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Referente Corsi di Studio (Ingegneria informatica (Computer Engineering) L3LM)

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Pubblicazioni più recenti

Ruospo, Annachiara; Matana Luza, Lucas; Bosio, Alberto; Traiola, Marcello; Dilillo, ... (In stampa)
Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks. In: LATS 2021 : IEEE Latin-American Test Symposium, Punta del Este, Uruguay, Oct 27, 2021 - Oct 29, 2021
Matana Luza, Lucas; Ruospo, Annachiara; Soderstrom, Daniel; Cazzaniga, Carlo; ... (In stampa)
Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks. In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING. ISSN 2168-6750
Floridia, Andrea; Sanchez Sanchez, Ernesto (In stampa)
A JTAG-based Fault Emulation Platform for Dependability Analyses of Processor-based ASICs. In: 12th IEEE Latin America Symposium on Circuits and System, Arequipa (Perú), February 21-25, 2021, pp. 1-4
Oberti, Franco; Sanchez, Ernesto; Savino, Alessandro; Parisi, Filippo; Di Carlo, Stefano (2021)
Mitigation of Automotive Control Modules Hardware Replacement-based Attacks Through Hardware Signature. In: 51st Annual IEEE/IFIP International Conference on Dependable Systems and Networks 2021 (DSN2021), Taipei, Taiwan, 21-24 June 2021, pp. 13-14. ISBN: 978-1-6654-3566-6 Download fulltext
Oberti, F.; Sanchez, E.; Savino, A.; Parisi, F.; Di Carlo, S. (2021)
TAURUM P2T: Advanced secure CAN-FD architecture for road vehicle. In: 27th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2021, Torino, Italy, 28-30 June 2021, pp. 1-7. ISBN: 978-1-6654-3370-9 Download fulltext
Matana Luza, Lucas; Ruospo, Annachiara; Bosio, Alberto; Ernesto, Sanchez; Dilillo, Luigi (2021)
A Model-Based Framework to Assess the Reliability of Safety-Critical Applications. In: 2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Vienna, Austria, 7-9 April 2021, pp. 41-44. ISBN: 978-1-6654-3595-6 Download fulltext
Damljanovic, Aleksa; Ruospo, Annachiara; Sanchez Sanchez, Ernesto; Squillero, Giovanni (2021)
A Benchmark Suite of RT-level Hardware Trojansfor Pipelined Microprocessor Cores. In: 24th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Vienna, Austria, April 7-9 Download fulltext
Ruospo, A.; Piumatti, D.; Floridia, A.; Sanchez, E. (2021)
A Suitability analysis of software based testing strategies for the on-line testing of artificial neural networks applications in embedded devices. In: 27th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2021, Torino, Italy, 2021, pp. 1-6. ISBN: 978-1-6654-3370-9
Ruospo, Annachiara; Sanchez, Ernesto; Traiola, Marcello; O’Connor, Ian; Bosio, Alberto (2021)
Investigating data representation for efficient and reliable Convolutional Neural Networks. In: MICROPROCESSORS AND MICROSYSTEMS, vol. 86. ISSN 0141-9331
Ruospo, Annachiara; Ernesto, Sanchez (2021)
On the Reliability Assessment of Artificial Neural Networks Running on AI-Oriented MPSoCs. In: APPLIED SCIENCES, vol. 11. ISSN 2076-3417 Download fulltext
Bosio, A.; Di Carlo, S.; Girard, P.; Sanchez, E.; Savino, A.; Sekanina, L.; Traiola, M.; ... (2020)
Design, Verification, Test and In-Field Implications of Approximate Computing Systems. In: 2020 IEEE European Test Symposium (ETS), Tallinn, Estonia, Estonia, 25-29 May 2020, pp. 1-10. ISBN: 978-1-7281-4312-5 Download fulltext
Piumatti, D.; Sanchez, E.; Bernardi, P.; Martorana, R.; Pernice, M. A. (2020)
An efficient strategy for the development of software test libraries for an automotive microcontroller family. In: MICROELECTRONICS RELIABILITY, vol. 115. ISSN 0026-2714
Ruospo, Annachiara; Balaara, Angelo; Bosio, Alberto; Ernesto, Sanchez (2020)
A Pipelined Multi-Level Fault Injector for Deep Neural Networks. In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), ESA-ESRIN, Frascati (Rome) Italy, October 19 – October 21, 2020
Ruospo, Annachiara; Bosio, Alberto; Ianne, Alessandro; Ernesto, Sanchez (2020)
Evaluating Convolutional Neural Networks Reliability depending on their Data Representation. In: Euromicro Conference on Digital System Design (DSD) 2020, Kranj, Slovenia (virtual event), August 26 – 28, 2020, pp. 672-679 Download fulltext
Duran, Ckristian; Morales, Hanssel; Rojas, Camilo; Ruospo, Annachiara; Ernesto, Sanchez; ... (2020)
Simulation and Formal: The Best of Both Domains for Instruction Set Verification of RISC-V Based Processors. In: IEEE International Symposium on Circuits and Systems (ISCAS), Virtual Event, from October 10 to October 21 2020 Download fulltext
Da Silva, F. A.; Cagri Bagbaba, A.; Ruospo, A.; Mariani, R.; Kanawati, G.; Sanchez, E.; ... (2020)
Special Session: AutoSoC - A Suite of Open-Source Automotive SoC Benchmarks. In: 38th IEEE VLSI Test Symposium, VTS 2020, usa, 2020, pp. 1-9. ISBN: 978-1-7281-5359-9 Download fulltext
Floridia, Andrea; Sanchez, Ernesto (2020)
On-line Self-test Mechanism for Dual-Core Lockstep System-on-Chips. In: MICROELECTRONICS RELIABILITY, vol. 112C, pp. 1-10. ISSN 0026-2714
Portolan, Michele; Cantoro, Riccardo; Ernesto, Sanchez (2019)
A Functional Approach to Test and Debug of IEEE 1687 Reconfigurable Networks. In: 2019 IEEE European Test Symposium (ETS), Baden-Baden, Germany, 27-31 May 2019, pp. 1-2. ISBN: 978-1-7281-1173-5 Download fulltext
Ruospo, A.; Sanchez, E. (2019)
On the detection of always-on hardware trojans supported by a pre-silicon verification methodology. In: 20th International Workshop on Microprocessor/SoC Test, Security and Verification, MTV 2019, usa, 2019, pp. 25-30. ISBN: 978-1-7281-5025-3 Download fulltext
Ballan, O.; Bernardi, P.; Yazdani, B.; Sanchez, E. (2013)
A software-based self-test strategy for on-line testing of the scan chain circuitries in embedded microprocessors. In: 2013 IEEE 19th International On-Line Testing Symposium, IOLTS 2013, Chania, Crete, grc, 2013, pp. 79-84. ISBN: 978-1-4799-0664-2
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