SARAH AZIMI

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Research Assistant
Adjunct Professor

Most recent publications

Portaluri, Andrea; De Sio, Corrado; Azimi, Sarah; Sterpone, Luca (In stampa)
SEU Mitigation on SRAM-based FPGAs through Domains-based Isolation Design Flow. In: IEEE Radiation and its Effects on Components and Systems 2021 Download fulltext
Azimi, Sarah; De Sio, Corrado; Sterpone, Luca (In stampa)
Analysis of Radiation-induced Transient Errors on 7nm FinFET Technology. In: MICROELECTRONICS RELIABILITY. ISSN 0026-2714
De Sio, Corrado; Azimi, Sarah; Portaluri, Andrea; Sterpone, Luca (2021)
SEU Evaluation of Hardened-by-Replication Software in RISC-V Soft Processor. In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Download fulltext
Yang, Wei-Tao; Du, Xue-Cheng; Li, Yong-Hong; He, Chao-Hui; Guo, Gang; Shi, Shu-Ting; ... (2021)
Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis. In: NUCLEAR SCIENCE AND TECHNIQUES, vol. 32. ISSN 1001-8042
Azimi, Sarah; De Sio, Corrado; Sterpone, Luca (2021)
On the Evaluation of SEEs on Open-Source Embedded Static RAMs. In: IEEE International Conference on Very Large Scale Integration (VLSI-SoC) Download fulltext
Portaluri, Andrea; De Sio, Corrado; Azimi, Sarah; Sterpone, Luca (2021)
A New Domains-based Isolation Design Flow for Reconfigurable SoCs. In: IEEE International Symposium on On-Line Testing and robust System Design (IOLTS 2021), pp. 1-6 Download fulltext
Azimi, Sarah; De Sio, Corrado; Sterpone, Luca (2021)
A Radiation-Hardened CMOS Full-Adder Based on Layout Selective Transistor Duplication. In: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, vol. 29, pp. 1596-1600. ISSN 1063-8210 Download fulltext
Du, Boyang; Azimi, Sarah; Moramarco, Annarita; Sabena, Davide; Parisi, Filippo; ... (2021)
An Automated Continuous Integration Multitest Platform for Automotive Systems. In: IEEE SYSTEMS JOURNAL, pp. 1-12. ISSN 1932-8184 Download fulltext
Azimi, Sarah; De Sio, Corrado; Sterpone, Luca (2021)
A 3-D LUT Design for Transient Error Detection Via Inter-Tier In-Silicon Radiation Sensor. In: Design, Automation and Test in Europe Conference (DATE2021), February 2021, pp. 1-6 Download fulltext
Azimi, Sarah; Sterpone, Luca (2020)
Digital Design Techniques for Dependable High Performance Computing. In: IEEE International Test Conference (ITC 2020), 2020, pp. 1-10. ISBN: 978-1-7281-9113-3 Download fulltext
Azimi, Sarah; Du, Boyang; De Sio, Corrado; Sterpone, Luca (2020)
On the Mitigation of Single Event Transient in 3D LUT by In-Cell Layout Resizing. In: 31th IEEE Radiation and its Effects on Components and System (RADECS), pp. 1-4 Download fulltext
De Sio, Corrado; Azimi, Sarah; Sterpone, Luca (2020)
An Emulation Platform for Evaluating the Reliability of Deep Neural Network. In: The 33th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology (DFT 2020), pp. 1-4 Download fulltext
De Sio, C.; Azimi, S.; Sterpone, L. (2020)
On the Analysis of Radiation-induced Failures in the AXI Interconnect Module. In: MICROELECTRONICS RELIABILITY, pp. 113733-113738. ISSN 0026-2714
De Sio, C.; Azimi, S.; Sterpone, L. (2020)
On the evaluation of SEU effects on AXI interconnect within AP-SoCs. In: 33rd International Conference on Architecture of Computing Systems, ARCS 2020, deu, 2020, pp. 215-227. ISSN 0302-9743. ISBN: 978-3-030-52793-8 Download fulltext
Azimi, Sarah; De Sio, Corrado; Sterpone, Luca (2020)
In-Circuit Mitigation Approach of Single Event Transients for 45nm Flip-Flops. In: 26th IEEE International Symposium on On-Line Testing and robust System Design (IOLT 2020), pp. 1-6 Download fulltext
Azimi, Sarah; De Sio, Corrado; Yang, Weitao; Sterpone, Luca (2020)
A New Single Event Transient Hardened Floating Gate Configurable Logic Circuit. In: 18th IEEE International NEWCAS, Montreal, Canada, June 16-19, 2020, pp. 311-314 Download fulltext
Sterpone, L.; Luoni, F.; Azimi, S.; Du, B. (2020)
A 3D Simulation-based Approach to Analyze Heavy Ions-induced SET on Digital Circuits. In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. ISSN 0018-9499 Download fulltext
De Sio, C.; Azimi, S.; Bozzoli, L.; Du, B.; Sterpone, L. (2019)
Radiation-induced Single Event Transient effects during the reconfiguration process of SRAM-based FPGAs. In: MICROELECTRONICS RELIABILITY. ISSN 0026-2714
Shamgholi, Maryam; Abbasi, Majid; Mahmood Riazi, Seyed; Azimi, Sarah (2015)
The development of Eddy Current Nondestructive Testing Method for Coating Thickness Measurement on the Steel Sheets. In: 4th International Engineering Material and Metallurgy
Azimi, Sarah; Vejdaniamiri, Mehdi (2014)
Concurrent Detection and Classification of Faults in Matrix Converter Using Trans-Conductance. In: INTERNATIONAL JOURNAL OF POWER ELECTRONICS AND DRIVE SYSTEMS, pp. 93-100. ISSN 2088-8694
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