PAOLO BERNARDI

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Associate Professor

+39 0110907183 / 7183 (DAUIN)

Most recent publications

Appello, D.; Bernardi, P.; Calabrese, A.; Littardi, S.; Pollaccia, G.; Quer, S.; ... (2021)
Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures. In: 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2021, aut, 2021, pp. 69-74. ISBN: 978-1-6654-3595-6
Calabrese, A.; Bernardi, P.; Littardi, S.; Quer, S. (2020)
Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures. In: International Test Conference 2020 (ITC2020), 3-5 November 2020, pp. 1-1 Download fulltext
Polian, I.; Anders, J.; Becker, S.; Bernardi, P.; Chakrabarty, K.; Elhamawy, N.; Sauer, ... (2020)
Exploring the Mysteries of System-Level Test. In: 29th IEEE Asian Test Symposium, ATS 2020, mys, 2020, pp. 1-6. ISBN: 978-1-7281-7467-9
Piumatti, D.; Sanchez, E.; Bernardi, P.; Martorana, R.; Pernice, M. A. (2020)
An efficient strategy for the development of software test libraries for an automotive microcontroller family. In: MICROELECTRONICS RELIABILITY, vol. 115. ISSN 0026-2714
Manzini, A.; Inglese, P.; Caldi, L.; Cantoro, R.; Carnevale, G.; Coppetta, M.; ... (2019)
A machine learning-based approach to optimize repair and increase yield of embedded flash memories in automotive systems-on-chip. In: 2019 IEEE European Test Symposium (ETS), Baden-Baden, Germany, 27-31 May 2019, pp. 1-6. ISBN: 978-1-7281-1173-5 Download fulltext
Bosio, A.; Bernardi, P.; Ruospo, A.; Sanchez, E. (2019)
A reliability analysis of a deep neural network. In: 20th IEEE Latin American Test Symposium, LATS 2019, Santiago del Chile, 2019, pp. 1-6. ISBN: 978-1-7281-1756-0
Almeida, F.; Bernardi, P.; Calabrese, D.; Restifo, M.; Reorda, M. S.; Appello, D.; ... (2019)
Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test. In: 22nd International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2019, rou, 2019. ISBN: 9781728100739 Download fulltext
Skitsas, Michael A.; RESTIFO, MARCO; Michael, Maria K.; Nicopoulos, Chrysostomos; ... (2019)
Self-testing of multicore processors. In: Many-Core Computing: Hardware and Software / Michael A. Skitsas, Marco Restifo, Maria K. Michael, Chrysostomos Nicopoulos, Paolo Bernardi, and Ernesto Sanchez, S.L., IET, pp. 367-394. ISBN: 9781785615825
Bernardi, P.; Cantoro, R.; Floridia, A.; Piumatti, D.; Pogonea, C.; Ruospo, A.; Sanchez, ... (2019)
Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions. In: Design, Automation and Test in Europe; DATE 2019, pp. 920-923. ISBN: 978-3-9819263-2-3
Bernardi, P.; Piumatti, D.; Sanchez, E. (2019)
Facilitating Fault-Simulation Comprehension through a Fault-Lists Analysis Tool. In: 10th IEEE Latin American Symposium on Circuits and Systems 2019 (LASCAS19), Armenia, Quindío, Colombia, February 24 - 27, 2019, pp. 77-80. ISBN: 978-1-7281-0453-9
Carbonara, S.; Bernardi, P.; Restifo, M. (2019)
A hybrid in-field self-test technique for SoCs. In: 14th IEEE International Conference on Design and Technology of Integrated Systems In Nanoscale Era, DTIS 2019, grc, 2019, pp. 1-6. ISBN: 978-1-7281-3424-6
Appello, Davide; Bernardi, Paolo; Cantoro, Riccardo; Colazzo, Andrea; Motta, Alessandro; ... (2018)
An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In. In: JOURNAL OF LOW POWER ELECTRONICS, pp. 86-98. ISSN 1546-1998
Appello, Davide; Bernardi, Paolo; Bugeja, Conrad; Cantoro, Riccardo; Pollaccia, Giorgio; ... (2018)
Adaptive Management Techniques for Optimized Burn-In of Safety-Critical SoC. In: JOURNAL OF ELECTRONIC TESTING, vol. 34, pp. 43-52. ISSN 0923-8174
Appello, Davide; Bernardi, Paolo; Bugeja, Conrad; Cantoro, Riccardo; Pollaccia, Giorgio; ... (2018)
An Optimized Test During Burn-In for Automotive SoC. In: IEEE DESIGN & TEST, pp. 46-53. ISSN 2168-2356 Download fulltext
Bernardi, P.; Floridia, A.; Piumatti, D.; Sanchez, E.; De Luca, S.; Sansonetti, A. (2018)
Problems of a Software Test Library for Multicore System-On-Chip. In: Proceedings of the 6 th Prague Embedded Systems Workshop, Praga, PESW18 pp. 4-5
Bernardi, P.; Bosio, A.; Barbareschi, M. (2018)
DTIS 2018 foreword. In: 13th IEEE International Conference on Design and Technology of Integrated Systems In Nanoscale Era, DTIS 2018, ita, 2018, pp. ix-ix. ISBN: 978-1-5386-5291-6
Bernardi, Paolo; Bosio, Alberto; Di Natale, Giorgio; Guerriero, Andrea; Sanchez, ... (2017)
Improving stress quality for SoC using faster-than-at-speed execution of functional programs. In: IFIP Advances in Information and Communication Technology / Bernardi, Paolo, S.L., Springer New York LLC, pp. 130-151. ISBN: 9783319671031
Bosio, A.; Dilillo, L.; Girard, P.; Todri-Sanial, A.; Virazel, A.; Bernabovi, S.; ... (2014)
An intra-cell defect grading tool. In: 17th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2014, pol, 2014, pp. 298-301. ISBN: 978-1-4799-4558-0
Touati, A.; Bosio, A.; Dilillo, L.; Girard, P.; Todri-Sanial, A.; Virazel, A.; Bernardi, ... (2014)
A comprehensive evaluation of functional programs for power-aware test. In: 23rd IEEE North Atlantic Test Workshop, NATW 2014, Binghamton, NY, usa, 2014, pp. 69-72. ISBN: 978-1-4799-5135-2
Ballan, O.; Bernardi, P.; Yazdani, B.; Sanchez, E. (2013)
A software-based self-test strategy for on-line testing of the scan chain circuitries in embedded microprocessors. In: 2013 IEEE 19th International On-Line Testing Symposium, IOLTS 2013, Chania, Crete, grc, 2013, pp. 79-84. ISBN: 978-1-4799-0664-2
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