Call for Papers: IEEE International Symposium on On-Line Testing and Robust System Design (IEEE IOLTS 2026)

Call for Papers of the 32nd IEEE International Symposium on On-Line Testing and Robust System Design (IEEE IOLTS 2026), which will take place from the 1st to the 3rd of July in Polignano a Mare (Bari), Italy.
Among the organizers, Riccardo Cantoro and Annachiara Ruospo, of the DAUIN.

Deadline
- 1 March 2026 (title and abstract)
- 8 March 2026 (full paper).

Topics
The areas of interest include, but are not limited to:
- Dependable system design
- Dependable Computer Architectures
- Design-for-Reliability
- Design for Reliability approaches for Low-Power
- Cross-layer reliability approaches
- Fault-Tolerant and Fail-Safe systems
- Functional safety
- Self-Test and Self-Repair
- Self-Healing design
- Self-Regulating design
- Self-Adapting design
- Reliability issues of Low-Power Design
- Robustness evaluation
- Quality, yield, reliability, and lifespan issues in nanometer technologies
- Variability, Aging, EMI, and Radiation Effects in nanometer technologies
- On-line testing techniques for digital, analog, and mixed-signal circuits
- Self-checking circuits and coding theory
- On-line monitoring of current, temperature, process variations, and aging
- Power density and overheating issues in nanometer technologies
- Field Diagnosis, Maintainability, and Reconfiguration
- Design for Security
- Fault-based attacks and countermeasures
- Design for Robustness for automotive, railway, avionics, space, large industrial applications, IT infrastructure, cloud computing, and wired, cellular, and satellite communications
- CAD for robust circuits design

More information
- Contact: Riccardo Cantoro and Annachiara Ruospo
- Link to the Symposium