MATTEO SONZA REORDA

Full Professor

Coordinatore di Corso di Dottorato (Collegio di Dottorato INGEGNERIA INFORMATICA E DEI SISTEMI)
Rector’s Delegate for the University Platform on Digital Revolution

+39 0110907055 / 7055 (DAUIN)

matteo.sonzareorda@polito.it

Personal web site

Scientific branch	ING-INF/05 - SISTEMI DI ELABORAZIONE DELLE INFORMAZIONI (Area 0009 - Ingegneria industriale e dell'informazione)

Identifiers	ORCID: 0000-0003-2899-7669 Scopus Author ID: 7003764130 WoS ResearcherID: J-1775-2018

Skills and keywords	ERC sectors PE7_4 - (Micro and nano) systems engineering PE6_2 - Computer systems, parallel/distributed systems, sensor networks, embedded systems, cyber-physical systems Keywords Automatic test equipment Automatic test pattern generation Circuit faults Circuit reliability Collaudo Reliability analysis

Skills and keywords

ERC sectors

PE7_4 - (Micro and nano) systems engineering PE6_2 - Computer systems, parallel/distributed systems, sensor networks, embedded systems, cyber-physical systems

Keywords

Automatic test equipment Automatic test pattern generation Circuit faults Circuit reliability Collaudo Reliability analysis

Scientific responsibilities and other assignments	Awards and Honors C.V. Ramamoorthy Best Paper Award conferred by IEEE International Conference on Tools with Artificial Intelligence, United States (1997) Best Paper Award at the IEEE Asian Test Symposium conferred by ATS (IEEE Asian Test Symposium) program committee, Italy (2001) Best Paper Award at the IEEE European Test Symposium conferred by IEEE European Test Symposium Program Committee, Italy (2005) Best Paper Award at the IEEE Conference on Design, Automation and Test in Europe conferred by DATE Program Committee, Italy (2006) Best Paper Award at the IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) conferred by DDECS Program Committee, Italy (2013) Best Paper award in DDECS 2016 conferred by DDECS organizing committee, Italy (2016) Fellowships Fellow - Institute of Electrical and Electronic Engineers (IEEE), Stati Uniti (2016-) Fellow Conferences IEEE Workshop on RTL and High Level Test (WRTLT) 2020/ IEEE, Malesia, Program chair 25th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) - 2017/ IEEE, Emirati Arabi Uniti, 1/1-25/10 2017, Program chair IEEE Latin-American Test Symposium, Program chair IEEE Latin-American Test Workshop, Program chair IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, Program chair IEEE International On-line Testing Symposium, Program chair IEEE International On-line Testing Symposium, Program chair

Scientific responsibilities and other assignments

Awards and Honors

C.V. Ramamoorthy Best Paper Award conferred by IEEE International Conference on Tools with Artificial Intelligence, United States (1997)
Best Paper Award at the IEEE Asian Test Symposium conferred by ATS (IEEE Asian Test Symposium) program committee, Italy (2001)
Best Paper Award at the IEEE European Test Symposium conferred by IEEE European Test Symposium Program Committee, Italy (2005)
Best Paper Award at the IEEE Conference on Design, Automation and Test in Europe conferred by DATE Program Committee, Italy (2006)
Best Paper Award at the IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) conferred by DDECS Program Committee, Italy (2013)
Best Paper award in DDECS 2016 conferred by DDECS organizing committee, Italy (2016)

Fellowships

Fellow - Institute of Electrical and Electronic Engineers (IEEE), Stati Uniti (2016-)
Fellow

Conferences

IEEE Workshop on RTL and High Level Test (WRTLT) 2020/ IEEE, Malesia, Program chair
25th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) - 2017/ IEEE, Emirati Arabi Uniti, 1/1-25/10 2017, Program chair
IEEE Latin-American Test Symposium, Program chair
IEEE Latin-American Test Workshop, Program chair
IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, Program chair
IEEE International On-line Testing Symposium, Program chair
IEEE International On-line Testing Symposium, Program chair