MATTEO SONZA REORDA

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Member (Commissione per la definizione di linee di indirizzo per la distribuzione di fondi premiali al personale docente)
Vice Rector for Research
Member (Board of Governors)
Member (Academic Senate)
Presidente Comitato di Ateneo per la ricerca - CARTT

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Most recent publications

Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza ... (In stampa)
A comparative overview of ATPG flows targeting traditional and cell-aware fault models. In: 29th IEEE International Conference on Electronics Circuits and Systems (ICECS), Glasgow, 24th - 26th October 2022, pp. 1-4
Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; ... (In stampa)
Recent Trends and Perspectives on Defect-Oriented Testing. In: The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS)
Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; Tempesta, Claudia; SONZA ... (In stampa)
Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level. In: International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Iaria, Giusy; Angione, Francesco; Bernardi, Paolo; SONZA REORDA, Matteo; Davide, ... (In stampa)
A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip. In: Latin American Test Symposium
Guerrero-Balaguera, Juan-David; Galasso, Luigi; Sierra, Robert Limas; Reorda, Matteo ... (2022)
Reliability Assessment of Neural Networks in GPUs: A Framework For Permanent Faults Injections. In: 2022 IEEE 31st International Symposium on Industrial Electronics (ISIE), pp. 959-962. ISBN: 978-1-6654-8240-0
Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; ... (2022)
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. In: 2022 IEEE European Test Symposium (ETS), Barcelona (Spain), 23-27 May 2022, pp. 1-10. ISBN: 978-1-6654-6706-3
Deligiannis, Nikolaos; Faller, Tobias; RODRIGUEZ CONDIA, JOSIE ESTEBAN; Cantoro, ... (2022)
Using Formal Methods to Support the Development of STLs for GPUs. In: Asian Test Symposium (ATS), Taiwan
Angione, F.; Appello, D.; Bernardi, P.; Bertani, C.; Gallo, G.; Littardi, S.; Pollaccia, ... (2022)
A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress. In: IEEE TRANSACTIONS ON COMPUTERS, pp. 1-14. ISSN 0018-9340
da Silva, Felipe Augusto; Cantoro, Riccardo; Hamdioui, Said; Sartoni, Sandro; Sauer, ... (2022)
A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers. In: ELECTRONICS, vol. 11. ISSN 2079-9292
Rodriguez Condia, Josie E.; Augusto Da Silva, Felipe; Cagri Bagbaba, Ahmet; Juan-David, ... (2022)
Using STLs for Effective In-field Test of GPUs. In: IEEE DESIGN & TEST, pp. 1-1. ISSN 2168-2356
Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Traiola, Marcello; ... (2022)
Improving the Fault Resilience of Neural Network Applications Through Security Mechanisms. In: Dependable Systems and Networks, 27-30 June 2022, pp. 23-24
Cantoro, Riccardo; Garau, Francesco; Girard, Patrick; Kolahimahmoudi, Nima; Sartoni, ... (2022)
Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries. In: 2022 IEEE European Test Symposium, Barcelona (SP), 23-27 Maggio 2022, pp. 1-2. ISBN: 978-1-6654-6706-3
Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo (2022)
A New Method to Generate Software Test Libraries for In-Field GPU Testing Resorting to High-Level Languages. In: 40th IEEE VLSI Test Symposium, VTS 2022, San Diego (USA), 25-27 April 2022, pp. 1-7. ISBN: 978-1-6654-1060-1
Guerrero-Balaguera, Juan-David; Rodriguez Condia, J. E.; Sonza Reorda, M. (2022)
A Compaction Method for STLs for GPU in-field test. In: 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022, Antwerp (BE), 14-23 March 2022, pp. 454-459. ISBN: 978-3-9819263-6-1
Cantoro, Riccardo; Garau, Francesco; Masante, Riccardo; Sartoni, Sandro; Singh, ... (2022)
Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries. In: 2022 IEEE 40th VLSI Test Symposium (VTS), San Diego (USA), 25-27 Aprile 2022, pp. 1-7. ISBN: 978-1-6654-1060-1
Iaria, G.; Foscale, T.; Bernardi, P.; Presicce, L.; Sonza Reorda, M.; Appello, D.; ... (2022)
A novel SEU injection setup for Automotive SoC. In: 2022 IEEE International Symposium on Industrial Electronics, Anchorage, AK (USA), 01-03 June 2022, pp. 623-626. ISBN: 978-1-6654-8240-0
Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; SONZA REORDA, Matteo; Appello, ... (2022)
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. In: IEEE European Test Symposium, Barcelona (Spain), 23-27 May 2022, pp. 1-6. ISBN: 978-1-6654-6706-3
Rodriguez Condia, Josie E.; Rech, Paolo; Fernandes dos Santos, Fernando; Carro, Luigi; ... (2022)
An Effective Method to Identify Microarchitectural Vulnerabilities in GPUs. In: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, vol. 22, pp. 129-141. ISSN 1530-4388
Goncalves, Marcio M.; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo; Sterpone, ... (2022)
Evaluating low-level software-based hardening techniques for configurable GPU architectures. In: THE JOURNAL OF SUPERCOMPUTING, vol. 78, pp. 8081-8105. ISSN 0920-8542
Mirabella, N.; Grosso, M.; Franchino, G.; Rinaudo, S.; Deretzis, I.; La Magna, A.; ... (2022)
An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells. In: ELECTRONICS, vol. 11. ISSN 2079-9292
Bagbaba, A. C.; da Silva, F. A.; Reorda, M. S.; Hamdioui, S.; Jenihhin, M.; Sauer, C. (2022)
Automated Identification of Application-Dependent Safe Faults in Automotive Systems-on-a-Chips. In: ELECTRONICS, vol. 11. ISSN 2079-9292
Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; de ... (2022)
Test, Reliability and Functional Safety trends for Automotive System-on-Chip. In: IEEE European Test Symposium
Quitadamo, Matteo Vincenzo; Piumatti, Davide; Raviola, Erica; Fiori, Franco; Sonza ... (2022)
A New Technique to Check the Correct Mounting of the Power Module Heatsinks. In: MICROELECTRONICS RELIABILITY, vol. 128. ISSN 0026-2714
Guerrero-Balaguera, Juan-David; Sierra, Robert Limas; Reorda, Matteo Sonza (2022)
Effective fault simulation of GPU’s permanent faults for reliability estimation of CNNs. In: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS), Torino, pp. 1-6. ISBN: 978-1-6654-7355-2
Ruggeri, Walter; Bernardi, Paolo; Littardi, Stefano; Reorda, Matteo Sonza; Appello, ... (2021)
Innovative methods for Burn-In related Stress Metrics Computation. In: 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 28-30 June 2021, pp. 1-6. ISBN: 978-1-6654-3654-0
Juan-David, Guerrero-Balaguera; Rodriguez Condia, Josie E.; SONZA REORDA, Matteo (2021)
Using Hardware Performance Counters to support in-field GPU Testing. In: 28th IEEE International Conference on Electronics Circuits and Systems, Dubai, 28 november-1 december 2021, pp. 1-4. ISBN: 978-1-7281-8281-0
Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Marcello, Traiola; ... (2021)
Towards the Integration of Reliability and Security Mechanisms to Enhance the Fault Resilience of Neural Networks. In: IEEE ACCESS, vol. 9, pp. 155998-156012. ISSN 2169-3536
Appello, D.; Chen, H. H.; Sauer, M.; Polian, I.; Bernardi, P.; Reorda, M. S. (2021)
System-Level Test: State of the Art and Challenges. In: 27th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2021, 2021, pp. 1-7. ISBN: 978-1-6654-3370-9
Fernandes dos Santos, Fernando; Rodriguez Condia, Josie Esteban.; Carro, Luigi; Sonza ... (2021)
Revealing GPUs Vulnerabilities by Combining Register-Transfer and Software-Level Fault Injection. In: 51st Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2021, twn, 2021, pp. 292-304. ISBN: 978-1-6654-3572-7
Rodriguez Condia, Josie E.; Sonza Reorda, M. (2021)
Modular Functional Testing: Targeting the Small Embedded Memories in GPUs. In: VLSI-SoC: Design Trends. VLSI-SoC 2020 / Calimera, A., Gaillardon, PE., Korgaonkar, K., Kvatinsky, S., Reis, R. (eds), S.L., Springer, pp. 205-233. ISBN: 978-3-030-81640-7
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