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Professore Associato (L.240)

+39 0110907183 / 7183 (DAUIN)

Pubblicazioni più recenti

Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; ... (In stampa)
Recent Trends and Perspectives on Defect-Oriented Testing. In: The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS)
Angione, Francesco; Bernardi, Paolo; Calabrese, Andrea; Cardone, Lorenzo; Niccoletti, ... (In stampa)
An innovative Strategy to Quickly Grade Functional Test Programs. In: International Test Conference
Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; Tempesta, Claudia; SONZA ... (In stampa)
Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level. In: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; ... (2022)
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. In: 2022 IEEE European Test Symposium (ETS), Barcelona (Spain), 23-27 May 2022, pp. 1-10. ISBN: 978-1-6654-6706-3
Angione, F.; Appello, D.; Bernardi, P.; Bertani, C.; Gallo, G.; Littardi, S.; Pollaccia, ... (2022)
A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress. In: IEEE TRANSACTIONS ON COMPUTERS, pp. 1-14. ISSN 0018-9340
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