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Assistant Professor with time contract

+39 0110907198 / 7198 (DAUIN)

Last years publications

Oberti, F.; Savino, A.; Sanchez, E.; Parisi, F.; Di Carlo, S. (2022)
EXT-TAURUM P2T: an Extended Secure CAN-FD Architecture for Road Vehicles. In: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, pp. 1-13. ISSN 1530-4388 Download fulltext
Carpegna, Alessio; Di Carlo, Stefano; Savino, Alessandro (2022)
Artificial Resilience in neuromorphic systems. In: International Symposium on Highly-Efficient Accelerators and Reconfigurable Technologies (HEART) 2022, Tsukuba, Japan, June 9-10, 2022, pp. 1-3. ISBN: 978-1-4503-9660-8 Download fulltext
Dutto, Simone; Savino, Alessandro; Di Carlo, Stefano (2021)
Exploring Deep Learning for In-Field Fault Detection in Microprocessors. In: 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE), Grenoble, FR, 1-5 Feb. 2021, pp. 1456-1459. ISBN: 978-3-9819263-5-4 Download fulltext
Oberti, F.; Sanchez, E.; Savino, A.; Parisi, F.; Di Carlo, S. (2021)
TAURUM P2T: Advanced secure CAN-FD architecture for road vehicle. In: 27th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2021, Torino, Italy, 28-30 June 2021, pp. 1-7. ISBN: 978-1-6654-3370-9 Download fulltext
Oberti, Franco; Sanchez, Ernesto; Savino, Alessandro; Parisi, Filippo; Di Carlo, Stefano (2021)
Mitigation of Automotive Control Modules Hardware Replacement-based Attacks Through Hardware Signature. In: 51st Annual IEEE/IFIP International Conference on Dependable Systems and Networks 2021 (DSN2021), Taipei, Taiwan, 21-24 June 2021, pp. 13-14. ISBN: 978-1-6654-3566-6 Download fulltext
Savino, A.; Traiola, M.; Di Carlo, S.; Bosio, A. (2021)
Efficient Neural Network Approximation via Bayesian Reasoning. In: 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2021, Vienna, Austria, 2027-9 April 20211, pp. 45-50. ISSN 2334-3133. ISBN: 978-1-6654-3595-6 Download fulltext
Casseau, E.; Dobias, P.; Sinnen, O.; Rodrigues, G. S.; Kastensmidt, F.; Savino, A.; Di ... (2021)
Special session: Operating systems under test: An overview of the significance of the operating system in the resiliency of the computing continuum. In: 39th IEEE VLSI Test Symposium, VTS 2021, San Diego, CA, USA, 2021, pp. 1-10. ISBN: 978-1-6654-1949-9 Download fulltext
Di Carlo, S.; Song, P.; Savino, A. (2021)
Guest Editorial: Special section on emerging trends and computing paradigms for testing, reliability and security in future VLSI systems. In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING, vol. 9, pp. 649-650. ISSN 2168-6750 Download fulltext
Bosio, A.; Di Carlo, S.; Girard, P.; Sanchez, E.; Savino, A.; Sekanina, L.; Traiola, M.; ... (2020)
Design, Verification, Test and In-Field Implications of Approximate Computing Systems. In: 2020 IEEE European Test Symposium (ETS), Tallinn, Estonia, Estonia, 25-29 May 2020, pp. 1-10. ISBN: 978-1-7281-4312-5 Download fulltext
Mamone, Dario; Bosio, Alberto; Savino, Alessandro; Hamdioui, Said; Rebaudengo, Maurizio (2020)
On the Analysis of Real-time Operating System Reliability in Embedded Systems. In: 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Frascati, Italy, Italy, 19-21 Oct. 2020, pp. 1-6. ISBN: 978-1-7281-9457-8 Download fulltext
Bosio, A.; Canal, R.; Di Carlo, S.; Gizopoulos, D.; Savino, A. (2020)
Cross-layer soft-error resilience analysis of computing systems. In: 50th Annual IEEE/IFIP International Conference on Dependable Systems and Networks: Supplemental Volume, DSN-S 2020, Valencia, Spain, Spain, 29 June-2 July 2020, pp. 79-79. ISBN: 978-1-7281-7260-6 Download fulltext
Savino, Alessandro; Vallero, Alessandro; Di Carlo, Stefano (2020)
Stochastic methods. In: Cross-Layer Reliability of Computing Systems / Di Natale G, Gizopoulos D., Di Carlo S., Bosio A. Canal R., S.L., IET - the institution of engineering and technology, pp. 281-304. ISBN: 9781785617973
Vallero, A.; Savino, A.; Carelli, A.; Di Carlo, S. (2019)
Bayesian models for early cross-layer reliability analysis and design space exploration. In: 25th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2019, Rhodes, Greece, 1-3 July 2019, pp. 143-146. ISBN: 978-1-7281-2490-2 Download fulltext
Savino, A.; Portolan, M.; Leveugle, R.; Di Carlo, S. (2019)
Approximate computing design exploration through data lifetime metrics. In: 24th IEEE European Test Symposium (ETS 2019), Baden Baden, D, May 27-31 2019, pp. 1-7. ISBN: 978-1-7281-1173-5 Download fulltext
Portolan, M.; Savino, A.; Leveugle, R.; Di Carlo, S.; Bosio, A.; Di Natale, G. (2019)
Alternatives to fault injections for early safety/security evaluations. In: 24th IEEE European Test Symposium (ETS 2019), Baden Baden, D, 27-31 May 2019, pp. 1-10. ISBN: 978-1-7281-1173-5 Download fulltext
Vallero, Alessandro; Savino, Alessandro; Chatzidimitriou, Athanasios; Kaliorakis, ... (2019)
SyRA: Early System Reliability Analysis for Cross-layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems. In: IEEE TRANSACTIONS ON COMPUTERS, vol. 68, pp. 765-783. ISSN 0018-9340 Download fulltext
Traiola, Marcello; Savino, Alessandro; DI CARLO, Stefano (2019)
Probabilistic estimation of the application-level impact of precision scaling in approximate computing applications. In: MICROELECTRONICS RELIABILITY, vol. 102. ISSN 0026-2714 Download fulltext
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