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Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; SONZA REORDA, Matteo; Appello, ... (In stampa)
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. In: IEEE European Test Symposium
Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; de ... (In stampa)
Test, Reliability and Functional Safety trends for Automotive System-on-Chip. In: IEEE European Test Symposium
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