CORRADO DE SIO

Pubblicazioni degli ultimi anni

Vacca, Eleonora; De Sio, Corrado; Azimi, Sarah (2022)
Layout-oriented Radiation Effects Mitigation in RISC-V Soft Processor. In: 19th ACM International Conference on Computing Frontiers 2022, Torino, May 2022, pp. 1-6
Sterpone, L.; Azimi, S.; De Sio, C.; Parisi, F. (2022)
Analysis and Mitigation of Soft-Errors on High Performance Embedded GPUs. In: 21st IEEE International Symposium on Parallel and Distributed Computing, Basel (Switzerland), July, 2022, pp. 1-8
Portaluri, Andrea; Azimi, Sarah; De Sio, Corrado; Sterpone, Luca; Merodio Codinachs, ... (2022)
Radiation-induced Effects on DMA Data Transfer in Reconfigurable Devices. In: IEEE The 28th International Symposium on On-Line Testing and Robust System Design (IOLTS 2022), Turin, 12-14 September 2022, pp. 1-7
De Sio, C.; Azimi, S.; Sterpone, L. (2022)
FireNN: Neural Networks Reliability Evaluation on Hybrid Platforms. In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING, pp. 1-1. ISSN 2168-6750
Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; de ... (2022)
Test, Reliability and Functional Safety trends for Automotive System-on-Chip. In: IEEE European Test Symposium
Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; ... (2022)
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. In: 2022 IEEE European Test Symposium (ETS), Barcelona (Spain), 23-27 May 2022, pp. 1-10. ISBN: 978-1-6654-6706-3
Azimi, Sarah; De Sio, Corrado; Sterpone, Luca (2022)
A Placement-Oriented Mitigation Technique for Single Event Effect in Monolithic 3D IC. In: IEEE International Conference on Synthesis, modeling, analysis and Simulation methods and applications to circuit design - SMACD 2022, Sardinia, Italy, June 2022, pp. 1-4
Portaluri, Andrea; Azimi, Sarah; DE SIO, Corrado; Rizzieri, Daniele; Sterpone, Luca (2022)
On the Reliability of Real-time Operating System on Embedded Soft Processor for Space Applications. In: 35th GI/ITG International Conference on Architecture of Computing Systems, Heilbronn (Germany), September, 2022, pp. 1-14
Azimi, S.; De Sio, C.; Portaluri, A.; Rizzieri, D.; Sterpone, L. (2022)
A Comparative Radiation Analysis of Reconfigurable Memory Technologies: FinFET versus Bulk CMOS. In: MICROELECTRONICS RELIABILITY, pp. 1-6. ISSN 0026-2714
Bozzoli, L.; De Sio, C.; Du, B.; Sterpone, L. (2021)
A Neutron Generator Testing Platform for the Radiation Analysis of SRAM-based FPGAs. In: IEEE International Instrumentation and Measurement Technology Conference (I2MTC), Glasgow, United Kingdom, 17-20 May 2021, pp. 1-5. ISBN: 978-1-7281-9539-1
Azimi, Sarah; De Sio, Corrado; Sterpone, Luca (2021)
Analysis of Radiation-induced Transient Errors on 7nm FinFET Technology. In: MICROELECTRONICS RELIABILITY, vol. 126. ISSN 0026-2714
Azimi, Sarah; De Sio, Corrado; Sterpone, Luca (2021)
On the Evaluation of SEEs on Open-Source Embedded Static RAMs. In: IEEE International Conference on Very Large Scale Integration (VLSI-SoC), 4-7 October 2021, pp. 1-6
De Sio, Corrado; Azimi, Sarah; Portaluri, Andrea; Sterpone, Luca (2021)
SEU Evaluation of Hardened-by-Replication Software in RISC-V Soft Processor. In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), Athens (GR), 6-8 October 2019, pp. 1-6
Azimi, Sarah; De Sio, Corrado; Rizzieri, Daniele; Sterpone, Luca (2021)
Analysis of Single Event Effects on Embedded Processor. In: ELECTRONICS, vol. 10. ISSN 2079-9292
Yang, Wei-Tao; Du, Xue-Cheng; Li, Yong-Hong; He, Chao-Hui; Guo, Gang; Shi, Shu-Ting; ... (2021)
Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis. In: NUCLEAR SCIENCE AND TECHNIQUES, vol. 32. ISSN 1001-8042
Azimi, Sarah; De Sio, Corrado; Sterpone, Luca (2021)
A Radiation-Hardened CMOS Full-Adder Based on Layout Selective Transistor Duplication. In: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, vol. 29, pp. 1596-1600. ISSN 1063-8210
Azimi, Sarah; DE SIO, Corrado; Sterpone, Luca (2021)
A 3-D LUT Design for Transient Error Detection Via Inter-Tier In-Silicon Radiation Sensor. In: Design, Automation and Test in Europe Conference (DATE2021), February 2021, pp. 1-6
Portaluri, Andrea; De Sio, Corrado; Azimi, Sarah; Sterpone, Luca (2021)
A New Domains-based Isolation Design Flow for Reconfigurable SoCs. In: IEEE International Symposium on On-Line Testing and robust System Design (IOLTS 2021), pp. 1-7
De Sio, C.; Azimi, S.; Sterpone, L. (2020)
On the Analysis of Radiation-induced Failures in the AXI Interconnect Module. In: MICROELECTRONICS RELIABILITY, vol. 114. ISSN 0026-2714
De Sio, C.; Azimi, S.; Sterpone, L. (2020)
On the evaluation of SEU effects on AXI interconnect within AP-SoCs. In: 33rd International Conference on Architecture of Computing Systems, ARCS 2020, deu, 2020, pp. 215-227. ISSN 0302-9743. ISBN: 978-3-030-52793-8
Azimi, Sarah; De Sio, Corrado; Sterpone, Luca (2020)
In-Circuit Mitigation Approach of Single Event Transients for 45nm Flip-Flops. In: 26th IEEE International Symposium on On-Line Testing and robust System Design (IOLT 2020), 13-15 July 2020, pp. 1-6. ISBN: 978-1-7281-8187-5
DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca (2020)
An Emulation Platform for Evaluating the Reliability of Deep Neural Networks. In: The 33th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology (DFT 2020), 19-21 Oct. 2020, pp. 1-4
Azimi, Sarah; Du, Boyang; DE SIO, Corrado; Sterpone, Luca (2020)
On the Mitigation of Single Event Transient in 3D LUT by In-Cell Layout Resizing. In: 31th IEEE Radiation and its Effects on Components and System (RADECS), pp. 1-4
Azimi, Sarah; DE SIO, Corrado; Yang, Weitao; Sterpone, Luca (2020)
A New Single Event Transient Hardened Floating Gate Configurable Logic Circuit. In: 18th IEEE International NEWCAS, Montreal, Canada, June 16-19, 2020, pp. 311-314
Vedi tutte le pubblicazioni su Porto@Iris