TestGroup

Test digitale di sistemi, progettazione, affidabilità e verifica sono i principali temi di ricerca del TestGroup. La ricerca in questo gruppo si propone di progettare sistemi integrati facilmente verificabili, affidabili e convenienti. Vengono anche affrontati problemi relativi test off-line e on-line di sistemi integrati complessi.

Progetti e pubblicazioni

  • Selezione di progetti di ricerca finanziati
    • CAN BUS PROTOCOL FOR EXOMAR ROVER
      PRINETTO PAOLO ERNESTO
      2016 - 2017 (Concluso)
    • SALVEREMO - SISTEMA AUTOMATICO DI LOCALIZZAZIONE E AVVISTAMENTO ESCURSIONISTI IN AREE REMOTE MONTANE
      PRINETTO PAOLO ERNESTO
      2014 - 2016 (Concluso)
    • LIS4ALL - LINGUA ITALIANA DEI SEGNI PER L'ACCESSO SU LARGA SCALA AD INFORMAZIONI LOCALIZZATE
      PRINETTO PAOLO ERNESTO
      2012 - 2014 (Concluso)
    • AUTHOMATIC TRANSLATION INTO SIGN LANGUAGES - ATLAS
      PRINETTO PAOLO ERNESTO
      2009 - 2012 (Concluso)
    • DEFECT BASED TESTING AND DIAGNOSIS OF SRAM MEMORIES
      PRINETTO PAOLO ERNESTO
      2009 - 2011 (Concluso)
    • STUDIO DI FATTIBILITA' DELL'INTEGRAZIONE DEL SOTTOSISTEMA DI CONTROLLO ACCESSI E RILEVAZIONE PRESENZE A SISTEMA DI SUPERVISIONE PER BULLDOG AUTOMATION MICRONTEL
      PRINETTO PAOLO ERNESTO
      2009 - 2010 (Concluso)
    • ANALISI E INDIVIDUAZIONE DI UNA NUOVA PIATTAFORMA A MICROPROCESSORE (32 BIT)
      PRINETTO PAOLO ERNESTO
      2008 - 2008 (Concluso)
    • DEFINIZIONE DI UN'ARCHITETTURA DI ELABORAZIONE RICONFIGURABILE E RIPARABILE TRAMITE AGENTI MOBILI
      PRINETTO PAOLO ERNESTO
      2006 - 2008 (Concluso)
    • UN PROCESSO DI COLLAUDO UNIFICATO: DALLE SPECIFICHE AL TEST FUNZIONALE DI FINE PRODUZIONE
      PRINETTO PAOLO ERNESTO
      2001 - 2003 (Concluso)
    • EUNICE-TEST EUROPEAN NETWORK FOR INITIAL AND CONTINUING EDUCATION IN VLSI/SOC ETSTING USING REMOTE ATE FACILITIES
      PRINETTO PAOLO ERNESTO
      2001 - 2003 (Concluso)
  • Selezione di pubblicazioni recenti
    In stampa
    1. New Metrics for Spin Transfer Torque (STT) MRAM Cell Robustness Estimation
      proceeding

      Vatajelu, ELENA IOANA; R., Rodriguez Montañés; Indaco, Marco; M., Renovell; Prinetto, Paolo Ernesto; J., Figueras
      In: Proceedings of Design, Automation & Test in Europe Conference
      Design, Automation & Test in Europe Conference 2015
      pp.6

    2. On the impact of supply voltage variation on the statistical reliability of a Spin-transfer-torque MRAM (STT-MRAM)
      proceeding

      Vatajelu, ELENA IOANA; R., Rodriguez Montañés; Indaco, Marco; M., Renovell; Prinetto, Paolo Ernesto; J., Figueras
      In: Proceedings of Design of Circuits and Integrated Systems
      Design of Circuits and Integrated Systems (Madrid)
      pp.6

    2023
    1. Safeguarding Inter-Device Communications for Connected Systems: A Holistic Security Framework
      proceeding

      Eftekhari Moghadam, Vahid; Prinetto, Paolo
      In: Proceedings of the 3rd International Conference on Electrical, Computer, Communications and Mechatronics Engineering (ICECCME) (2023)
      IEEE
      3rd International Conference on Electrical, Computer, Communications and Mechatronics Engineering (ICECCME) (2023) (Tenerife (ESP)) 19-21 July, 2023
      pp.6 (pp.1-6) ISBN:9798350322989 DOI:10.1109/ICECCME57830.2023.10252717

    2022
    1. ThreMA: Ontology-based Automated Threat Modelling for ICT Infrastructures
      articolo

      De Rosa, Fabio; Maunero, Nicolò; Prinetto, Paolo; Talentino, Federico; Trussoni, Martina
      IEEE ACCESS
      IEEE
      Vol.10 pp.13 (pp.116514-116526) ISSN:2169-3536 DOI:10.1109/ACCESS.2022.3219063

    2. Ontology for Cybersecurity Governance of ICT Systems
      proceeding

      De Rosa, Fabio; Maunero, Nicolò; Nicoletti, Luca; Prinetto, Paolo; Trussoni, Martina
      CEUR WORKSHOP PROCEEDINGS
      In: Proceedings of the Italian Conference on Cybersecurity (ITASEC22) (2022)
      CEUR Workshop Proceedings
      Italian Conference on Cybersecurity (ITASEC22) (2022) (Rome (ITA)) 20-23 June, 2022
      Vol.3260 pp.12 (pp.52-63) ISSN:1613-0073

    3. A Secure Canary-Based Hardware Approach Against ROP
      proceeding

      Sadeghipourrudsari, Mahboobe; Prinetto, Paolo; Nouri, Ebrahim; Sheikhshoaei, Fatemeh; Navabi, Zainalabedin
      In: Title of the volume not validated
      CEUR Workshop Proceedings
      ITASEC'22: Italian Conference on Cybersecurity (Rome, Italy) June 20--23, 2022
      Vol.6 pp.12

    4. Remotizing and Virtualizing Chips and Circuits for Hardware-based Capture-the-Flag Challenges
      proceeding

      Roascio, Gianluca; Cerini, Samuele Yves; Prinetto, Paolo
      In: Proceedings of the 2022 IEEE European Symposium on Security and Privacy Workshops (EuroS&PW)
      Institute of Electrical and Electronics Engineers Inc.
      2022 IEEE European Symposium on Security and Privacy Workshops (EuroS&PW) (Genoa (ITA)) 06-10 June 2022
      pp.9 (pp.477-485) ISBN:9781665495608 DOI:10.1109/EuroSPW55150.2022.00057

    5. Real-Time Control-Flow Integrity for Multicore Mixed-Criticality IoT Systems
      proceeding

      Eftekhari Moghadam, Vahid; Prinetto, Paolo; Roascio, Gianluca
      In: Proceedings of the 2022 IEEE European Test Symposium (ETS)
      Institute of Electrical and Electronics Engineers Inc.
      2022 IEEE European Test Symposium (ETS) (Barcelona (ESP)) 23-27 May 2022
      pp.4 (pp.1-4) ISBN:9781665467063 DOI:10.1109/ETS54262.2022.9810441

    2021
    1. Control-flow integrity for real-time operating systems: open issues and challenges
      proceeding

      Eftekhari Moghadam, Vahid; Meloni, Marco; Prinetto, Paolo
      In: 2021 IEEE East-West Design & Test Symposium (EWDTS) Proceedings
      Institute of Electrical and Electronics Engineers Inc.
      19th IEEE EAST-WEST DESIGN & TEST SYMPOSIUM (EWDTS-2021) (Batumi, Georgia) September 10-13. 2021
      pp.6 (pp.1-6) DOI:10.1109/EWDTS52692.2021.9581003

    2. Prolepsis: binary analysis and instrumentation of iot software for control-flow integrity
      proceeding

      Forte, Valentina; Maunero, Nicolò; Prinetto, Paolo; Roascio, Gianluca
      In: 2021 IEEE International Conference on Electrical, Computer, Communications and Mechatronics Engineering (ICECCME) Proceedings
      Institute of Electrical and Electronics Engineers Inc.
      IEEE International Conference on Electrical, Computer, Communications and Mechatronics Engineering (ICECCME) (Mauritius) October 7-8, Mauritius
      pp.6 (pp.1-6) ISBN:9781665412629 DOI:10.1109/ICECCME52200.2021.9591080

    3. Aftab: a risc-v implementation with configurable gateways for security
      proceeding

      Rajabalipanah, Maryam; Sadeghipourrudsari, Mahboobe; Jahanpeima, Zahra; Roascio, Gianluca; Prinetto, Paolo; Navabi, Zainalabedin
      In: 2021 IEEE East-West Design & Test Symposium (EWDTS) Proceedings
      Institute of Electrical and Electronics Engineers Inc.
      19th IEEE East-West Design & Test Symposium (EWDTS-2021) (Batumi, Georgia) September 10-13, 2021
      pp.6 (pp.1-6) ISBN:9781665445030 DOI:10.1109/EWDTS52692.2021.9580979

    4. Paideusis: a remote hybrid cyber range for hardware, network, and iot security training
      proceeding

      Berra, Giulio; Ferraro, Gaspare; Fornero, Matteo; Maunero, Nicolò; Prinetto, Paolo; Roascio, Gianluca
      CEUR WORKSHOP PROCEEDINGS
      In: Proceedings of the Italian Conference on Cybersecurity (ITASEC 2021)
      CEUR-WS
      ITASEC 2021 - Italian Conference on Cybersecurity 2021 (All Digital Event) April 7-9, 2021
      Vol.2940 pp.14 (pp.284-297) ISSN:1613-0073

    2020
    1. SEkey: a distributed hardware-based key management system
      proceeding

      Fornero, Matteo; Maunero, Nicolò; Prinetto, Paolo; Varriale, Antonio
      In: 2020 IEEE East-West Design & Test Symposium (EWDTS)
      Institute of Electrical and Electronics Engineers Inc.
      2020 IEEE East-West Design & Test Symposium (EWDTS) (Varna (BG)) September 4-7, 2020
      pp.7 (pp.1-7) ISBN:9781728198989 DOI:10.1109/EWDTS50664.2020.9225107

    2. Hardware-based capture-the-flag challenges
      proceeding

      Prinetto, Paolo; Roascio, Gianluca; Varriale, Antonio
      In: 2020 IEEE East-West Design & Test Symposium (EWDTS) Proceedings
      IEEE
      18th IEEE East-West Design & Test Symposium (EWDTS-2020) (Varna (BG)) 04-07 September 2020
      pp.8 (pp.1-8) ISBN:9781728198996 DOI:10.1109/EWDTS50664.2020.9224932

    3. A FPGA-based control-flow integrity solution for securing bare-metal embedded systems
      proceeding

      Maunero, N.; Prinetto, P.; Roascio, G.; Varriale, A.
      In: Proceedings - 2020 15th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2020
      Institute of Electrical and Electronics Engineers Inc.
      15th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2020 (Marrakech (MA)) 2020
      pp.10 (pp.1-10) ISBN:9781728154268 DOI:10.1109/DTIS48698.2020.9081314

    4. EVA: a hybrid cyber range
      proceeding

      Ahmad, Shabeer; Maunero, Nicolò; Prinetto, Paolo Ernesto
      CEUR WORKSHOP PROCEEDINGS
      In: Proceedings of the Fourth Italian Conference on Cyber Security
      CEUR Workshop Proceedings
      ITASEC 2020 - Italian Conference on Cyber Security (Ancona (IT)) February 4th-7th, 2020
      Vol.Vol-2597 pp.12 (pp.12-23) ISSN:1613-0073

    5. Hardware security, vulnerabilities, and attacks: a comprehensive taxonomy
      proceeding

      Prinetto, Paolo; Roascio, Gianluca
      CEUR WORKSHOP PROCEEDINGS
      In: Proceedings of the Fourth Italian Conference on Cyber Security
      CEUR Workshop Proceedings
      ITASEC20 - Italian Conference on Cybersecurity (Ancona (ITA)) February 4th-7th, 2020
      Vol.Vol-2597 pp.13 (pp.177-189) ISSN:1613-0073

    2019
    1. CFI: control flow integrity or control flow interruption?
      proceeding

      Maunero, N.; Prinetto, P.; Roascio, G.
      In: 2019 IEEE East-West Design and Test Symposium, EWDTS 2019
      Institute of Electrical and Electronics Engineers Inc.
      2019 IEEE East-West Design and Test Symposium, EWDTS 2019 (Batumi (GE)) 2019
      pp.6 (pp.1-6) ISBN:9781728110035 DOI:10.1109/EWDTS.2019.8884464

    2. Synetgy: Algorithm-hardware Co-design for ConvNet Accelerators on Embedded FPGAs
      proceeding

      Yang, Yifan; Huang, Qijing; Wu, Bichen; Zhang, Tianjun; Ma, Liang; Gambardella, Giulio; Blott, Michaela; Lavagno, Luciano; Vissers, Kees; Wawrzynek, John; Keutzer, Kurt
      In: Machine Learning
      Association for Computing Machinery
      27th ACM/SIGDA International Symposium on Field-Programmable Gate Arrays
      pp.10 (pp.23-32) ISBN:9781450361378 DOI:10.1145/3289602.3293902

    2018
    1. Securing bitstream integrity, confidentiality and authenticity in reconfigurable mobile heterogeneous systems
      proceeding

      Carelli, Alberto; Cristofanini, Carlo Alberto; Vallero, Alessandro; Basile, Cataldo; Prinetto, Paolo; Di Carlo, Stefano
      In: Proceedings of the 2018 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR 2018)
      Institute of Electrical and Electronics Engineers Inc. (STATI UNITI D'AMERICA)
      IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR 2018) (Cluj-Napoca (Romania)) 24-26 May 2018
      pp.6 (pp.1-6) ISBN:9781538622049 DOI:10.1109/AQTR.2018.8402795

    2017
    1. Side-channel analysis of SEcube™ platform
      proceeding

      Bollo, Matteo; Carelli, Alberto; Di Carlo, Stefano; Prinetto, Paolo
      In: Proceedings of the 2017 IEEE East-West Design & Test Symposium (EWDTS)
      IEEE (STATI UNITI D'AMERICA)
      2017 IEEE East-West Design & Test Symposium (EWDTS) (Novi Sad, (Serbia)) 29 Sept.-2 Oct. 2017
      pp.5 (pp.1-5) ISBN:9781538632994 DOI:10.1109/EWDTS.2017.8110067

    2. Scan chain encryption for the test, diagnosis and debug of secure circuits
      proceeding

      Da Silva, Mathieu; Flottes, Marie Lise; DI NATALE, Giorgio; Rouzeyre, Bruno; Prinetto, Paolo Ernesto; Restifo, Marco
      In: Proceedings of the European Test Workshop
      Institute of Electrical and Electronics Engineers Inc. (STATI UNITI D'AMERICA)
      22nd IEEE European Test Symposium, ETS 2017 (cyp) 2017
      pp.6 (pp.1-6) ISBN:9781509054572 DOI:10.1109/ETS.2017.7968248

    2016
    1. Towards Model Driven Design of Crypto Primitives and Processes
      proceeding

      Carelli, Alberto; Di Natale, Giorgio; Trotta, Pascal; Margaria, TIZIANA MARIA
      In: Proceedings of The 2016 World Congress in Computer Science, Computer Engineering, and Applied Computing
      CSREA Press
      SAM'16 - The 2016 International Conference on Security and Management (Las Vegas (USA)) Luglio 2016
      Vol.1 pp.7 (pp.152-158) ISBN:9781601324450

    2. SEcube™: Data at Rest and Data in Motion Protection
      proceeding

      Varriale, Antonio; Prinetto, Paolo Ernesto; Carelli, Alberto; Trotta, Pascal
      In: Proceedings of The 2016 World Congress in Computer Science, Computer Engineering, and Applied Computing
      CSREA Press
      SAM'16 - The 2016 International Conference on Security and Management (Las Vegas (USA))
      Vol.1 pp.7 (pp.138-144) ISBN:9781601324450

    3. Model driven design of secure properties for vision-based applications: A case study
      proceeding

      AIRO' FARULLA, Giuseppe; Indaco, Marco; Legay, Axel; Margaria, Tiziana
      In: Proceedings of the International Conference on Security and Management (SAM), The Steering Committee of The World Congress in Computer Science, Computer Engineering and Applied Computing
      The 2016 International Conference on Security and Management (SAM'16) (Las Vegas, USA) 25-28 July 2016
      Vol.1 pp.9 (pp.159-167) ISBN:9781601324450

    4. A Low-cost Open Source 3D-Printable Dexterous Anthropomorphic Robotic Hand with a Parallel Spherical Joint Wrist for Sign Languages Reproduction
      articolo

      Bulgarelli, Andrea; Toscana, Giorgio; Russo, LUDOVICO ORLANDO; AIRO' FARULLA, Giuseppe; Indaco, Marco; Bona, Basilio
      INTERNATIONAL JOURNAL OF ADVANCED ROBOTIC SYSTEMS
      INTECH
      Vol.13 pp.12 ISSN:1729-8806 DOI:10.5772/64113

    5. Towards a Highly Reliable SRAM-based PUFs
      proceeding

      Vatajelu, ELENA IOANA; Di Natale, Giorgio; Prinetto, Paolo Ernesto
      In: Proceedings of 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE)
      2016 Design, Automation & Test in Europe Conference & Exhibition (DATE)
      pp.4 (pp.273-276) ISBN:9783981537079 DOI:10.3850/9783981537079_0753

    6. Security Primitives (PUF and TRNG) with STT-MRAM
      proceeding

      Vatajelu, ELENA IOANA; Di Natale, G.; Prinetto, Paolo Ernesto
      2016 IEEE 34th VLSI Test Symposium (VTS)
      In: Proceedings of 2016 IEEE 34th VLSI Test Symposium (VTS)
      IEEE
      2016 IEEE 34th VLSI Test Symposium (VTS)
      Vol.2016 IEEE 34th VLSI Test Symposium (VTS) pp.4 (pp.1-4) ISBN:9781467384544 DOI:10.1109/VTS.2016.7477292

    7. STT-MRAM-based PUF architecture exploiting magnetic tunnel junction fabrication-induced variability
      articolo

      Vatajelu, ELENA IOANA; Di Natale, Giorgio; Barbareschi, Mario; Torres, Lionel; Indaco, Marco; Prinetto, Paolo Ernesto
      ACM JOURNAL ON EMERGING TECHNOLOGIES IN COMPUTING SYSTEMS
      Association for Computing Machinery
      Vol.13 pp.21 (pp.1-21) ISSN:1550-4832 DOI:10.1145/2790302

    8. Enhancing Real-time Embedded Image Processing Robustness on Reconfigurable Devices for Critical Applications
      tesi dottorato

      Trotta, Pascal
      Politecnico di Torino
      pp.184 DOI:10.6092/polito/porto/2641174

    9. Vision-based pose estimation for robot-mediated hand telerehabilitation
      articolo

      AIRO' FARULLA, Giuseppe; Pianu, Daniele; Cempini, Marco; Cortese, Mario; Russo, LUDOVICO ORLANDO; Indaco, Marco; Nerino, Roberto; Chimienti, Antonio; Oddo, Calogero M.; Vitiello, Nicola
      SENSORS
      MDPI AG
      Vol.16 pp.16 (pp.208-223) ISSN:1424-8220 DOI:10.3390/s16020208

    2015
    1. Read/Write Robustness Estimation Metrics for Spin Transfer Torque (STT) MRAM Cell
      proceeding

      Vatajelu, ELENA IOANA; Rodriguez Montañés, Rosa; Indaco, Marco; Renovell, Michel; Prinetto, Paolo Ernesto; Figueras, Joan
      In: Proceedings of 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE)
      2015 Design, Automation & Test in Europe Conference & Exhibition (DATE)
      pp.6 (pp.447-452) ISBN:9783981537048 DOI:10.7873/DATE.2015.0822

    2. STT-MRAM cell reliability evaluation under process, voltage and temperature (PVT) variations
      proceeding

      Vatajelu, ELENA IOANA; Rodriguez Montanes, Rosa; Indaco, Marco; Prinetto, Paolo Ernesto; Figueras, Joan
      In: Proceedings - 2015 10th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2015
      Institute of Electrical and Electronics Engineers Inc.
      2015 10th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2015 (ita) 2015
      pp.6 (pp.1-6) ISBN:9781479919994 DOI:10.1109/DTIS.2015.7127377

    3. STT-MRAM-based strong PUF architecture
      proceeding

      Vatajelu, ELENA IOANA; Di Natale, Giorgio; Torres, Lionel; Prinetto, Paolo Ernesto
      In: Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI
      IEEE Computer Society
      IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2015 (fra) 2015
      Vol.07-10- pp.6 (pp.467-472) ISBN:9781479987184 DOI:10.1109/ISVLSI.2015.128

    4. PORTING LEON3FT/GRLIB TO 4th GENERATION FLASH-BASED DEVICES
      proceeding

      Andersson, Jan; Habinc, Sandi; Prinetto, Paolo Ernesto; Trotta, Pascal
      In: DASIA 2015: The International Space System Engineering Conference
      DASIA 2015: The International Space System Engineering Conference (Barcelona) 19-21 May 2015
      pp.4

    5. An efficient many-core architecture for Elliptic Curve Cryptography security assessment
      proceeding

      Indaco, Marco; Lauri, Fabio; Miele, Andrea; Trotta, Pascal
      In: Proceedings of the 25th International Conference on Field Programmable Logic and Applications (FPL)
      25th International Conference on Field Programmable Logic and Applications (FPL) (London (UK)) 2-4 September 2015
      pp.6 (pp.1-6) ISBN:9780993428005 DOI:10.1109/FPL.2015.7293950

    6. A portable open-source controller for safe Dynamic Partial Reconfiguration on Xilinx FPGAs
      proceeding

      DI CARLO, Stefano; Prinetto, Paolo Ernesto; Trotta, Pascal; Andersson, Jan
      In: Proceedings of the 25th International Conference on Field Programmable Logic and Applications (FPL)
      IEEE (STATI UNITI D'AMERICA)
      25th International Conference on Field Programmable Logic and Applications (FPL) (London, UK) 2-4 Sept. 2015
      pp.4 (pp.1-4) ISBN:9780993428005 DOI:10.1109/FPL.2015.7294002

    7. Power-aware voltage tuning for STT-MRAM reliability
      proceeding

      Vatajelu, ELENA IOANA; Rodriguez Montanes, R.; DI CARLO, Stefano; Indaco, Marco; Renovell, M.; Prinetto, Paolo Ernesto; Figueras, J.
      In: Proceedings of the 20th IEEE European Test Symposium (ETS)
      IEEE Computer Society (STATI UNITI D'AMERICA)
      20th IEEE European Test Symposium (ETS) (Cluj-Napoca, RO) 25-29 May 2015
      pp.6 (pp.1-6) ISBN:9781479976034 DOI:10.1109/ETS.2015.7138748

    8. SSDExplorer: A Virtual Platform for Performance/Reliability-Oriented Fine-Grained Design Space Exploration of Solid State Drives
      articolo

      Zuolo, Lorenzo; Zambelli, Cristian; Micheloni, Rino; Indaco, Marco; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Bertozzi, Davide; Olivo, Piero
      IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
      IEEE
      Vol.34 pp.12 (pp.1627-1638) ISSN:0278-0070 DOI:10.1109/TCAD.2015.2422834

    9. A cloud robotics system for telepresence enabling mobility impaired people to enjoy the whole museum experience
      proceeding

      KAOUK NG, MIGUEL EFRAIN; Primatesta, Stefano; Giuliano, Luca; Lupetti, MARIA LUCE; Russo, LUDOVICO ORLANDO; AIRO' FARULLA, Giuseppe; Indaco, Marco; Rosa, Stefano; Germak, Claudio; Bona, Basilio
      In: 2015 10th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
      IEEE
      Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2015 10th International Conference on (Naples (IT)) 21-23 April 2015
      pp.6 (pp.1-6) ISBN:9781479919994 DOI:10.1109/DTIS.2015.7127391

    10. ORIENTOMA: A novel platform for autonomous and safe navigation for blind and visually impaired
      proceeding

      AIRO' FARULLA, Giuseppe; Russo, LUDOVICO ORLANDO; Rosa, Stefano; Indaco, Marco
      In: 2015 10th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
      IEEE
      Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2015 10th International Conference on (Naples (IT)) 21-23 April 2015
      pp.6 (pp.1-6) ISBN:9781479919994 DOI:10.1109/DTIS.2015.7127390

    11. A Novel Architectural Pattern to Support the Development of Human-Robot Interaction (HRI) Systems Integrating Haptic Interfaces and Gesture Recognition Algorithms
      proceeding

      AIRO' FARULLA, Giuseppe; Russo, LUDOVICO ORLANDO; Gallifuoco, Vincenzo; Indaco, Marco
      IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
      In: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
      IEEE
      VLSI (ISVLSI), 2015 IEEE Computer Society Annual Symposium on (Montpellier (Fr)) 8-10 July 2015
      pp.6 (pp.386-391) ISSN:1063-8210 ISBN:9781479987184 DOI:10.1109/ISVLSI.2015.112

    12. Dynamic Partial Reconfiguration for Dependable Systems
      tesi dottorato

      Gambardella, Giulio
      Politecnico di Torino
      DOI:10.6092/polito/porto/2617020

    13. High-performance hardware accelerators for image processing in space applications
      tesi dottorato

      Rolfo, Daniele
      Politecnico di Torino
      pp.228 DOI:10.6092/polito/porto/2616951

    14. PARLOMA – A Novel Human-Robot Interaction System for Deaf-blind Remote Communication
      articolo

      Russo, LUDOVICO ORLANDO; AIRO' FARULLA, Giuseppe; Pianu, D.; Salgarella, A. R.; Controzzi, M.; Cipriani, C.; Oddo, C. M.; Geraci, C.; Rosa, Stefano; Indaco, Marco
      INTERNATIONAL JOURNAL OF ADVANCED ROBOTIC SYSTEMS
      INTECH
      Vol.12 pp.13 (pp.1-13) ISSN:1729-8806 DOI:10.5772/60416

    15. STT MRAM-Based PUFs
      proceeding

      Vatajelu, ELENA IOANA; G., Di Natale; Indaco, Marco; Prinetto, Paolo Ernesto
      In: Proceedings of Design, Automation and Test in Europe
      IEEE
      Design, Automation and Test in Europe
      pp.4 (pp.872-875) DOI:10.7873/DATE.2015.0505

    16. Nonvolatile Memories: Present and Future Challenges
      proceeding

      Vatajelu, ELENA IOANA; H., Aziza; C., Zambelli
      In: Proceedings of International Test Symposium
      IEEE
      International Test Symposium 2014
      pp.6

    17. SATTA: a Self-Adaptive Temperature-based TDF awareness methodology for dynamically reconfigurable FPGAs
      articolo

      DI CARLO, Stefano; Gambardella, Giulio; Prinetto, Paolo Ernesto; Rolfo, Daniele; Trotta, Pascal
      ACM TRANSACTIONS ON RECONFIGURABLE TECHNOLOGY AND SYSTEMS
      ACM
      Vol.8 pp.22 (pp.1-22) ISSN:1936-7406 DOI:10.1145/2659001

    18. SA-FEMIP: A Self-Adaptive Features Extractor and Matcher IP-Core Based on Partially Reconfigurable FPGAs for Space Applications
      articolo

      DI CARLO, Stefano; Gambardella, Giulio; Prinetto, Paolo Ernesto; Rolfo, Daniele; Trotta, Pascal
      IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
      IEEE / Institute of Electrical and Electronics Engineers
      Vol.23 pp.10 (pp.2198-2208) ISSN:1063-8210 DOI:10.1109/TVLSI.2014.2357181

    19. Usability of Online Assistance From Semi-literate Users’ Perspective
      articolo

      Ahmad, Nadeem; Shoaib, Umar; Prinetto, Paolo Ernesto
      INTERNATIONAL JOURNAL OF HUMAN-COMPUTER INTERACTION
      Taylor Francis Online
      Vol.31 pp.10 (pp.55-64) ISSN:1044-7318 DOI:10.1080/10447318.2014.925772

    20. Performance and Reliability Analysis of Cross-Layer Optimizations of NAND Flash Controllers
      articolo

      Bertozzi, D.; DI CARLO, Stefano; Galfano, S.; Indaco, M.; O. l. i. v. o., P.; Prinetto, Paolo Ernesto; Zambelli, C.
      ACM TRANSACTIONS ON EMBEDDED COMPUTING SYSTEMS
      ACM
      Vol.14 pp.24 (pp.1-24) ISSN:1539-9087 DOI:10.1145/2629562

    2014
    1. Integration of STT-MRAM model into CACTI simulator
      proceeding

      Indaco, M.; DI CARLO, Stefano; Vatajelu, E. I.; Prinetto, Paolo Ernesto; Arcaro, S.; Pala, D.
      In: Proceedings of the 9th IEEE International Design and Test Symposium
      IEEE (STATI UNITI D'AMERICA)
      9th IEEE International Design and Test Symposium (IDT) (Algiers, DZ) 16-18 Dec. 2014
      pp.6 (pp.67-72) ISBN:9781479982004 DOI:10.1109/IDT.2014.7038589

    2. On the impact of process variability and aging on the reliability of emerging memories (Embedded tutorial)2014 19th IEEE European Test Symposium (ETS)
      proceeding

      Indaco, Marco; Prinetto, Paolo Ernesto; Vatajelu, ELENA IOANA
      In: 2014 19th IEEE European Test Symposium (ETS)
      IEEE
      European Test Symposium 2014
      pp.10 (pp.1-10) DOI:10.1109/ETS.2014.6847813

    3. Service Oriented Non-Volatile Memories
      tesi dottorato

      Indaco, Marco
      Politecnico di Torino
      pp.173 DOI:10.6092/polito/porto/2572951

    4. A novel approach for video-based absolute navigation in space exploration missions
      proceeding

      Tadewos Getahun, T.; Prinetto, Paolo Ernesto; Rolfo, Daniele; Trotta, Pascal; Lanza, P.; Martelli, A.; Tramutola, A.
      In: Proceedings of the DASIA 2014 - DAta Systems In Aerospace - Conference
      ESA Publications Division (PAESI BASSI)
      Data Systems in Aerospace 2014 (Warsaw, Poland) 3-5 June, 2014
      pp.5

    5. A cloud-based Cyber-Physical System for environmental monitoring
      proceeding

      Sanislav, T.; Mois, G.; Folea, S.; Miclea, L.; Gambardella, Giulio; Prinetto, Paolo Ernesto
      In: Proceedings of the 3rd Mediterranean Conference on Embedded Computing (MECO) 2014
      IEEE (STATI UNITI D'AMERICA)
      3rd Mediterranean Conference on Embedded Computing (MECO) (Budva, ME) 15-19 June 2014
      pp.4 (pp.6-9) DOI:10.1109/MECO.2014.6862654

    6. Real-time single camera hand gesture recognition system for remote deaf-blind communication
      proceeding

      AIRO' FARULLA, Giuseppe; Russo, LUDOVICO ORLANDO; Chiara, Pintor; Daniele, Pianu; Giorgio, Micotti; Alice Rita, Salgarella; Domenico, Camboni; Marco, Controzzi; Christian, Cipriani; Calogero Maria, Oddo; Rosa, Stefano; Indaco, Marco
      LECTURE NOTES IN COMPUTER SCIENCE
      In: 1st International Conference on Augmented and Virtual Reality - Salento AVR 2014
      Springer
      1st International Conference on Augmented and Virtual Reality - Salento AVR 2014 (Lecce) 17-20 September 2014
      Vol.1 pp.18 (pp.35-52) ISSN:0302-9743 DOI:10.1007/978-3-319-13969-2_3

    7. ABLUR: An FPGA-based adaptive deblurring core for real-time applications
      proceeding

      AIRO' FARULLA, Giuseppe; Indaco, Marco; Prinetto, Paolo Ernesto; Rolfo, Daniele; Trotta, Pascal
      In: Adaptive Hardware and Systems (AHS), 2014 NASA/ESA Conference on
      IEEE / Institute of Electrical and Electronics Engineers
      Adaptive Hardware and Systems (AHS), 2014 NASA/ESA Conference on (Leicester) 14-17 July 2014
      pp.8 (pp.104-111) DOI:10.1109/AHS.2014.6880165

    8. Evaluation of image deblurring algorithms for real-time applications
      proceeding

      AIRO' FARULLA, Giuseppe; Indaco, Marco; Rolfo, Daniele; Russo, LUDOVICO ORLANDO; Trotta, Pascal
      In: Design & Technology of Integrated Systems In Nanoscale Era (DTIS), 2014 9th IEEE International Conference On
      IEEE
      Design & Technology of Integrated Systems In Nanoscale Era (DTIS), 2014 9th IEEE International Conference On (Santorini) 6-8 May 2014
      pp.6 (pp.1-6) DOI:10.1109/DTIS.2014.6850668

    9. An improved fault mitigation strategy for CUDA Fermi GPUs
      proceeding

      DI CARLO, Stefano; Gambardella, G.; Martella, I.; Prinetto, Paolo Ernesto; Rolfo, D.; Trotta, P.
      In: Proceedings of the Dependable GPU Computing workshop 2014
      Dependable GPU Computing workshop 2014 (Dresden, DE) 28 March 2014
      pp.6 (pp.1-6)

    10. Reliability Estimation at Block-Level Granularity of Spin-Transfer-Torque MRAMs
      proceeding

      Vatajelu, E. I.; Indaco, M.; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Rodriguez Montañés, R.; Figueras, J.
      In: Proceedings of the 27th IEEE Defect and Fault Tolerance in VLSI and Nanotechnology Systems Symposium (DFTS) 2014
      IEEE (STATI UNITI D'AMERICA)
      27th IEEE Defect and Fault Tolerance in VLSI and Nanotechnology Systems Symposium (DFTS) (Amsterdam, NL) 1-3 Oct. 2014
      pp.6 (pp.75-80) ISBN:9781479961559 DOI:10.1109/DFT.2014.6962093

    11. A Fault Injection Methodology and Infrastructure for Fast Single Event Upsets Emulation on Xilinx SRAM-based FPGAs
      proceeding

      DI CARLO, Stefano; Prinetto, Paolo Ernesto; Rolfo, D.; Trotta, P.
      In: Proceedings of the 27th IEEE Defect and Fault Tolerance in VLSI and Nanotechnology Systems Symposium (DFTS) 2014
      IEEE (STATI UNITI D'AMERICA)
      27th IEEE Defect and Fault Tolerance in VLSI and Nanotechnology Systems Symposium (DFTS) (Amsterdam, NL) 1-3 Oct. 2014
      pp.6 (pp.159-164) ISBN:9781479961559 DOI:10.1109/DFT.2014.6962073

    12. On Enhancing Fault Injection's Capabilities and Performances for Safety Critical Systems
      proceeding

      DI CARLO, Stefano; Gambardella, G.; Prinetto, Paolo Ernesto; Reichenbach, F.; Lokstad, T.; Rafiq, G.
      In: Proceedings of the 17th Euromicro Conference on Digital System Design (DSD) 2014
      IEEE (STATI UNITI D'AMERICA)
      17th Euromicro Conference on Digital System Design (DSD) (Verona, IT) 27-29 Aug. 2014
      pp.8 (pp.583-590) ISBN:9781479957934 DOI:10.1109/DSD.2014.12

    13. A novel algorithm and hardware architecture for fast video-based shape reconstruction of space debris
      articolo

      DI CARLO, Stefano; Prinetto, Paolo Ernesto; Rolfo, D.; Sansonne, N.; Trotta, P.
      EURASIP JOURNAL ON ADVANCES IN SIGNAL PROCESSING
      Springer
      Vol.2014:147 pp.19 (pp.1-19) ISSN:1687-6180 DOI:10.1186/1687-6180-2014-147

    14. A novel methodology to increase fault tolerance in autonomous FPGA-based systems
      proceeding

      DI CARLO, Stefano; Gambardella, Giulio; Prinetto, Paolo Ernesto; Rolfo, Daniele; Trotta, Pascal; Vallero, Alessandro
      In: Proceedings of the IEEE 20th International On-Line Testing Symposium (IOLTS) 2014
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 20th International On-Line Testing Symposium (IOLTS) (Platja d'Aro, Girona (ES)) 7-9 July 2014
      pp.6 (pp.87-92) ISBN:9781479953240 DOI:10.1109/IOLTS.2014.6873677

    15. FLARES: an aging aware algorithm to autonomously adapt the error correction capability in NAND Flash memories
      articolo

      DI CARLO, Stefano; Galfano, Salvatore; Indaco, Marco; Prinetto, Paolo Ernesto; Bertozzi, D.; Olivo, P.; Zambelli, C.
      ACM TRANSACTIONS ON ARCHITECTURE AND CODE OPTIMIZATION
      ACM
      Vol.11 pp.25 (pp.26:1-26:25) ISSN:1544-3566 DOI:10.1145/2631919

    16. SSDExplorer: a Virtual Platform for Fine-Grained Design Space Exploration of Solid State Drives
      proceeding

      Zuolo, L.; Zambelli, C.; Micheloni, R.; Galfano, Salvatore; Indaco, Marco; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Olivo, P.; Bertozzi, D.
      In: Proceedings of Design, Automation and Test in Europe, Conference and Exhibition (DATE)
      IEEE (STATI UNITI D'AMERICA)
      Design, Automation and Test in Europe, Conference and Exhibition (DATE) (Dresden, DE) 24-28 Mar. 2014
      pp.6 (pp.1-6) DOI:10.7873/DATE.2014.297

    17. Integrating MultiWordNet with Italian Sign Language lexical resources
      articolo

      Shoaib, Umar; Ahmad, Nadeem; Prinetto, Paolo Ernesto; Tiotto, Gabriele
      EXPERT SYSTEMS WITH APPLICATIONS
      ELSEVIER
      Vol.41 pp.9 (pp.2300-2308) ISSN:0957-4174 DOI:10.1016/j.eswa.2013.09.027

    2013
    1. Blurring Prediction in Monocular SLAM
      proceeding

      Russo, LUDOVICO ORLANDO; AIRO' FARULLA, Giuseppe; Indaco, Marco; Rosa, Stefano; Rolfo, Daniele; Bona, Basilio
      In: Proceedings of the 8th International Design & Test Symposium (IDT) 2013
      8th IEEE International Design & Test Symposium 2013 (Marrakesh, Morocco) December 16-18, 2013
      DOI:10.1109/IDT.2013.6727095

    2. Stereo vision system for capture and removal of space debris
      proceeding

      Rosso, Francesco; Gallo, F.; Allasia, W.; Licata, E.; Prinetto, Paolo Ernesto; Rolfo, Daniele; Trotta, Pascal; Favetto, Alain; Paleari, M.; Ariano, Paolo
      In: Titolo volume non avvalorato
      5th European Conference for Aeronautics and Space Sciences EUCASS 2013 (Munich, Germany) 1-5 July 2013
      pp.9

    3. Fault mitigation strategies for CUDA GPUs
      proceeding

      DI CARLO, Stefano; Gambardella, G.; Martella, I.; Prinetto, Paolo Ernesto; Rolfo, D.; Trotta, P.
      In: IEEE International Test Conference (ITC) 2013
      IEEE (STATI UNITI D'AMERICA)
      IEEE International Test Conference (ITC) (Anaheim (CA), USA) 6-13 Sept., 2013
      pp.8 (pp.1-8) ISBN:9781479908592 DOI:10.1109/TEST.2013.6651908

    4. FEMIP: A high performance FPGA-based features extractor & matcher for space applications
      proceeding

      DI CARLO, Stefano; Gambardella, Giulio; Prinetto, Paolo Ernesto; Rolfo, Daniele; Trotta, Pascal; Lanza, L.
      In: 23rd International Conference on Field programmable Logic and Applications (FPL) 2013
      IEEE (STATI UNITI D'AMERICA)
      23rd International Conference on Field programmable Logic and Applications (FPL) (Porto, PT) 2-4 Sept., 2013
      pp.4 (pp.1-4) ISBN:9781479900046 DOI:10.1109/FPL.2013.6645606

    5. Dependable Dynamic Partial Reconfiguration with minimal area & time overheads on Xilinx FPGAS
      proceeding

      DI CARLO, Stefano; Gambardella, Giulio; Indaco, Marco; Prinetto, Paolo Ernesto; Rolfo, Daniele; Trotta, Pascal
      In: 23rd International Conference on Field programmable Logic and Applications (FPL) 2013
      IEEE (STATI UNITI D'AMERICA)
      23rd International Conference on Field programmable Logic and Applications (FPL) (Porto, PT) 2-4 Sept., 2013
      pp.4 (pp.1-4) ISBN:9781479900046 DOI:10.1109/FPL.2013.6645549

    6. AIDI: An adaptive image denoising FPGA-based IP-core for real-time applications
      proceeding

      DI CARLO, Stefano; Prinetto, Paolo Ernesto; Rolfo, Daniele; Trotta, Pascal
      In: NASA/ESA Conference on Adaptive Hardware and Systems (AHS) 2013
      IEEE (STATI UNITI D'AMERICA)
      NASA/ESA Conference on Adaptive Hardware and Systems (AHS) (Torino, IT) 24-27 June, 2013
      pp.8 (pp.99-106) ISBN:9781467363839 DOI:10.1109/AHS.2013.6604232

    7. Increasing the robustness of CUDA Fermi GPU-based systems
      proceeding

      DI CARLO, Stefano; Gambardella, G.; Indaco, M.; Martella, I.; Prinetto, Paolo Ernesto; Rolfo, D.; Trotta, P.
      In: Proceedings of the IEEE 19th International On-Line Testing Symposium (IOLTS) 2013
      IEEE (STATI UNITI D'AMERICA)
      IEEE 19th International On-Line Testing Symposium (IOLTS) (Crete, GR) 8-10 July, 2013
      pp.2 (pp.234-235) ISBN:9781479906642 DOI:10.1109/IOLTS.2013.6604088

    8. Advanced image processing in space applications: the new trend to increase the success rate of exploration space missions
      proceeding

      Lanza, P.; Martelli, A.; Prinetto, Paolo Ernesto; Rolfo, Daniele; Tramutola, A.; Trotta, Pascal
      In: Titolo volume non avvalorato
      5th European Conference for Aeronautics and Space Sciences (EUCASS 2013) 1-5 July 2013
      pp.12

    9. FPGA-based IP-cores library for advanced image processing in space applications
      proceeding

      Lanza, P.; Martelli, A.; Prinetto, Paolo Ernesto; Rolfo, Daniele; Tramutola, A.; Trotta, Pascal
      In: Proceedings of the DASIA 2013 - DAta Systems In Aerospace - Conference
      ESA Publications Division (PAESI BASSI)
      Data Systems in Aerospace 2013 (Porto, Portugal) 14-16 May, 2013
      pp.8

    10. Stereo vision system for capture and removal of space debris
      proceeding

      Walter, Allasia; Ariano, Paolo; Favetto, Alain; Francesco, Gallo; Enrico, Licata; Marco, Paleari; Prinetto, Paolo Ernesto; Rolfo, Daniele; Francesco, Rosso; Trotta, Pascal
      In: IEEE Conference on Design and Architectures for Signal and Image Processing (DASIP) 2013
      IEEE (STATI UNITI D'AMERICA)
      IEEE Conference on Design and Architectures for Signal and Image Processing (DASIP) (Cagliari (IT)) 08-13 Oct., 2013
      pp.7 (pp.201-207)

    11. Ef3S: An evaluation framework for flash-based systems
      proceeding

      DI CARLO, Stefano; Galfano, Salvatore; Indaco, Marco; Prinetto, Paolo Ernesto
      In: IEEE 19th International On-Line Testing Symposium (IOLTS) 2013
      IEEE (STATI UNITI D'AMERICA)
      IEEE 19th International On-Line Testing Symposium (IOLTS) (Crete, GR) 8-10 July, 2013
      pp.6 (pp.199-204) ISBN:9781479906642 DOI:10.1109/IOLTS.2013.6604079

    12. A software-based self test of CUDA Fermi GPUs
      proceeding

      DI CARLO, Stefano; Gambardella, G.; Indaco, M.; Martella, I.; Prinetto, Paolo Ernesto; Rolfo, D.; Trotta, P.
      In: Proceedings of the IEEE 18th European Test Symposium (ETS)
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 18th European Test Symposium (ETS) (Avignon (F)) 27-30 May 2013
      pp.6 (pp.1-6) DOI:10.1109/ETS.2013.6569353

    13. Design and Optimization of Adaptable BCH Codecs for NAND Flash Memories
      articolo

      Fabiano, Michele; Indaco, Marco; DI CARLO, Stefano; Prinetto, Paolo Ernesto
      MICROPROCESSORS AND MICROSYSTEMS
      Butterworth Heinemann Publishers:Linacre Editore attuale..ELSEVIER SCI LTD, THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD, ENGLAND, OXON, OX5 1GB. House Jordan Hill, Oxford OX2 8DP United Kingdom:011 44 1865 314569, EMAIL: bhmarketing@repp.co.uk, INTERNET: http://www.laxtonsprices.co.uk, Fax: 011 44 1865 314569
      Vol.37 pp.13 (pp.407-419) ISSN:0141-9331 DOI:10.1016/j.micpro.2013.03.002

    14. ZipStream: improving dependability in Dynamic Partial Reconfiguration
      proceeding

      DI CARLO, Stefano; Gambardella, Giulio; Huynh Bao, T.; Prinetto, Paolo Ernesto; Rolfo, Daniele; Trotta, Pascal
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 8th International Design and Test Symposium (IDT) (Marrakesh, MA) 16-18 Dec. 2013
      pp.6 (pp.1-6) DOI:10.1109/IDT.2013.6727128

    15. SAFE: a Self Adaptive Frame Enhancer FPGA-based IP-core for real-time space applications
      proceeding

      DI CARLO, Stefano; Gambardella, Giulio; Lanza, P.; Prinetto, Paolo Ernesto; Rolfo, Daniele; Trotta, Pascal
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 8th International Design and Test Symposium (IDT) (Marrakesh, MA) 16-18 Dec. 2013
      pp.6 (pp.1-6) DOI:10.1109/IDT.2013.6727127

    2012
    1. Efficient system-level aging prediction
      proceeding

      HATAMI MAZINANI, Nadereh; Baranowski, R.; Prinetto, Paolo Ernesto; Wunderlich, H.
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 17th European Test Symposium (ETS) (Annecy, FR) 28-31 May 2012
      pp.6 (pp.1-6) ISBN:9781467306966 DOI:10.1109/ETS.2012.6233028

    2. ADAGE: An Automated Synthesis tool for Adaptive BCH-based ECC IP-Cores
      proceeding

      DI CARLO, Stefano; Fabiano, Michele; Indaco, Marco; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE COMPUTER SOCIETY (STATI UNITI D'AMERICA)
      ITC - IEEE International Test Conference (Anaheim) 4-9 November, 2012
      pp.1

    3. A Virtual Character based Italian Sign Language Dictionary
      proceeding

      Ahmad, Nadeem; Barberis, Davide; Garazzino, Nicola; Prinetto, Paolo Ernesto; Shoaib, Umar; Tiotto, Gabriele
      In: Proceedings of the Conference Universal Learning Design, ICCHP
      Masaryk University (REPUBBLICA CECA)
      Universal Learning Design International Conference (Linz (Austria)) 11-13 Jul. 2012
      pp.8

    4. NBTI Mitigation by Dynamic Partial Reconfiguration
      proceeding

      DI CARLO, Stefano; Galfano, Salvatore; Gambardella, Giulio; Indaco, Marco; Prinetto, Paolo Ernesto; Rolfo, Daniele; Trotta, Pascal
      In: Proceedings of the IEEE 13th Biennal Baltic Electronics Conference 2013
      IEEE (STATI UNITI D'AMERICA)
      IEEE 13th Biennal Baltic Electronics Conference (BEC) (Tallin, EE) 03-05 Oct., 2012
      pp.4 (pp.93-96) DOI:10.1109/BEC.2012.6376823

    5. A platform-independent user-friendly dictionary from Italian to LIS
      proceeding

      Shoaib, Umar; Ahmad, Nadeem; Prinetto, Paolo Ernesto; Tiotto, Gabriele
      In: LREC'12 : 8th International Conference on Language Resources and Evaluation
      LREC'12 : 8th International Conference on Language Resources and Evaluation (Istanbul (Turkey)) May 23-25, 2012
      ISBN:9782951740877

    6. A cross-layer approach for new reliability-performance trade-offs in MLC NAND flash memories
      proceeding

      Zambelli, C.; Indaco, Marco; Fabiano, Michele; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Olivo, P.; Bertozzi, D.
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      Design, Automation and Test in Europe, Conference and Exhibition (DATE) (Dresden, DE) 12-16 March 2012
      pp.6 (pp.881-886) ISBN:9781457721458 DOI:10.1109/DATE.2012.6176622

    2011
    1. The Italian Sign Language Sign Bank: Using WordNet for Sign Language corpus creation
      proceeding

      Prinetto, Paolo Ernesto; Shoaib, Umar; Tiotto, Gabriele
      In: Titolo volume non avvalorato
      IEEE International Conference on Communications and Information Technology (Aqaba (Jordan)) 29-31 March 2011
      pp.4 (pp.134-137) ISBN:9781457704017 DOI:10.1109/ICCITECHNOL.2011.5762664

    2. Language Resources for Computer Assisted Translation from Italian to Italian Sign Language of Deaf People
      proceeding

      Barberis, Davide; Garazzino, Nicola; Savino, Alessandro; Ahmad, Nadeem; Shoaib, Umar; Prinetto, Paolo Ernesto; Tiotto, Gabriele
      In: Titolo volume non avvalorato
      Accessibility Reaching Everywhere International Conference (Brussels (Belgium)) 28-30 November 2011
      pp.6 (pp.363-369)

    3. Validation & Verification of an EDA automated synthesis tool
      proceeding

      DI CARLO, Stefano; Gambardella, Giulio; Indaco, Marco; Rolfo, Daniele; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 6th International Design and Test Workshop (IDT) (Beirut, LI) 11-14 Dec. 2011
      pp.5 (pp.48-52) ISBN:9781467304689 DOI:10.1109/IDT.2011.6123100

    4. An area-efficient 2-D convolution implementation on FPGA for space applications
      proceeding

      DI CARLO, Stefano; Gambardella, Giulio; Indaco, Marco; Rolfo, Daniele; Tiotto, Gabriele; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 6th International Design and Test Workshop (IDT) (Beirut, LI) 11-14 Dec. 2011
      pp.5 (pp.88-92) ISBN:9781467304689 DOI:10.1109/IDT.2011.6123108

    5. MarciaTesta: An Automatic Generator of Test Programs for Microprocessors' Data Caches
      proceeding

      DI CARLO, Stefano; Gambardella, Giulio; Indaco, Marco; Rolfo, Daniele; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 20th Asian Test Symposium (ATS) (New Delhi, IN) 20-23 Nov. 2011
      pp.6 (pp.401-406) ISBN:9781457719844 DOI:10.1109/ATS.2011.78

    6. A unifying formalism to support automated synthesis of SBSTs for embedded caches
      proceeding

      DI CARLO, Stefano; Gambardella, Giulio; Indaco, Marco; Rolfo, Daniele; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE East-West Design & Test Symposium (EWDTS) (Sebastopoli, UA) 9-12 Sept. 2011
      pp.4 (pp.39-42) ISBN:9781457719578 DOI:10.1109/EWDTS.2011.6116421

    7. Efficient Multi-level Fault Simulation of HW/SW Systems for Structural Faults
      articolo

      Baranowski, R.; DI CARLO, Stefano; Hatami, N.; Imhof, M. E.; Kochte, M.; Prinetto, Paolo Ernesto; Wunderlich, H. J.; Zoellin, C. G.
      SCIENCE CHINA. INFORMATION SCIENCES
      Science China Press, co-published with Springer
      Vol.54 pp.13 (pp.1784-1796) ISSN:1674-733X DOI:10.1007/s11432-011-4366-9

    8. Design Issues and Challenges of File Systems for Flash Memories
      capitolo

      DI CARLO, Stefano; Fabiano, Michele; Prinetto, Paolo Ernesto; Cramia, M.
      Flash Memories
      InTech (CROAZIA)
      pp.28 (pp.3-30) ISBN:9789533072722 DOI:10.5772/22976

    9. Genetic Defect Based March Test Generation for SRAM
      proceeding

      DI CARLO, Stefano; Politano, GIANFRANCO MICHELE MARIA; Prinetto, Paolo Ernesto; Savino, Alessandro; Scionti, A.
      LECTURE NOTES IN COMPUTER SCIENCE
      In: Titolo volume non avvalorato
      Springer
      EvoCOMNET, EvoFIN, EvoHOT, EvoMUSART, EvoSTIM, and EvoTRANSLOG, EvoApplications 2011 (Torino (IT)) April 27-29 2011
      Vol.6625 pp.10 (pp.141-150) ISSN:0302-9743 ISBN:9783642205194 DOI:10.1007/978-3-642-20520-0_15

    10. Software-Based Self-Test of Set-Associative Cache Memories
      articolo

      DI CARLO, Stefano; Prinetto, Paolo Ernesto; Savino, Alessandro
      IEEE TRANSACTIONS ON COMPUTERS
      IEEE Computer Society
      Vol.60 pp.15 (pp.1030-1044) ISSN:0018-9340 DOI:10.1109/TC.2010.166

    2010
    1. System Reliability Evaluation Using Concurrent Multi-Level Simulation of Structural Faults
      proceeding

      Kochte, M. A.; Zoellin, C. G.; Baranowski, R.; Imhof, M. E.; Wunderlich, H. J.; Hatami, N.; DI CARLO, Stefano; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      IEEE International Test Conference (ITC) (Austin (TX), USA) 31 Oct.- 5 Nov. 2010
      pp.1 ISBN:9781424472062 DOI:10.1109/TEST.2010.5699309

    2. Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level
      proceeding

      Kochte, M. A.; Zoellin, C. G.; Baranowski, R.; Imhof, M. E.; Wunderlich, H. J.; Hatami, N.; DI CARLO, Stefano; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 19th Asian Test Symposium (ATS) (Shanghai, CN) 1-4 Dec. 2010
      pp.6 (pp.3-8) ISBN:9781424488414 DOI:10.1109/ATS.2010.10

    3. Effiziente Simulation von strukturellen Fehlern für die Zuverlässigkeitsanalyse auf Systemebene
      proceeding

      Kochte, M. A.; Zoellin, C. G.; Baranowski, R.; Imhof, M. E.; Wunderlich, H. J.; Hatami, N.; DI CARLO, Stefano; Prinetto, Paolo Ernesto
      In: GMM/GI/ITG-Fachtagung
      VDE Verag (GERMANIA)
      Zuverlässigkeit und Entwurf (GMM-FB 66) (Wildbad Kreuth, DE) 13-15 Sep. 2010
      Vol.13. bis 15 pp.8 (pp.25-32) ISBN:9783800732999

    4. Microprocessor fault-tolerance via on-the-fly partial reconfiguration
      proceeding

      DI CARLO, Stefano; Miele, Andrea; Prinetto, Paolo Ernesto; Trapanese, Antonio
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 15th European Test Symposium (ETS) (Praga, CZ) 24-28 May 2010
      pp.6 (pp.201-206) ISBN:9781424458349 DOI:10.1109/ETSYM.2010.5512759

    5. Defective Behaviour of an 8T SRAM Cell with Open Defects
      proceeding

      Rodríguez Montañés, R.; Arumí, D.; Manich, S.; Figueras, J.; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Scionti, A.
      In: Proceeding of the IEEE 2nd International Conference on Advances in System Testing and Validation Lifecycle (VALID)
      IEEE (STATI UNITI D'AMERICA)
      IEEE 2nd International Conference on Advances in System Testing and Validation Lifecycle (VALID) (Nice, FR) 22-27 Aug. 2010
      pp.6 (pp.81-86) ISBN:9781424477845 DOI:10.1109/VALID.2010.19

    6. 8T SRAM Defective Cell with Open Defects
      proceeding

      Rodríguez Montañés, R.; Arumí, D.; Manich, S.; Figueras, J.; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Scionti, A.
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      IEEE 25th Conference on Design of Circuits and Integrated Systems (DCIS) (Lanzarote, ES) 17-19 Nov. 2010
      pp.6 (pp.492-497) ISBN:9788469373934

    7. EDACs and test integration strategies for NAND flash memories
      proceeding

      DI CARLO, Stefano; Fabiano, Michele; Piazza, R.; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE East-West Design & Test Symposium (EWDTS) (St. Petersburg, RU) 17-20 Sept. 2010
      pp.4 (pp.218-221) ISBN:9781424495559 DOI:10.1109/EWDTS.2010.5742060

    8. Exploring modeling and testing of NAND flash memories
      proceeding

      DI CARLO, Stefano; Fabiano, M.; Piazza, R.; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE East-West Design & Test Symposium (EWDTS) (St. Petersburg, RU) 17-20 Sept. 2010
      pp.4 (pp.47-50) ISBN:9781424495559 DOI:10.1109/EWDTS.2010.5742059

    9. A Multilanguage Database for Supporting Sign Language Translation and Synthesis
      proceeding

      Borgotallo, R.; Marino, C.; Piccolo, Elio; Prinetto, Paolo Ernesto; Tiotto, Gabriele; Rossini, M.
      In: Proceedings of the 4th Workshop on the Representation and Processing of Sign Languages: Corpora and Sign Language Technologies
      European Language Resources Association
      International Conference on Language Resources and Evaluation (La Valletta, Malta) 17-23 May 2010
      Vol.W13 pp.4 (pp.23-26) ISBN:9782951740860

    10. On the creation and the annotation of a large-scale Italian-LIS parallel corpus
      proceeding

      Bertoldi, N.; Tiotto, Gabriele; Prinetto, Paolo Ernesto; Piccolo, Elio; Nunnari, F.; Lombardo, V.; Mazzei, A.; Damiano, R.; Lesmo, L.; DEL PRINCIPE, A.
      In: Proceedings of the 4th Workshop on the Representation and Processing of Sign Languages: Corpora and Sign Language Technologies
      European Language Resources Association
      International Conference on Language Resources and Evaluation (La Valletta, Malta) 17-23 May 2010
      Vol.W13 pp.4 (pp.19-22) ISBN:9782951740860

    11. A Web Based Platform for Sign Language Corpus Creation
      proceeding

      Barberis, Davide; Garazzino, Nicola; Piccolo, Elio; Prinetto, Paolo Ernesto; Tiotto, Gabriele
      LECTURE NOTES IN COMPUTER SCIENCE
      In: Titolo volume non avvalorato
      Springer
      12th International Conference, ICCHP 2010 (Vienna (AT)) July14-16, 2010
      Vol.6180 pp.7 (pp.193-199) ISSN:0302-9743 ISBN:9783642140990 DOI:10.1007/978-3-642-14100-3_29

    12. Automated synthesis of EDACs for FLASH Memories with User-Selectable Correction Capability
      proceeding

      Caramia, M.; Fabiano, Michele; Miele, A.; Piazza, R.; Prinetto, Paolo Ernesto
      In: Proceedings of HLDVT 2010: IEEE International High Level Design Validation and Test Workshop 2010
      IEEE Computer Society (STATI UNITI D'AMERICA)
      HLDVT 2010: IEEE International High Level Design Validation and Test Workshop 2010 (Anaheim, FL (USA)) 10-12 June 2010
      pp.8 (pp.113-120) ISBN:9781424478057 DOI:10.1109/HLDVT.2010.5496653

    13. Models in Memory Testing, From functional testing to defect-based testing
      capitolo

      DI CARLO, Stefano; Prinetto, Paolo Ernesto
      Models in Hardware Testing
      Springer (GERMANIA)
      pp.29 (pp.157-185) ISBN:9789048132812 DOI:10.1007/978-90-481-3282-9_6

    2009
    1. Synthesizing TLM-2.0 Communication Interfaces
      proceeding

      HATAMI MAZINANI, Nadereh; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      SPD FL Stepanov V.V.Ukraine, 61168, Kharkov, Ak. Pavlova st., 311 (UCRAINA)
      EWDTS 2009: 7th IEEE East-West Design & Test Symposium (Moscow (Russian Federation)) Sept 18-21. 2009
      pp.4 (pp.442-446)

    2. Testing Methodologies on Communication Networks
      proceeding

      HATAMI MAZINANI, Nadereh; Prinetto, Paolo Ernesto; Tiotto, Gabriele
      In: EWDTS 2009: 7th IEEE East-West Design & Test Symposium
      SPD FL Stepanov V.V.Ukraine, 61168, Kharkov, Ak. Pavlova st., 311 (UCRAINA)
      EWDTS 2009: 7th IEEE East-West Design & Test Symposium (Moscow (Russian Federation)) Sept 18-21, 2009
      pp.4 (pp.456-459)

    3. An Editor for Assisted Translation of Italian Sign Language
      proceeding

      HATAMI MAZINANI, Nadereh; Prinetto, Paolo Ernesto; Tiotto, Gabriele
      In: EWDTS 2009: 7th IEEE East-West Design & Test Symposium
      SPD FL Stepanov V.V.Ukraine, 61168, Kharkov, Ak. Pavlova st., 311 (UCRAINA)
      EWDTS 2009: 7th IEEE East-West Design & Test Symposium (Moscow (Russian Federation)) Sept 18-21. 2009
      pp.4 (pp.415-418)

    4. TLM 2.0 simple sockets synthesis to RTL
      proceeding

      HATAMI MAZINANI, Nadereh; Ghofrani, A.; Prinetto, Paolo Ernesto; Navabi, Z.
      In: DTIS '09: IEEE Design & Technology of Integrated Systems in Nanoscale Era, 2009
      IEEE Computer Society (STATI UNITI D'AMERICA)
      DTIS '09: IEEE Design & Technology of Integrated Systems in Nanoscale Era, 2009 (Cairo (Egypt)) Apr 6-9, 2009
      Vol.4th International Conference on Design & Technology of Integrated Systems in Nanoscal Era DTIS '09 pp.6 (pp.3-8) ISBN:9781424443208 DOI:10.1109/DTIS.2009.4938013

    5. A FPGA-Based Reconfigurable Software Architecture for Highly Dependable Systems
      proceeding

      DI CARLO, Stefano; Prinetto, Paolo Ernesto; Scionti, A.
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE Asian Test Symposium (ATS) (Taichung, TW) 23-26 Nov. 2009
      pp.6 (pp.125-130) ISBN:9780769538648 DOI:10.1109/ATS.2009.53

    6. Exploring Design Dimensions in Flash-based Mass-memory Devices
      proceeding

      Caramia, M.; DI CARLO, Stefano; Fabiano, Michele; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      ACM (STATI UNITI D'AMERICA)
      ACM 4th International Workshop on Software Support for Portable Storage (IWSSPS) (Grenoble, F) 15 Oct. 2009
      pp.6 (pp.43-48)

    7. Flash-memories in Space Applications: Trends and Challenges
      proceeding

      Caramia, M.; DI CARLO, Stefano; Fabiano, Michele; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 7th East-West Design & Test Symposium (EWDTS) (Moscow, RU) 18-21 Sep. 2009
      pp.4 (pp.429-432)

    8. FLARE: A design environment for FLASH-based space applications
      proceeding

      Caramia, M.; DI CARLO, Stefano; Fabiano, Michele; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      IEEE International High Level Design Validation and Test Workshop (HLDVT) (San Francisco (CA), USA) 4-6 Nov. 2009
      pp.6 (pp.14-19) ISBN:9781424448234 DOI:10.1109/HLDVT.2009.5340180

    9. Test infrastructures evaluation at transaction level
      proceeding

      DI CARLO, Stefano; Hatami, N.; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      IEEE International Test Conference (ITC) (Austin (TX), USA) 1-6 Nov. 2009
      pp.1 ISBN:9781424448685 DOI:10.1109/TEST.2009.5355830

    10. System Level Testing via TLM 2.0 Debug Transport Interface
      proceeding

      DI CARLO, Stefano; Hatami, N.; Prinetto, Paolo Ernesto; Savino, Alessandro
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 24th International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTS) (Chicago (IL), USA) 7-9 Oct. 2009
      pp.9 (pp.286-294) ISBN:9780769538396 DOI:10.1109/DFT.2009.46

    11. A Low-Cost FPGA-Based Test and Diagnosis Architecture for SRAMs
      proceeding

      DI CARLO, Stefano; Prinetto, Paolo Ernesto; Scionti, A.; Figueras, J.; Manch, S.; Rodriguez Montanes, R.
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE First International Conference on Advances in System Testing and Validation Lifecycle (VALID) (Lisbon, PT) 20-25 Sept. 2009
      pp.6 (pp.141-146) ISBN:9781424448623 DOI:10.1109/VALID.2009.29

    12. Test exploration and validation using transaction level models
      proceeding

      Kochte, M. A; Zollen, C. G; Imhof, M. E; Khaligh, R. S; Radetzki, M.; Wunderlich, H. J; DI CARLO, Stefano; Prinetto, Paolo Ernesto
      In: Design, Automation and Test in Europe, Conference and Exhibition (DATE)
      IEEE Computer Society (STATI UNITI D'AMERICA)
      DATE '09 : Design, Automation & Test in Europe Conference & Exhibition, 2009 (Nice, FR) 20-24 Apr. 2009
      pp.4 (pp.1250-1253) ISBN:9781424437818 DOI:10.1109/DATE.2009.5090856

    13. Are IEEE 1500 compliant cores really compliant to the standard?
      articolo

      Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; Prinetto, Paolo Ernesto
      IEEE DESIGN & TEST OF COMPUTERS
      IEEE Computer Society
      Vol.26 pp.9 (pp.16-24) ISSN:0740-7475 DOI:10.1109/MDT.2009.46

    2008
    1. Using ER Models for Microprocessor Functional Test Coverage Evaluation
      proceeding

      Benso, Alfredo; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Savino, Alessandro; Scionti, A.
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 11th International Biennial Baltic Electronics Conference (BEC) (Tallinn, EE) 6-8 Oct. 2008
      pp.4 (pp.139-142) ISBN:9781424420599 DOI:10.1109/BEC.2008.4657498

    2. Functional Testing Approaches for "BIFST-able" tlm_fifo
      proceeding

      Alemzadeh, H.; Navabi, Z.; DI CARLO, Stefano; Scionti, A.; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      IEEE International High Level Design, Validation and Test Workshop (HLDVT) (Hyatt Regency Lake Tahoe Resort Incline Village (NV), USA) 19-21 Nov. 2008
      pp.8 (pp.85-92) ISBN:9781424429226 DOI:10.1109/HLDVT.2008.4695882

    3. Influence of parasitic capacitance variations on 65 nm and 32 nm predictive technology model SRAM core-cells
      proceeding

      DI CARLO, Stefano; Prinetto, Paolo Ernesto; Savino, Alessandro; Scionti, A.
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 17th Asian Test Symposium (ATS) (Sapporo, JP) 24-27 Nov. 2008
      pp.6 (pp.411-416) ISBN:9780769533964 DOI:10.1109/ATS.2008.13

    4. Applying March Tests to K-Way Set-Associative Cache Memories
      proceeding

      Alpe, Simone; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Savino, Alessandro
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 13th European Test Symposium (ETS) (Verbania, IT) 25-29 May 2008
      pp.7 (pp.77-83) ISBN:9780769531502 DOI:10.1109/ETS.2008.25

    5. March Test Generation Revealed
      articolo

      Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
      IEEE TRANSACTIONS ON COMPUTERS
      IEEE Computer Society
      Vol.57 pp.10 (pp.1704-1713) ISSN:0018-9340 DOI:10.1109/TC.2008.105

    6. A Systematic Approach for Evaluating Satellite Communications Systems
      proceeding

      DI CARLO, Stefano; Prinetto, Paolo Ernesto; Savino, Alessandro; Tiotto, Gabriele; Elia, P.
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 6th East-West Design & Test Symposium (EWDTS) (Lviv, UA) 9-12 Oct. 2008
      pp.4 (pp.13-16)

    7. Automating defects simulation and fault modeling for SRAMs
      proceeding

      DI CARLO, Stefano; Prinetto, Paolo Ernesto; Scionti, A.; Al Ars, Z.
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      IEEE International High Level Design Validation and Test Workshop (HLDVT) (The Hyatt Regency Lake Tahoe Resort (NE), USA) 19-21 Nov. 2008
      pp.8 (pp.169-176) ISBN:9781424429226 DOI:10.1109/HLDVT.2008.4695898

    8. Reliability in Application Specific Mesh-based NoC Architectures
      proceeding

      Alemzadeh, H.; Refan, F.; Navabi, Z.; Prinetto, Paolo Ernesto; Safari, S.
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IOLTS 2008 : 14th IEEE International On-Line Testing Symposium (Rhodes (Greece)) July 6-9, 2008
      pp.6 (pp.207-212) ISBN:9780769532646 DOI:10.1109/IOLTS.2008.53

    9. "Plug & Test" at System Level via Testable TLM Primitives
      proceeding

      Alemzadeh, H.; DI CARLO, Stefano; Refan, F.; Navabi, Z.; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      IEEE International Test Conference (ITC) (Santa Clara (CA), USA) 28-30 Oct., 2008
      pp.10 (pp.1-10) ISBN:9781424424023 DOI:10.1109/TEST.2008.4700610

    10. IEEE Standard 1500 Compliance Verification for Embedded Cores
      articolo

      Benso, Alfredo; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Zorian, Y.
      IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
      IEEE
      Vol.16 pp.11 (pp.397-407) ISSN:1063-8210 DOI:10.1109/TVLSI.2008.917412

    2007
    1. Automating the IEEE std. 1500 compliance verification for embedded cores
      proceeding

      Benso, Alfredo; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Bosio, Alberto
      In: Proceedings of IEEE International High Level Design Validation and Test Workshop (HLDVT), 2007
      IEEE (STATI UNITI D'AMERICA)
      IEEE International High Level Design Validation and Test Workshop (HLDVT) (Irvine (CA), USA) 7-9 Nov. 2007
      pp.8 (pp.171-178) DOI:10.1109/HLDVT.2007.4392810

    2. Analysis of System-Failure Rate Caused by Soft-Errors using a UML-Based Systematic Methodology in an SoC
      proceeding

      Hosseinabady, M.; Neishaburi, M. H.; Navabi, Z.; Benso, Alfredo; DI CARLO, Stefano; Prinetto, Paolo Ernesto; DI NATALE, Giorgio
      In: Proceedings of IEEE 13th International On-Line Testing Symposium (IOLTS) 2007
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 13th International On-Line Testing Symposium (IOLTS) (Crete, GR) 8-11 July 2007
      pp.2 (pp.205-206) DOI:10.1109/IOLTS.2007.17

    3. Academic Network for Microelectronic Test Education
      articolo

      Novak, F.; Biasizzo, A.; Bertrand, Y.; Flottes, M.; Balado, L.; Figueras, J.; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Pricopi, N.; Wunderlich, H. J.; Van Der Hayden, J. P.
      INTERNATIONAL JOURNAL OF ENGINEERING EDUCATION
      TEMPUS Publications
      Vol.23 pp.9 (pp.1245-1253) ISSN:0949-149X

    4. March AB, a State-of-the-Art March Test for Realistic Static Linked Faults and Dynamic Faults in SRAMs
      articolo

      Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
      IET COMPUTERS & DIGITAL TECHNIQUES
      IET - The Institution of Engineering and Technology
      Vol.1 pp.9 (pp.237-245) ISSN:1751-8601 DOI:10.1049/iet-cdt:20060137

    2006
    1. A Black-Box-Oriented Test Methodology
      proceeding

      Benso, Alfredo; Bosio, Alberto; Prinetto, Paolo Ernesto; Savino, Alessandro
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE East-West Design & Test Workshop (EWDTW06) (Sochi (Russia)) Sept. 15-19, 2006
      pp.5 (pp.11-15) ISBN:9789666591244

    2. An on-line software-based self-test framework for microprocessor cores
      proceeding

      Benso, Alfredo; Bosio, A; Prinetto, Paolo Ernesto; Savino, Alessandro
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006 (Tunis (Tunisia)) Sept. 5-7 2006
      pp.6 (pp.394-399) ISBN:9780780397262 DOI:10.1109/DTIS.2006.1708654

    3. Automatic March tests generation for multi-port SRAMs
      proceeding

      Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      IEEE 3rd International Workshop on Electronic Design, Test and Applications (DELTA) (Kuala Lumpur, MY) 17-19 Jan. 2006
      pp.8 (pp.385-392) ISBN:9780769525006 DOI:10.1109/DELTA.2006.17

    4. A 22n March Test for Realistic Static Linked Faults in SRAMs
      proceeding

      Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
      In: IEEE 11th European Test Symposium (ETS), 2006
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 11th European Test Symposium (ETS) (SouthAmpton, UK) 21-24 May 2006
      pp.6 (pp.49-54) DOI:10.1109/ETS.2006.2

    5. Memory Fault Simulator for Static-Linked Faults
      proceeding

      Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 15th AsianTest Symposium (ATS) (Fukuoka, JP) 20-23 Nov. 2006
      pp.6 (pp.31-36) ISBN:9780769526287 DOI:10.1109/ATS.2006.260989

    6. ATPG for Dynamic Burn-In Test in Full-Scan Circuits
      proceeding

      Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
      In: IEEE 15th Asian Test Symposium (ATS), 2006
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 15th Asian Test Symposium (ATS) (Fukuoka, JP) 20-23 Nov. 2006
      pp.8 (pp.75-82) DOI:10.1109/ATS.2006.260996

    7. Single-Event Upset Analysis and Protection in High Speed Circuits
      proceeding

      Hosseinabady, M.; Lofti Kamran, P.; DI NATALE, Giorgio; DI CARLO, Stefano; Benso, Alfredo; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 11th European Test Symposium (ETS) (SouthAmpton (UK)) 21-24 May 2006
      pp.6 (pp.29-34) ISBN:9780769525662 DOI:10.1109/ETS.2006.41

    8. A Unique March Test Algorithm for the Wide Spread of Realistic Memory Faults in SRAMs
      proceeding

      Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
      In: IEEE 9th Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2006
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 9th Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS) (Prague, CZ) 18-21 Apr. 2006
      pp.2 (pp.155-156) DOI:10.1109/DDECS.2006.1649602

    9. Automatic March Tests Generations for Static Linked Faults in SRAMs
      proceeding

      Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      Design, Automation and Test in Europe, Conference and Exhibition (DATE) (Munich, DE) 6-10 Mar. 2006
      Vol.1 pp.6 (pp.1-6) ISBN:9783981080117 DOI:10.1109/DATE.2006.244097

    2005
    1. A Dependable Autonomic Computing Environment for Self-Testing of Complex Heterogeneous Systems
      articolo

      Baldini, A.; Benso, A.; Prinetto, P.
      ELECTRONIC NOTES IN THEORETICAL COMPUTER SCIENCE
      Elsevier
      Vol.116 pp.13 (pp.45-57) ISSN:1571-0661 DOI:10.1016/j.entcs.2004.02.087

    2. AFSM-based deterministic hardware TPG
      proceeding

      Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 8th Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS) (Sopron, HU) 13-16 Apr. 2005
      pp.4 (pp.178-181) ISBN:9789639364486

    3. PROMON: a profile monitor of software applications
      proceeding

      Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto; Tagliaferri, Luca; Tibaldi, Clara
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 8th Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS) (Sopron, HU) 13-16 Apr. 2005
      pp.6 (pp.81-86) ISBN:9789639364486

    4. March AB, March AB1: new March tests for unlinked dynamic memory faults
      proceeding

      Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
      In: IEEE International Test Conference (ITC), 2005
      IEEE (STATI UNITI D'AMERICA)
      IEEE International Test Conference (ITC) (Austin (TX), USA) 8-10 Nov. 2005
      pp.8 (pp.834-841) DOI:10.1109/TEST.2005.1584047

    5. Automatic March tests generation for static and dynamic faults in SRAMs
      proceeding

      Benso, Alfredo; Bosio, Alberto; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
      In: IEEE 10th European Test Symposium (ETS) , 2005
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 10th European Test Symposium (ETS) (Tallin, EE) 22-25 May 2005
      pp.6 (pp.122-127) DOI:10.1109/ETS.2005.8

    6. Agent Based Test and Repair of Distributed Systems
      articolo

      Miclea, L.; Szilárd, E.; Benso, Alfredo; Prinetto, Paolo Ernesto
      JOURNAL OF EMBEDDED COMPUTING
      IOS Press
      Vol.1 pp.10 (pp.405-414) ISSN:1740-4460

    2004
    1. Towards microagent based DBIST/DBISR
      proceeding

      Miclea, L.; Enyedi, S.; Toderean, G.; Benso, Alfredo; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      IEEE International Test Conference (ITC) (Charlotte (NC), USA) 26-28 Oct. 2004
      pp.8 (pp.867-874) ISBN:9780780385801 DOI:10.1109/TEST.2004.1387350

    2. Digital, memory and mixed-signal test engineering education: five centres of competence in Europe
      proceeding

      Flottes, M. L.; Bertrand, Y.; Balado, L.; Lupon, E.; Biasizzo, A.; Novak, F.; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Pricopi, N.; Wunderlich, H. J.
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 2nd International Workshop on Electronic Design, Test and Applications (DELTA) (Perth, AU) 28-30 Jan. 2004
      pp.5 (pp.135-139) ISBN:9780769520810 DOI:10.1109/DELTA.2004.10024

    3. System Level Functional Testing from UML Specifications in End-Of-Production Industrial Environments
      articolo

      Baldini, A; Benso, Alfredo; Prinetto, Paolo Ernesto
      INTERNATIONAL JOURNAL ON SOFTWARE TOOLS FOR TECHNOLOGY TRANSFER
      SPRINGER-VERLAG BERLIN
      Vol.7 pp.15 (pp.326-340) ISSN:1433-2779 DOI:10.1007/s10009-004-0147-8

    2003
    1. Designing and Testing High Dependable Memories for Aerospace Applications
      proceeding

      Brogna, A; Bigongiari, F; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto; Saletti, R.
      In: Titolo volume non avvalorato
      IFIP International Conference on Very Large Scale Integration of System-on-Chip (IFIP VLSI-SoC) (Darmstadt (Germany)) 1-3 December 2003
      ISBN:9783901882173

    2. Test engineering education in Europe: the EuNICE-Test project
      proceeding

      Bertrand, Y.; Flottes, M. L.; Balado, L.; Figueras, J.; Biasizzo, A.; Novak, F.; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Pricopi, N.; Wunderlich, H. J.; Van Der Heyden, J. P.
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      IEEE International Conference on Microelectronic Systems Education (ICMSE) (Anaheim (CA), USA) 1-2 Jun. 2003
      pp.2 (pp.85-86) ISBN:9780769519739 DOI:10.1109/MSE.2003.1205266

    3. A watchdog processor to detect data and control flow errors
      proceeding

      Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 9th International On-Line Testing Symposium (IOLTS) (Kos, GR) 7-9 July 2003
      pp.5 (pp.144-148) ISBN:9780769519685 DOI:10.1109/OLT.2003.1214381

    4. Data criticality estimation in software applications
      proceeding

      Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto; Tagliaferri, Luca
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      IEEE International Test Conference (ITC) (Charlotte (NC), USA) 30 Sept. - 2 Oct., 2003
      Vol.1 pp.9 (pp.802-810) ISBN:9780780381063 DOI:10.1109/TEST.2003.1270912

    5. Online self-repair of FIR filters
      articolo

      Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
      IEEE DESIGN & TEST OF COMPUTERS
      IEEE Computer Society
      Vol.20 pp.8 (pp.50-57) ISSN:0740-7475 DOI:10.1109/MDT.2003.1198686

    6. FAUST: fault-injection script-based tool
      proceeding

      Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto; Solcia, Ivano; Tagliaferri, Luca
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 9th On-Line Testing Symposium (IOLTS) (Kos, GR) 7-9 July 2003
      pp.1 ISBN:9780769519685 DOI:10.1109/OLT.2003.1214386

    7. Programmable built-in self-testing of embedded RAM clusters in system-on-chip architectures
      articolo

      Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Lobetti Bodoni, M.; Prinetto, Paolo Ernesto
      IEEE COMMUNICATIONS MAGAZINE
      IEEE
      Vol.41 pp.8 (pp.90-97) ISSN:0163-6804 DOI:10.1109/MCOM.2003.1232242

    8. A Hierachical Infrastrucutre for SOC Test Management
      articolo

      Benso, Alfredo; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Zorian, Y.
      IEEE DESIGN & TEST OF COMPUTERS
      IEEE Computer Society
      Vol.20 pp.8 (pp.32-39) ISSN:0740-7475 DOI:10.1109/MDT.2003.1214350

    9. Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation
      monografia

      Benso, Alfredo; Prinetto, Paolo Ernesto
      Kluver Academic Publishers (PAESI BASSI)
      pp.245 ISBN:9781402075896

    2002
    1. Initializability Analysis of Synchronous Sequential Circuits
      articolo

      Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; Squillero, Giovanni
      ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS
      Vol.7 pp.16 (pp.249-264) ISSN:1084-4309 DOI:10.1145/544536.544538

    2. On Using COTS/CAM Equipments in Space Applications
      articolo

      Benso, Alfredo; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto; Zanello, R.
      MSSU: MICROGRAVITY AND SPACE STATION UTILIZATION
      Liguori Editore SRL
      Vol.2 pp.3 ISSN:0958-5036

    3. An optimal algorithm for the automatic generation of March tests
      proceeding

      Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      Design, Automation and Test in Europe, Conference and Exhibition (DATE) (Paris, FR) 4-8 Mar. 2002
      pp.6 (pp.938-943) ISBN:9780769514710 DOI:10.1109/DATE.2002.998412

    4. Static analysis of SEU effects on software applications
      proceeding

      Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      IEEE International Test Conference (ITC) (Baltimore (MD), USA) 7-10 Oct. 2002
      pp.9 (pp.500-508) ISBN:9780780375420 DOI:10.1109/TEST.2002.1041800

    5. Specification and design of a new memory fault simulator
      proceeding

      Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 11th AsianTest Symposium (ATS) (Guam, USA) 18-20 Nov. 2002
      pp.6 (pp.92-97) ISBN:9780769518251 DOI:10.1109/ATS.2002.1181693

    6. Automated Synthesis of SEU Tolerant Architectures from OO Descriptions
      proceeding

      Chiusano, SILVIA ANNA; DI CARLO, Stefano; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 8th International On-Line Testing Workshop (IOLTW) (Isle of Bendor, FR) 8-10 July 2002
      pp.6 (pp.26-31) ISBN:9780769516417 DOI:10.1109/OLT.2002.1030179

    7. DFT and BIST of a multichip module for high-energy physics experiments
      articolo

      Benso, Alfredo; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto
      IEEE DESIGN & TEST OF COMPUTERS
      IEEE
      Vol.19/3 pp.12 (pp.92-103) ISSN:0740-7475 DOI:10.1109/MDT.2002.1003804

    8. An On-line BIST RAM Architecture with Self Repair Capabilities
      articolo

      Benso, Alfredo; Chiusano, SILVIA ANNA; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
      IEEE TRANSACTIONS ON RELIABILITY
      IEEE
      Vol.51 pp.6 (pp.123-128) ISSN:0018-9529 DOI:10.1109/24.994929

    2001
    1. A genetic algorithm for the computation of initialization sequences for synchronous sequential circuits
      proceeding

      Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; Squillero, Giovanni
      In: 10th anniversary compendium of papers from Asian Test Symposium : proceedings : 1992-2001
      IEEE
      ATS '97 (Akita (JPN)) 19-21 Nov. 1997
      pp.6 (pp.213-218) ISBN:9780769512334 DOI:10.1109/ATS.2001.10066

    2. Validation of a software dependability tool via fault injection experiments
      proceeding

      Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Tagliaferri, Luca; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 7th International On-Line Testing Workshop (IOLTW) (Taormina, IT) 9-11 July 2001
      pp.6 (pp.3-8) ISBN:9780769512907 DOI:10.1109/OLT.2001.937809

    3. Software dependability techniques validated via fault injection experiments
      proceeding

      Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto; Tagliaferri, Luca
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      IEEE 6th European Conference on Radiation and Its Effects on Components and Systems (RADECS) (Grenoble, FR) 10-14 Sept. 2001
      pp.6 (pp.269-274) ISBN:9780780373136 DOI:10.1109/RADECS.2001.1159292

    4. Memory read faults: taxonomy and automatic test generation
      proceeding

      Benso, Alfredo; DI CARLO, Stefano; Di Natale, Giorgio; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 10th AsianTest Symposium (ATS) (Kyoto, JP) 19-21 Nov. 2001
      pp.7 (pp.157-163) ISBN:9780769513782 DOI:10.1109/ATS.2001.990275

    5. Control-flow checking via regular expressions
      proceeding

      Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto; Tagliaferri, Luca
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE 10th Asian Test Symposium (ATS) (Kyoto, JP) 19-21 Nov. 2001
      pp.5 (pp.299-303) ISBN:9780769513782 DOI:10.1109/ATS.2001.990300

    6. On applying the set covering model to reseeding
      proceeding

      Chiusano, SILVIA ANNA; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Wunderlich, H. J.
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      Design, Automation and Test in Europe, Conference and Exhibition (DATE) (Munich, DE) 13-16 March 2001
      pp.5 (pp.156-160) ISBN:9780769509938 DOI:10.1109/DATE.2001.915017

    7. SEU effect analysis in a open-source router via a distributed fault injection environment
      proceeding

      Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      Design, Automation and Test in Europe, Conference and Exhibition (DATE) (Munich, DE) 13-16 Mar. 2001
      pp.5 (pp.219-223) ISBN:9780769509938 DOI:10.1109/DATE.2001.915028

    8. GRAAL: a tool for highly dependable SRAMs generation
      proceeding

      Chiusano, SILVIA ANNA; DI NATALE, G.; Prinetto, Paolo Ernesto; Bigongiari, F.
      In: Titolo volume non avvalorato
      IEEE International Test Conference 30 October - 1 November 2001
      (pp.250-257) ISBN:9780780371699

    9. A Self-Repairing Execution Unit for Microprogrammed Processors
      articolo

      Benso, Alfredo; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto
      IEEE MICRO
      IEEE COMPUTER SOCIETY
      Vol.21, Issue: 5 pp.7 (pp.16-22) ISSN:0272-1732 DOI:10.1109/40.958696

    10. Online and Offline BIST in IP-Core Design
      articolo

      Benso, Alfredo; Chiusano, SILVIA ANNA; DI NATALE, Giorgio; Prinetto, Paolo Ernesto; Lobetti Bodoni, M.
      IEEE DESIGN & TEST OF COMPUTERS
      IEEE
      Vol.18(5) pp.8 (pp.92-99) ISSN:0740-7475 DOI:10.1109/54.953276

    2000
    1. Self-repairing in a micro-programmed processor for dependable applications
      proceeding

      Benso, Alfredo; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto; Simonotti, P; Ugo, G.
      In: Titolo volume non avvalorato
      IEEE Press (STATI UNITI D'AMERICA)
      DFT 2000: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Yamanashi, Japan) 25-27 Sept. 2000
      pp.9 (pp.231-239) ISBN:9780769507194 DOI:10.1109/DFTVS.2000.887161

    2. A programmable BIST architecture for clusters of Multiple-Port SRAMs
      proceeding

      Benso, Alfredo; DI CARLO, Stefano; DI NATALE, Giorgio; Prinetto, Paolo Ernesto; Lobetti Bodoni, M.
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      IEEE International Test Conference (ITC) (Atlantic City (NJ), USA) 3-5 Oct. 2000
      pp.10 (pp.557-566) ISBN:9780780365469 DOI:10.1109/TEST.2000.894249

    3. A family of Self-Repair SRAM cores
      proceeding

      Benso, Alfredo; Chiusano, SILVIA ANNA; DI NATALE, G; LOBETTI BODONI, M; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE Press (STATI UNITI D'AMERICA)
      IOLTW 2000: IEEE International On-Line Test Workshop July 2000
      (pp.214-218) ISBN:9780765916419

    4. HD2BIST: a hierarchical framework for BIST scheduling, data patterns delivering and diagnosis in SoCs
      proceeding

      Benso, Alfredo; Chiusano, SILVIA ANNA; DI CARLO, Stefano; Prinetto, Paolo Ernesto; Ricciato, F.; Spadari, M.; Zorian, Y.
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      IEEE International Test Conference (ITC) (Atlantic City (NJ), USA) 3-5 Oct. 2000
      pp.10 (pp.892-901) ISBN:9780780365469 DOI:10.1109/TEST.2000.894300

    5. An effective distributed BIST architecture for RAMs
      proceeding

      Benso, Alfredo; Chiusano, SILVIA ANNA; DI CARLO, Stefano; DI NATALE, Giorgio; LOBETTI BODONI, M.; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE European Test Workshop (ETW) (Cascais, PT) 23-26 May 2000
      pp.6 (pp.119-124) ISBN:9780769507019 DOI:10.1109/ETW.2000.873788

    6. On integrating a proprietary and a commercial architecture for optimal BIST performances in SoCs
      proceeding

      Benso, Alfredo; DI CARLO, Stefano; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto; Ricciato, F.; Lobetti Bodoni, M.; Spadari, M.
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE International Conference on Computer Design (ICCD) (Austin (TX), USA) 17-20 Sept. 2000
      pp.2 (pp.539-540) ISBN:9780769508016 DOI:10.1109/ICCD.2000.878335

    7. Optimal Hardware Pattern Generation for Functional BIST
      proceeding

      Cataldo, S.; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto; Wunderlich, H. J.
      In: Titolo volume non avvalorato
      IEEE Design, Automation and Test in Europe 27-30 March 2000
      (pp.292-297) ISBN:9780769505374

    8. A C/C++ Source-to-Source Compiler for Dependable Applications
      proceeding

      Benso, Alfredo; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto; Tagliaferri, L.
      In: Titolo volume non avvalorato
      IEEE International Conference on Dependable Systems and Networks 25-28 June 2000
      (pp.71-78) ISBN:9780769507071

    9. A COTS Wrapping Toolkit for Fault Tolerant Applications under Windows NT
      proceeding

      Benso, Alfredo; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE International On-Line Testing Workshop 3-5 July 2000
      (pp.9-16) ISBN:9780769506463

    10. 'BOND': An Interposition Agents Based Fault Injector for Windows NT
      proceeding

      Baldini, A.; Benso, Alfredo; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems 25-27 October 2000
      (pp.387-395) ISBN:9780769507194

    11. A software development kit for dependable applications in embedded systems
      proceeding

      Benso, Alfredo; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE International Test Conference 3-5 October 2000
      pp.9 (pp.170-178) ISBN:9780780365469

    12. Non-intrusive BIST for systems-on-a-chip
      proceeding

      Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto; Wunderlich, H. J.
      In: Titolo volume non avvalorato
      IEEE International Test Conference 3-5 October 2000
      pp.8 (pp.644-651) ISBN:9780780365469

    13. A High-level EDA Environment for the Automatic Insertion of HD-BIST Structures
      articolo

      Benso, Alfredo; Cataldo, Silvia; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto; Zorian, Y.
      JOURNAL OF ELECTRONIC TESTING
      Springer Netherlands
      Vol.16 pp.6 (pp.179-184) ISSN:0923-8174 DOI:10.1023/A:1008326928340

    1999
    1. RT-level TPG Exploiting High-Level Synthesis Information
      proceeding

      Chiusano, SILVIA ANNA; Corno, Fulvio; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE VLSI Test Symposium 25-30 April 1999
      (pp.341-353) ISBN:9780769501468

    2. HD-BIST: a hierarchical framework for BIST scheduling and diagnosis in SOCs
      proceeding

      Benso, Alfredo; Cataldo, S.; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto; Zorian, Y.
      In: Titolo volume non avvalorato
      IEEE International Test Conference (Atlantic City, NJ) 27-30 September 1999
      pp.7 (pp.1038-1044) ISBN:9780780357532

    3. Testing an MCM for high-energy physics experiments: a case study
      proceeding

      Benso, Alfredo; Chiusano, SILVIA ANNA; Prinetto, Paolo Ernesto; Giovannetti, S.; Mariani, R.; Motto, S.
      In: Titolo volume non avvalorato
      IEEE International Test Conference (Atlantic City, NJ) 27-30 September 1999
      pp.9 (pp.38-46) ISBN:9780780357532

    4. SymFony: a hybrid topological-symbolic ATPG exploiting RT-level information
      articolo

      Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo; Violante, Massimo; U., Glaeser; H. T., Vierhaus
      IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
      Vol.18 pp.12 (pp.191-202) ISSN:0278-0070 DOI:10.1109/43.743731

    5. Testing Embedded Memories in Telecommunication Systems
      articolo

      Barbagallo, S.; Benso, Alfredo; Chiusano, SILVIA ANNA; Lobetti Bodoni, M.; Prinetto, Paolo Ernesto
      IEEE COMMUNICATIONS MAGAZINE
      IEEE
      Vol.37 , Issue: 6 pp.6 (pp.84-89) ISSN:0163-6804 DOI:10.1109/35.769279

    6. Exploiting Behavioral Information in Gate-Level ATPG
      articolo

      Chiusano, SILVIA ANNA; Corno, Fulvio; Prinetto, Paolo Ernesto
      JOURNAL OF ELECTRONIC TESTING
      Vol.14(1-2) (pp.141-148) ISSN:0923-8174 DOI:10.1023/A:1008322011010

    1998
    1. Exploiting symbolic techniques for partial scan flip flop selection
      proceeding

      Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo; Violante, Massimo
      In: DATE 1998 : IEEE Design Automation and Test Conference in Europe, 1998
      IEEE Computer Society (STATI UNITI D'AMERICA)
      DATE 1998 : IEEE Design Automation and Test Conference in Europe, 1998 (Paris (France)) Feb 23-26, 1998
      pp.10 (pp.670-679) ISBN:9780818683596 DOI:10.1109/DATE.1998.655930 

    2. Exploiting the background debugging mode in a fault injection system
      proceeding

      Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
      In: IPDS'98: IEEE International Computer Performance and Dependability Symposium
      IEEE Computer Society Press (STATI UNITI D'AMERICA)
      IPDS'98: IEEE International Computer Performance and Dependability Symposium (Durham, NC (USA)) Sep 07-09, 1998
      pp.1 ISBN:9780818686795 DOI:10.1109/IPDS.1998.707736

    3. A Hybrid Fault Injection Methodology for Real Time Systems
      proceeding

      Benso, Alfredo; Civera, Pierluigi; Rebaudengo, Maurizio; SONZA REORDA, Matteo; Ferro, ANTONIO VITO; Macchiarulo, Luca; Violante, Massimo; Prinetto, Paolo Ernesto; R., Ubar; J., Raik
      In: FTCS-28: 28th Annual International Symposium on Fault-Tolerant Computing
      IEEE Computer Society Press (STATI UNITI D'AMERICA)
      FTCS-28: 28th Annual International Symposium on Fault-Tolerant Computing (Munich (Germany)) Jun 23-25, 1998
      pp.2 (pp.74-75) ISBN:9780818684708

    4. A test pattern generation methodology for low power consumption
      proceeding

      Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      16th IEEE VLSI Test Symposium (Monterey (CA)) Apr 26-30 1998
      pp.5 (pp.453-457) ISBN:9780818684364 DOI:10.1109/VTEST.1998.670912

    5. Fast sequential circuit test generation using high-level and gate-level techniques
      proceeding

      Rudnick, E. M.; Vietti, R.; Ellis, A.; Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      Design, Automation and Test in Europe, 1998
      ISBN:9780818683596 DOI:10.1109/DATE.1998.655915

    6. A Fault Injection Environment for Microprocessor-based Board
      proceeding

      Benso, Alfredo; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      IEEE International Test Conference (ITC) (Washington (DC), USA) 18-23 Oct. 1998
      pp.5 (pp.768-773) ISBN:9780780350939 DOI:10.1109/TEST.1998.743259

    7. On the Identification of Optimal Cellular Automata for Built-In Self-Test of Sequential Circuits
      proceeding

      Prinetto, Paolo Ernesto; SONZA REORDA, Matteo; Gaudenzi, N.; Corno, Fulvio
      In: Titolo volume non avvalorato
      VTS'98 : 16th IEEE VLSI Test Symposium (Monterey CA, (USA)) Apr 26-30, 1998
      pp.6 (pp.424-429) ISBN:9780818684364 DOI:10.1109/VTEST.1998.670902

    8. A Test Pattern Generation Algorithm Exploiting Behavioral Information
      proceeding

      Chiusano, SILVIA ANNA; Corno, Fulvio; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE Asian Test Symposium 2-4 December 1998
      (pp.480-485) ISBN:9780818682773

    9. Integrating On-Line and Off-Line Testing of a Switching Memory in a Telecommunication System
      articolo

      S., Barbagallo; Corno, Fulvio; D., Medina; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      IEEE DESIGN & TEST OF COMPUTERS
      Vol.Vol. 15, No. 1 ISSN:0740-7475

    10. EXFI: a low cost Fault Injection System for embedded Microprocessor-based Boards
      articolo

      Benso, Alfredo; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
      ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS
      ACM
      Vol.5 pp.9 (pp.626-634) ISSN:1084-4309 DOI:10.1145/296333.296351

    11. Integrating Online and Offline Testing of a Switching Memory
      articolo

      Barbagallo, S; Corno, Fulvio; Medina, D; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      IEEE DESIGN & TEST OF COMPUTERS
      Vol.15 , Issue: 1 , Jan-March 1998 (pp.63-70) ISSN:0740-7475 DOI:10.1109/54.655184

    12. The General Product Machine: a New Model for Symbolic FSM Traversal
      articolo

      Cabodi, Gianpiero; Camurati, Paolo Enrico; Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      FORMAL METHODS IN SYSTEM DESIGN
      Vol.12 (pp.267-289) ISSN:0925-9856

    1997
    1. A new approach to build a low-level Malicious Fault List starting from High-level description and Alternative Graphs
      proceeding

      Benso, Alfredo; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; R., Ubar
      In: Titolo volume non avvalorato
      EDTC '97 Proceedings of the 1997 European conference on Design and Test
      pp.6 (pp.560-565) ISBN:9780818677861

    2. Optimizing area loss in flat glass cutting
      proceeding

      Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; S., Bisotto
      In: Titolo volume non avvalorato
      Second International Conference on Genetic Algorithms in Engineering Systems (Glasgow, UK) 2-4 Sept. 1997
      pp.6 (pp.450-455) ISBN:9780852966938 DOI:10.1049/cp:19971222

    3. Exploiting Logic Simulation to Improve Simulation-based Sequential ATPG
      proceeding

      Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; Violante, Massimo
      In: Titolo volume non avvalorato
      Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian (Akita, J) 17-19 Nov 1997
      pp.6 (pp.68-73) ISBN:9780818682094 DOI:10.1109/ATS.1997.643922

    4. Exploiting high-level descriptions for circuits fault tolerance assessment
      proceeding

      Benso, Alfredo; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; J., Raik; R., Ubar
      In: Titolo volume non avvalorato
      Defect and Fault Tolerance in VLSI Systems, 1997. Proceedings., 1997 IEEE International Symposium on (Paris, F) 20-22 Oct 1997
      pp.5 (pp.212-216) ISBN:9780818681684 DOI:10.1109/DFTVS.1997.628327

    5. New Static Compaction Techniques of Test Sequences for Sequential Circuits
      proceeding

      Corno, Fulvio; Rebaudengo, Maurizio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      EDTC '97 Proceedings of the 1997 European conference on Design and Test
      pp.7 (pp.37-43) ISBN:9780818677861

    6. SAARA: a simulated annealing algorithm for test pattern generation for digital circuits
      proceeding

      Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      SAC '97 Proceedings of the 1997 ACM symposium on Applied computing
      pp.5 (pp.228-232) ISBN:9780897918503 DOI:10.1145/331697.331745

    7. Reti Logiche (Esercizi commentati e risolti)
      monografia

      Benso, Alfredo; Corno, Fulvio; Prinetto, Paolo Ernesto
      Ed. Esculapio (ITALIA)
      pp.100

    8. Simulation-Based Verification of Network Protocols Performance
      proceeding

      Baldi, Mario; Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; Squillero, Giovanni
      In: Proceedings of the IFIP WG 10.5 International Conference on Correct Hardware Design and Verification Methods: Advances in Hardware Design and Verification
      Chapman & Hall, Ltd (REGNO UNITO DI GRAN BRETAGNA)
      CHARME
      pp.16 (pp.236-251) ISBN:9780412813306

    9. A genetic algorithm for the computation of initialization sequences for synchronous sequential circuits
      proceeding

      Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; Squillero, Giovanni
      In: Titolo volume non avvalorato
      IEEE
      ATS '97, 6th Asian Test Symposium (Akita (JPN)) 17-19 Nov 1997
      pp.6 (pp.56-61) ISBN:9780818682094 DOI:10.1109/ATS.1997.643917

    10. A New Approach for Initialization Sequences Computation for Synchronous Sequential Circuits
      proceeding

      Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; Squillero, Giovanni
      In: 1997 IEEE Proceedings of the International Conference on Computer Design
      IEEE
      International Conference on Computer Design
      (pp.381-386)

    11. Testability analysis and ATPG on behavioral RT-level VHDL
      proceeding

      Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      ITC 1997: IEEE International Test Conference (Washington DC (USA)) Nov 1-6, 1997
      pp.7 (pp.753-759) ISBN:9780780342095 DOI:10.1109/TEST.1997.639688

    12. Hybrid Symbolic-Explicit Techniques for the Graph Coloring Problem
      proceeding

      Chiusano, SILVIA ANNA; Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      IEEE European Design and Test Conference (Paris) March 1997
      pp.5 (pp.422-426) ISBN:9780818677861

    13. Exploiting Symbolic Techniques within Genetic Algorithms for Power Optimization
      proceeding

      Chiusano, SILVIA ANNA; Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      IEEE International Conference on Tools with Artificial Intelligence 3-8 Nov 1997
      (pp.133-140) ISBN:9780818682032

    14. Cellular automata for deterministic sequential test pattern generation
      proceeding

      Chiusano, SILVIA ANNA; Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      IEEE VLSI Test Symposium April 27-May 1, 1997
      (pp.60-67) ISBN:9780818678103

    15. Guaranteeing Testability in Re-encoding for Low Power.
      proceeding

      Chiusano, SILVIA ANNA; Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      IEEE Asian Test Symposium 17-18 November 1997
      (pp.30-35) ISBN:9780818682094

    1996
    1. A genetic algorithm for automatic generation of test logic for digital circuits
      proceeding

      Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo;  ,
      In: ICTAI 1996 : 8th IEEE International Conference on Tools with Artificial Intelligence, 1996
      IEEE Computer Society (STATI UNITI D'AMERICA)
      ICTAI 1996 : 8th IEEE International Conference on Tools with Artificial Intelligence, 1996 (Toulouse (France)) Nov 16-19, 1996
      pp.7 (pp.10-16) ISBN:9780818676864 DOI:10.1109/TAI.1996.560394

    2. Scan insertion criteria for low design impact
      proceeding

      Barbagallo, S.; Lobetti Bodoni, M.; Medina, D.; Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: VTS 1996 : IEEE VLSI Test Symposium
      IEEE Computer Society (STATI UNITI D'AMERICA)
      VTS 1996 : IEEE VLSI Test Symposium (Princeton, NJ (USA)) Apr 26 - May 1, 1996
      pp.6 (pp.26-31) ISBN:9780818673047 DOI:10.1109/VTEST.1996.510831

    3. Self-checking and Fault Tolerant approaches can help BIST fault coverage: a case study
      proceeding

      Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: ED&TC 96: IEEE European Conference on Design and Test 1996
      IEEE Computer Society (STATI UNITI D'AMERICA)
      ED&TC 96: IEEE European Conference on Design and Test 1996 (Paris (Francia)) Mar 11-14, 1996
      pp.1 ISBN:9780818674235 DOI:10.1109/EDTC.1996.494374 

    4. Fault Tolerant and BIST design of a FIFO cell
      proceeding

      Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: Euro-DAC '96: IEEE European Design Automation Conference with Euro-VHDL '96 and Exhibition
      IEEE Computer Society (STATI UNITI D'AMERICA)
      Euro-DAC '96: IEEE European Design Automation Conference with Euro-VHDL '96 and Exhibition (Geneva (CH)) Sep 16-20, 1996
      pp.6 (pp.233-238) ISBN:9780818675737 DOI:10.1109/EURDAC.1996.558210 

    5. Partial scan flip flop selection for simulation-based sequential ATPGs
      proceeding

      Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      Test Conference, 1996. Proceedings., International (Washington, DC, USA) 20-25 Oct 1996
      pp.7 (pp.558-564) ISBN:9780780335417 DOI:10.1109/TEST.1996.557088

    6. Comparing topological, symbolic and GA-based ATPGs: an experimental approach
      proceeding

      Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      Test Conference, 1996. Proceedings., International (Washington, DC) 20-25 Oct 1996
      pp.9 (pp.39-47) ISBN:9780780335417 DOI:10.1109/TEST.1996.556941

    7. Fault Behavior Observation of a Microprocessor System through a VHDL Simulation-Based Fault Injection Experiment
      proceeding

      Amendola, A.; Benso, Alfredo; Corno, Fulvio; Impagliazzo, L.; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      Design Automation Conference, 1996, with EURO-VHDL '96 and Exhibition, Proceedings EURO-DAC '96, European (Geneva, CH) 16 - 20 Sep 1996
      pp.6 (pp.536-541) ISBN:9780818675737 DOI:10.1109/EURDAC.1996.558255

    8. Advanced Techniques for GA-based sequential ATPGs
      proceeding

      Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; Mosca, R.
      In: Titolo volume non avvalorato
      European Design and Test Conference, 1996. ED&TC 96. Proceedings (Paris, F) 11-14 Mar 1996
      pp.5 (pp.375-379) ISBN:9780818674242 DOI:10.1109/EDTC.1996.494328

    9. A parallel genetic algorithm for Automatic Generation of Test Sequences for digital circuits
      proceeding

      Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
      LECTURE NOTES IN COMPUTER SCIENCE
      In: Titolo volume non avvalorato
      Springer
      High-Performance Computing and Networking International Conference and Exhibition HPCN EUROPE 1996 (Brussels (BEL)) April 15–19, 1996
      Vol.1067 pp.6 (pp.454-459) ISSN:0302-9743 ISBN:9783540611424 DOI:10.1007/3-540-61142-8_583

    10. Exploiting competing subpopulations for automatic generation of test sequences for digital circuits
      proceeding

      Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
      LECTURE NOTES IN COMPUTER SCIENCE
      In: Parallel Problem Solving from Nature — PPSN IV
      Springer
      International Conference on Evolutionary Computation — The 4th International Conference on Parallel Problem Solving from Nature (Berlin (DEU)) September 22–26, 1996
      Vol.1141 pp.10 (pp.791-800) ISSN:0302-9743 ISBN:9783540617235 DOI:10.1007/3-540-61723-X_1042

    11. On-line testing of an off-the-shelf microprocessor board for safety-critical applications
      proceeding

      Corno, Fulvio; M., Damiani; L., Impagliazzo; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; G., Sartore; SONZA REORDA, Matteo
      LECTURE NOTES IN COMPUTER SCIENCE
      In: Titolo volume non avvalorato
      Springer
      Dependable Computing — EDCC-2, 2nd European Dependable Computing Conference (Taormina (ITA)) October 2–4, 1996
      Vol.1150 pp.12 (pp.190-201) ISSN:0302-9743 ISBN:9783540617723 DOI:10.1007/3-540-61772-8_38

    12. Il ruolo delle tecniche di fault injection nell’analisi dell’affidabilità dei sistemi
      articolo

      Benso, Alfredo; Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
      AEI AUTOMAZIONE ENERGIA INFORMAZIONE
      Association Elettrotecnica Elettronic: AEI Uffic Center, Piaz Morandi 2, 20121 Milan Italy:011 39 02 77790223, EMAIL: soci@aei.it, Fax: 011 39 02 798817
      Vol.83 pp.7 (pp.63-69) ISSN:1122-2824

    13. Role of fault injection techniques in system dependability analysis
      articolo

      Benso, Alfredo; Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
      AEI AUTOMAZIONE ENERGIA INFORMAZIONE
      Vol.83 (pp.63-69) ISSN:1122-2824

    14. Testable Synthesis of Control Units via Circular Self-Test Path: Problems and Solutions
      articolo

      Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      IEEE DESIGN & TEST OF COMPUTERS
      (pp.50-60) ISSN:0740-7475

    15. Circular self-test path for FSMs
      articolo

      Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      IEEE DESIGN & TEST OF COMPUTERS
      Vol.13 , Issue: 4 , Winter 1996 (pp.50-60) ISSN:0740-7475 DOI:10.1109/54.544536

    16. GATTO: A Genetic Algorithm for Automatic Test Pattern Generation for Large Synchronous Sequential Circuits
      articolo

      Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
      IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
      Vol.15(8) (pp.991-1000) ISSN:0278-0070 DOI:10.1109/43.511578

    1995
    1. Uso di Tecniche Evolutive per la Risoluzione di Problemi di CAD Elettronico
      capitolo

      Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
      Processori dedicati
      Franco Angeli (ITALIA)
      pp.5 (pp.39-43) ISBN:9788820494834

    2. Testing a Switching Memory in a Telecommunication System
      proceeding

      Barbagallo, S.; Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: ITC 1995 : IEEE International Test Conference, 1995
      IEEE Computer Society (STATI UNITI D'AMERICA)
      ITC 1995 : IEEE International Test Conference, 1995 (Washington DC (USA)) Oct 21-25, 1995
      pp.10 (pp.947-956) ISBN:9780780329928 DOI:10.1109/TEST.1995.529941

    3. Proving testing preorders for process algebra descriptions
      proceeding

      Corno, Fulvio; Cusinato, Marco; Ferrero, M.; Prinetto, Paolo Ernesto
      In: ED&TC 1995: IEEE European Design and Test Conference, 1995
      IEEE Computer Society Press (STATI UNITI D'AMERICA)
      ED&TC 1995: IEEE European Design and Test Conference, 1995 (Paris (France)) Mar 6-9, 1995
      pp.5 (pp.333-337) ISBN:9780818670398 DOI:10.1109/EDTC.1995.470375 

    4. Using symbolic techniques to find the maximum clique in very large sparse graphs
      proceeding

      Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
      European Design and Test Conference, 1995. ED&TC 1995
      ISBN:9780818670398 DOI:10.1109/EDTC.1995.470377

    5. A portable ATPG tool for parallel and distributed systems
      proceeding

      Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; Veiluva, E.
      In: Titolo volume non avvalorato
      13th IEEE VLSI Test Symposium (VTS'95) (Princeton, NJ, USA) April 30 - May 03 1995
      pp.6 (pp.29-34) ISBN:9780818670008 DOI:10.1109/VTEST.1995.512613

    6. GARDA: a Diagnostic ATPG for Large Synchronous Sequential Circuits
      proceeding

      Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      European Design and Test Conference, 1995. ED&TC 1995, Proceedings. (Paris, F) 6-9 Mar 1995
      pp.5 (pp.267-271) ISBN:9780818670398 DOI:10.1109/EDTC.1995.470385

    7. Improving topological ATPG with symbolic techniques
      proceeding

      Corno, Fulvio; U., Gläser; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; T., Vierhaus
      In: Titolo volume non avvalorato
      IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
      IEEE VLSI Test Symposium
      pp.6 (pp.338-343) ISBN:9780818670008 DOI:10.1109/VTEST.1995.512658

    8. A PVM tool for automatic test generation on parallel and distributed systems
      proceeding

      Corno, Fulvio; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; Enzo, Veiluva
      LECTURE NOTES IN COMPUTER SCIENCE
      In: Titolo volume non avvalorato
      Springer
      High-Performance Computing and Networking International Conference and Exhibition (Milan (ITA)) May 3–5, 1995
      Vol.919 pp.6 (pp.39-44) ISSN:0302-9743 ISBN:9783540593935 DOI:10.1007/BFb0046607

    9. Reti Logiche (Raccolta di lucidi)
      monografia

      Corno, Fulvio; Prinetto, Paolo Ernesto
      Libreria Editrice Universitaria Levrotto & Bella (ITALIA)

    1994
    1. Making the circular self-test path technique effective for real circuits
      proceeding

      Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: ITC 1994 : IEEE International Test Conference, 1994
      IEEE Computer Society (STATI UNITI D'AMERICA)
      ITC 1994 : IEEE International Test Conference, 1994 (Washington DC (USA)) Oct 2-6, 1994
      pp.9 (pp.949-957) ISBN:9780780321038 DOI:10.1109/TEST.1994.528044 

    2. A process algebra interpretation of a verification oriented overlanguage of VHDL
      proceeding

      Bayol, C.; Soulas, B.; Borrione, D.; Corno, Fulvio; Prinetto, Paolo Ernesto
      In: EURO-DAC '94: IEEE European Design Automation Conference
      IEEE Computer Society (STATI UNITI D'AMERICA)
      EURO-DAC '94: IEEE European Design Automation Conference (Grenoble (France)) Sep 19-22, 1994
      pp.6 (pp.506-511) ISBN:9780897916851 DOI:10.1145/198174.198314

    3. An industrial experience in the built-in self test of embedded RAM
      proceeding

      Camurati, Paolo Enrico; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo;   barbagallo, S.;   burri, A.;  medina, D.
      In: VTS 1994 : IEEE 12th VLSI Test Symposium
      IEEE Computer Society (STATI UNITI D'AMERICA)
      VTS 1994 : IEEE 12th VLSI Test Symposium (Cherry Hill, NJ (USA)) Apr 25-28, 1994
      pp.6 (pp.306-311) ISBN:9780818654404 DOI:10.1109/VTEST.1994.292296 

    4. System-Level Modeling and Verification: a Comprehensive Design Methodology
      proceeding

      Camurati, Paolo Enrico; Corno, Fulvio; Prinetto, Paolo Ernesto;   bayol, C.;   soulas, B.  .
      In: ED&TC 1994 : IEEE European Design and Test Conference EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design
      IEEE Computer Society (STATI UNITI D'AMERICA)
      ED&TC 1994 : IEEE European Design and Test Conference EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design (Paris (France)) Feb 28 - Mar 03, 1994
      pp.5 (pp.636-640) ISBN:9780818654107 DOI:10.1109/EDTC.1994.326811 

    5. An experimental analysis of the effectiveness of the circular self-test path technique
      proceeding

      Prinetto, Paolo Ernesto; Corno, Fulvio; SONZA REORDA, Matteo
      In: EURO-DAC '94: IEEE European design automation Conference
      IEEE Computer Society Press (STATI UNITI D'AMERICA)
      EURO-DAC '94: IEEE European design automation Conference (Grenoble (France)) Sep 19-22, 1994
      pp.6 (pp.246-251) ISBN:9780897916851 DOI:10.1145/198174.198254

    6. GATTO: an Intelligent Tool for Automatic Test Pattern Generation for Digital Circuits
      proceeding

      Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo; Veiluva, E.
      In: Titolo volume non avvalorato
      Tools with Artificial Intelligence, 1994. Proceedings., Sixth International Conference on (New Orleans, LA, USA) 6-9 Nov 1994
      pp.7 (pp.411-417) ISBN:9780818667855 DOI:10.1109/TAI.1994.346463

    7. An automatic test pattern generator for large sequential circuits based on Genetic Algorithms
      proceeding

      Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      Test Conference, 1994. Proceedings., International (Washington, DC, USA) 2-6 Oct 1994
      ISBN:9780780321038 DOI:10.1109/TEST.1994.527955

    8. A New Functional Fault Model for System-Level Descriptions
      proceeding

      P., Camurati; Corno, Fulvio; Meo, Michela; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      2th IEEE VLSI Test Symposium (NJ (USA)) April 1994
      ISBN:9780818654404 DOI:10.1109/VTEST.1994.292310

    1993
    1. Finding the Maximurn Clique in a Graph Using BDDs
      proceeding

      Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: ICVC93: IEEE 3rd International Conference on VLSI and CAD
      ICVC93: IEEE 3rd International Conference on VLSI and CAD. (Taejon (Korea).) Nov 1993
      pp.4 (pp.269-272)

    2. A verifiable design methodology at system-level
      proceeding

      Camurati, Paolo Enrico; Corno, Fulvio; Prinetto, Paolo Ernesto; C., Bayol; B., Soulas
      In: ICVC93: IEEE 3rd International Conference on VLSI and CAD
      ICVC93: IEEE 3rd International Conference on VLSI and CAD (Taejon (Korea)) Nov 1993
      pp.4 (pp.364-367)

    3. Hybrid Genetic Algorithms for the Travelling Salesman Problem
      proceeding

      Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
      In: ICANNGA 1993: Artificial Neural Nets and Genetic Algorithms
      Springer-Verlag (AUSTRIA)
      ICANNGA 1993: Artificial Neural Nets and Genetic Algorithms (Innsbruck (Austria)) Feb 1993
      pp.8 (pp.559-566) ISBN:9783211007433

    4. System-level fault modeling and test pattern generation with process algebras
      proceeding

      Camurati, Paolo Enrico; Corno, Fulvio; Prinetto, Paolo Ernesto
      In: ETC-93: IEEE 3rd European Test Conference
      IEEE Computer Society (STATI UNITI D'AMERICA)
      ETC-93: IEEE 3rd European Test Conference (Rotterdam (The Netherlands)) Apr 19-22, 1993
      pp.10 (pp.47-56) ISBN:9780818633607 DOI:10.1109/ETC.1993.246534

    5. Exploiting symbolic traversal techniques for efficient Process Algebra Manipulation
      proceeding

      Camurati, Paolo Enrico; Corno, Fulvio; Prinetto, Paolo Ernesto
      In: CHDL'93: 11th IFIP WG10.2 International Conference on Computer Hardware Description Languages and their Applications
      North-Holland Publishing Co. (PAESI BASSI)
      CHDL'93: 11th IFIP WG10.2 International Conference on Computer Hardware Description Languages and their Applications (Ottawa, Ontario (Canada)) Apr 26-28, 1993
      pp.14 (pp.31-44) ISBN:9780444816412

    6. An efficient tool for system-level verification of behaviors and temporal properties
      proceeding

      Camurati, Paolo Enrico; Corno, Fulvio; Prinetto, Paolo Ernesto
      In: EURO-DAC '93: IEEE European Design Automation Conference, 1993, with EURO-VHDL '93
      IEEE Computer Society (STATI UNITI D'AMERICA)
      EURO-DAC '93: IEEE European Design Automation Conference, 1993, with EURO-VHDL '93 (Hamburg (Germany)) Sep 20-24, 1993
      pp.6 (pp.124-129) ISBN:9780818643507 DOI:10.1109/EURDAC.1993.410626

    7. VOVHDL: A verification-oriented dialect of VHDL
      proceeding

      Camurati, Paolo Enrico; Corno, Fulvio; Prinetto, Paolo Ernesto; C., Bayol; B., Soulas
      In: VFE'93: VHDL Forum for CAD in Europe: Fall '93 Meeting
      VFE'93: VHDL Forum for CAD in Europe: Fall '93 Meeting (Hamburg (Germany)) Sept 23, 1993
      pp.11 (pp.37-47)

    8. A methodology for system-level design for verifiability
      proceeding

      Camurati, Paolo Enrico; Corno, Fulvio; Prinetto, Paolo Ernesto
      LECTURE NOTES IN COMPUTER SCIENCE
      In: Correct Hardware Design and Verification Methods
      Springer
      IFIPWG10.2 Advanced Research Working Conference, CHARME'93 (Arles (FRA)) May 24–26, 1993
      Vol.683 pp.12 (pp.80-91) ISSN:0302-9743 ISBN:9783540567783 DOI:10.1007/BFb0021716

    9. An Approach to Sequential Circuit Diagnosis Based on Formal Verification Techniques
      articolo

      Cabodi, Gianpiero; Camurati, Paolo Enrico; Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      JOURNAL OF ELECTRONIC TESTING
      Vol.4 pp.7 (pp.11-17) ISSN:0923-8174

    1992
    1. Centralized vs. distributed implementation of FSM equivalence verification on a parallel system
      proceeding

      Camurati, Paolo Enrico; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
      In: EWPC '92 : the European Workshops on Parallel Computing: from theory to sound practic
      IOS Press (STATI UNITI D'AMERICA)
      EWPC '92 : the European Workshops on Parallel Computing: from theory to sound practic (Barcelona (Spain)) Mar 23-24, 1992
      pp.4 (pp.554-557) ISBN:9789051990805

    2. A simulation-based approach to test pattern generation for synchronous circuits
      proceeding

      Camurati, Paolo Enrico; Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667
      IEEE VLSI Test Symposium
      pp.5 (pp.263-267) ISBN:9780780306233 DOI:10.1109/VTEST.1992.232763

    3. Improved techniques for multiple stuck-at fault analysis using single stuck-at fault test sets
      proceeding

      Camurati, Paolo Enrico; Rebaudengo, Maurizio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      Circuits and Systems, 1992. ISCAS '92. Proceedings., 1992 IEEE International Symposium on 10-13 May 1992
      pp.4 (pp.383-386) ISBN:9780780305939 DOI:10.1109/ISCAS.1992.229933

    4. Efficient Verification of Sequential Circuits on a Parallel System
      proceeding

      Camurati, Paolo Enrico; Prinetto, Paolo Ernesto; Rebaudengo, Maurizio; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      EDAC'92: IEEE European Design Automation Conference (Brussels)
      pp.5 (pp.64-68) ISBN:9780818626456 DOI:10.1109/EDAC.1992.205895

    5. Sequential circuit diagnosis based on formal verification techniques
      proceeding

      Cabodi, Gianpiero; Camurati, Paolo Enrico; Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: ITC 1992: IEEE International Test Conference 1992
      IEEE Computer Society (STATI UNITI D'AMERICA)
      ITC 1992: IEEE International Test Conference 1992 (Baltimore MD (USA)) Sept. 20-24 1992
      (pp.187-196)

    6. A new model for improving symbolic Product Machine traversal
      proceeding

      Cabodi, Gianpiero; Camurati, Paolo Enrico; Corno, Fulvio; S., Gai; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      DAC-29: 29th ACM/IEEE Design Automation Conference (Anaheim, CA (USA)) June 1992
      pp.6 (pp.614-619)

    7. Cross-fertilizing FSM Verification Techniques and Sequential Diagnosis
      proceeding

      Cabodi, Gianpiero; Camurati, Paolo Enrico; Corno, Fulvio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: Proceedings of the 1992 IEEE EURO-DAC
      IEEE EURO-DAC'92 (Hamburg (Germany)) September 1992
      (pp.306-311)

    1991
    1. The use of model checking in ATPG for sequential circuits
      proceeding

      Camurati, Paolo Enrico; Gilli, Marco; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      LECTURE NOTES IN COMPUTER SCIENCE
      In: Titolo volume non avvalorato
      Springer
      Computer-Aided Verification 2nd International Conference, CAV '90 (New Brunswick, NJ (USA)) June 18-21, 1990
      Vol.531 pp.10 (pp.86-95) ISSN:0302-9743 ISBN:9783540544777 DOI:10.1007/BFb0023722

    2. The Product Machine and Implicit Enumeration to prove FSMs correct
      proceeding

      Camurati, Paolo Enrico; Gilli, Marco; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: Correct Hardware Design Methodologies
      CHARME 1991: Advanced Research Workshop on Correct Hardware Design Methodologies (Torino (Italy)) June 1991
      pp.12 (pp.51-62) ISBN:9780444893673

    3. An experimental comparison of different approaches to ROM BIST
      proceeding

      Barbagallo, S.; Burri, A.; Medina, D.; Camurati, Paolo Enrico; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: CompEuro’91: IEEE 5th Annual European Computer Conference on VLSI and Computers
      IEEE Computer Society (STATI UNITI D'AMERICA)
      CompEuro’91: IEEE 5th Annual European Computer Conference on VLSI and Computers (Bologna (Italy)) 13-16 May 1991
      pp.5 (pp.567-571) ISBN:9780818621413 DOI:10.1109/CMPEUR.1991.257450

    4. Comparing ATPGs for synchronous sequential circuits
      proceeding

      Camurati, Paolo Enrico; Gilli, Marco; Meo, ANGELO RAFFAELE; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: CompEuro’91: IEEE 5th Annual European Computer Conference on VLSI and Computers
      IEEE Computer Society (STATI UNITI D'AMERICA)
      CompEuro’91: IEEE 5th Annual European Computer Conference on VLSI and Computers (Bologna (Italy)) 13-16 May 1991
      pp.5 (pp.224-228) ISBN:9780818621413 DOI:10.1109/CMPEUR.1991.257386

    5. Proving finite state machines correct with an automaton-based method
      proceeding

      Camurati, Paolo Enrico; Gilli, Marco; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: IEEE First Great Lakes Symposium on VLSI
      IEEE Computer Society (STATI UNITI D'AMERICA)
      IEEE First Great Lakes Symposium on VLSI (Kalamazoo MI (USA),) 1-2 March 1991
      pp.4 (pp.255-258) ISBN:9780818621703 DOI:10.1109/GLSV.1991.143975

    6. TPDL*: Extended Temporal Profile Description Language
      articolo

      Cabodi, Gianpiero; Camurati, Paolo Enrico; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      SOFTWARE-PRACTICE & EXPERIENCE
      Vol.21 pp.20 (pp.355-374) ISSN:0038-0644

    1990
    1. Diagnosis Oriented Test Pattern Generation
      proceeding

      Camurati, Paolo Enrico; Lioy, Antonio; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667
      IEEE European Design Automation Conference
      pp.5 (pp.470-474) ISBN:9780818620249 DOI:10.1109/EDAC.1990.136693

    2. Model Checking and Graph Theory in sequential ATPG
      proceeding

      Camurati, Paolo Enrico; Gilli, Marco; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: CAV 1990: Workshop on Computer-Aided Verification
      CAV 1990: Workshop on Computer-Aided Verification, (Rutgers NJ (USA)) June 1990
      pp.13 (pp.505-517) ISBN:9780821865941

    3. A new algorithm for diagnosis-oriented automatic test pattern generation
      proceeding

      Camurati, Paolo Enrico; Medina, D.; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: EuroASIC 1990: IEEE EURO ASIC
      IEEE Computer Society (STATI UNITI D'AMERICA)
      EuroASIC 1990: IEEE EURO ASIC (Paris (France)) 29 May-1 June 1990
      pp.5 (pp.332-336) ISBN:9780818620669 DOI:10.1109/EASIC.1990.207964

    4. A diagnostic test pattern generation algorithm
      proceeding

      Camurati, Paolo Enrico; Medina, D.; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: ITC 1990: IEEE International Test Conference 1990
      IEEE Computer Society (STATI UNITI D'AMERICA)
      ITC 1990: IEEE International Test Conference 1990 (Washington DC (USA)) 10-14 Sept. 1990
      pp.7 (pp.52-58) ISBN:9780818690648 DOI:10.1109/TEST.1990.114000

    5. Exact Probabilistic Testability Measures for Multi-Output Circuits
      articolo

      Camurati, P; Lioy, A; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      JOURNAL OF ELECTRONIC TESTING
      Kluwer Academic Publishers
      Vol.1, Number 3, October 1990 pp.6 (pp.229-234) ISSN:0923-8174 DOI:10.1007/BF00938686

    1989
    1. Probabilistic Testability Analysis
      proceeding

      Camurati, Paolo Enrico; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: CAD&CG 1989: International Conference on Computer-Aided Design & Computer Graphics
      IAP – International Academic Publisher - Pergamom Press (REGNO UNITO DI GRAN BRETAGNA)
      CAD&CG 1989: International Conference on Computer-Aided Design & Computer Graphics (Beijing (China)) Aug 10-12, 1989
      pp.6 (pp.640-645)

    2. Exact probabilistic testability measures for multi-output circuits
      proceeding

      Camurati, Paolo Enrico; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: Robotic systems and AMT: IFIP TC5/WG5.3 International Conference on CAD/CAM and AMT, 1989
      North-Holland (PAESI BASSI)
      Robotic systems and AMT: IFIP TC5/WG5.3 International Conference on CAD/CAM and AMT, 1989 (Jerusalem (Israel)) Dc 11-14, 1989
      ISBN:9780444888280

    3. Testability measures with concurrent good simulation
      proceeding

      Cabodi, Gianpiero; Camurati, Paolo Enrico; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: ETC'89: IEEE 1st European Test Conference
      IEEE Computer Society (STATI UNITI D'AMERICA)
      ETC'89: IEEE 1st European Test Conference (Paris (France)) 12-14 April 1989
      (pp.144-149) DOI:10.1109/ETC.1989.36236

    4. Expressing logical and temporal conditions in simulation environments: TPDL*
      articolo

      Cabodi, Gianpiero; Camurati, Paolo Enrico; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      MICROPROCESSING AND MICROPROGRAMMING
      Vol.26 pp.12 (pp.241-252) ISSN:0165-6074

    5. Aritmetica dei Calcolatori e Codifica dell'Informazione
      monografia

      Mezzalama, Marco; N., Montefusco; Prinetto, Paolo Ernesto
      UTET (ITALIA)

    1988
    1. Random Testability Analysis: comparing and evaluating existing approaches
      proceeding

      Camurati, Paolo Enrico; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667
      IEEE International Conference on Computer Design
      pp.4 (pp.70-73) ISBN:9780818608728 DOI:10.1109/ICCD.1988.25662

    1987
    1. Improving Diagnostic capabilities of ATEs via AI techniques
      proceeding

      Camurati, Paolo Enrico; Mezzalama, Marco; Prinetto, Paolo Ernesto
      In: 2nd European Workshop on Fault Diagnostics, Reliability and Related Knowledge-based Approaches
      Pergamon (REGNO UNITO DI GRAN BRETAGNA)
      2nd European Workshop on Fault Diagnostics, Reliability and Related Knowledge-based Approaches (Manchester (UK)) April 1987
      ISBN:9780080349220

    1986
    1. C_TPDL* : adapting TPDL* to concurrent simulation environments
      articolo

      Cabodi, Gianpiero; Camurati, Paolo Enrico; Prinetto, Paolo Ernesto; SONZA REORDA, Matteo
      MICROPROCESSING AND MICROPROGRAMMING
      Elsevier
      Vol.18 pp.8 (pp.39-46) ISSN:0165-6074

    2. Experiences in Prolog based DFT rule checking
      proceeding

      Cabodi, Gianpiero; Camurati, Paolo Enrico; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      FJCC'86: IEEE Fall Joint Computer Conference (Dallas, Texas (USA)) November 1986
      (pp.909-914)

    1985
    1. Testing Strategy and Technique for Macro-Based Circuits
      articolo

      Somenzi, F; Gai, S; Mezzalama, Marco; Prinetto, Paolo Ernesto
      IEEE TRANSACTIONS ON COMPUTERS
      Vol.C-34, Issue 1, Jan. 1985 (pp.85-90) ISSN:0018-9340 DOI:10.1109/TC.1985.1676519

    1984
    1. Microprogram Simulation Using a Structured Microcode Model
      articolo

      Mezzalama, Marco; Prinetto, Paolo Ernesto
      MICROPROCESSORS AND MICROSYSTEMS
      Butterworth Heinemann
      Vol.13 pp.16 (pp.299-314) ISSN:0141-9331

    2. PART: Programmable Array Testing Based on a Partitioning Algorithm
      articolo

      Somenzi, F.; Gai, Silvano; Mezzalama, Marco; Prinetto, Paolo Ernesto
      IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
      IEEE
      Vol.3 pp.8 (pp.142-149) ISSN:0278-0070 DOI:10.1109/TCAD.1984.1270068

    1983
    1. ``Experiments in Automatic Classification of Laringeal Pathology
      articolo

      B., Morra; Mezzalama, Marco; Prinetto, Paolo Ernesto
      MEDICAL & BIOLOGICAL ENGINEERING & COMPUTING
      Peter Peregrinus
      Vol.21 pp.9 (pp.603-611) ISSN:0140-0118

    2. A Review of Fault Models for LSI/VLSI Devices
      articolo

      S., Gai; Mezzalama, Marco; Prinetto, Paolo Ernesto
      SOFTWARE & MICROSYSTEMS
      stevenage
      Vol.2 pp.10 (pp.44-53) ISSN:0261-3182

    3. ORION: an integrated system for LSI-VLSI automated synthesis
      proceeding

      Gai, S.; Mezzalama, Marco; Prinetto, Paolo Ernesto
      In: MELECON '83: 2nd IEEE Mediterranean Electrotechnical Conference
      IEEE Computer Society (STATI UNITI D'AMERICA)
      MELECON '83: 2nd IEEE Mediterranean Electrotechnical Conference (Athens (Greece)) May 24-26, 1983
      ISBN:9789994603565

    4. PLA simulation in a RTL environment
      proceeding

      Gai, S.; Mezzalama, Marco; Prinetto, Paolo Ernesto
      In: MELECON '83: 2nd IEEE Mediterranean Electrotechnical Conference
      IEEE Computer Society (STATI UNITI D'AMERICA)
      MELECON '83: 2nd IEEE Mediterranean Electrotechnical Conference (Athens (Greece)) May 24-26, 1983
      ISBN:9789994603565

    5. PART: Programmable ARray Testing based on PARTitioning algorithm
      proceeding

      Somenzi, F.; Gai, S.; Mezzalama, Marco; Prinetto, Paolo Ernesto
      In: Titolo volume non avvalorato
      IEEE Computer Society (STATI UNITI D'AMERICA)
      ISCAS'83: IEEE 1983 International Symposium on Circuits and Systems. (Newport Beach, CA (USA).) May 2-4, 1983
      pp.4 (pp.1298-1301) ISBN:9789993993957

    6. Testing strategies for PLA based circuits
      proceeding

      Somenzi, F.; Gai, S.; Mezzalama, Marco; Prinetto, Paolo Ernesto
      In: ISCAS'83: IEEE 1983 International Symposium on Circuits and Systems
      IEEE Computer Society (STATI UNITI D'AMERICA)
      ISCAS'83: IEEE 1983 International Symposium on Circuits and Systems (Newport Beach, CA (USA)) May 2-4, 1983
      pp.4 (pp.1302-1305) ISBN:9789993993957

    7. Testable design with PLA macros
      proceeding

      Gai, S.; Mezzalama, Marco; Prinetto, Paolo Ernesto; Somenzi, F.
      In: VLSI'83: IFIP TC 10/WG 10.5 International Conference on Very Large Scale Integration, 1983
      North-Holland Publishing Co. (PAESI BASSI)
      VLSI'83: IFIP TC 10/WG 10.5 International Conference on Very Large Scale Integration, 1983 (Trondheim (Norway),) Aug 16-19, 1983
      pp.10 (pp.373-382) ISBN:9780444883445

    8. PART: Programmable ARray Testing based on PARTitioning algorithm
      proceeding

      Somenzi, F.; Gai, S.; Mezzalama, Marco; Prinetto, Paolo Ernesto
      In: FTCS-13: IEEE 13th International Conference on Fault Tolerant Computing
      IEEE Computer Society (STATI UNITI D'AMERICA)
      FTCS-13: IEEE 13th International Conference on Fault Tolerant Computing (Milano (Italy)) June 1983
      pp.4 (pp.430-433) ISBN:9780818600203

    9. A New Integrated System for PLA Testing and Verification
      proceeding

      Somenzi, F.; Gai, S.; Mezzalama, Marco; Prinetto, Paolo Ernesto
      In: DAC 1983 : 20th Conference on Design Automation 1983
      IEEE Computer Society (STATI UNITI D'AMERICA)
      DAC 1983 : 20th Conference on Design Automation 1983 (Miami, FL (USA)) 27-29 June 1983
      pp.7 (pp.57-63) ISBN:9780818600265

    10. A Hierarchical Description Model for Microcode
      articolo

      Mezzalama, Marco; Prinetto, Paolo Ernesto
      IEEE TRANSACTIONS ON COMPUTERS
      Vol.C-32, Issue 5, May 1983 (pp.478-487) ISSN:0018-9340 DOI:10.1109/TC.1983.1676259

    1982
    1. A Machine-Independent Approach to Microprogram Synthesis
      articolo

      Mezzalama, Marco; Prinetto, Paolo Ernesto
      SOFTWARE-PRACTICE & EXPERIENCE
      WILEY
      Vol.12 pp.26 (pp.985-1010) ISSN:0038-0644

    2. A Microcomputer-based eye movement automatic analysis system
      proceeding

      Albera, R.; Massia, G.; Mezzalama, Marco; Monetti, M.; Morra, B.; Prinetto, Paolo Ernesto
      In: MEDCOMP '82: first IEEE Computer Society International Conference on Medical Computer Science/Computational Medicine
      IEEE Computer Society (STATI UNITI D'AMERICA)
      MEDCOMP '82: first IEEE Computer Society International Conference on Medical Computer Science/Computational Medicine (Philadelphia PE (USA),) Sept 23-25, 1982
      pp.6 (pp.248-253)

    3. Microcode compaction via microblock definition
      proceeding

      Mezzalama, Marco; Prinetto, Paolo Ernesto; Filippi, G.
      In: MICRO 15 : IEEE 15th annual workshop on Microprogramming
      IEEE Computer Society (STATI UNITI D'AMERICA)
      MICRO 15 : IEEE 15th annual workshop on Microprogramming
      pp.9 (pp.134-142)

    4. Eye Movement Automated Analysis: A New Improved Approach
      proceeding

      Morra, B.; Albera, R.; Massia, G.; Mezzalama, Marco; Monetti, M.; Prinetto, Paolo Ernesto
      In: ISMII’82: IEEE 1st International Symposium on Medical Imaging and Image Interpretation
      ISMII’82: IEEE 1st International Symposium on Medical Imaging and Image Interpretation (Berlin (Germany)) Oct 1982
      pp.7 (pp.203-209) ISBN:9780892524105 DOI:10.1117/12.934629

    1981
    1. A Strategy for Simulating Bit-Slice Based Microprogrammable Systems
      articolo

      Mezzalama, Marco; Prinetto, Paolo Ernesto
      MICROPROCESSING AND MICROPROGRAMMING
      ELSEVIER
      Vol.7 pp.10 (pp.334-343) ISSN:0165-6074

    2. DEFASM: a Microprogram Meta-assembler With Semantic Capability
      articolo

      Mezzalama, Marco; Prinetto, Paolo Ernesto; S., Romani
      SOFTWARE & MICROSYSTEMS
      Stevenage, Herts.: Institution of Electrical Engineers
      Vol.128 pp.10 (pp.133-142) ISSN:0261-3182

    3. Microinstruction Modeling using timing and semantic constraints
      proceeding

      Mezzalama, Marco; Prinetto, Paolo Ernesto
      In: SMD’81 : Simulation, Modeling and Development
      Acta Press (STATI UNITI D'AMERICA)
      SMD’81 : Simulation, Modeling and Development (Cairo (Egypt)) Sep 1-3, 1981
      pp.4 (pp.32-35) ISBN:9780889860308

    4. A hierarchical integrated system for microcode development
      proceeding

      Mezzalama, Marco; Prinetto, Paolo Ernesto; Visintin, I.
      In: EUROMICRO `81: 7th Euromicro Symposium on Implementing Functions: Microprocessing and Firmware
      Elsevier Science Ltd
      EUROMICRO `81: 7th Euromicro Symposium on Implementing Functions: Microprocessing and Firmware (Paris (France)) Sept 1981
      pp.10 (pp.251-260) ISBN:9780444862822

    5. Testing strategies for VLSI’s
      proceeding

      Mezzalama, Marco; Prinetto, Paolo Ernesto
      In: ICCSCS 1981: 4th Int. Conference on Control System and Computer Science
      I.P.B. Centrul de multiplicare - Str Splaiul Independentei, 313 (ROMANIA)
      ICCSCS 1981: 4th Int. Conference on Control System and Computer Science (Bucharest (Rumania)) June 17-20, 1981
      Vol.1 pp.7 (pp.287-293)

    6. Firmware description languages for a microprogram meta assembler
      proceeding

      Mezzalama, Marco; Prinetto, Paolo Ernesto
      In: CHDL'81: IFIP TC-10 Fifth International Conference on Computer Hardware Description Languages and Their Applications, 1981
      North-Holland Publishing Co. (PAESI BASSI)
      CHDL'81: IFIP TC-10 Fifth International Conference on Computer Hardware Description Languages and Their Applications, 1981 (Kaiserslautern (Germany)) Sept 7-9, 1981
      pp.14 (pp.267-280) ISBN:9780444862792

    7. Timing analysis and logic verification via user selectable multiple value logics
      proceeding

      Mezzalama, Marco; Prinetto, Paolo Ernesto; Visintin, I.
      In: ECCTD’81
      Delft University Press - North-Holland Publishing Company
      ECCTD’81 : IEEE European Conference on Circuit Theory and Design (The Hague (The Netherlands)) August 1981
      pp.6 (pp.346-351)

    8. Needs and trends on host computer organization to aid VLSI design
      proceeding

      Mezzalama, Marco; Prinetto, Paolo Ernesto
      In: MELECON `81 : IEEE 1st Mediterranean Electrotechnical Conference
      IEEE (STATI UNITI D'AMERICA)
      MELECON `81 : IEEE 1st Mediterranean Electrotechnical Conference (Tel Aviv (Israel)) May 24-28, 1981
      pp.1 ISBN:9789991737010

    9. Optimal choice of multiple value sets for logic design verification
      proceeding

      Mezzalama, Marco; Prinetto, Paolo Ernesto; Visintin, I.
      In: APCMS 1981 : 12th annual Pittsburg Conference on Modelling and Simulation
      School of Engineering, University of Pittsburgh (STATI UNITI D'AMERICA)
      APCMS 1981 : 12th annual Pittsburg Conference on Modelling and Simulation (Pittsburg PE (USA)) Apr 30-May 1, 1981
      Vol.12 - part 4 pp.7 (pp.1513-1519) ISBN:9780876645628

    1980
    1. A machine instruction level concurrent simulator for multiprocessor systems
      proceeding

      Meo, ANGELO RAFFAELE; Mezzalama, Marco; Prinetto, Paolo Ernesto
      In: EUROMICRO’80 : Microprocessor systems
      EUROMICRO’80 : Microprocessor systems (London (U.K.)) September 1980
      pp.10 (pp.125-134)

    2. DESMI: a procedual H.D.L. for machine instruction specification
      proceeding

      Mezzalama, Marco; Prinetto, Paolo Ernesto
      In: MIMI’80 : Mini and microcomputers and their applications
      Acta Press (STATI UNITI D'AMERICA)
      MIMI’80 : Mini and microcomputers and their applications (Budapest (Hungary)) September 1980
      pp.7 (pp.302-308) ISBN:9780889860247

    1979
    1. Design and implementation of a flexible and interactive microprogram simulator
      proceeding

      Mezzalama, Marco; Prinetto, Paolo Ernesto
      In: MICRO 12 : IEEE 12th Annual Microprogramming Workshop
      IEEE Computer Society (STATI UNITI D'AMERICA)
      MICRO 12 : IEEE 12th Annual Microprogramming Workshop (Hershey, PE (USA)) Nov 18-21, 1979
      pp.7 (pp.42-48)

    2. Hardware-software trade-offs in evaluation of mathematical functions in microcomputers
      proceeding

      Mezzalama, Marco; Prinetto, Paolo Ernesto
      In: Informatica 1979 : XIV Yugoslav International Symposium on Information Processing
      INFORMATIKA, Slovene Computer Society
      Informatica 1979 : XIV Yugoslav International Symposium on Information Processing (Bled (Yugoslavia)) Oct 1-6, 1979

    3. An interactive microprogram simulator
      proceeding

      Mezzalama, Marco; Prinetto, Paolo Ernesto
      In: MIMI 1979 : IEEE 1st International Micro and Mini Computer Conference
      IEEE Computer Society (STATI UNITI D'AMERICA)
      MIMI 1979 : IEEE 1st International Micro and Mini Computer Conference (Houston, TX (USA)) November 1979
      pp.6 (pp.159-164)

    1978
    1. MAP: a proposal for a microprogrammable arithmetic processor
      proceeding

      Mezzalama, Marco; Prinetto, Paolo Ernesto
      In: Informatica 1978 : XIII Yugoslav International Symposium on Information Processing
      Informatica 1978 : XIII Yugoslav International Symposium on Information Processing (Bled (Yugoslavia)) Oct 2-7, 1978