EDGAR ERNESTO SANCHEZ SANCHEZ

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Professore Associato (L.240)

Membro Centro Interdipartimentale (PEIC - Power Electronics Innovation Center)
Referente Corsi di Studio (Ingegneria informatica (Computer Engineering) L3LM)

+39 0110907182 / 7182 (DAUIN)

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Pubblicazioni più recenti

Gavarini, Gabriele; Stucchi, Diego; Ruospo, Annachiara; Boracchi, Giacomo; Sanchez, ... (In stampa)
Open-Set Recognition: an Inexpensive Strategy to Increase DNN Reliability. In: The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2022), Torino, September, 12th-14th 2022
Bosio, Alberto; Di Carlo, Stefano; Girard, Patrick; Ruospo, Annachiara; Sanchez, ... (2022)
Design, Verification, Test, and In-Field Implications of Approximate Digital Integrated Circuits. In: Approximate Computing Techniques From Component- to Application-Level / Bosio A., Ménard D., Sentieys O., S.L., Springer Nature, pp. 349-385. ISBN: 978-3-030-94704-0
Oberti, F.; Savino, A.; Sanchez, E.; Parisi, F.; Di Carlo, S. (2022)
EXT-TAURUM P2T: an Extended Secure CAN-FD Architecture for Road Vehicles. In: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, vol. 22, pp. 98-110. ISSN 1530-4388
Ruospo, Annachiara; Gavarini, Gabriele; Bragaglia, Ilaria; Traiola, Marcello; Bosio, ... (2022)
Selective Hardening of Critical Neurons in Deep Neural Networks. In: 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems – DDECS 2022, Prague, Czech Republic, April 6 – 8, 2022, pp. 136-141
Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; de ... (2022)
Test, Reliability and Functional Safety trends for Automotive System-on-Chip. In: IEEE European Test Symposium
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