Most recent publications

Mirabella, Nunzio; Grosso, Michelangelo; Franchino, Giovanna; Rinaudo, Salvatore; ... (In stampa)
Comparing different solutions for testing resistive defects in low-power SRAMs. In: 22nd IEEE Latin-American Test Symposium 2021, Porto Alegre (Brazil), 27th - 29th October 2021, pp. 1-6
Mirabella, Nunzio; Ricci, Maurizio; CalĂ , Ignazio; Lanza, Roberto; Grosso, Michelangelo (2021)
Testing single via related defectsin digital VLSI designs. In: MICROELECTRONICS RELIABILITY, vol. 120. ISSN 0026-2714
Mirabella, N.; Ricci, M.; Grosso, M. (2020)
On the test of single via related defects in digital VLSI designs. In: 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2020, Serbia, 2020, pp. 1-6. ISBN: 978-1-7281-9938-2 Download fulltext
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