Most recent publications

Matana Luza, Lucas; Ruospo, Annachiara; Soderstrom, Daniel; Cazzaniga, Carlo; ... (In stampa)
Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks. In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING. ISSN 2168-6750
Ruospo, Annachiara; Matana Luza, Lucas; Bosio, Alberto; Traiola, Marcello; Dilillo, ... (In stampa)
Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks. In: LATS 2021 : IEEE Latin-American Test Symposium, Punta del Este, Uruguay, Oct 27, 2021 - Oct 29, 2021
Ruospo, A.; Piumatti, D.; Floridia, A.; Sanchez, E. (2021)
A Suitability analysis of software based testing strategies for the on-line testing of artificial neural networks applications in embedded devices. In: 27th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2021, Torino, Italy, 2021, pp. 1-6. ISBN: 978-1-6654-3370-9
Ruospo, Annachiara; Sanchez, Ernesto; Traiola, Marcello; O’Connor, Ian; Bosio, Alberto (2021)
Investigating data representation for efficient and reliable Convolutional Neural Networks. In: MICROPROCESSORS AND MICROSYSTEMS, vol. 86. ISSN 0141-9331
Ruospo, Annachiara; Ernesto, Sanchez (2021)
On the Reliability Assessment of Artificial Neural Networks Running on AI-Oriented MPSoCs. In: APPLIED SCIENCES, vol. 11. ISSN 2076-3417 Download fulltext
Matana Luza, Lucas; Ruospo, Annachiara; Bosio, Alberto; Ernesto, Sanchez; Dilillo, Luigi (2021)
A Model-Based Framework to Assess the Reliability of Safety-Critical Applications. In: 2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Vienna, Austria, 7-9 April 2021, pp. 41-44. ISBN: 978-1-6654-3595-6 Download fulltext
Damljanovic, Aleksa; Ruospo, Annachiara; Sanchez Sanchez, Ernesto; Squillero, Giovanni (2021)
A Benchmark Suite of RT-level Hardware Trojansfor Pipelined Microprocessor Cores. In: 24th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Vienna, Austria, April 7-9 Download fulltext
Ruospo, Annachiara; Balaara, Angelo; Bosio, Alberto; Ernesto, Sanchez (2020)
A Pipelined Multi-Level Fault Injector for Deep Neural Networks. In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), ESA-ESRIN, Frascati (Rome) Italy, October 19 – October 21, 2020
Ruospo, Annachiara; Bosio, Alberto; Ianne, Alessandro; Ernesto, Sanchez (2020)
Evaluating Convolutional Neural Networks Reliability depending on their Data Representation. In: Euromicro Conference on Digital System Design (DSD) 2020, Kranj, Slovenia (virtual event), August 26 – 28, 2020, pp. 672-679 Download fulltext
Duran, Ckristian; Morales, Hanssel; Rojas, Camilo; Ruospo, Annachiara; Ernesto, Sanchez; ... (2020)
Simulation and Formal: The Best of Both Domains for Instruction Set Verification of RISC-V Based Processors. In: IEEE International Symposium on Circuits and Systems (ISCAS), Virtual Event, from October 10 to October 21 2020 Download fulltext
Da Silva, F. A.; Cagri Bagbaba, A.; Ruospo, A.; Mariani, R.; Kanawati, G.; Sanchez, E.; ... (2020)
Special Session: AutoSoC - A Suite of Open-Source Automotive SoC Benchmarks. In: 38th IEEE VLSI Test Symposium, VTS 2020, usa, 2020, pp. 1-9. ISBN: 978-1-7281-5359-9 Download fulltext
Floridia, Andrea; Carmona, Tzamn Melendez; Piumatti, Davide; Ruospo, Annachiara; ... (2020)
Deterministic Cache-based Execution of On-line Self-Test Routines in Multi-core Automotive System-on-Chips. In: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), Grenoble, France, 9-13 March, 2020, pp. 1235-1240. ISBN: 978-3-9819263-4-7 Download fulltext
Floridia, Andrea; Piumatti, Davide; Ruospo, Annachiara; Ernesto, Sanchez; Martorana, ... (2019)
Increasing the Robustness of Software Test Libraries in Multi-core System-on-Chips. In: IEEE-tttc ART workshop
Ruospo, Annachiara; Cantoro, Riccardo; Ernesto, Sanchez; Pasquale Davide Schiavone, ; ... (2019)
On-line Testing for Autonomous Systems driven by RISC-V Processor Design Verification. In: The 32nd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Noordwijk, Netherlands, Netherlands, October 2 – October 4, 2019. ISBN: 978-1-7281-2260-1 Download fulltext
Floridia, Andrea; Piumatti, Davide; Ruospo, Annachiara; Ernesto, Sanchez; Sergio De ... (2019)
A Decentralized Scheduler for On-line Self-test Routines in Multi-core Automotive System-on-Chips. In: 2019 IEEE International Test Conference (ITC), Washington (USA), 9 - 15 November, 2019, pp. 1-10. ISBN: 978-1-7281-4823-6 Download fulltext
Bosio, A.; Bernardi, P.; Ruospo, A.; Sanchez, E. (2019)
A reliability analysis of a deep neural network. In: 20th IEEE Latin American Test Symposium, LATS 2019, Santiago del Chile, 2019, pp. 1-6. ISBN: 978-1-7281-1756-0
Schiavone, P. D.; Sanchez, E.; Ruospo, A.; Minervini, F.; Zaruba, F.; Haugou, G.; ... (2019)
An Open-Source Verification Framework for Open-Source Cores: A RISC-V Case Study. In: 26th IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2018, Verona (Italia), 2018, pp. 43-48. ISBN: 978-1-5386-4756-1
Bernardi, P.; Cantoro, R.; Floridia, A.; Piumatti, D.; Pogonea, C.; Ruospo, A.; Sanchez, ... (2019)
Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions. In: Design, Automation and Test in Europe; DATE 2019, pp. 920-923. ISBN: 978-3-9819263-2-3
Ruospo, A.; Sanchez, E. (2019)
On the detection of always-on hardware trojans supported by a pre-silicon verification methodology. In: 20th International Workshop on Microprocessor/SoC Test, Security and Verification, MTV 2019, usa, 2019, pp. 25-30. ISBN: 978-1-7281-5025-3 Download fulltext
Floridia, A.; Piumatti, D.; Ruospo, A.; Sanchez, E. (2018)
Analysis of Fault Simulations Result during development of a Software Test Library. In: IEEE-tttc ART workshop
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