MATTEO SONZA REORDA

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Full Professor

Vice Rector for Research
Member (Board of Governors)
Member (Academic Senate)
Presidente Comitato di Ateneo per la ricerca - CARTT

+39 0110907055 / 7055 (DAUIN)

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Most recent publications

Iaria, G.; Foscale, T.; Bernardi, P.; Presicce, L.; Sonza Reorda, M.; Appello, D.; ... (In stampa)
A novel SEU injection setup for Automotive SoC. In: 2022 IEEE International Symposium on Industrial Electronics
Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; SONZA REORDA, Matteo; Appello, ... (In stampa)
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. In: IEEE European Test Symposium
Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; de ... (In stampa)
Test, Reliability and Functional Safety trends for Automotive System-on-Chip. In: IEEE European Test Symposium
Mirabella, N.; Grosso, M.; Franchino, G.; Rinaudo, S.; Deretzis, I.; La Magna, A.; ... (2022)
An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells. In: ELECTRONICS, vol. 11. ISSN 2079-9292
Bagbaba, A. C.; da Silva, F. A.; Reorda, M. S.; Hamdioui, S.; Jenihhin, M.; Sauer, C. (2022)
Automated Identification of Application-Dependent Safe Faults in Automotive Systems-on-a-Chips. In: ELECTRONICS, vol. 11. ISSN 2079-9292
Rodriguez Condia, Josie E.; Rech, Paolo; Fernandes dos Santos, Fernando; Carro, Luigi; ... (2022)
An Effective Method to Identify Microarchitectural Vulnerabilities in GPUs. In: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, vol. 22, pp. 129-141. ISSN 1530-4388
Goncalves, Marcio M.; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo; Sterpone, ... (2022)
Evaluating low-level software-based hardening techniques for configurable GPU architectures. In: THE JOURNAL OF SUPERCOMPUTING, vol. 78, pp. 8081-8105. ISSN 0920-8542
da Silva, Felipe Augusto; Cantoro, Riccardo; Hamdioui, Said; Sartoni, Sandro; Sauer, ... (2022)
A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers. In: ELECTRONICS, vol. 11. ISSN 2079-9292
Rodriguez Condia, Josie E.; Augusto Da Silva, Felipe; Cagri Bagbaba, Ahmet; Juan-David, ... (2022)
Using STLs for Effective In-field Test of GPUs. In: IEEE DESIGN & TEST, pp. 1-1. ISSN 2168-2356
Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Traiola, Marcello; ... (2022)
Improving the Fault Resilience of Neural Network Applications Through Security Mechanisms. In: Dependable Systems and Networks
Cantoro, Riccardo; Garau, Francesco; Girard, Patrick; Kolahimahmoudi, Nima; Sartoni, ... (2022)
Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries. In: 2022 IEEE European Test Symposium, Barcelona (SP), 23-27 Maggio 2022, pp. 1-2. ISBN: 978-1-6654-6706-3
Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo (2022)
A New Method to Generate Software Test Libraries for In-Field GPU Testing Resorting to High-Level Languages. In: 40th IEEE VLSI Test Symposium, VTS 2022, San Diego (USA), 25-27 April 2022, pp. 1-7. ISBN: 978-1-6654-1060-1
Guerrero-Balaguera, Juan-David; Rodriguez Condia, J. E.; Sonza Reorda, M. (2022)
A Compaction Method for STLs for GPU in-field test. In: 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022, Antwerp (BE), 14-23 March 2022, pp. 454-459. ISBN: 978-3-9819263-6-1
Cantoro, Riccardo; Garau, Francesco; Masante, Riccardo; Sartoni, Sandro; Singh, ... (2022)
Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries. In: 2022 IEEE 40th VLSI Test Symposium (VTS), San Diego (USA), 25-27 Aprile 2022, pp. 1-7. ISBN: 978-1-6654-1060-1
Quitadamo, Matteo Vincenzo; Piumatti, Davide; Raviola, Erica; Fiori, Franco; Sonza ... (2022)
A New Technique to Check the Correct Mounting of the Power Module Heatsinks. In: MICROELECTRONICS RELIABILITY, vol. 128. ISSN 0026-2714
Ruggeri, Walter; Bernardi, Paolo; Littardi, Stefano; Reorda, Matteo Sonza; Appello, ... (2021)
Innovative methods for Burn-In related Stress Metrics Computation. In: 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 28-30 June 2021, pp. 1-6. ISBN: 978-1-6654-3654-0
Juan-David, Guerrero-Balaguera; Rodriguez Condia, Josie E.; SONZA REORDA, Matteo (2021)
Using Hardware Performance Counters to support in-field GPU Testing. In: 28th IEEE International Conference on Electronics Circuits and Systems, Dubai, 28 november-1 december, pp. 1-4
GUERRERO BALAGUERA, JUAN DAVID; RODRIGUEZ CONDIA, JOSIE ESTEBAN; SONZA REORDA, Matteo (2021)
A Novel Compaction Approach for SBST Test Programs. In: Asian Test Symposium, Japan, 22-25 Nov. 2021, pp. 67-72
Deligiannis, Nikolaos; Cantoro, Riccardo; Faller, Tobias; Paxian, Tobias; Becker, Bernd; ... (2021)
Effective SAT-based Solutions for Generating Functional Sequences Maximizing the Sustained Switching Activity in a Pipelined Processor. In: Asian Test Symposium (ATS), 22-25 Nov. 2021, pp. 73-78
Mirabella, Nunzio; Grosso, Michelangelo; Franchino, Giovanna; Rinaudo, Salvatore; ... (2021)
Comparing different solutions for testing resistive defects in low-power SRAMs. In: 22nd IEEE Latin-American Test Symposium 2021, Porto Alegre (Brazil), 27th - 29th October 2021, pp. 1-6
Deligiannis, Nikolaos; Cantoro, Riccardo; Sonza Reorda, Matteo (2021)
Maximizing the Switching Activity of Different Modules Within a Processor Core via Evolutionary Techniques. In: Digital System Design (DSD), pp. 535-540
Cantoro, Riccardo; Girard, Patrick; Masante, Riccardo; Sartoni, Sandro; Reorda, Matteo ... (2021)
Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement. In: 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS), pp. 1-4. ISBN: 978-1-6654-3370-9
Rodriguez Condia, Josie Esteban; Rech, Paolo; Fernandes dos Santos, Fernando; Carro, ... (2021)
Protecting GPU's Microarchitectural Vulnerabilities via Effective Selective Hardening. In: 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS), Torino, Italy, 28-30 June 2021, pp. 1-7. ISBN: 978-1-6654-3370-9
Rodriguez Condia, Josie E.; Fernandes dos Santos, Fernando.; Sonza Reorda, Matteo; Rech, ... (2021)
Combining architectural simulation and software fault injection for a fast and accurate CNNs reliability evaluation on GPUs. In: 39th IEEE VLSI Test Symposium, VTS 2021, usa, 2021, pp. 1-7. ISBN: 978-1-6654-1949-9
Fernandes dos Santos, Fernando; Rodriguez Condia, Josie Esteban.; Carro, Luigi; Sonza ... (2021)
Revealing GPUs Vulnerabilities by Combining Register-Transfer and Software-Level Fault Injection. In: 51st Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2021, twn, 2021, pp. 292-304. ISBN: 978-1-6654-3572-7
Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Marcello, Traiola; ... (2021)
Towards the Integration of Reliability and Security Mechanisms to Enhance the Fault Resilience of Neural Networks. In: IEEE ACCESS, vol. 9, pp. 155998-156012. ISSN 2169-3536
Appello, D.; Chen, H. H.; Sauer, M.; Polian, I.; Bernardi, P.; Reorda, M. S. (2021)
System-Level Test: State of the Art and Challenges. In: 27th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2021, 2021, pp. 1-7. ISBN: 978-1-6654-3370-9
Deligiannis, Nikolaos; Cantoro, Riccardo; Sauer, Matthias; Becker, Bernd; Reorda, Matteo ... (2021)
New Techniques for the Automatic Identification of Uncontrollable Lines in a CPU Core. In: 2021 IEEE 39th VLSI Test Symposium (VTS), pp. 1-7. ISBN: 978-1-6654-1949-9
Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Reorda, Matteo Sonza (2021)
On the Functional Test of Special Function Units in GPUs. In: 2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Vienna, April 7-9, 2021, pp. 81-86. ISBN: 978-1-6654-3595-6
Polian, I.; Anders, J.; Becker, S.; Bernardi, P.; Chakrabarty, K.; Elhamawy, N.; Sauer, ... (2020)
Exploring the Mysteries of System-Level Test. In: 29th IEEE Asian Test Symposium, ATS 2020, mys, 2020, pp. 1-6. ISBN: 978-1-7281-7467-9
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