Most recent publications

Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; ... (In stampa)
Recent Trends and Perspectives on Defect-Oriented Testing. In: The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS)
Bernardi, Paolo; Insinga, Giorgio; Paganini, Giovanni; Cantoro, Riccardo; Beer, Peter; ... (2022)
Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip. In: IEEE European Test Symposium, Barcelona (Spain), 23-27 May 2022, pp. 1-6. ISBN: 978-1-6654-6706-3
Abbati, L. Degli; Ullmann, R.; Paganini, G.; Coppetta, M.; Zaia, L.; Huard, V.; ... (2021)
Industrial best practice: cases of study by automotive chip- makers. In: 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), pp. 1-6. ISBN: 978-1-6654-1609-2
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