BOYANG DU

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Docente a contratto e/o collaboratore didattico
Docente a contratto e/o collaboratore didattico (Scuola di Dottorato)

Pubblicazioni più recenti

Bozzoli, L.; De Sio, C.; Du, B.; Sterpone, L. (2021)
A Neutron Generator Testing Platform for the Radiation Analysis of SRAM-based FPGAs. In: IEEE International Instrumentation and Measurement Technology Conference (I2MTC), Glasgow, United Kingdom, 17-20 May 2021, pp. 1-5. ISBN: 978-1-7281-9539-1
Du, Boyang; Azimi, Sarah; Moramarco, Annarita; Sabena, Davide; Parisi, Filippo; ... (2021)
An Automated Continuous Integration Multitest Platform for Automotive Systems. In: IEEE SYSTEMS JOURNAL, pp. 1-12. ISSN 1932-8184 Download fulltext
Yang, Weitao; Du, Boyang; He, Chaohui; Sterpone, Luca (2021)
Reliability assessment on 16 nm ultrascale+ MPSoC using fault injection and fault tree analysis. In: MICROELECTRONICS RELIABILITY, vol. 120. ISSN 0026-2714
Rodriguez Condia, Josie Esteban; Du, Boyang; Roascio, Gianluca; Scie, Edouard; Guerrero ... (2020)
Programmers manual FlexGripPlus SASS SM 1.0. pp. 1-67 Download fulltext
Yang, W.; Li, Y.; Zhang, W.; Guo, Y.; Zhao, H.; Wei, J.; Li, Y.; He, C.; Chen, K.; Guo, ... (2020)
Electron inducing soft errors in 28 nm system-on-Chip. In: RADIATION EFFECTS AND DEFECTS IN SOLIDS, vol. 175, pp. 745-754. ISSN 1042-0150
Azimi, Sarah; Du, Boyang; De Sio, Corrado; Sterpone, Luca (2020)
On the Mitigation of Single Event Transient in 3D LUT by In-Cell Layout Resizing. In: 31th IEEE Radiation and its Effects on Components and System (RADECS), pp. 1-4 Download fulltext
Sterpone, L.; Luoni, F.; Azimi, S.; Du, B. (2020)
A 3D Simulation-based Approach to Analyze Heavy Ions-induced SET on Digital Circuits. In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. ISSN 0018-9499 Download fulltext
Rodriguez Condia, Josie E.; Du, Boyang; Sonza Reorda, Matteo; Sterpone, Luca (2020)
FlexGripPlus: An improved GPGPU model to support reliability analysis. In: MICROELECTRONICS RELIABILITY, vol. 109, pp. 1-14. ISSN 0026-2714 Download fulltext
De Sio, C.; Azimi, S.; Bozzoli, L.; Du, B.; Sterpone, L. (2019)
Radiation-induced Single Event Transient effects during the reconfiguration process of SRAM-based FPGAs. In: MICROELECTRONICS RELIABILITY. ISSN 0026-2714
Du, B.; RODRIGUEZ CONDIA, JOSIE ESTEBAN; Reorda, M. S. (2019)
An extended model to support detailed GPGPU reliability analysis. In: 14th IEEE International Conference on Design and Technology of Integrated Systems In Nanoscale Era, DTIS 2019, grc, 2019, pp. 1-6. ISBN: 978-1-7281-3424-6 Download fulltext
Du, Boyang; Azimi, Sarah; De Sio, Corrado; Bozzoli, Ludovica; Sterpone, Luca (2019)
On the Reliability of Convolutional Neural Network Implementation on SRAM-based FPGA. In: The 32nd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology, ESA-ESTEC & TU Delft, Netherlands, 02/10/2019 - 04/10/2019
Sterpone, Luca; Bozzoli, Ludovica; DE SIO, Corrado; Du, Boyang; Azimi, Sarah (2019)
Analysis of Radiation-induced SETs in 3D VLSI Face-to-Back LUTs. In: 30th IEEE Radiation and its Effects on Components and Systems (RADECS 2019)
Sterpone, Luca; Azimi, Sarah; Du, Boyang; Luoni, Francesca (2019)
Rad-Ray: A new Simulation Tool for the Analysis of Heavy Ions-induced SETs on ICs. In: 30th IEEE Radiation and its Effects on Components and Systems (RADECS 2019)
Sterpone, Luca; Bozzoli, Ludovica; DE SIO, Corrado; Du, Boyang; Azimi, Sarah (2019)
A new Method for the Analysis of Radiation-induced Effects in 3D VLSI Face-to-Back LUTs. In: IEEE International Conference on Synthesis, modeling, analysis and Simulation methods and applications to circuit design (SMACD) Download fulltext
Du, B.; Rodriguez Condia, Josie E.; Sonza Reorda, M.; Sterpone, L. (2019)
On the evaluation of SEU effects in GPGPUs. In: 2019 IEEE Latin American Test Symposium (LATS), Santiago, Chile, 11-13 March 2019, pp. 1-6. ISBN: 978-1-7281-1756-0 Download fulltext
Sterpone, Luca; Du, Boyang; Azimi, Sarah (2019)
SETA-RAY: A New IDE tool for Predicting, Analyzing and Mitigating Radiation-induced Soft Errors on FPGAs. In: IEEE design, automation and test in Europe - DATE 2019 Download fulltext
DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca; Du, Boyang (2019)
Analyzing Radiation-induced Transient Errors on SRAM-based FPGAs by Propagation of Broadening Effect. In: IEEE ACCESS, vol. 7, pp. 140182-140189. ISSN 2169-3536 Download fulltext
Azimi, Sarah; Du, Boyang; Sterpone, Luca; Merodio Codinachs, David; Grimoldi, Raoul; ... (2019)
A new CAD tool for Single Event Transient Analysis and Mitigation on Flash-based FPGAs. In: INTEGRATION, vol. 67, pp. 73-81. ISSN 0167-9260
DU, BOYANG; STERPONE, LUCA; AZIMI, SARAH; Merodio Codinachs, David; Ferlet-Cavrois, ... (2019)
Ultra High Energy Heavy Ion Test Beam on Xilinx Kintex-7 SRAM-based FPGA. In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE, vol. 66, pp. 1813-1819. ISSN 0018-9499
Azimi, S.; Sterpone, L.; Du, B.; Boragno, L. (2018)
On the analysis of radiation-induced Single Event Transients on SRAM-based FPGAs. In: MICROELECTRONICS RELIABILITY, vol. 88-90, pp. 936-940. ISSN 0026-2714
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