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; Mariani, R. (2007)
A Functional Verification based Fault Injection Environment. In: IEEE 22nd International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTS), Roma, IT, 26-28 Sept. 2007, pp. 114-122. ISBN: 9780769528854
Contributo in Atti di Convegno (Proceeding) - Benso, Alfredo; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Bosio, Alberto (2007)
Automating the IEEE std. 1500 compliance verification for embedded cores. In: IEEE International High Level Design Validation and Test Workshop (HLDVT), Irvine (CA), USA, 7-9 Nov. 2007, pp. 171-178
Contributo in Atti di Convegno (Proceeding) - Benso, Alfredo; Bosio, Alberto; Prinetto, Paolo Ernesto; Savino, Alessandro (2006)
A Black-Box-Oriented Test Methodology. In: IEEE East-West Design & Test Workshop (EWDTW06), Sochi (Russia), Sept. 15-19, 2006, pp. 11-15. ISBN: 9666591243
Contributo in Atti di Convegno (Proceeding) - Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo ... (2006)
ATPG for Dynamic Burn-In Test in Full-Scan Circuits. In: IEEE 15th Asian Test Symposium (ATS), Fukuoka, JP, 20-23 Nov. 2006, pp. 75-82
Contributo in Atti di Convegno (Proceeding) - Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo ... (2006)
A 22n March Test for Realistic Static Linked Faults in SRAMs. In: IEEE 11th European Test Symposium (ETS), SouthAmpton, UK, 21-24 May 2006, pp. 49-54
Contributo in Atti di Convegno (Proceeding) - Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo ... (2006)
Memory Fault Simulator for Static-Linked Faults. In: IEEE 15th AsianTest Symposium (ATS), Fukuoka, JP, 20-23 Nov. 2006, pp. 31-36. ISBN: 0769526284
Contributo in Atti di Convegno (Proceeding) - Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo ... (2006)
Automatic March tests generation for multi-port SRAMs. In: IEEE 3rd International Workshop on Electronic Design, Test and Applications (DELTA), Kuala Lumpur, MY, 17-19 Jan. 2006, pp. 385-392. ISBN: 0769525008
Contributo in Atti di Convegno (Proceeding)