The E. J. McCluskey Best Doctoral Thesis 2025 Award goes to Dr. Francesco Angione

Francesco Angione received the IEEE TTTC’s E. J. McCluskey Best Doctoral Thesis 2025 Award, at the IEEE VLSI Test Symposium (VTS), for the doctoral thesis System-Level Test techniques for Automotive SoCs.
Dr. Angione completed his PhD in March 2025, under the supervision of Prof. Paolo Bernardi and Riccardo Cantoro of the CAD - Electronic CAD & Reliability Group of the DAUIN.

The IEEE TTTC’s E. J. McCluskey Best Doctoral Thesis Award is an annual competition recognizing outstanding doctoral research in test technology. Named after Prof. Edward J. McCluskey, a logic design and reliability pioneer, the award aims to highlight impactful student work, foster academia-industry collaboration, and provide visibility for emerging researchers.