Pubblicazioni più recenti

Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza ... (In stampa)
A comparative overview of ATPG flows targeting traditional and cell-aware fault models. In: 29th IEEE International Conference on Electronics Circuits and Systems (ICECS), Glasgow, 24th - 26th October 2022, pp. 1-4
Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; ... (In stampa)
Recent Trends and Perspectives on Defect-Oriented Testing. In: The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS)
Mirabella, N.; Grosso, M.; Franchino, G.; Rinaudo, S.; Deretzis, I.; La Magna, A.; ... (2022)
An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells. In: ELECTRONICS, vol. 11. ISSN 2079-9292
Mirabella, Nunzio; Ricci, Maurizio; Calà, Ignazio; Lanza, Roberto; Grosso, Michelangelo (2021)
Testing single via related defectsin digital VLSI designs. In: MICROELECTRONICS RELIABILITY, vol. 120. ISSN 0026-2714
Mirabella, Nunzio; Grosso, Michelangelo; Franchino, Giovanna; Rinaudo, Salvatore; ... (2021)
Comparing different solutions for testing resistive defects in low-power SRAMs. In: 22nd IEEE Latin-American Test Symposium 2021, Porto Alegre (Brazil), 27th - 29th October 2021, pp. 1-6
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