JUAN DAVID GUERRERO BALAGUERA

Most recent publications

Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; ... (2022)
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. In: 2022 IEEE European Test Symposium (ETS), Barcelona (Spain), 23-27 May 2022, pp. 1-10. ISBN: 978-1-6654-6706-3
Guerrero-Balaguera, Juan-David; Galasso, Luigi; Sierra, Robert Limas; Reorda, Matteo ... (2022)
Reliability Assessment of Neural Networks in GPUs: A Framework For Permanent Faults Injections. In: 2022 IEEE 31st International Symposium on Industrial Electronics (ISIE), pp. 959-962. ISBN: 978-1-6654-8240-0
Rodriguez Condia, Josie E.; Augusto Da Silva, Felipe; Cagri Bagbaba, Ahmet; Juan-David, ... (2022)
Using STLs for Effective In-field Test of GPUs. In: IEEE DESIGN & TEST, pp. 1-1. ISSN 2168-2356
Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo (2022)
A New Method to Generate Software Test Libraries for In-Field GPU Testing Resorting to High-Level Languages. In: 40th IEEE VLSI Test Symposium, VTS 2022, San Diego (USA), 25-27 April 2022, pp. 1-7. ISBN: 978-1-6654-1060-1
Guerrero-Balaguera, Juan-David; Rodriguez Condia, J. E.; Sonza Reorda, M. (2022)
A Compaction Method for STLs for GPU in-field test. In: 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022, Antwerp (BE), 14-23 March 2022, pp. 454-459. ISBN: 978-3-9819263-6-1
Show all publications in Porto@Iris