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Pubblicazioni più recenti

Gavarini, Gabriele; Stucchi, Diego; Ruospo, Annachiara; Boracchi, Giacomo; Sanchez, ... (In stampa)
Open-Set Recognition: an Inexpensive Strategy to Increase DNN Reliability. In: The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2022), Torino, September, 12th-14th 2022
Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; ... (2022)
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. In: 2022 IEEE European Test Symposium (ETS), Barcelona (Spain), 23-27 May 2022, pp. 1-10. ISBN: 978-1-6654-6706-3
Ruospo, Annachiara (2022)
Reliability and Security Assessment of Modern Embedded Devices. relatore: SANCHEZ SANCHEZ, EDGAR ERNESTO; , 34. XXIV Ciclo, P.: 193
Bosio, Alberto; Di Carlo, Stefano; Girard, Patrick; Ruospo, Annachiara; Sanchez, ... (2022)
Design, Verification, Test, and In-Field Implications of Approximate Digital Integrated Circuits. In: Approximate Computing Techniques From Component- to Application-Level / Bosio A., Ménard D., Sentieys O., S.L., Springer Nature, pp. 349-385. ISBN: 978-3-030-94704-0
Ruospo, Annachiara; Gavarini, Gabriele; Bragaglia, Ilaria; Traiola, Marcello; Bosio, ... (2022)
Selective Hardening of Critical Neurons in Deep Neural Networks. In: 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems – DDECS 2022, Prague, Czech Republic, April 6 – 8, 2022, pp. 136-141
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