THOMAS LANGE

Most recent publications

Chen, Junchao; Lange, Thomas; Andjelkovic, Marko; Simevski, Aleksandar; Krstic, Milos (2020)
Prediction of Solar Particle Events with SRAM-Based Soft Error Rate Monitor and Supervised Machine Learning. In: MICROELECTRONICS RELIABILITY, vol. 114. ISSN 0026-2714 Download fulltext
Chen, Junchao; Lange, Thomas; Andjelkovic, Marko; Simevski, Aleksandar; Krstic, Milos (2020)
Hardware Accelerator Design with Supervised Machine Learning for Solar Particle Event Prediction in Space Applications. In: 33rd International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)
Alexandrescu, Dan; Balakrishnan, Aneesh; Lange, Thomas; Glorieux, Maximilien (2020)
Enabling Cross-Layer Reliability and Functional Safety Assessment Through ML-Based Compact Models. In: 26th International Symposium on On-Line Testing And Robust System Design (IOLTS), Naples (Italy), 13-15 July 2020, pp. 1-6. ISBN: 978-1-7281-8187-5
Lange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, ... (2020)
Machine Learning Clustering Techniques for Selective Mitigation of Critical Design Features. In: 26th International Symposium on On-Line Testing And Robust System Design (IOLTS), Naples (Italy), 13-15 July 2020, pp. 1-7. ISBN: 978-1-7281-8187-5
Balakrishnan, A.; Lange, T.; Glorieux, M.; Alexandrescu, D.; Jenihhin, M. (2020)
Composing Graph Theory and Deep Neural Networks to Evaluate SEU Type Soft Error Effects. In: 9th Mediterranean Conference on Embedded Computing, MECO 2020, mne, 2020, pp. 1-5. ISBN: 978-1-7281-6949-1
Balakrishnan, A.; Lange, T.; Glorieux, M.; Alexandrescu, D.; Jenihhin, M. (2019)
The Validation of Graph Model-Based, Gate Level Low-Dimensional Feature Data for Machine Learning Applications. In: 5th IEEE Nordic Circuits and Systems Conference, NORCAS 2019: NORCHIP and International Symposium of System-on-Chip, SoC 2019, fin, 2019, pp. 1-7. ISBN: 978-1-7281-2769-9
Lange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, ... (2019)
Machine Learning To Tackle the Challenges of Transient and Soft Errors in Complex Circuits. In: 25th International Symposium on On-Line Testing And Robust System Design (IOLTS), pp. 7-14
Lange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, ... (2019)
On the Estimation of Complex Circuits Functional Failure Rate by Machine Learning Techniques. In: 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN-S) 2019, pp. 35-41. ISBN: 978-1-7281-3028-6
Lai, Xinhui; Balakrishnan, Aneesh; Lange, Thomas; Jenihhin, Maksim; Ghasempouri, Tara; ... (2019)
Understanding multidimensional verification: Where functional meets non-functional. In: MICROPROCESSORS AND MICROSYSTEMS, vol. 71, pp. 102867-102879. ISSN 0141-9331 Download fulltext
Balakrishnan, Aneesh; Lange, Thomas; Glorieux, Maximilien; Alexandrescu, Dan; Jenihhin, ... (2019)
Modeling Gate-Level Abstraction Hierarchy Using Graph Convolutional Neural Networks to Predict Functional De-Rating Factors. In: NASA/ESA Conference on Adaptive Hardware and Systems (AHS) 2019, pp. 72-78. ISBN: 978-1-7281-4650-8
Lange, Thomas; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca (2019)
Functional Failure Rate Due to Single-Event Transients in Clock Distribution Networks. In: 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) 2019, pp. 1-6. ISBN: 978-1-7281-3424-6
Glorieux, Maximilien; Evans, Adrian; Lange, Thomas; In, A-Duong; Alexandrescu, Dan; ... (2018)
Single-Event Characterization of Xilinx UltraScale+® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation. In: IEEE Nuclear and Space Radiation Effects Conference
Sterpone, Luca; Azimi, Sarah; Bozzoli, Ludovica; Du, Boyang; Lange, Thomas; Maximilien, ... (2018)
A Novel Error Rate Estimation Approach for UltraScale+ SRAM-based FPGAs. In: IEEE Adaptive Hardware and Systems (AHS), 2018 NASA/ESA Conference
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