PAOLO RECH

Scarica il contatto come vcard Foto

Assegnista di Ricerca

Pubblicazioni più recenti

Fernandes dos Santos, Fernando; Kumas Sastry Hari, Siva; Martins Basso, Pedro; Carro, ... (In stampa)
Demystifying GPU Reliability: Comparing and Combining Beam Experiments, Fault Simulation, and Profiling. In: 35th IEEE International Parallel & Distributed Processing Symposium (IPDPS) Download fulltext
Pagliarini, Samuel; Benites, Luis; Martins, Mayler; Rech, Paolo; Kastensmidt, Fernanda (In stampa)
Evaluating Architectural, Redundancy, and Implementation Strategies for Radiation Hardening of FinFET Integrated Circuits. In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. ISSN 0018-9499 Download fulltext
Fernandes dos Santos, Fernando; Brandalero, Marcelo; Sullivan, Michael; Martins Basso, ... (In stampa)
Reduced Precision DWC: an Efficient Hardening Strategy for Mixed-Precision Architectures. In: IEEE TRANSACTIONS ON COMPUTERS. ISSN 0018-9340 Download fulltext
Rodriguez Condia, Josie Esteban; Rech, Paolo; Fernandes dos Santos, Fernando; Carro, ... (2021)
Protecting GPU's Microarchitectural Vulnerabilities via Effective Selective Hardening. In: 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS), Torino, Italy, 28-30 June 2021, pp. 1-7. ISBN: 978-1-6654-3370-9 Download fulltext
Rodriguez Condia, Josie E.; Fernandes dos Santos, Fernando.; Sonza Reorda, Matteo; Rech, ... (2021)
Combining architectural simulation and software fault injection for a fast and accurate CNNs reliability evaluation on GPUs. In: 39th IEEE VLSI Test Symposium, VTS 2021, usa, 2021, pp. 1-7. ISBN: 978-1-6654-1949-9
Sekanina, L.; Vasicek, Z.; Bosio, A.; Traiola, M.; Rech, P.; Oliveria, D.; Fernandes, ... (2018)
Special session: How approximate computing impacts verification, test and reliability. In: 36th IEEE VLSI Test Symposium, VTS 2018, San Francisco, USA, 22-25 April, 2018, pp. 1-1. ISBN: 9781538637746 Download fulltext
Quinn, Heather; Robinson, William H.; Rech, Paolo; Aguirre, Miguel; Barnard, Arno; ... (2015)
Using Benchmarks for Radiation Testing of Microprocessors and FPGAs. In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE, vol. 62, pp. 2547-2554. ISSN 0018-9499
Robinson, W.H. ; Rech, P. ; Aguirre, M. ; Barnard, A. ; Desogus, M. ; Entrena, L. ; ... (2015)
Using Benchmarks for Radiation Testing of Microprocessors and FPGAs. In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE, vol. 62, pp. 2547-2554. ISSN 0018-9499
H. Hakobyan ; P. Rech; M. Sonza Reorda; M. Violante (2014)
Early Reliability Evaluation of a Biomedical System. In: 2014 9th International Design & Test Symposium, Algiers, Algeria, December 2014, pp. 45-50
Sabena D.; Sterpone L.; Carro L.; Rech P. (2014)
Reliability Evaluation of Embedded GPGPUs for Safety Critical Applications. In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE, vol. 61, pp. 3123-3129. ISSN 0018-9499
De Carvalho M.; Sabena D.; Sonza Reorda M.; Sterpone L.; Rech P.; Carro L. (2014)
Fault Injection in GPGPU Cores to Validate and Debug Robust Parallel Applications. In: IEEE 20th International On-Line Testing Symposium (IOLTS), Platja d'Aro, July 7 - 9, 2014, pp. 210-211
Pilla L.L. ; Rech P. ; Silvestri F. ; Frost C. ; Navaux P.O.A. ; Sonza M. ; Carro L. (2014)
Software-Based Hardening Strategies for Neutron Sensitive FFT Algorithms on GPUs. In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE, vol. 61, pp. 1874-1880. ISSN 0018-9499
Sabena D.; Sonza Reorda M.; Sterpone L.; Rech P.; Carro L. (2014)
Evaluating the radiation sensitivity of GPGPU caches: New algorithms and experimental results. In: MICROELECTRONICS RELIABILITY, vol. 54, pp. 2621-2628. ISSN 0026-2714
L.Bautista Gomez; F. Cappello; L. Carro; N. DeBardeleben; B. Fang; S. Gurumurthi; K. ... (2014)
GPGPUs: How to combine high computational power with high reliability. In: Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014, Dresden, Germany, March 2014
Sabena D.; Sonza Reorda M.; Sterpone L.; Rech P.; Carro L. (2013)
On the evaluation of soft-errors detection techniques for GPGPUs. In: 2013 8th IEEE International Design and Test Symposium (IDT), Marrakesh, December 16-18, 2013
P. Rech; M. Grosso; F. Melchiori; D. Loparco; D. Appello; L. Dilillo; A. Paccagnella; M. ... (2010)
Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts. In: IEEE 16th International On-Line Testing Symposium, corfu (greece), july 2010, pp. 29-34. ISBN: 9781424477227
APPELLO D.; GROSSO M.; LOPARCO D.; MELCHIORI F.; PACCAGNELLA A.; RECH P.; SONZA REORDA M. (2010)
Evaluating the Impact of DFM Library Optimizations on Alpha-induced SEU Sensitivity in a Microprocessor Core. In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE, vol. 57, pp. 2098-2105. ISSN 0018-9499
D. APPELLO; P. BERNARDI; S. GERARDIN; M. GROSSO; A. PACCAGNELLA; P. RECH; SONZA REORDA M. (2009)
DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study. In: 27th IEEE VLSI Test Symposium (VTS '09), Santa Cruz, USA, May 2009, pp. 276-281
RECH P; PACCAGNELLA A; GROSSO M; SONZA REORDA M; MELCHIORI F; APPELLO D (2009)
Evaluating the impact of DFM library optimizations on alpha-induced SEU sensitivity in a microprocessor core. In: European Conference on Radiation and Its Effects on Components and Systems (RADECS), Bruges, Belgium, Sept. 14-18, 2009, pp. 481-488. ISBN: 9781457704925
VIOLANTE M.; SONZA REORDA M.; STERPONE L.; MANUZZATO A.; GERARDIN S.; RECH P.; BAGATIN ... (2007)
A new hardware/software platform for the soft-error sensitivity evaluation of FPGA devices. In: 8th IEEE Latin American Test Workshop, Cuzco, Peru, pp. 1-6
Vedi tutte le pubblicazioni su Porto@Iris