CAD - Electronic CAD & Reliability Group

Il gruppo svolge attività di ricerca e trasferimento tecnologico nel campo della progettazione di circuiti e sistemi elettronici, con particolare attenzione ai Sistemi Embedded. Il gruppo possiede specifiche competenze nei settori del collaudo, dei sistemi tolleranti ai guasti, della validazione del progetto, delle reti di sensori, del model-based design, degli algoritmi evolutivi, dei dispositivi RFID e della bioinformatica.

Progetti e pubblicazioni

• Selezione di pubblicazioni recenti
  In stampa

  1. AI-Powered Anomaly Detection for Satellite Telemetry
     proceeding
     

     Buccellato, Federico; Nicolini, Davide; Vacca, Eleonora; De Sio, Corrado; Sterpone, Luca
     In: CF '25: Proceedings of the 22st ACM International Conference on Computing Frontiers
     ACM
     The 22st ACM International Conference on Computing Frontiers (Cagliari (ITA)) 28-30 May 2025
     pp.2

  2. Hardware-Aware Software-Based Fault Injection Platform for DNN Accelerators
     proceeding
     

     Vacca, Eleonora; Buccellato, Federico
     In: CF '25: Proceedings of the 22st ACM International Conference on Computing Frontiers
     ACM
     22st ACM International Conference on Computing Frontiers (Cagliari (ITA)) 28-30 May 2025
     pp.2

  3. Cutting-Edge Strategies for Radiation Effect Estimation on Asteroids Space Mission
     proceeding
     

     Vacca, Eleonora; Azimi, Sarah; Sterpone, Luca
     In: CF '25 Companion: Proceedings of the 21st ACM International Conference on Computing Frontiers Workshops and Special Session
     ACM
     22st ACM International Conference on Computing Frontiers (Cagliari (ITA)) 28-30 May 2025
     pp.6

  4. RePAIR: Reconfigurable Platform for AI Resilience within RISC-V Ecosystem
     proceeding
     

     Cora, Giorgio; Vacca, Eleonora; DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca
     In: Titolo volume non avvalorato
     Springer
     The 21st International Symposium on Applied Reconfigurable Computing ARC 2025
     

  5. Enhancing Security of Smart Cities with “Signal for Help” Recognition System
     proceeding
     

     Buccellato, Federico; De Sio, Corrado; Vacca, Eleonora; Azimi, Sarah
     In: IEEE International Smart Cities Conference
     IEEE
     10th IEEE International Smart Cities Conference (Pattaya, Thailand) 29/10/24-1/11/24
     pp.6

  6. Radiation Environment and Effects Analysis of the Zodiac Pioneer Mission
     proceeding
     

     Vacca, Eleonora; Azimi, Sarah; Sterpone, Luca; Cardi, Margherita; Pappagallo, Isabella; Martino, Paolo
     In: International Astronautical Congress (IAC)
     International Astronautical Federation (IAF)
     The 75th International Astronautical Congress (Milan (ITA)) 14-18 October 2024
     

  7. On Assessing the Robustness of RISC-V Soft Cores for Space Systems by Mission-Tailored SEU Analysis
     proceeding
     

     Vacca, Eleonora; De Sio, Corrado; Azimi, Sarah; Sterpone, Luca
     In: IEEE International Conference on Electronics Circuits and Systems
     IEEE
     31st IEEE International Conference on Electronics Circuits and Systems (Nancy (FRA)) 18-20 November 2024
     pp.4

  8. Recurrent Neural Networks for Soil Moisture Prediction Leveraging Soil Matric Potential Data
     proceeding
     

     Dilillo, Nicola; Marceddu, Antonio Costantino; Barezzi, Mattia; Garlando, Umberto; Ferrero, Renato
     In: 2024 IEEE Conference on AgriFood Electronics (CAFE)
     IEEE
     AgriFood Electronics (CAFE), IEEE Conference on Agrifood Electronics (Xanthi (GR)) 26-28 September 2024
     pp.5

  9. A TID Estimation Tool based on Machine Learning for the Zodiac Pioneer Mission
     proceeding
     

     Vacca, Eleonora; Azimi, Sarah; Sterpone, Luca; Cardi, Margherita; Filippo, Corradino; Isabella, Pappagallo; Ingioisi, Francesca; Martino, Paolo
     In: European Conference on Radiation and Its Effects on Components and Systems (RADECS)
     IEEE
     IEEE Radiation and its Effects on Components and Systems 2024 (Maspalomas, Canary Islands (2024)) 16-20 September 2024
     pp.4

  10. Transfer Learning in MCU Performance Screening
      proceeding
      

      Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
      In: IEEE International Test Conference (ITC)
      IEEE
      IEEE International Test Conference (ITC 2023) (Anaheim, CA 92802, Stati Uniti) 8-13 Ottobre 2023
      pp.2

  11. Hardening Dynamically Reconfigurable Processing Modules Architectures: A Neutron Test Experience
      proceeding
      

      Desogus, Marco; Sterpone, Luca; Sabena, Davide; Ullah, Anees; Mario, Porrmann; Jens, Hagemeyer; Jorgan, Ilstad
      In: Proceedings of Radiation Effects on Components and Systems 2013
      Radiation Effects on Components and Systems 2013
      

  12. Real-Time SEU Tolerant Circuits on SRAM-based FPGAs
      proceeding
      

      Sterpone, Luca; Ullah, Anees
      In: Proceedings of Radiation Effects on Components and Systems 2013
      Radiation Effects on Components and Systems 2013 (Oxford) 23rd-27th September, 2013
      

  13. A Light-Weight Fault Tolerance Framework for Space Computing using COTS Components
      articolo
      

      Campagna, Salvatore; Hussain, Moazzam; Violante, Massimo
      LECTURE NOTES IN COMPUTER SCIENCE
      ISSN:0302-9743

  2025

  1. DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks
     proceeding
     

     Bellarmino, Nicolo'; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto
     In: 28th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
     IEEE
     28th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) (Lyon, France) May 5-7, 2025
     pp.6

  2. Self-supervised pretraining and quantization for fault tolerant neural networks: friend or foe?
     articolo
     

     Milazzo, Rosario; Fosson, Sophie M.; Morra, Lia; Sterpone, Luca
     IEEE ACCESS
     IEEE
     Vol.13 pp.17 (pp.75546-75562) ISSN:2169-3536 DOI:10.1109/access.2025.3564834

  3. About the Functional In-Field Self-Testing of AI Accelerators
     proceeding
     

     Guerrero-Balaguera, Juan-David; Rodriguez condia, Josie Esteban; Sierra, Robert Limas; Reorda, Matteo Sonza
     In: Proceedings of the 2025 IEEE 26th Latin American Test Symposium (LATS)
     IEEE
     2025 IEEE 26th Latin American Test Symposium (LATS) (San Andres Island (COL)) 11-14 March 2025
     pp.6 (pp.1-6) ISBN:9781665477635 DOI:10.1109/lats65346.2025.10963960

  4. IoT and Edge Computing: Applications and Reliability Implications
     proceeding
     

     Caro-Anzola, Edward-W.; Esposito, Giuseppe; Guerrero-Balaguera, Juan-David; Jiménez-López, Andrés-F.; Jiménez-López, Fabián-R.; Limas-Sierra, Robert; Ramirez-Espinosa, Gustavo; Giusto, Edoardo; Montrucchio, Bartolomeo; Vera-Cely, Oscar-F.; Rodriguez Condia, Josie Esteban
     In: Proceedings of the 2025 IEEE 26th Latin American Test Symposium (LATS)
     IEEE
     2025 IEEE 26th Latin American Test Symposium (LATS) (San Andres Island (COL)) 11-14 March 2025
     pp.10 (pp.1-10) ISBN:9781665477635 DOI:10.1109/lats65346.2025.10963944

  5. Estimating the Impact of Soft Errors on AI-Based Perception in Automotive
     proceeding
     

     Hegde, Shailesh Sudhakara; Selvaraj, Dinesh Cyril; Rodriguez Condia, Josie Esteban; Amati, Nicola; Chiasserini, Carla Fabiana; Deflorio, Francesco Paolo; Reorda, Matteo Sonza
     In: Proceedings of the 2025 IEEE 26th Latin American Test Symposium (LATS)
     IEEE
     2025 IEEE 26th Latin American Test Symposium (LATS) (San Andres Island (COL)) 11-14 March 2025
     pp.6 (pp.1-6) ISBN:9781665477635 DOI:10.1109/lats65346.2025.10963959

  6. Improving CNN Runtime Robustness Against Soft Errors by Dropout Layer Optimization
     proceeding
     

     Sierra, Robert Limas; Esposito, Giuseppe; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Reorda, Matteo Sonza
     In: 2025 IEEE 26th Latin American Test Symposium (LATS)
     IEEE
     2025 IEEE 26th Latin American Test Symposium (LATS) (San Andres Islas (COL)) 11-14 March 2025
     pp.6 (pp.1-6) ISBN:9781665477635 DOI:10.1109/lats65346.2025.10963963

  7. Late Contribution: VeriSide: A Modified Verilator for Leakage Assessment at the RTL Level
     proceeding
     

     Farnaghinejad, Behnam; Porsia, Antonio; Ruospo, Annachiara; Savino, Alessandro; Di Carlo, Stefano; Sanchez, Ernesto
     In: 26th IEEE Latin American Test Samposium 2025
     IEEE
     26th IEEE Latin American Test Samposium 2025 (San Andres Islas (COL)) 11-14 March 2025
     pp.2 (pp.1-2) ISBN:9781665477635 DOI:10.1109/lats65346.2025.10963943

  8. Grouped Feature Selection for SMONs Placement in MCU Performance Screening
     proceeding
     

     Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni
     In: 2025 IEEE 26th Latin American Test Symposium (LATS)
     IEEE
     2025 IEEE 26th Latin American Test Symposium (LATS) (San Andrés (COL)) 11-14 March 2025
     pp.6 (pp.1-6) ISBN:9781665477635 DOI:10.1109/lats65346.2025.10963942

  9. Leveraging ATE to optimize System-Level-Test for Multicore Automotive SoCs
     proceeding
     

     Angione, Francesco; Bernardi, Paolo; Bertani, Claudia; Bertetto, Lorenzo; Cardone, Lorenzo; DI GRUTTOLA GIARDINO, Nicola; Quer, Stefano; Tancorre, Vincenzo
     In: 2025 IEEE 26th Latin American Test Symposium (LATS)
     IEEE
     Latin American Test Symposium (San Andres Islas, Colombia) 11-14 March 2025
     pp.6 (pp.1-6) ISBN:9781665477635 DOI:10.1109/LATS65346.2025.10963947

  10. Enhancing Logic Diagnosis of field returns through Logic BIST in Automotive SoCs
      proceeding
      

      Bernardi, Paolo; Filipponi, Gabriele; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo
      In: 2025 IEEE 26th Latin American Test Symposium (LATS)
      IEEE
      2025 IEEE Latin American Test Symposium (San Andres Islas (COL)) 11-14 March 2025
      pp.6 ISBN:9781665477635 DOI:10.1109/LATS65346.2025.10963955

  11. Information theoretic clustering of the human pangenome minigraph
      articolo
      

      Ferrero, Renato; Gandino, Filippo; Carbone, Anna
      PATTERN RECOGNITION LETTERS
      Elsevier
      Vol.191 pp.7 (pp.117-123) ISSN:0167-8655 DOI:10.1016/j.patrec.2025.03.004

  12. Reliability of Deep Neural Networks: Impact and Open Issues
      articolo
      

      Ruospo, A.; Pappalardo, S.; Turco, V.; Bosio, A.; Sanchez, E.
      IEEE DESIGN & TEST
      IEEE
      Vol.42 pp.12 (pp.14-25) ISSN:2168-2356 DOI:10.1109/MDAT.2025.3544125

  13. DOC: Detection of On-Line Failures in CNNs
      proceeding
      

      Turco, Vittorio; Bellarmino, Nicolò; Ruospo, Annachiara; Cantoro, Riccardo; Sanchez, Ernesto
      In: 2025 IEEE 26th Latin American Test Symposium (LATS)
      IEEE
      Latin American Test Workshop, LATW (San Andrés (COL)) 11-14 March 2025
      pp.6 ISBN:9781665477635 DOI:10.1109/LATS65346.2025.10963935

  14. Image Test Libraries for the in-field test of ultra-low-power devices
      proceeding
      

      Porsia, Antonio; Perlo, Giacomo; Ruospo, Annachiara; Sanchez, Ernesto
      In: 2025 IEEE 26th Latin American Test Symposium (LATS)
      IEEE
      Latin American Test Workshop, LATW (San Andrés (Colombia)) 11-14 March 2025
      pp.6 ISBN:9781665477635 DOI:10.1109/LATS65346.2025.10963940

  15. On-the-Fly Sleep Scoring Algorithm with Heart Rate, RR Intervals and Accelerometer as Input
      articolo
      

      Guagnano, Michele; Groppo, Sara; Pugliese, Luigi; Violante, Massimo
      SENSORS
      MDPI
      Vol.25 pp.15 ISSN:1424-8220 DOI:10.3390/s25072141

  16. Test and diagnosis of memories embedded in Automotive SoCs
      tesi dottorato
      

      Insinga, Giorgio
      Politecnico di Torino
      pp.138 (pp.1-138)

  17. Towards Ultra-Reliable Automotive Systems-on-Chip
      tesi dottorato
      

      Iaria, Giusy
      Politecnico di Torino
      pp.125 (pp.1-125)

  18. System-Level Test techniques for Automotive SoCs
      tesi dottorato
      

      Angione, Francesco
      Politecnico di Torino
      pp.222 (pp.1-222)

  19. Selective hardening of RISCV soft-processors for space applications
      articolo
      

      Cora, Giorgio; De Sio, Corrado; Azimi, Sarah; Sterpone, Luca
      MICROELECTRONICS RELIABILITY
      Elsevier
      Vol.167 pp.6 ISSN:0026-2714 DOI:10.1016/j.microrel.2025.115667

  20. A Reliability Evaluation Flow for Assessing the Impact of Permanent Hardware Faults on Integer Arithmetic Circuits
      articolo
      

      Deligiannis, Nikolaos; Guerrero-Balaguera, Juan-David; Cantoro, Riccardo; Habib, S. E. D.; Reorda, Matteo Sonza
      IEEE ACCESS
      IEEE
      Vol.13 pp.20 (pp.32177-32196) ISSN:2169-3536 DOI:10.1109/access.2025.3534274

  21. Effective Fault Effects Evaluation for Permanent Faults in GPUs executing DNNs
      articolo
      

      Guerrero Balaguera, Juan David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo
      ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS
      ACM
      Vol.30 pp.33 (pp.1-33) ISSN:1084-4309 DOI:10.1145/3715327

  22. A Scalable Fog Computing Solution for Industrial Predictive Maintenance and Customization
      articolo
      

      D'Agostino, Pietro; Violante, Massimo; Macario, Gianpaolo
      ELECTRONICS
      MDPI
      Vol.14 pp.24 ISSN:2079-9292 DOI:10.3390/electronics14010024

  23. A Comprehensive Scan Test Cost Model to Optimize the Production of very large SoCs
      articolo
      

      Iaria, Giusy; Bernardi, Paolo; Bertani, Claudia; Cardone, Lorenzo; Garozzo, Giuseppe; Tancorre, Vincenzo
      IEEE TRANSACTIONS ON COMPUTERS
      IEEE
      Vol.74 pp.15 (pp.1278-1292) ISSN:0018-9340 DOI:10.1109/TC.2024.3521246

  24. Enhancing the Effectiveness of STLs for GPUs via Bounded Model Checking
      articolo
      

      Deligiannis, Nikolaos; Faller, Tobias; Rodriguez Condia, Josie Esteban; Cantoro, Riccardo; Becker, Bernd; Sonza Reorda, Matteo
      ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS
      ACM
      Vol.30 pp.24 (pp.1-24) ISSN:1084-4309 DOI:10.1145/3706635

  25. COSMO: COmpressed Sensing for Models and logging Optimization in MCU Performance Screening
      articolo
      

      Bellarmino, Nicolò; Cantoro, Riccardo; Fosson, Sophie M.; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
      IEEE TRANSACTIONS ON COMPUTERS
      IEEE Computer Society
      Vol.74 pp.13 (pp.652-664) ISSN:0018-9340 DOI:10.1109/tc.2024.3500378

  26. A System-Level Test Methodology for Communication Peripherals in System-on-Chips
      articolo
      

      Angione, Francesco; Bernardi, Paolo; DI GRUTTOLA GIARDINO, Nicola; Filipponi, Gabriele; Bertani, Claudia; Tancorre, Vincenzo
      IEEE TRANSACTIONS ON COMPUTERS
      Institute of Electrical and Electronics Engineers
      Vol.74 pp.9 (pp.731-739) ISSN:0018-9340 DOI:10.1109/TC.2024.3500375

  27. Device-Aware Test for Anomalous Charge Trapping in FeFETs
      proceeding
      

      Yuan, Sicong; Wang, Changhao; Fieback, Moritz; Xun, Hanzhi; Taouil, Mottaqiallah; Li, Xiuyan; Wang, Lin; Chen, Danyang; Bellarmino, Nicolò; Cantoro, Riccardo; Hamdioui, Said
      In: ASPDAC '25: Proceedings of the 30th Asia and South Pacific Design Automation Conference
      ACM
      30th Asia and South Pacific Design Automation Conference ASP-DAC 2025 (Tokyo (JPN)) Jan. 20-23, 2025
      pp.7 (pp.635-641) ISBN:9798400706356 DOI:10.1145/3658617.3697755

  28. Investigating on Gradient Regularization for Testing Neural Networks
      proceeding
      

      Bellarmino, Nicolo; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni
      LECTURE NOTES IN COMPUTER SCIENCE
      In: Machine Learning, Optimization, and Data Science 10th International Conference, LOD 2024
      Springer
      10th International Conference on machine Learning, Optimization and Data science (LOD 2024) (Castiglione della Pescaia (ITA)) September 22 – 25, 2024
      Vol.15509 pp.15 (pp.67-81) ISSN:0302-9743 ISBN:9783031824838 DOI:10.1007/978-3-031-82484-5_6

  29. Deep Learning Strategies for Labeling and Accuracy Optimization in Microcontroller Performance Screening
      articolo
      

      Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
      IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
      IEEE
      Vol.44 pp.14 (pp.641-654) ISSN:0278-0070 DOI:10.1109/tcad.2024.3436542

  2024

  1. WIP: Building an Education Ecosystem for Next Generation Microelectronics Experts in Green and Circular Economy with Digitally-Supported Teaching Methods for Sustainable Chips and Applications (EU Project GreenChips-EDU)
     proceeding
     

     Hofmann, Klaus; Keil, Ferdinand; Riehl, David; Michalowska-Forsyth, Alicja; Czepl, Nikolaus; Woywod, Sarah; Zupan, Dominik; Casu, Mario R.; Ricciardi, Carlo; Violante, Massimo; Graziano, Mariagrazia; Ardesi, Yuri; Mo, Fabrizio; Berger, Dominik; Sill, Sabine; Visotschnig, Volker; Morfouli, Panagiota; Prejbeanu, Liliana; Morin-Allory, Katell; Chavet, Cyrille; Bucci, Davide; Basrour, Skandar; Crebier, Jean-Christophe; Nguyen, Nhu-Huan; Quisbert, Ernesto; Defelix, Christian; Corbett-Etchevers, Isabelle; Sturm, Johannes; Konrath, Jens Peter; Birnbacher, Ulla; Klinger, Thomas; Werth, Wolfgang; Fernandes, Jorge; Santos, Marcelino; Rubio, Antonio; Pagès-Zamora, Alba; Pegueroles, Josep; Salazar, Jordi; Otero, Beatriz; Moreno, J. Manuel; Aragones, X.; Martin, Israel; Sole, Aleix; Suttnig, Dunja; Calabro, Julia; Lima, Floriberto; Santos, Marcelino; Jouseau, Eric; Cerisier, François; Rivier, Cristian; Eisenriegler, Sepp; Reichl, Harald; Macan, Miroslav; Krušelj, Dubravko; Puškarić, Mladen; Tatalović, Mirjana; Zeleničić, Vinko; Deutschmann, Bernd
     In: FIE 2024 Conference Proceedings
     IEEE
     2024 IEEE Frontiers in Education Conference (FIE) (Washington (USA)) 13-16 October 2024
     pp.5 (pp.1-5) DOI:10.1109/fie61694.2024.10893342

  2. TRRR: Accelerated Online Error Detecting and Correcting Fault Tolerant Architecture
     proceeding
     

     K K, Raghunandana; K R, Yogesh Prasad; Sonza Reorda, M.; Singh, Virendra
     In: 2024 IEEE East-West Design & Test Symposium (EWDTS)
     IEEE
     2024 IEEE East-West Design & Test Symposium (EWDTS) (Yerevan, Armenia) 13-17 November 2024
     pp.6 (pp.1-6) ISBN:9798331515768 DOI:10.1109/ewdts63723.2024.10873630

  3. Toward Fault-Tolerant Applications on Reconfigurable Systems-on-Chip
     proceeding
     

     DE SIO, Corrado; Sterpone, Luca
     In: 2024 IEEE International Test Conference (ITC)
     IEEE
     2024 IEEE International Test Conference (ITC) (San Diego, CA (USA)) 03-08 November 2024
     pp.10 (pp.197-206) ISBN:9798331520137 DOI:10.1109/ITC51657.2024.00039

  4. Reliability Assessment of Large DNN Models:Trading Off Performance and Accuracy
     proceeding
     

     Chen, Junchao; Esposito, Giuseppe; Fernandes dos Santos, Fernando; Guerrero-Balaguera, Juan-David; Kritikakou, Angeliki; Krstic, Milos; Limas-Sierra, Robert-Alexander; Rodriguez-Condia, Josie-Esteban; Sonza-Reorda, Matteo; Traiola, Marcello; Veronesi, Alessandro
     In: 2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration (VLSI-SoC)
     IEEE
     2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration (VLSI-SoC) (Tanger (MAR)) 06-09 October 2024
     pp.10 (pp.1-10) ISBN:9798331539672 DOI:10.1109/VLSI-SoC62099.2024.10767814

  5. Evaluating Different Fault Injection Abstractions on the Assessment of DNN SW Hardening Strategies
     proceeding
     

     Esposito, Giuseppe; Guerrero Balaguera, Juan David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo
     In: 2024 IEEE 33rd Asian Test Symposium (ATS)
     IEEE
     33rd IEEE Asian Test Symposium (ATS 2024) (Ahmedabad, Gujarat (IND)) 17th -20th December 2024
     pp.6 (pp.1-6) ISBN:9798331529161 DOI:10.1109/ATS64447.2024.10915284

  6. Computational Intelligence for Computer-Aided Design Machine Learning Techniques for Microcontrollers Performance Screenings
     tesi dottorato
     

     Bellarmino, Nicolo'
     Politecnico di Torino
     pp.170 (pp.1-170)

  7. Enhancing Automotive Embedded Applications: A Comprehensive Evaluation of Control Flow Checking Methods
     proceeding
     

     Solouki, Mohammadreza Amel; Sini, Jacopo; Violante, Massimo
     In: 2024 IEEE International Conference on Design, Test and Technology of Integrated Systems (DTTIS)
     IEEE
     2024 IEEE International Conference on Design, Test and Technology of Integrated Systems (DTTIS) (Aix-en-Provence (FRA)) 14-16 October 2024
     pp.6 (pp.1-6) DOI:10.1109/dttis62212.2024.10780201

  8. Dependability in Embedded Systems: A Survey of Fault Tolerance Methods and Software-Based Mitigation Techniques
     articolo
     

     AMEL SOLOUKI, Mohammadreza; Angizi, Shaahin; Violante, Massimo
     IEEE ACCESS
     Institute of Electrical and Electronics Engineers
     Vol.12 pp.29 (pp.180939-180967) ISSN:2169-3536 DOI:10.1109/ACCESS.2024.3509633

  9. A Novel Approach to Address Random Hardware Failures for Automotive Application Within the ISO26262 and AUTOSAR Frameworks
     articolo
     

     Sini, Jacopo; Scialabba, Kiara; Violante, Massimo; Cosimi, Francesco; Arena, Antonio
     IEEE ACCESS
     IEEE
     Vol.12 pp.16 (pp.165845-165860) ISSN:2169-3536 DOI:10.1109/access.2024.3488897

  10. Defects, Fault Modeling, and Test Development Framework for FeFETs
      proceeding
      

      Wang, Changhao; Yuan, Sicong; Xun, Hanzhi; Li, Chaobo; Taouil, Mottaqiallah; Fieback, Moritz; Chen, Danyang; Li, Xiuyan; Wang, Lin; Cantoro, Riccardo; Yin, Chujun; Hamdioui, Said
      In: 2024 IEEE International Test Conference (ITC)
      IEEE
      International Test Conference (ITC) 2024 (San Diego (USA)) 03-08 November 2024
      pp.5 (pp.91-95) ISBN:9798331520137 DOI:10.1109/ITC51657.2024.00026

  11. Simulation Techniques For Rapid Software Development and Validation
      tesi dottorato
      

      AMEL SOLOUKI, Mohammadreza
      Politecnico di Torino
      pp.125 (pp.1-125)

  12. Logic Diagnosis Based on Logic Built-In Self-Test Signatures Collected In-Field from Failing System-on-Chips
      articolo
      

      Bernardi, Paolo; Filipponi, Gabriele; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo
      ELECTRONICS
      MDPI
      Vol.13 pp.29 ISSN:2079-9292 DOI:10.3390/electronics13214234

  13. CAN-MM: Multiplexed Message Authentication Code for Controller Area Network Message Authentication in Road Vehicles
      articolo
      

      Oberti, Franco; Savino, Alessandro; Sanchez, Ernesto; Casasso, Paolo; Parisi, Filippo; Carlo, Stefano Di
      IEEE TRANSACTIONS ON VEHICULAR TECHNOLOGY
      IEEE
      Vol.73 pp.13 (pp.14661-14673) ISSN:0018-9545 DOI:10.1109/tvt.2024.3402986

  14. Enhancing the Reliability of Split Computing Deep Neural Networks
      proceeding
      

      Esposito, G.; Guerrero-Balaguera, J. -D.; Condia, J. E. R.; Levorato, M.; Reorda, M. S.
      In: 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS)
      IEEE
      2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS) (Rennes (FR)) 03-05 July 2024
      pp.7 (pp.1-7) ISBN:9798350370553 DOI:10.1109/IOLTS60994.2024.10616071

  15. A 6-bit Low-Area Hybrid ADC Design For System-on-Chip Measurements
      proceeding
      

      Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio
      In: 2024 IEEE International Conference on Design, Test and Technology of Integrated Systems (DTTIS)
      IEEE
      IEEE International conference on Design, Test & Technology of Integrated Systems (DTTIS) (Aix-en-Provence (FR)) 14-16 October 2024
      pp.6 ISBN:9798350363128 DOI:10.1109/DTTIS62212.2024.10780233

  16. AI Eye Charts: measuring the visual acuity of Neural Networks with test images
      proceeding
      

      Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto
      In: 2024 IEEE International Conference on Design, Test and Technology of Integrated Systems (DTTIS)
      IEEE
      IEEE 2nd International conference on Design, Test & Technology of Integrated Systems (Aix-en-Provence (FR)) 14-16 October 2024
      pp.5 (pp.1-5) ISBN:9798350363128 DOI:10.1109/DTTIS62212.2024.10780079

  17. Optimizing LSTM-based temperature prediction algorithm for embedded system deployment
      proceeding
      

      D'Agostino, Pietro; Violante, Massimo; Macario, Gianpaolo
      In: IEEE ETFA 2024 - IEEE International Conference on Emerging Technologies and Factory Automation
      IEEE
      29TH INTERNATIONAL CONFERENCE ON EMERGING TECHNOLOGIES AND FACTORY AUTOMATION (Padova (IT)) September 10-13, 2024
      pp.7 (pp.01-07) DOI:10.1109/ETFA61755.2024.10711142

  18. COVID-19 Detection from Exhaled Breath
      articolo
      

      Bellarmino, Nicolo'; Cantoro, Riccardo; Castelluzzo, Michele; Correale, Raffaele; Squillero, Giovanni; Bozzini, Giorgio; Castelletti, Francesco; Ciricugno, Carla; Dalla Gasperina, Daniela; Dentali, Francesco; Poggialini, Giovanni; Salerno, Piergiorgio; Stefanotaborelli,
      SCIENTIFIC REPORTS
      Nature Portfolio
      Vol.14 pp.15 ISSN:2045-2322 DOI:10.1038/s41598-024-74104-1

  19. Analyzing the Structural and Operational Impact of Faults in Floating-Point and Posit Arithmetic Cores for CNN Operations
      proceeding
      

      Rodriguez Condia, Josie E; Guerrero-Balaguera, Juan-David; Sierra, Robert Limas; Reorda, Matteo Sonza
      In: IEEE
      29th IEEE European Test Symposium 2024
      29th IEEE European Test Symposium 2024 (The Hague (NL)) 20-24 May 2024
      pp.4 (pp.1-4) ISBN:9798350349320 DOI:10.1109/ets61313.2024.10567884

  20. To be or not to be… awake? A comparison of subjective and objective methods for drowsiness detection in drivers
      proceeding
      

      Groppo, Sara; Guagnano, Michele; Pugliese, Luigi; Sini, Jacopo; Violante, Massimo
      In: 2024 IEEE 22nd Mediterranean Electrotechnical Conference (MELECON)
      IEEE
      2024 IEEE 22nd Mediterranean Electrotechnical Conference (MELECON) (Porto (PRT)) 25-27 June 2024
      pp.5 (pp.684-688) ISBN:9798350387025 DOI:10.1109/melecon56669.2024.10608467

  21. Embedded Feature Selection in MCU Performance Screening
      proceeding
      

      Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
      In: 2024 IEEE International Conference on Design, Test and Technology of Integrated Systems (DTTIS)
      IEEE
      IEEE 2nd International conference on Design, Test & Technology of Integrated Systems (Aix-en-Provence (FRA)) October 14th -16th 2024
      pp.6 (pp.1-6) ISBN:9798350363128 DOI:10.1109/DTTIS62212.2024.10780418

  22. Early Detection of Permanent Faults in DNNs Through the Application of Tensor-Related Metrics
      proceeding
      

      Turco, V.; Ruospo, A.; Sanchez, E.; Sonza Reorda, M.
      ... IEEE ... INTERNATIONAL SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS & SYSTEMS
      In: 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS)
      IEEE (STATI UNITI D'AMERICA)
      2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) (Kielce (POL)) 03-05 April 2024
      pp.6 (pp.13-18) ISSN:2334-3133 ISBN:9798350359343 DOI:10.1109/DDECS60919.2024.10508918

  23. Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test
      proceeding
      

      Cantoro, Riccardo; Grosso, Michelangelo; Guglielminetti, Iacopo; Khoshzaban, Reza; Reorda, Matteo Sonza
      In: Titolo volume non avvalorato
      IEEE
      2024 IEEE European Test Symposium (ETS) (The Hague (NL)) 20-24 May 2024
      pp.4 ISBN:9798350349320 DOI:10.1109/ets61313.2024.10567198

  24. Exploring trade-offs in multi-site wafer testing
      proceeding
      

      Bernardi, Paolo; Cardone, Lorenzo; Foscale, Tommaso
      In: Titolo volume non avvalorato
      IEEE
      25th IEEE Latin American Test Symposium 2024 (Maceio (BRA)) 09-12 April 2024
      pp.4 ISBN:9798350365559 DOI:10.1109/lats62223.2024.10534596

  25. A Flexible FPGA-based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems
      proceeding
      

      DI GRUTTOLA GIARDINO, Nicola; Angione, Francesco; Bernardi, Paolo; Foscale, Tommaso; Bertani and Vincenzo Tancorre, Claudia
      In: 2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
      IEEE
      International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) (Didcot (UK)) 08-10 October 2024
      pp.6 ISBN:9798350366884 DOI:10.1109/DFT63277.2024.10753536

  26. Effective Application-level Error Modeling of Permanent Faults on AI Accelerators
      proceeding
      

      Pessia, Francesco; Guerrero-Balaguera, Juan-David; Limas Sierra, Robert; Rodriguez Condia, Josie E.; Levorato, Marco; Sonza Reorda, Matteo
      In: 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS)
      IEEE
      International Symposium on On-Line Testing and Robust System Design (IOLTS) (Rennes (FRA)) 03-05 July 2024
      pp.7 (pp.1-7) ISBN:9798350370553 DOI:10.1109/iolts60994.2024.10616087

  27. Byron: A Fuzzer for Turing-complete Test Programs
      proceeding
      

      Squillero, Giovanni; Tonda, Alberto; Masetta, Dimitri; Sacchet, Marco
      In: GECCO '24 Companion: Proceedings of the Genetic and Evolutionary Computation Conference Companion
      Association for Computing Machinery (STATI UNITI D'AMERICA)
      GECCO '24 Companion: Genetic and Evolutionary Computation Conference Companion (Melbourne, VIC (AUS)) July 14 - 18, 2024
      pp.4 (pp.1691-1694) ISBN:9798400704956 DOI:10.1145/3638530.3664136

  28. Analyzing the Reliability of TCUs Through Micro-architecture and Structural Evaluations for Two Real Number Formats
      capitolo
      

      LIMAS SIERRA, ROBERT ALEXANDER; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; SONZA REORDA, Matteo
      IFIP ADVANCES IN INFORMATION AND COMMUNICATION TECHNOLOGY
      VLSI-SoC 2023: Silicon Innovations for Trustworthy Artificial Intelligence
      Springer
      Vol.680 pp.28 (pp.149-176) ISSN:1868-4238 ISBN:9783031709463 DOI:10.1007/978-3-031-70947-0_8

  29. Towards an Evolutionary Approach for Exploting Core Knowledge in Artificial Intelligence
      proceeding
      

      Calabrese, Andrea; Quer, Stefano; Squillero, Giovanni; Tonda, Alberto
      In: GECCO 2024: Proceedings of the Genetic and Evolutionary Computation Conference
      ACM Association for Cmputing Machinery
      GECCO 2024: The Genetic and Evolutionary Computation Conference (Melbourne, VIC (AUS)) July 14 - 18, 2024
      pp.4 (pp.259-262) ISBN:9798400704956 DOI:10.1145/3638530.3654230

  30. NXRouting: A GPU-Enhanced CAD Tool for European Radiation-Hardened FPGAs
      articolo
      

      Portaluri, Andrea; Azimi, Sarah; Saracino, Andrea; Sterpone, Luca; Kilic, Alp; Dupuis, Damien
      ELECTRONICS
      MDPI
      Vol.13 pp.14 ISSN:2079-9292 DOI:10.3390/electronics13142803

  31. Approximate Fault-Tolerant Neural Network Systems
      proceeding
      

      Traiola, Marcello; Pappalardo, Salvatore; Piri, Ali; Ruospo, Annachiara; Deveautour, Bastien; Sanchez, Ernesto; Bosio, Alberto; Saeedi, Sepide; Carpegna, Alessio; Göğebakan, Anıl Bayram; Magliano, Enrico; Savino, Alessandro
      In: 2024 IEEE European Test Symposium (ETS)
      IEEE
      IEEE European Test Symposium (ETS) 2024 (Der Haag (NL)) 20-24 May 2024
      pp.10 (pp.1-10) ISBN:9798350349320 DOI:10.1109/ets61313.2024.10567290

  32. Assessing the Reliability of Different Split Computing Neural Network Applications
      proceeding
      

      Esposito, Giuseppe; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Levorato, Marco; Reorda, Matteo Sonza
      In: 2024 IEEE 25th Latin American Test Symposium (LATS)
      IEEE
      2024 IEEE 25th Latin American Test Symposium (LATS) (Maceio (BRA)) 09-12 April 2024
      pp.6 ISBN:9798350365559 DOI:10.1109/lats62223.2024.10534618

  33. Optimizing System-Level Test Program Generation via Genetic Programming
      proceeding
      

      Schwachhofer, D.; Angione, F.; Becker, S.; Wagner, S.; Sauer, M.; Bernardi, P.; Polian, I.
      In: 2024 IEEE European Test Symposium (ETS)
      IEEE
      2024 IEEE European Test Symposium (ETS) (The Hague (NL)) 20-24 May 2024
      pp.4 ISBN:9798350349320 DOI:10.1109/ETS61313.2024.10567817

  34. ZOR: Zero Overhead Reliability Strategies for AI Accelerators
      proceeding
      

      Vacca, Eleonora; Azimi, Sarah; Sterpone, Luca
      In: IEEE International NEWCAS Conference
      IEEE
      22nd IEEE International NEWCAS Conference 2024 (Sherbrooke (CAN)) 16-19 June 2024
      pp.5 (pp.248-252) ISBN:9798350361759 DOI:10.1109/NewCAS58973.2024.10666350

  35. REMPRO: Reconfigurable Modular Processor
      proceeding
      

      Vacca, Eleonora; Strollo, Elio; Azimi, Sarah
      In: CF '24 Companion: Proceedings of the 21st ACM International Conference on Computing Frontiers Workshops and Special Session
      ACM
      21st ACM International Conference on Computing Frontiers (Ischia (ITA)) May 7-9, 2024
      pp.6 (pp.110-115) ISBN:9798400704925 DOI:10.1145/3637543.3652977

  36. Secure Intermittent Computing with ARM TrustZone on the Cortex-M
      proceeding
      

      Chiavassa, Pietro; Gandino, Filippo; Ferrero, Renato; Muehlberg, Jan Tobias
      In: 2024 IEEE European Symposium on Security and Privacy Workshops (EuroS&PW)
      IEEE
      2024 IEEE European Symposium on Security and Privacy Workshops (EuroS&PW) SysTEX 2024 - 7th Workshop on System Software for Trusted Execution (Vienna (AT)) 08-12 July 2024
      pp.9 (pp.160-168) ISBN:9798350367294 DOI:10.1109/EuroSPW61312.2024.00022

  37. Improving Data Quality of Low-Cost Light-Scattering PM Sensors: Towards Automatic Air Quality Monitoring in Urban Environments
      articolo
      

      Ramirez-Espinosa, Gustavo; Chiavassa, Pietro; Giusto, Edoardo; Quer, Stefano; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      IEEE INTERNET OF THINGS JOURNAL
      IEEE
      Vol.11 pp.12 (pp.28409-28420) ISSN:2327-4662 DOI:10.1109/jiot.2024.3405623

  38. Analyzing the Impact of Scheduling Policies on the Reliability of GPUs Running CNN Operations
      proceeding
      

      Limas Sierra, Robert; Guerrero-Balaguera, Juan-David; Pessia, Francesco; Rodriguez Condia, Josie E.; Reorda, Matteo Sonza
      In: Titolo volume non avvalorato
      IEEE
      2024 IEEE 42nd VLSI Test Symposium (VTS) (Tempe, AZ (USA)) 22-24 April 2024
      pp.7 ISBN:9798350363784 DOI:10.1109/vts60656.2024.10538940

  39. Special Session: Reliability Assessment Recipes for DNN Accelerators
      proceeding
      

      Ahmadilivani, Mohammad Hasan; Bosio, Alberto; Deveautour, Bastien; Santos, Fernando Fernandes Dos; Guerrero-Balaguera, Juan-David; Jenihhin, Maksim; Kritikakou, Angeliki; Limas Sierra, Robert; Pappalardo, Salvatore; Raik, Jaan; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo; Taheri, Mahdi; Traiola, Marcello
      In: 2024 IEEE 42nd VLSI Test Symposium (VTS)
      IEEE
      2024 IEEE 42nd VLSI Test Symposium (VTS) (Tempe (USA)) 22-24 April 2024
      pp.11 ISBN:9798350363784 DOI:10.1109/vts60656.2024.10538707

  40. Evaluating the Reliability of Supervised Compression for Split Computing
      proceeding
      

      Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Levorato, Marco; Sonza Reorda, Matteo
      In: 2024 IEEE 42nd VLSI Test Symposium (VTS)
      IEEE
      2024 IEEE 42nd VLSI Test Symposium (VTS) (Tempe (USA)) 22-24 April 2024
      pp.6 (pp.1-6) ISBN:9798350363784 DOI:10.1109/vts60656.2024.10538938

  41. An Integrated Environment for the Reliability Assessment of CNNs Accelerators Implemented in FPGAs
      proceeding
      

      Mesa, Luis Ariel; Guerrero-Balaguera, Juan-David; Castañeda, Erika D.; Sanchez, Ernesto; Pérez-Holguín, Wilson-Javier
      In: 2024 IEEE 25th Latin American Test Symposium (LATS)
      IEEE
      2024 IEEE 25th Latin American Test Symposium (LATS) (Maceio (BRA)) 09-12 April 2024
      pp.4 ISBN:9798350365559 DOI:10.1109/lats62223.2024.10534609

  42. A Novel Robust Core for Detecting Node Failures in FPGA Clusters
      proceeding
      

      Cora, Giorgio; DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca
      In: CF’ 24: Proceedings of the 21st ACM International Conference on Computing Frontiers
      ACM
      CF' 24: 21st ACM International Conference on Computing Frontiers (Ischia (ITA)) May 7 - 9, 2024
      pp.2 (pp.328-329) ISBN:9798400705977 DOI:10.1145/3649153.3653001

  43. Enhancing the Robustness of System on FPGA by Routing Isolation
      proceeding
      

      Nicolini, Davide; DE SIO, Corrado; Vacca, Eleonora
      In: CF’ 24: Proceedings of the 21st ACM International Conference on Computing Frontiers
      ACM
      CF' 24: 21st ACM International Conference on Computing Frontiers (Ischia (ITA)) May 7 - 9, 2024
      pp.2 (pp.326-327) ISBN:9798400705977 DOI:10.1145/3649153.3653000

  44. Scalable K-Nearest Neighbors Implementation using Distributed Embedded Systems
      proceeding
      

      DE SIO, Corrado; Avignone, Andrea; Sterpone, Luca; Chiusano, Silvia
      In: CF’ 24: Proceedings of the 21st ACM International Conference on Computing Frontiers
      ACM
      CF' 24: 21st ACM International Conference on Computing Frontiers (Ischia (ITA)) May 7-9, 2024
      pp.2 (pp.314-315) ISBN:9798400705977 DOI:10.1145/3649153.3652994

  45. Exploring the Resiliency of Hardware CNN for Aerospace Application
      proceeding
      

      De Sio, C.; Cora, G.; Azimi, S.; Vacca, E.; Sterpone, L.
      In: 2024 20th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)
      IEEE
      20th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (Volos (GRC)) July 2-5, 2024
      pp.4 ISBN:9798350351927 DOI:10.1109/SMACD61181.2024.10745391

  46. Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects
      proceeding
      

      Bartolomucci, Michelangelo; Deligiannis, Nikolaos; Cantoro, Riccardo; Sonza Reorda, Matteo
      In: 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS)
      IEEE
      International Symposium on On-Line Testing and Robust System Design (IOLTS) (Rennes (FRA)) 03-05 July 2024
      pp.6 ISBN:9798350370553 DOI:10.1109/IOLTS60994.2024.10616077

  47. Assessment of RISC-V Processor Suitability for Satellite Applications
      proceeding
      

      Vacca, Eleonora; Cora, Giorgio; Azimi, Sarah; Sterpone, Luca
      In: CF '24: Proceedings of the 21st ACM International Conference on Computing Frontiers
      ACM
      21st ACM International Conference on Computing Frontiers (Ischia (ITA)) May 7-9, 2024
      pp.6 (pp.116-121) ISBN:9798400704925 DOI:10.1145/3637543.3652978

  48. Model theft attack against a tinyML application running on an Ultra-Low-Power Open-Source SoC
      proceeding
      

      Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto
      In: Proceedings of the 21st ACM International Conference on Computing Frontiers: Workshops and Special Sessions
      ACM
      21st ACM International Conference on Computing Frontiers Workshops and Special Sessions (CF '24 Companion) (Ischia (IT)) 07-09/05/2024
      pp.4 (pp.63-66) ISBN:9798400704925 DOI:10.1145/3637543.3652877

  49. Resiliency approaches in Convolutional, Photonic, and Spiking Neural Networks
      proceeding
      

      Bosio, Alberto; Gomes, Mauricio; Pavanello, Fabio; Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto; Vatajelu, Elena Ioana
      In: Titolo volume non avvalorato
      IEEE
      2024 IEEE 25th Latin American Test Symposium (LATS) (Maceió (BRA)) 09-12 April 2024
      pp.10 (pp.1-10) ISBN:9798350365559 DOI:10.1109/LATS62223.2024.10534615

  50. A New Reliability Analysis of RISC-V Soft Processor for Safety-Critical Systems
      proceeding
      

      Cora, Giorgio; De Sio, Corrado; Rizzieri, Daniele; Azimi, Sarah; Sterpone, Luca
      In: 2024 IEEE 27th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
      IEEE
      27th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (Kielce (POL)) 03-05 April 2024
      pp.6 (pp.31-36) ISBN:9798350359343 DOI:10.1109/DDECS60919.2024.10508921

  51. Investigating and Reducing the Architectural Impact of Transient Faults in Special Function Units for GPUs
      articolo
      

      Rodriguez Condia, Josie E.; Guerrero-Balaguera, Juan-David; Patiño Núñez, Edwar J.; Limas, Robert; Sonza Reorda, Matteo
      JOURNAL OF ELECTRONIC TESTING
      Springer
      Vol.40 pp.14 (pp.215-228) ISSN:0923-8174 DOI:10.1007/s10836-024-06107-9

  52. On the Fault Tolerance of Self-Supervised Training in Convolutional Neural Networks
      proceeding
      

      Milazzo, Rosario; De Marco, Vincenzo; De Sio, Corrado; Fosson, Sophie; Morra, Lia; Sterpone, Luca
      In: 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS)
      IEEE
      27th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (Kielce (Polonia)) 3-5 April 2024
      pp.6 (pp.110-115) ISBN:9798350359343 DOI:10.1109/DDECS60919.2024.10508923

  53. Evaluating the Reliability of Integer Multipliers With Respect to Permanent Faults
      proceeding
      

      Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Habib, S. E. D.
      In: 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS)
      IEEE
      International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) (Kielce (POL)) 03-05 April 2024
      pp.6 (pp.124-129) ISBN:9798350359343 DOI:10.1109/DDECS60919.2024.10508899

  54. Exploring Hardware Fault Impacts on Different Real Number Representations of the Structural Resilience of TCUs in GPUs
      articolo
      

      Limas Sierra, Robert; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo
      ELECTRONICS
      MDPI
      Vol.13 pp.16 ISSN:2079-9292 DOI:10.3390/electronics13030578

  55. Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs
      articolo
      

      Bernardi, Paolo; Guerriero, Augusto Maria; Insinga, Giorgio; Paganini, Giovanni; Carnevale, Giambattista; Coppetta, Matteo; Mischo, Walter; Ullmann, Rudolf
      ELECTRONICS
      MDPI
      Vol.13 pp.16 ISSN:2079-9292 DOI:10.3390/electronics13020303

  56. CNN-Oriented Placement Algorithm for High-Performance Accelerators on Rad-Hard FPGAs
      articolo
      

      Sterpone, L.; Azimi, S.; De Sio, C
      IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
      IEEE
      Vol.43 pp.14 (pp.1079-1092) ISSN:0278-0070 DOI:10.1109/TCAD.2023.3331976

  57. U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration
      proceeding
      

      Bellarmino, Nicolo’; Cantoro, Riccardo; Squillero, Giovanni
      LECTURE NOTES IN COMPUTER SCIENCE
      In: Machine Learning, Optimization, and Data Science
      Springer
      The 9th International Conference on Machine Learning, Optimization, and Data Science (LOD 2023) (Grasmere, Lake District, England (UK)) September 22 – 26, 2023
      Vol.14505 pp.15 (pp.364-378) ISSN:0302-9743 ISBN:9783031539688 DOI:10.1007/978-3-031-53969-5_27

  58. Banknote identification through unique fluorescent properties
      articolo
      

      Ferrero, Renato; Montrucchio, Bartolomeo
      IEEE TRANSACTIONS ON DEPENDABLE AND SECURE COMPUTING
      IEEE
      Vol.21 pp.12 (pp.975-986) ISSN:1545-5971 DOI:10.1109/TDSC.2023.3267166

  2023

  1. Evaluating the Impact of Aging on Path-Delay Self-Test Libraries
     proceeding
     

     Cantoro, Riccardo; Sartoni, Sandro; Reorda, Matteo Sonza; Anghel, Lorena; Portolan, Michele
     In: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
     IEEE
     IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) 2023 (Juan-Les-Pins (FRA)) 03-05 October 2023
     pp.7 ISBN:9798350315004 DOI:10.1109/dft59622.2023.10313531

  2. Self-Test Library Generation for In-field Test of Path Delay faults
     articolo
     

     Anghel, Lorena; Cantoro, Riccardo; Masante, Riccardo; Portolan, Michele; Sartoni, Sandro; SONZA REORDA, Matteo
     IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
     IEEE
     Vol.42 pp.14 (pp.4246-4259) ISSN:0278-0070 DOI:10.1109/TCAD.2023.3268210

  3. Bio-orthogonal double-crosslinked alginate-gelatin/MXenes hydrogels as biomimetic viscoelastic and electroconductive substrates supporting cardiac regeneration
     proceeding
     

     Testore, Daniele; Zoso, Alice; Paoletti, Camilla; Groppo, Sara; Marcello, Elena; Rafieraad, Alireza; Dhingra, Sanjiv; Chiono, Valeria
     In: Conference abstract book
     European Society of Biomaterials
     33rd Annual Conference of the European Society for Biomaterials (ESB 2023)
     

  4. EUFRATE: A High-Perfomance Reconfigurable Architecture for Radiation-hardened Telecom Payloads
     proceeding
     

     Bozzoli, Ludovica; Catanese, Antonino; Scarpa, Eugenio; Fazzoletto, Emilio; Goehringer, Diana; Pertuz, Sergio; Lester, Kalms; Wulf, Cornelia; Charaf, Nejdet; Sterpone, Luca; Azimi, Sarah; Rizzieri, Daniele
     In: European Data Handling and Data Processing Conference for Space, EDHPC 2023
     IEEE
     European Data Handling and Data Processing Conference for Space, EDHPC 2023 (Juan Les Pins (FRA)) 02-06 October 2023
     ISBN:9789090379241 DOI:10.23919/EDHPC59100.2023.10396517

  5. Analyzing the Impact of Different Real Number Formats on the Structural Reliability of TCUs in GPUs
     proceeding
     

     Sierra, Robert Limas; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo
     In: 31st IFIP/IEEE Conference on Very Large Scale Integration (VLSI-SoC 2023)
     IEEE
     IFIP/IEEE Conference on Very Large Scale Integration (VLSI-SoC 2023) (Dubai (United Arab Emirates)) 16-18 October 2023
     pp.6 (pp.1-6) ISBN:9798350325997 DOI:10.1109/VLSI-SoC57769.2023.10321881

  6. Veni, Vidi, Evolvi (commentary on W. B. Langdon’s "Jaws 30")
     articolo
     

     Squillero, Giovanni; Tonda, Alberto
     GENETIC PROGRAMMING AND EVOLVABLE MACHINES
     Springer
     Vol.24 pp.4 (pp.1-4) ISSN:1389-2576 DOI:10.1007/s10710-023-09472-0

  7. Guidelines for Implementing Control Flow Checking into Automotive Embedded Applications Developed with C Language
     proceeding
     

     Sini, Jacopo; AMEL SOLOUKI, Mohammadreza; Violante, Massimo
     In: 2023 {IEEE} Nordic Circuits and Systems Conference ({NorCAS})
     IEEE
     IEEE Nordic Circuits and Systems Conference (NorCAS) (Aalborg, Denmark) 31 October 2023 - 01 November 2023
     pp.6 (pp.1-6) ISBN:9798350337570 DOI:10.1109/norcas58970.2023.10305466

  8. Uncovering hidden vulnerabilities in CNNs through evolutionary-based Image Test Libraries
     proceeding
     

     Turco, V.; Ruospo, A.; Gavarini, G.; Sanchez, E.; Sonza Reorda, M.
     In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
     IEEE
     International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (Juan-Les-Pins (FR)) 03-05 October 2023
     pp.6 ISBN:9798350315004 DOI:10.1109/DFT59622.2023.10313530

  9. On the resilience of representative and novel data formats in CNNs
     proceeding
     

     Gavarini, G.; Ruospo, A.; Sanchez, E.
     In: 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
     IEEE
     International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (Juan-Les-Pins (FR)) 03-05 October 2023
     pp.6 ISBN:9798350315004 DOI:10.1109/DFT59622.2023.10313551

  10. A Fast Reliability Analysis of Image Segmentation Neural Networks Exploiting Statistical Fault Injections
      proceeding
      

      Gavarini, G; Ruospo, A; Sanchez, E
      In: 2023 IEEE 24th Latin American Test Symposium (LATS)
      IEEE (STATI UNITI D'AMERICA)
      2023 IEEE 24th Latin American Test Symposium (LATS) (Veracruz (Mexico)) 21-24 March 2023
      pp.6 (pp.1-6) ISBN:9798350325973 DOI:10.1109/LATS58125.2023.10154488

  11. Special Session: Approximation and Fault Resiliency of DNN Accelerators
      proceeding
      

      Ahmadilivani, Mh; Barbareschi, M; Barone, S; Bosio, A; Daneshtalab, M; Della Torca, S; Gavarini, G; Jenihhin, M; Raik, J; Ruospo, A; Sanchez, E; Taheri, M
      In: 2023 IEEE 41st VLSI Test Symposium (VTS)
      IEEE (STATI UNITI D'AMERICA)
      2023 IEEE 41st VLSI Test Symposium (VTS) (San Diego (USA)) 24-26 April 2023
      pp.10 (pp.1-10) ISBN:9798350346305 DOI:10.1109/VTS56346.2023.10140043

  12. SCI-FI: a Smart, aCcurate and unIntrusive Fault-Injector for Deep Neural Networks
      proceeding
      

      Gavarini, G; Ruospo, A; Sanchez, E
      In: 2023 IEEE European Test Symposium (ETS)
      IEEE (STATI UNITI D'AMERICA)
      2023 IEEE European Test Symposium (ETS) (Venice (Italy)) 22-26 May 2023
      pp.6 (pp.1-6) ISBN:9798350336344 DOI:10.1109/ETS56758.2023.10173957

  13. Measuring Particulate Matter: an Investigation on Sensor Technology, Particle Size, Monitoring Site
      articolo
      

      Gandino, Filippo; Chiavassa, Pietro; Ferrero, Renato
      IEEE ACCESS
      IEEE
      Vol.11 pp.14 (pp.108761-108774) ISSN:2169-3536 DOI:10.1109/ACCESS.2023.3319092

  14. Targeting different defect-oriented fault models in IC testing: an experimental approach
      proceeding
      

      Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza Reorda, Matteo
      In: 2023 26th Euromicro Conference on Digital System Design (DSD)
      Institute of Electrical and Electronics Engineers
      26th Euromicro Conference Series on Digital System Design (DSD) (Golem (ALB)) 6-8 September, 2023
      pp.6 (pp.214-219) ISBN:9798350344196 DOI:10.1109/DSD60849.2023.00039

  15. Understanding the Effects of Permanent Faults in GPU's Parallelism Management and Control Units
      proceeding
      

      Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; dos Santos, Fernando F.; Sonza, Matteo; Rech, Paolo
      In: SC23: International Conference for High Performance Computing, Networking, Storage and Analysis
      SC23: International Conference for High Performance Computing, Networking, Storage and Analysis
      SC23: International Conference for High Performance Computing, Networking, Storage and Analysis (Denver CO (USA)) November 12 - 17, 2023
      pp.14 (pp.1-14) ISBN:9798400701092 DOI:10.1145/3581784.3607086

  16. Understanding the Effect of Transpilation in the Reliability of Quantum Circuits
      proceeding
      

      Dilillo, Nicola; Giusto, Edoardo; Dri, Emanuele; Baheri, Betis; Guan, Qiang; Montrucchio, Bartolomeo; Rech, Paolo
      In: 2023 IEEE International Conference on Quantum Computing and Engineering (QCE)
      IEEE (STATI UNITI D'AMERICA)
      IEEE International Conference on Quantum Computing and Engineering (QCE) (Bellevue, WA (USA)) 17-22 September 2023
      pp.4 (pp.232-235) ISBN:9798350343236 DOI:10.1109/QCE57702.2023.10220

  17. Investigation on wireless communication for sensors in IoT cold chain
      proceeding
      

      Dilillo, Nicola; Ferrero, Renato; Gandino, Filippo; Rebaudengo, Maurizio
      In: 2023 IEEE Conference on AgriFood Electronics (CAFE)
      IEEE
      AgriFood Electronics (CAFE), IEEE Conference on Agrifood Electronics (Torino, Italy) 25-27 September 2023
      pp.5 (pp.89-93) ISBN:9798350327113 DOI:10.1109/CAFE58535.2023.10291686

  18. RunSAFER: A Novel Runtime Fault Detection Approach for Systolic Array Accelerators
      proceeding
      

      Vacca, Eleonora; Ajmone, Giorgio; Sterpone, Luca
      In: 2023 IEEE 41st International Conference on Computer Design (ICCD)
      IEEE
      The 41st IEEE International Conference on Computer Design (Washington DC (USA)) 6-8 November 2023
      pp.9 (pp.596-604) ISBN:9798350342918 DOI:10.1109/ICCD58817.2023.00095

  19. A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test
      proceeding
      

      Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio
      In: 2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC)
      IEEE
      Conference on Very Large Scale Integration (VLSI-SoC 2023) (Dubai (United Arab Emirates)) October 16 - 18, 2023
      pp.6 (pp.1-6) ISBN:9798350325997 DOI:10.1109/VLSI-SoC57769.2023.10321848

  20. Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors
      proceeding
      

      Deligiannis, Nikolaos; Faller, Tobias; Iacopo, Guglielminetti; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo
      In: 2023 IEEE 32nd Asian Test Symposium (ATS)
      IEEE
      Asian Test Symposium (ATS) (Beijing (China)) 14-17 October 2023
      pp.6 (pp.1-6) ISBN:9798350303100 DOI:10.1109/ATS59501.2023.10317988

  21. A Toolchain to Quantify Burn-In Stress Effectiveness on large Automotive System-on-Chips
      articolo
      

      Angione, Francesco; Appello, Davide; Bernardi, Paolo; Calabrese, Andrea; Quer, Stefano; SONZA REORDA, Matteo; Tancorre, Vincenzo; Ugioli, Roberto
      IEEE ACCESS
      IEEE
      Vol.11 pp.22 (pp.105655-105676) ISSN:2169-3536 DOI:10.1109/ACCESS.2023.3316511

  22. Reliability Estimation of Split DNN Models for Distributed Computing in IoT Systems
      proceeding
      

      Guerrero-Balaguera, Juan-David; Harshbarger, Ian A.; Rodriguez Condia, Josie E.; Levorato, Marco; Sonza Reorda, Matteo
      In: 2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE)
      IEEE
      2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE) (Helsinki (FIN)) 19-21 June 2023
      pp.4 (pp.1-4) ISBN:9798350399714 DOI:10.1109/ISIE51358.2023.10227928

  23. Machine Learning for Microcontroller Performance Screening
      proceeding
      

      Bellarmino, Nicolo'
      In: 2023 IEEE European Test Symposium
      IEEE
      2023 IEEE European Test Symposium (Venezia, (IT)) 22-26 Maggio 2023
      pp.2

  24. Enabling Inter-Product Transfer Learning on MCU Performance Screening
      proceeding
      

      Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
      In: 2023 IEEE 32nd Asian Test Symposium (ATS)
      IEEE
      IEEE 32nd Asian Test Symposium (Beijing (China)) 14-17 October 2023
      pp.6 (pp.1-6) ISBN:9798350303100 DOI:10.1109/ATS59501.2023.10317992

  25. A Fault Injection Framework for AI Hardware Accelerators
      proceeding
      

      Pappalardo, S; Ruospo, A; O'Connor, I; Deveautour, B; Sanchez, E; Bosio, A
      In: 2023 IEEE 24th Latin American Test Symposium (LATS)
      IEEE
      2023 IEEE 24th Latin American Test Symposium (LATS) (Veracruz, Mexico) 21-24 March 2023
      pp.6 (pp.1-6) ISBN:9798350325973 DOI:10.1109/LATS58125.2023.10154505

  26. Resilience-Performance Tradeoff Analysis of a Deep Neural Network Accelerator
      proceeding
      

      Pappalardo, S; Ruospo, A; O'Connor, I; Deveautour, B; Sanchez, E; Bosio, A
      In: 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
      IEEE
      2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) (Tallin, Estonia) 03-05 May 2023
      pp.6 (pp.181-186) ISBN:9798350332773 DOI:10.1109/DDECS57882.2023.10139704

  27. Evaluating Reliability against SEE of Embedded Systems: A Comparison of RTOS and Bare-metal Approaches
      articolo
      

      DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca
      MICROELECTRONICS RELIABILITY
      Elsevier
      Vol.150 pp.7 ISSN:0026-2714 DOI:10.1016/j.microrel.2023.115124

  28. Assessing the Robustness of Real-Time Operating System on Soft Processor against Multiple Bit Upset
      proceeding
      

      Portaluri, Andrea; DE SIO, Corrado; Sterpone, Luca
      In: Proceedings of the 20th ACM International Conference on Computing Frontiers
      ACM
      20th ACM International Conference on Computing Frontiers (Bologna (IT)) May 9 - 11, 2023
      pp.2 (pp.207-208) ISBN:9798400701405 DOI:10.1145/3587135.3592188

  29. Reliability Analysis of Microarchitectural Faults in GPGPU-based HPC Systems
      proceeding
      

      DE SIO, Corrado; Sterpone, Luca; Azimi, Sarah
      In: Proceedings of the 20th ACM International Conference on Computing Frontiers
      ACM
      20th ACM International Conference on Computing Frontiers (Bologna (IT)) May 9 - 11, 2023
      pp.2 (pp.213-214) ISBN:9798400701405 DOI:10.1145/3587135.3592186

  30. A Framework for Uniformly Analyze and Mitigate Radiation-effects on FPGAs for Aerospace
      proceeding
      

      Sterpone, Luca; Azimi, Sarah; DE SIO, Corrado
      In: CF '23: Proceedings of the 20th ACM International Conference on Computing Frontiers
      ACM
      20th ACM International Conference on Computing Frontiers (Bologna (IT)) May 9 - 11, 2023
      pp.6 (pp.257-262) ISBN:9798400701405 DOI:10.1145/3587135.3592768

  31. Enhanced Video Surveillance Systems for “Signal For Help” Detection on Edge Devices
      proceeding
      

      Azimi, Sarah; De Sio, Corrado; Sterpone, Luca
      In: 2023 IEEE International Symposium on Technology and Society (ISTAS)
      IEEE
      IEEE International Symposium on Technology and Society (ISTAS23) (Swansea, Wales (UK)) 13-15 September 2023
      pp.4 (pp.1-4) ISBN:9798350324860 DOI:10.1109/ISTAS57930.2023.10305989

  32. PSP Framework: A novel risk assessment method in compliance with ISO/SAE-21434
      proceeding
      

      Oberti, Franco; Sanchez, Ernesto; Savino, Alessandro; Parisi, Filippo; Di Carlo, Stefano
      In: Proceedings 2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W)
      IEEE (STATI UNITI D'AMERICA)
      2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W) (Porto (PRT)) 27-30 June 2023
      pp.8 (pp.60-67) ISBN:9798350325430 DOI:10.1109/DSN-W58399.2023.00031

  33. An embedded low-cost solution for a fog computing device on the Internet of Things
      proceeding
      

      D'Agostino, Pietro; Violante, Massimo; Macario, Gianpaolo
      In: 2023 Eighth International Conference on Fog and Mobile Edge Computing (FMEC)
      IEEE
      The Eighth IEEE International Conference on Fog and Mobile Edge Computing (Tartu (Estonia)) September 18-20, 2023
      pp.8 (pp.284-291) ISBN:9798350316971 DOI:10.1109/FMEC59375.2023.10306045

  34. A user-extensible solution for deploying fog computing in industrial applications
      proceeding
      

      D'Agostino, Pietro; Violante, Massimo; Macario, Gianpaolo
      In: 2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE)
      IEEE
      International Symposium on Industrial Electronics (ISIE) 2023 (Helsinki- (FIN)) 19-21 June 2023
      pp.6 (pp.1-6) ISBN:9798350399714 DOI:10.1109/ISIE51358.2023.10227939

  35. A Novel Real-Time Redundant System For Aiding Drivers To Increase Their Attention Level
      proceeding
      

      Sini, Jacopo; Pugliese, Luigi; D'Agostino, Pietro; Violante, Massimo; Groppo, Riccardo
      In: 2023 IEEE Smart World Congress (SWC)
      IEEE
      IEEE Smart World Congress 2023 (Portsmouth (UK)) 28-31 August 2023
      pp.6 (pp.898-903) ISBN:9798350319804 DOI:10.1109/SWC57546.2023.10448988

  36. Exploring the Feasibility of Sleep Quality Evaluation with a Reduced Parameter Set
      proceeding
      

      Guagnano, Michele; Groppo, Sara; Pugliese, Luigi; Violante, Massimo
      In: 2023 IEEE Smart World Congress (SWC)
      IEEE
      IEEE Smart World Congress 2023 (Portsmouth (UK)) 28-31 August 2023
      pp.6 (pp.904-909) ISBN:9798350319804 DOI:10.1109/SWC57546.2023.10448672

  37. Real-Time Sleep Prediction Algorithm Using Commercial off the Shelf Wearable Devices
      proceeding
      

      Pugliese, Luigi; Violante, Massimo; Groppo, Riccardo
      In: 2023 IEEE Smart World Congress (SWC)
      IEEE
      IEEE Smart World Congress 2023 (Portsmouth (UK)) 28-31 August 2023
      pp.5 (pp.634-638) ISBN:9798350319804 DOI:10.1109/SWC57546.2023.10448558

  38. A New Approach to Selectively Control Flow Checking Methods Compliant with ISO 26262
      proceeding
      

      AMEL SOLOUKI, Mohammadreza; Sini, Jacopo; Violante, Massimo
      In: A New Approach to Selectively Control Flow Checking Methods Compliant with ISO 26262
      Association for Computing Machinery (STATI UNITI D'AMERICA)
      20th ACM International Conference on Computing Frontiers (Bologna Italy) May 9 - 11, 2023
      pp.2 (pp.215-216) ISBN:9798400701405 DOI:10.1145/3587135.3592185

  39. Novel Control Flow Checking Implementations for Automotive Software
      proceeding
      

      Cosimi, Francesco; Sini, Jacopo; Arena, Antonio; Violante, Massimo
      In: Titolo voume non avvalorato
      IEEE
      19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD) (Funchal, Madeira, Portugal) 03-05 July 2023
      pp.4 (pp.1-4) ISBN:9798350332650 DOI:10.1109/SMACD58065.2023.10192166

  40. A Reliability-aware Environment for Design Exploration for GPU Devices
      proceeding
      

      Limas Sierra, Robert; Guerrero Balaguera, Juan David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo
      ... IEEE ... INTERNATIONAL SYMPOSIUM ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS & SYSTEMS
      In: 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS
      IEEE
      2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) (Tallinn (Estonia)) 03-05 May 2023
      pp.6 (pp.169-174) ISSN:2334-3133 ISBN:9798350332773 DOI:10.1109/DDECS57882.2023.10139643

  41. Analyzing the Architectural Impact of Transient Fault Effects in SFUs of GPUs
      proceeding
      

      Rodriguez Condia, Josie E.; Guerrero-Balaguera, Juan-David; Patiño Núñez, Edwar J.; Limas, Robert; Reorda, Matteo Sonza
      In: 2023 IEEE 24th Latin American Test Symposium (LATS)
      IEEE
      2023 IEEE 24th Latin American Test Symposium (LATS) (Veracruz (Mexico)) 21-24 March 2023
      pp.6 (pp.1-6) ISBN:9798350325973 DOI:10.1109/LATS58125.2023.10154504

  42. Evaluating the Prevalence of SFUs in the Reliability of GPUs
      proceeding
      

      Rodriguez Condia, Josie E.; Guerrero-Balaguera, Juan-David; Patiño Núñez, Edwar J.; Limas, Robert; Reorda, Matteo Sonza
      In: 2023 IEEE European Test Symposium (ETS)
      IEEE (STATI UNITI D'AMERICA)
      2023 IEEE European Test Symposium (ETS) (Venice (IT)) 22-26 May 2023
      pp.6 (pp.1-6) ISBN:9798350336344 DOI:10.1109/ETS56758.2023.10174110

  43. Towards Evolutionary Control Laws for Viability Problems
      proceeding
      

      Tonda, Alberto; Alvarez, Isabelle; Martin, Sophie; Squillero, Giovanni; Lutton, Evelyne
      In: GECCO '23: Proceedings of the Genetic and Evolutionary Computation Conference
      ACM
      GECCO'23 (Lisbon (Portugal)) July 15 - 19, 2023
      pp.9 (pp.1464-1472) ISBN:9798400701191 DOI:10.1145/3583131.3590415

  44. Evaluation and mitigation of faults affecting Swin Transformers
      proceeding
      

      Gavarini, Gabriele; Ruospo, Annachiara; Sanchez, Ernesto
      In: 29th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2023)
      IEEE
      29th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2023) (Chania,Crete (Greece)) July 3rd - 5th, 2023
      pp.7 (pp.1-7) ISBN:9798350341355 DOI:10.1109/IOLTS59296.2023.10224882

  45. Rule-based Sleep-Apnea detection algorithm
      proceeding
      

      Pugliese, Luigi; Guagnano, Michele; Groppo, Sara; Groppo, Riccardo; Violante, Massimo
      In: 2023 9th International Workshop on Advances in Sensors and Interfaces (IWASI)
      IEEE
      2023 9th International Workshop on Advances in Sensors and Interfaces (IWASI) (Monopoli (Italy)) 8-9 June 2023
      pp.5 (pp.251-255) ISBN:9798350336948 DOI:10.1109/IWASI58316.2023.10164530

  46. Density-oriented diagnostic data compression strategy for characterization of embedded memories in Automotive Systems-on-Chip
      proceeding
      

      Insinga, Giorgio; Battilana, Matteo; Coppetta, Matteo; Mautone, Nellina; Carnevale, Giambattista; Giltrelli, Massimo; Scaramuzza, Pierre; Ullmann, Rudolf
      In: 2023 IEEE European Test Symposium (ETS)
      IEEE
      European Test Symposium (ETS) 2023 (Venice (IT)) 22-26 May 2023
      pp.6 (pp.1-6) ISBN:9798350336344 DOI:10.1109/ETS56758.2023.10174126

  47. Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests
      proceeding
      

      Bernardi, Paolo; Filipponi, Gabriele; Foscale, Tommaso; Insinga, Giorgio
      In: 2023 IEEE 24th Latin American Test Symposium (LATS)
      IEEE
      IEEE Latin-American Test Symposium (Veracruz (Mexico)) 21-24 March 2023
      pp.2 ISBN:9798350325973 DOI:10.1109/LATS58125.2023.10154486

  48. About the correlation between logical identified faulty gates and their layout characteristics
      proceeding
      

      Bernardi, Paolo; Cardone, Lorenzo; Iaria, Giusy; Appello, Davide; Garozzo, Giuseppe; Tancorre, Vincenzo
      In: 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS)
      IEEE
      IEEE International Symposium on On-Line Testing and Robust System Design (03-05 July 2023) Crete, Greece
      pp.7 ISBN:9798350341355 DOI:10.1109/IOLTS59296.2023.10224897

  49. Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults
      proceeding
      

      Bernardi, Paolo; Filipponi, Gabriele; Reorda, Matteo Sonza; Appello, Davide; Bertani, Claudia; Tancorre, Vincenzo
      In: 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
      Institute of Electrical and Electronics Engineers
      International Symposium on Design and Diagnostics of Electronic Circuits and Systems (Tallinn (Estonia)) 03-05 May 2023
      pp.6 (pp.21-26) ISBN:9798350332773 DOI:10.1109/DDECS57882.2023.10139670

  50. A guided debugger-based fault injection methodology for assessing functional test programs
      proceeding
      

      Angione, Francesco; Bernardi, Paolo; Di Gruttola Giardino, Nicola; Appello, Davide; Bertani, Claudia; Tancorre, Vincenzo
      In: 2023 IEEE 41st VLSI Test Symposium (VTS)
      IEEE
      VLSI Test Symposium (San Diego (USA)) 24-26 April 2023
      pp.7 (pp.1-7) ISBN:9798350346305 DOI:10.1109/VTS56346.2023.10140099

  51. On the integration and hardening of Software Test Libraries in Real-Time Operating Systems
      proceeding
      

      Angione, Francesco; Bernardi, Paolo; Cantoro, Riccardo; Di Gruttola Giardino, Nicola; Piumatti, Davide; Reorda, Matteo Sonza; Appello, Davide; Tancorre, Vincenzo
      In: 2023 IEEE 24th Latin American Test Symposium (LATS)
      IEEE
      Latin American Test Symposium (Veracruz (Mexico)) 21-24 March 2023
      pp.6 (pp.1-6) ISBN:9798350325973 DOI:10.1109/LATS58125.2023.10154492

  52. A Quantum Adaptation to Roll Truly Random Dice in Role Playing Games
      proceeding
      

      Marceddu, ANTONIO COSTANTINO; Dilillo, Nicola; Russo, Marco; Ferrero, Renato; Montrucchio, Bartolomeo
      In: 2023 IEEE Conference on Games (CoG)
      IEEE (STATI UNITI D'AMERICA)
      2023 IEEE Conference on Games (CoG) (Boston (USA)) 21-24 Agosto 2023
      pp.4 (pp.1-4) ISBN:9798350322774 DOI:10.1109/CoG57401.2023.10333196

  53. Analyzing the SEU-induced Error Propagation in Systolic Array on SRAM-based FPGA
      proceeding
      

      Vacca, Eleonora; Azimi, Sarah; Sterpone, Luca
      In: 2023 23rd European Conference on Radiation and Its Effects on Components and Systems (RADECS)
      IEEE
      IEEE Radiation and its Effects on Components and Systems 2023 (Toulouse (FRA)) 25-29 September 2023
      pp.4 ISBN:9798331520441 DOI:10.1109/RADECS59069.2023.10767017

  54. Programmable SEL Test Monitoring System for Radiation Hardness Assurance
      proceeding
      

      Rizzieri, Daniele; Azimi, Sarah; Sterpone, Luca; DE SIO, Corrado; Borel, Thomas; Gupta, Viyas; Cardi, Marghertia
      In: 2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S)
      IEEE
      IEEE/IFIP International Conference on Dependable Systems and Networks (Porto (PRT)) 27 - 30 June 2023
      pp.7 (pp.217-223) ISBN:9798350325454 DOI:10.1109/DSN-S58398.2023.00061

  55. Radiation-Induced Errors in the Software Level of Real-Time Soft Processing System
      proceeding
      

      DE SIO, Corrado; Rizzieri, Daniele; Portaluri, Andrea; LA GRECA, SALVATORE GABRIELE; Azimi, Sarah
      In: 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS)
      IEEE
      IEEE Symposium on On-Line Testing and Robust System Design -IOLTS (Chania, Crete (GRC)) 03-05 July 2023
      pp.3 (pp.1-3) ISBN:9798350341355 DOI:10.1109/IOLTS59296.2023.10224884

  56. Design Techniques for Multi-Core Neural Network Accelerators on Radiation-Hardened FPGAs
      proceeding
      

      Portaluri, Andrea; Azimi, Sarah; Sterpone, Luca
      In: 2023 22nd International Symposium on Parallel and Distributed Computing (ISPDC)
      IEEE
      IEEE International Symposium on Parallel and Distributed Computing (Bucharest (Romania)) 10-12 July 2023
      pp.7 (pp.16-22) ISBN:9798350341270 DOI:10.1109/ISPDC59212.2023.00023

  57. Radiation Effects in Real-Time Soft Processors: Relating Software Errors to Hardware Faults
      proceeding
      

      DE SIO, Corrado; Rizzieri, Daniele; La Greca, Salvatore G.; Azimi, Sarah; Sterpone, Luca
      In: 2023 23rd European Conference on Radiation and Its Effects on Components and Systems (RADECS)
      IEEE
      IEEE Radiation and its Effects on Components and Systems 2023 (RADECS) (Toulouse (FRA)) 25-29 September 2023
      pp.4 (pp.1-4) ISBN:9798331520441 DOI:10.1109/RADECS59069.2023.10766965

  58. Evaluating the Impact of Transition Delay Faults in GPUs
      proceeding
      

      Rodriguez Condia, Josie E.; Reorda, Matteo Sonza
      In: Proceedings of the 36th International Conference on VLSI Design and 2023 22nd International Conference on Embedded Systems (VLSID)
      IEEE
      International Conference on VLSI Design and 2023 22nd International Conference on Embedded Systems (VLSID) (Hyderabad (India)) 08-12 January 2023
      pp.6 (pp.353-358) ISBN:9798350346787 DOI:10.1109/VLSID57277.2023.00077

  59. A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors
      proceeding
      

      Anders, Jens; Andreu, Pablo; Becker, Bernd; Becker, Steffen; Cantoro, Riccardo; Deligiannis, Nikolaos; Elhamawy, Nourhan; Faller, Tobias; Hernandez, Carles; Mentens, Nele; Namazi Rizi, Mahnaz; Polian, Ilia; Sajadi, Abolfazl; Sauer, Mathias; Schwachhofer, Denis; SONZA REORDA, Matteo; Stefanov, Todor; Tuzov, Ilya; Wagner, Stefan; Zidaric, Nuša
      In: 2023 IEEE European Test Symposium (ETS)
      IEEE
      2023 IEEE European Test Symposium (ETS) (Venice (Italy)) 22-26 May 2023
      pp.10 (pp.1-10) ISBN:9798350336344 DOI:10.1109/ETS56758.2023.10174099

  60. Constraint-Based Automatic SBST Generation for RISC-V Processor Families
      proceeding
      

      Faller, Tobias; Deligiannis, Nikolaos; Schwörer, Markus; SONZA REORDA, Matteo; Becker, Bernd
      In: 2023 IEEE European Test Symposium (ETS)
      IEEE
      2023 IEEE European Test Symposium (ETS) (Venice (Italy)) 22-26 May 2023
      pp.6 (pp.1-6) ISBN:9798350336344 DOI:10.1109/ETS56758.2023.10174156

  61. Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing
      proceeding
      

      Deligiannis, Nikolaos; Faller, Tobias; Chenghan, Zhou; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo
      In: 2023 IEEE European Test Symposium (ETS)
      IEEE
      2023 IEEE European Test Symposium (ETS) (Venice (Italy)) 22-26 May 2023
      pp.5 (pp.1-5) ISBN:9798350336344 DOI:10.1109/ETS56758.2023.10174232

  62. Functional Testing with STLs: A Step Towards Reliable RISC-V-based HPC Commodity Clusters
      proceeding
      

      Rodriguez, Esteban; Deligiannis, Nikolaos; Sini, Jacopo; Cantoro, Riccardo; SONZA REORDA, Matteo
      LECTURE NOTES IN COMPUTER SCIENCE
      In: High Performance Computing
      Springer
      ISC High Performance 2023 International Workshops (Hamburg (DEU)) May 21–25, 2023
      Vol.13999 pp.14 (pp.444-457) ISSN:1611-3349 ISBN:9783031408427 DOI:10.1007/978-3-031-40843-4_33

  63. An Experimental Evaluation of Control Flow Checking for Automotive Embedded Applications Compliant with ISO 26262
      articolo
      

      Solouki, Mohammadreza Amel; Sini, Jacopo; Violante, Massimo
      IEEE ACCESS
      IEEE
      Vol.11 pp.15 (pp.51185-51198) ISSN:2169-3536 DOI:10.1109/ACCESS.2023.3279731

  64. Image Test Libraries for the on-line self-test of functional units in GPUs running CNNs
      proceeding
      

      Ruospo, Annachiara; Gavarini, Gabriele; Porsia, Antonio; Sonza Reorda, Matteo; Sanchez, Ernesto; Mariani, Riccardo; Aribido, Joseph; Athavale, Jyotika
      In: 2023 IEEE European Test Symposium (ETS)
      IEEE
      28th IEEE European Test Symposium 2023 (Venice (Italy)) May 22 - 26, 2023
      pp.6 (pp.1-6) ISBN:9798350336344 DOI:10.1109/ETS56758.2023.10174176

  65. High-Performance SET Hardening Technique for Vision-Oriented Applications
      proceeding
      

      DE SIO, Corrado; Sterpone, Luca
      In: 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)D)
      IEEE
      International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design (SMACD) (Funchal (PRT)) 03-05 July 2023
      pp.4 (pp.1-4) ISBN:9798350332650 DOI:10.1109/SMACD58065.2023.10192201

  66. PyXEL: Exploring Bitstream Analysis to Assess and Enhance the Robustness of Designs on FPGAs
      proceeding
      

      DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca; Merodio Codinachs, David; Decuzzi, Filomena
      In: 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)
      IEEE
      International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design (SMACD) (Funchal (PRT)) 03-05 July 2023
      pp.4 ISBN:9798350332650 DOI:10.1109/SMACD58065.2023.10192116

  67. STLs for GPUs: Using High-Level Language Approaches
      articolo
      

      Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo
      IEEE DESIGN & TEST
      IEEE
      Vol.40 pp.10 (pp.51-60) ISSN:2168-2356 DOI:10.1109/MDAT.2023.3267601

  68. A Comprehensive Analysis of Transient Errors on Systolic Arrays
      proceeding
      

      Vacca, Eleonora; Azimi, Sarah; Sterpone, Luca
      In: 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems
      IEEE
      26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (Tallinn (Estonia)) 3-5 May 2023
      pp.6 (pp.175-180) DOI:10.1109/DDECS57882.2023.10139763

  69. Automating the Generation of Programs Maximizing the Repeatable Constant Switching Activity in Microprocessor Units via MaxSAT
      articolo
      

      Deligiannis, Nikolaos; Faller, Tobias; Cantoro, Riccardo; Paxian, Tobias; Becker, Bernd; SONZA REORDA, Matteo
      IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
      IEEE
      Vol.42 pp.12 (pp.4270-4281) ISSN:0278-0070 DOI:10.1109/TCAD.2023.3252467

  70. Feature Selection for Cost Reduction in MCU Performance Screening
      proceeding
      

      Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
      In: 24th IEEE Latin-American Test Symposium (LATS)
      IEEE
      24th IEEE Latin-American Test Symposium (LATS) (Veracruz (MEX)) 21-24 Marzo 2023
      pp.6 (pp.1-6) ISBN:9798350325973 DOI:10.1109/LATS58125.2023.10154495

  71. Semi-Supervised Deep Learning for Microcontroller Performance Screening
      proceeding
      

      Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
      In: 2023 IEEE European Test Symposium (ETS)
      IEEE
      2023 IEEE European Test Symposium (ETS) (Venezia (IT)) 22-26 May 2023
      pp.6 (pp.1-6) ISBN:9798350336344 DOI:10.1109/ETS56758.2023.10174083

  72. A Multi-Label Active Learning Framework for Microcontroller Performance Screening
      articolo
      

      Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Martone, Raffaele; Schlichtmann, Ulf; Squillero, Giovanni
      IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
      IEEE
      Vol.42 pp.14 (pp.3436-3449) ISSN:0278-0070 DOI:10.1109/TCAD.2023.3245989

  73. Automating the Generation of Programs Maximizing the Sustained Switching Activity in Microprocessor units via Evolutionary Techniques
      articolo
      

      Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo
      MICROPROCESSORS AND MICROSYSTEMS
      Elsevier
      Vol.98 pp.8 ISSN:0141-9331 DOI:10.1016/j.micpro.2023.104775

  74. A Real-Time Novelty Recognition Framework Based on Machine Learning for Fault Detection
      articolo
      

      Albertin, Umberto; Pedone, Giuseppe; Brossa, Matilde; Squillero, Giovanni; Chiaberge, Marcello
      ALGORITHMS
      MDPI
      Vol.16 pp.26 (pp.1-26) ISSN:1999-4893 DOI:10.3390/a16020061

  75. Comparison of heuristic approaches to PCI planning for Quantum Computers
      proceeding
      

      Barillaro, Giuseppe; Boella, Andrea; Gandino, Filippo; Ghazi Vakili, Mohammad; Giusto, Edoardo; Mondo, Giovanni; Montrucchio, Bartolomeo; Scarabosio, Andrea; Scionti, Alberto; Terzo, Olivier; Vitali, Giacomo
      In: Titolo volume non avvalorato
      IEEE
      IEEE ICCE International Conference on Consumer Electronics (Las Vegas) 6-8 Gennaio 2023
      pp.6 (pp.1-6) DOI:10.1109/ICCE56470.2023.10043394

  76. EuFRATE: European FPGA Radiation-hardened Architecture for Telecommunications
      proceeding
      

      Bozzoli, Ludovica; Catanese, Antonio; Fazzoletto, Emilio; Scarpa, Eugenio; Goehringer, Diana; Pertuz, Sergio; Kalms, Lester; Wulf, Cornelia; Charaf, Najdet; Sterpone, Luca; Azimi, Sarah; Rizzieri, Daniele; La Greca, Salvatore Gabriele; Merodio Cordinachs, David; King, Stephen
      In: Design, Automation & Test in Europe Conference & Exhibition (DATE)
      IEEE
      Design, Automation & Test in Europe Conference & Exhibition (DATE) - DATE 2023 (Antwerp (Belgium)) 17-19 Aprile 2023
      pp.6 (pp.1-6) DOI:10.23919/DATE56975.2023.10137035

  77. Fighting for a Future Free from Violence: A Framework for Real-time Detection of “Signal for Help”
      articolo
      

      Azimi, Sarah; De Sio, Corrado; Carlucci, Francesco; Sterpone, Luca
      INTELLIGENT SYSTEMS WITH APPLICATIONS
      Elsevier
      Vol.17 pp.24 (pp.1-24) ISSN:2667-3053 DOI:10.1016/j.iswa.2022.200174

  78. Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems
      articolo
      

      Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David
      ELECTRONICS
      MDPI
      Vol.12 pp.12 ISSN:2079-9292 DOI:10.3390/electronics12010169

  79. Assessing Convolutional Neural Networks Reliability through Statistical Fault Injections
      proceeding
      

      Ruospo, Annachiara; Gavarini, Gabriele; De Sio, Corrado; Guerrero Balaguera, Juan David; Sterpone, Luca; Sonza Reorda, Matteo; Sanchez, Ernesto; Mariani, Riccardo; Aribido, Joseph; Athavale, Jyotika
      In: IEEE Design, Automation and Test in Europe Conference (DATE)
      IEEE
      IEEE Design, Automation and Test in Europe Conference (DATE) (Antwerp (Belgium)) 17 - 19 April 2023
      pp.6 (pp.1-6) ISBN:9798350396249 DOI:10.23919/DATE56975.2023.10136998

  80. Characterizing a Neutron-Induced Fault Model for Deep Neural Networks
      articolo
      

      Fernandes Dos Santos, Fernando; Kritikakou, Angeliki; Rodriguez Condia, Josie E.; Juan-David, Guerrero-Balaguera; SONZA REORDA, Matteo; Sentieys, Olivier; Rech, Paolo
      IEEE TRANSACTIONS ON NUCLEAR SCIENCE
      IEEE
      Vol.70 pp.11 (pp.370-380) ISSN:0018-9499 DOI:10.1109/tns.2022.3224538

  81. A novel fuel injected mass feedback-control for single and multiple injections in direct injection systems for CI engines
      articolo
      

      Ferrari, Alessandro; Novara, Carlo; Vento, Oscar; Violante, Massimo; Zhang, Tantan
      FUEL
      Elsevier
      Vol.334 pp.10 ISSN:0016-2361 DOI:10.1016/j.fuel.2022.126670

  82. A Survey on Deep Learning Resilience Assessment Methodologies
      articolo
      

      Ruospo, Annachiara; Sanchez, Ernesto; Matana Luza, Lucas; Dilillo, Luigi; Traiola, Marcello; Bosio, Alberto
      COMPUTER
      IEEE
      Vol.56 pp.10 (pp.57-66) ISSN:0018-9162 DOI:10.1109/MC.2022.3217841

  83. A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress
      articolo
      

      Angione, F.; Appello, D.; Bernardi, P.; Bertani, C.; Gallo, G.; Littardi, S.; Pollaccia, G.; Ruggeri, W.; Reorda, M. S.; Tancorre, V.; Ugioli, R.
      IEEE TRANSACTIONS ON COMPUTERS
      IEEE
      pp.13 (pp.1447-1459) ISSN:0018-9340 DOI:10.1109/TC.2022.3199994

  84. Using STLs for Effective In-field Test of GPUs
      articolo
      

      Rodriguez Condia, Josie E.; Augusto Da Silva, Felipe; Cagri Bagbaba, Ahmet; Juan-David, Guerrero-Balaguera; Hamdioui, Said; Sauer, Christian; SONZA REORDA, Matteo
      IEEE DESIGN & TEST
      IEEE / Institute of Electrical and Electronics Engineers Incorporated
      Vol.40 pp.9 (pp.109-117) ISSN:2168-2356 DOI:10.1109/MDAT.2022.3188573

  2022

  1. Runtime Test Solution for Adaptive Aging Compensation and Fail Operational Safety mode
     proceeding
     

     Huard, V.; Jacquet, F.; Mhira, S.; Jure, L.; Montfort, O.; Louvat, M.; Zaia, L.; Bertrand, F.; Acacia, E.; Caffin, O.; Belhadj, H.; Durand, O.; Exibard, N.; Bonnet, V.; Charvier, A.; Bernardi, P.; Cantoro, R.
     In: Titolo volume non avvalorato
     IEEE
     2022 IEEE International Reliability Physics Symposium (IRPS) (Dallas, TX (USA)) 27-31 March 2022
     pp.4 ISBN:9781665479509 DOI:10.1109/irps48227.2022.9764590

  2. LIN-MM: Multiplexed Message Authentication Code for Local Interconnect Network message authentication in road vehicles
     proceeding
     

     Oberti, Franco; Sanchez, Ernesto; Savino, Alessandro; Parisi, Filippo; Brero, Mirco; DI CARLO, Stefano
     In: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design IOLTS
     Institute of Electrical and Electronics Engineers (STATI UNITI D'AMERICA)
     IEEE 28th International Symposium on On-Line Testing and Robust System Design IOLTS 2022 (Torino) 12-14 September 2022
     pp.7 (pp.1-7) ISBN:9781665473569 DOI:10.1109/IOLTS56730.2022.9897819

  3. Machine Learning for Test, Diagnosis, Post-Silicon Validation and Yield Optimization
     proceeding
     

     Amrouch, Hussam; Chakrabarty, Krishnendu; Pflueger, Dirk; Polian, Ilia; Sauer, Matthias; Reorda, Matteo Sonza
     In: 2022 IEEE European Test Symposium (ETS)
     IEEE
     IEEE European Test Symposium (Barcelona (ESP)) 23-27 May 2022
     pp.6 (pp.1-6) ISBN:9781665467063 DOI:10.1109/ETS54262.2022.9810416

  4. REFU: Redundant Execution with Idle Functional Units, Fault Tolerant GPGPU architecture
     proceeding
     

     Raghunandana, K. K.; Varaprasad, B. K. S. V. L.; Sonza Reorda, M.; Singh, Virendra
     PROCEEDINGS IEEE COMPUTER SOCIETY ANNUAL SYMPOSIUM ON VLSI
     In: IEEE Computer Society Annual Symposium on VLSI
     IEEE
     2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) (Nicosia, Cyprus) 04-06 July 2022
     pp.4 (pp.394-397) ISSN:2159-3469 ISBN:9781665466059 DOI:10.1109/ISVLSI54635.2022.00088

  5. Microarchitectural Reliability Evaluation of a Block Scheduling Controller in GPUs
     proceeding
     

     Rodriguez Condia, Josie E.; Faggiano, R; Reorda, Ms
     In: Proceedings of the IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2022)
     IEEE
     IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2022) (Nicosia, Cyprus) 04-06 July 2022
     pp.6 (pp.26-31) DOI:10.1109/ISVLSI54635.2022.00018

  6. Toward the hardening of real-time operating systems
     proceeding
     

     Bosio, Alberto; Di Carlo, Stefano; Rebaudengo, Maurizio; Savino, Alessandro
     In: 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
     IEEE (STATI UNITI D'AMERICA)
     IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (Austin, TX (USA)) 19-21 October 2022
     pp.6 (pp.1-6) ISBN:9781665459389 DOI:10.1109/DFT56152.2022.9962356

  7. A Multi-level Approach to Evaluate the Impact of GPU Permanent Faults on CNN's Reliability
     proceeding
     

     Rodriguez Condia, Josie E.; Guerrero-Balaguera, Juan-David; Dos Santos, Fernando F.; Reorda, Matteo Sonza; Rech, Paolo
     In: 2022 IEEE International Test Conference (ITC)
     IEEE
     2022 IEEE International Test Conference (ITC) (Anaheim, CA (USA)) 23-30 September 2022
     pp.10 (pp.278-287) ISBN:9781665462709 DOI:10.1109/ITC50671.2022.00036

  8. In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip
     proceeding
     

     Filipponi, G.; Iaria, G.; Sonza Reorda, M.; Appello, D.; Garozzo, G.; Tancorre, V.
     In: Titolo volume non avvalorato
     IEEE
     2022 IEEE International Test Conference (ITC) (Anaheim (USA)) 23-30 September 2022
     pp.4 (pp.646-649) DOI:10.1109/ITC50671.2022.00090

  9. Neural Network's Reliability to Permanent Faults: Analyzing the Impact of Performance Optimizations in GPUs
     proceeding
     

     Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Reorda, Matteo Sonza
     In: 2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS)
     IEEE
     2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS) (Glasgow (UK)) 24-26 October 2022
     pp.4 (pp.1-4) ISBN:9781665488235 DOI:10.1109/ICECS202256217.2022.9971036

  10. Effectiveness of Control Flow Checking Algorithms Using a Model-Based Software Design Approach: An Empirical Study
      proceeding
      

      AMEL SOLOUKI, Mohammadreza; Sini, Jacopo; Violante, Massimo
      In: 2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS)
      IEEE
      IEEE International Conference on Electronics, Circuits and Systems (ICECS) (Glasgow, United Kingdom) 24-26 October 2022
      pp.4 ISBN:9781665488235 DOI:10.1109/ICECS202256217.2022.9970849

  11. Evaluating the impact of Permanent Faults in a GPU running a Deep Neural Network
      proceeding
      

      Juan-David, Guerrero-Balaguera; Galasso, Luigi; LIMAS SIERRA, ROBERT ALEXANDER; Ernesto, Sanchez; SONZA REORDA, Matteo
      In: 2022 {IEEE} International Test Conference in Asia ({ITC}-Asia)
      IEEE
      2022 {IEEE} International Test Conference in Asia ({ITC}-Asia) (Taipei (Taiwan)) 24-26 August 2022
      pp.6 (pp.96-101) ISBN:9781665455237 DOI:10.1109/itcasia55616.2022.00027

  12. Real-time sleep prediction using a virtual sensor to estimate Heart Rate Variability (HRV) through Respiratory Rate (RR)
      proceeding
      

      Pugliese, Luigi; Violante, Massimo; Groppo, Sara
      In: 2022 IEEE 16th International Conference on Application of Information and Communication Technologies (AICT)
      IEEE
      16th International Conference on Application of Information and Communication Technologies (AICT) (Washington DC (USA)) 12-14 October 2022
      pp.4 (pp.1-4) ISBN:9781665451628 DOI:10.1109/AICT55583.2022.10013549

  13. Effective fault simulation of GPU’s permanent faults for reliability estimation of CNNs
      proceeding
      

      Guerrero-Balaguera, Juan-David; Sierra, Robert Limas; Reorda, Matteo Sonza
      In: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)
      IEEE
      2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) (Torino) 12-14 September 2022
      pp.6 (pp.1-6) ISBN:9781665473552 DOI:10.1109/IOLTS56730.2022.9897823

  14. Implementation of Control Flow Checking—A New Perspective Adopting Model-Based Software Design
      articolo
      

      Amel Solouki, Mohammadreza; Sini, Jacopo; Violante, Massimo
      ELECTRONICS
      MDPI
      Vol.11 pp.16 ISSN:2079-9292 DOI:10.3390/electronics11193074

  15. Reliability assessment of FreeRTOS in Embedded Systems
      proceeding
      

      Bosio, A.; Rebaudengo, M.; Savino, A.
      In: 2022 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S)
      IEEE
      2022 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (Baltimore, MD (USA)) 27-30 June 2022
      pp.3 (pp.28-30) ISBN:9781665402606 DOI:10.1109/DSN-S54099.2022.00019

  16. Open-Set Recognition: an Inexpensive Strategy to Increase DNN Reliability
      proceeding
      

      Gavarini, Gabriele; Stucchi, Diego; Ruospo, Annachiara; Boracchi, Giacomo; Sanchez, Ernesto
      In: The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2022)
      IEEE
      The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2022) (Torino) September, 12th-14th 2022
      pp.7 ISBN:9781665473552 DOI:10.1109/IOLTS56730.2022.9897805

  17. A comparative overview of ATPG flows targeting traditional and cell-aware fault models
      proceeding
      

      Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza Reorda, Matteo
      In: Titolo volume non avvalorato
      Institute of Electrical and Electronics Engineers Inc.
      29th IEEE International Conference on Electronics Circuits and Systems (ICECS) (Glasgow) 24th - 26th October 2022
      pp.4 (pp.1-4) DOI:10.1109/ICECS202256217.2022.9971003

  18. Recent Trends and Perspectives on Defect-Oriented Testing
      proceeding
      

      Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; Gielen, G.; Gomez, J.; Grosso, M.; Guerriero, A. M.; Guglielminetti, I.; Hamdioui, S.; Insinga, G.; Mautone, N.; Mirabella, N.; Sartoni, S.; Sonza Reorda, M.; Ullmann, R.; Vanhooren, R.; Xama, N.; Wu, L.
      In: Titolo volume non avvalorato
      IEEE
      The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) (Torino (Italy)) 12-14 September 2022
      pp.10 DOI:10.1109/IOLTS56730.2022.9897647

  19. Social Influence Analysis (SIA) in Online Social Networks
      proceeding
      

      Leszkiewicz, Agata; Bucur, Doina; Grimme, Christian; Michalski, Radoslaw; Clever, Lena; Pohl, Janina; Rook, Jeroen; Bossek, Jakob; Preuss, Mike; Squillero, Giovanni; Quer, Stefano; Calabrese, Andrea; Iacca, Giovanni; Kizgin, Hatice; Trautmann, Heike
      In: Titolo volume non avvalorato
      Springer
      MISDOOM 2022 (Boise, Idaho (USA)) 11-12 October 2022
      pp.2 (pp.1-2)

  20. Test, Reliability and Functional Safety Trends for Automotive System-on-Chip
      proceeding
      

      Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De Sio, C.; Foscale, T.; Gavarini, G.; Guerrero, J.; Huch, M.; Iaria, G.; Kilian, T.; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.
      In: 2022 IEEE European Test Symposium (ETS)
      IEEE
      2022 IEEE European Test Symposium (ETS) (Barcelona (Spain)) 23-27 May 2022
      pp.10 (pp.1-10) ISBN:9781665467063 DOI:10.1109/ETS54262.2022.9810388

  21. Design and Mitigation techniques of Radiation induced SEEs on Open-Source Embedded Static RAMs
      capitolo
      

      Azimi, S.; De Sio, C.; Portaluri, A.; Sterpone, L.
      IFIP ADVANCES IN INFORMATION AND COMMUNICATION TECHNOLOGY
      VLSI-SoC: Technology Advancement on SoC Design
      Springer
      Vol.661 pp.19 (pp.135-153) ISSN:1868-4238 ISBN:9783031168185 DOI:10.1007/978-3-031-16818-5_7

  22. A Comparative Radiation Analysis of Reconfigurable Memory Technologies: FinFET versus Bulk CMOS
      articolo
      

      Azimi, S.; De Sio, C.; Portaluri, A.; Rizzieri, D.; Sterpone, L.
      MICROELECTRONICS RELIABILITY
      Elsevier
      Vol.138 pp.5 (pp.1-5) ISSN:0026-2714 DOI:10.1016/j.microrel.2022.114733

  23. On the Reliability of Real-time Operating System on Embedded Soft Processor for Space Applications
      proceeding
      

      Portaluri, Andrea; Azimi, Sarah; DE SIO, Corrado; Rizzieri, Daniele; Sterpone, Luca
      In: 35th GI/ITG International Conference on Architecture of Computing Systems
      Springer
      35th GI/ITG International Conference on Architecture of Computing Systems (Heilbronn (Germany)) September, 2022
      pp.13 (pp.181-193) ISBN:9783031218668 DOI:10.1007/978-3-031-21867-5_12

  24. Analysis and Mitigation of Soft-Errors on High Performance Embedded GPUs
      proceeding
      

      Sterpone, L.; Azimi, S.; De Sio, C.; Parisi, F.
      In: 21st IEEE International Symposium on Parallel and Distributed Computing
      IEEE
      21st IEEE International Symposium on Parallel and Distributed Computing (Basel (Switzerland)) 11-13 July 2022
      pp.8 (pp.91-98) DOI:10.1109/ISPDC55340.2022.00022

  25. Failure rate analysis of radiation tolerant design techniques on SRAM-based FPGAs
      articolo
      

      Vacca, Eleonora; Azimi, Sarah; Sterpone, Luca
      MICROELECTRONICS RELIABILITY
      Elsevier
      Vol.138 pp.6 ISSN:0026-2714 DOI:10.1016/j.microrel.2022.114778

  26. Soft Error Reliability Prediction of SRAM-based FPGA Designs
      proceeding
      

      Vacca, Eleonora; Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Sterpone, Luca; Merodio Codinachs, David; Poivey, Christian
      In: European Conference on Radiation and Its Effects on Components and Systems (RADECS)
      IEEE
      IEEE Radiation and its Effects on Components and Systems 2022 (Venice (ITA)) 03-07 October 2022
      pp.4 (pp.1-4) ISBN:9798350371239 DOI:10.1109/RADECS55911.2022.10412546

  27. Analysis of Proton-induced Single Event Effect in the On-Chip Memory of Embedded Processor
      proceeding
      

      DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca; Merodio Codinachs, David
      In: 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
      IEEE
      IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (Austin (USA)) October, 2022
      pp.6 (pp.1-6) DOI:10.1109/DFT56152.2022.9962341

  28. Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data
      proceeding
      

      Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
      In: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design
      IEEE
      IEEE International Symposium on On-Line Testing and Robust System 2022 (Torino) 12-14 September 2022
      pp.7 ISBN:9781665473552 DOI:10.1109/IOLTS56730.2022.9897769

  29. Using Formal Methods to Support the Development of STLs for GPUs
      proceeding
      

      Deligiannis, Nikolaos; Faller, Tobias; RODRIGUEZ CONDIA, JOSIE ESTEBAN; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo
      In: Proceedings of the 2022 IEEE 31st Asian Test Symposium
      IEEE
      Asian Test Symposium (ATS) (Taiwan) 21-24 November 2022
      pp.6 (pp.84-89) DOI:10.1109/ATS56056.2022.00027

  30. An innovative Strategy to Quickly Grade Functional Test Programs
      proceeding
      

      Angione, Francesco; Bernardi, Paolo; Calabrese, Andrea; Cardone, Lorenzo; Niccoletti, Alessandro; Piumatti, Davide; Quer, Stefano; Appello, Davide; Tancorre, Vincenzo; Ugioli, Roberto
      In: International Test Conference
      IEEE
      International Test Conference (Anaheim, CA (USA)) 23-30 September 2022
      pp.10 (pp.355-364) DOI:10.1109/ITC50671.2022.00044

  31. Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level
      proceeding
      

      Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; Tempesta, Claudia; SONZA REORDA, Matteo; Appello, Davide; Ugioli, Roberto; Tancorre, Vincenzo
      In: 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)s
      IEEE
      International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (Austin (USA)) 19-21 October 2022
      pp.6 DOI:10.1109/DFT56152.2022.9962338

  32. A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip
      proceeding
      

      Iaria, Giusy; Angione, Francesco; Bernardi, Paolo; SONZA REORDA, Matteo; Davide, Appello; Giuseppe, Garozzo; Vincenzo, Tancorre
      In: 2022 IEEE 23rd Latin American Test Symposium (LATS)
      IEEE Computer society
      Latin American Test Symposium (Montevideo (Uruguay)) 05-08 September 2022
      pp.6 DOI:10.1109/LATS57337.2022.9936975

  33. Use of Facial Expressions to Improve the Social Acceptance of Level 4 and 5 Automated Driving System Equipped Vehicles
      proceeding
      

      Marceddu, ANTONIO COSTANTINO; Sini, Jacopo; Montrucchio, Bartolomeo; Violante, Massimo
      In: 2022 International Conference on Software, Telecommunications and Computer Networks (SoftCOM)
      IEEE (STATI UNITI D'AMERICA)
      2022 International Conference on Software, Telecommunications and Computer Networks (SoftCOM) (Split (Croatia)) September 22-24 2022
      pp.3 (pp.1-3) ISBN:9789532901177 DOI:10.23919/SoftCOM55329.2022.9911303

  34. Proton-induced MBU Effects in Real-time Operating System on Embedded Soft Processor
      proceeding
      

      De Sio, Corrado; Azimi, Sarah; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David
      In: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS)
      IEEE
      IEEE Radiation and its Effects on Components and Systems 2022 (Venice (IT)) 03-07 October 2022
      pp.4 (pp.1-4) ISBN:9798350371239 DOI:10.1109/RADECS55911.2022.10412414

  35. Radiation-induced Effects on DMA Data Transfer in Reconfigurable Devices
      proceeding
      

      Portaluri, Andrea; Azimi, Sarah; De Sio, Corrado; Sterpone, Luca; Merodio Codinachs, David
      In: IEEE International Symposium on On-Line Testing and Robust System Design
      IEEE
      IEEE The 28th International Symposium on On-Line Testing and Robust System Design (IOLTS 2022) (Turin) 12-14 September 2022
      pp.7 (pp.1-7) DOI:10.1109/IOLTS56730.2022.9897262

  36. A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers
      articolo
      

      da Silva, Felipe Augusto; Cantoro, Riccardo; Hamdioui, Said; Sartoni, Sandro; Sauer, Christian; Sonza Reorda, Matteo
      ELECTRONICS
      MDPI
      Vol.11 pp.19 ISSN:2079-9292 DOI:10.3390/electronics11162481

  37. Reliability Assessment of Neural Networks in GPUs: A Framework For Permanent Faults Injections
      proceeding
      

      Guerrero-Balaguera, Juan-David; Galasso, Luigi; Sierra, Robert Limas; Reorda, Matteo Sonza
      In: 2022 IEEE 31st International Symposium on Industrial Electronics (ISIE)
      IEEE
      2022 IEEE 31st International Symposium on Industrial Electronics (ISIE)
      pp.4 (pp.959-962) ISBN:9781665482400 DOI:10.1109/ISIE51582.2022.9831549

  38. Improving the Fault Resilience of Neural Network Applications Through Security Mechanisms
      proceeding
      

      Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Traiola, Marcello; Valea, Emanuele
      In: Proceedings of the 2022 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)
      IEEE
      Dependable Systems and Networks 27-30 June 2022
      pp.2 (pp.23-24) DOI:10.1109/DSN-S54099.2022.00017

  39. Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries
      proceeding
      

      Cantoro, Riccardo; Garau, Francesco; Girard, Patrick; Kolahimahmoudi, Nima; Sartoni, Sandro; Reorda, Matteo Sonza; Virazel, Arnaud
      In: Titolo volume non avvalorato
      IEEE
      2022 IEEE European Test Symposium (Barcelona (SP)) 23-27 Maggio 2022
      pp.2 (pp.1-2) ISBN:9781665467063 DOI:10.1109/ETS54262.2022.9810392

  40. A New Method to Generate Software Test Libraries for In-Field GPU Testing Resorting to High-Level Languages
      proceeding
      

      Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo
      In: Proceedings of the IEEE VLSI Test Symposium
      IEEE Computer Society
      40th IEEE VLSI Test Symposium, VTS 2022 (San Diego (USA)) 25-27 April 2022
      pp.7 (pp.1-7) ISBN:9781665410601 DOI:10.1109/VTS52500.2021.9794225

  41. A Compaction Method for STLs for GPU in-field test
      proceeding
      

      Guerrero-Balaguera, Juan-David; Rodriguez Condia, J. E.; Sonza Reorda, M.
      In: Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022
      Institute of Electrical and Electronics Engineers Inc.
      2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022 (Antwerp (BE)) 14-23 March 2022
      pp.6 (pp.454-459) ISBN:9783981926361 DOI:10.23919/DATE54114.2022.9774597

  42. A Simulation-Based Approach to Aid Development of Software-Based Hardware Failure Detection and Mitigation Algorithms of a Mobile Robot System
      articolo
      

      Sini, Jacopo; Passarino, Andrea; Bonicelli, Stefano; Violante, Massimo
      SENSORS
      MDPI
      Vol.22 pp.24 ISSN:1424-8220 DOI:10.3390/s22134665

  43. Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries
      proceeding
      

      Cantoro, Riccardo; Garau, Francesco; Masante, Riccardo; Sartoni, Sandro; Singh, Virendra; Reorda, Matteo Sonza
      In: Titolo volume non avvalorato
      IEEE
      2022 IEEE 40th VLSI Test Symposium (VTS) (San Diego (USA)) 25-27 Aprile 2022
      pp.7 (pp.1-7) ISBN:9781665410601 DOI:10.1109/VTS52500.2021.9794219

  44. A Placement-Oriented Mitigation Technique for Single Event Effect in Monolithic 3D IC
      proceeding
      

      Azimi, Sarah; De Sio, Corrado; Sterpone, Luca
      In: IEEE International Conference on Synthesis, modeling, analysis and Simulation methods and applications to circuit design - SMACd 2022
      IEEE
      IEEE International Conference on Synthesis, modeling, analysis and Simulation methods and applications to circuit design - SMACD 2022 (Sardinia, Italy) June 2022
      pp.4 (pp.1-4) DOI:10.1109/SMACD55068.2022.9816235

  45. Design, Verification, Test, and In-Field Implications of Approximate Digital Integrated Circuits
      capitolo
      

      Bosio, Alberto; Di Carlo, Stefano; Girard, Patrick; Ruospo, Annachiara; Sanchez, Ernesto; Savino, Alessandro; Sekanina, Lukas; Traiola, Marcello; Vasicek, Zdenek; Virazel, Arnaud
      Approximate Computing Techniques From Component- to Application-Level
      Springer Nature
      pp.37 (pp.349-385) ISBN:9783030947040 DOI:10.1007/978-3-030-94705-7_12

  46. Layout-oriented Radiation Effects Mitigation in RISC-V Soft Processor
      proceeding
      

      Vacca, Eleonora; De Sio, Corrado; Azimi, Sarah
      In: 19th ACM International Conference on Computing Frontiers
      ACM
      19th ACM International Conference on Computing Frontiers 2022 (Torino) May 2022
      pp.6 (pp.215-220) DOI:10.1145/3528416.3530984

  47. Parallel Multithread Analysis of Extremely Large Simulation Traces
      articolo
      

      Appello, D.; Bernardi, Paolo; Calabrese, Andrea; Pollaccia, G.; Quer, Stefano; Tancorre, V.; Ugioli, R.
      IEEE ACCESS
      IEEE
      Vol.10 pp.18 (pp.56440-56457) ISSN:2169-3536 DOI:10.1109/ACCESS.2022.3177613

  48. Mask and respirator detection: analysis and potential solutions for a frequently ill-conditioned problem
      proceeding
      

      Marceddu, ANTONIO COSTANTINO; Ferrero, Renato; Montrucchio, Bartolomeo
      In: 2022 IEEE 46th Annual Computers, Software, and Applications Conference (COMPSAC)
      IEEE (STATI UNITI D'AMERICA)
      2022 IEEE 46th Annual Computers, Software, and Applications Conference (COMPSAC) (Online) 27 June - 1 July 2022
      pp.6 (pp.1056-1061) ISBN:9781665488105 DOI:10.1109/COMPSAC54236.2022.00165

  49. A novel SEU injection setup for Automotive SoC
      proceeding
      

      Iaria, G.; Foscale, T.; Bernardi, P.; Presicce, L.; Sonza Reorda, M.; Appello, D.; Tancorre, V.; Ugioli, R.
      In: Titolo volume non avvalorato
      IEEE
      2022 IEEE International Symposium on Industrial Electronics (Anchorage, AK (USA)) 01-03 June 2022
      pp.4 (pp.623-626) ISBN:9781665482400 DOI:10.1109/ISIE51582.2022.9831533

  50. An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip
      proceeding
      

      Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; SONZA REORDA, Matteo; Appello, Davide; Tancorre, Vincenzo; Ugioli, Roberto
      In: Titolo volume non avvalorato
      IEEE
      IEEE European Test Symposium (Barcelona (Spain)) 23-27 May 2022
      pp.6 (pp.1-6) ISBN:9781665467063 DOI:10.1109/ETS54262.2022.9810396

  51. Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip
      proceeding
      

      Bernardi, Paolo; Insinga, Giorgio; Paganini, Giovanni; Cantoro, Riccardo; Beer, Peter; Mautone, Nellina; Scaramuzza, Pierre; Carnevale, Giambattista; Coppetta, Matteo; Ullmann, Rudolf
      In: Titolo volume non avvalorato
      IEEE
      IEEE European Test Symposium (Barcelona (Spain)) 23-27 May 2022
      pp.6 (pp.1-6) ISBN:9781665467063 DOI:10.1109/ETS54262.2022.9810445

  52. A novel algorithm for detecting the drowsiness onset in real-time
      articolo
      

      Pugliese, L.; Violante, M.; Groppo, S.
      IEEE ACCESS
      IEEE Access
      Vol.10 pp.6 (pp.1-6) ISSN:2169-3536 DOI:10.1109/ACCESS.2022.3167708

  53. An Effective Method to Identify Microarchitectural Vulnerabilities in GPUs
      articolo
      

      Rodriguez Condia, Josie E.; Rech, Paolo; Fernandes dos Santos, Fernando; Carro, Luigi; Sonza Reorda, Matteo
      IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
      IEEE / Institute of Electrical and Electronics Engineers Incorporated
      Vol.22 pp.13 (pp.129-141) ISSN:1530-4388 DOI:10.1109/TDMR.2022.3166260

  54. Evaluating low-level software-based hardening techniques for configurable GPU architectures
      articolo
      

      Goncalves, Marcio M.; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo; Sterpone, Luca; Azambuja, Jose Rodrigo
      THE JOURNAL OF SUPERCOMPUTING
      Kluwer Academic Publishers
      Vol.78 pp.25 (pp.8081-8105) ISSN:0920-8542 DOI:10.1007/s11227-021-04154-z

  55. Public-Private Partnership: Evolutionary Algorithms as a Solution to Information Asymmetry
      proceeding
      

      Pellegrino, Simone; Rebuglio, Massimo; Squillero, Giovanni
      LECTURE NOTES IN ARTIFICIAL INTELLIGENCE
      In: International Conference on the Applications of Evolutionary Computation (Part of EvoStar)
      Springer
      EvoApplications 2022: Applications of Evolutionary Computation
      Vol.13224 pp.14 (pp.110-123) ISBN:9783031024610 DOI:10.1007/978-3-031-02462-7_8

  56. FPGA Qualification and Failure Rate Estimation Methodology for LHC Environments Using Benchmarks Test Circuits
      articolo
      

      Scialdone, A.; Ferraro, R.; Alía, R. G.; Sterpone, L.; Masi, S. Danzeca and A.
      IEEE TRANSACTIONS ON NUCLEAR SCIENCE
      IEEE
      Vol.69 pp.9 (pp.1633-1641) ISSN:0018-9499 DOI:10.1109/TNS.2022.3162037

  57. An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells
      articolo
      

      Mirabella, N.; Grosso, M.; Franchino, G.; Rinaudo, S.; Deretzis, I.; La Magna, A.; Reorda, M. S.
      ELECTRONICS
      MDPI
      Vol.11 pp.16 ISSN:2079-9292 DOI:10.3390/electronics11020203

  58. Automated Identification of Application-Dependent Safe Faults in Automotive Systems-on-a-Chips
      articolo
      

      Bagbaba, A. C.; da Silva, F. A.; Reorda, M. S.; Hamdioui, S.; Jenihhin, M.; Sauer, C.
      ELECTRONICS
      MDPI
      Vol.11 pp.26 ISSN:2079-9292 DOI:10.3390/electronics11030319

  59. A Novel Redundant Validation IoT System for Affective Learning Based on Facial Expressions and Biological Signals
      articolo
      

      Marceddu, Antonio Costantino; Pugliese, Luigi; Sini, Jacopo; Ramirez Espinosa, Gustavo; Amel Solouki, Mohammadreza; Chiavassa, Pietro; Giusto, Edoardo; Montrucchio, Bartolomeo; Violante, Massimo; De Pace, Francesco
      SENSORS
      MDPI
      Vol.22 pp.20 ISSN:1424-8220 DOI:10.3390/s22072773

  60. A Novel ISO 26262-Compliant Test Bench to Assess the Diagnostic Coverage of Software Hardening Techniques against Digital Components Random Hardware Failures
      articolo
      

      Sini, Jacopo; Violante, Massimo; Tronci, Fabrizio
      ELECTRONICS
      MDPI
      Vol.11 pp.14 ISSN:2079-9292 DOI:10.3390/electronics11060901

  61. FireNN: Neural Networks Reliability Evaluation on Hybrid Platforms
      articolo
      

      De Sio, C.; Azimi, S.; Sterpone, L.
      IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING
      IEEE Computer Society
      Vol.10 pp.15 (pp.549-563) ISSN:2168-6750 DOI:10.1109/TETC.2022.3152668

  62. Selective Hardening of Critical Neurons in Deep Neural Networks
      proceeding
      

      Ruospo, Annachiara; Gavarini, Gabriele; Bragaglia, Ilaria; Traiola, Marcello; Bosio, Alberto; Sanchez, Ernesto
      In: 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems – DDECS 2022
      IEEE
      25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems – DDECS 2022 (Prague, Czech Republic) April 6 – 8, 2022
      pp.6 (pp.136-141) DOI:10.1109/DDECS54261.2022.9770168

  63. Test, Reliability and Functional Safety trends for Automotive System-on-Chip
      proceeding
      

      Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; de Sio, C.; Foscale, T.; Gavarini, G.; Huch, M.; Kilian, T; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.
      In: Titolo volume non avvalorato
      IEEE
      IEEE European Test Symposium
      pp.3

  64. Predictable Features Elimination: An Unsupervised Approach to Feature Selection
      proceeding
      

      Barbiero, Pietro; Squillero, Giovanni; Tonda, Alberto
      LECTURE NOTES IN ARTIFICIAL INTELLIGENCE
      In: International Conference on Machine Learning, Optimization, and Data Science
      Springer
      LOD 2021: Machine Learning, Optimization, and Data Science
      Vol.13163 pp.14 (pp.399-412) ISBN:9783030954666 DOI:10.1007/978-3-030-95467-3_29

  65. A Virtual Sensor for Backlash in Robotic Manipulators
      articolo
      

      Giovannitti, Eliana; Nabavi, Sayyidshahab; Squillero, Giovanni; Tonda, Alberto
      JOURNAL OF INTELLIGENT MANUFACTURING
      Springer
      Vol.33 pp.17 (pp.1921-1937) ISSN:0956-5515 DOI:10.1007/s10845-022-01934-z

  66. Machine Learning for Hardware Security: Classifier-based Identification of Trojans in Pipelined Microprocessors
      articolo
      

      Damljanovic, Aleksa; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni
      APPLIED SOFT COMPUTING
      Elsevier
      Vol.116 pp.16 (pp.1-16) ISSN:1568-4946 DOI:10.1016/j.asoc.2021.108068

  67. A New Technique to Check the Correct Mounting of the Power Module Heatsinks
      articolo
      

      Quitadamo, Matteo Vincenzo; Piumatti, Davide; Raviola, Erica; Fiori, Franco; Sonza Reorda, Matteo
      MICROELECTRONICS RELIABILITY
      Elsevier
      Vol.128 pp.12 ISSN:0026-2714 DOI:10.1016/j.microrel.2021.114416

  68. Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks
      articolo
      

      Matana Luza, Lucas; Ruospo, Annachiara; Soderstrom, Daniel; Cazzaniga, Carlo; Kastriotou, Maria; Sanchez, Ernesto; Bosio, Alberto; Dilillo, Luigi
      IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING
      IEEE
      Vol.10 pp.16 (pp.1867-1882) ISSN:2168-6750 DOI:10.1109/TETC.2021.3116999

  69. An Automated Continuous Integration Multitest Platform for Automotive Systems
      articolo
      

      Du, Boyang; Azimi, Sarah; Moramarco, Annarita; Sabena, Davide; Parisi, Filippo; Sterpone, Luca
      IEEE SYSTEMS JOURNAL
      IEEE
      Vol.16 pp.12 (pp.2495-2506) ISSN:1932-8184 DOI:10.1109/JSYST.2021.3069548

  70. Analyzing In-Memory NoSQL Landscape
      articolo
      

      Hemmatpour, Masoud; Montrucchio, Bartolomeo; Rebaudengo, Maurizio; Sadoghi, Mohammad
      IEEE TRANSACTIONS ON KNOWLEDGE AND DATA ENGINEERING
      IEEE
      Vol.34 pp.16 (pp.1628-1643) ISSN:1041-4347 DOI:10.1109/TKDE.2020.3002908

  2021

  1. Sistema di iniezione con efficiente controllo in quantità iniettata
     brevetto
     

     Ferrari, Alessandro; Novara, Carlo; Violante, Massimo; Vento, Oscar; Zhang, Tantan
     N.102021000026006

  2. Tutorial: Silicon Systems for Wireless LAN
     proceeding
     

     Stamenkovic, Z.; Aziza, H.; Sanchez, E.; Bosio, A.
     In: 2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
     IEEE
     International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) 2021 (Vienna, Austria) 07-09 April 2021
     pp.2 (pp.157-158) ISBN:9781665435956 DOI:10.1109/DDECS52668.2021.9417056

  3. Modular Functional Testing: Targeting the Small Embedded Memories in GPUs
     capitolo
     

     Rodriguez Condia, Josie E.; Sonza Reorda, M.
     IFIP ADVANCES IN INFORMATION AND COMMUNICATION TECHNOLOGY
     VLSI-SoC: Design Trends. VLSI-SoC 2020
     Springer
     pp.29 (pp.205-233) ISSN:1868-4238 ISBN:9783030816407 DOI:10.1007/978-3-030-81641-4_10

  4. Revealing GPUs Vulnerabilities by Combining Register-Transfer and Software-Level Fault Injection
     proceeding
     

     Fernandes dos Santos, Fernando; Rodriguez Condia, Josie Esteban.; Carro, Luigi; Sonza Reorda, Matteo; Rech, Paolo
     In: Proceedings - 51st Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2021
     Institute of Electrical and Electronics Engineers Inc.
     51st Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2021 (twn) 2021
     pp.13 (pp.292-304) ISBN:9781665435727 DOI:10.1109/DSN48987.2021.00042

  5. Analysis of Single Event Effects on Embedded Processor
     articolo
     

     Azimi, Sarah; De Sio, Corrado; Rizzieri, Daniele; Sterpone, Luca
     ELECTRONICS
     MDPI
     Vol.10 pp.13 ISSN:2079-9292 DOI:10.3390/electronics10243160

  6. Novel Validation Techniques for Autonomous Vehicles
     tesi dottorato
     

     Sini, Jacopo
     Politecnico di Torino
     pp.312 (pp.1-312)

  7. Towards the Integration of Reliability and Security Mechanisms to Enhance the Fault Resilience of Neural Networks
     articolo
     

     Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Traiola, Marcello; Valea, Emanuele
     IEEE ACCESS
     Institute of Electrical and Electronics Engineers
     Vol.9 pp.15 (pp.155998-156012) ISSN:2169-3536 DOI:10.1109/ACCESS.2021.3129149

  8. System-Level Test: State of the Art and Challenges
     proceeding
     

     Appello, D.; Chen, H. H.; Sauer, M.; Polian, I.; Bernardi, P.; Reorda, M. S.
     In: 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design, IOLTS 2021
     Institute of Electrical and Electronics Engineers Inc.
     27th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2021 2021
     pp.7 (pp.1-7) ISBN:9781665433709 DOI:10.1109/IOLTS52814.2021.9486708

  9. Industrial best practice: cases of study by automotive chip- makers
     proceeding
     

     Abbati, L. Degli; Ullmann, R.; Paganini, G.; Coppetta, M.; Zaia, L.; Huard, V.; Montfort, O.; Cantoro, R.; Insinga, G.; Venini, F.; Calao, P.; Bernardi, P.
     In: Titolo volume non avvalorato
     IEEE
     2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) 06-08 October 2021
     pp.6 (pp.1-6) ISBN:9781665416092 DOI:10.1109/DFT52944.2021.9568350

  10. Scenarios of Electromobility. Cross ferilisation and Dissemination of Best Practices and Researches within EU Policies Webinar proceedings
      proceeding
      

      Bena, Francesca; Roccasalva, Giuseppe; LE GUILLOU, Pierrick; Lapietra, Maria; Massoner, Johan; Ordóñez, Dolores; Veronese, Maurizio; Cipollina, Diego; Felsberger, Mathias; Sorniotti, Aldo; Baranzini, Daniele; Mei Hua, Xu; Pistauer, Markus; Annoni, Marco; Violante, Massimo; Gropppo, Riccardo; Guglielmi, Paolo; BONI CASTAGNETTI, Federico; Šimić, Dragan; Munoz, Ines; Amditis, Angelos J.; Estivo, Giuseppe
      In: Scenarios of Electromobility
      Torino Urban Lab (ITALIA)
      Cross ferilisation and Dissemination of Best Practices and Researches within EU Policies Webinar proceedings (online) 28 maggio 2020
      pp.53 (pp.1-53) ISBN:9788861730106

  11. Innovative methods for Burn-In related Stress Metrics Computation
      proceeding
      

      Ruggeri, Walter; Bernardi, Paolo; Littardi, Stefano; Reorda, Matteo Sonza; Appello, Davide; Bertani, Claudia; Pollaccia, Giorgio; Tancorre, Vincenzo; Ugioli, Roberto
      In: Titolo volume non avvalorato
      IEEE
      16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) 28-30 June 2021
      pp.6 (pp.1-6) ISBN:9781665436540 DOI:10.1109/DTIS53253.2021.9505067

  12. Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis
      articolo
      

      Yang, Wei-Tao; Du, Xue-Cheng; Li, Yong-Hong; He, Chao-Hui; Guo, Gang; Shi, Shu-Ting; Cai, Li; Azimi, Sarah; De Sio, Corrado; Sterpone, Luca
      NUCLEAR SCIENCE AND TECHNIQUES
      Springer
      Vol.32 pp.10 ISSN:1001-8042 DOI:10.1007/s41365-021-00943-6

  13. Using Hardware Performance Counters to support in-field GPU Testing
      proceeding
      

      Juan-David, Guerrero-Balaguera; Rodriguez Condia, Josie E.; SONZA REORDA, Matteo
      In: 2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS)
      IEEE
      28th IEEE International Conference on Electronics Circuits and Systems (Dubai) 28 november-1 december 2021
      pp.4 (pp.1-4) ISBN:9781728182810 DOI:10.1109/ICECS53924.2021.9665511

  14. A Novel Compaction Approach for SBST Test Programs
      proceeding
      

      GUERRERO BALAGUERA, JUAN DAVID; RODRIGUEZ CONDIA, JOSIE ESTEBAN; SONZA REORDA, Matteo
      In: 2021 IEEE 30th Asian Test Symposium (ATS)
      IEEE
      Asian Test Symposium (Japan) 22-25 Nov. 2021
      pp.6 (pp.67-72) DOI:10.1109/ATS52891.2021.00024

  15. Mitigation of Automotive Control Modules Hardware Replacement-based Attacks Through Hardware Signature
      proceeding
      

      Oberti, Franco; Sanchez, Ernesto; Savino, Alessandro; Parisi, Filippo; Di Carlo, Stefano
      In: Proceedings of the 2021 51st Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S)
      IEEE (STATI UNITI D'AMERICA)
      51st Annual IEEE/IFIP International Conference on Dependable Systems and Networks 2021 (DSN2021) (Taipei, Taiwan) 21-24 June 2021
      pp.2 (pp.13-14) ISBN:9781665435666 DOI:10.1109/DSN-S52858.2021.00017

  16. TAURUM P2T: Advanced secure CAN-FD architecture for road vehicle
      proceeding
      

      Oberti, F.; Sanchez, E.; Savino, A.; Parisi, F.; Di Carlo, S.
      In: Proceedings - 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design, IOLTS 2021
      Institute of Electrical and Electronics Engineers Inc. (STATI UNITI D'AMERICA)
      27th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2021 (Torino, Italy) 28-30 June 2021
      pp.7 (pp.1-7) ISBN:9781665433709 DOI:10.1109/IOLTS52814.2021.9486688

  17. On the Evaluation of SEEs on Open-Source Embedded Static RAMs
      proceeding
      

      Azimi, Sarah; De Sio, Corrado; Sterpone, Luca
      In: 2021 IFIP/IEEE 29th International Conference on Very Large Scale Integration (VLSI-SoC)
      IEEE
      IEEE International Conference on Very Large Scale Integration (VLSI-SoC) 4-7 October 2021
      pp.6 (pp.1-6) DOI:10.1109/VLSI-SoC53125.2021.9606985

  18. Analysis of Radiation-induced Transient Errors on 7nm FinFET Technology
      articolo
      

      Azimi, Sarah; De Sio, Corrado; Sterpone, Luca
      MICROELECTRONICS RELIABILITY
      Elsevier
      Vol.126 pp.5 ISSN:0026-2714 DOI:10.1016/j.microrel.2021.114319

  19. SEU Evaluation of Hardened-by-Replication Software in RISC-V Soft Processor
      proceeding
      

      De Sio, Corrado; Azimi, Sarah; Portaluri, Andrea; Sterpone, Luca
      In: 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
      IEEE
      IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (Athens (GR)) 6-8 October 2019
      pp.6 (pp.1-6) DOI:10.1109/DFT52944.2021.9568342

  20. SEU Mitigation on SRAM-based FPGAs through Domains-based Isolation Design Flow
      proceeding
      

      Portaluri, Andrea; De Sio, Corrado; Azimi, Sarah; Sterpone, Luca
      In: 2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
      IEEE
      IEEE Radiation and its Effects on Components and Systems 2021 (Vienna (Austria)) 13-17 September 2021
      pp.4 ISBN:9781665437943 DOI:10.1109/RADECS53308.2021.9954492

  21. Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks
      proceeding
      

      Ruospo, Annachiara; Matana Luza, Lucas; Bosio, Alberto; Traiola, Marcello; Dilillo, Luigi; Ernesto, Sanchez
      In: 2021 IEEE 22nd Latin American Test Symposium (LATS)
      IEEE
      LATS 2021 : IEEE Latin-American Test Symposium (Punta del Este, Uruguay) Oct 27, 2021 - Oct 29, 2021
      pp.5 (pp.1-5) DOI:10.1109/LATS53581.2021.9651807

  22. A Suitability analysis of software based testing strategies for the on-line testing of artificial neural networks applications in embedded devices
      proceeding
      

      Ruospo, A.; Piumatti, D.; Floridia, A.; Sanchez, E.
      In: Proceedings - 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design, IOLTS 2021
      Institute of Electrical and Electronics Engineers Inc.
      27th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2021 (Torino, Italy) 2021
      pp.6 (pp.1-6) ISBN:9781665433709 DOI:10.1109/IOLTS52814.2021.9486704

  23. Effective SAT-based Solutions for Generating Functional Sequences Maximizing the Sustained Switching Activity in a Pipelined Processor
      proceeding
      

      Deligiannis, Nikolaos; Cantoro, Riccardo; Faller, Tobias; Paxian, Tobias; Becker, Bernd; SONZA REORDA, Matteo
      In: 2021 IEEE 30th Asian Test Symposium (ATS)
      IEEE
      Asian Test Symposium (ATS) 22-25 Nov. 2021
      pp.6 (pp.73-78) DOI:10.1109/ATS52891.2021.00025

  24. Detection of Contaminated Hazelnuts under UV Illumination
      proceeding
      

      Asnani, S.; Rebaudengo, M.; Montrucchio, B.
      In: ACM International Conference Proceeding Series
      Association for Computing Machinery
      4th International Conference on Image and Graphics Processing, ICIGP 2021 (chn) 2021
      pp.6 (pp.46-51) ISBN:9781450389105 DOI:10.1145/3447587.3447594

  25. Comparing different solutions for testing resistive defects in low-power SRAMs
      proceeding
      

      Mirabella, Nunzio; Grosso, Michelangelo; Franchino, Giovanna; Rinaudo, Salvatore; Deretzis, Ioannis; La Magna, Antonino; Sonza Reorda, Matteo
      In: 22nd IEEE Latin-American Test Symposium 2021
      Institute of Electrical and Electronics Engineers Inc.
      22nd IEEE Latin-American Test Symposium 2021 (Porto Alegre (Brazil)) 27th - 29th October 2021
      pp.6 (pp.1-6) DOI:10.1109/lats53581.2021.9651760

  26. Investigating data representation for efficient and reliable Convolutional Neural Networks
      articolo
      

      Ruospo, Annachiara; Sanchez, Ernesto; Traiola, Marcello; O’Connor, Ian; Bosio, Alberto
      MICROPROCESSORS AND MICROSYSTEMS
      Elsevier
      Vol.86 (104318) pp.14 ISSN:0141-9331 DOI:10.1016/j.micpro.2021.104318

  27. Smart techniques for flying-probe testing
      proceeding
      

      Calabrese, A.; Quer, S.; Squillero, G.
      In: Proceedings of the 16th International Conference on Software Technologies, ICSOFT 2021
      SciTePress
      16th International Conference on Software Technologies, ICSOFT 2021 2021
      pp.9 (pp.285-293) ISBN:9789897585234 DOI:10.5220/0010582302850293

  28. Exploiting Active Learning for Microcontroller Performance Prediction
      proceeding
      

      Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Martone, Raffaele; Schlichtmann, Ulf; Squillero, Giovanni
      In: 2021 IEEE European Test Symposium
      IEEE
      2021 IEEE European Test Symposium 24-28 May 2021
      pp.4 (pp.1-4) ISBN:9781665418492 DOI:10.1109/ETS50041.2021.9465472

  29. Maximizing the Switching Activity of Different Modules Within a Processor Core via Evolutionary Techniques
      proceeding
      

      Deligiannis, Nikolaos; Cantoro, Riccardo; Sonza Reorda, Matteo
      In: Proceedings of the 2021 24th Euromicro Conference on Digital System Design
      IEEE
      Digital System Design (DSD) 01-03 September 2021
      pp.6 (pp.535-540) ISBN:9781665427036 DOI:10.1109/DSD53832.2021.00086

  30. Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement
      proceeding
      

      Cantoro, Riccardo; Girard, Patrick; Masante, Riccardo; Sartoni, Sandro; Reorda, Matteo Sonza; Virazel, Arnaud
      In: Titolo volume non avvalorato
      IEEE
      2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) 28-30 June 2021
      pp.4 (pp.1-4) ISBN:9781665433709 DOI:10.1109/IOLTS52814.2021.9486711

  31. Protecting GPU's Microarchitectural Vulnerabilities via Effective Selective Hardening
      proceeding
      

      Rodriguez Condia, Josie Esteban; Rech, Paolo; Fernandes dos Santos, Fernando; Carro, Luigi; Sonza Reorda, Matteo
      In: Proceedings of the IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)
      IEEE
      2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) (Torino, Italy) 28-30 June 2021
      pp.7 (pp.1-7) ISBN:9781665433709 DOI:10.1109/IOLTS52814.2021.9486703

  32. A New Domains-based Isolation Design Flow for Reconfigurable SoCs
      proceeding
      

      Portaluri, Andrea; De Sio, Corrado; Azimi, Sarah; Sterpone, Luca
      In: IEEE International Symposium on On-Line Testing and robust System Design (IOLTS 2021)
      IEEE International Symposium on On-Line Testing and robust System Design
      IEEE International Symposium on On-Line Testing and robust System Design (IOLTS 2021)
      pp.7 (pp.1-7) DOI:10.1109/IOLTS52814.2021.9486687

  33. Special session: Operating systems under test: An overview of the significance of the operating system in the resiliency of the computing continuum
      proceeding
      

      Casseau, E.; Dobias, P.; Sinnen, O.; Rodrigues, G. S.; Kastensmidt, F.; Savino, A.; Di Carlo, S.; Rebaudengo, M.; Bosio, A.
      In: Proceedings of the 39th IEEE VLSI Test Symposium, VTS 2021
      IEEE Computer Society (STATI UNITI D'AMERICA)
      39th IEEE VLSI Test Symposium, VTS 2021 (San Diego, CA, USA) 2021
      Vol.2021- pp.10 (pp.1-10) ISBN:9781665419499 DOI:10.1109/VTS50974.2021.9441042

  34. An investigation on duty-cycle for particulate matter monitoring with light-scattering sensors
      proceeding
      

      Chiavassa, Pietro; Gandino, Filippo; Giusto, Edoardo
      In: 2021 6th International Conference on Smart and Sustainable Technologies (SpliTech)
      IEEE (STATI UNITI D'AMERICA)
      Splitech 2021 (Split/Bol (HR)) 8-11 Settembre 2021
      pp.6 (pp.1-6) DOI:10.23919/SpliTech52315.2021.9566363

  35. Frequency Analysis of Particulate Matter in Urban Environments under Low-cost Sensors
      proceeding
      

      RAMIREZ ESPINOSA, GUSTAVO ADOLFO; Montrucchio, Bartolomeo; Gandino, Filippo; Rebaudengo, Maurizio
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      2021 International Conference on Computer Communication and Artificial Intelligence ({CCAI}) (Guangzhou, China) 7-9 May 2021
      pp.9 (pp.97-105) ISBN:9781728194011 DOI:10.1109/ccai50917.2021.9447517

  36. Low-cost PM Sensor Behaviour Based on Duty-Cycle Analysis
      proceeding
      

      RAMIREZ ESPINOSA, GUSTAVO ADOLFO; Montrucchio, Bartolomeo; Giusto, Edoardo; Rebaudengo, Maurizio
      In: 2021 26th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA )
      IEEE (STATI UNITI D'AMERICA)
      ETFA 2021 - 26th Conference on Emerging Technologies and Factory Automation (Västerås (SE)) 7-10 Settembre 2021
      pp.8 (pp.1-8) DOI:10.1109/ETFA45728.2021.9613651

  37. Combining architectural simulation and software fault injection for a fast and accurate CNNs reliability evaluation on GPUs
      proceeding
      

      Rodriguez Condia, Josie E.; Fernandes dos Santos, Fernando.; Sonza Reorda, Matteo; Rech, P.
      In: Proceedings of the IEEE VLSI Test Symposium
      IEEE Computer Society
      39th IEEE VLSI Test Symposium, VTS 2021 (usa) 2021
      Vol.2021- pp.7 (pp.1-7) ISBN:9781665419499 DOI:10.1109/VTS50974.2021.9441044

  38. On the Reliability Assessment of Artificial Neural Networks Running on AI-Oriented MPSoCs
      articolo
      

      Ruospo, Annachiara; Ernesto, Sanchez
      APPLIED SCIENCES
      MPDI
      Vol.11 pp.27 ISSN:2076-3417 DOI:10.3390/app11146455

  39. A Neutron Generator Testing Platform for the Radiation Analysis of SRAM-based FPGAs
      proceeding
      

      Bozzoli, L.; De Sio, C.; Du, B.; Sterpone, L.
      In: 2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
      IEEE (STATI UNITI D'AMERICA)
      IEEE International Instrumentation and Measurement Technology Conference (I2MTC) (Glasgow, United Kingdom) 17-20 May 2021
      pp.5 (pp.1-5) ISBN:9781728195391 DOI:10.1109/I2MTC50364.2021.9459804

  40. Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures
      proceeding
      

      Appello, D.; Bernardi, P.; Calabrese, A.; Littardi, S.; Pollaccia, G.; Quer, S.; Tancorre, V.; Ugioli, R.
      In: Proceedings - 2021 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2021
      Institute of Electrical and Electronics Engineers Inc. (STATI UNITI D'AMERICA)
      24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2021 (aut) 2021
      pp.6 (pp.69-74) ISBN:9781665435956 DOI:10.1109/DDECS52668.2021.9417048

  41. A Radiation-Hardened CMOS Full-Adder Based on Layout Selective Transistor Duplication
      articolo
      

      Azimi, Sarah; De Sio, Corrado; Sterpone, Luca
      IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
      IEEE
      Vol.29 pp.5 (pp.1596-1600) ISSN:1063-8210 DOI:10.1109/TVLSI.2021.3086897

  42. New Techniques for the Automatic Identification of Uncontrollable Lines in a CPU Core
      proceeding
      

      Deligiannis, Nikolaos; Cantoro, Riccardo; Sauer, Matthias; Becker, Bernd; Reorda, Matteo Sonza
      In: Proceedings of the 2021 IEEE 39th VLSI Test Symposium (VTS)
      IEEE
      2021 IEEE 39th VLSI Test Symposium (VTS) 25-28 April 2021
      pp.7 (pp.1-7) ISBN:9781665419499 DOI:10.1109/VTS50974.2021.9441040

  43. A Model-Based Framework to Assess the Reliability of Safety-Critical Applications
      proceeding
      

      Matana Luza, Lucas; Ruospo, Annachiara; Bosio, Alberto; Ernesto, Sanchez; Dilillo, Luigi
      In: Titolo volume non avvalorato
      IEEE
      2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) (Vienna, Austria) 7-9 April 2021
      pp.4 (pp.41-44) ISBN:9781665435956 DOI:10.1109/DDECS52668.2021.9417059

  44. On the Functional Test of Special Function Units in GPUs
      proceeding
      

      Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Reorda, Matteo Sonza
      In: Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems (DDECS)
      IEEE (AUSTRIA)
      2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) (Vienna) April 7-9, 2021
      pp.6 (pp.81-86) ISBN:9781665435956 DOI:10.1109/DDECS52668.2021.9417025

  45. Exploiting Artificial Swarms for the Virtual Measurement of Backlash in Industrial Robots
      proceeding
      

      Squillero, Giovanni; Giovannitti, Eliana; Tonda, Alberto; Nabavi, Sayyidshahab
      In: 2021 IEEE Congress on Evolutionary Computation (CEC)
      IEEE
      IEEE Congress on Evolutionary Computation 2021 (Kraków, Poland) 28 June 2021 - 01 July 2021
      pp.8 (pp.1743-1750) ISBN:9781728183923 DOI:10.1109/CEC45853.2021.9504962

  46. Reliability assessment on 16 nm ultrascale+ MPSoC using fault injection and fault tree analysis
      articolo
      

      Yang, Weitao; Du, Boyang; He, Chaohui; Sterpone, Luca
      MICROELECTRONICS RELIABILITY
      Elsevier
      Vol.120 (114122) pp.8 ISSN:0026-2714 DOI:10.1016/j.microrel.2021.114122

  47. Ways to Wear a Mask or a Respirator (WWMR-DB)
      altro
      

      Marceddu, ANTONIO COSTANTINO; Ferrero, Renato; Montrucchio, Bartolomeo
      DOI:10.21227/8atn-gn55

  48. A Benchmark Suite of RT-level Hardware Trojansfor Pipelined Microprocessor Cores
      proceeding
      

      Damljanovic, Aleksa; Ruospo, Annachiara; Sanchez Sanchez, Ernesto; Squillero, Giovanni
      In: Proceedings of the 24th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems
      IEEE
      24th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) (Vienna, Austria) April 7-9
      

  49. DYRE: a DYnamic REconfigurable solution to increase GPGPU's reliability
      articolo
      

      Rodriguez Condia, Josie E.; Narducci, Pierpaolo; Sonza Reorda, Matteo; Sterpone, Luca
      THE JOURNAL OF SUPERCOMPUTING
      Springer
      Vol.77 pp.18 (pp.11625-11642) ISSN:0920-8542 DOI:10.1007/s11227-021-03751-2

  50. A novel approach to improve the social acceptance of autonomous driving vehicles by recognizing the emotions of passengers
      proceeding
      

      Marceddu, Antonio Costantino; Sini, Jacopo; Violante, Massimo; Montrucchio, Bartolomeo
      PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
      In: PROCEEDINGS VOLUME 11605
      SPIE (STATI UNITI D'AMERICA)
      Thirteenth International Conference on Machine Vision (Rome (IT)) 2 - 6 November 2020
      pp.9 (pp.1-9) ISSN:0277-786X ISBN:9781510640405 DOI:10.1117/12.2586417

  51. A 3-D LUT Design for Transient Error Detection Via Inter-Tier In-Silicon Radiation Sensor
      proceeding
      

      Azimi, Sarah; DE SIO, Corrado; Sterpone, Luca
      In: Design, Automation and Test in Europe Conference (DATE2021)
      IEEE
      Design, Automation and Test in Europe Conference (DATE2021) 01-05 February 2021
      pp.6 (pp.252-257) DOI:10.23919/DATE51398.2021.9473944

  52. Automatic Detection and Prediction of the Transition Between the Behavioural States of a Subject Through a Wearable CPS
      capitolo
      

      Groppo, Sara; Armengaud, Eric; Pugliese, Luigi; Violante, Massimo; Garramone, Luciano
      LECTURE NOTES IN MOBILITY
      Intelligent System Solutions for Auto Mobility and Beyond
      Springer, Cham
      pp.9 (pp.177-185) ISSN:2196-5544 ISBN:9783030658700 DOI:10.1007/978-3-030-65871-7_13

  53. A fuzzy control system for energy efficient wireless devices in the Internet of Vehicles
      articolo
      

      Collotta, Mario; Ferrero, Renato; Giusto, Edoardo; GHAZI VAKILI, Mohammad; Grecuccio, Jacopo; Kong, Xiangjie; You, Ilsun
      INTERNATIONAL JOURNAL OF INTELLIGENT SYSTEMS
      John Wiley and Sons
      Vol.36 pp.24 (pp.1595-1618) ISSN:1098-111X DOI:10.1002/int.22353

  54. A JTAG-based Fault Emulation Platform for Dependability Analyses of Processor-based ASICs
      proceeding
      

      Floridia, Andrea; Sanchez Sanchez, Ernesto
      In: 2021 IEEE 12th Latin America Symposium on Circuits and System (LASCAS)
      IEEE
      12th IEEE Latin America Symposium on Circuits and System (Arequipa (Perú)) February 21-25, 2021
      Vol.2021 12th IEEE Latin America Symposium on Circuits and System pp.4 (pp.1-4) DOI:10.1109/LASCAS51355.2021.9459158

  55. Discovering Hierarchical Neural Archetype Sets
      capitolo
      

      Ciravegna, Gabriele; Barbiero, Pietro; Cirrincione, Giansalvo; Squillero, Giovanni; Tonda, Alberto
      SMART INNOVATION, SYSTEMS AND TECHNOLOGIES
      Progresses in Artificial Intelligence and Neural Systems
      Springer
      Vol.184 pp.13 (pp.255-267) ISSN:2190-3018 ISBN:9789811550928 DOI:10.1007/978-981-15-5093-5_24

  56. Assessing the effectiveness of different test approaches for power devices in a PCB
      articolo
      

      Piumatti, Davide; Borlo, Stefano; Reorda, Matteo Sonza; Bojoi, Radu
      IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS
      IEEE
      Vol.9 pp.15 (pp.3671-3685) ISSN:2168-6777 DOI:10.1109/JESTPE.2020.3013229

  57. Passengers’ Emotions Recognition to Improve Social Acceptance of Autonomous Driving Vehicles
      capitolo
      

      Sini, Jacopo; Marceddu, Antonio Costantino; Violante, Massimo; Dessì, Riccardo
      SMART INNOVATION, SYSTEMS AND TECHNOLOGIES
      Progresses in Artificial Intelligence and Neural Systems
      Springer
      Vol.184 pp.8 (pp.25-32) ISSN:2190-3018 ISBN:9789811550928 DOI:10.1007/978-981-15-5093-5_3

  2020

  1. Verification
     capitolo
     

     Ernesto, Sanchez
     Silicon Systems for Wireless LAN
     Worlds Scientific
     Vol.22 pp.30 (pp.311-340) ISBN:9789811210723

  2. Guest Editor's Introduction: Special Section on High Dependability Systems
     editoriale
     

     Metra, Cecilia; Reorda, Matteo Sonza
     IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING
     IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
     Vol.8 pp.2 (pp.416-417) ISSN:2168-6750 DOI:10.1109/TETC.2020.2995450

  3. Novel Validation Techniques for Autonomous Vehicles
     tesi dottorato
     

     Sini, Jacopo
     pp.310

  4. Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures
     proceeding
     

     Calabrese, A.; Bernardi, P.; Littardi, S.; Quer, S.
     In: Proceeding of the International Test Conference 2020
     IEEE
     International Test Conference 2020 (ITC2020) 3-5 November 2020
     pp.1

  5. Machine Learning based Performance Prediction of Microcontrollers using Speed Monitors
     proceeding
     

     Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Martone, Raffaele; Schlichtmann, Ulf; Squillero, Giovanni
     In: IEEE International Test Conference
     IEEE
     IEEE International Test Conference (Washington, DC, USA) 1-6 Nov. 2020
     pp.5 (pp.1-5) ISBN:9781728191133 DOI:10.1109/ITC44778.2020.9325253

  6. Exploring the Mysteries of System-Level Test
     proceeding
     

     Polian, I.; Anders, J.; Becker, S.; Bernardi, P.; Chakrabarty, K.; Elhamawy, N.; Sauer, M.; Singh, A.; Reorda, M. S.; Wagner, S.
     In: Proceedings of the Asian Test Symposium
     IEEE Computer Society
     29th IEEE Asian Test Symposium, ATS 2020 (mys) 2020
     pp.6 (pp.1-6) ISBN:9781728174679 DOI:10.1109/ATS49688.2020.9301557

  7. Design and Verification of an open-source SFU model for GPGPUs
     proceeding
     

     Rodriguez Condia Josie, Esteban.; Guerrero-Balaguera, Juan-David; Moreno-Manrique, C. -F.; Reorda, M. S.
     In: Proceedings of the Biennial Baltic Electronics Conference, BEC
     IEEE Computer Society
     17th Biennial Baltic Electronics Conference, BEC 2020 (Tallin (Est)) 2020
     pp.6 (pp.1-6) ISBN:9781728194448 DOI:10.1109/BEC49624.2020.9276748

  8. Testing the Divergence Stack Memory on GPGPUs: A Modular in-Field Test Strategy
     proceeding
     

     Rodriguez Condia, Josie Esteban; Sonza Reorda, M.
     In: IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC
     IEEE Computer Society
     28th IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SOC 2020 (usa) 5-7 Oct. 2020
     pp.6 (pp.153-158) ISBN:9781728154091 DOI:10.1109/VLSI-SOC46417.2020.9344088

  9. New Perspectives on Core In-field Path Delay Test
     proceeding
     

     Cantoro, Riccardo; Foti, Dario; Sartoni, Sandro; Sonza Reorda, Matteo; Anghel, Lorena; Portolan, Michele
     In: Titolo volume non avvalorato
     IEEE
     2020 IEEE International Test Conference (ITC) (Washington DC (USA)) 01-06 November 2020
     pp.5 (pp.1-5) ISBN:9781728191133 DOI:10.1109/ITC44778.2020.9325260

  10. Digital Design Techniques for Dependable High Performance Computing
      proceeding
      

      Azimi, Sarah; Sterpone, Luca
      In: IEEE International Test Conference (ITC)
      IEEE
      IEEE International Test Conference (ITC 2020) 2020
      pp.10 (pp.1-10) ISBN:9781728191133 DOI:10.1109/ITC44778.2020.9325281

  11. A Densely-Deployed, High Sampling Rate, Open-Source Air Pollution Monitoring WSN
      altro
      

      Montrucchio, Bartolomeo; Giusto, Edoardo; GHAZI VAKILI, Mohammad; Quer, Stefano; Ferrero, Renato; Fornaro, Claudio
      DOI:10.21227/m4pb-g538

  12. Internet of things: Hardware and software solutions
      editoriale
      

      Solic, P.; Perkovic, T.; Ferrero, R.; Patrono, L.; Barachi, M. E.
      JOURNAL OF COMMUNICATION SOFTWARE AND SYSTEMS
      Croatian Communications and Information Society
      Vol.16 pp.2 (pp.105-106) ISSN:1845-6421 DOI:10.24138/jcomss.v16i2.1106

  13. On the Analysis of Real-time Operating System Reliability in Embedded Systems
      proceeding
      

      Mamone, Dario; Bosio, Alberto; Savino, Alessandro; Hamdioui, Said; Rebaudengo, Maurizio
      In: 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
      Institute of Electrical and Electronics Engineers Inc. (STATI UNITI D'AMERICA)
      33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (Frascati, Italy, Italy) 19-21 Oct. 2020
      pp.6 (pp.1-6) ISBN:9781728194578 DOI:10.1109/DFT50435.2020.9250861

  14. Design, Verification, Test and In-Field Implications of Approximate Computing Systems
      proceeding
      

      Bosio, A.; Di Carlo, S.; Girard, P.; Sanchez, E.; Savino, A.; Sekanina, L.; Traiola, M.; Vasicek, Z.; Virazel, A.
      In: Proceedings of 2020 IEEE European Test Symposium (ETS)
      Institute of Electrical and Electronics Engineers Inc. (STATI UNITI D'AMERICA)
      2020 IEEE European Test Symposium (ETS) (Tallinn, Estonia, Estonia) 25-29 May 2020
      pp.10 (pp.1-10) ISBN:9781728143125 DOI:10.1109/ETS48528.2020.9131557

  15. Evaluating Data Encryption Effects on the Resilience of an Artificial Neural Network
      proceeding
      

      Cantoro, Riccardo; Deligiannis, Nikolaos; Reorda, Matteo Sonza; Traiola, Marcello; Valea, Emanuele
      In: 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
      IEEE
      2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
      pp.4 (pp.1-4) ISBN:9781728194578 DOI:10.1109/DFT50435.2020.9250869

  16. Design techniques to improve the resilience of computing systems: software layer
      capitolo
      

      Bosio, Alberto; Di Carlo, Stefano; Di Natale, Giorgio; Sonza Reorda, Matteo; Rodriguez Condia, Josie E.
      Cross-Layer Reliability of Computing Systems
      IET - the institution of engineering and technology (STATI UNITI D'AMERICA)
      pp.18 (pp.95-112) ISBN:9781785617980 DOI:10.1049/PBCS057E_ch4

  17. Improving GPU register file reliability with a comprehensive ISA extension
      articolo
      

      Gonçalves, M. M.; Rodriguez Condia, Josie E.; Reorda, M. Sonza; Sterpone, L.; Azambuja, J. R.
      MICROELECTRONICS RELIABILITY
      Elsevier
      Vol.114 pp.9 ISSN:0026-2714 DOI:10.1016/j.microrel.2020.113768

  18. An efficient strategy for the development of software test libraries for an automotive microcontroller family
      articolo
      

      Piumatti, D.; Sanchez, E.; Bernardi, P.; Martorana, R.; Pernice, M. A.
      MICROELECTRONICS RELIABILITY
      Elsevier
      Vol.115 (113962) pp.21 ISSN:0026-2714 DOI:10.1016/j.microrel.2020.113962

  19. A Densely-Deployed, High Sampling Rate, Open-Source Air Pollution Monitoring WSN
      articolo
      

      Montrucchio, Bartolomeo; Giusto, Edoardo; GHAZI VAKILI, Mohammad; Quer, Stefano; Ferrero, Renato; Fornaro, Claudio
      IEEE TRANSACTIONS ON VEHICULAR TECHNOLOGY
      IEEE
      Vol.69 pp.15 (pp.15786-15799) ISSN:0018-9545 DOI:10.1109/TVT.2020.3035554

  20. Multilevel Simulation Methodology for FMECA Study Applied to a Complex Cyber-Physical System
      articolo
      

      Piumatti, Davide; Sini, Jacopo; Borlo, Stefano; Sonza Reorda, Matteo; Bojoi, Radu; Violante, Massimo
      ELECTRONICS
      MDPI
      Vol.9 pp.21 ISSN:2079-9292 DOI:10.3390/electronics9101736

  21. Machine Learning Clustering Techniques for Selective Mitigation of Critical Design Features
      proceeding
      

      Lange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca
      In: 2020 IEEE 26th International Symposium on On-Line Testing And Robust System Design (IOLTS)
      IEEE
      26th International Symposium on On-Line Testing And Robust System Design (IOLTS) (Naples (Italy)) 13-15 July 2020
      pp.7 (pp.1-7) ISBN:9781728181875 DOI:10.1109/IOLTS50870.2020.9159751

  22. Electron inducing soft errors in 28 nm system-on-Chip
      articolo
      

      Yang, W.; Li, Y.; Zhang, W.; Guo, Y.; Zhao, H.; Wei, J.; Li, Y.; He, C.; Chen, K.; Guo, G.; Du, B.; Sterpone, L.
      RADIATION EFFECTS AND DEFECTS IN SOLIDS
      Taylor and Francis
      Vol.175 pp.10 (pp.745-754) ISSN:1042-0150 DOI:10.1080/10420150.2020.1759067

  23. A Pipelined Multi-Level Fault Injector for Deep Neural Networks
      proceeding
      

      Ruospo, Annachiara; Balaara, Angelo; Bosio, Alberto; Ernesto, Sanchez
      In: IEEE
      IEEE
      IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (ESA-ESRIN, Frascati (Rome) Italy) October 19 – October 21, 2020
      DOI:10.1109/DFT50435.2020.9250866

  24. Evaluating Convolutional Neural Networks Reliability depending on their Data Representation
      proceeding
      

      Ruospo, Annachiara; Bosio, Alberto; Ianne, Alessandro; Ernesto, Sanchez
      In: IEEE
      IEEE
      Euromicro Conference on Digital System Design (DSD) 2020 (Kranj, Slovenia (virtual event)) August 26 – 28, 2020
      pp.8 (pp.672-679) DOI:10.1109/DSD51259.2020.00109

  25. Simulation and Formal: The Best of Both Domains for Instruction Set Verification of RISC-V Based Processors
      proceeding
      

      Duran, Ckristian; Morales, Hanssel; Rojas, Camilo; Ruospo, Annachiara; Ernesto, Sanchez; Roa, Elkim
      In: 2020 IEEE International Symposium on Circuits and Systems (ISCAS)
      IEEE (STATI UNITI D'AMERICA)
      IEEE International Symposium on Circuits and Systems (ISCAS) (Virtual Event) from October 10 to October 21 2020
      pp.4 DOI:10.1109/ISCAS45731.2020.9180589

  26. Special Session: AutoSoC - A Suite of Open-Source Automotive SoC Benchmarks
      proceeding
      

      Da Silva, F. A.; Cagri Bagbaba, A.; Ruospo, A.; Mariani, R.; Kanawati, G.; Sanchez, E.; Reorda, M. S.; Jenihhin, M.; Hamdioui, S.; Sauer, C.
      In: Proceedings of the IEEE VLSI Test Symposium
      IEEE Computer Society
      38th IEEE VLSI Test Symposium, VTS 2020 (usa) 2020
      Vol.2020- pp.9 (pp.1-9) ISBN:9781728153599 DOI:10.1109/VTS48691.2020.9107599

  27. On the Mitigation of Single Event Transient in 3D LUT by In-Cell Layout Resizing
      proceeding
      

      Azimi, Sarah; Du, Boyang; DE SIO, Corrado; Sterpone, Luca
      In: 2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
      IEEE
      European Conference on Radiation and its Effects on Components and Systems (RADECS) (Online event)
      pp.4 (pp.1-4) DOI:10.1109/RADECS50773.2020.9857719

  28. An Emulation Platform for Evaluating the Reliability of Deep Neural Networks
      proceeding
      

      DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca
      In: 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
      IEEE
      33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2020) (ita) 19-21 Oct. 2020
      pp.4 (pp.1-4) ISBN:9781728194578 DOI:10.1109/DFT50435.2020.9250872

  29. Theory and practice of population diversity in evolutionary computation
      proceeding
      

      Sudholt, D.; Squillero, G.
      In: GECCO 2020 Companion - Proceedings of the 2020 Genetic and Evolutionary Computation Conference Companion
      Association for Computing Machinery, Inc
      2020 Genetic and Evolutionary Computation Conference, GECCO 2020 (mex) 2020
      pp.18 (pp.975-992) ISBN:9781450371278 DOI:10.1145/3377929.3389892

  30. Evolutionary algorithms and machine learning: Synergies, Challenges and Opportunities
      proceeding
      

      Squillero, G.; Tonda, A.
      In: GECCO 2020 Companion - Proceedings of the 2020 Genetic and Evolutionary Computation Conference Companion
      Association for Computing Machinery, Inc
      2020 Genetic and Evolutionary Computation Conference, GECCO 2020 (mex) 2020
      pp.16 (pp.1190-1205) ISBN:9781450371278 DOI:10.1145/3377929.3389863

  31. Analyzing the Sensitivity of GPU Pipeline Registers to Single Events Upsets
      proceeding
      

      Rodriguez Condia, Josie E.; Goncalves, Marcio M.; Azambuja, Jose Rodrigo; Sonza Reorda, Matteo; Sterpone, Luca
      In: 2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) proceedings
      IEEE
      2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) (Limassol, Cyprus) 6-8 July 2020
      pp.6 (pp.380-385) ISBN:9781728157757 DOI:10.1109/ISVLSI49217.2020.00076

  32. On the testing of special memories in GPGPUs
      proceeding
      

      Rodriguez Condia, Josie E.; Reorda, Matteo Sonza
      In: 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) proceedings
      IEEE
      2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) (Napoli, Italy) 13-15 July 2020
      pp.6 (pp.1-6) ISBN:9781728181875 DOI:10.1109/IOLTS50870.2020.9159711

  33. On the Analysis of Radiation-induced Failures in the AXI Interconnect Module
      articolo
      

      De Sio, C.; Azimi, S.; Sterpone, L.
      MICROELECTRONICS RELIABILITY
      Elsevier
      Vol.114 (113733) pp.5 ISSN:0026-2714 DOI:10.1016/j.microrel.2020.113733

  34. On the evaluation of SEU effects on AXI interconnect within AP-SoCs
      proceeding
      

      De Sio, C.; Azimi, S.; Sterpone, L.
      LECTURE NOTES IN COMPUTER SCIENCE
      In: Architecture of Computing Systems – ARCS 2020
      Springer
      33rd International Conference on Architecture of Computing Systems, ARCS 2020 (Aachen (DEU)) May 25–28, 2020
      Vol.12155 pp.13 (pp.215-227) ISSN:0302-9743 ISBN:9783030527938 DOI:10.1007/978-3-030-52794-5_16

  35. In-Circuit Mitigation Approach of Single Event Transients for 45nm Flip-Flops
      proceeding
      

      Azimi, Sarah; De Sio, Corrado; Sterpone, Luca
      In: IEEE International Symposium on On-Line Testing and robust System Design
      IEEE International Symposium on On-Line Testing and robust System Design
      26th IEEE International Symposium on On-Line Testing and robust System Design (IOLT 2020) 13-15 July 2020
      pp.6 (pp.1-6) ISBN:9781728181875 DOI:10.1109/IOLTS50870.2020.9159738

  36. Transitory master key transport layer security for WSNs
      articolo
      

      Griotti, M.; Gandino, F.; Rebaudengo, M.
      IEEE ACCESS
      Institute of Electrical and Electronics Engineers
      Vol.8 pp.9 (pp.20304-20312) ISSN:2169-3536 DOI:10.1109/ACCESS.2020.2969050

  37. Combining Blockchain and IoT: food-chain traceability and beyond
      articolo
      

      Grecuccio, Jacopo; Giusto, Edoardo; Fiori, Fabio; Rebaudengo, Maurizio
      ENERGIES
      MDPI
      Vol.13 (3820) pp.20 ISSN:1996-1073 DOI:10.3390/en13153820

  38. Quantum Computing tutorial
      articolo
      

      Cirillo, GIOVANNI AMEDEO; Giusto, Edoardo; Gandino, Filippo; Mondo, Giovanni
      NOTIZIARIO TECNICO TELECOM ITALIA
      TIM S.p.A.
      Vol.n.2 - 2020 pp.20 (pp.58-77) ISSN:2038-1921

  39. On-line Self-test Mechanism for Dual-Core Lockstep System-on-Chips
      articolo
      

      Floridia, Andrea; Sanchez, Ernesto
      MICROELECTRONICS RELIABILITY
      Elsevier
      Vol.112 pp.10 (pp.1-10) ISSN:0026-2714 DOI:10.1016/j.microrel.2020.113770

  40. A New Single Event Transient Hardened Floating Gate Configurable Logic Circuit
      proceeding
      

      Azimi, Sarah; DE SIO, Corrado; Yang, Weitao; Sterpone, Luca
      In: 18th IEEE International NEWCAS
      IEEE International NEWCAS
      18th IEEE International NEWCAS (Montreal, Canada) June 16-19, 2020
      pp.4 (pp.311-314) DOI:10.1109/NEWCAS49341.2020.9159844

  41. A 3D Simulation-based Approach to Analyze Heavy Ions-induced SET on Digital Circuits
      articolo
      

      Sterpone, L.; Luoni, F.; Azimi, S.; Du, B.
      IEEE TRANSACTIONS ON NUCLEAR SCIENCE
      IEEE
      pp.9 ISSN:0018-9499 DOI:10.1109/TNS.2020.3006997

  42. Quantum Pliers Cutting the Blockchain
      articolo
      

      Giusto, Edoardo; GHAZI VAKILI, Mohammad; Gandino, Filippo; Demartini, CLAUDIO GIOVANNI; Montrucchio, Bartolomeo
      IT PROFESSIONAL
      IEEE
      Vol.22 pp.7 (pp.90-96) ISSN:1520-9202 DOI:10.1109/MITP.2020.2974690

  43. Evaluating the Code Encryption Effects on Memory Fault Resilience
      proceeding
      

      Cantoro, R.; Deligiannis, N.; Sonza Reorda, M.; Traiola, M.; Valea, E.
      In: Proceedings - 21st IEEE Latin-American Test Symposium, LATS 2020
      Institute of Electrical and Electronics Engineers Inc.
      21st IEEE Latin-American Test Symposium, LATS 2020 (Maceio, Brazil) 30 March-2 April 2020
      pp.6 (pp.1-6) ISBN:9781728187310 DOI:10.1109/LATS49555.2020.9093670

  44. Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs
      proceeding
      

      da Silva, Felipe Augusto; Bagbaba, Ahmet Cagri; Sartoni, Sandro; Cantoro, Riccardo; Reorda, Matteo Sonza; Hamdioui, Said; Sauer, Christian
      In: Proceedings - 2020 IEEE European Test Symposium (ETS)
      IEEE
      2020 IEEE European Test Symposium (ETS) (Tallinn, Estonia) 25-29 May 2020
      pp.6 (pp.1-6) ISBN:9781728143125 DOI:10.1109/ETS48528.2020.9131568

  45. Smart management energy systems in industry 4.0
      editoriale
      

      Ferrero, Renato; Collotta, Mario; Victoria Bueno-Delgado, Maria; Chen, Hsing-Chung
      ENERGIES
      MDPI
      Vol.13 pp.3 (pp.1-3) ISSN:1996-1073 DOI:10.3390/en13020382

  46. Deterministic Cache-based Execution of On-line Self-Test Routines in Multi-core Automotive System-on-Chips
      proceeding
      

      Floridia, Andrea; Carmona, Tzamn Melendez; Piumatti, Davide; Ruospo, Annachiara; Sanchez, Ernesto; Luca, Sergio De; Martorana, Rosario; Pernice, Mose Alessandro
      In: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)
      IEEE
      2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) (Grenoble, France) 9-13 March, 2020
      pp.6 (pp.1235-1240) ISBN:9783981926347 DOI:10.23919/DATE48585.2020.9116239

  47. Electro-Mobility-as-a-Service (eMaaS) in the EU funded STEVE Project experience
      proceeding
      

      Baranzini, Daniele; Trojaniello, Diana; Groppo, Riccardo; Annoni, Marco; Violante, Massimo; Tavernini, Davide; Ordonez, Dolores; Bena, Francesca; Roccasalva, Giuseppe; Sanna, Alberto; Massoner, Johann; Reisinger, Jochen
      TRAFICOMIN TUTKIMUKSIA JA SELVITYKSIÄ
      In: Proceedings of TRA2020, the 8th Transport Research Arena: Rethinking transport – towards clean and inclusive mobility
      Toni Lusikka, (ed.) Finnish Transport and Communications Agency Traficom (FINLANDIA)
      TRA Transport Research Arena - Helsinki 2020 (Helsinki)
      Vol.Traficom Research Reports 7/2020 pp.2 (pp.52-53) ISSN:2669-8781 ISBN:9789523114845

  48. Test Solution for Heatsinks in Power Electronics Applications
      articolo
      

      Piumatti, Davide; Borlo, Stefano; Quitadamo, Matteo Vincenzo; Sonza Reorda, Matteo; Giacomo Armando, Eric; Fiori, Franco
      ELECTRONICS
      MDPI
      Vol.9 pp.15 (pp.1-15) ISSN:2079-9292 DOI:10.3390/electronics9061020

  49. In-field Functional Test of CAN Bus Controllers
      proceeding
      

      Cantoro, Riccardo; Sartoni, Sandro; Reorda, Matteo Sonza
      In: 2020 IEEE 38th VLSI Test Symposium (VTS)
      IEEE
      IEEE VLSI Test Symposium 2020
      pp.6 (pp.1-6) ISBN:9781728153599 DOI:10.1109/VTS48691.2020.9107628

  50. A dynamic reconfiguration mechanism to increase the reliability of GPGPUs
      proceeding
      

      Rodriguez Condia, Josie E.; Narducci, Pierpaolo; Reorda, M. Sonza; Sterpone, L.
      In: 2020 IEEE 38th VLSI Test Symposium (VTS) proceedings
      IEEE
      2020 IEEE 38th VLSI Test Symposium (VTS) (San Diego, USA) 5-8 April 2020
      pp.6 (pp.1-6) ISBN:9781728153599 DOI:10.1109/VTS48691.2020.9107572

  51. Towards Vehicle-Level Simulator Aided Failure Mode, Effect, and Diagnostic Analysis of Automotive Power Electronics Items
      proceeding
      

      Sini, J.; D'Auria, M.; Violante, Massimo.
      In: 2020 IEEE Latin-American Test Symposium (LATS)
      IEEE
      21st IEEE Latin-American Test Symposium, LATS 2020 (Maceio (Brazil)) 30 March-2 April 2020
      pp.6 (pp.1-6) ISBN:9781728187310 DOI:10.1109/LATS49555.2020.9093694

  52. A dynamic hardware redundancy mechanism for the in-field fault detection in cores of GPGPUs
      proceeding
      

      Rodriguez Condia, Josie E.; Narducci, Pierpaolo; Reorda, M. Sonza; Sterpone, L.
      In: 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) proceedings
      IEEE
      2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) (Novi Sad, Serbia, Serbia) 22-24 April 2020
      pp.6 (pp.1-6) ISBN:9781728199382 DOI:10.1109/DDECS50862.2020.9095665

  53. Evaluating Software-based Hardening Techniques for General-Purpose Registers on a GPGPU
      proceeding
      

      Goncalves, Marcio M.; Azambuja, Jose Rodrigo; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo; Sterpone, Luca
      In: 2020 IEEE Latin-American Test Symposium (LATS) Procedings
      IEEE
      2020 IEEE Latin-American Test Symposium (LATS) (Maceio, Brasil) 30 March-2 April 2020
      pp.6 (pp.1-6) ISBN:9781728187310 DOI:10.1109/LATS49555.2020.9093682

  54. Testing Heatsink Faults in Power Transistors by means of Thermal Model
      proceeding
      

      Piumatti, Davide; Quitadamo, Matteo Vincenzo; Reorda, Matteo Sonza; Fiori, Franco
      In: 21st IEEE Latin-American Test Symposium (LATS20)
      IEEE
      21st IEEE Latin-American Test Symposium (LATS20) (Jatiúca (Maceió), Brazil) 30th March - 2nd April 2020
      pp.6 (pp.1-6) ISBN:9781728187310 DOI:10.1109/LATS49555.2020.9093674

  55. The Maximum Common Subgraph Problem: A Parallel and Multi-Engine Approach
      articolo
      

      Quer, Stefano; Marcelli, Andrea; Squillero, Giovanni
      COMPUTATION
      MDPI
      Vol.8 pp.29 (pp.1-29) ISSN:2079-3197 DOI:10.3390/computation8020048

  56. A simulation-based methodology for aiding advanced driver assistance systems hazard analysis and risk assessment
      articolo
      

      Sini, Jacopo; Violante, Massimo
      MICROELECTRONICS RELIABILITY
      Elsevier
      Vol.109 pp.7 (pp.1-7) ISSN:0026-2714 DOI:10.1016/j.microrel.2020.113661

  57. An Optimized Frame-Driven Routing Algorithm for Reconfigurable SRAM-based FPGAs
      articolo
      

      Bozzoli, Ludovica; Sterpone, Luca
      IEEE ACCESS
      IEEE
      Vol.8 pp.13 (pp.116226-116238) ISSN:2169-3536 DOI:10.1109/ACCESS.2020.2978632

  58. Soft-Error Analysis of Self-reconfiguration Controllers for Safety Critical Dynamically Reconfigurable FPGAs
      proceeding
      

      Bozzoli, L.; Sterpone, L.
      LECTURE NOTES IN COMPUTER SCIENCE
      In: Applied Reconfigurable Computing. Architectures, Tools, and Applications : ARC 2020
      Springer
      16th International Symposium on Applied Reconfigurable Computing, ARC 2020 (Toledo (ESP)) April 1–3, 2020
      Vol.12083 pp.13 (pp.84-96) ISSN:1611-3349 ISBN:9783030445331 DOI:10.1007/978-3-030-44534-8_7

  59. FlexGripPlus: An improved GPGPU model to support reliability analysis
      articolo
      

      Rodriguez Condia, Josie E.; Du, Boyang; Sonza Reorda, Matteo; Sterpone, Luca
      MICROELECTRONICS RELIABILITY
      Elsevier
      Vol.109 pp.14 (pp.1-14) ISSN:0026-2714 DOI:10.1016/j.microrel.2020.113660

  60. Automatic Emotion Recognition for the Calibration of Autonomous Driving Functions
      articolo
      

      Sini, Jacopo; Marceddu, Antonio Costantino; Violante, Massimo
      ELECTRONICS
      MDPI
      Vol.9 pp.20 (pp.1-20) ISSN:2079-9292 DOI:10.3390/electronics9030518

  61. Generating Neural Archetypes to Instruct Fast and Interpretable Decisions
      proceeding
      

      Barbiero, Pietro; Ciravegna, Gabriele; Cirrincione, Giansalvo; Tonda, Alberto; Squillero, Giovanni
      ADVANCES IN INTELLIGENT SYSTEMS AND COMPUTING
      In: DECON 2019
      Springer
      The International Conference on Decision Economics
      Vol.1009 pp.8 (pp.45-52) ISSN:2194-5357 ISBN:9783030382261 DOI:10.1007/978-3-030-38227-8_6

  62. Faults Detection in the Heatsinks Mounted on Power Electronic Transistors
      articolo
      

      Quitadamo, Matteo V.; Piumatti, Davide; SONZA REORDA, Matteo; Fiori, Franco
      INTERNATIONAL JOURNAL OF ELECTRICAL AND ELECTRONIC ENGINEERING AND TELECOMMUNICATIONS
      International Journal of Electrical and Electronic Engineering & Telecommunications
      Vol.9 pp.7 (pp.206-212) ISSN:2319-2518 DOI:10.18178/ijeetc.9.4.206-212

  63. An on-line testing technique for the scheduler memory of a GPGPU
      articolo
      

      Di Carlo, Stefano; Condia, Josie E. Rodriguez; Reorda, Matteo Sonza
      IEEE ACCESS
      Institute of Electrical and Electronics Engineers
      Vol.8 pp.20 (pp.16893-16912) ISSN:2169-3536 DOI:10.1109/ACCESS.2020.2968139

  64. A Novel Sequence Generation Approach to Diagnose Faults in Reconfigurable Scan Networks
      articolo
      

      Cantoro, Riccardo; Damljanovic, Aleksa; Sonza Reorda, Matteo; Squillero, Giovanni
      IEEE TRANSACTIONS ON COMPUTERS
      IEEE
      Vol.69 pp.12 (pp.87-98) ISSN:0018-9340 DOI:10.1109/TC.2019.2939125

  65. ISO26262-Compliant Developmentof a High Dependable Automotive Powertrain Item
      proceeding
      

      Sini, Jacopo; Violante, Massimo; Dessi, Riccardo
      LECTURE NOTES IN ELECTRICAL ENGINEERING
      In: ELECTRIMACS 2019
      Springer (SVIZZERA)
      ELECTRIMACS 2019 (Salerno (ITA)) 1st to 23rd May 2019
      Vol.615 pp.12 (pp.315-326) ISSN:1876-1100 ISBN:9783030371609 DOI:10.1007/978-3-030-37161-6_23

  66. Virtual Measurement of the Backlash Gap in Industrial Manipulators
      proceeding
      

      Giovannitti, Eliana; Squillero, Giovanni; Alberto, Tonda
      COMMUNICATIONS IN COMPUTER AND INFORMATION SCIENCE
      In: Proceedings SEMCCO 2019 & FANCCO 2019
      springer
      SEMCCO 2019 & FANCCO 2019 (Maribor, Slovenia,EU) 10 – 12 July 2019
      Vol.1092 pp.12 (pp.189-200) ISSN:1865-0929 DOI:10.1007/978-3-030-37838-7_17

  67. The Rise of Android Banking Trojans
      articolo
      

      Atzeni, Andrea; Dıaz, Fernando; Lopez, Francisco; Marcelli, Andrea; Sanchez, Antonio; Squillero, Giovanni
      IEEE POTENTIALS
      IEEE
      Vol.39 pp.6 (pp.13-18) ISSN:0278-6648 DOI:10.1109/MPOT.2019.2904744

  2019

  1. Evolutionary discovery of coresets for classification
     proceeding
     

     Barbiero, Pietro; Squillero, Giovanni; Tonda, Alberto
     In: GECCO '19: Proceedings of the Genetic and Evolutionary Computation Conference Companion
     ACM
     GECCO'19 (Prague (Czech Republic)) July 13 - 17, 2019
     pp.8 (pp.1747-1754) ISBN:9781450367486 DOI:10.1145/3319619.3326846

  2. Beyond coreset discovery: evolutionary archetypes
     proceeding
     

     Barbiero, Pietro; Squillero, Giovanni; Tonda, Alberto
     In: GECCO '19: Proceedings of the Genetic and Evolutionary Computation Conference Companion
     ACM
     GECCO'19 (Prague (Czech Republic)) July 13 - 17, 2019
     pp.2 (pp.47-48) ISBN:9781450367486 DOI:10.1145/3319619.3326789

  3. An open source embedded-GPGPU model for the accurate analysis and mitigation of SEU effects
     proceeding
     

     Du, B.; Rodriguez Condia, Josie E.; Sonza Reorda, M.; Sterpone, L.
     In: 2019 19th European Conference on Radiation and Its Effects on Components and Systems RADECS
     IEEE
     2019 19th European Conference on Radiation and Its Effects on Components and Systems (Montpellier (France)) 16-20 September 2019
     pp.4 (pp.1-4) ISBN:9781728156996 DOI:10.1109/RADECS47380.2019.9745670

  4. A hybrid in-field self-test technique for SoCs
     proceeding
     

     Carbonara, S.; Bernardi, P.; Restifo, M.
     In: Proceedings - 2019 14th IEEE International Conference on Design and Technology of Integrated Systems In Nanoscale Era, DTIS 2019
     Institute of Electrical and Electronics Engineers Inc. (STATI UNITI D'AMERICA)
     14th IEEE International Conference on Design and Technology of Integrated Systems In Nanoscale Era, DTIS 2019 (grc) 2019
     pp.6 (pp.1-6) ISBN:9781728134246 DOI:10.1109/DTIS.2019.8735075

  5. RTOS Solution for NoC-Based COTS MPSoC Usage in Mixed-Criticality Systems
     articolo
     

     Avramenko, Serhiy; Violante, Massimo
     JOURNAL OF ELECTRONIC TESTING
     Springer
     Vol.35 pp.16 (pp.29-44) ISSN:0923-8174 DOI:10.1007/s10836-019-05779-y

  6. On the detection of always-on hardware trojans supported by a pre-silicon verification methodology
     proceeding
     

     Ruospo, A.; Sanchez, E.
     In: Proceedings - 2019 20th International Workshop on Microprocessor/SoC Test, Security and Verification, MTV 2019
     Institute of Electrical and Electronics Engineers Inc. (STATI UNITI D'AMERICA)
     20th International Workshop on Microprocessor/SoC Test, Security and Verification, MTV 2019 (usa) 2019
     pp.6 (pp.25-30) ISBN:9781728150253 DOI:10.1109/MTV48867.2019.00013

  7. A machine learning-based approach to optimize repair and increase yield of embedded flash memories in automotive systems-on-chip
     proceeding
     

     Manzini, A.; Inglese, P.; Caldi, L.; Cantoro, R.; Carnevale, G.; Coppetta, M.; Giltrelli, M.; Mautone, N.; Irrera, F.; Ullmann, R.; Bernardi, P.
     In: Proceedings - 2019 IEEE European Test Symposium (ETS)
     Institute of Electrical and Electronics Engineers Inc.
     2019 IEEE European Test Symposium (ETS) (Baden-Baden, Germany) 27-31 May 2019
     pp.6 (pp.1-6) ISBN:9781728111735 DOI:10.1109/ETS.2019.8791529

  8. A Functional Approach to Test and Debug of IEEE 1687 Reconfigurable Networks
     proceeding
     

     Portolan, Michele; Cantoro, Riccardo; Ernesto, Sanchez
     In: Proceedings - 2019 IEEE European Test Symposium (ETS)
     Institute of Electrical and Electronics Engineers Inc.
     2019 IEEE European Test Symposium (ETS) (Baden-Baden, Germany) 27-31 May 2019
     pp.2 (pp.1-2) ISBN:9781728111735 DOI:10.1109/ETS.2019.8791522

  9. Key Recoverability in Wireless Sensor Networks
     articolo
     

     Gandino, F.; Servetti, A.
     IEEE ACCESS
     Institute of Electrical and Electronics Engineers Inc.
     Vol.7 pp.11 (pp.164407-164417) ISSN:2169-3536 DOI:10.1109/ACCESS.2019.2952945

  10. Untestable faults identification in GPGPUs for safety-critical applications
      proceeding
      

      Condia, Josie E. Rodriguez; Da Silva, Felipe A.; Hamdioui, S.; Sauer, C.; Reorda, M. Sonza
      In: 1
      Institute of Electrical and Electronics Engineers
      2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS) (Genova) 27-29 Nov. 2019
      pp.4 (pp.570-573) ISBN:9781728109961 DOI:10.1109/ICECS46596.2019.8964677

  11. Test-Plan Optimization for Flying-Probes In-Circuit Testers
      proceeding
      

      Bonaria, Luciano; Raganato, Maurizio; Squillero, Giovanni; Reorda, Matteo Sonza
      In: 2019 IEEE International Test Conference in Asia (ITC-Asia)
      IEEE
      2019 IEEE International Test Conference in Asia (ITC-Asia)
      pp.6 (pp.19-24) ISBN:9781728147185 DOI:10.1109/ITC-Asia.2019.00017

  12. Challenges of Reliability Assessment and Enhancement in Autonomous Systems
      proceeding
      

      Jenihhin, Maksim; Reorda, Matteo Sonza; Balakrishnan, Aneesh; Alexandrescu, Dan
      In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
      ieee
      2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
      pp.6 (pp.1-6) ISBN:9781728122601 DOI:10.1109/DFT.2019.8875379

  13. Software-Based Self-Test for Transition Faults: A Case Study
      proceeding
      

      Grosso, M.; Rinaudo, S.; Casalino, A.; Reorda, M. S.
      In: IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC
      IEEE Computer Society
      27th IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 (Peru) 2019
      Vol.2019- pp.6 (pp.76-81) ISBN:9781728139159 DOI:10.1109/VLSI-SoC.2019.8920306

  14. Machine Learning on Low-Power Low-Cost Platforms: an Application Case Study
      capitolo
      

      Scionti, A.; Terzo, O.; D'Amico, C.; Montrucchio, B.; Ferrero, R.
      Heterogeneous Computing Architectures: Challenges and Vision
      CRC Press (STATI UNITI D'AMERICA)
      pp.30 (pp.191-220) ISBN:9780367023447

  15. Further assessment of the injected mass closed-loop control strategy in the design of innovative fuel injection systems
      proceeding
      

      Ferrari, Alessandro; Mittica, Antonio; Novara, Carlo; Vento, Oscar; Violante, Massimo; Zhang, Tantan
      AIP CONFERENCE PROCEEDINGS
      In: 74TH ATI NATIONAL CONGRESS: Energy Conversion: Research, Innovation and Development for Industry and Territories
      AIP Publishing
      74TH ATI NATIONAL CONGRESS: Energy Conversion: Research, Innovation and Development for Industry and Territories
      Vol.2191 pp.8 ISSN:0094-243X DOI:10.1063/1.5138803

  16. A Possible Strategy for the Development of Software Test Libraries for different Processors of the same Family
      altro
      

      Piumatti, Davide; Ernesto, Sanchez; Martorana, Rosario; Alessandro Pernice, Mosè
      In: IEEE-tttc ART workshop
      ART 2019 (Washington d.c.) 14-15 November 2019
      Vol.ART 2019 pp.6

  17. Increasing the Robustness of Software Test Libraries in Multi-core System-on-Chips
      altro
      

      Floridia, Andrea; Piumatti, Davide; Ruospo, Annachiara; Ernesto, Sanchez; Martorana, Rosario; Alessandro Pernice, Mose
      In: IEEE-tttc ART workshop
      ART 2019 (Washington d.c.) 14-15 November 2019
      Vol.ART 2019 pp.4

  18. Estimation of displacement for internet of things applications with kalman filter
      articolo
      

      Ferrero, R.; Gandino, F.; Hemmatpour, M.
      ELECTRONICS
      MDPI
      Vol.8 pp.12 (pp.1-12) ISSN:2079-9292 DOI:10.3390/electronics8090985

  19. A dynamic greedy test scheduler for optimizing probe motion in in-circuit testers
      proceeding
      

      Bonaria, L.; Raganato, M.; Sonza Reorda, M.; Squillero, G.
      In: Proceedings of the European Test Symposium
      Institute of Electrical and Electronics Engineers Inc.
      2019 IEEE European Test Symposium, ETS 2019 (Baden Baden, Germany) 2019
      Vol.2019- pp.2 (pp.1-2) ISBN:9781728111735 DOI:10.1109/ETS.2019.8791519

  20. Improved Test Solutions for COTS-Based Systems in Space Applications
      proceeding
      

      Cantoro, R.; Carbonara, Sara; Florida, A.; Sanchez, E.; Sonza Reorda, M.; Mess, J. -G.
      IFIP ADVANCES IN INFORMATION AND COMMUNICATION TECHNOLOGY
      In: IFIP Advances in Information and Communication Technology
      Springer New York LLC
      26th IFIP/IEEE WG 10.5 International Conference on Very Large Scale Integration, VLSI-SoC 2018 (ita) 2018
      Vol.561 pp.20 (pp.187-206) ISSN:1868-4238 ISBN:9783030234249 DOI:10.1007/978-3-030-23425-6_10

  21. Radiation-induced Single Event Transient effects during the reconfiguration process of SRAM-based FPGAs
      articolo
      

      De Sio, C.; Azimi, S.; Bozzoli, L.; Du, B.; Sterpone, L.
      MICROELECTRONICS RELIABILITY
      Elsevier
      pp.6 ISSN:0026-2714 DOI:10.1016/j.microrel.2019.06.034

  22. Ubiquitous fridge with natural language interaction
      proceeding
      

      Ferrero, Renato; GHAZI VAKILI, Mohammad; Giusto, Edoardo; Guerrera, Mauro; Randazzo, Vincenzo
      In: Proceedings of the 2019 IEEE International Conference on RFID Technology and Applications (RFID-TA)
      IEEE
      2019 IEEE International Conference on RFID Technology and Applications (RFID-TA) (Pisa (Italia)) 25-27 Settembre 2019
      pp.6 (pp.404-409) DOI:10.1109/RFID-TA.2019.8892025

  23. Simulation-based Equivalence Checking between IEEE 1687 ICL and RTL
      proceeding
      

      Damljanovic, Aleksa; Jutman, Artur; Portolan, Michele; Ernesto, Sanchez; Squillero, Giovanni; Tsertov, Anton
      In: Proceedings - 2019 IEEE International Test Conference (ITC)
      IEEE
      50th IEEE International Test Conference, ITC 2019 (Washington DC (USA)) 12-14 November
      pp.8 DOI:10.1109/ITC44170.2019.9000181

  24. On-line Testing for Autonomous Systems driven by RISC-V Processor Design Verification
      proceeding
      

      Ruospo, Annachiara; Cantoro, Riccardo; Ernesto, Sanchez; Pasquale Davide Schiavone, ; Angelo, Garofalo; Benini, Luca
      In: The 32nd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
      The 32nd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
      The 32nd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (Noordwijk, Netherlands, Netherlands) October 2 – October 4, 2019
      Vol.IEEE The 32nd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems pp.6 ISBN:9781728122601 DOI:10.1109/DFT.2019.8875345

  25. A Decentralized Scheduler for On-line Self-test Routines in Multi-core Automotive System-on-Chips
      proceeding
      

      Floridia, Andrea; Piumatti, Davide; Ruospo, Annachiara; Ernesto, Sanchez; Sergio De Luca, ; Rosario, Martorana
      In: Proceedings - 2019 IEEE International Test Conference (ITC)
      IEEE
      2019 IEEE International Test Conference (ITC) (Washington (USA)) 9 - 15 November, 2019
      pp.10 (pp.1-10) ISBN:9781728148236 DOI:10.1109/ITC44170.2019.9000129

  26. Testing permanent faults in pipeline registers of GPGPUs: A multi-kernel approach
      proceeding
      

      SONZA REORDA, Matteo; Rodriguez Condia Josie, E.
      In: Proceedings of the - 2019 IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS)
      Institute of Electrical and Electronics Engineers
      2019 IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS) (Rhodes (Greece)) 1-3 July 2019
      pp.6 ISBN:9781728124902 DOI:10.1109/IOLTS.2019.8854463

  27. An extended model to support detailed GPGPU reliability analysis
      proceeding
      

      Du, B.; RODRIGUEZ CONDIA, JOSIE ESTEBAN; Reorda, M. S.
      In: Proceedings - 2019 14th IEEE International Conference on Design and Technology of Integrated Systems In Nanoscale Era, DTIS 2019
      Institute of Electrical and Electronics Engineers Inc.
      14th IEEE International Conference on Design and Technology of Integrated Systems In Nanoscale Era, DTIS 2019 (grc) 2019
      pp.6 (pp.1-6) ISBN:9781728134246 DOI:10.1109/DTIS.2019.8735047

  28. Machine Learning To Tackle the Challenges of Transient and Soft Errors in Complex Circuits
      proceeding
      

      Lange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca
      In: 2019 IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS)
      IEEE
      25th International Symposium on On-Line Testing And Robust System Design (IOLTS)
      pp.8 (pp.7-14) DOI:10.1109/IOLTS.2019.8854423

  29. On the Estimation of Complex Circuits Functional Failure Rate by Machine Learning Techniques
      proceeding
      

      Lange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca
      In: 2019 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks – Supplemental Volume (DSN-S)
      IEEE
      49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN-S) 2019
      pp.7 (pp.35-41) ISBN:9781728130286 DOI:10.1109/DSN-S.2019.00021

  30. Assessing the Effectiveness of the Test of Power Devices at the Board Level
      proceeding
      

      Piumatti, Davide; Borlo, Stefano; Mandrile, Fabio; SONZA REORDA, Matteo; Bojoi, IUSTIN RADU
      In: 2019 34th Conference on Design of Circuits and Integrated Systems, DCIS 2019
      IEEE
      34th IEEE Conference on Design of Circuits and Integrated Systems (DCIS 19) (Bilbao, Spain) November 20 – 22, 2019
      Vol.2019 34th Conference on Design of Circuits and Integrated Systems, DCIS 2019 pp.6 (pp.1-6) ISBN:9781728154589 DOI:10.1109/DCIS201949030.2019.8959845

  31. Functional Failure Rate Due to Single-Event Transients in Clock Distribution Networks
      proceeding
      

      Lange, Thomas; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca
      In: 2019 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)
      IEEE
      14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) 2019
      pp.6 (pp.1-6) ISBN:9781728134246 DOI:10.1109/DTIS.2019.8735052

  32. On the Reliability of Convolutional Neural Network Implementation on SRAM-based FPGA
      proceeding
      

      Du, Boyang; Azimi, Sarah; DE SIO, Corrado; Bozzoli, Ludovica; Sterpone, Luca
      In: The 32nd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology
      IEEE
      The 32nd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology (ESA-ESTEC & TU Delft, Netherlands) 02/10/2019 - 04/10/2019
      pp.6 DOI:10.1109/DFT.2019.8875362

  33. Rad-Ray: A new Simulation Tool for the Analysis of Heavy Ions-induced SETs on ICs
      proceeding
      

      Sterpone, Luca; Azimi, Sarah; Du, Boyang; Luoni, Francesca
      In: 30th IEEE Radiation and its Effects on Components and Systems
      IEEE RADECS
      30th IEEE Radiation and its Effects on Components and Systems (RADECS 2019)
      

  34. Correction to: Improved Test Solutions for COTS-Based Systems in Space Applications
      capitolo
      

      Cantoro, Riccardo; Carbonara, Sara; Floridia, Andrea; Sanchez, Ernesto; Sonza Reorda, Matteo; Mess, Jan-Gerd
      IFIP ADVANCES IN INFORMATION AND COMMUNICATION TECHNOLOGY
      VLSI-SoC: Design and Engineering of Electronics Systems Based on New Computing Paradigms
      Springer, Cham
      Vol.561 pp.20 (pp.187-206) ISSN:1868-4238 ISBN:9783030234249 DOI:10.1007/978-3-030-23425-6_14

  35. Personal Assistance and Monitoring Devices Applications
      editoriale
      

      Ferrero, Renato; Rebaudengo, Maurizio; Rosique, Francisca
      ADVANCES IN HUMAN-COMPUTER INTERACTION
      HINDAWI LTD
      Vol.2019 pp.2 (pp.1-2) ISSN:1687-5893 DOI:10.1155/2019/8916796

  36. Usability evaluation of touch gestures for Mobile Augmented Reality applications
      articolo
      

      Fiorino, Davide; Collotta, Mario; Ferrero, Renato
      JOURNAL OF WIRELESS MOBILE NETWORKS, UBIQUITOUS COMPUTING AND DEPENDABLE APPLICATIONS
      Innovative Information Science & Technology Research Group (ISYOU)
      Vol.10 pp.15 (pp.22-36) ISSN:2093-5374 DOI:10.22667/JOWUA.2019.06.30.022

  37. Degree Distribution of Wireless Networks for Mobile IoT Applications
      proceeding
      

      Ferrero, Renato; Gandino, Filippo
      In: Proceedings of the 2019 IEEE 43rd Annual Computer Software and Applications Conference (COMPSAC)
      IEEE
      2019 IEEE 43rd Annual Computer Software and Applications Conference (COMPSAC) (Milwaukee, WI, USA) 15-19 luglio 2019
      Vol.1 pp.6 (pp.876-881) ISBN:9781728126074 DOI:10.1109/COMPSAC.2019.00128

  38. Evaluation of Throughput of TDMA Anti-Collision Protocols in Static and Mobile RFID Networks
      proceeding
      

      Ferrero, Renato
      In: Proceedings of the 2019 4th International Conference on Smart and Sustainable Technologies (SpliTech)
      IEEE
      2019 4th International Conference on Smart and Sustainable Technologies (SpliTech) (Split, Croatia) 18-21 giugno 2019
      pp.7 (pp.1-7) ISBN:9789532900910 DOI:10.23919/SpliTech.2019.8783206

  39. Emerging Applications through Low-Power Wireless Technologies for Internet of Things
      editoriale
      

      Pau, Giovanni; Ferrero, Renato; Jennehag, Ulf; Zhang, Haijun
      INTERNATIONAL JOURNAL OF DISTRIBUTED SENSOR NETWORKS
      SAGE
      Vol.15 pp.2 (pp.1-2) ISSN:1550-1477 DOI:10.1177/1550147719835692

  40. Evolutionary Antivirus Signature Optimization
      proceeding
      

      Giovannitti, Eliana; Mannella, Luca; Andrea, Marcelli; Squillero, Giovanni
      In: Proceeding of Congress on Evolutionary Computation
      IEEE
      2019 IEEE Congress on Evolutionary Computation (CEC) (Wellington) 10-13 June 2019
      pp.8 (pp.905-912) ISBN:9781728121536 DOI:10.1109/CEC.2019.8790240

  41. A new Method for the Analysis of Radiation-induced Effects in 3D VLSI Face-to-Back LUTs
      proceeding
      

      Sterpone, Luca; Bozzoli, Ludovica; DE SIO, Corrado; Du, Boyang; Azimi, Sarah
      In: 16th IEEE International Conference on Synthesis, modeling, analysis and Simulation methods and applications to circuit design
      IEEE
      IEEE International Conference on Synthesis, modeling, analysis and Simulation methods and applications to circuit design (SMACD)
      pp.4 (pp.205-208) DOI:10.1109/SMACD.2019.8795296

  42. On NBTI-induced Aging Analysis in IEEE 1687 Reconfigurable Scan Networks
      proceeding
      

      Damljanovic, Aleksa; Squillero, Giovanni; Cem Gursoy, Cemil; Jenihhin, Maksim
      In: Proceedings - 2019 IFIP/IEEE International Conference on Very Large Scale Integration
      IEEE
      27th IFIP/IEEE International Conference on Very Large Scale Integration (Cuzco, Peru) 6-9 October 2019
      pp.6 DOI:10.1109/VLSI-SoC.2019.8920313

  43. A reliability analysis of a deep neural network
      proceeding
      

      Bosio, A.; Bernardi, P.; Ruospo, A.; Sanchez, E.
      In: LATS 2019 - 20th IEEE Latin American Test Symposium
      Institute of Electrical and Electronics Engineers Inc.
      20th IEEE Latin American Test Symposium, LATS 2019 (Santiago del Chile) 2019
      pp.6 (pp.1-6) ISBN:9781728117560 DOI:10.1109/LATW.2019.8704548

  44. An Open-Source Verification Framework for Open-Source Cores: A RISC-V Case Study
      proceeding
      

      Schiavone, P. D.; Sanchez, E.; Ruospo, A.; Minervini, F.; Zaruba, F.; Haugou, G.; Benini, L.
      In: IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC
      IEEE Computer Society
      26th IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2018 (Verona (Italia)) 2018
      Vol.2018- pp.6 (pp.43-48) ISBN:9781538647561 DOI:10.1109/VLSI-SoC.2018.8644818

  45. Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test
      proceeding
      

      COSTA DE ALMEIDA, ANTONIO FELIPE; Bernardi, P.; Calabrese, D.; Restifo, M.; Reorda, M. S.; Appello, D.; Pollaccia, G.; Tancorre, V.; Ugioli, R.; Zoppi, G.
      In: Proceedings - 2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2019
      Institute of Electrical and Electronics Engineers Inc.
      22nd International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2019 (rou) 2019
      ISBN:9781728100739 DOI:10.1109/DDECS.2019.8724644

  46. Multi-level diversity promotion strategies for Grammar-guided Genetic Programming
      articolo
      

      Bartoli, Alberto; De Lorenzo, Andrea; Medvet, Eric; Squillero, Giovanni
      APPLIED SOFT COMPUTING
      Elsevier
      pp.42 ISSN:1568-4946 DOI:10.1016/j.asoc.2019.105599

  47. An Investigation on Pervasive Technologies for IoT-based Thermal Monitoring
      articolo
      

      Giusto, Edoardo; Gandino, Filippo; Greco, MICHELE LUIGI; Grosso, Michelangelo; Montrucchio, Bartolomeo; Salvatore, Rinaudo
      SENSORS
      MDPI
      Vol.19 pp.23 ISSN:1424-8220 DOI:10.3390/s19030663

  48. On the in-field test of the GPGPU scheduler memory
      proceeding
      

      Di Carlo, Stefano; Condia, Josie E. Rodriguez; Sonza Reorda, Matteo
      In: Proceedings of the IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
      IEEE (STATI UNITI D'AMERICA)
      IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) (Cluj-Napoca, (Romania)) 24-26 April 2019
      pp.6 (pp.1-6) ISBN:9781728100739 DOI:10.1109/DDECS.2019.8724672

  49. A Novel Simulation-Based Approach for ISO 26262 Hazard Analysis and Risk Assessment
      proceeding
      

      Sini, Jacopo; Violante, Massimo; Pecorella, Luca; Dodde, Vincenzo; Gnaniah, Rubin
      In: Titolo volume non avvalorato
      IEEE
      25th IEEE International Symposium on On-Line Testing and Robust System Design (Rhodes Island (Greece)) July 1-3, 2019
      pp.2 (pp.253-254) DOI:10.1109/IOLTS.2019.8854385

  50. Self-testing of multicore processors
      capitolo
      

      Skitsas, Michael A.; Restifo, Marco; Michael, Maria K.; Nicopoulos, Chrysostomos; Bernardi, Paolo; Ernesto, Sanchez
      Many-Core Computing: Hardware and Software
      IET
      pp.28 (pp.367-394) ISBN:9781785615825 DOI:10.1049/PBPC022E_ch15

  51. A review on fall prediction and prevention system for personal devices: evaluation and experimental results
      articolo
      

      Hemmatpour, Masoud; Ferrero, Renato; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      ADVANCES IN HUMAN-COMPUTER INTERACTION
      Hindawi
      Vol.2019 pp.12 ISSN:1687-5893 DOI:10.1155/2019/9610567

  52. A new FPGA-based Detection Method for Spurious Variations in PCBA Power Distribution Network
      proceeding
      

      Odintsov, Sergei; Bozzoli, Ludovica; De Sio, Corrado; Sterpone, Luca; Jutman, Artur
      In: IEEE DDECS
      IEEE
      IEEE DDECS 2019
      pp.6 (pp.1-6) ISBN:9781728100739 DOI:10.1109/DDECS.2019.8724662

  53. A Fuzzy Approach for Reducing Power Consumption in Wireless Sensor Networks: A Testbed With IEEE 802.15.4 and WirelessHART
      articolo
      

      Collotta, Mario; Ferrero, Renato; Rebaudengo, Maurizio
      IEEE ACCESS
      IEEE
      Vol.7 pp.12 (pp.64866-64877) ISSN:2169-3536 DOI:10.1109/ACCESS.2019.2917783

  54. On the Evaluation of the PIPB Effect within SRAM-based FPGAs
      proceeding
      

      DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca
      In: 2019 IEEE European Test Symposium (ETS)
      IEEE European Test Symposium
      2019 IEEE European Test Symposium (ETS2019)
      pp.2 DOI:10.1109/ETS.2019.8791527

  55. Hybrid on-line self-test architecture for computational units on embedded processor cores
      proceeding
      

      Floridia, Andrea; Mongano, Gianmarco; Piumatti, Davide; Sanchez, Ernesto
      In: IEEE DDECS19
      IEEE DDECS19 (ROMANIA)
      Design and Diagnostics of Electronic Circuits and Systems (DDECS) (Cluj-Napoca) April 24-26, 2019
      Vol.IEEE DDECS19 pp.6 (pp.1-6) ISBN:9781728100739 DOI:10.1109/DDECS.2019.8724647

  56. New categories of Safe Faults in a processor-based Embedded System
      proceeding
      

      Gursoy, C.; Jenihhin, M.; Oyeniran, A. S.; Piumatti, D.; Raik, J.; Reorda, M. Sonza; Ubar, R.
      In: IEEE DDECS19
      IEEE DDECS19 (ROMANIA)
      Design and Diagnostics of Electronic Circuits and Systems (DDECS) (Cluj-Napoca) April 24-26, 2019
      Vol.DDECS19 pp.4 (pp.1-4) ISBN:9781728100739 DOI:10.1109/DDECS.2019.8724642

  57. Fault Grading Techniques of Software Test Libraries for Safety-Critical Applications
      articolo
      

      Floridia, Andrea; Sanchez, Ernesto; Sonza Reorda, Matteo
      IEEE ACCESS
      IEEE
      Vol.7 pp.10 (pp.63578-63587) ISSN:2169-3536 DOI:10.1109/ACCESS.2019.2917036

  58. Digital design techniques for dependable High-Performance Computing
      tesi dottorato
      

      Azimi, Sarah
      Politecnico di Torino
      pp.196 (pp.1-196)

  59. On the evaluation of SEU effects in GPGPUs
      proceeding
      

      Du, B.; Rodriguez Condia, Josie E.; Sonza Reorda, M.; Sterpone, L.
      In: 2019 IEEE Latin American Test Symposium (LATS) Proceedings
      IEEE
      2019 IEEE Latin American Test Symposium (LATS) (Santiago, Chile) 11-13 March 2019
      pp.6 (pp.1-6) ISBN:9781728117560 DOI:10.1109/LATW.2019.8704643

  60. About Performance Faults in Microprocessor Core in-field Testing
      proceeding
      

      Acle, Julio Perez; Sanchez, Ernesto; Reorda, Matteo Sonza
      In: 2019 IEEE 10th Latin American Symposium on Circuits & Systems (LASCAS)
      ieee (URUGUAY)
      2019 IEEE 10th Latin American Symposium on Circuits & Systems (LASCAS)
      pp.4 (pp.229-232) ISBN:9781728104539 DOI:10.1109/LASCAS.2019.8667562

  61. An Enhanced Evolutionary Technique for the Generation of Compact Reconfigurable Scan-Network Tests
      articolo
      

      Cantoro, Riccardo; Damljanovic, Aleksa; SONZA REORDA, Matteo; Squillero, Giovanni
      JOURNAL OF CIRCUITS, SYSTEMS, AND COMPUTERS
      World Scientific
      pp.25 ISSN:0218-1266 DOI:10.1142/S0218126619400073

  62. Post-Silicon Validation of IEEE 1687 Reconfigurable Scan Networks
      proceeding
      

      Damljanovic, Aleksa; Jutman, Artur; Squillero, Giovanni; Tsertov, Anton
      In: Proceedings - 2019 IEEE European Test Symposium (ETS)
      IEEE
      24th IEEE European Test Symposium (ETS) (Baden-Baden, Germany) 27-31 May 2019
      pp.6 DOI:10.1109/ETS.2019.8791546

  63. Fault-Independent Test-Generation for Software-Based Self-Testing
      articolo
      

      Georgiou, Panagiotis; Kavousianos, Xrysovalantis; Cantoro, Riccardo; Reorda, Matteo Sonza
      IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
      IEEE
      Vol.19 pp.9 (pp.341-349) ISSN:1530-4388 DOI:10.1109/TDMR.2019.2911022

  64. Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions
      proceeding
      

      Bernardi, P.; Cantoro, R.; Floridia, A.; Piumatti, D.; Pogonea, C.; Ruospo, A.; Sanchez, E.; De Luca, S.; Sansonetti, A.
      In: IEEE DATE 2019
      IEEE DATE 2019
      Design, Automation and Test in Europe; DATE 2019
      Vol.IEEE DATE 2019 pp.4 (pp.920-923) ISBN:9783981926323 DOI:10.23919/DATE.2019.8714780

  65. SETA-RAY: A New IDE tool for Predicting, Analyzing and Mitigating Radiation-induced Soft Errors on FPGAs
      proceeding
      

      Sterpone, Luca; Du, Boyang; Azimi, Sarah
      In: IEEE design, automation and test in Europe
      IEEE design, automation and test in Europe
      IEEE design, automation and test in Europe - DATE 2019
      pp.2

  66. Analyzing Radiation-induced Transient Errors on SRAM-based FPGAs by Propagation of Broadening Effect
      articolo
      

      DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca; Du, Boyang
      IEEE ACCESS
      IEEE access
      Vol.7 pp.8 (pp.140182-140189) ISSN:2169-3536 DOI:10.1109/ACCESS.2019.2915136

  67. ReM: A Reconfigurable Multipotent Cell for New Distributed Reconfigurable Architectures
      proceeding
      

      Bozzoli, Ludovica; Sterpone, Luca
      LECTURE NOTES IN ARTIFICIAL INTELLIGENCE
      In: Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
      Springer Verlag
      15th International Symposium on Applied Reconfigurable Computing, ARC 2019 (deu) 2019
      Vol.11444 pp.10 (pp.295-304) ISBN:9783030172268 DOI:10.1007/978-3-030-17227-5_21

  68. Facilitating Fault-Simulation Comprehension through a Fault-Lists Analysis Tool
      proceeding
      

      Bernardi, P.; Piumatti, D.; Sanchez, E.
      In: IEEE LASCAS19
      IEEE LASCAS19
      10th IEEE Latin American Symposium on Circuits and Systems 2019 (LASCAS19) (Armenia, Quindío, Colombia) February 24 - 27, 2019
      pp.4 (pp.77-80) ISBN:9781728104539 DOI:10.1109/LASCAS.2019.8667573

  69. A new CAD tool for Single Event Transient Analysis and Mitigation on Flash-based FPGAs
      articolo
      

      Azimi, Sarah; Du, Boyang; Sterpone, Luca; Merodio Codinachs, David; Grimoldi, Raoul; Cattaneo, Luca
      INTEGRATION
      Elsevier
      Vol.67 pp.9 (pp.73-81) ISSN:0167-9260 DOI:10.1016/j.vlsi.2019.02.001

  70. Ultra High Energy Heavy Ion Test Beam on Xilinx Kintex-7 SRAM-based FPGA
      articolo
      

      Du, Boyang; Sterpone, Luca; Azimi, Sarah; Merodio Codinachs, David; Ferlet-Cavrois, Véronique; Boatella Polo, Cesar; García Alía, Rubén; Kastriotou, Maria; Fernández-Martínez, Pablo
      IEEE TRANSACTIONS ON NUCLEAR SCIENCE
      IEEE
      Vol.66 pp.7 (pp.1813-1819) ISSN:0018-9499 DOI:10.1109/TNS.2019.2915207

  71. Balancing the equity-efficiency trade-off in personal income taxation: an evolutionary approach
      articolo
      

      Pellegrino, Simone; Perboli, Guido; Squillero, Giovanni
      ECONOMIA POLITICA
      Springer
      Vol.36 pp.28 (pp.37-64) ISSN:1120-2890 DOI:10.1007/s40888-018-0132-4

  72. Upgrading QoSinNoC: Efficient Routing for Mixed-Criticality Applications and Power Analysis
      proceeding
      

      Avramenko, Serhiy; Payandeh Azad, Siavoosh; Violante, Massimo; Raik, Jaan; Niazmand, Behrad; Jenihhin, Maksim
      In: International Conference on Very Large Scale Integration (VLSI-SoC)
      IEEE
      International Conference on Very Large Scale Integration (VLSI-SoC) (verona) 8-10 October
      ISBN:9781538647561 DOI:10.1109/VLSI-SoC.2018.8644866

  73. An analysis of test solutions for COTS-based systems in space applications
      proceeding
      

      Cantoro, Riccardo; Carbonara, Sara; Floridia, Andrea; Ernesto, Sanchez; SONZA REORDA, Matteo; Jan-Gerd, Mess
      In: 2018 IFIP/IEEE 26th International Conference on Very Large Scale Integration (VLSI-SOC)
      IEEE
      2018 IFIP/IEEE 26th International Conference on Very Large Scale Integration (VLSI-SOC) (Verona (Italy)) 8-10 Ottobre 2018
      Vol.IEEE VLSI-SOC 2018 pp.6 (pp.1-6) DOI:10.1109/VLSI-SoC.2018.8644846

  74. Hybrid on-line self-test strategy for dual-core lockstep processors
      proceeding
      

      Floridia, Andrea; Ernesto, Sanchez
      In: 2018 IEEE 31st International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
      IEEE
      2018 IEEE 31st International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (Chicago (USA)) 8-10 Ottobre 2018
      Vol.2018 pp.6 (pp.1-6) DOI:10.1109/DFT.2018.8602982

  75. MATS**: An On-Line Testing Approach for Reconfigurable Embedded Memories
      proceeding
      

      Bozzoli, Ludovica; Sterpone, Luca
      In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
      IEEE
      IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (Chicago (USA)) 8 October 2018 through 10 October 2018
      pp.6 DOI:10.1109/DFT.2018.8602934

  2018

  1. DTIS 2018 foreword
     proceeding
     

     Bernardi, P.; Bosio, A.; Barbareschi, M.
     In: Proceedings - 2018 13th IEEE International Conference on Design and Technology of Integrated Systems In Nanoscale Era, DTIS 2018
     Institute of Electrical and Electronics Engineers Inc. (STATI UNITI D'AMERICA)
     13th IEEE International Conference on Design and Technology of Integrated Systems In Nanoscale Era, DTIS 2018 (ita) 2018
     ISBN:9781538652916 DOI:10.1109/DTIS.2018.8368546

  2. Comparing different approaches to the test of Reconfigurable Scan Networks
     altro
     

     Cantoro, Riccardo; Damljanovic, Aleksa; Sonza Reorda, Matteo; Squillero, Giovanni
     3RD INTERNATIONAL TEST STANDARDS APPLICATION WORKSHOP (TESTA) (Bremen, Germany) May 31st – June 1st, 2018
     

  3. Dependable MPSoC-Based Mixed-Criticality Systems for Space Applications
     proceeding
     

     Esposito, Stefano; Violante, Massimo
     In: Proceedings of the International Workshop on Metrology for AeroSpace
     IEEE (STATI UNITI D'AMERICA)
     5th IEEE International Workshop on Metrology for AeroSpace
     pp.5 (pp.358-362) DOI:10.1109/MetroAeroSpace.2018.8453618

  4. Innovative Practices on Quality Levels of A/MS Devices
     proceeding
     

     Dobbelaere, Wim; Violante, Massimo; Rearick, Jeff; Sarson, Peter
     In: Proceedings of the VLSI Test Symposium
     IEEE (STATI UNITI D'AMERICA)
     VLSI Test Symposium
     pp.1 DOI:10.1109/VTS.2018.8368629

  5. Fault-Independent Test-Generation for Software-Based Self-Testing
     proceeding
     

     Georgiou, P.; Kavousianos, X.; Cantoro, R.; Reorda, M. S.
     In: 2018 IEEE 24th International Symposium on On-Line Testing and Robust System Design, IOLTS 2018
     Institute of Electrical and Electronics Engineers Inc.
     24th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2018 (Platja d'Aro, Spain) 2-4 July 2018
     pp.6 (pp.79-84) ISBN:9781538659922 DOI:10.1109/IOLTS.2018.8474081

  6. Redundancy in Key Management for WSNs
     articolo
     

     Gandino, Filippo; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
     CRYPTOGRAPHY
     MDPI
     Vol.2 pp.12 ISSN:2410-387X DOI:10.3390/cryptography2040040

  7. On the test of a COTS-based system for space applications
     proceeding
     

     Carbonara, S.; Firrincieli, A.; Sonza Reorda, M.; Mess, J. -G.
     In: 2018 IEEE 24th International Symposium on On-Line Testing and Robust System Design, IOLTS 2018
     Institute of Electrical and Electronics Engineers Inc.
     24th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2018 (esp) 2018
     pp.2 (pp.47-48) ISBN:9781538659922 DOI:10.1109/IOLTS.2018.8474085

  8. Massively Extended Modular Monitoring and a Second Life for Upper Stages
     proceeding
     

     Meß, Jan-Gerd; Sonza Reorda, Matteo; Violante, Massimo; Dannemann, Frak; Hanson, Berenike; Söderholm, Stefan; Karlsson, Niklas; Kuremyr, Tobias; Albert, Yann; Spiecker, Joachim
     In: 69thInternational Astronautical Congress(IAC),Bremen, Germany, 1-5 October 2018.
     International Astronautical Federation
     69thInternational Astronautical Congress(IAC),Bremen, Germany, 1-5 October 2018. (Bremen, Germany, 1-5 October 2018.) 1-5 October 2018.
     pp.13

  9. Effect of mobility on RFID reader-to-reader interference
     proceeding
     

     Ferrero, Renato; Gandino, Filippo
     In: Proceedings of the 2018 6th International EURASIP Workshop on RFID Technology (EURFID)
     IEEE
     2018 6th International EURASIP Workshop on RFID Technology (EURFID) (Brno, Czech Republic) 11-12 settembre 2018
     pp.6 (pp.1-6) ISBN:9781538659380 DOI:10.1109/EURFID.2018.8611709

  10. RESCUE: Cross-Sectoral PhD Training Concept for Interdependent Reliability, Security and Quality
      proceeding
      

      Vierhaus, Heinrich Theodor; Jenihhin, Maksim; Reorda, Matteo Sonza
      In: 2018 12th European Workshop on Microelectronics Education (EWME)
      IEEE
      2018 12th European Workshop on Microelectronics Education (EWME)
      pp.6 (pp.45-50) ISBN:9781538691144 DOI:10.1109/EWME.2018.8629465

  11. PyXEL: An Integrated Environment for the Analysis of Fault Effects in SRAM-Based FPGA Routing
      proceeding
      

      Bozzoli, Ludovica; DE SIO, Corrado; Sterpone, Luca; Bernardeschi, Cinzia
      In: 2018 International Symposium on Rapid System Prototyping (RSP)
      IEEE
      2018 International Symposium on Rapid System Prototyping (RSP)
      pp.6 (pp.70-75) ISBN:9781538675571 DOI:10.1109/RSP.2018.8632000

  12. On the analysis of radiation-induced Single Event Transients on SRAM-based FPGAs
      articolo
      

      Azimi, S.; Sterpone, L.; Du, B.; Boragno, L.
      MICROELECTRONICS RELIABILITY
      Elsevier Ltd
      Vol.88-90 pp.5 (pp.936-940) ISSN:0026-2714 DOI:10.1016/j.microrel.2018.07.135

  13. Communicating Efficiently on Cluster-Based Remote Direct Memory Access (RDMA) over InfiniBand Protocol
      articolo
      

      Hemmatpour, Masoud; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      APPLIED SCIENCES
      MDPI
      Vol.8 pp.17 ISSN:2076-3417 DOI:10.3390/app8112034

  14. Improving Multi-objective Evolutionary Influence Maximization in Social Networks
      proceeding
      

      Bucur, Doina; Iacca, Giovanni; Marcelli, Andrea; Squillero, Giovanni; Tonda, Alberto
      LECTURE NOTES IN ARTIFICIAL INTELLIGENCE
      In: Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
      Springer Verlag
      21st International Conference on Applications of Evolutionary Computation, EvoApplications 2018 (ita) 2018
      Vol.10784 pp.8 (pp.117-124) ISBN:9783319775371 DOI:10.1007/978-3-319-77538-8_9

  15. A new closed-loop control of the injected mass for a full exploitation of digital and continuous injection-rate shaping
      articolo
      

      Ferrari, A.; Novara, C.; Paolucci, E.; Vento, Oscar; Violante, M.; Zhang, Tantan
      ENERGY CONVERSION AND MANAGEMENT
      Elsevier
      Vol.177 pp.11 (pp.629-639) ISSN:0196-8904 DOI:10.1016/j.enconman.2018.08.037

  16. Design and rapid prototyping of a closed-loop control strategy of the injected mass for the reduction of CO2, combustion noise and pollutant emissions in diesel engines
      articolo
      

      Ferrari, A.; Novara, C.; Paolucci, E.; Vento, Oscar; Violante, M.; Zhang, T.
      APPLIED ENERGY
      Elsevier
      Vol.232 pp.10 (pp.358-367) ISSN:0306-2619 DOI:10.1016/j.apenergy.2018.09.028

  17. Analysis of Fault Simulations Result during development of a Software Test Library
      altro
      

      Floridia, A.; Piumatti, D.; Ruospo, Annachiara; Sanchez, E.
      In: IEEE-tttc ART workshop
      ART 2018 (Phoenix, Arizona, USA) November 01-02, 2018.
      Vol.ART 2018 pp.4

  18. Countering Android Malware: a Scalable Semi-Supervised Approach for Family-Signature Generation
      articolo
      

      Atzeni, Andrea; Díaz, Fernando; Marcelli, Andrea; Sánchez, Antonio; Squillero, Giovanni; Tonda, Alberto
      IEEE ACCESS
      IEEE
      pp.17 (pp.59540-59556) ISSN:2169-3536 DOI:10.1109/ACCESS.2018.2874502

  19. On the mitigation of Hardware Trojan attacks in embedded processors by exploiting a Hardware-based obfuscator
      proceeding
      

      Marcelli, Andrea; Ernesto, Sanchez; Sasselli, Luca; Squillero, Giovanni
      In: IEEE Proceedings of 3rd International Verification and Security Workshop (IVSW)
      IEEE
      3rd International Verification and Security Workshop (IVSW) (Hotel Cap Roig, Platja d’Aro, Costa Brava, Spain) July 2-4, 2018
      DOI:10.1109/IVSW.2018.8494850

  20. A dense RFID network for flexible Thermal Monitoring
      proceeding
      

      Giusto, Edoardo; Gandino, Filippo; Greco, MICHELE LUIGI; Rebaudengo, Maurizio; Montrucchio, Bartolomeo
      In: Titolo volume non avvalorato
      IEEE
      2018 6th International EURASIP Workshop on RFID Technology (Brno, Czech Republic) September 11-12, 2018
      pp.7 ISBN:9781538659373 DOI:10.1109/EURFID.2018.8611649

  21. Particulate matter monitoring in mixed indoor/outdoor industrial applications: a case study
      proceeding
      

      Giusto, Edoardo; Ferrero, Renato; Gandino, Filippo; Montrucchio, Bartolomeo; Rebaudengo, Maurizio; Zhang, Mingyang
      In: Proceedings of the 2018 IEEE 23rd International Conference on Emerging Technologies and Factory Automation (ETFA)
      IEEE (STATI UNITI D'AMERICA)
      2018 IEEE 23rd International Conference on Emerging Technologies and Factory Automation (ETFA) (Torino (Italy)) 04 - 07 September, 2018
      Vol.1 pp.7 (pp.838-844) ISBN:9781538671078 DOI:10.1109/ETFA.2018.8502644

  22. Advancements in Distributed Air Quality Monitoring Systems
      capitolo
      

      Giusto, Edoardo; Ferrero, Renato; Gandino, Filippo; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      Advances in Sensors: Reviews
      IFSA Publishing
      Vol.6 pp.11 (pp.127-137) ISBN:9788409030309

  23. A New Technique to Generate Test Sequences for Reconfigurable Scan Networks
      proceeding
      

      Cantoro, Riccardo; Damljanovic, Aleksa; SONZA REORDA, Matteo; Squillero, Giovanni
      In: Proceedings - 2018 IEEE International Test Conference (ITC)
      IEEE
      49th IEEE International Test Conference, ITC 2018 (Phoenix, Arizona (USA)) 28 October - 2 November 2018
      pp.9 (pp.1-9) DOI:10.1109/TEST.2018.8624742

  24. A Novel Error Rate Estimation Approach for UltraScale+ SRAM-based FPGAs
      proceeding
      

      Sterpone, Luca; Azimi, Sarah; Bozzoli, Ludovica; Du, Boyang; Lange, Thomas; Maximilien, Glorieux; Dan, Alexandrescu; Cesar Boatella, Polo; MERODIO CODINACHS, David
      In: IEEE Adaptive Hardware and Systems (AHS), 2018 NASA/ESA Conference
      IEEE
      IEEE Adaptive Hardware and Systems (AHS), 2018 NASA/ESA Conference
      pp.7 (pp.120-126) DOI:10.1109/AHS.2018.8541474

  25. A Semi-Formal Technique to Generate Effective Test Sequences for Reconfigurable Scan Networks
      proceeding
      

      Cantoro, Riccardo; Damljanovic, Aleksa; SONZA REORDA, Matteo; Squillero, Giovanni
      In: Proceedings - 2nd IEEE International Test Conference in Asia, ITC-Asia 2018
      IEEE
      2nd IEEE International Test Conference in Asia, ITC-Asia 2018 (Harbin (PRC)) 15-17 Agosto 2018
      Vol.2018 pp.6 (pp.55-60) ISBN:9781538651803 DOI:10.1109/ITC-Asia.2018.00020

  26. Efficient Software-Based Partitioning for Commercial-off-the-Shelf NoC-based MPSoCs for Mixed-Criticality Systems
      proceeding
      

      Esposito, Stefano; Avramenko, Serhiy; Violante, Massimo
      In: International Symposium on On-Line Testing and Robust System Design
      IEEE
      International Symposium on On-Line Testing and Robust System Design (Platja d'Aro (Spain)) 2-4 July 2018
      ISBN:9781538659922 DOI:10.1109/IOLTS.2018.8474155

  27. QoSinNoC: Analysis of QoS-aware NoC architectures for mixed-criticality applications
      proceeding
      

      Avramenko, Serhiy; Azad, Siavoosh Payandeh; Esposito, Stefano; Niazmand, Behrad; Violante, Massimo; Raik, Jaan; Jenihhin, Maksim
      In: Proceedings - 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018
      IEEE
      21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018 (hun) 2018
      pp.6 (pp.67-72) ISBN:9781538657546 DOI:10.1109/DDECS.2018.00-10

  28. Rice Coding-Based Lite Compression Algorithm with Controlled Error for Sensor Data
      proceeding
      

      Avramenko, Serhiy; Esposito, Stefano; Violante, Massimo
      In: IEEE International Workshop on Metrology for AeroSpace (MetroAeroSpace)
      IEEE
      IEEE International Workshop on Metrology for AeroSpace (MetroAeroSpace)
      pp.5 (pp.6-10) ISBN:9781538624746 DOI:10.1109/MetroAeroSpace.2018.8453565

  29. Computer-Aided Design of Multi-Agent Cyber-Physical Systems
      proceeding
      

      Sini, Jacopo; Violante, Massimo; Dessì, Riccardo
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      23rd International Conference on Emerging Technologies and Factory Automation (ETFA) (Torino (Italy)) September 4-7, 2018
      pp.8 DOI:10.1109/ETFA.2018.8502448

  30. Towards an automatic approach for hardware verification according to ISO 26262 functional safety standard
      proceeding
      

      Sini, Jacopo; Sonza Reorda, Matteo; Violante, Massimo; Sarson, Peter
      In: Proceedings of 24th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS)
      IEEE
      24th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) (Platja d’Aro, Costa Brava (ESP)) July 2-4, 2018
      pp.4 DOI:10.1109/IOLTS.2018.8474083

  31. Real-Time Validation of Fault-Tolerant Mixed-Criticality Systems
      proceeding
      

      Esposito, Stefano; Sini, Jacopo; Violante, Massimo
      In: Titolo volume non avvalorato
      IEEE
      24th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) (Platja d’Aro, Costa Brava, Spain) July 2-4, 2018
      pp.2 DOI:10.1109/IOLTS.2018.8474091

  32. An Automatic Approach to Perform FMEDA Safety Assessment on Hardware Designs
      proceeding
      

      Sini, Jacopo; Violante, Massimo
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      24th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) (Platja d’Aro, Costa Brava, Spain) July 2-4, 2018
      pp.4 DOI:10.1109/IOLTS.2018.8474217

  33. Development flow of on-line Software Test Libraries for asynchronous processor cores
      proceeding
      

      Floridia, Andrea; Ernesto, Sanchez; Andrikos, Nikos
      In: 2018 IEEE 24th International Symposium on On-Line Testing and Robust System Design (IOLTS)
      IEEE
      2018 IEEE 24th International Symposium on On-Line Testing and Robust System Design (IOLTS) (Platja d’Aro (Spain)) 2-4 July 2018
      Vol.2018 pp.6 DOI:10.1109/IOLTS.2018.8474126

  34. About the functional test of the GPGPU scheduler
      proceeding
      

      Du, B.; RODRIGUEZ CONDIA, JOSIE ESTEBAN; Sonza Reorda, M.; Sterpone, L.
      In: Titolo volume non avvalorato
      IEEE Xplorer
      24th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS 2018) (Hotel Cap Roig, Platja d’Aro, Costa Brava, Spain) July 2-4, 2018
      DOI:10.1109/IOLTS.2018.8474174

  35. Assessing Test Procedure Effectiveness for Power Devices
      proceeding
      

      Piumatti, Davide; Sonza Reorda, M.
      In: 33th IEEE Conference on Design of Circuits and Integrated Systems
      IEEE DCIS 2019 (FRANCIA)
      33th IEEE Conference on Design of Circuits and Integrated Systems (Lione, Francia) November 14-16 2018
      Vol.2018 pp.6 (pp.1-6) ISBN:9781728101712 DOI:10.1109/DCIS.2018.8681495

  36. Workshops at PPSN 2018
      proceeding
      

      Purshouse, Robin; Zarges, Christine; Cussat-Blanc, Sylvain; Epitropakis, Michael G.; Gallagher, Marcus; Jansen, Thomas; Kerschke, Pascal; Li, Xiaodong; Lobo, Fernando G.; Miller, Julian; Oliveto, Pietro S.; Preuss, Mike; Squillero, Giovanni; Tonda, Alberto; Wagner, Markus; Weise, Thomas; Wilson, Dennis; Wróbel, Borys; Zamuda, Aleš
      LECTURE NOTES IN ARTIFICIAL INTELLIGENCE
      In: PPSN 2018: Parallel Problem Solving from Nature – PPSN XV
      Springer
      Parallel Problem Solving from Nature
      Vol.11102 pp.8 (pp.490-497) ISBN:9783319992587 DOI:10.1007/978-3-319-99259-4_39

  37. Problems of a Software Test Library for Multicore System-On-Chip
      altro
      

      Bernardi, P.; Floridia, A.; Piumatti, D.; Sanchez, E.; De Luca, S.; Sansonetti, A.
      In: Proceedings of the 6 th Prague Embedded Systems Workshop
      PESW18 (REPUBBLICA CECA)
      6 th Prague Embedded Systems Workshop (Praga) June 28-30, 2018
      Vol.Proceedings of the 6 th Prague Embedded Systems Workshop pp.2 (pp.4-5) ISBN:9788001064566

  38. Parallel software-based self-test suite for multi-core system-on-chip: Migration from single-core to multi-core automotive microcontrollers
      proceeding
      

      Floridia, A.; Piumatti, D.; Sanchez, E.; De Luca, S.; Sansonetti, A.
      In: 2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)
      IEEE
      2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) (Taormina, Italy) 9-12 April 2018
      pp.6 (pp.1-6) ISBN:9781538652916 DOI:10.1109/DTIS.2018.8368558

  39. Evaluating surrogate models for multi-objective influence maximization in social networks
      proceeding
      

      Bucur, Doina; Iacca, Giovanni; Marcelli, Andrea; Squillero, Giovanni; Tonda, Alberto
      In: GECCO 2018 Companion - Proceedings of the 2018 Genetic and Evolutionary Computation Conference Companion
      Association for Computing Machinery, Inc
      2018 Genetic and Evolutionary Computation Conference, GECCO 2018 (jpn) 2018
      pp.8 (pp.1258-1265) ISBN:9781450357647 DOI:10.1145/3205651.3208238

  40. Promoting diversity in evolutionary optimization: Why and how
      altro
      

      Squillero, Giovanni; Tonda, Alberto
      pp.19 (pp.998-1016) DOI:10.1145/3205651.3207878

  41. About on-line functionally untestable fault identification in microprocessor cores for safety-critical applications
      proceeding
      

      Cantoro, R.; Firrincieli, Andrea; Piumatti, D.; Restifo, M.; Sanchez, E.; Reorda, M. Sonza
      In: 2018 IEEE 19th Latin-American Test Symposium, LATS 2018
      Institute of Electrical and Electronics Engineers Inc.
      19th IEEE Latin-American Test Symposium, LATS 2018 (bra) 2018
      Vol.2018- pp.6 (pp.1-6) ISBN:9781538614723 DOI:10.1109/LATW.2018.8349679

  42. Test of Reconfigurable Modules in Scan Networks
      articolo
      

      Cantoro, Riccardo; Ghani Zadegan, Farrokh; Palena, Marco; Pasini, Paolo; Larsson, Erik; Sonza Reorda, Matteo
      IEEE TRANSACTIONS ON COMPUTERS
      IEEE Computer Society
      pp.12 ISSN:0018-9340 DOI:10.1109/TC.2018.2834915

  43. An evolutionary technique for reducing the duration of reconfigurable scan network test
      proceeding
      

      Cantoro, Riccardo; San Paolo, Luigi; Sonza Reorda, Matteo; Squillero, Giovanni
      In: Proceedings - 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018
      Institute of Electrical and Electronics Engineers Inc.
      21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018 (hun) 2018
      pp.6 (pp.129-134) ISBN:9781538657546 DOI:10.1109/DDECS.2018.00030

  44. VALIS: an evolutionary classification algorithm
      articolo
      

      Karpov, Peter; Squillero, Giovanni; Tonda, Alberto
      GENETIC PROGRAMMING AND EVOLVABLE MACHINES
      Springer
      Vol.14 pp.19 (pp.1-19) ISSN:1389-2576 DOI:10.1007/s10710-018-9331-6

  45. Nonlinear predictive threshold model for real-time abnormal gait detection
      articolo
      

      Hemmatpour, Masoud; Ferrero, Renato; Gandino, Filippo; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      JOURNAL OF HEALTHCARE ENGINEERING
      Hindawi
      Vol.2018 pp.9 ISSN:2040-2295 DOI:10.1155/2018/4750104

  46. COMET: a Configuration Memory Tool to Analyze, Visualize and Manipulate FPGAs Bitstream
      proceeding
      

      Bozzoli, Ludovica; Sterpone, Luca
      In: ARCS Workshop 2018; 31th International Conference on Architecture of Computing Systems
      VDE
      ARCS Workshop 2018; 31th International Conference on Architecture of Computing Systems
      

  47. On the Mitigation of Single Event Transients on Flash-based FPGAs
      proceeding
      

      Azimi, Sarah; Du, Boyang; Sterpone, Luca
      In: IEEE European Test Symposium (ETS)
      IEEE
      IEEE European Test Symposium (ETS 2018) (Bremen, Germany) 28 May- 01 June, 2018
      pp.2 DOI:10.1109/ETS.2018.8400715

  48. A Zero-Timing Overhead SET Mitigation Approach for Flash-based FPGAs
      proceeding
      

      Azimi, Sarah; Du, Boyang; Sterpone, Luca
      In: IEEE Radiation and its Effects on Component and Systems 2018
      IEEE
      IEEE Radiation and its Effects on Component and Systems - RADECS 2018 (Gothenburg- Sweden) 16-21 September 2018
      pp.4 DOI:10.1109/RADECS45761.2018.9328665

  49. SETA: A CAD tool for Single Event Transient Analysis and Mitigation on Flash-based FPGAs
      proceeding
      

      Azimi, Sarah; Du, Boyang; Sterpone, Luca; MERODIO CODINACHS, David; Cattaneo, Luca
      In: Proceedings of the 2018 15th IEEE International Conference on Synthesis, modeling, analysis and Simulation methods and applications to circuit design
      IEEE
      15th IEEE International Conference on Synthesis, modeling, analysis and Simulation methods and applications to circuit design (Prague, Czech Republic) 2 July- 5 July 2018
      pp.4 (pp.49-52) DOI:10.1109/SMACD.2018.8434897

  50. An automatic approach to integration testing for critical automotive software
      proceeding
      

      Sini, J.; Mugoni, A.; Violante, M.; Quario, A.; Argiri, C.; Fusetti, F.
      In: 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)
      IEEE (STATI UNITI D'AMERICA)
      13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) (Taormina (IT))
      pp.2 (pp.1-2) ISBN:9781538652916 DOI:10.1109/DTIS.2018.8368563

  51. A fuzzy approach for power savings in both infrastructure and ad hoc WLANs
      articolo
      

      Collotta, Mario; Ferrero, Renato; Rebaudengo, Maurizio
      COMPUTERS IN INDUSTRY
      Elsevier
      Vol.99 pp.10 (pp.183-192) ISSN:0166-3615 DOI:10.1016/j.compind.2018.03.031

  52. Defeating hardware Trojan in microprocessor cores through software obfuscation
      proceeding
      

      Marcelli, Andrea; Sanchez, Ernesto; Squillero, Giovanni; Jamal, Muhammad Usman; Imtiaz, Afnan; Machetti, Simone; Mangani, Filippo; Monti, Paolo; Pola, Davide; Salvato, Alessandro; Simili, Michele
      In: Proceedings 19th IEEE Latin American Test Symposium (LATS), 2018
      ieee (STATI UNITI D'AMERICA)
      IEEE 19th Latin-American Test Symposium (LATS), 2018
      pp.6 (pp.1-6) ISBN:9781538614723 DOI:10.1109/LATW.2018.8349680

  53. Mixed public and secret-key cryptography for wireless sensor networks
      proceeding
      

      Griotti, Mattia; Gandino, Filippo; Rebaudengo, Maurizio
      In: Titolo volume non avvalorato
      IEEE
      The Tenth International Conference on Mobile Computing and Ubiquitous Networking (Toyama, Japan) October 3-5, 2017
      pp.6 DOI:10.23919/ICMU.2017.8330094

  54. Fast partial reconfiguration on SRAM-based FPGAs: A frame-driven routing approach
      proceeding
      

      Sterpone, Luca; Bozzoli, Ludovica
      In: Applied Reconfigurable Computing. Architectures, Tools, and Applications
      Springer Verlag
      14th International Symposium on Applied Reconfigurable Computing, ARC 2018 (grc) 2018
      Vol.10824 pp.12 (pp.319-330) ISBN:9783319788890 DOI:10.1007/978-3-319-78890-6_26

  55. RTOS for mixed criticality applications deployed on NoC-based COTS MPSoC
      proceeding
      

      Esposito, Stefano; Avramenko, Serhiy; Violante, Massimo
      In: Test Symposium (LATS), 2018 IEEE 19th Latin-American
      IEEE
      Test Symposium (LATS), 2018 IEEE 19th Latin-American (Sao Paulo, Brasile)
      pp.6 (pp.1-6) ISBN:9781538614723 DOI:10.1109/LATW.2018.8347239

  56. Real-time validation of mixed-criticality applications
      proceeding
      

      Esposito, S.; Sini, J.; Violante, M.
      In: Test Symposium (LATS), 2018 IEEE 19th Latin-American
      IEEE
      Test Symposium (LATS), 2018 IEEE 19th Latin-American (Sao Paulo, Brasile)
      pp.6 (pp.1-6) ISBN:9781538614723 DOI:10.1109/LATW.2018.8349683

  57. IbIS: Interface-based Interconnection Structure for Dynamically Reconfigurable FPGAs
      proceeding
      

      Bozzoli, Ludovica; Sterpone, Luca
      In: IEEE International Symposium on Circuits and Systems (ISCAS), 2018
      IEEE
      IEEE International Symposium on Circuits and Systems (ISCAS), 2018
      ISBN:9781538648810 DOI:10.1109/ISCAS.2018.8351162

  58. Automated Playtesting in Collectible Card Games using Evolutionary Algorithms: a Case Study in HearthStone
      articolo
      

      García-Sánchez, P.; Tonda, Alberto; Mora, Antonio M.; Squillero, Giovanni; Merelo, Juan J.
      KNOWLEDGE-BASED SYSTEMS
      Elsevier
      pp.33 ISSN:0950-7051 DOI:10.1016/j.knosys.2018.04.030

  59. Internet of Things for fall prediction and prevention
      articolo
      

      Hemmatpour, Masoud; Ferrero, Renato; Gandino, Filippo; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      JOURNAL OF COMPUTATIONAL METHODS IN SCIENCE AND ENGINEERING
      IOS Press
      Vol.18 pp.8 (pp.511-518) ISSN:1472-7978 DOI:10.3233/JCM-180806

  60. An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In
      articolo
      

      Appello, Davide; Bernardi, Paolo; Cantoro, Riccardo; Colazzo, Andrea; Motta, Alessandro; Pagani, Alberto; Pollaccia, Giorgio; Restifo, Marco; Ernesto, Sanchez; Venini, Federico
      JOURNAL OF LOW POWER ELECTRONICS
      American Scientific Publishers
      pp.13 (pp.86-98) ISSN:1546-1998 DOI:10.1166/jolpe.2018.1542

  61. Adaptive Management Techniques for Optimized Burn-In of Safety-Critical SoC
      articolo
      

      Appello, Davide; Bernardi, Paolo; Bugeja, Conrad; Cantoro, Riccardo; Pollaccia, Giorgio; Restifo, Marco; Venini, Federico
      JOURNAL OF ELECTRONIC TESTING
      Springer
      Vol.34 pp.10 (pp.43-52) ISSN:0923-8174 DOI:10.1007/s10836-018-5705-1

  62. An Optimized Test During Burn-In for Automotive SoC
      articolo
      

      Appello, Davide; Bernardi, Paolo; Bugeja, Conrad; Cantoro, Riccardo; Pollaccia, Giorgio; Restifo, Marco; Ernesto, Sanchez; Venini, Federico
      IEEE DESIGN & TEST
      IEEE
      pp.8 (pp.46-53) ISSN:2168-2356 DOI:10.1109/MDAT.2018.2799807

  63. Analysis of random geometric graph for wireless network configuration
      proceeding
      

      Ferrero, Renato; Gandino, Filippo
      In: Proceedings of the 10th International Conference on Mobile Computing and Ubiquitous Networking
      IEEE (STATI UNITI D'AMERICA)
      10th International Conference on Mobile Computing and Ubiquitous Networking (Toyama, Japan) October 3-5, 2017
      pp.6 (pp.1-6) ISBN:9784907626327 DOI:10.23919/ICMU.2017.8330075

  64. Data Reduction Techniques for Near Real-Time Decision Making in Fall Prediction Systems
      capitolo
      

      Hemmatpour, Masoud; Ferrero, Renato; Gandino, Filippo; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      Exploration of Healthcare Using Data Mining Techniques
      IGI GLOBAL (STATI UNITI D'AMERICA)
      pp.13 (pp.52-64) ISBN:9781522552222 DOI:10.4018/978-1-5225-5222-2.ch004

  65. Urban Dust Monitoring From Ground Level to Last Floor
      proceeding
      

      Ferrero, Renato; Gandino, Filippo; Hemmatpour, Masoud; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      In: Proceedings of the 2017 10th International Conference on Mobile Computing and Ubiquitous Network (ICMU)
      IEEE
      2017 10th International Conference on Mobile Computing and Ubiquitous Networking (ICMU) (Toyama, Japan) October 3-5, 2017
      pp.4 (pp.1-4) ISBN:9784907626310 DOI:10.23919/ICMU.2017.8330072

  66. Cost Evaluation of Synchronization Algorithms for Multicore Architectures
      capitolo
      

      Hemmatpour, Masoud; Ferrero, Renato; Gandino, Filippo; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      Encyclopedia of Information Science and Technology, Fourth Edition
      IGI GLOBAL (STATI UNITI D'AMERICA)
      pp.15 (pp.3989-4003) ISBN:9781522522553 DOI:10.4018/978-1-5225-2255-3.ch346

  67. OLT(RE)2: an On-Line on-demand Testing approach for permanent Radiation Effects in REconfigurable systems
      articolo
      

      Dario, Cozzi; Sebastian, Korf; Luca, Cassano; Jens, Hagemeyer; Andrea, Domenici; Cinzia, Bernardeschi; Mario, Porrmann; Sterpone, Luca
      IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING
      IEEE
      Vol.6 pp.13 (pp.511-523) ISSN:2168-6750 DOI:10.1109/TETC.2016.2586195

  68. Scan-Chain Intra-Cell Aware Testing
      articolo
      

      Touati, Aymen; Bosio, Alberto; Girard, Patrick; Virazel, Arnaud; Bernardi, Paolo; SONZA REORDA, Matteo; Auvray, Etienne
      IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING
      IEEE
      pp.11 ISSN:2168-6750 DOI:10.1109/TETC.2016.2624311

  69. A cost-effective proposal for an RFID-based system for agri-food traceability
      articolo
      

      Ferrero, Renato; Gandino, Filippo; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      INTERNATIONAL JOURNAL OF AD HOC AND UBIQUITOUS COMPUTING
      inderscience publischers
      Vol.27 pp.11 (pp.270-280) ISSN:1743-8225 DOI:10.1504/IJAHUC.2018.090598

  2017

  1. Welcome note from the technical program chairs
     capitolo
     

     Maniatakos, M.; Reorda, M. S.
     IEEE/IFIP International Conference on VLSI and System-on-Chip, VLSI-SoC
     IEEE Computer Society
     pp.2 (pp.1-2) ISBN:9781538628805 DOI:10.1109/VLSI-SoC.2017.8203445

  2. An FPGA-based dynamically reconfigurable platform for emulation of permanent faults in ASICs
     articolo
     

     Ullah, A.; Sanchez, E.; Sterpone, L.; Cardona, L. A.; Ferrer, C.
     MICROELECTRONICS RELIABILITY
     Elsevier Ltd
     Vol.75 pp.11 (pp.110-120) ISSN:0026-2714 DOI:10.1016/j.microrel.2017.06.032

  3. Hardening Approach for the Scheduler's Kernel Data Structures
     proceeding
     

     Velasco, ALEJANDRO DAVID; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
     In: ARCS 2017; 30th International Conference on Architecture of Computing Systems
     VDE VERLAG GMBH (GERMANIA)
     30th International Conference on Architecture of Computing Systems (Vienna) 3-6 April 2017
     pp.4 (pp.32-35) ISBN:9783800743957

  4. Fault tolerant electronic system design
     proceeding
     

     Du, Boyang; Sterpone, Luca
     In: Proceedings - International Test Conference
     Institute of Electrical and Electronics Engineers Inc.
     48th IEEE International Test Conference, ITC 2017 (Forth Worth Convention Center, usa) 2017
     Vol.2017- pp.6 (pp.1-6) ISBN:9781538634134 DOI:10.1109/TEST.2017.8242080

  5. On the Development of a High-Level Fault Simulator for the Analysis of Performance Faults on Speculative Modules
     proceeding
     

     Floridia, Andrea; Margelli, R; Sanchez, E
     In: Proceedings 18th IEEE Latin American Test Symposium (LATS), 2017
     IEEE (STATI UNITI D'AMERICA)
     18th IEEE Latin American Test Symposium (LATS), 2017
     pp.6 (pp.1-6) ISBN:9781538604151 DOI:10.1109/LATW.2017.7906746

  6. Improving stress quality for SoC using faster-than-at-speed execution of functional programs
     capitolo
     

     Bernardi, Paolo; Bosio, Alberto; Di Natale, Giorgio; Guerriero, Andrea; Sanchez, Ernesto; Venini, Federico
     IFIP Advances in Information and Communication Technology
     Springer New York LLC
     Vol.508 pp.22 (pp.130-151) ISBN:9783319671031 DOI:10.1007/978-3-319-67104-8_7

  7. Nanotechnologies Testing
     capitolo
     

     SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
     Nanoelectronics: Materials, Devices, Applications
     Wiley (GERMANIA)
     pp.20 (pp.427-446) ISBN:9783527800728 DOI:10.1002/9783527800728.ch17

  8. A novel tool-flow for zero-overhead cross-domain error resilient partially reconfigurable X-TMR for SRAM-based FPGAs
     articolo
     

     Sterpone, Luca; Andres Cardona, Luis; Ullah, Anees; Ferrer, Carles
     JOURNAL OF SYSTEMS ARCHITECTURE
     Elsevier
     Vol.81 pp.9 (pp.112-120) ISSN:1383-7621 DOI:10.1016/j.sysarc.2017.10.009

  9. Development and Assessment of Pressure-Based and Model-Based Techniques for the MFB50 Control of a Euro VI 3.0L Diesel Engine
     articolo
     

     Finesso, Roberto; Marello, Omar; Misul, DANIELA ANNA; Spessa, Ezio; Violante, Massimo; Yang, Yixin; Hardy, Gilles; Maier, Christian
     SAE INTERNATIONAL JOURNAL OF ENGINES
     SAE International
     Vol.10 pp.18 (pp.1538-1555) ISSN:1946-3944 DOI:10.4271/2017-01-0794

  10. On the Optimization of SBST Test Program Compaction
      proceeding
      

      Cantoro, Riccardo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Squillero, Giovanni; Valea, Emanuele
      In: Titolo volume non avvalorato
      IEEE
      IEEE International Symposium On Defect And Fault Tolerance In VLSI And Nanotechnology Systems (DFTS) (Cambridge (UK)) October 23-25, 2017
      pp.4 (pp.1-4) DOI:10.1109/DFT.2017.8244444

  11. Automated Test Program Reordering for Efficient SBST
      proceeding
      

      Cantoro, Riccardo; Cetrulo, E.; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Voza, A.
      In: Titolo volume non avvalorato
      IEEE
      Design of Circuits and Integrated Systems Conference (DCIS2017) (Barcelona) 22-24 November 2017
      pp.6 (pp.1-6) DOI:10.1109/DCIS.2017.8311634

  12. Software-Based Self-Test Techniques for Dual-Issue Embedded Processors
      articolo
      

      Bernardi, Paolo; Cantoro, Riccardo; De Luca, Sergio; SANCHEZ SANCHEZ, EDGAR ERNESTO; Sansonetti, Alessandro; Squillero, Giovanni
      IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING
      IEEE
      pp.14 ISSN:2168-6750 DOI:10.1109/TETC.2017.2758641

  13. Self rerouting of dynamically reconfigurable SRAM-based FPGAs
      proceeding
      

      Bozzoli, Ludovica; Sterpone, Luca
      In: IEEE Adaptive Hardware and Systems (AHS), 2017 NASA/ESA Conference
      IEEE
      IEEE Adaptive Hardware and Systems (AHS), 2017 NASA/ESA Conference
      pp.8 (pp.77-84) ISBN:9781538634394 DOI:10.1109/AHS.2017.8046362

  14. DIIG: A Distributed Industrial IoT Gateway
      proceeding
      

      Hemmatpour, Masoud; GHAZI VAKILI, Mohammad; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      Computer Software and Applications Conference (COMPSAC) (Torino) 4-8 June 2017
      Vol.1 pp.5 (pp.755-759) DOI:10.1109/COMPSAC.2017.110

  15. Polynomial classification model for real-time fall prediction system
      proceeding
      

      Hemmatpour, Masoud; Karimshoushtari, Milad; Ferrero, Renato; Montrucchio, Bartolomeo; Rebaudengo, Maurizio; Novara, Carlo
      In: Proceedings of the 2017 IEEE 41st Annual Computer Software and Applications Conference (COMPSAC)
      IEEE (STATI UNITI D'AMERICA)
      2017 IEEE 41st Annual Computer Software and Applications Conference (COMPSAC) (Torino) 4-8 June 2017
      Vol.1 pp.6 (pp.973-978) DOI:10.1109/COMPSAC.2017.189

  16. System-level architecture for mixed criticality applications on MPSoC: A space application
      proceeding
      

      Esposito, Stefano; Violante, Massimo
      In: 4th IEEE International Workshop on Metrology for AeroSpace, MetroAeroSpace 2017 - Proceedings
      Institute of Electrical and Electronics Engineers Inc.
      4th IEEE International Workshop on Metrology for AeroSpace, MetroAeroSpace 2017 (Padova (IT)) 2017
      pp.5 (pp.479-483) ISBN:9781509042340 DOI:10.1109/MetroAeroSpace.2017.7999621

  17. A probe-based SEU detection method for SRAM-based FPGAs
      articolo
      

      Sterpone, Luca; Boragno, Luca
      MICROELECTRONICS RELIABILITY
      Elsevier Ltd
      Vol.76-77C pp.5 (pp.154-158) ISSN:0026-2714 DOI:10.1016/j.microrel.2017.07.077

  18. Analysis of Radiation-induced Cross Domain Errors in TMR Architectures on SRAM-based FPGAs
      proceeding
      

      Sterpone, Luca; Boragno, Luca
      In: IOLTS
      IEEE
      International On-Line Testing and Robust System Design Symposium (Thessaloniki) July 3-5, 2017
      pp.6 (pp.174-179) DOI:10.1109/IOLTS.2017.8046214

  19. Towards Making Fault Injection on Abstract Models a More Accurate Tool for Predicting RT-Level Effects
      proceeding
      

      Flenker, Tino; Malburg, Jan; Fey, Goerschwin; Avramenko, Serhiy; Violante, Massimo; SONZA REORDA, Matteo
      In: Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI
      IEEE Computer Society
      2017 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2017 (deu) 2017
      Vol.2017- pp.6 (pp.533-538) ISBN:9781509067626 DOI:10.1109/ISVLSI.2017.99

  20. Deterministic Network On Chip for Deploying Real Time Applications on Many-core Processors
      proceeding
      

      Esposito, Stefano; Violante, Massimo
      In: Titolo volume non avvalorato
      IEEE
      2017 IEEE 23rd International Symposium on On-Line Testing and Robust Systems Design (Salonicco (GR)) 3-5 Luglio 2017
      pp.4 (pp.21-24) ISBN:9781538603529 DOI:10.1109/IOLTS.2017.8046172

  21. New techniques for functional testing of microprocessor based systems
      tesi dottorato
      

      Cantoro, Riccardo
      Politecnico di Torino
      pp.213 DOI:10.6092/polito/porto/2680228

  22. Effective Characterization of Radiation-induced SET on Flash-based FPGAs
      proceeding
      

      Sterpone, Luca; Azimi, Sarah
      In: IEEE RADECS 2017
      IEEE
      Radiation Effects on Components & Systems Conference (Geneva, Switzerland) 2-6 October 2017
      pp.4

  23. A new approach for Total Ionizing Dose effect analysis on Flash-based FPGA
      articolo
      

      Zhang, Qiutao; Azimi, Sarah; LA VACCARA, Germano; Sterpone, Luca; Du, Boyang
      MICROELECTRONICS RELIABILITY
      Elsevier
      Vol.76-77 pp.6 (pp.58-63) ISSN:0026-2714 DOI:10.1016/j.microrel.2017.07.066

  24. Defeating Hardware Trojan through Software Obfuscation
      proceeding
      

      Marcelli, Andrea; Restifo, Marco; SANCHEZ SANCHEZ, EDGAR ERNESTO; Squillero, Giovanni
      In: Informal proceedings online on the web page of the RESCUE 2017 workshop
      -
      RESCUE 2017 - Workshop on Reliability, Security and Quality (Limassol, Cyprus) May 25-26, 2017
      

  25. Reliability evaluation of heterogeneous systems-on-chip for automotive ECUs
      proceeding
      

      Azimi, Sarah; Moramarco, Annarita; Sterpone, Luca
      In: IEEE ISIE 2017
      IEEE
      IEEE 26th International Symposium on Industrial Electronics (ISIE), 2017 (Edinburgh, United Kingdom) 19-21 June 2017
      pp.6 (pp.1291-1296) ISBN:9781509014125 DOI:10.1109/ISIE.2017.8001431

  26. On-Line Software-based Self-Test for ECC of Embedded RAM Memories
      proceeding
      

      Restifo, Marco; Bernardi, Paolo; DE LUCA, Sergio; Sansonetti, Alessandro
      In: Symposium on Defect and Fault TOlerance in VLSI and Nanotechnology Systems
      Institute of Electrical and Electronics Engineers (STATI UNITI D'AMERICA)
      Symposium on Defect and Fault TOlerance in VLSI and Nanotechnology Systems (Cambridge (UK)) 2017
      pp.6 (pp.1-6)

  27. An effective diversity promotion mechanism in grammatical evolution
      proceeding
      

      Medvet, Eric; Bartoli, Alberto; Squillero, Giovanni
      In: Proceedings of the Genetic and Evolutionary Computation Conference Companion
      ACM (STATI UNITI D'AMERICA)
      GECCO 2017 (Berlin)
      pp.2 (pp.247-248) ISBN:9781450349390 DOI:10.1145/3067695.3076057

  28. Online monitoring soft errors in reconfigurable FPGA during radiation test
      proceeding
      

      Du, Boyang; Sterpone, Luca
      In: 2017 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceeding Papers
      IEEE
      Instrumentation and Measurement Technology Conference (I2MTC) (22-25 May 2017) Turin (ITA)
      pp.5 (pp.1-5) ISBN:9781509035960 DOI:10.1109/I2MTC.2017.7969976

  29. A key management scheme for mobile wireless sensor networks
      articolo
      

      Gandino, Filippo; Celozzi, Cesare; Rebaudengo, Maurizio
      APPLIED SCIENCES
      MDPI
      Vol.7 pp.17 (pp.1-17) ISSN:2076-3417 DOI:10.3390/app7050490

  30. A Low-Cost Solution for the Monitoring of Air Pollution Parameters Through Bicycles
      proceeding
      

      Aicardi, Irene; Gandino, Filippo; Grasso, Nives; Lingua, Andrea Maria; Noardo, Francesca
      LECTURE NOTES IN COMPUTER SCIENCE
      In: Computational Science and Its Applications – ICCSA 2017
      Springer International Publishing (GERMANIA)
      The 17th International Conference on Computational Science and Its Applications (ICCSA 2017) (Trieste, Italy) July 3 - 6, 2017
      Vol.10407 pp.16 (pp.105-120) ISSN:0302-9743 ISBN:9783319624006 DOI:10.1007/978-3-319-62401-3_9

  31. Micro Latch-up Analysis on Ultra- Nanometer VLSI Technologies: A new Monte Carlo Approach
      proceeding
      

      Sterpone, Luca; Azimi, Sarah
      In: IEEE Computer Society Annual Symposium on VLSI
      IEEE
      IEEE Computer Society Annual Symposium on VLSI, ISVLSI (Bochum, Germany) 3-5 July
      pp.6 (pp.338-343) DOI:10.1109

  32. TMR technique for mutex kernel data structures
      proceeding
      

      Velasco, ALEJANDRO DAVID; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      In: LATS 2017 - 18th IEEE Latin-American Test Symposium
      IEEE
      18th IEEE Latin-American Test Symposium, LATS 2017 (Bogota (Colombia)) 13-15 March 2017
      pp.6 (pp.1-6) DOI:10.1109/LATW.2017.7906745

  33. On the in-field test of embedded memories
      proceeding
      

      Bernardi, Paolo; Restifo, Marco; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
      In: 23rd IEEE International Symposium on On-Line Testing and Robust System Design
      IEEE
      23rd IEEE International Symposium on On-Line Testing and Robust System Design
      

  34. Robustness in Automotive Electronics: an industrial overview of major concerns
      proceeding
      

      Backhausen, Ulrich; Ballan, Oscar; Bernardi, Paolo; Luca, Sergio De; Henzler, Julie; Kern, Thomas; Piumatti, Davide; Rabenalt, Thomas; Ramamoorthy, Krishnapriya Chakiat; SANCHEZ SANCHEZ, EDGAR ERNESTO; Sansonetti, Alessandro; Ullmann, Rudolf; Venini, Federico; Wiesner, Robert
      In: 23rd IEEE International Symposium on On-Line Testing and Robust System Design
      IEEE
      23rd IEEE International Symposium on On-Line Testing and Robust System Design
      

  35. On the In-field Testing of Spare Modules in Automotive Microprocessors
      proceeding
      

      Piumatti, Davide; Bernardi, Paolo; SANCHEZ SANCHEZ, EDGAR ERNESTO; Regis, Simone; Luca, Segio De; Sansonetti, Alessandro
      In: 25th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)
      IFIP/IEEE
      25th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)
      

  36. Effective Mitigation of Radiation-induced Single Event Transient on Flash-based FPGAs
      proceeding
      

      Azimi, Sarah; Du, Boyang; Sterpone, Luca; Merodio Codinachs, David; Grimoldi, Raoul
      In: GLSVLSI '17 Proceedings of the on Great Lakes Symposium on VLSI 2017
      ACM
      GLSVLSI '17 (Banff, Alberta, Canada) May 10 - 12, 2017
      pp.6 (pp.203-208) ISBN:9781450349727 DOI:10.1145/3060403.3060454

  37. HAIT: Heap Analyzer with Input Tracing
      proceeding
      

      Atzeni, Andrea; Marcelli, Andrea; Muroni, Francesco; Squillero, Giovanni
      In: Proceedings of the 14th International Joint Conference on e-Business and Telecommunications - Volume 6: SECRYPT
      SCITEPRESS
      SECRYPT 2017 (Madrid, Spain) 24-26 Luglio 2017
      Vol.Proceedings of the 14th International Joint Conference on e-Business and Telecommunications - Volume 6: SECRYPT pp.8 (pp.327-334) ISBN:9789897582592 DOI:10.5220/0006420803270334

  38. An automatic approach to perform the verification of hardware designs according to the ISO26262 functional safety standard
      proceeding
      

      Bagalini, Enea; Sini, Jacopo; SONZA REORDA, Matteo; Violante, Massimo; Klimesch, Herwig; Sarson, Peter
      In: Titolo volume non avvalorato
      IEEE
      Test Symposium (LATS), 2017 18th IEEE Latin American (Bogotà) 13-15 March 2017
      pp.6 (pp.1-6) DOI:10.1109/LATW.2017.7906760

  39. A Novel Method for Online Detection of Faults Affecting Execution-Time in Multicore-Based Systems
      articolo
      

      Esposito, Stefano; Violante, Massimo; Sozzi, Marco; Terrone, Marco; Traversone, Massimo
      ACM TRANSACTIONS ON EMBEDDED COMPUTING SYSTEMS
      ACM
      Vol.16 pp.19 (pp.1-19) ISSN:1539-9087 DOI:10.1145/3063313

  40. BASTION: Board and SoC test instrumentation for ageing and no failure found
      proceeding
      

      Jutman, Artur; Lotz, Christophe; Larsson, Erik; SONZA REORDA, Matteo; Jenihhin, Maksim; Raik, Jaan; Kerkhoff, Hans; Krenz Baath, Rene; Engelke, Piet
      In: 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE)
      ieee
      2017 Design, Automation & Test in Europe Conference & Exhibition (DATE) (Lausanne, Switzerland) March 2017
      pp.6 (pp.115-120) ISBN:9783981537086 DOI:10.23919/DATE.2017.7926968

  41. Microprocessor Testing: Functional Meets Structural Test
      articolo
      

      Touati, A.; Girard, P.; Virazel, A.; Bosio, Alberto; Bernardi, Paolo; SONZA REORDA, Matteo
      JOURNAL OF CIRCUITS, SYSTEMS, AND COMPUTERS
      World Scientific Publishing Company
      Vol.26 pp.18 (pp.1-18) ISSN:0218-1266 DOI:10.1142/S0218126617400072

  42. An Effective Fault-Injection Framework for Memory Reliability Enhancement Perspectives
      proceeding
      

      Harcha, Ghita; Girard, Patrick; Virazel, Arnaud; Bosio, Alberto; Bernardi, Paolo
      In: Design &Technology of Integrated Systems in Nanoscale Era
      IEEE
      Design &Technology of Integrated Systems in Nanoscale Era
      

  43. On the detection of board delay faults through the execution of functional programs
      proceeding
      

      An, G.; Cantoro, Riccardo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      IEEE
      2017 18th IEEE Latin American Test Symposium (LATS) (Bogota (CO)) 13-15 March 2017
      pp.6 (pp.1-6) ISBN:9781538604151 DOI:10.1109/LATW.2017.7906759

  44. A DMA and CACHE-based stress schema for burn-in of automotive microcontroller
      proceeding
      

      Bernardi, Paolo; Cantoro, Riccardo; Gianotto, L.; Restifo, Marco; SANCHEZ SANCHEZ, EDGAR ERNESTO; Venini, Federico; Appello, D.
      In: Titolo volume non avvalorato
      IEEE
      2017 18th IEEE Latin American Test Symposium (LATS) (Bogota (CO)) 13-15 March 2017
      pp.6 (pp.1-6) ISBN:9781538604151 DOI:10.1109/LATW.2017.7906767

  45. Applications of Evolutionary Computation (Part II)
      curatela
      

      Squillero, Giovanni; Sim, Kevin
      LECTURE NOTES IN COMPUTER SCIENCE
      Springer International Publishing
      Vol.2 pp.243 (pp.1-243) ISSN:0302-9743 ISBN:9783319558493

  46. Applications of Evolutionary Computation (Part I)
      curatela
      

      Squillero, Giovanni; Sim, Kevin
      LECTURE NOTES IN COMPUTER SCIENCE
      Springer International Publishing
      Vol.1 pp.905 (pp.1-905) ISSN:0302-9743 ISBN:9783319558486

  47. Adaptive Batteries Exploiting On-Line Steady-State Evolution Strategy
      proceeding
      

      Fadda, Edoardo; Perboli, Guido; Squillero, Giovanni
      In: Applications of Evolutionary Computation
      Springer International Publishing
      European Conference on the Applications of Evolutionary Computation (Amsterdam)
      Vol.10199 pp.13 (pp.329-341) ISBN:9783319558486 DOI:10.1007/978-3-319-55849-3_22

  48. Multi-objective Evolutionary Algorithms for Influence Maximization in Social Networks
      proceeding
      

      Bucur, Doina; Iacca, Giovanni; Marcelli, Andrea; Squillero, Giovanni; Tonda, Alberto
      In: Applications of Evolutionary Computation
      Springer International Publishing
      European Conference on the Applications of Evolutionary Computation (Amsterdam)
      Vol.10199 pp.13 (pp.221-233) ISBN:9783319558486 DOI:10.1007/978-3-319-55849-3_15

  49. An Evolutionary Approach to Hardware Encryption and Trojan-Horse Mitigation
      proceeding
      

      Marcelli, Andrea; Restifo, Marco; Sanchez, Ernesto; Squillero, Giovanni
      In: Proceedings
      IEEE (STATI UNITI D'AMERICA)
      Design, Automation and Test in Europe, DATE 2017 (Laussane, Switzerland) 27-31 March 2017
      pp.6 ISBN:9781509058266 DOI:10.23919/DATE.2017.7927244

  50. Radiation-induced SET on Flash-based FPGAs: Analysis and Filtering methods
      proceeding
      

      Sterpone, Luca; Azimi, Sarah
      In: ARCS 2017 - 30th International Conference on Architecture of Computing Systems Workshop Proceedings
      VDE VERLAG (GERMANIA)
      CompSpace 2017 (Wien) 3 - 6 April 2017
      Vol.1 pp.6 (pp.3-8) ISBN:9783800743957

  51. Evaluation of transient errors in GPGPUs for safety critical applications: An effective simulation-based fault injection environment
      articolo
      

      Azimi, Sarah; Du, Boyang; Sterpone, Luca
      JOURNAL OF SYSTEMS ARCHITECTURE
      Elsevier
      Vol.75 pp.12 (pp.95-106) ISSN:1383-7621 DOI:10.1016/j.sysarc.2017.01.009

  52. A Key Distribution Scheme for Mobile Wireless Sensor Networks: Q-s-Composite
      articolo
      

      Gandino, Filippo; Ferrero, Renato; Rebaudengo, Maurizio
      IEEE TRANSACTIONS ON INFORMATION FORENSICS AND SECURITY
      IEEE
      Vol.12 pp.14 (pp.34-47) ISSN:1556-6013 DOI:10.1109/TIFS.2016.2601061

  53. New Techniques to Reduce the Execution Time of Functional Test Programs
      articolo
      

      Gaudesi, Marco; Pomeranz, Irith; SONZA REORDA, Matteo; Squillero, Giovanni
      IEEE TRANSACTIONS ON COMPUTERS
      IEEE
      Vol.66 pp.6 (pp.1268-1273) ISSN:0018-9340 DOI:10.1109/TC.2016.2643663

  54. (Over-)Realism in evolutionary computation: Commentary on “On the Mapping of Genotype to Phenotype in Evolutionary Algorithms” by Peter A. Whigham, Grant Dick, and James Maclaurin
      articolo
      

      Squillero, Giovanni; Tonda, Alberto
      GENETIC PROGRAMMING AND EVOLVABLE MACHINES
      Springer Science+Business Media B.V., Formerly Kluwer Academic Publishers B.V.
      pp.3 (pp.1-3) ISSN:1389-2576 DOI:10.1007/s10710-017-9295-y

  55. A High-Level Approach to Analyze the Effects of Soft Errors on Lossless Compression Algorithms
      articolo
      

      Avramenko, Serhiy; SONZA REORDA, Matteo; Violante, Massimo; Fey, Görschwin
      JOURNAL OF ELECTRONIC TESTING
      Springer New York LLC
      pp.12 (pp.1-12) ISSN:0923-8174 DOI:10.1007/s10836-016-5637-6

  56. A Low-Cost Reliability vs. Cost Trade-Off Methodology to Selectively Harden Logic Circuits
      articolo
      

      Wali, I.; Deveautour, B.; Virazel, Arnaud; Bosio, A.; Girard, P.; SONZA REORDA, Matteo
      JOURNAL OF ELECTRONIC TESTING
      Springer
      Vol.33 pp.12 (pp.25-36) ISSN:0923-8174 DOI:10.1007/s10836-017-5640-6

  57. A baseline walking dataset exploiting accelerometer and gyroscope for fall prediction and prevention systems
      proceeding
      

      Hemmatpour, Masoud; Ferrero, Renato; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      In: Proceedings of the 11th EAI International Conference on Body Area Networks
      EAI
      11th EAI International Conference on Body Area Networks (Torino) December 15–16, 2016
      pp.5 (pp.81-85) DOI:10.4108/eai.15-12-2016.2267646

  58. Eigenwalk: a Novel Feature for Walk Classification and Fall Prediction
      proceeding
      

      Hemmatpour, Masoud; Ferrero, Renato; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      In: Proceedings of the 11th EAI International Conference on Body Area Networks
      EAI
      11th EAI International Conference on Body Area Networks (Torino) December 15–16, 2016
      pp.5 (pp.86-90) DOI:10.4108/eai.15-12-2016.2267645

  59. On the consolidation of mixed criticalities applications on multicore architectures
      articolo
      

      Esposito, Stefano; Violante, Massimo
      JOURNAL OF ELECTRONIC TESTING
      Springer
      Vol.33 pp.12 (pp.65-76) ISSN:0923-8174 DOI:10.1007/s10836-016-5636-7

  60. A Comprehensive Methodology for Stress Procedures Evaluation and Comparison for Burn-In of Automotive SoC
      proceeding
      

      Bernardi, Paolo; Appello, Davide; Giacopelli, Giampaolo; Motta, Alessandro; Pagani, Alberto; Pollaccia, Giorgio; Rabbi, Christian; Restifo, Marco; Ruberg, Priit; Sanchez, Ernesto; Villa, Claudio Maria; Venini, Federico
      In: Design, Automation and Test in Europe Conference and Exhibition (DATE2017)
      IEEE
      Design, Automation and Test in Europe Conference and Exhibition (DATE2017)
      

  61. A Fault-Tolerant Ripple-Carry Adder with Controllable-Polarity Transistors
      articolo
      

      Mohammadi, Hassan Ghasemzadeh; Gaillardon, Pierre Emmanuel; Zhang, Jian; Micheli, Giovanni De; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
      ACM JOURNAL ON EMERGING TECHNOLOGIES IN COMPUTING SYSTEMS
      ACM
      Vol.13 pp.13 (pp.1-13) ISSN:1550-4832 DOI:10.1145/2988234

  62. An Error-Detection and Self-Repairing Method for Dynamically and Partially Reconfigurable Systems
      articolo
      

      SONZA REORDA, Matteo; Sterpone, Luca; Ullah, Anees
      IEEE TRANSACTIONS ON COMPUTERS
      IEEE
      Vol.66 pp.12 (pp.1022-1033) ISSN:0018-9340 DOI:10.1109/TC.2016.2607749

  63. A neural network model based on co-occurrence matrix for fall prediction
      proceeding
      

      Hemmatpour, Masoud; Ferrero, Renato; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      In: Lecture Notes of the Institute for Computer Sciences, Social-Informatics and Telecommunications Engineering, LNICST
      Springer
      International Conference on Wireless Mobile Communication and Healthcare (MILANO) NOVEMBER 14–16, 2016
      pp.8 (pp.241-248) DOI:10.1007/978-3-319-58877-3_32

  64. A security protocol for RFID traceability
      articolo
      

      Gandino, Filippo; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      INTERNATIONAL JOURNAL OF COMMUNICATION SYSTEMS
      John Wiley & Sons
      Vol.30 pp.14 ISSN:1074-5351 DOI:10.1002/dac.3109

  2016

  1. Automotive embedded software architecture in the multi-core age
     proceeding
     

     Gai, Paolo; Violante, Massimo
     In: Proceedings of the European Test Symposium
     IEEE (STATI UNITI D'AMERICA)
     European Test Symposium
     pp.8 (pp.1-8) ISBN:9781467396592 DOI:10.1109/ETS.2016.7519309

  2. An FPGA-based testing platform for the validation of automotive powertrain ECU
     proceeding
     

     Du, Boyang; Sterpone, Luca
     In: 2016 IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016
     Institute of Electrical and Electronics Engineers Inc.
     24th Annual IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016 (est) 2016
     pp.7 (pp.1-7) ISBN:9781509035618 DOI:10.1109/VLSI-SoC.2016.7753553

  3. MPDEA 2016 chairs' welcome & organization
     proceeding
     

     Squillero, Giovanni; Tonda, Alberto
     In: GECCO 2016 Companion - Proceedings of the 2016 Genetic and Evolutionary Computation Conference
     Association for Computing Machinery, Inc
     2016 Genetic and Evolutionary Computation Conference, GECCO 2016 Companion (usa) 2016
     pp.1 ISBN:9781450343237 DOI:10.1145/2908961.2931650

  4. Promoting diversity in evolutionary algorithms: An updated bibliography
     proceeding
     

     Squillero, Giovanni; Tonda, Alberto
     In: GECCO 2016 Companion - Proceedings of the 2016 Genetic and Evolutionary Computation Conference
     Association for Computing Machinery, Inc
     2016 Genetic and Evolutionary Computation Conference, GECCO 2016 Companion (usa) 2016
     pp.2 (pp.943-944) ISBN:9781450343237 DOI:10.1145/2908961.2931651

  5. Rejuvenation of nbti-impacted processors using evolutionary generation of assembler programs
     proceeding
     

     Pellerey, Francesco; Jenihhin, Maksim; Squillero, Giovanni; Raik, Jaan; SONZA REORDA, Matteo; Tihhomirov, Valentin; Ubar, Raimund
     In: Proceedings of the Asian Test Symposium
     IEEE Computer Society
     25th IEEE Asian Test Symposium, ATS 2016 (jpn) 2016
     pp.6 (pp.304-309) ISBN:9781509038084 DOI:10.1109/ATS.2016.57

  6. Evolutionary deckbuilding in hearthstone
     proceeding
     

     Garcia Sanchez, Pablo; Tonda, Alberto; Squillero, Giovanni; Mora, Antonio; Merelo, Juan J.
     In: Proceedings of Computational Intelligence and Games (CIG), 2016
     IEEE
     2016 IEEE Conference on Computational Intelligence and Games (CIG)
     pp.8 (pp.1-8) ISBN:9781509018833 DOI:10.1109/CIG.2016.7860426

  7. Fast hierarchical key management scheme with transitory master key for wireless sensor networks
     articolo
     

     Gandino, Filippo; Ferrero, Renato; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
     IEEE INTERNET OF THINGS JOURNAL
     IEEE
     Vol.3 pp.12 (pp.1334-1345) ISSN:2327-4662 DOI:10.1109/JIOT.2016.2599641

  8. Analysis of radiation-induced SEUs on dynamic reconfigurable systems
     proceeding
     

     Boragno, Luca; Sterpone, Luca; David Merodio, Codinachs
     In: ReCoSoC
     IEEE
     Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC), 2016 11th International Symposium on (Tallin) 27-29 June 2016
     pp.6 (pp.1-6) ISBN:9781509025206 DOI:10.1109/ReCoSoC.2016.7533907

  9. Faster-than-at-speed execution of functional programs: an experimental analysis
     proceeding
     

     Bernardi, Paolo; Bosio, Alberto; Natale, Giorgio Di; Guerriero, Andrea; Venini, Federico
     In: IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)
     IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)
     

  10. Online Test of Control Flow Errors: A New Debug Interface-Based Approach
      articolo
      

      Du, Boyang; SONZA REORDA, Matteo; Sterpone, Luca; Luis, Parra; Marta Portela, García; Almudena, Lindoso; Luis, Entrena
      IEEE TRANSACTIONS ON COMPUTERS
      IEEE
      Vol.65 pp.10 (pp.1846-1855) ISSN:0018-9340 DOI:10.1109/TC.2015.2456014

  11. Test Time Minimization in Reconfigurable Scan Networks
      proceeding
      

      Cantoro, Riccardo; Palena, Marco; Pasini, Paolo; SONZA REORDA, Matteo
      In: Proceedings - 2016 IEEE 25th Asian Test Symposium (ATS)
      IEEE
      2016 IEEE 25th Asian Test Symposium (ATS) (Hiroshima (JP)) November 21-24, 2016
      pp.6 DOI:10.1109/ATS.2016.58

  12. A Suite of IEEE 1687 Benchmark Networks
      proceeding
      

      Tšertov, Anton; Jutman, Artur; Devadze, Sergei; SONZA REORDA, Matteo; Larsson, Erik; Ghani Zadegan, Farrokh; Cantoro, Riccardo; Montazeri, Mehrdad; Krenz Baath, Rene
      In: Proceedings - 2016 IEEE International Test Conference (ITC)
      IEEE
      2016 IEEE International Test Conference (ITC) (Fort Worth, TX (USA)) November 15-17, 2016
      pp.10 DOI:10.1109/TEST.2016.7805840

  13. In-field functional test programs development flow for embedded FPUs
      proceeding
      

      Cantoro, Riccardo; Piumatti, Davide; Bernardi, Paolo; De Luca, S.; Sansonetti, A.
      In: Titolo volume non avvalorato
      2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (Storrs (USA)) 19-20 Sept. 2016
      pp.4 (pp.107-110) ISBN:9781509036233 DOI:10.1109/DFT.2016.7684079

  14. Automatic generation of stimuli for fault diagnosis in IEEE 1687 networks
      proceeding
      

      Cantoro, Riccardo; Montazeri, M.; SONZA REORDA, Matteo; Zadegan, F. Ghani; Larsson, E.
      In: Titolo volume non avvalorato
      2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) 4-6 July 2016
      pp.6 (pp.167-172) ISBN:9781509015078 DOI:10.1109/IOLTS.2016.7604692

  15. Kanzi: A Distributed, In-memory Key-Value Store
      proceeding
      

      Hemmatpour, Masoud; Montrucchio, Bartolomeo; B, .; Rebaudengo, Maurizio; M, .; Sadoghi,
      In: Titolo volume non avvalorato
      Association for Computing Machinery, Inc (STATI UNITI D'AMERICA)
      ACM/IFIP/USENIX International Middleware Conference (Trento) December 12-16, 2016
      pp.2 (pp.3-4) ISBN:9781450346665 DOI:10.1145/3007592.3007594

  16. Analysis and optimization of synchronization algorithms for multicore architectures
      proceeding
      

      Hemmatpour, Masoud; Ferrero, Renato; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      In: Proceedings of the 1st International Workshop on Resilience in Nanoelectronics Systems
      IFIP/IEEE
      1st International Workshop on Resilience in Nanoelectronics Systems (RENS'16) (Tallin, Estonia) 28-29 September 2016
      pp.1

  17. A Selective Mapper for the Mitigation of SETs on Rad-Hard RTG4 Flash-based FPGAs
      proceeding
      

      Azimi, Sarah; Du, Boyang; Sterpone, Luca
      In: IEEE RADECS 2016
      IEEE
      IEEE Radiation Effects on Components and System Conference (Bremen, Germany) 19-23 September
      pp.4 DOI:10.1109/RADECS.2016.8093152

  18. Accurate Analysis of SET effects on Flash-based FPGA System-on-a-Chip for Satellite Applications
      proceeding
      

      Azimi, Sarah; Du, Boyang; Sterpone, Luca
      In: IEEE RADECS
      IEEE
      Radiation Effects on Components & Systems Conference
      pp.4 DOI:10.1109/RADECS.2016.8093203

  19. Accurate Analysis of SET effects on Flash-based FPGA System-on-a-Chip for Satellite Applications
      proceeding
      

      Azimi, Sarah; Du, Boyang; Sterpone, Luca; Grimoldi, Raoul; Fossati, Luca; Codinachs, David Merodio
      In: IEEE DDECS 2016
      IEEE
      2016 IEEE 19th International Symposium on Design and Diagnostic of Electronic Circuits & Systems (DDECS) (Kosice) April 20-22
      pp.6 ISBN:9781509024674

  20. On the prediction of Radiation-induced SETs in Flash-based FPGAs
      articolo
      

      Azimi, Sarah; Du, Boyang; Sterpone, Luca
      MICROELECTRONICS RELIABILITY
      Elsevier
      Vol.64 pp.5 (pp.230-234) ISSN:0026-2714 DOI:10.1016/j.microrel.2016.07.106

  21. Accurate Analysis of SET effects on Flash-based FPGA System-on-a-Chip for Satellite Application
      proceeding
      

      Raoul, Grimoldi; David, Merodio Codinachs; Luca, Fossati; Du, Boyang; Sterpone, Luca
      In: IEEE DDECS
      IEEE 19th International Symposium on Design and Diagnostic of Electronic Circuits & Systems (DDECS) (Kosice, Slovakia) April 20-22
      pp.6 ISBN:9781509024674

  22. FPGA-controlled PCBA power-on self-test using processor's debug features
      proceeding
      

      Du, Boyang; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Acle, J. Perez; Tsertov, A.
      In: Formal Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2016
      Institute of Electrical and Electronics Engineers Inc.
      19th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2016 (svk) 2016
      pp.6 (pp.1-6) ISBN:9781509024674 DOI:10.1109/DDECS.2016.7482458

  23. Hybrid soft error mitigation techniques for COTS processor-based systems
      proceeding
      

      Chielle, Eduardo; Du, Boyang; Kastensmidt, Fernanda L.; Cuenca Asensi, Sergio; Sterpone, Luca; SONZA REORDA, Matteo
      In: LATS 2016 - 17th IEEE Latin-American Test Symposium
      Institute of Electrical and Electronics Engineers Inc.
      17th IEEE Latin-American Test Symposium, LATS 2016 (bra) 2016
      pp.6 (pp.99-104) ISBN:9781509013319 DOI:10.1109/LATW.2016.7483347

  24. Analysis of the effects of soft errors on compression algorithms through fault injection inside program variables
      proceeding
      

      Avramenko, Serhiy; SONZA REORDA, Matteo; Violante, Massimo; Fey, G.
      In: LATS 2016 - 17th IEEE Latin-American Test Symposium
      Institute of Electrical and Electronics Engineers Inc.
      17th IEEE Latin-American Test Symposium, LATS 2016 (bra) 2016
      pp.6 (pp.14-19) ISBN:9781509013319 DOI:10.1109/LATW.2016.7483332

  25. Improving the Functional Test Delay Fault Coverage: A Microprocessor Case Study
      proceeding
      

      Touati, A.; Bosio, A.; Girard, P.; Virazel, A.; Bernardi, Paolo; SONZA REORDA, Matteo
      In: 2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)
      2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)
      pp.6 (pp.731-736) ISBN:9781467390392 DOI:10.1109/ISVLSI.2016.42

  26. A low-cost susceptibility analysis methodology to selectively harden logic circuits
      proceeding
      

      Wali, I.; Deveautour, B.; Virazel, A.; Bosio, A.; Girard, P.; SONZA REORDA, Matteo
      In: 2016 21th IEEE European Test Symposium (ETS)
      2016 21th IEEE European Test Symposium (ETS)
      pp.2 (pp.1-2) ISBN:9781467396592 DOI:10.1109/ETS.2016.7519296

  27. An effective approach for functional test programs compaction
      proceeding
      

      Touati, A.; Bosio, Alberto; Girard, P.; Virazel, A.; Bernardi, Paolo; SONZA REORDA, Matteo
      In: Formal Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2016
      Institute of Electrical and Electronics Engineers Inc.
      19th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2016 (svk) 2016
      pp.6 (pp.1-6) ISBN:9781509024674 DOI:10.1109/DDECS.2016.7482466

  28. Commercial Off-the-Shelf Components in Space Applications
      capitolo
      

      Esposito, Stefano; Violante, Massimo
      Semiconductor Devices in Harsh Conditions
      CRC PRESS (STATI UNITI D'AMERICA)
      Vol.Semiconductor Devices in Harsh Conditions pp.18 (pp.3-20) ISBN:9781498743808

  29. Online Time Interference Detection in Mixed-Criticality Applications on Multicore Architectures using Performance Counters
      proceeding
      

      Esposito, Stefano; Violante, Massimo; Sozzi, Marco; Terrone, Marco; Traversone, Massimo
      In: 22nd IEEE International Symposium on On-Line Testing and Robust System Design
      IEEE
      22nd IEEE International Symposium on On-Line Testing and Robust System Design (Sant Feliu de Guixols (ESP)) 4-6 July 2016
      pp.2 (pp.213-214)

  30. Development of an automated test system for ECU software validation: an industrial experience
      proceeding
      

      Bagalini, Enea; Violante, Massimo
      In: Titolo volume non avvalorato
      IEEE
      Biennial Baltic Electronics Conference (BEC 2016) (Tallinn (Estonia)) 3-5 Oct. 2016
      pp.4 (pp.103-106) ISBN:9781509013937 DOI:10.1109/BEC.2016.7743739

  31. Observability solutions for in-field functional test of processor-based systems: a survey and quantitative test case evaluation
      articolo
      

      Perez Acle, Julio; Cantoro, Riccardo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Squillero, Giovanni
      MICROPROCESSORS AND MICROSYSTEMS
      Elsevier
      Vol.47 pp.12 (pp.392-403) ISSN:0141-9331 DOI:10.1016/j.micpro.2016.09.002

  32. AN INTEGRATED APPROACH FOR POLLUTION MONITORING: SMART ACQUIREMENT AND SMART INFORMATION
      proceeding
      

      Arco, Emere; Boccardo, Piero; Gandino, Filippo; Lingua, Andrea Maria; Noardo, Francesca; Rebaudengo, Maurizio
      ISPRS ANNALS OF THE PHOTOGRAMMETRY, REMOTE SENSING AND SPATIAL INFORMATION SCIENCES
      In: Titolo volume non avvalorato
      Copernicus publications
      1st International Conference on Smart Data and Smart Cities, 30th UDMS (Split (Croatia)) 7–9 September 2016
      Vol.III-4/W1 pp.8 (pp.67-74) ISSN:2194-9050 DOI:10.5194/isprs-annals-IV-4-W1-67-2016

  33. On the diagnostic analysis of IEEE 1687 networks
      proceeding
      

      Cantoro, Riccardo; Montazeri, M.; SONZA REORDA, Matteo; Zadegan, F. Ghani; Larsson, E.
      In: Titolo volume non avvalorato
      2016 21th IEEE European Test Symposium (ETS)
      pp.2 (pp.1-2) ISBN:9781467396592 DOI:10.1109/ETS.2016.7519294

  34. A General-Purpose Framework for Genetic Improvement
      proceeding
      

      Marino, Francesco; Squillero, Giovanni; Tonda, Alberto
      In: Parallel Problem Solving from Nature – PPSN XIV
      Springer International Publishing
      PPSN
      Vol.9921 pp.8 (pp.345-352) ISBN:9783319458229 DOI:10.1007/978-3-319-45823-6_32

  35. Tutorials at PPSN 2016
      proceeding
      

      Doerr, Carola; Bredeche, Nicolas; Alba, Enrique; Bartz Beielstein, Thomas; Brockhoff, Dimo; Doerr, Benjamin; Eiben, Gusz; Epitropakis, Michael G.; Fonseca, Carlos M.; Guerreiro, Andreia; Haasdijk, Evert; Heinerman, Jacqueline; Hubert, Julien; Lehre, Per Kristian; Malagò, Luigi; Merelo, J. J.; Miller, Julian; Naujoks, Boris; Oliveto, Pietro; Picek, Stjepan; Pillay, Nelishia; Preuss, Mike; Ryser Welch, Patricia; Squillero, Giovanni; Stork, Jörg; Sudholt, Dirk; Tonda, Alberto; Whitley, Darrell; Zaefferer, Martin
      In: Parallel Problem Solving from Nature – PPSN XIV
      Springer International Publishing
      PPSN
      Vol.9921 pp.11 (pp.1012-1022) ISBN:9783319458229 DOI:10.1007/978-3-319-45823-6_95

  36. Anatomy of a portfolio optimizer under a limited budget constraint
      articolo
      

      Deplano, Igor; Squillero, Giovanni; Tonda, Alberto
      EVOLUTIONARY INTELLIGENCE
      Springer
      pp.12 ISSN:1864-5909 DOI:10.1007/s12065-016-0144-3

  37. Thermal issues in test: An overview of the significant aspects and industrial practice
      proceeding
      

      Alt, J.; Bernardi, Paolo; Bosio, A.; Cantoro, Riccardo; Kerkhoff, H.; Leininger, A.; Molzer, W.; Motta, A.; Pacha, C.; Pagani, A.; Rohani, A.; Strasser, R.
      In: Proceedings of the IEEE VLSI Test Symposium
      IEEE Computer Society
      34th IEEE VLSI Test Symposium, VTS 2016 (Las Vegas (USA)) 25-27 April 2016
      Vol.2016- pp.4 (pp.1-4) ISBN:9781467384544 DOI:10.1109/VTS.2016.7477278

  38. Effective generation and evaluation of diagnostic SBST programs
      proceeding
      

      Riefert, Andreas; Cantoro, Riccardo; Sauer, Matthias; SONZA REORDA, Matteo; Becker, Bernd
      In: Proceedings of the IEEE VLSI Test Symposium
      IEEE Computer Society
      34th IEEE VLSI Test Symposium, VTS 2016 (Las Vegas (USA)) 25-27 April 2016
      Vol.2016- pp.6 (pp.1-6) ISBN:9781467384544 DOI:10.1109/VTS.2016.7477279

  39. On the robustness of DCT-based compression algorithms for space applications
      proceeding
      

      Avramenko, Serhiy; SONZA REORDA, Matteo; Violante, Massimo; Fey, Görschwin; Mess, Jan Gerd; Schmidt, Robert
      In: IEEE International Symposium on On-Line Testing and Robust System Design
      IEEE
      IEEE International Symposium on On-Line Testing and Robust System Design (Sant Feliu de Guixols) 4 – 6 July 2016
      pp.2 (pp.1-2) ISBN:9781509015078 DOI:10.1109/IOLTS.2016.7604656

  40. A new EDA flow for the Mitigation of SEUs in Dynamic Reconfigurable FPGAs
      proceeding
      

      Du, Boyang; Sterpone, Luca; Codinachs, David Merodio
      In: 21st IEEE European Test Symposium Proceedings
      IEEE
      IEEE European Test Symposium (The Netherlands (NL)) May 23 - 27, 2016
      DOI:10.1109/ETS.2016.7519323

  41. On the consolidation of mixed criticalities applications on multicore architectures
      proceeding
      

      Esposito, Stefano; Avramenko, Serhiy; Violante, Massimo
      In: 2016 17th Latin-American Test Symposium (LATS)
      IEEE
      2016 17th Latin-American Test Symposium (LATS) (Foz-do-Iguacu (Brasile)) 6-8 Aprile 2016
      pp.6 (pp.57-62) DOI:10.1109/LATW.2016.7483340

  42. Exploiting accelerometers to estimate displacement
      proceeding
      

      Ferrero, Renato; Gandino, Filippo; Hemmatpour, Masoud; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      In: Proceedings of the 2016 5th Mediterranean Conference on Embedded Computing (MECO)
      IEEE
      2016 5th Mediterranean Conference on Embedded Computing (MECO) (Bar (Montenegro)) 12-16 giugno 2016
      pp.5

  43. KITO tool: A fault injection environment in Linux kernel data structures
      articolo
      

      Velasco, ALEJANDRO DAVID; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      MICROELECTRONICS RELIABILITY
      Elsevier Limited
      Vol.60 pp.10 (pp.153-162) ISSN:0026-2714 DOI:10.1016/j.microrel.2016.02.011

  44. A mobile and low-cost system for environmental monitoring: a case study
      articolo
      

      Velasco, ALEJANDRO DAVID; Ferrero, Renato; Gandino, Filippo; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      SENSORS
      MDPI
      Vol.16 pp.17 (pp.1-17) ISSN:1424-8220 DOI:10.3390/s16050710

  45. Toner savings based on quasi-random sequences and a perceptual study for green printing
      articolo
      

      Montrucchio, Bartolomeo; Ferrero, Renato
      IEEE TRANSACTIONS ON IMAGE PROCESSING
      IEEE
      Vol.25 pp.12 (pp.2635-2646) ISSN:1057-7149 DOI:10.1109/TIP.2016.2552641

  46. Scalable FPGA Graph model to detect routing faults
      proceeding
      

      Sterpone, Luca; Cabodi, Gianpiero; Finocchiaro, SEBASTIANO FABRIZIO; Loiacono, Carmelo; Savarese, Francesco; Du, Boyang
      In: IEEE International Symposium on On-Line Testing and Robust System Design
      IEEE
      IEEE International Symposium on On-Line Testing and Robust System Design
      pp.6 DOI:10.1109/IOLTS.2016.7604690

  47. Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits
      articolo
      

      Maksim, Jenihhin; Squillero, Giovanni; Thiago Santos, Copetti; Valentin, Tihhomirov; Sergei, Kostin; Marco, Gaudesi; Fabian, Vargas; Jaan, Raik; SONZA REORDA, Matteo; Leticia Bolzani, Poehls; Raimund, Ubar; Guilherme Cardoso, Medeiros
      JOURNAL OF ELECTRONIC TESTING
      Springer
      Vol.32 pp.17 (pp.273-289) ISSN:0923-8174 DOI:10.1007/s10836-016-5589-x

  48. A Flexible Framework for the Automatic Generation of SBST Programs
      articolo
      

      Riefert, Andreas; Cantoro, Riccardo; Sauer, Matthias; SONZA REORDA, Matteo; Becker, Bernd
      IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
      IEEE
      pp.12 (pp.1-12) ISSN:1063-8210 DOI:10.1109/TVLSI.2016.2538800

  49. UA2TPG: An untestability analyzer and test pattern generator for SEUs in the configuration memory of SRAM-based FPGAs
      articolo
      

      Bernardeschi, Cinzia; Cassano, Luca; Domenici, Andrea; Sterpone, Luca
      INTEGRATION
      Elsevier
      Vol.55 pp.13 (pp.85-97) ISSN:0167-9260 DOI:10.1016/j.vlsi.2016.03.004

  50. A New Simulation-Based Fault Injection Approach for the Evaluation of Transient Errors in GPGPUs
      proceeding
      

      Azimi, Sarah; Du, Boyang; Sterpone, Luca
      LECTURE NOTES IN COMPUTER SCIENCE
      In: Lecture notes in Computer Science
      Elsevier (PAESI BASSI)
      Architecture of Computing Systems -- ARCS 2016 (Norimberga) 4 - 7 April 2016
      Vol.9637 pp.13 (pp.388-400) ISSN:0302-9743 ISBN:9783319306957 DOI:10.1007/978-3-319-30695-7_29

  51. Portfolio Optimization, a Decision-Support Methodology for Small Budgets
      proceeding
      

      Deplano, Igor; Squillero, Giovanni; Tonda, ALBERTO PAOLO
      In: Applications of Evolutionary Computation
      Springer
      EvoSTAR 2016 (Porto)
      Vol.9597 pp.15 (pp.58-72) ISBN:9783319312033 DOI:10.1007/978-3-319-31204-0_5

  52. Applications of Evolutionary Computation (Part II)
      curatela
      

      Squillero, Giovanni; Burelli, Paolo
      LECTURE NOTES IN COMPUTER SCIENCE
      Springer
      Vol.9598 pp.350 (pp.1-350) ISSN:0302-9743 ISBN:9783319311524

  53. Applications of Evolutionary Computation (Part I)
      curatela
      

      Squillero, Giovanni; Burelli, Paolo
      LECTURE NOTES IN COMPUTER SCIENCE
      Springer
      Vol.9597 pp.863 (pp.1-863) ISSN:0302-9743 ISBN:9783319312033

  54. Challenging Anti-virus Through Evolutionary Malware Obfuscation
      proceeding
      

      Gaudesi, Marco; Marcelli, Andrea; SANCHEZ SANCHEZ, EDGAR ERNESTO; Squillero, Giovanni; Tonda, ALBERTO PAOLO
      In: Challenging Anti-virus Through Evolutionary Malware Obfuscation
      Springer International Publishing
      Evostar 2016 (Porto) Evostar 2016
      Vol.Applications of Evolutionary Computation pp.14 (pp.149-162) ISBN:9783319311524

  55. Investigation of interference models for RFID systems
      articolo
      

      Zhang, Linchao; Ferrero, Renato; Gandino, Filippo; Rebaudengo, Maurizio
      SENSORS
      MDPI
      Vol.16 pp.16 (pp.1-16) ISSN:1424-8220 DOI:10.3390/s16020199

  56. A Hybrid Fault-Tolerant Architecture for Highly Reliable Processing Cores
      articolo
      

      Wali, I.; Virazel, A.; Bosio, A.; Girard, P.; Pravossoudovitch, S.; SONZA REORDA, Matteo
      JOURNAL OF ELECTRONIC TESTING
      Springer
      pp.15 (pp.1-15) ISSN:0923-8174 DOI:10.1007/s10836-016-5578-0

  57. Optimizing groups of colluding strong attackers in mobile urban communication networks with evolutionary algorithms
      articolo
      

      Bucur, Doina; Iacca, Giovanni; Gaudesi, Marco; Squillero, Giovanni; Tonda, Alberto
      APPLIED SOFT COMPUTING
      Elsevier Science
      Vol.40 pp.11 (pp.416-426) ISSN:1568-4946 DOI:10.1016/j.asoc.2015.11.024

  58. Exploiting Evolutionary Modeling to Prevail in Iterated Prisoner’s Dilemma Tournaments
      articolo
      

      Marco, Gaudesi; Piccolo, Elio; Squillero, Giovanni; Alberto, Tonda
      IEEE TRANSACTIONS ON COMPUTATIONAL INTELLIGENCE AND AI IN GAMES
      IEEE
      Vol.8 pp.13 (pp.288-300) ISSN:1943-068X DOI:10.1109/TCIAIG.2015.2439061

  59. Divergence of character and premature convergence: A survey of methodologies for promoting diversity in evolutionary optimization
      articolo
      

      Squillero, Giovanni; Tonda, ALBERTO PAOLO
      INFORMATION SCIENCES
      Elsevier Science Incorporated
      Vol.329 pp.18 (pp.782-799) ISSN:0020-0255 DOI:10.1016/j.ins.2015.09.056

  60. Development Flow for On-Line Core Self-Test of Automotive Microcontrollers
      articolo
      

      Bernardi, Paolo; Cantoro, Riccardo; De Luca, Sergio; SANCHEZ SANCHEZ, EDGAR ERNESTO; Sansonetti, Alessandro
      IEEE TRANSACTIONS ON COMPUTERS
      IEEE
      Vol.65 pp.11 (pp.744-754) ISSN:0018-9340 DOI:10.1109/TC.2015.2498546

  2015

  1. The development of Eddy Current Nondestructive Testing Method for Coating Thickness Measurement on the Steel Sheets
     proceeding
     

     Shamgholi, Maryam; Abbasi, Majid; Mahmood Riazi, Seyed; Azimi, Sarah
     In: 4th International Engineering Material and Metallurgy
     4th International Engineering Material and Metallurgy
     4th International Engineering Material and Metallurgy
     

  2. Fault-tolerant manager core for dynamic partial reconfiguration in FPGAs
     capitolo
     

     Tambara, Lucas A.; Tarrillo, Jimmy; Kastensmidt, Fernanda L.; Sterpone, Luca
     FPGAs and Parallel Architectures for Aerospace Applications: Soft Errors and Fault-Tolerant Design
     Springer International Publishing
     pp.13 (pp.121-133) ISBN:9783319143521 DOI:10.1007/978-3-319-14352-1_9

  3. Fault-tolerance techniques for soft-core processors using the trace interface
     capitolo
     

     Entrena, Luis; Lindoso, Almudena; Portela Garcia, Marta; Parra, Luis; Du, Boyang; SONZA REORDA, Matteo; Sterpone, Luca
     FPGAs and Parallel Architectures for Aerospace Applications: Soft Errors and Fault-Tolerant Design
     Springer International Publishing
     pp.14 (pp.293-306) ISBN:9783319143521 DOI:10.1007/978-3-319-14352-1_19

  4. Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG
     proceeding
     

     Palermo, N.; Tihhomirov, V.; Copetti, T. S.; Jenihhin, M.; Raik, J.; Kostin, S.; Gaudesi, M.; Squillero, Giovanni; SONZA REORDA, Matteo; Vargas, F.; Poehls, L. Bolzani
     In: 2015 16th Latin-American Test Symposium, LATS 2015
     Institute of Electrical and Electronics Engineers Inc.
     16th IEEE Latin-American Test Symposium, LATS 2015 (mex) 2015
     pp.6 ISBN:9781467367103 DOI:10.1109/LATW.2015.7102405

  5. Partition-Based Faults Diagnosis of a VLIW Processor
     capitolo
     

     Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca
     VLSI-SoC: At the Crossroads of Emerging Trends
     Springer (GERMANIA)
     Vol.461 pp.19 (pp.208-226) ISBN:9783319237985 DOI:10.1007/978-3-319-23799-2

  6. On the design of a fault tolerant ripple-carry adder with controllable-polarity transistors
     proceeding
     

     Ghasemzadeh, H.; Gaillardon, P. E.; Zhang, J.; De Micheli, G.; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
     In: Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI
     IEEE Computer Society
     IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2015 2015
     Vol.07-10- pp.6 (pp.491-496) ISBN:9781479987184 DOI:10.1109/ISVLSI.2015.13

  7. About the functional test of permanent faults in distributed systems
     proceeding
     

     Vaskova, A.; Portela García, M.; López Ongil, C.; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
     In: 2015 Conference on Design of Circuits and Integrated Systems (DCIS)
     IEEE
     2015 Conference on Design of Circuits and Integrated Systems (DCIS)
     pp.6 DOI:10.1109/DCIS.2015.7388571

  8. Towards automatic StarCraft strategy generation using genetic programming
     proceeding
     

     Garcia Sanchez, Pablo; Tonda, ALBERTO PAOLO; Mora, Antonio M.; Squillero, Giovanni; Merelo, J. J.
     In: Proceedings 2015 IEEE Conference on Computational Intelligence and Games
     IEEE (STATI UNITI D'AMERICA)
     2015 IEEE Conference on Computational Intelligence and Games (CIG) (Taiwan) Aug. 31 2015-Sept. 2 2015
     pp.8 (pp.284-291) ISBN:9781479986224 DOI:10.1109/CIG.2015.7317940

  9. Evaluation of error effects on a biomedical system
     proceeding
     

     Bagalini, Enea; Violante, Massimo; Hakob, Hakobyan
     In: Proceedings of IEEE East-West Design & Test Symposium (EWDTS’2015)
     IEEE East- West Design & Test Symposium (Batumi (Georgia)) September 26-29, 2015
     pp.4 (pp.39-42) ISBN:9781467377751 DOI:10.1109/EWDTS.2015.7493164

  10. Malware Obfuscation through Evolutionary Packers
      proceeding
      

      Marco, Gaudesi; Marcelli, Andrea; SANCHEZ SANCHEZ, EDGAR ERNESTO; Squillero, Giovanni; Alberto, Tonda
      In: Proceedings of the Companion Publication of the 2015 Annual Conference on Genetic and Evolutionary Computation
      ACM
      GECCO
      pp.2 (pp.757-758) ISBN:9781450334884 DOI:10.1145/2739482.2764940

  11. Designing Autonomous Race Car Models for Learning Advanced Topics in Hard Real-Time System
      articolo
      

      Bagalini, Enea; Violante, Massimo
      INTERNATIONAL JOURNAL OF ROBOTICS APPLICATIONS AND TECHNOLOGIES
      IGI Global
      Vol.3 pp.22 (pp.1-22) ISSN:2166-7195 DOI:10.4018/IJRAT.2015010101

  12. On the Design of Highly Reliable System-on-Chip using Dynamically Reconfigurable FPGAs
      proceeding
      

      DAVID MERODIO, Codinachs; Du, Boyang; Sterpone, Luca; Venditti, Lorenzo
      In: Titolo non avvalorato
      Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC), 2015 10th International Symposium on (Bremen) June 2015
      pp.6 (pp.1-6) DOI:10.1109/ReCoSoC.2015.7238082

  13. Radiation-induced single event transients modeling and testing on nanometric flash-based technologies
      articolo
      

      Sterpone, Luca; Du, Boyang; Azimi, Sarah
      MICROELECTRONICS RELIABILITY
      Elsevier
      Vol.55 pp.5 (pp.2087-2091) ISSN:0026-2714 DOI:10.1016/j.microrel.2015.07.035

  14. Analysis and mitigation of SEUs in ARM-based SoC on Xilinx Virtex-V SRAM-based FPGAS
      proceeding
      

      Du, Boyang; Desogus, Marco; Sterpone, Luca
      In: 2015 11th Conference on Ph.D. Research in Microelectronics and Electronics, PRIME 2015
      Institute of Electrical and Electronics Engineers Inc.
      11th Conference on Ph.D. Research in Microelectronics and Electronics, PRIME 2015 (gbr) 2015
      pp.4 (pp.236-239) ISBN:9781479982295 DOI:10.1109/PRIME.2015.7251378

  15. Layout and Radiation Tolerance Issues in High-Speed Links
      articolo
      

      Giordano, R.; Aloisio, A.; Bocci, V.; Capodiferro, M.; Izzo, V.; Sterpone, Luca; Violante, Massimo
      IEEE TRANSACTIONS ON NUCLEAR SCIENCE
      IEEE
      Vol.62 pp.9 (pp.3177-3185) ISSN:0018-9499 DOI:10.1109/TNS.2015.2498307

  16. Using Benchmarks for Radiation Testing of Microprocessors and FPGAs
      articolo
      

      Quinn, Heather; Robinson, William H.; Rech, Paolo; Aguirre, Miguel; Barnard, Arno; Desogus, Marco; Entrena, Luis; Garcia Valderas, Mario; Guertin, Steven M.; Kaeli, David; Kastensmidt, Fernanda Lima; Kiddie, Bradley T.; Sanchez Clemente, Antonio; SONZA REORDA, Matteo; Sterpone, Luca; Wirthlin, Michael
      IEEE TRANSACTIONS ON NUCLEAR SCIENCE
      IEEE
      Vol.62 pp.8 (pp.2547-2554) ISSN:0018-9499 DOI:10.1109/TNS.2015.2498313

  17. COTS-Based High-Performance Computing for Space Applications
      articolo
      

      Esposito, Stefano; Albanese, Cristian; Alderighi, Monica; Casini, Fabio; Giganti, Luca; Esposti, Maria Livia; Monteleone, Claudio; Violante, Massimo
      IEEE TRANSACTIONS ON NUCLEAR SCIENCE
      IEEE
      Vol.62 pp.8 (pp.2687-2694) ISSN:0018-9499 DOI:10.1109/TNS.2015.2492824

  18. An Hybrid Architecture for consolidating mixed criticality applications on multicore systems
      proceeding
      

      Avramenko, Serhiy; Esposito, Stefano; Violante, Massimo; Sozzi, Marco; Traversone, Massimo; Binello, Marco; Terrone, Marco
      In: Proceedings on the IEEE International On-Line Testing Symposium
      IEEE International On-Line Testing Symposium
      pp.4 (pp.26-29) ISBN:9781467379052 DOI:10.1109/IOLTS.2015.7229823

  19. On the Testability of IEEE 1687 Networks
      proceeding
      

      Cantoro, Riccardo; Montazeri, Mehrdad; SONZA REORDA, Matteo; Ghani Zadegan, Farrokh; Larsson, Erik
      In: Titolo volume non avvalorato
      IEEE
      24th IEEE Asian Test Symposium (Mumbai (IN)) November 22-25, 2015
      pp.6 (pp.211-216) DOI:10.1109/ATS.2015.7447934

  20. Observability solutions for in-field functional test of processor-based systems
      proceeding
      

      Perez Acle, Julio; Cantoro, Riccardo; Hailemichael, Abel Teklu; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
      In: Proceedings - XXX Conference on Design of Circuits and Integrated Systems (DCIS)
      IEEE
      XXX Conference on Design of Circuits and Integrated Systems (DCIS) (Estoril (PT)) November 25-27, 2015
      pp.6 (pp.1-6) DOI:10.1109/DCIS.2015.7388582

  21. A novel simulator for RFID reader-to-reader anti-collision protocols
      proceeding
      

      Ferrero, Renato; Gandino, Filippo; Montrucchio, Bartolomeo; Rebaudengo, Maurizio; Zhang, Linchao
      In: Proceedings of the 2015 International EURASIP Workshop on RFID Technology (EURFID)
      IEEE
      2015 International EURASIP Workshop on RFID Technology (EURFID) (Rosenheim (Germania)) 22-23 Ottobre 2015
      pp.6

  22. Experimental Investigation on the Interference between UHF RFID and GSM
      proceeding
      

      Ferrero, Renato; Gandino, Filippo; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      In: Proceedings of the 2015 International EURASIP Workshop on RFID Technology (EURFID)
      IEEE
      2015 International EURASIP Workshop on RFID Technology (EURFID) (Rosenheim (Germania)) 22-23 Ottobre 2015
      pp.4

  23. Operator Selection using Improved Dynamic Multi-Armed Bandit
      proceeding
      

      Belluz, Jany; Gaudesi, Marco; Squillero, Giovanni; Tonda, ALBERTO PAOLO
      In: GECCO '15 Proceedings of the 2015 on Genetic and Evolutionary Computation Conference
      ACM (STATI UNITI D'AMERICA)
      Genetic and Evolutionary Computation Conference (Madrid)
      pp.7 (pp.1311-1317) ISBN:9781450334723 DOI:10.1145/2739480.2754712

  24. Software-based self-test techniques of computational modules in dual issue embedded processors
      proceeding
      

      Bernardi, Paolo; Bovi, C.; Cantoro, Riccardo; De Luca, S.; Meregalli, R.; Piumatti, Davide; SANCHEZ SANCHEZ, Edgar Ernesto; Sansonetti, A.
      In: Titolo volume non avvalorato
      IEEE
      2015 20th IEEE European Test Symposium (ETS) (Cluj-Napoca) 25-29 May 2015
      pp.2 (pp.1-2) ISBN:9781479976034 DOI:10.1109/ETS.2015.7138730

  25. Exploiting Evolutionary Computation in an Industrial Flow for the Development of Code-Optimized Microprocessor Test Programs
      proceeding
      

      Cantoro, Riccardo; Gaudesi, Marco; SANCHEZ SANCHEZ, Edgar Ernesto; Squillero, Giovanni
      In: Proceedings of the Companion Publication of the 2015 on Genetic and Evolutionary Computation Conference
      ACM New York (STATI UNITI D'AMERICA)
      Genetic and Evolutionary Computation Conference 2015 (GECCO) (Madrid (ESP)) July 11-15, 2015
      pp.2 (pp.1465-1466) ISBN:9781450334884 DOI:10.1145/2739482.2764673

  26. Design Space Exploration and Optimization of a Hybrid Fault-Tolerant Architecture
      proceeding
      

      Wali, I; Virazel, A.; Bosio, A.; Girard, P.; SONZA REORDA, Matteo
      In: 21st IEEE International On-Line Testing Symposium
      IEEE (STATI UNITI D'AMERICA)
      21st IEEE International On-Line Testing Symposium (Elia, Halkidiki, Greece) July 2015
      pp.6 (pp.89-94) ISBN:9781479906628

  27. On the Maximization of the Sustained Switching Activity in a Processor
      proceeding
      

      Cantoro, Riccardo; SONZA REORDA, Matteo; Rohani, A.; Kerkhoff, H. G.
      In: Proceedings - 21st IEEE International On-Line Testing Symposium
      IEEE (STATI UNITI D'AMERICA)
      21st IEEE International On-Line Testing Symposium (Elia, Halkidiki, Greece) July 2015
      pp.2 (pp.34-35) ISBN:9781479906628 DOI:10.1109/IOLTS.2015.7229826

  28. Exploring the Impact of Functional Test Programs Re-Used for Power-Aware Testing
      proceeding
      

      A., Touati; A., Bosio; L., Dilillo; P., Girard; A., Virazel; Bernardi, Paolo; SONZA REORDA, Matteo
      In: Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
      IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS INC
      Design, Automation & Test in Europe Conference & Exhibition (DATE), 2015
      pp.4 (pp.1277-1280)

  29. In-field test of safety-critical systems: is functional test a feasible solution?
      proceeding
      

      SONZA REORDA, Matteo
      In: 2015 16th IEEE Latin-American Test Symposium (LATS)
      IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS INC
      2015 16th IEEE Latin-American Test Symposium (LATS)
      pp.2 DOI:10.1109/LATW.2015.7102528

  30. Scan-Chain Intra-Cell Defects Grading
      proceeding
      

      A., Touati; A., Bosio; L., Dilillo; P., Girard; A., Virazel; Bernardi, Paolo; SONZA REORDA, Matteo
      In: 10th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
      IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS INC
      10th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
      pp.6 DOI:10.1109/DTIS.2015.7127349

  31. An effective ATPG flow for Gate Delay Faults
      proceeding
      

      A., Bosio; L., Dilillo; P., Girard; A., Virazel; Bernardi, Paolo; SONZA REORDA, Matteo
      In: 10th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2015
      IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS INC
      10th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2015
      pp.6 DOI:10.1109/DTIS.2015.7127350

  32. The EcoThermo project: key and innovative aspects
      proceeding
      

      Bari, F.; Mereu, D.; Damarco, Chiara; Greco, Cosimo; Malan, Stefano; Marchetto, Guido; ROA TIRADO, Sebastian; Tisseur, Riccardo; Violante, Massimo; Zangari, Giuseppe; Caruso, Sebastiano; Masoero, Marco Carlo; Saba, Fabio
      ENERGY PROCEDIA
      In: Energy Procedia
      Elsevier
      6th International Building Physics Conference, IBPC 2015 (Torino) 15-17 June 2015
      pp.6 (pp.2977-2982) ISSN:1876-6102 DOI:10.1016/j.egypro.2015.11.697

  33. An innovative parallel fuzzy scheme for low-power consumption in IEEE 802.11 devices
      proceeding
      

      Collotta, M.; Tirrito, S.; Ferrero, Renato; Rebaudengo, Maurizio
      In: Proceedings of the 2015 IEEE 13th International Conference on Industrial Informatics (INDIN)
      IEEE
      2015 IEEE 13th International Conference on Industrial Informatics (INDIN) (Cambridge (UK)) 22-24 Luglio 2015
      pp.6 (pp.908-913) DOI:10.1109/INDIN.2015.7281856

  34. On gait recognition with smartphone accelerometer
      proceeding
      

      Ferrero, Renato; Gandino, Filippo; Montrucchio, Bartolomeo; Rebaudengo, Maurizio; Velasco, ALEJANDRO DAVID; Benkhelifa, I.
      In: Proceedings of the 2015 4th Mediterranean Conference on Embedded Computing (MECO)
      IEEE
      2015 4th Mediterranean Conference on Embedded Computing (MECO) (Budva (Montenegro)) 14-18 Giugno 2015
      pp.6 (pp.368-373) ISBN:9781479989997 DOI:10.1109/MECO.2015.7181946

  35. On the design of distributed air quality monitoring systems
      proceeding
      

      Velasco, ALEJANDRO DAVID; Ferrero, Renato; Gandino, Filippo; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      In: AIP Conference Proceedings
      AIP Publishing LLC
      11th International Conference of Computational Methods in Sciences and Engineering (ICCMSE 2015) (Atene (Grecia)) 20-23 Marzo 2015
      Vol.1702 pp.4

  36. SET-PAR: Place and Route Tools for the Mitigation of Single Event Transients on Flash-Based FPGAs
      proceeding
      

      Sterpone, Luca; Du, Boyang
      In: Applied Reconfigurable Computing
      Springer International Publishing
      11th International Symposium, ARC 2015, Bochum, Germany, April 13-17, 2015, Proceedings (Bochum) 13-17 April 2015
      Vol.9040 pp.12 (pp.129-140) ISBN:9783319162140 DOI:10.1007/978-3-319-16214-0_11

  37. SW-Based Transparent In-Field Memory Testing
      proceeding
      

      Bernardi, Paolo; Ciganda, LYL MERCEDES; SONZA REORDA, Matteo; Said, Hamdioui
      In: 16th IEEE Latin American Test Symposium
      IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS INC
      16th IEEE Latin American Test Symposium (Puerto Vallarta - Mexico) 25 -27 Marzo
      

  38. Black Holes and Revelations: Using Evolutionary Algorithms to Uncover Vulnerabilities in Disruption-Tolerant NetworksApplications of Evolutionary Computation
      proceeding
      

      Doina, Bucur; Giovanni, Iacca; Squillero, Giovanni; Alberto, Tonda
      LECTURE NOTES IN COMPUTER SCIENCE
      In: Lecture Notes in Computer ScienceApplications of Evolutionary Computation
      Springer
      EvoAPPS
      Vol.9028 pp.13 (pp.29-41) ISSN:0302-9743 ISBN:9783319165486 DOI:10.1007/978-3-319-16549-3_3

  39. Chromatic Selection – An Oversimplified Approach to Multi-objective OptimizationApplications of Evolutionary Computation
      proceeding
      

      Squillero, Giovanni
      LECTURE NOTES IN COMPUTER SCIENCE
      In: Lecture Notes in Computer ScienceApplications of Evolutionary Computation
      Springer
      EvoAPPS
      Vol.9028 pp.9 (pp.681-689) ISSN:0302-9743 ISBN:9783319165486 DOI:10.1007/978-3-319-16549-3_55

  40. On the Automatic Generation of SBST Test Programs for In-Field Test
      proceeding
      

      Riefert, A.; Cantoro, Riccardo; Sauer, M.; SONZA REORDA, Matteo; Becker, B.
      In: Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE)
      IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS INC
      2015 Design, Automation & Test in Europe Conference & Exhibition (DATE) (Grenoble, France) 9-13 March, 2015
      pp.6 (pp.1186-1191) ISBN:9783981537048 DOI:10.7873/DATE.2015.0271

  41. Mitigating Soft Errors in Processors Cores Embedded in System-on Programmable-Chips
      capitolo
      

      Esposito, Stefano; Violante, Massimo
      FPGAs and Parallel Architectures for Aerospace Applications
      Springer (STATI UNITI D'AMERICA)
      Vol.1 pp.20 (pp.219-238) ISBN:9783319143521 DOI:10.1007/978-3-319-14352-1_15

  42. Applications of Evolutionary Computation
      curatela
      

      Mora, Antonio M.; Squillero, Giovanni
      Springer
      Vol.1 pp.913 (pp.1-913) ISBN:9783319165486

  43. Permanent Fault Detection and Diagnosis in the Lightweight Dual Modular Redundancy Architecture
      proceeding
      

      Ferreira, R.; SANCHEZ SANCHEZ, EDGAR ERNESTO; DA ROLT, J.; Nazar, G.; Moreira, A.; Carro, L.; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      IEEE
      16th Latin American Test Symposium (Puerto Vallarta - Mexico) 25 -27 Marzo
      pp.6 (pp.1-6)

  44. On the Functional Test of the Cache Coherency Logic in Multi-core Systems
      proceeding
      

      Perez Acle, J.; Cantoro, Riccardo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      IEEE
      2015 IEEE 6th Latin American Symposium on Circuits & Systems (LASCAS) (Montevideo - Uruguay) 24-27 Feb. 2015
      pp.4 (pp.1-4) ISBN:9781479983322 DOI:10.1109/LASCAS.2015.7250453

  45. On Test Program Compaction
      proceeding
      

      Gaudesi, Marco; SONZA REORDA, Matteo; Irith, Pomeranz
      In: campo non avvalorato
      IEEE
      Test Symposium (ETS), 2015 20th IEEE European (Cluj-Napoca) 25-29 May 2015
      Vol.1 pp.6 (pp.1-6) ISBN:9781479976034 DOI:10.1109/ETS.2015.7138771

  46. An Evolutionary Approach for Test Program Compaction
      proceeding
      

      Cantoro, Riccardo; Gaudesi, Marco; SANCHEZ SANCHEZ, EDGAR ERNESTO; Schiavone, P.; Squillero, Giovanni
      In: campo non avvalorato
      IEEE
      16th Latin-American Test Symposium (Puerto Vallarta, Mexico) March 25-27
      Vol.1 pp.6 (pp.1-6) ISBN:9781467367103 DOI:10.1109/LATW.2015.7102406

  47. On the Functional Test of Branch Prediction Units
      articolo
      

      SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
      IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
      IEEE
      Vol.23 pp.14 (pp.1675-1688) ISSN:1063-8210 DOI:10.1109/TVLSI.2014.2356612

  2014

  1. A comprehensive evaluation of functional programs for power-aware test
     proceeding
     

     Touati, A.; Bosio, A.; Dilillo, L.; Girard, P.; Todri-Sanial, A.; Virazel, A.; Bernardi, P.
     In: Proceedings - IEEE 23rd North Atlantic Test Workshop, NATW 2014
     IEEE Computer Society
     23rd IEEE North Atlantic Test Workshop, NATW 2014 (Binghamton, NY, usa) 2014
     pp.4 (pp.69-72) ISBN:9781479951352 DOI:10.1109/NATW.2014.23

  2. An intra-cell defect grading tool
     proceeding
     

     Bosio, A.; Dilillo, L.; Girard, P.; Todri-Sanial, A.; Virazel, A.; Bernabovi, S.; Bernardi, P.
     In: Proceedings of the 2014 IEEE 17th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2014
     Institute of Electrical and Electronics Engineers Inc.
     17th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2014 (pol) 2014
     pp.4 (pp.298-301) ISBN:9781479945580 DOI:10.1109/DDECS.2014.6868814

  3. Concurrent Detection and Classification of Faults in Matrix Converter Using Trans-Conductance
     articolo
     

     Azimi, Sarah; Vejdaniamiri, Mehdi
     INTERNATIONAL JOURNAL OF POWER ELECTRONICS AND DRIVE SYSTEMS
     International Journal of Power Electronics and Drive system
     pp.8 (pp.93-100) ISSN:2088-8694 DOI:10.11591/ijpeds.v4i5.6065

  4. Layout and radiation tolerance issues in high-speed links for TDAQ systems
     proceeding
     

     Bocci, V.; Capodiferro, M.; Giordano, R.; Izzo, V.; Sterpone, Luca; Violante, Massimo
     In: Real Time Conference (RT), 2014 19th IEEE-NPSS
     IEEE (STATI UNITI D'AMERICA)
     Real Time Conference (RT), 2014 19th IEEE-NPSS
     pp.2 (pp.1-2) DOI:10.1109/RTC.2014.7097548

  5. A New Hybrid Nonintrusive Error-Detection Technique Using Dual Control-Flow Monitoring
     articolo
     

     L., Parra; A., Lindoso; M., Portela Garcia; L., Entrena; Du, Boyang; SONZA REORDA, Matteo; Sterpone, Luca
     IEEE TRANSACTIONS ON NUCLEAR SCIENCE
     IEEE
     Vol.61 pp.8 (pp.3236-3243) ISSN:0018-9499 DOI:10.1109/TNS.2014.2361953

  6. Early Reliability Evaluation of a Biomedical System
     proceeding
     

     Hakobyan, H.; Rech, P.; SONZA REORDA, Matteo; Violante, Massimo
     In: 2014 9th International Design & Test Symposium
     IEEE / Institute of Electrical and Electronics Engineers (STATI UNITI D'AMERICA)
     2014 9th International Design & Test Symposium (Algiers, Algeria) December 2014
     pp.6 (pp.45-50)

  7. A comparison of graphics processor architectures for RFID simulation
     proceeding
     

     Ferrero, Renato; Montrucchio, Bartolomeo; Lorenzo, David; Kargar, Ebrahim; Luca, Graglia; Giovanni di Dio, Iovino; Marco, Ribero
     In: Proceedings of the 2014 17th International Conference on Network-Based Information Systems
     IEEE
     2014 17th International Conference on Network-Based Information Systems (NBiS) (Salerno (Italia)) 10-12 Settembre 2014
     pp.7 (pp.8-14) DOI:10.1109/NBiS.2014.37

  8. A parallel fuzzy scheme to improve power consumption management in Wireless Sensor Networks
     proceeding
     

     Mario, Collotta; Gianfranco, Scatà; Salvatore, Tirrito; Ferrero, Renato; Rebaudengo, Maurizio
     In: Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA)
     IEEE
     19th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) (Barcelona (Spain)) 16-19 September 2014
     pp.4 DOI:10.1109/ETFA.2014.7005363

  9. High Quality System Level Test and Diagnosis
     proceeding
     

     Artur, Jutman; SONZA REORDA, Matteo; Hans Joachim, Wunderlich
     In: 2014 IEEE 23rd Asian Test Symposium
     IEEE / Institute of Electrical and Electronics Engineers (STATI UNITI D'AMERICA)
     2014 IEEE 23rd Asian Test Symposium (Hangzhou, China) November 2014
     pp.8 (pp.298-305) DOI:10.1109/ATS.2014.62

  10. Diagnostic Test Generation for Statistical Bug Localization using Evolutionary Computation
      proceeding
      

      Gaudesi, Marco; M., Jenihhin; J., Raik; SANCHEZ SANCHEZ, EDGAR ERNESTO; Squillero, Giovanni; V., Tihhomirov; R., Ubar
      In: Lecture Notes in Computer Science
      Springer
      EVOSTAR - The Leading European event on Bio-Inspired Computation (Granada, Spain) 23-25 April 2014
      Vol.8602 pp.12 (pp.425-436) DOI:10.1007/978-3-662-45523-4_35

  11. Effective emulation of permanent faults in ASICs through dynamically reconfigurable FPGAs
      proceeding
      

      SANCHEZ SANCHEZ, EDGAR ERNESTO; Sterpone, Luca; Ullah, Anees
      In: Proceedings of 24th International Conference on Field Programmable Logic and Applications (FPL), 2014
      IEEE
      24th International Conference on Field Programmable Logic and Applications (FPL), 2014
      pp.6 (pp.1-6) DOI:10.1109/FPL.2014.6927478

  12. On the in-Field Functional Testing of Decode Units in Pipelined RISC Processors
      proceeding
      

      Bernardi, Paolo; Cantoro, Riccardo; Ciganda, LYL MERCEDES; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; S., De Luca; R., Meregalli; A., Sansonetti
      In: Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
      IEEE
      2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (Amsterdam) OCT. 1-3, 2014
      pp.6 (pp.298-303) DOI:10.1109/DFT.2014.6962090

  13. Fault Injection in the Process Descriptor of a Unix-based Operating System
      proceeding
      

      Montrucchio, Bartolomeo; Rebaudengo, Maurizio; Velasco, ALEJANDRO DAVID
      In: Proceedings of the 28th Defect and Fault Tolerance in VLSI and Nanotechnology Systems Symposium
      IEEE / Institute of Electrical and Electronics Engineers (STATI UNITI D'AMERICA)
      IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (Amsterdam (NL)) 1-3 October 2014
      pp.6 (pp.1-6)

  14. Reliability Evaluation of Embedded GPGPUs for Safety Critical Applications
      articolo
      

      Sabena, Davide; Sterpone, Luca; Carro, L.; Rech, P.
      IEEE TRANSACTIONS ON NUCLEAR SCIENCE
      IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS INC
      Vol.61 pp.7 (pp.3123-3129) ISSN:0018-9499 DOI:10.1109/TNS.2014.2363358

  15. Soft Error Effects Analysis and Mitigation in VLIW Safety-Critical Applications
      proceeding
      

      Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca
      In: Proceedings of IFIP/IEEE 22nd International Conference on Very Large Scale Integration (VLSI-SoC)
      IFIP/IEEE 22nd International Conference on Very Large Scale Integration (VLSI-SoC) (Playa del Carmen, Mexico.) October 6-8, 2014
      pp.6 (pp.135-140)

  16. TURAN: Evolving non-deterministic players for the iterated prisoner's dilemma
      proceeding
      

      Gaudesi, Marco; Piccolo, Elio; Squillero, Giovanni; Tonda, ALBERTO PAOLO
      In: Evolutionary Computation (CEC), 2014 IEEE Congress on
      IEEE
      2014 IEEE Congress on Evolutionary Computation (CEC) (Beijing, China) 06 - 11 July, 2014
      pp.7 (pp.21-27) DOI:10.1109/CEC.2014.6900564

  17. The tradeoffs between data delivery ratio and energy costs in wireless sensor networks
      proceeding
      

      Doina, Bucur; Giovanni, Iacca; Squillero, Giovanni; Alberto, Tonda
      In: Proceedings of the 2014 conference on Genetic and evolutionary computation - GECCO '14
      ACM New York, NY, USA (STATI UNITI D'AMERICA)
      GECCO (Vancouver)
      pp.8 (pp.1071-1078) DOI:10.1145/2576768.2598384

  18. Universal information distance for genetic programming
      proceeding
      

      Gaudesi, Marco; Squillero, Giovanni; Tonda, ALBERTO PAOLO
      In: Proceedings of the 2014 conference companion on Genetic and evolutionary computation companion - GECCO Comp '14
      ACM (STATI UNITI D'AMERICA)
      GECCO '14 - Genetic and Evolutionary Computation Conference (Vancouver, BC, Canada) July 12-16, 2014
      pp.2 (pp.137-138) DOI:10.1145/2598394.2598440

  19. Embedded virtualization techniques for automotive infotainment applications
      capitolo
      

      Violante, Massimo; Gianpaolo, Macario; Salvatore, Campagna
      Handbook of Research on Embedded Systems Design
      IGI Global (STATI UNITI D'AMERICA)
      Vol.1 pp.16 (pp.372-387) ISBN:9781466661943 DOI:10.4018/978-1-4666-6194-3

  20. Recovery Time and Fault Tolerance Improvement for Circuits mapped on SRAM-based FPGAs
      articolo
      

      Ullah, Anees; Sterpone, Luca
      JOURNAL OF ELECTRONIC TESTING
      Springer
      Vol.30 pp.18 (pp.425-442) ISSN:0923-8174 DOI:10.1007/s10836-014-5463-7

  21. Permanent faults on LIN networks: On-line test generation
      proceeding
      

      Vaskova, A.; Portela Garcia, M.; Garcia Valderas, M.; Lopez Ongil, C.; SONZA REORDA, Matteo
      In: 2014 IEEE 20th International On-Line Testing Symposium (IOLTS)
      IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS INC (STATI UNITI D'AMERICA)
      2014 IEEE 20th International On-Line Testing Symposium (IOLTS)
      pp.6 (pp.176-181) DOI:10.1109/IOLTS.2014.6873665

  22. Validation of a tool for estimating the effects of Soft- Errors on modern SRAM-based FPGAs
      proceeding
      

      Desogus, Marco; Sterpone, Luca; David Merodio, Codinachs
      In: Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium (IOLTS)
      IEEE / Institute of Electrical and Electronics Engineers
      IEEE 20th International On-Line Testing Symposium (Platja d’Aro, Catalunya, Spain) 7 - 9 July 2014
      pp.5 (pp.111-115)

  23. ASSESS: A Simulator of Soft Errors in the Configuration Memory of SRAM-based FPGAs
      articolo
      

      Cinzia, Bernardeschi; Luca, Cassano; Andrea, Domenici; Sterpone, Luca
      IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
      IEEE / Institute of Electrical and Electronics Engineers
      Vol.33 pp.14 (pp.1342-1355) ISSN:0278-0070 DOI:10.1109/TCAD.2014.2329419

  24. Fault injection and fault tolerance methodologies for assessing device robustness and mitigating against ionizing radiation
      proceeding
      

      Alexandrescu, Dan; Sterpone, Luca; Lopez Ongil, Celia
      In: Proceedings of the 19th IEEE European Test Symposium
      IEEE European Test Symposium (Paderborn) 26 - 30 Maggio
      pp.8 (pp.1-6) DOI:10.1109/ETS.2014.6847812

  25. Reducing SEU Sensitivity in LIN Networks: Selective and Collaborative Hardening Techniques
      proceeding
      

      A., Vaskova; A., Fabregat; M., Portela García; M., García Valderas; C., López Ongil; SONZA REORDA, Matteo
      In: 2014 15th Latin American Test Workshop - LATW
      IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS INC (STATI UNITI D'AMERICA)
      2014 15th Latin American Test Workshop - LATW
      pp.6 DOI:10.1109/LATW.2014.6841924

  26. Analysis and mitigation of single event effects on flash-based FPGAS
      proceeding
      

      Sterpone, Luca; Du, Boyang
      In: PROCEEDINGS 2014 19TH IEEE EUROPEAN TEST SYMPOSIUM (ETS)
      IEEE
      IEEE 19th EUROPEAN TEST SYMPOSIUM (ETS) (Paderborn, Germany)
      pp.6 (pp.1-6) DOI:10.1109/ETS.2014.6847804

  27. A New Solution to On-Line Detection of Control Flow Errors
      proceeding
      

      Du, Boyang; SONZA REORDA, Matteo; Sterpone, Luca; L., Parra; M., Portela Garcia; A., Lindoso; L., Entrena
      In: Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium (IOLTS)
      IEEE / Institute of Electrical and Electronics Engineers
      IEEE 20th International On-Line Testing Symposium (Hotel Cap Roig, Platja d’Aro, Catalunya, Spain)
      pp.6 (pp.105-110)

  28. Fault Injection in GPGPU Cores to Validate and Debug Robust Parallel Applications
      proceeding
      

      DE CARVALHO, Mauricio; Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca; Rech, P.; Carro, L.
      In: Proceedings of IEEE 20th International On-Line Testing Symposium (IOLTS)
      IEEE 20th International On-Line Testing Symposium (IOLTS) (Platja d'Aro) July 7 - 9, 2014
      pp.2 (pp.210-211)

  29. Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test
      articolo
      

      DE CARVALHO, Mauricio; Bernardi, Paolo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Ballan, O.
      JOURNAL OF ELECTRONIC TESTING
      Springer
      Vol.30 pp.12 (pp.317-328) ISSN:0923-8174 DOI:10.1007/s10836-014-5457-5

  30. Software-Based Hardening Strategies for Neutron Sensitive FFT Algorithms on GPUs
      articolo
      

      Pilla, L. L.; Rech, P.; Silvestri, F.; Frost, C.; Navaux, P. O. A.; SONZA REORDA, Matteo; Carro, L.
      IEEE TRANSACTIONS ON NUCLEAR SCIENCE
      IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS INC
      Vol.61 pp.7 (pp.1874-1880) ISSN:0018-9499 DOI:10.1109/TNS.2014.2301768

  31. Reconfigurable High Performance Architectures: How much are they ready for safety-critical applications
      proceeding
      

      Sabena, Davide; Sterpone, Luca; Schölzel, M.; Koal, T.; Vierhaus, H. T.; Wong, S.; Glein, R.; Rittner, F.; Stender, C.; Porrmann, M.; Hagemeyer, J.
      In: Proceedings of 19th IEEE European Test Symposium (ETS)
      19th IEEE European Test Symposium (ETS) (Paderborn) 26 May - 30 May 2014
      pp.8 (pp.175-182)

  32. On the In-Field Test of Branch Prediction Units using the Correlated Predictor mechanism
      proceeding
      

      Gaudesi, Marco; S., Saleem; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; E., Tanowe
      In: Titolo volume non avvalorato
      IEEE
      IEEE 17th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (Warsaw, Poland) April 23-25
      

  33. A Functional Approach for Testing the Reorder Buffer Memory
      articolo
      

      DI CARLO, Stefano; Gaudesi, Marco; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
      JOURNAL OF ELECTRONIC TESTING
      Springer
      Vol.30 pp.13 (pp.469-481) ISSN:0923-8174 DOI:10.1007/s10836-014-5461-9

  34. Evaluating the radiation sensitivity of GPGPU caches: New algorithms and experimental results
      articolo
      

      Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca; Rech, P.; Carro, L.
      MICROELECTRONICS RELIABILITY
      Elsevier
      Vol.54 pp.8 (pp.2621-2628) ISSN:0026-2714 DOI:10.1016/j.microrel.2014.05.001

  35. Key Management for Static Wireless Sensor Networks With Node Adding
      articolo
      

      Gandino, Filippo; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS
      IEEE
      Vol.10 pp.11 (pp.1133-1143) ISSN:1551-3203 DOI:10.1109/TII.2013.2288063

  36. In-field testing of SoC devices: Which solutions by which players?
      proceeding
      

      Jacob A., Abraham; Xinli, Gu; Teresa, Maclaurin; Janusz, Rajski; Paul G., Ryan; Dimitris, Gizopoulos; SONZA REORDA, Matteo
      In: 2014 IEEE 32nd VLSI Test Symposium (VTS)
      IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS INC (STATI UNITI D'AMERICA)
      2014 IEEE 32nd VLSI Test Symposium (VTS)
      pp.2 DOI:10.1109/VTS.2014.6818780

  37. MIHST: A Hardware Technique for Embedded Microprocessor Functional On-line Self-Test
      articolo
      

      Bernardi, Paolo; Ciganda, LYL MERCEDES; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
      IEEE TRANSACTIONS ON COMPUTERS
      IEEE Computer Society
      Vol.63 pp.12 (pp.2760-2771) ISSN:0018-9340 DOI:10.1109/TC.2013.165

  38. GPGPUs: How to combine high computational power with high reliability
      proceeding
      

      Bautista Gomez, L.; Cappello, F.; Carro, L.; Debardeleben, N.; Fang, B.; Gurumurthi, S.; Pattabiraman, K.; Rech, P.; SONZA REORDA, Matteo
      In: Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
      IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS INC
      Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014 (Dresden, Germany) March 2014
      pp.10 DOI:10.7873/DATE2014.354

  39. An effective approach to automatic functional processor test generation for small-delay faults
      proceeding
      

      Riefert, Andreas; Ciganda, LYL MERCEDES; Sauer, Matthias; Bernardi, Paolo; SONZA REORDA, Matteo; Becker, Bernd
      In: Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
      IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS INC
      Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014 (Dresden, Germany) March 2014
      pp.6 DOI:10.7873/DATE2014.140

  40. Software-implemented Fault Injection in Operating System Kernel Mutex Data Structure
      proceeding
      

      Montrucchio, Bartolomeo; Rebaudengo, Maurizio; Velasco, ALEJANDRO DAVID
      In: Proceedings of 5th IEEE Latin American Symposium on Circuits and Systems (LASCAS)
      5th IEEE Latin American Symposium on Circuits and Systems (Santiago, Chile) February 25 - 28, 2014
      pp.6 (pp.1-6) DOI:10.1109/LASCAS.2014.6820257

  41. In- and out-degree distributions of nodes and coverage in random sector graphs
      articolo
      

      Ferrero, Renato; Bueno Delgado, M. V.; Gandino, Filippo
      IEEE TRANSACTIONS ON WIRELESS COMMUNICATIONS
      IEEE
      Vol.13 pp.12 (pp.2074-2085) ISSN:1536-1276 DOI:10.1109/TWC.2014.031314.130905

  42. On the Functional Test of the Register Forwarding and Pipeline Interlocking Unit in Pipelined Processors
      proceeding
      

      Bernardi, Paolo; Cantoro, Riccardo; Ciganda, LYL MERCEDES; Du, Boyang; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Grosso, Michelangelo; O., Ballan
      In: Proceedigns on 14th International Workshop on Microprocessor Test and Verification (MTV), 2013
      IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS INC
      14th International Workshop on Microprocessor Test and Verification (MTV) (Austin, Tx, USA) December 12–13, 2013
      pp.6 (pp.52-57) DOI:10.1109/MTV.2013.10

  43. The impact of topology on energy consumption for collection tree protocols: An experimental assessment through evolutionary computation
      articolo
      

      Doina, Bucur; Giovanni, Iacca; Squillero, Giovanni; Alberto, Tonda
      APPLIED SOFT COMPUTING
      Elsevier
      Vol.16 pp.13 (pp.210-222) ISSN:1568-4946 DOI:10.1016/j.asoc.2013.12.002

  44. Towards Automated Malware Creation: Code Generation and Code Integration
      proceeding
      

      Cani, A.; Gaudesi, Marco; SANCHEZ SANCHEZ, EDGAR ERNESTO; Squillero, Giovanni; Tonda, ALBERTO PAOLO
      In: Towards Automated Malware Creation: Code Generation and Code Integration
      ACM SIGAPP
      29th Symposium on Applied Computing - SAC 14 (Gyeongju, Korea) March 24 - 28, 2014
      pp.2 (pp.157-158)

  45. Improving Colorwave with the probabilistic approach for reader-to-reader anti-collision TDMA protocols
      articolo
      

      Ferrero, Renato; Gandino, Filippo; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      WIRELESS NETWORKS
      Springer US
      Vol.20 pp.13 (pp.397-409) ISSN:1022-0038 DOI:10.1007/s11276-013-0611-z

  46. On the Automatic Generation of Optimized Software-Based Self-Test Programs for VLIW Processors
      articolo
      

      Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca
      IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
      IEEE
      Vol.22 pp.11 (pp.813-823) ISSN:1063-8210 DOI:10.1109/TVLSI.2013.2252636

  47. Performance analysis of reliable flooding in duty-cycle wireless sensor networks
      articolo
      

      Zhang, Linchao; Ferrero, Renato; SANCHEZ SANCHEZ, ERWING RICARDO; Rebaudengo, Maurizio
      TRANSACTIONS ON EMERGING TELECOMMUNICATIONS TECHNOLOGIES
      John Wiley & Sons
      Vol.25 pp.16 (pp.183-198) ISSN:2161-3915 DOI:10.1002/ett.2556

  2013

  1. A software-based self-test strategy for on-line testing of the scan chain circuitries in embedded microprocessors
     proceeding
     

     Ballan, O.; Bernardi, P.; Yazdani, B.; Sanchez, E.
     In: Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium, IOLTS 2013
     IEEE (STATI UNITI D'AMERICA)
     2013 IEEE 19th International On-Line Testing Symposium, IOLTS 2013 (Chania, Crete, grc) 2013
     pp.6 (pp.79-84) ISBN:9781479906642 DOI:10.1109/IOLTS.2013.6604055

  2. Accurate Mitigation of Single Event Effects on Flash-based FPGAs: A new Design Flow
     proceeding
     

     Sterpone, Luca; Du, Boyang; D., Merodio Codinachs; V., Ferlet Cavrois
     In: Proceedings of RADECS
     RADECS (Oxford) September, 2013
     pp.4

  3. Industrial applications of evolutionary algorithms
     proceeding
     

     Squillero, Giovanni
     In: Proceeding of the fifteenth annual conference companion on Genetic and evolutionary computation conference companion - GECCO '13 Companion
     ACM
     GECCO
     pp.21 (pp.935-955) DOI:10.1145/2464576.2480814

  4. Validation and robustness assessment of an automotive system
     proceeding
     

     Desogus, Marco; SONZA REORDA, Matteo; Sterpone, Luca; Avantaggiati, V. A.; Audisio, G.; Sabatini, M.
     In: Proceedings of 8th IEEE International Design & Test Symposium
     8th IEEE International Design & Test Symposium (IDT) (Marrakech) 16-18 Dicembre 2013
     pp.6

  5. On the evaluation of soft-errors detection techniques for GPGPUs
     proceeding
     

     Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca; Rech, P.; Carro, L.
     In: Proceedings of 2013 8th IEEE International Design and Test Symposium (IDT)
     2013 8th IEEE International Design and Test Symposium (IDT) (Marrakesh) December 16-18, 2013
     pp.6

  6. Fault detection in RNS Montgomery modular multiplication
     proceeding
     

     Jean Claude Bajard, Julien Eynard; Gandino, Filippo
     In: Titolo volume non avvalorato
     IEEE
     Computer Arithmetic (ARITH), 2013 21st IEEE Symposium on (Austin, TX) 7-10 April 2013
     pp.8 (pp.119-126) DOI:10.1109/ARITH.2013.31

  7. Simulation and evaluation of the interference models for RFID reader-to-reader collisions
     proceeding
     

     Zhang, Linchao; Ferrero, Renato; Gandino, Filippo; Rebaudengo, Maurizio
     In: Proceedings of 11th International Conference on Advances in Mobile Computing & Multimedia (MoMM2013)
     ACM (STATI UNITI D'AMERICA)
     11th International Conference on Advances in Mobile Computing & Multimedia (MoMM2013) (Vienna (Austria)) 2-4 dicembre 2013
     pp.8 (pp.209-216) ISBN:9781450321068 DOI:10.1145/2536853.2536877

  8. An efficient method for the test of embedded memory cores during the operational phase
     proceeding
     

     Bernardi, Paolo; Ciganda, LYL MERCEDES; SONZA REORDA, Matteo; Hamdioui, Said
     In: 2013 22nd Asian Test Symposium
     IEEE Computer Society (STATI UNITI D'AMERICA)
     2013 22nd Asian Test Symposium (Yilan, Taiwan) Nov. 2013
     pp.6 (pp.227-232)

  9. SEL-UP: A CAD tool for the sensitivity analysis of radiation-induced Single Event Latch-Up
     articolo
     

     Sterpone, Luca
     MICROELECTRONICS RELIABILITY
     Elsevier
     Vol.53 pp.4 (pp.1311-1314) ISSN:0026-2714 DOI:10.1016/j.microrel.2013.07.104

  10. On the Automatic Generation of Software-Based Self-Test Programs for Functional Test and Diagnosis of VLIW Processors
      proceeding
      

      Sabena, Davide; Sterpone, Luca; SONZA REORDA, Matteo
      In: VLSI-SoC: From Algorithms to Circuits and System-on-Chip Design
      Springer Berlin Heidelberg
      20th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration (Santa Cruz, CA, USA) October 7-10, 2012
      pp.19 (pp.162-180) ISBN:9783642450723 DOI:10.1007/978-3-642-45073-0_9

  11. Accounting for Post-Transcriptional Regulation in Boolean Networks Based Regulatory Models.
      proceeding
      

      Benso, Alfredo; DI CARLO, Stefano; Rehman, H. U.; Politano, GIANFRANCO MICHELE MARIA; Savino, Alessandro; Squillero, Giovanni; Vasciaveo, Alessandro; Benedettini, S.
      In: International Work-Conference on Bioinformatics and Biomedical Engineering (IWBBIO) 2013
      Copicentro Editorial (SPAGNA)
      International Work-Conference on Bioinformatics and Biomedical Engineering, IWBBIO 2013 (Granada, ES) 18-20 March , 2013
      pp.8 (pp.397-404)

  12. Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption
      articolo
      

      Bernardi, Paolo; DE CARVALHO, Mauricio; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; A., Bosio; L., Dilillo; M., Valka; P., Girard
      JOURNAL OF LOW POWER ELECTRONICS
      American Standard Publishers
      Vol.9 pp.11 (pp.253-263) ISSN:1546-1998 DOI:10.1166/jolpe.2013.1259

  13. Increasing fault coverage during functional test in the operational phase2013 IEEE 19th International On-Line Testing Symposium (IOLTS)
      proceeding
      

      DE CARVALHO, Mauricio; Bernardi, Paolo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; O., Ballan
      In: 2013 IEEE 19th International On-Line Testing Symposium (IOLTS)
      2013 IEEE 19th International On-Line Testing Symposium (IOLTS)
      (pp.43-48) DOI:10.1109/IOLTS.2013.6604049

  14. On the development of diagnostic test programs for VLIW processors
      proceeding
      

      Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca
      In: Proceedings of 21st IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)
      21st IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) (Istanbul) October 2013
      pp.6 (pp.87-92)

  15. Hardening of serial communication protocols for potentially critical systems in automotive applications: LIN bus
      proceeding
      

      A., Vaskova; M., Portela Garcia; M., Garcia Valderas; C., Lopez Ongil; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS INC (STATI UNITI D'AMERICA)
      2013 IEEE 19th International On-Line Testing Symposium (IOLTS)
      pp.6 (pp.13-18) DOI:10.1109/IOLTS.2013.6604044

  16. EXPLOITING THE DEBUG INTERFACE TO SUPPORT ON LINE TEST OF CONTROL FLOW ERRORS
      proceeding
      

      Du, Boyang; SONZA REORDA, Matteo; Sterpone, Luca; L., Parra; M., PORTELA GARCIA; A., Lindoso; L., Entrena
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      2013 IEEE 19th International On-Line Testing Symposium (IOLTS)
      pp.6 (pp.98-103) DOI:10.1109/IOLTS.2013.6604058

  17. Hierarchical Key Negotiation Technique for Transitory Master Key Schemes in Wireless Sensor Networks
      proceeding
      

      Celozzi, Cesare; Gandino, Filippo; Rebaudengo, Maurizio
      In: Titolo volume non avvalorato
      8TH INTERNATIONAL CONFERENCE ON BROADBAND AND WIRELESS COMPUTING, COMMUNICATION AND APPLICATIONS (COMPIEGNE, COMPIEGNE, FRANCE) October 28-30, 2013
      

  18. Power Consumption Versus Configuration SEUs in Xilinx Virtex-5 FPGAs
      articolo
      

      Aloisio, A.; Bocci, V.; Giordano, R.; Izzo, V.; Sterpone, Luca; Violante, Massimo
      IEEE TRANSACTIONS ON NUCLEAR SCIENCE
      IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667
      Vol.60 pp.6 (pp.3502-3507) ISSN:0018-9499 DOI:10.1109/TNS.2013.2273001

  19. On the functional test of the BTB logic in pipelined and superscalar processors
      proceeding
      

      Changdao, D.; Graziano, Mariagrazia; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Zamboni, Maurizio; Zhifan, N.
      In: Test Workshop (LATW), 2013 14th Latin American
      IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS INC
      Test Workshop (LATW), 2013 14th Latin American (Cordoba, Argentina) 2013
      pp.5 (pp.1-6) DOI:10.1109/LATW.2013.6562677

  20. Applications of Evolutionary Computation
      curatela
      

      Anna I., Esparcia Alcazar; Sara, Silva; Alexandros, Agapitos; Carlos, Cotta; Ivanoe De, Falco; Antonio Della, Cioppa; Konrad, Diwold; Aniko, Ekart; Ernesto, Tarantino; Francisco Fernandez de, Vega; Paolo, Burelli; Kevin, Sim; Stefano, Cagnoni; Anabela, Simoes; Jj, Merelo; Neil, Urquhart; Evert, Haasdijk; Mengjie, Zhang; Squillero, Giovanni; A. E., Eiben; Andrea, Tettamanzi; Kyrre, Glette; Philipp, Rohlfshagen; Robert, Schaefer
      Springer Verlag Germany:Tiergartenstrasse 17, D 69121 Heidelberg Germany:011 49 6221 3450, EMAIL: g.braun@springer.de, INTERNET: http://www.springer.de, Fax: 011 49 6221 345229
      pp.639 (pp.1-639)

  21. IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems Guest Editorial
      articolo
      

      Prashant D., Joshi; Violante, Massimo
      JOURNAL OF ELECTRONIC TESTING
      Springer Verlag Germany:Tiergartenstrasse 17, D 69121 Heidelberg Germany:011 49 6221 3450, EMAIL: g.braun@springer.de, INTERNET: http://www.springer.de, Fax: 011 49 6221 345229
      Vol.29 pp.2 (pp.259-260) ISSN:0923-8174 DOI:10.1007/s10836-013-5390-z

  22. Dynamic Neutron Testing of Dynamically Reconfigurable Processing Modules Architecture
      proceeding
      

      Sterpone, Luca; Sabena, Davide; Ullah, Anees; Porrmann, M.; Hagemeyer, J.; Ilstad, J.
      In: Titolo volume non avvalorato
      IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS INC
      IEEE AHS (Torino) June 2013
      pp.5 (pp.184-188)

  23. On the Optimal Reconfiguration Times for TMR Circuits on SRAM based FPGAs
      proceeding
      

      Sterpone, Luca; Ullah, Anees
      In: Titolo volume non avvalorato
      IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS INC
      IEEE AHS (Torino) June 2013
      pp.6 (pp.9-14)

  24. An Error-Detection and Self-Repairing Method for Dynamically and Partially Reconfigurable Systems
      proceeding
      

      SONZA REORDA, Matteo; Sterpone, Luca; Ullah, Anees
      In: Titolo volume non avvalorato
      IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS INC
      IEEE European Test Symposium
      pp.7 (pp.149-155)

  25. On-line testing of permanent radiation effects in reconfigurable systems
      proceeding
      

      Cassano, L.; Cozzi, D.; Korf, S.; Hagemeyer, J.; Porrmann, M.; Sterpone, Luca
      In: Titolo volume non avvalorato
      IEEE
      IEEE Design Automation and Test in Europe (Grenoble) April, 2013
      pp.4 (pp.717-720) DOI:10.7873/DATE.2013.154

  26. On-line functionally untestable fault identification in embedded processor cores
      proceeding
      

      Bernardi, Paolo; Bonazza, M.; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Ballan, O.
      In: Titolo volume non avvalorato
      IEEE
      Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
      

  27. An Efficient Distance Metric for Linear Genetic Programming
      proceeding
      

      Gaudesi, Marco; Squillero, Giovanni; Tonda, A.
      In: Proceeding of the fifteenth annual conference on Genetic and evolutionary computation conference
      ACM (STATI UNITI D'AMERICA)
      GECCO 2013 - Genetic and Evolutionary Computation Conference (Amsterdam, The Netherlands) July 06-10, 2013
      pp.8 (pp.925-932) DOI:10.1145/2463372.2463495

  28. An Evolutionary Approach to Wetlands Design
      proceeding
      

      Gaudesi, Marco; Marion, A.; Musner, T.; Squillero, Giovanni; Tonda, ALBERTO PAOLO
      LECTURE NOTES IN COMPUTER SCIENCE
      In: Titolo volume non avvalorato
      Springer Berlin Heidelberg
      11th European Conference on Evolutionary Computation, Machine Learning and Data Mining in Bioinformatics, EvoBIO 2013 (Vienna (Austria)) 3-5 April 2013
      Vol.7833 pp.11 (pp.177-187) ISSN:0302-9743 DOI:10.1007/978-3-642-37189-9_16

  29. Simulating reader-to-reader interference in RFID systems
      proceeding
      

      Ferrero, Renato; Gandino, Filippo; Zhang, Linchao; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      In: Proceedings of the 2013 27th International Conference on Advanced Information Networking and Applications Workshops
      IEEE
      27th International Conference on Advanced Information Networking and Applications Workshops (Barcellona (Spagna)) 25-28 Marzo 2013
      pp.7 (pp.1063-1069) DOI:10.1109/WAINA.2013.90

  30. On the On-line Functional Test of the Reorder Buffer Memory in Superscalar Processors
      proceeding
      

      DI CARLO, Stefano; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
      In: Proceedings of the IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems 2013
      IEEE (STATI UNITI D'AMERICA)
      IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2013 (Karlovy Vary) 8-10 April 2013
      pp.6 (pp.36-41) DOI:10.1109/DDECS.2013.6549785

  31. Trade-off between maximum cardinality of collision sets and accuracy of RFID reader-to-reader collision detection
      articolo
      

      Zhang, Linchao; Gandino, Filippo; Ferrero, Renato; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      EURASIP JOURNAL ON EMBEDDED SYSTEMS
      EURASIP
      Vol.2013 pp.14 ISSN:1687-3963 DOI:10.1186/1687-3963-2013-10

  32. Reliability Analysis Reloaded: How Will We Survive?
      proceeding
      

      Robert, Aitken; Görschwin, Fey; Zbigniew T., Kalbarczyk; Frank, Reichenbach; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      Design, Automation & Test in Europe (Grenoble (France)) March 2013
      pp.10 (pp.358-367)

  33. Improving Key Negotiation in Transitory Master Key Schemes for Wireless Sensor Networks
      proceeding
      

      Celozzi, Cesare; Gandino, Filippo; Rebaudengo, Maurizio
      LECTURE NOTES OF THE INSTITUTE FOR COMPUTER SCIENCES, SOCIAL INFORMATICS AND TELECOMMUNICATIONS ENGINEERING
      In: Titolo volume non avvalorato
      Springer
      4th International Conference on Sensor Systems and Software (S-CUBE 2013) (Lucca) June 11–12, 2013
      ISSN:1867-8211 DOI:10.1007/978-3-319-04166-7_1

  34. An Evolutionary Framework for Routing Protocol Analysis in Wireless Sensor Networks
      proceeding
      

      Doina, Bucur; Giovanni, Iacca; Squillero, Giovanni; Alberto, Tonda
      LECTURE NOTES IN COMPUTER SCIENCE
      In: Titolo volume non avvalorato
      Springer
      16th European Conference on Applications of Evolutionary Computation, EvoApplications 2013 (Vienna (Austria)) 3-5 April 2013
      Vol.7835 pp.11 (pp.1-11) ISSN:0302-9743 ISBN:9783642371912 DOI:10.1007/978-3-642-37192-9-1

  35. A Memetic Approach to Bayesian Network Structure Learning
      proceeding
      

      Alberto, Tonda; Evelyne, Lutton; Squillero, Giovanni; Pierre Henri, Wuillemin
      LECTURE NOTES IN COMPUTER SCIENCE
      In: Applications of Evolutionary Computation
      Springer Verlag Germany:
      16th European Conference, EvoApplications 2013 (Vienna (Austria)) April 3-5, 2013
      Vol.7835 pp.10 (pp.102-111) ISSN:0302-9743 ISBN:9783642371912 DOI:10.1007/978-3-642-37192-9_11

  36. A Novel Fault Tolerant and Run-Time Reconfigurable Platform for Satellite Payload Processing
      articolo
      

      Sterpone, Luca; Mario, Porrmann; Jens, Hagemeyer
      IEEE TRANSACTIONS ON COMPUTERS
      IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS INC
      Vol.62 pp.18 (pp.1508-1525) ISSN:0018-9340 DOI:10.1109/TC.2013.80

  37. Evaluation of Single and Additive Interference Models for RFID Collisions
      articolo
      

      Zhang, Linchao; Gandino, Filippo; Ferrero, Renato; Rebaudengo, Maurizio
      MATHEMATICAL AND COMPUTER MODELLING
      Elsevier
      Vol.58 pp.13 (pp.1236-1248) ISSN:0895-7177 DOI:10.1016/j.mcm.2013.01.011

  38. A Functional Test Algorithm for the Register Forwarding and Pipeline Interlocking unit in Pipelined Microprocessors
      proceeding
      

      Bernardi, Paolo; Du, Boyang; Ciganda, LYL MERCEDES; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Grosso, Michelangelo; Ballan, O.
      In: IEEE 7th International Design and Test Symposium (IDT)
      IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS INC
      IEEE 7th International Design and Test Symposium (IDT) (Doha (Qatar)) December 2012
      pp.6 DOI:10.1109/IDT.2013.6727120

  39. Evolutionary Optimization of Wetlands Design
      proceeding
      

      Gaudesi, Marco; A., Marion; T., Musner; Squillero, Giovanni; A., Tonda
      In: Proceedings of the 28th Annual ACM Symposium on Applied Computing
      ACM New York, NY, USA (STATI UNITI D'AMERICA)
      28th Annual ACM Symposium on Applied Computing, SAC 2013 (Coimbra, Portugal) 18 - 22 Marzo 2013
      Vol.I pp.6 (pp.176-181) ISBN:9781450316569 DOI:10.1145/2480362.2480400

  40. A Geometric Distribution Reader Anti-collision protocol for RFID Dense Reader Environments
      articolo
      

      M. V., Bueno Delgado; Ferrero, Renato; Gandino, Filippo; P., Pavon Marino; Rebaudengo, Maurizio
      IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING
      IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667
      Vol.10 pp.11 (pp.296-306) ISSN:1545-5955 DOI:10.1109/TASE.2012.2218101

  41. DCNS: an Adaptable High Throughput RFID Reader-to-Reader Anti-collision Protocol
      articolo
      

      Gandino, Filippo; Ferrero, Renato; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      IEEE TRANSACTIONS ON PARALLEL AND DISTRIBUTED SYSTEMS
      IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS INC
      Vol.24 pp.13 (pp.893-905) ISSN:1045-9219 DOI:10.1109/TPDS.2012.208

  2012

  1. Bayesian network structure learning from limited datasets through graph evolution
     proceeding
     

     Tonda, Alberto Paolo; Lutton, Evelyne; Reuillon, Romain; Squillero, Giovanni; Wuillemin, Pierre-Henri
     LECTURE NOTES IN ARTIFICIAL INTELLIGENCE
     In: Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
     Springer
     15th European Conference on Genetic Programming, EuroGP 2012 (Malaga, esp) 2012
     Vol.7244 pp.12 (pp.254-265) ISBN:9783642291388 DOI:10.1007/978-3-642-29139-5_22

  2. SEU effects on power consumption in FPGAs
     proceeding
     

     Aloisio, A.; Bocci, V.; Chiodi, G.; Giordano, R.; Izzo, V.; Sterpone, Luca; Violante, Massimo
     In: Titolo volume non avvalorato
     IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS INC
     IEEE Real Time Conference (San Francisco, USA) June 2012
     pp.6 (pp.1-5) DOI:10.1109/RTC.2012.6418110

  3. Accurate simulation of SEUs in the configuration memory of SRAM-based FPGAs
     proceeding
     

     Bernardeschi, C.; Cassano, L.; Domenici, A.; Sterpone, Luca
     In: Titolo volume non avvalorato
     IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS INC
     IEEE DFT (Austin, TX, USA) October, 2012
     pp.6 (pp.115-120) DOI:10.1109/DFT.2012.6378210

  4. Peak Power Estimation: A Case Study on CPU Cores
     proceeding
     

     Bernardi, Paolo; DE CARVALHO, Mauricio; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; A., Bosio; L., Dilillo; P., Girard; M., Valka
     In: Titolo volume non avvalorato
     IEEE Computer Society
     2012 IEEE 21st Asian Test Symposium
     pp.6 (pp.167-172) DOI:10.1109/ATS.2012.58

  5. High-reliability fault tolerant digital systems in nanometric technologies: Characterization and design methodologies
     proceeding
     

     Bolchini, C.; Miele, A.; Sandionigi, C.; Ottavi, M.; Pontarelli, S.; Salsano, A.; Metra, C.; Omana, M.; Rossi, D.; SONZA REORDA, Matteo; Sterpone, Luca; Violante, Massimo; Gerardin, S.; Bagatin, M.; Paccagnella, A.
     In: Titolo volume non avvalorato
     IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
     IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
     pp.5 (pp.121-125) ISBN:9781467330435 DOI:10.1109/DFT.2012.6378211

  6. Automatic Generation of On-Line Test Programs through a Cooperation Scheme
     proceeding
     

     Ciganda, LYL MERCEDES; Gaudesi, Marco; Lutton, E.; SANCHEZ SANCHEZ, EDGAR ERNESTO; Squillero, Giovanni; Tonda, ALBERTO PAOLO
     In: Titolo volume non avvalorato
     IEEE
     13th International Workshop on Microprocessor Test and Verification (MTV), 2012 (Austin TX, USA) 10-13 Dec. 2012
     pp.6 (pp.13-18) DOI:10.1109/MTV.2012.17

  7. Software-Based Testing for System Peripherals
     articolo
     

     Grosso, Michelangelo; Perez Holguin, W. J.; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Tonda, ALBERTO PAOLO; Velasco Medina, J.
     JOURNAL OF ELECTRONIC TESTING
     springer US
     Vol.28 pp.12 (pp.189-200) ISSN:0923-8174 DOI:10.1007/s10836-012-5287-2

  8. A benchmark for cooperative coevolution
     articolo
     

     Alberto, Tonda; Evelyne, Lutton; Squillero, Giovanni
     MEMETIC COMPUTING
     Springer
     Vol.4 pp.15 (pp.263-277) ISSN:1865-9284 DOI:10.1007/s12293-012-0095-x

  9. Latch-up test measurement for long duration space missions
     proceeding
     

     Sterpone, Luca; R., Mancini; D., Gelfusa
     In: Titolo volume non avvalorato
     IEEE (STATI UNITI D'AMERICA)
     Instrumentation and Measurement Technology Conference (Graz (AUSTRIA)) 13-16 May, 2012
     pp.5 (pp.1010-1014) DOI:10.1109/I2MTC.2012.6229561

  10. A scalable platform for run-time reconfigurable satellite payload processing
      proceeding
      

      J., Hagemeyer; A., Hilgenstein; D., Jungewelter; D., Cozzi; C., Felicetti; U., Rueckert; S., Korf; M., Koester; F., Margaglia; M., Porrmann; F., Dittmann; M., Ditze; J., Harris; Sterpone, Luca; J., Ilstad
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      Adaptive Hardware and Systems (Erlangen (GERMANY)) June 25 - 28, 2012
      pp.8 (pp.9-16) DOI:10.1109/AHS.2012.6268642

  11. On-line test of embedded systems: Which role for functional test?
      proceeding
      

      SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2012 (Tallinn, Estonia)
      pp.1 DOI:10.1109/DDECS.2012.6219007

  12. On the Functional Test of Branch Prediction Units Based on the Branch History Table Architecture
      proceeding
      

      SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Alberto Paolo, Tonda
      In: VLSI-SoC: Advanced Research for Systems on Chip 19th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2011, Hong Kong, China, October 3-5, 2011, Revised Selected Papers
      Springer
      19th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2011 (Hong Kong; China) 3-5 October 2011
      Vol.379 pp.14 (pp.110-123) ISBN:9783642327704 DOI:10.1007/978-3-642-32770-4

  13. On the development of Software-Based Self-Test methods for VLIW processors
      proceeding
      

      Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca
      In: Titolo volume non avvalorato
      Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2012 IEEE International Symposium on (Austin, TX, USA) October, 2012.
      pp.6 (pp.25-30) ISBN:9781467330435 DOI:10.1109/DFT.2012.6378194

  14. On the optimized generation of Software-Based Self-Test programs for VLIW processors
      proceeding
      

      Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca
      In: Titolo volume non avvalorato
      VLSI and System-on-Chip (VLSI-SoC), 2012 IEEE/IFIP 20th International Conference on (Santa Cruz, CA, USA) 7-10 October 2012
      pp.6 (pp.129-134) ISBN:9781467326575 DOI:10.1109/VLSI-SoC.2012.6379018

  15. Evaluation Criteria for Reader-to-Reader Anti-collision Protocols
      altro
      

      Gandino, Filippo; Ferrero, Renato; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      pp.9

  16. E-Learning at Politecnico di Torino: Moving to a Sustainable Large-Scale Multi-Channel System of Services
      capitolo
      

      Barbagallo, Salvatore; Bertonasco, Roberto; Corno, Fulvio; Farinetti, Laura; Mezzalama, Marco; SONZA REORDA, Matteo; Venuto, Enrico
      Handbook of Research on Didactic Strategies and Technologies for Education: Incorporating Advancements
      Information Science Reference (an imprint of IGI Global) (STATI UNITI D'AMERICA)
      pp.13 (pp.690-702) ISBN:9781466621220 DOI:10.4018/978-1-4666-2122-0.ch060

  17. Evaluation of the Additive Interference Model for RFID Reader Collision Problem
      proceeding
      

      Zhang, Linchao; Gandino, Filippo; Ferrero, Renato; Rebaudengo, Maurizio
      In: Proceedings of the 2012 4th International EURASIP Workshop on RFID Technology
      IEEE
      2012 4th International EURASIP Workshop on RFID Technology (Torino) 27-28 September 2012
      pp.5 ISBN:9780769548135

  18. A new IP core for fast error detection and fault tolerance in COTS-based solid state mass memories
      proceeding
      

      Costenaro, E.; Violante, Massimo; Alexandrescu, D.
      In: Titolo volume non avvalorato
      On-Line Testing Symposium (IOLTS), 2011 IEEE 17th International
      pp.6 (pp.49-54) ISBN:9781457710537 DOI:10.1109/IOLTS.2011.5993810

  19. An hybrid architecture to detect transient faults in microprocessors: An experimental validation
      proceeding
      

      Campagna, Salvatore; Violante, Massimo
      In: Titolo volume non avvalorato
      Design, Automation & Test in Europe Conference & Exhibition (DATE), 2012
      pp.6 (pp.1433-1438) ISBN:9781457721458

  20. A Comparison between Single and Additive Contribution in RFID Reader-to-Reader Interference Models
      proceeding
      

      Zhang, Linchao; Ferrero, Renato; Gandino, Filippo; Rebaudengo, Maurizio
      In: Proceedings of the 2012 6th International Conference on Innovative Mobile and Internet Services in Ubiquitous Computing
      IEEE
      2012 6th International Conference on Innovative Mobile and Internet Services in Ubiquitous Computing (Palermo, Italy) 4-6 July, 2012
      pp.8 (pp.177-184) ISBN:9780769546841 DOI:10.1109/IMIS.2012.122

  21. Applications of Evolutionary Computation
      curatela
      

      C., Di Chio; A., Agapitos; S., Cagnoni; C., Cotta; F., Fernández de Vega; G. A., Di Caro; R., Drechsler; A., Ekárt; A. I., Esparcia Alcázar; M., Farooq; W. B., Langdon; J. J., Merelo Guervós; M., Preuss; H., Richter; S., Silva; A., Simões; Squillero, Giovanni; E., Tarantino; A., Tettamanzi; J., Togelius; N., Urquhart; A. S., Uyar; G. N., Yannakakis
      SPRINGER
      Vol.7248 pp.542 (pp.1-542) ISBN:9783642291777

  22. On the functional test of L2 caches
      proceeding
      

      Riga, M.; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      IEEE
      2012 IEEE 18th International On-line Testing Symposium (IOLTS)
      pp.7 (pp.84-90) ISBN:9781467320832

  23. On-Line Software-Based Self-Test of the Address Calculation Unit in RISC Processors
      proceeding
      

      Bernardi, Paolo; Ciganda, LYL MERCEDES; DE CARVALHO, Mauricio; Grosso, Michelangelo; J., Lagos Benites; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; O., Ballan
      In: Titolo volume non avvalorato
      European Test Symposium (ETS), 2012 17th IEEE
      ISBN:9781467306966

  24. A New Fault Injection Approach for Testing Network-on-Chips
      proceeding
      

      Sterpone, Luca; Sabena, Davide; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      PDP 2012 (Munich)
      pp.6 (pp.530-535) DOI:10.1109/PDP.2012.82

  25. Network Modeling and Interference Analysis in Pervasive Technology
      tesi dottorato
      

      Ferrero, Renato
      Politecnico di Torino
      pp.134 DOI:10.6092/polito/porto/2496150

  26. An algorithmic and architectural study on Montgomery exponentiation in RNS
      articolo
      

      Gandino, Filippo; Lamberti, Fabrizio; Paravati, Gianluca; Bajard, J. C.; Montuschi, Paolo
      IEEE TRANSACTIONS ON COMPUTERS
      Piscataway, N.J. : IEEE
      Vol.61:8 pp.13 (pp.1071-1083) ISSN:0018-9340 DOI:10.1109/TC.2012.84

  27. A SBST strategy to test microprocessors' branch target buffer
      proceeding
      

      Bernardi, Paolo; Ciganda, LYL MERCEDES; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      IEEE
      IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2012) (Tallinn, Estonia) April 18-20, 2012
      pp.6 (pp.306-311) ISBN:9781424497546

  28. On the use of embedded debug features for permanent and transient fault resilience in microprocessors
      articolo
      

      Portela Garcia, M.; Grosso, Michelangelo; Gallardo Campos, M.; SONZA REORDA, Matteo; Enterna, L.; Garcia Valderas, M.; Lopez Ongil, C.
      MICROPROCESSORS AND MICROSYSTEMS
      Elsevier
      Vol.36 pp.17 (pp.334-343) ISSN:0141-9331 DOI:10.1016/j.micpro.2012.02.013

  29. Industrial Applications of Evolutionary Algorithms
      monografia
      

      SANCHEZ SANCHEZ, EDGAR ERNESTO; Squillero, Giovanni; Tonda, A.
      Springer
      Vol.34 pp.134 ISBN:9783642274664 DOI:10.1007/978-3-642-27467-1

  30. A New SBST Algorithm for Testing the Register File of VLIW Processors
      proceeding
      

      Sterpone, Luca; Sabena, Davide; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      IEEE Design, Automation and Test in Europe, 2012 (Dresden, Germany) 12-16 March 2012
      pp.6 (pp.412-417)

  31. A fair and high throughput reader-to-reader anticollision protocol in dense RFID networks
      articolo
      

      Ferrero, Renato; Gandino, Filippo; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS
      IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667
      Vol.8 pp.10 (pp.697-706) ISSN:1551-3203 DOI:10.1109/TII.2011.2176742

  32. An adaptive low-cost tester architecture supporting embedded memory volume diagnosis
      articolo
      

      Bernardi, Paolo; Ciganda, LYL MERCEDES
      IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
      IEEE Instrumentation and Measurement Society Editor-in-Chief: Professor Reza Zoughi
      Vol.61 pp.17 (pp.1002-1018) ISSN:0018-9456 DOI:10.1109/TIM.2011.2179822

  2011

  1. Automatic Generation of Software-based Functional Failing Test for Speed Debug and On-silicon Timing Verification2011 12th International Workshop on Microprocessor Test and Verification
     proceeding
     

     SANCHEZ SANCHEZ, EDGAR ERNESTO; Squillero, Giovanni; Tonda, ALBERTO PAOLO
     In: 2011 12th International Workshop on Microprocessor Test and Verification
     IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667
     MTV (Austin)
     pp.5 (pp.51-55) ISBN:9780769545943 DOI:10.1109/MTV.2011.19

  2. Layout-Aware Multi-Cell Upsets Effects Analysis on TMR Circuits Implemented on SRAM-Based FPGAs
     articolo
     

     Sterpone, Luca; Violante, Massimo; Panariti, Alessandro; Bocquillo, A.; Miller, F.; Buard, N.; Manuzzato, A.; Gerardin, S.; Paccagnella, A.
     IEEE TRANSACTIONS ON NUCLEAR SCIENCE
     IEEE
     Vol.58 pp.8 (pp.2325-2332) ISSN:0018-9499 DOI:10.1109/TNS.2011.2161887

  3. On the Modeling of Gate Delay Faults by Means of Transition Delay Faults
     proceeding
     

     Bernardi, Paolo; SONZA REORDA, Matteo; Bosio, A.; Girard, P.; Pravossoudovitch, S.
     In: Titolo volume non avvalorato
     Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2011 IEEE International Symposium on
     pp.7 (pp.226-232) DOI:10.1109/DFT.2011.53

  4. Evolutionary failing-test generation for modern microprocessors
     proceeding
     

     SANCHEZ SANCHEZ, EDGAR ERNESTO; Squillero, Giovanni; Tonda, ALBERTO PAOLO
     In: GECCO '11 Proceedings of the 13th annual conference companion on Genetic and evolutionary computation
     ACM
     GECCO'11
     DOI:10.1145/2001858.2001985

  5. Adaptive opponent modelling for the iterated prisoner's dilemma
     proceeding
     

     Piccolo, Elio; Squillero, Giovanni
     In: Titolo volume non avvalorato
     IEEE
     Evolutionary Computation (CEC)
     pp.6 (pp.836-841) DOI:10.1109/CEC.2011.5949705

  6. Post-silicon failing-test generation through evolutionary computation
     proceeding
     

     SANCHEZ SANCHEZ, EDGAR ERNESTO; Squillero, Giovanni; Tonda, ALBERTO PAOLO
     In: Titolo volume non avvalorato
     IEEE
     VLSI and System-on-Chip (VLSI-SoC)
     pp.4 (pp.164-167) DOI:10.1109/VLSISoC.2011.6081667

  7. Group evolution: Emerging synergy through a coordinated effort
     proceeding
     

     SANCHEZ SANCHEZ, EDGAR ERNESTO; Squillero, Giovanni; Tonda, ALBERTO PAOLO
     In: Evolutionary Computation (CEC), 2011 IEEE Congress on
     IEEE
     Evolutionary Computation (CEC)
     pp.6 (pp.2662-2668) DOI:10.1109/CEC.2011.5949951

  8. GECCO'11: Proceedings of the 13th annual conference on Genetic and evolutionary computation
     curatela
     

     N., Krasnogor; P. L., Lanzi; A., Engelbrecht; D., Pelta; C., Gershenson; Squillero, Giovanni; A., Freitas; M., Ritchie; M., Preuss; C., Gagne; Y., Soon Ong; G., Raidl; M., Gallager; J., Lozano; C., Coello Coello; D., Landa Silva; N., Hansen; S., Meyer Nieberg; J., Smith; G., Eiben; E., Bernado Mansilla; W., Browne; L., Spector; T., Yu; J., Clune; G., Hornby; M. L., Wong; P., Collet; S., Gustafson; J. P., Watson; M., Sipper; S., Poulding; G., Ochoa; M., Schoenauer; C., Witt; A., Auger
     ACM
     ISBN:9781450305570

  9. Applications of Evolutionary ComputationEvoApplications 2011: EvoCOMNET, EvoFIN, EvoHOT, EvoMUSART, EvoSTIM, and EvoTRANSLOG, Torino, Italy, April 27-29, 2011, Proceedings, Part II
     curatela
     

     C., Di Chio; A., Brabazon; G. A., Di Caro; R., Drechsler; M., Farooq; J., Grahl; G., Greenfield; C., Prins; J., Romero; Squillero, Giovanni; E., Tarantino; A. G. B., Tettamanzi; N., Urquhart; A., Sima Uyar
     LECTURE NOTES IN COMPUTER SCIENCE
     Springer
     Vol.6625 pp.510 (pp.1-510) ISSN:0302-9743

  10. Evolution of Test Programs Exploiting a FSM Processor Model
      proceeding
      

      SANCHEZ SANCHEZ, EDGAR ERNESTO; Squillero, Giovanni; Tonda, ALBERTO PAOLO
      LECTURE NOTES IN COMPUTER SCIENCE
      In: Titolo volume non avvalorato
      Springer
      EvoApplications 2011: EvoCOMNET, EvoFIN, EvoHOT, EvoMUSART, EvoSTIM, and EvoTRANSLOG (Torino (ITA)) April 27-29, 2011
      Vol.6625 pp.10 (pp.162-171) ISSN:0302-9743 DOI:10.1007/978-3-642-20520-0_17

  11. Lamps: A Test Problem for Cooperative Coevolution
      proceeding
      

      Tonda, ALBERTO PAOLO; E., Lutton; Squillero, Giovanni
      In: Nature Inspired Cooperative Strategies for Optimization
      Springer
      Nature Inspired Cooperative Strategies for Optimization (Cluj Napoca, Romania) October 20-22
      Vol.387 pp.20 (pp.101-120) DOI:10.1007/978-3-642-24094-2_7

  12. A new Architecture to Cross-Fertilize On-line and Manufacturing Testing
      proceeding
      

      Bernardi, Paolo; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      The Institute of Electrical and Electronics Engineers, Inc. (STATI UNITI D'AMERICA)
      Twentieth IEEE Asian Test Symposium (ATS 2011) (New Delhi, India) 20-23 November 2011
      pp.6 (pp.142-147) ISBN:9780769545837

  13. Artificial evolution in computer aided design: from the optimization of parameters to the creation of assembly programs
      articolo
      

      Squillero, Giovanni
      COMPUTING
      Springer-Verlag
      Vol.93 pp.18 (pp.103-120) ISSN:0010-485X DOI:10.1007/s00607-011-0157-9

  14. A Functional Power Evaluation Flow for Defining Test Power Limits during At-Speed Delay Testing
      proceeding
      

      M., Valka; A., Bosio; L., Dilillo; P., Girard; S., Pravossoudovitch; A., Virazel; SANCHEZ SANCHEZ, EDGAR ERNESTO; DE CARVALHO, Mauricio; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      2011 16th IEEE European Test Symposium (ETS)
      pp.6 (pp.153-158) DOI:10.1109/ETS.2011.21

  15. Optimized embedded memory diagnosis
      proceeding
      

      DE CARVALHO, Mauricio; Bernardi, Paolo; SONZA REORDA, Matteo; N., Campanelli; T., Kerekes; D., Appello; M., Barone; V., Tancorre; M., Terzi
      In: Titolo volume non avvalorato
      2011 IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
      pp.6 (pp.347-352) DOI:10.1109/DDECS.2011.5783109

  16. Implementing a safe embedded computing system in SRAM-based FPGAs using IP cores: A case study based on the Altera NIOS-II soft processor
      proceeding
      

      J., Perez Acle; SONZA REORDA, Matteo; Violante, Massimo
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      2011 IEEE Second Latin American Symposium on Circuits and Systems (LASCAS)
      pp.5 (pp.1-5) DOI:10.1109/LASCAS.2011.5750278

  17. An Effective Methodology for On-line Testing of Embedded Microprocessors
      proceeding
      

      Bernardi, Paolo; Ciganda, LYL MERCEDES; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      IEEE 17th International on-line testing symposium (IOLTS), 2011 (Atene (GR)) 13-15 July 2011
      pp.6 (pp.270-275) ISBN:9781457710537 DOI:10.1109/IOLTS.2011.5994541

  18. Performance Evaluation of Reliable and Unreliable Opportunistic Flooding in Wireless Sensor Network
      proceeding
      

      Zhang, Linchao; SANCHEZ SANCHEZ, ERWING RICARDO; Rebaudengo, Maurizio
      In: Titolo volume non avvalorato
      17th IEEE International Conference on Networks (ICON) (Singapore) 14-16 Dicembre 2011
      pp.6 (pp.7-12) ISBN:9781457718250 DOI:10.1109/ICON.2011.6168498

  19. On the functional test of MESI controllers
      proceeding
      

      SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      IEEE
      12th Latin American Test Workshop (LATW) (Porto de Galinhas (Brazil))
      pp.6 (pp.1-6) ISBN:9781457714894 DOI:10.1109/LATW.2011.5985909

  20. On the Functional Test of Branch Prediction Units based on Branch History Table
      proceeding
      

      SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Alberto, Tonda
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      19th IFIP/IFEE International Conference on Very Large Scale Integration and SoC (Hong Kong (China)) 3-5 October, 2011
      pp.6 (pp.278-283) ISBN:9781457701702

  21. An FPGA-emulation-based platform for characterization of digital baseband communication systems
      proceeding
      

      LAGOS BENITES, JORGE LUIS; Grosso, Michelangelo; SONZA REORDA, Matteo; Audisio, G.; Pipponzi, M.; Sabatini, M.; Avantaggiati, V. A.
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (Vancouver, B.C. (CA)) Oct. 3-5, 2011
      pp.8 (pp.391-398) ISBN:9781457717130 DOI:10.1109/DFT.2011.1

  22. Control flow checking through embedded debug interface
      proceeding
      

      Parra, L.; Lindoso, A.; Portela, M.; Entrena, L.; Grosso, Michelangelo; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      26th Conference on Desing of Circuits and Integrated Systems (Albufeira (P)) Nov. 16-18, 2011
      pp.4 (pp.339-342) ISBN:9789729918131

  23. Evaluation Framework of Opportunistic Flooding in Wireless Sensor Networks
      proceeding
      

      Zhang, Linchao; SANCHEZ SANCHEZ, ERWING RICARDO; Rebaudengo, Maurizio
      In: Titolo volume non avvalorato
      2011 Ninth IEEE/IFIP International Conference on Embedded and Ubiquitous Computing (Melbourne (Australia)) 24-26 Ottobre 2011
      pp.8 (pp.87-94)

  24. An adaptively reconfigurable computing framework for intelligent robotics
      proceeding
      

      Hussain, Moazzam; Din, Ahmad; Violante, Massimo; Bona, Basilio
      In: Titolo volume non avvalorato
      2011 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM 2011) (Budapest (Hungary)) 3-7 July, 2011
      pp.7 (pp.996-1002) ISBN:9781457708374

  25. Degree Distribution of Unit Disk Graphs with Uniformly Deployed Nodes on a Rectangular Surface
      proceeding
      

      Ferrero, Renato; Gandino, Filippo
      In: Proceedings of the 2011 International Conference on Broadband and Wireless Computing, Communication and Applications
      IEEE
      2011 International Conference on Broadband and Wireless Computing, Communication and Applications (BWCCA) (Barcelona (Spain)) October 26-28, 2011
      pp.8 (pp.255-262) ISBN:9781457714559 DOI:10.1109/BWCCA.2011.38

  26. Covariance Matrix Adaptation Evolutionary Strategy for Drift Correction of Electronic Nose Data
      proceeding
      

      DI CARLO, Stefano; Falasconi, M.; SANCHEZ SANCHEZ, EDGAR ERNESTO; Sberveglieri, G.; Scionti, A.; Squillero, Giovanni; Tonda, A.
      AIP CONFERENCE PROCEEDINGS
      In: Titolo volume non avvalorato
      American Institute of Physics
      14th International Symposium on Olfaction and Electronic Nose, ISOEN 2011 (New York (US)) May 2-5, 2011
      Vol.1362 pp.2 (pp.25-26) ISSN:0094-243X DOI:10.1063/1.3626293

  27. Increasing pattern recognition accuracy for chemical sensing by evolutionary based drift compensation
      articolo
      

      DI CARLO, Stefano; Falasconi, M.; SANCHEZ SANCHEZ, EDGAR ERNESTO; Scionti, A.; Squillero, Giovanni; Tonda, A.
      PATTERN RECOGNITION LETTERS
      Elsevier
      Vol.32 pp.10 (pp.1594-1603) ISSN:0167-8655 DOI:10.1016/j.patrec.2011.05.019

  28. Introducing probability in Colorwave
      altro
      

      Gandino, Filippo; Ferrero, Renato; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      pp.11 (pp.1-11)

  29. A New Reconfigurable Clock-gating Technique for Low Power SRAM-based FPGAs
      proceeding
      

      Sterpone, Luca; D., Matos; L., Carro; S., Wong; F., Anjam
      In: Titolo volume non avvalorato
      IEEE Design, Automation and Test in Europe (Grenoble, France) 14-18 Marzo, 2011
      pp.6 (pp.1-6)

  30. Fault Injection Analysis of Transient Faults in Clustered VLIW Processors
      proceeding
      

      Sterpone, Luca; Sabena, Davide; Campagna, Salvatore; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      IEEE
      14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (Cottbus, Germany) 13-15 Aprile, 2011
      pp.6 (pp.207-212)

  31. Analysis of SEU Effects in Partially Reconfigurable SoPCs
      proceeding
      

      Sterpone, Luca; F., Margaglia; M., Koester; J., Hagemeyer; M., Porrman
      In: Titolo volume non avvalorato
      IEEE
      IEEE NASA/ESA Conference on Adaptive Hardware Systems June 6-9, 2011
      pp.8 (pp.129-136) DOI:10.1109/AHS.2011.5963926

  32. An Analytical Model of the Propagation Induced Pulse Broadening (PIPB) Effects on Single Event Transient in Flash-based FPGAs
      articolo
      

      Sterpone, Luca; Battezzati, Niccolo'; F., Lima Kastensmidt; R., Chipana
      IEEE TRANSACTIONS ON NUCLEAR SCIENCE
      IEEE
      Vol.58 pp.8 (pp.2333-2340) ISSN:0018-9499 DOI:10.1109/TNS.2011.2161886

  33. La formazione a distanza al Politecnico di Torino: nuovi modelli e strumenti
      proceeding
      

      Barbagallo, Salvatore; Bertonasco, Roberto; Corno, Fulvio; Mezzalama, Marco; SONZA REORDA, Matteo; Venuto, Enrico
      In: Titolo volume non avvalorato
      Didamatica 2011 (Torino (IT)) 4-6 maggio 2011
      pp.10 ISBN:9788890540622

  34. A Low-cost Emulation System for Fast Co-verification and Debug
      proceeding
      

      LAGOS BENITES, JORGE LUIS; Grosso, Michelangelo; Sterpone, Luca; SONZA REORDA, Matteo; Audisio, G.; Pipponzi, M.; Sabatini, M.
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      IEEE European Test Symposium (Trondheim (N)) May 23-27, 2011
      pp.1 DOI:10.1109/ETS.2011.32

  35. Functional Verification of DMA Controllers
      articolo
      

      Grosso, Michelangelo; Perez, H. W. J.; Ravotto, Danilo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Tonda, ALBERTO PAOLO; Velasco Medina, J.
      JOURNAL OF ELECTRONIC TESTING
      Springer
      Vol.27 pp.12 (pp.505-516) ISSN:0923-8174 DOI:10.1007/s10836-011-5219-6

  36. New Perspectives on Adoption of RFID Technology for Agrifood Traceability
      capitolo
      

      Gandino, Filippo; SANCHEZ SANCHEZ, ERWING RICARDO; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      Emerging Pervasive and Ubiquitous Aspects of Information Systems: Cross-Disciplinary Advancements
      IGI Global (STATI UNITI D'AMERICA)
      pp.20 (pp.112-131) ISBN:9781609604875 DOI:10.4018/978-1-60960-487-5.ch008

  37. An adaptive power-aware multi-hop routing algorithm for wireless sensor networks
      proceeding
      

      SANCHEZ SANCHEZ, ERWING RICARDO; MURILLO ROMERO, LAURA MARCELA; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      In: Titolo volume non avvalorato
      8th International Conference on Information Technology: New Generations (ITNG) (Las Vegas (USA)) 11-13 April, 2011
      pp.4 (pp.112-115) ISBN:9781612844275 DOI:10.1109/ITNG.2011.27

  38. Monitoring and modeling building energy expenditure with sensor networks
      proceeding
      

      SANCHEZ SANCHEZ, ERWING RICARDO; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      In: Titolo volume non avvalorato
      SciTePress
      1st International Conference on Pervasive and Embedded Computing and Communications Systems (PECCS) (Vilamoura (Portugal)) 5-7 March, 2011
      pp.5 (pp.283-287) ISBN:9789898425485

  39. Efficient energy-aware routing for sensor networks
      proceeding
      

      SANCHEZ SANCHEZ, ERWING RICARDO; MURILLO ROMERO, LAURA MARCELA; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      In: Titolo volume non avvalorato
      2nd IEEE Latin American Symposium on Circuits and Systems (LASCAS) (Bogota (Colombia)) 23-25 Feb., 2011
      pp.4 (pp.1-4) ISBN:9781424494842 DOI:10.1109/LASCAS.2011.5750315

  40. A novel access scheme for online test in RFID memories
      proceeding
      

      SANCHEZ SANCHEZ, ERWING RICARDO; Rebaudengo, Maurizio
      In: Titolo volume non avvalorato
      2nd IEEE Latin American Symposium on Circuits and Systems (LASCAS) (Bogota (Colombia)) 23-25 Feb., 2011
      pp.4 (pp.1-4) DOI:10.1109/LASCAS.2011.5750307

  41. A general approach for improving RNS Montgomery exponentiation using pre-processing
      proceeding
      

      Gandino, Filippo; Lamberti, Fabrizio; Bajard, J. C.; Montuschi, Paolo
      In: Proc. 20th IEEE Symposium on Computer Arithmetic (ARITH2011)
      20th IEEE Symposium on Computer Arithmetic (ARITH2011) (Tuebingen (Germany)) 25-27 July, 2011
      Vol.1 pp.10 (pp.195-204) DOI:10.1109/ARITH.2011.35

  42. Fault grading of software-based self-test procedures for dependable automotive applications
      proceeding
      

      Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; Ballan, O.
      In: Titolo volume non avvalorato
      ACM/IEEE
      Design, Automation & Test in Europe Conference & Exhibition (DATE) (Grenoble (F)) March 14-18, 2011
      pp.2 (pp.1-2) ISBN:9781612842080

  43. Evolutionary Optimization: the µGP toolkit
      monografia
      

      SANCHEZ SANCHEZ, EDGAR ERNESTO; Schillaci, M.; Squillero, Giovanni
      Springer (STATI UNITI D'AMERICA)
      pp.191 ISBN:9780387094250 DOI:10.1007/978-0-387-09426-7

  44. A Low-Cost Solution for Deploying Processor Cores in Harsh Environments
      articolo
      

      SONZA REORDA, Matteo; Violante, Massimo; Meinhardt, C.; Reis, R.
      IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
      Vol.58 pp.10 (pp.2617-2626) ISSN:0278-0046 DOI:10.1109/TIE.2011.2134054

  45. Fault-Injection Techniques for Dependability Analysis: An Overview
      capitolo
      

      Violante, Massimo
      Radiation Effects in Semiconductors
      CRC Press
      pp.20 (pp.385-404) ISBN:9781439826942

  46. Functional test generation for the pLRU replacement mechanism of embedded cache memories
      proceeding
      

      PEREZ HOLGIN, W. J.; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Tonda, ALBERTO PAOLO; VELASCO MEDINA, J.
      In: Titolo volume non avvalorato
      IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS INC
      Proceedings of the 12th IEEE Latin-American Test Workshop
      (pp.1-6) DOI:10.1109/LATW.2011.5985898

  47. Application-oriented SEU cross-section of aprocessor soft core for Atmel RHBD FPGAs
      articolo
      

      Battezzati, Niccolo'; Margaglia, F.; Violante, Massimo; Decuzzi, F.; Merodio Codinachs, D.; Bancelin, B.
      IEEE TRANSACTIONS ON NUCLEAR SCIENCE
      Vol.58 pp.6 (pp.987-992) ISSN:0018-9499 DOI:10.1109/TNS.2010.2103326

  48. Adaptive fuzzy-MAC for power reduction in wireless sensor networks
      proceeding
      

      SANCHEZ SANCHEZ, ERWING RICARDO; Montrucchio, Bartolomeo; MURILLO ROMERO, LAURA MARCELA; Rebaudengo, Maurizio
      In: Titolo volume non avvalorato
      New Technologies, Mobility and Security (NTMS), 2011 4th IFIP International Conference on (Paris (France)) 7-10 Feb. 2011
      pp.5 (pp.1-5) ISBN:9781424487035 DOI:10.1109/NTMS.2011.5720629

  49. Software-based self-test of embedded microprocessors
      capitolo
      

      Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
      Design and test technology for dependable Systems-on-Chip
      IGI Global (STATI UNITI D'AMERICA)
      pp.19 (pp.338-359) ISBN:9781609602123 DOI:10.4018/978-1-60960-212-3.ch015

  50. A Parallel Tester Architecture for Accelerometerand Gyroscope MEMS Calibration and Test
      articolo
      

      Ciganda, LYL MERCEDES; Bernardi, Paolo; SONZA REORDA, Matteo; Barbieri, D.; Bonaria, L.; Losco, R.; Marcigot, L.; Straiotto, M.
      JOURNAL OF ELECTRONIC TESTING
      Vol.27 pp.14 (pp.389-402) ISSN:0923-8174 DOI:10.1007/s10836-011-5210-2

  51. Probabilistic DCS: An RFID reader-to-reader anti-collision protocol
      articolo
      

      Gandino, Filippo; Ferrero, Renato; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      JOURNAL OF NETWORK AND COMPUTER APPLICATIONS
      Elsevier
      Vol.34 pp.12 (pp.821-832) ISSN:1084-8045 DOI:10.1016/j.jnca.2010.04.007

  52. Increasing Throughput in RFID Multi-Reader Environments Avoiding Reader-to-Reader Collisions
      proceeding
      

      Gandino, Filippo; Ferrero, Renato; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      In: Proceedings of the 2011 IEEE International Conference on Consumer Electronics (ICCE)
      IEEE
      2011 IEEE International Conference on Consumer Electronics (ICCE) (Las Vegas) 9-12 Gennaio 2011
      pp.2 (pp.37-38) ISBN:9781424487110 DOI:10.1109/ICCE.2011.5722638

  53. SOFTWARE-LEVEL SOFT-ERROR MITIGATION TECHNIQUES
      capitolo
      

      Rebaudengo, Maurizio; SONZA REORDA, Matteo; Violante, Massimo
      Soft Errors in Modern Electronic Systems
      Springer
      pp.33 (pp.253-285) ISBN:9781441969927 DOI:10.1007/978-1-4419-6993-4_9

  54. Advanced technologies for transient faults detection and compensation
      capitolo
      

      SONZA REORDA, Matteo; Sterpone, Luca; Violante, Massimo
      Design and test technology for dependable Systems-on-Chip
      IGI Global
      pp.21 (pp.132-154) ISBN:9781609602123 DOI:10.4018/978-1-60960-212-3.ch006

  55. Reconfigurable Field Programmable Gate Arrays for Mission-Critical Applications
      monografia
      

      Battezzati, Niccolo'; Sterpone, Luca; Violante, Massimo
      Springer Science+Business Media
      pp.220 (pp.1-220) ISBN:9781441975942 DOI:10.1007/978-1-4419-7595-9

  56. Coping With the Obsolescence of Safety - or Mission-Critical Embedded Systems Using FPGAs
      articolo
      

      Guzman Miranda, H.; Sterpone, Luca; Violante, Massimo; Aguirre, M.; Gutierrez Rizo, M.
      IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
      pp.8 (pp.814-821) ISSN:0278-0046 DOI:10.1109/TIE.2010.2050291

  57. Analysis and clustering of microRNA array: a new efficient and reliable computational method
      capitolo
      

      Sterpone, Luca; F., Collino; G., Camussi; C., Loconsole
      Software Tools and Algorithms for Biological Systems
      Springer
      Vol.696 pp.8 (pp.679-688) ISBN:9781441970459 DOI:10.1007/978-1-4419-7046-6_69

  2010

  1. An enhanced strategy for functional stress pattern generation for system-on-chip reliability characterization
     proceeding
     

     DE CARVALHO, Mauricio; Bernardi, Paolo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
     In: Titolo volume non avvalorato
     2010 11th International Workshop on Microprocessor Test and Verification 2010 (Austin (USA)) 13-15 December 2010
     pp.6

  2. An Exact and Efficient Critical Path Tracing Algorithm
     proceeding
     

     A., Bosio; P., Girard; S., Pravossoudovitch; Bernardi, Paolo; SONZA REORDA, Matteo
     In: Titolo volume non avvalorato
     IEEE
     Fifth IEEE International Symposium on Electronic Design, Test and Application, 2010 (DELTA '10)
     pp.6 (pp.164-169) DOI:10.1109/DELTA.2010.35

  3. A fault grading methodology for software-based self-test programs in systems-on-chip
     proceeding
     

     Ballan, O.; Bernardi, Paolo; Fontana, G.; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO
     In: Titolo volume non avvalorato
     IEEE (STATI UNITI D'AMERICA)
     International Workshop on Microprocessor Test and Verification (Austin (TX), USA) Dec. 13-15, 2010
     pp.4 (pp.43-46) DOI:10.1109/MTV.2010.16

  4. A framework to support the design of COTS-based reliable space computers for on-board data handling
     proceeding
     

     Campagna, Salvatore; Violante, Massimo
     In: Titolo volume non avvalorato
     On-Line Testing Symposium (IOLTS), 2010 IEEE 16th International
     pp.6 (pp.91-96) ISBN:9781424477241 DOI:10.1109/IOLTS.2010.5560229

  5. Hypervisor-Based Virtual Hardware for Fault Tolerance in COTS Processors Targeting Space Applications
     proceeding
     

     Campagna, Salvatore; Hussain, Moazzam; Violante, Massimo
     In: Titolo volume non avvalorato
     Defect and Fault Tolerance in VLSI Systems (DFT), 2010 IEEE 25th International Symposium on
     pp.8 (pp.44-51) ISBN:9781424484478 DOI:10.1109/DFT.2010.12

  6. A new framework for the automatic insertion of mitigation structures in circuits netlists
     proceeding
     

     Battezzati, Niccolo'; Serrone, D.; Violante, Massimo
     In: Titolo volume non avvalorato
     On-Line Testing Symposium (IOLTS), 2010 IEEE 16th International
     pp.2 (pp.190-191) ISBN:9781424477241

  7. Application-oriented SEU cross-section of a processor soft core for Atmel RHBD FPGAs
     proceeding
     

     Battezzati, Niccolo'; Margaglia, F.; Violante, Massimo; Decuzzi, F.; Merodio Codinachs, D.; Bancelin, B.
     In: Titolo volume non avvalorato
     11th European Conference on Radiation and Its Effects on Component and Systems
     pp.6

  8. A Programmable BIST for DRAM Testing and Diagnosis
     proceeding
     

     Grosso, Michelangelo; Bernardi, Paolo; SONZA REORDA, Matteo; Y., Zhang
     In: Titolo volume non avvalorato
     Institute of Electrical and Electronic Engineers, Inc. (STATI UNITI D'AMERICA)
     IEEE International Test Conference (Austin, USA) November 2010
     pp.10 ISBN:9781424472055

  9. Towards Drift Correction in Chemical Sensors Using an Evolutionary Strategy
     proceeding
     

     DI CARLO, Stefano; Falasconi, M.; SANCHEZ SANCHEZ, EDGAR ERNESTO; Scionti, A.; Squillero, Giovanni; Tonda, A.
     In: Proceedings of the ACM 12th Annual Conference on Genetic and Evolutionary Computation (GECCO)
     ACM (STATI UNITI D'AMERICA)
     ACM 12th Annual Conference on Genetic and Evolutionary Computation (GECCO) (Portland (OR), USA) 7-11 July 2010
     pp.2 (pp.1329-1330) ISBN:9781450300728 DOI:10.1145/1830483.1830727

  10. A Framework for Automated Detection of Power-Related Software Errors in Industrial Verification Processes
      articolo
      

      Gandini, S.; Ruzzarin, W.; SANCHEZ SANCHEZ, EDGAR ERNESTO; Squillero, Giovanni; Tonda, ALBERTO PAOLO
      JOURNAL OF ELECTRONIC TESTING
      Vol.26 pp.9 (pp.689-697) ISSN:0923-8174 DOI:10.1007/s10836-010-5184-5

  11. Exploiting Wireless Sensor Networks for Monitoring Building Performance
      proceeding
      

      Apiletti, Daniele; Baralis, ELENA MARIA; Cerquitelli, Tania; Chiusano, SILVIA ANNA; Montrucchio, Bartolomeo; MURILLO ROMERO, LAURA MARCELA; Rebaudengo, Maurizio; SANCHEZ SANCHEZ, ERWING RICARDO; Tonelli, Diego
      In: Titolo volume non avvalorato
      Congresso Nazionale AICA 2010 (L'Aquila, Italy) 29 Set. - 1 Oct.
      ISBN:9788890540608

  12. Enhanced Observability in Microprocessor-based Systems for Permanent and Transient Fault Resiliency
      proceeding
      

      Entrena, L.; Gallardo Campos, M.; Garcia Valderas, M.; Grosso, Michelangelo; Lopez Ongil, C.; Portela Garcia, M.; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      Conference on Design of Circuits and Integrated Systems (Lanzarote (E)) November 17-19, 2010
      pp.6 (pp.240-245) ISBN:9788469373934

  13. Generating Power-Hungry Test Programs for Power-Aware Validation of Pipelined Processors
      proceeding
      

      Calimera, Andrea; Macii, Enrico; Ravotto, Danilo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      ACM Press
      23rd annual symposium on Integrated circuits and system design (São Paulo, Brazil) September 2010
      pp.6 (pp.61-66) ISBN:9781450302883

  14. A Hybrid Approach for Detection and Correction of Transient Faults in SoCs
      articolo
      

      Bernardi, Paolo; Grosso, Michelangelo; Bolzani Poehls, L.; SONZA REORDA, Matteo
      IEEE TRANSACTIONS ON DEPENDABLE AND SECURE COMPUTING
      IEEE COMPUTER SOC
      Vol.Volume: 7 , Issue: 4 pp.7 (pp.439-445) ISSN:1545-5971 DOI:10.1109/TDSC.2010.33

  15. A tester architecture suitable for MEMS calibration and testing
      proceeding
      

      Ciganda, LYL MERCEDES; Bernardi, Paolo; SONZA REORDA, Matteo; Barbieri, D.; Straiotto, M.; Bonaria, L.
      In: Titolo volume non avvalorato
      ITC 2010, International Test Conference (Austin (USA)) Oct 31 – Nov 5, 2010
      

  16. Cumulative embedded memory failure bitmap display & analysis
      proceeding
      

      Campanelli, N.; Kekeres, T.; Bernardi, Paolo; DE CARVALHO, Mauricio; Panariti, Alessandro; SONZA REORDA, Matteo; Appello, D.; Barrone, M.
      In: Titolo volume non avvalorato
      2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) (Vienna (Autria)) 14-16 April 2010
      pp.6 (pp.255-260) ISBN:9781424466122 DOI:10.1109/DDECS.2010.5654683

  17. Analysis of SET propagation in Flash-based FPGAs by means of electrical pulse injection
      articolo
      

      Sterpone, Luca; Battezzati, Niccolo'; Ferlet Cavrois, V.
      IEEE TRANSACTIONS ON NUCLEAR SCIENCE
      Vol.57 pp.7 (pp.1820-1826) ISSN:0018-9499 DOI:10.1109/TNS.2010.2043686

  18. Design Validation of Multithreaded Processors using Threads Evolution
      articolo
      

      Ravotto, Danilo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Squillero, Giovanni
      JICS. JOURNAL OF INTEGRATED CIRCUITS AND SYSTEMS
      Vol.5 pp.11 (pp.67-77) ISSN:1807-1953

  19. An adaptive tester architecture for volume diagnosis
      proceeding
      

      Bernardi, Paolo; Grosso, Michelangelo; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      15th IEEE European Test Symposium (ETS) (Prague (Czech Republic)) May 2010
      pp.6 (pp.227-232) ISBN:9781424458332

  20. A Software-based self-test methodology for system peripherals
      proceeding
      

      Grosso, Michelangelo; W. J. Perez, H.; Ravotto, Danilo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; J., Velasco Medina
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      15th IEEE European Test Symposium (ETS) (Prague (Czech Republic)) May 2010
      pp.6 (pp.195-200) ISBN:9781424458332

  21. An On-line Fault Detection Technique based on Embedded Debug Features
      proceeding
      

      Grosso, Michelangelo; SONZA REORDA, Matteo; M., Portela Garcia; M., Garcia Valderas; C., Lopez Ongil; L., Entrena
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      IEEE 16th International On-Line Testing Symposium (corfu (greece)) july 2010
      pp.6 (pp.167-172) ISBN:9781424477227

  22. Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts
      proceeding
      

      Rech, P.; Grosso, Michelangelo; Melchiori, F.; Loparco, D.; Appello, D.; Dilillo, L.; Paccagnella, A.; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      IEEE 16th International On-Line Testing Symposium (corfu (greece)) july 2010
      (pp.29-34) ISBN:9781424477227

  23. Microprocessor Software-Based Self-Testing
      articolo
      

      Psarakis, M.; Gizopoulos, D.; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
      IEEE DESIGN & TEST OF COMPUTERS
      IEEE
      Vol.Vol. 27 No. 3 pp.16 (pp.4-19) ISSN:0740-7475 DOI:10.1109/MDT.2010.5

  24. An integrated flow for the design of hardened circuits on SRAM-based FPGAs
      proceeding
      

      Bolchini, C.; Miele, A.; Sandionigi, C.; Battezzati, Niccolo'; Sterpone, Luca; Violante, Massimo
      In: Titolo volume non avvalorato
      15th IEEE European Test Symposium
      pp.6 (pp.214-219) DOI:10.1109/ETSYM.2010.5512757

  25. On the mitigation of SET broadening effects in integrated circuits
      proceeding
      

      Sterpone, Luca; Battezzati, Niccolo'
      In: Titolo volume non avvalorato
      IEEE Design and Diagnostics of Electronic Circuits and Systems (Wien)
      pp.4 (pp.36-39) DOI:10.1109/DDECS.2010.5491820

  26. A New Soft-Error Resilient Voltage-Mode Quaternary Latch
      proceeding
      

      Rhod, E.; Sterpone, Luca; Carro, L.
      In: 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems
      IEEE
      IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Kyoto (Japan)) 6-8 Oct. 2010
      pp.9 (pp.200-208)

  27. A New Software Tool for Static Analysis of SET Sensitiveness in Flash-based FPGAs
      proceeding
      

      Battezzati, Niccolo'; Decuzzi, F.; Sterpone, Luca; Violante, Massimo
      In: 2010 18th IEEE/IFIP International Conference on VLSI and System-on-Chip
      IEEE
      IEEE International Symposium on Very Large Scale of Integration (VLSI) and System-on-Chip (SoC) (Madrid (Spain)) 22 November 2010
      pp.6 (pp.79-84) DOI:10.1109/VLSISOC.2010.5642619

  28. Microvesicles Derived from Adult Human Bone Marrow and Tissue Specific Mesenchymal Stem Cells Shuttle Selected Pattern of miRNAs
      articolo
      

      Collino, F.; Deregibus, M. C.; Bruno, S.; Sterpone, Luca; Aghemo, G.; Viltono, L.; Tetta, C.; Camussi, G.
      PLOS ONE
      Vol.5 pp.15 (pp.1-15) ISSN:1932-6203 DOI:10.1371/journal.pone.0011803

  29. Fair Anti-Collision Protocol in Dense RFID Networks
      proceeding
      

      Ferrero, Renato; Gandino, Filippo; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      In: Proceedings of the 3rd International EURASIP Workshop on RFID Technology
      Eurasip
      3rd International EURASIP Workshop on RFID Technology (La Manga del Mar Menor, Cartagena, Spain) 6-7 September 2010
      pp.5 (pp.101-105) ISBN:9788496997479

  30. Functional Test Generation for DMA Controllers
      proceeding
      

      Grosso, Michelangelo; W. J., PEREZ H; Ravotto, D; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; VELASCO MEDINA, J.
      In: 11th IEEE Latin-American Test Workshop 2010
      11th IEEE Latin-American Test Workshop 2010 (Punta del Este, Uruguay) March 28-31
      ISBN:9781424477852

  31. Exploiting Evolution for an Adaptive Drift-Robust Classifier in Chemical Sensing
      proceeding
      

      DI CARLO, Stefano; Falasconi, M.; SANCHEZ SANCHEZ, EDGAR ERNESTO; Scionti, A.; Squillero, Giovanni; Tonda, A.
      LECTURE NOTES IN COMPUTER SCIENCE
      In: Proceedings of EvoApplicatons 2010: EvoCOMPLEX, EvoGAMES, EvoIASP, EvoINTELLIGENCE, EvoNUM, and EvoSTOC
      Springer
      EvoApplicatons 2010: EvoCOMPLEX, EvoGAMES, EvoIASP, EvoINTELLIGENCE, EvoNUM, and EvoSTOC (Istanbul, Turkey,) April 7-9, 2010
      Vol.6024/2010 pp.10 (pp.412-421) ISSN:0302-9743 ISBN:9783642122385 DOI:10.1007/978-3-642-12239-2_43

  32. Evolving Individual Behavior in a Multi-Agent Traffic Simulator
      proceeding
      

      SANCHEZ SANCHEZ, EDGAR ERNESTO; Squillero, Giovanni; Tonda, ALBERTO PAOLO
      LECTURE NOTES IN COMPUTER SCIENCE
      In: Applications of Evolutionary Computation
      Springer
      Evo* 2010
      Vol.6024/2010 pp.10 (pp.11-20) ISSN:0302-9743 ISBN:9781010079781 DOI:10.1007/978-3-642-12239-2_2

  33. Evaluating the Impact of DFM Library Optimizations on Alpha-induced SEU Sensitivity in a Microprocessor Core
      articolo
      

      Appello, D.; Grosso, Michelangelo; Loparco, D.; Melchiori, F.; Paccagnella, A.; Rech, P.; SONZA REORDA, Matteo
      IEEE TRANSACTIONS ON NUCLEAR SCIENCE
      IEEE
      Vol.57 pp.8 (pp.2098-2105) ISSN:0018-9499 DOI:10.1109/TNS.2010.2049119

  34. A hardware accelerated framework for the generation of design validation programs for SMT processors
      proceeding
      

      SANCHEZ SANCHEZ, EDGAR ERNESTO; Danilo, Ravotto; SONZA REORDA, Matteo
      In: 13th IEEE International Symposium on Design & Diagnostics of Elctronic Circuits and Systems
      13th IEEE International Symposium on Design & Diagnostics of Elctronic Circuits and Systems (Vienna, Austria) April 2010
      

  35. CUMULATIVE EMBEDDED MEMORY FAILURE BITMAP DISPLAY ANALYSIS
      proceeding
      

      Bernardi, Paolo; Alessandro, Panariti; SONZA REORDA, Matteo; Tamas, Kerekes; Davide, Appello; Mario, Barone
      In: 13th IEEE International Symposium on Design & Diagnostics of Electronic Circuits and Systems
      13th IEEE International Symposium on Design & Diagnostics of Electronic Circuits and Systems (Vienna, Austria) April 2010
      

  36. A Novel Scalable and Reconfigurable Emulation Platform for Embedded Systems Verification
      proceeding
      

      DI MARZIO, M; Grosso, Michelangelo; SONZA REORDA, Matteo; Sterpone, Luca; Audisio, G; Sabatini, M.
      In: Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
      IEEE (STATI UNITI D'AMERICA)
      IEEE International Symposium on Circuits and Systems, ISCAS (Paris, France) May 30th - June 2nd
      pp.4 (pp.865-868) DOI:10.1109/ISCAS.2010.5537422

  37. A New Placement Algorithm for the Mitigation of Multiple Cell Upsets in SRAM-based FPGAs
      proceeding
      

      Sterpone, Luca; Battezzati, Niccolo'
      In: IEEE Design, Automation and Test in Europe 2010
      IEEE Design, Automation and Test in Europe, 2010 (Dresden) 8 - 12 Marzo, 2010
      (pp.1231-1236)

  38. A new Timing Driven Placement Algorithm for Dependable Circuits on SRAM-based FPGAs
      articolo
      

      Sterpone, Luca
      ACM TRANSACTIONS ON RECONFIGURABLE TECHNOLOGY AND SYSTEMS
      Vol.Volume 4 pp.21 (pp.7.1-7.21) ISSN:1936-7406 DOI:10.1145/1857927.1857934

  39. Tampering in RFID: A Survey on Risks and Defenses
      articolo
      

      Gandino, Filippo; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      MOBILE NETWORKS AND APPLICATIONS
      Springer Verlag
      Vol.15 (4) pp.15 (pp.502-516) ISSN:1383-469X DOI:10.1007/s11036-009-0209-y

  40. Exploiting an infrastructure-intellectual property for systems-on-chip test, diagnosis and silicon debug
      articolo
      

      Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo
      IET COMPUTERS & DIGITAL TECHNIQUES
      Vol.4(2) pp.10 (pp.104-113) ISSN:1751-8601 DOI:10.1049/iet-cdt.2008.0122

  41. Boosting Software Fault Injection for Dependability Analysis of Real-Time Embedded Applications
      articolo
      

      Cabodi, Gianpiero; Murciano, Marco; Violante, Massimo
      ACM TRANSACTIONS ON EMBEDDED COMPUTING SYSTEMS
      Vol.10 pp.32 (pp.24:1-24:32) ISSN:1539-9087 DOI:10.1145/1880050.1880060

  2009

  1. GECCO '09: Proceedings of the 11th annual conference on Genetic and evolutionary computation
     curatela
     

     G., Raidl; F., Rothlauf; Squillero, Giovanni; R., Drechsler; T., Stuetzle; M., Birattari; C. B., Congdon; M., Middendorf; C., Blum; C., Cotta; P., Bosman; J., Grahl; J., Knowles; D., Corne; H., Beyer; K., Stanley; J. F., Miller; Hemert, J.; T., Lenaerts; M., Ebner; J., Bacardit; M., O'Neill; Penta, M.; B., Doerr; T., Jansen; R., Poli; E., Alba
     ACM
     pp.1964

  2. Automatic Functional Stress Pattern Generation for SoC Reliability Characterization
     proceeding
     

     Appello, D.; Bernardi, Paolo; Cagliesi, R.; Giancarlini, M.; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
     In: Titolo volume non avvalorato
     14th IEEE European Test Symposium, 2009
     ISBN:9780769537030 DOI:10.1109/ETS.2009.16

  3. A low-cost solution for developing reliable Linux-based space computers for on-board data handling
     proceeding
     

     Violante, Massimo; Esposti, M. L.
     In: Titolo volume non avvalorato
     On-Line Testing Symposium, 2009. IOLTS 2009. 15th IEEE International
     ISBN:9781424445967 DOI:10.1109/IOLTS.2009.5195982

  4. Layout-aware multi-cell upsets effects analysis on TMR circuits implemented on SRAM-based FPGAs
     proceeding
     

     Sterpone, Luca; Violante, Massimo; Bocquillon, A.; Miller, F.; Buard, N.; Manuzzato, A.; Gerardin, S.; Pacagnella, A.
     In: Titolo volume non avvalorato
     Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on
     ISBN:9781457704925 DOI:10.1109/RADECS.2009.5994561

  5. Evaluating the impact of DFM library optimizations on alpha-induced SEU sensitivity in a microprocessor core
     proceeding
     

     Rech, P; Paccagnella, A; Grosso, Michelangelo; SONZA REORDA, Matteo; Melchiori, F; Appello, D.
     In: Titolo volume non avvalorato
     IEEE
     European Conference on Radiation and Its Effects on Components and Systems (RADECS) (Bruges, Belgium) Sept. 14-18, 2009
     pp.8 (pp.481-488) ISBN:9781457704925 DOI:10.1109/RADECS.2009.5994699

  6. An enhanced FPGA-based low-cost tester platform exploiting effective test data compression for SoCs
     proceeding
     

     Ciganda, LYL MERCEDES; Abate, Francesco; Bernardi, Paolo; Bruno, M.; SONZA REORDA, Matteo
     In: Titolo volume non avvalorato
     12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2009 (Liberec (CZ)) 15-17 April 2009
     pp.6 (pp.258-263) ISBN:9781424433414 DOI:10.1109/DDECS.2009.5012141

  7. Curricula design flow with embedded accreditation
     proceeding
     

     DEL CORSO, Dante; Gola, Muzio; Rebaudengo, Maurizio
     In: Titolo volume non avvalorato
     2009 EAEEIE Annual Conference (EAEEIE 2009) (Valencia, Spain) 22 Jun - 24 Jun 2009
     ISBN:9781424453863 DOI:10.1109/EAEEIE.2009.5335480

  8. Design validation of multithreaded architectures using concurrent threads evolution
     proceeding
     

     Ravotto, Danilo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Squillero, Giovanni
     In: 22nd Annual Symposium on Integrated Circuits and System Design: Chip on the Dunes
     the 22nd Annual Symposium on Integrated Circuits and System Design: Chip on the Dunes (Natal, Brazil) August 31 - September 3, 2009
     ISBN:9781605587059 DOI:10.1145/1601896.1601964

  9. An On-board Data-Handling Computer for Deep-Space Exploration Built Using Commercial-Off-the-Shelf SRAM-Based FPGAs
     proceeding
     

     SONZA REORDA, Matteo; Violante, Massimo; Cristina, Meinhardt
     In: 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2009 (DFT09)
     24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems 2009 (DFT09) (Chicago (USA)) October 2009
     (pp.254-262) DOI:10.1109/DFT.2009.35

  10. Soft Errors in Flash-based FPGAs: Analysis Methodologies and First Results
      proceeding
      

      Battezzati, Niccolo'; F., Decuzzi; Sterpone, Luca; Violante, Massimo
      In: proceedings of IEEE International Conference on Field Programmable Logic and Applications
      Field Programmable Logic and Applications August 31 - September 2, 2009
      (pp.723-724) ISBN:9781424438921 DOI:10.1109/FPL.2009.5272321

  11. A new RC design for mixed-grain based dynamically reconfigurable architectures
      proceeding
      

      E., Rhod; Sterpone, Luca; L., Carro
      In: IEEE International Conference on Electronics Circuits and Systems
      IEEE International Conference on Electronics Circuits and Systems (Hammamet, Tunisia) 13 - 16 December, 2009
      pp.4 (pp.984-987) DOI:10.1109/ICECS.2009.5410843

  12. Gene expression reliability estimation through cluster-based analysis
      proceeding
      

      Sterpone, Luca; Benso, Alfredo; DI CARLO, Stefano; Politano, GIANFRANCO MICHELE MARIA
      In: Titolo volume non avvalorato
      IEEE (STATI UNITI D'AMERICA)
      IEEE International Workshop on Medical Measurement (MeMeA) (Cetraro, IT) 29-30 May 2009
      pp.3 (pp.229-231) ISBN:9781424435982 DOI:10.1109/MEMEA.2009.5167990

  13. Test Techniques for System-on-Chip: Problems and solutions
      monografia
      

      Bernardi, Paolo
      VDM Verlag (GERMANIA)
      ISBN:9783639207484

  14. On the Generation of Functional Test Programs for the Cache Replacement Logic
      proceeding
      

      W. J., PEREZ H; Ravotto, Danilo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Tonda, ALBERTO PAOLO
      In: Asian Test Symposium, ATS'09
      18th IEEE Asian Test Symposium 2009 (ATS09) (Taichung, Taiwan) November 2009
      (pp.418-423)

  15. A low-cost SEE mitigation solution for soft-processors embedded in Systems on Pogrammable Chips
      proceeding
      

      SONZA REORDA, Matteo; Violante, Massimo; C., Meinhardt; R., Reis
      In: Design, Automation & Test in Europe Conference & Exhibition (DATE '09)
      Design, Automation & Test in Europe Conference & Exhibition (DATE '09) (Nice, France) April 2009
      (pp.352-357)

  16. DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study
      proceeding
      

      Appello, D.; Bernardi, Paolo; Gerardin, S.; Grosso, Michelangelo; Paccagnella, A.; Rech, P.; SONZA REORDA, Matteo
      In: 27th IEEE VLSI Test Symposium (VTS '09)
      27th IEEE VLSI Test Symposium (VTS '09) (Santa Cruz, USA) May 2009
      (pp.276-281) DOI:10.1109/VTS.2009.26

  17. Methodologies to study frequency-dependent Single Event Effects sensitivity in Flash-based FPGAs
      articolo
      

      Battezzati, Niccolo'; S., Gerardin; A., Manuzzato; D., Merodio; A., Paccagnella; C., Poivey; Sterpone, Luca; Violante, Massimo
      IEEE TRANSACTIONS ON NUCLEAR SCIENCE
      Vol.56 pp.8 (pp.3534-3541) ISSN:0018-9499 DOI:10.1109/TNS.2009.2034316

  18. Random Key Pre-Distribution with Transitory Master Key for Wireless Sensor Networks
      proceeding
      

      Gandino, Filippo; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      In: CoNEXT Student Workshop’09
      CoNEXT Student Workshop’09 (Roma) 1/12/2009
      

  19. Application-oriented SEU sensitiveness analysis of Atmel rad-hard FPGAs
      proceeding
      

      Battezzati, Niccolo'; Decuzzi, F; Violante, Massimo; Briet, M.
      In: Proceedings of the 15th IEEE International On-Line Testing Symposium
      15th IEEE International On-Line Testing Symposium (Sesimbra-Lisbon, Portugal) 24-26 June 2009
      (pp.89-94) ISBN:9781424445967

  20. An In-Vehicle Infotainment Software Architecture Based on Google Android
      proceeding
      

      Gianpaolo, Macario; Torchiano, Marco; Violante, Massimo
      In: IEEE Symposium on Industrial Embedded Systems (SIES) 2009
      IEEE Symposium on Industrial Embedded Systems (SIES) 2009 (Lausanne, Switzerland) July 8-10
      pp.4 (pp.257-260) ISBN:9781424441105 DOI:10.1109/SIES.2009.5196223

  21. Exploiting Embedded FPGA in On-line Software-based Test Strategies for Microprocessor Cores
      proceeding
      

      Grosso, Michelangelo; SONZA REORDA, Matteo
      In: 15th IEEE International On-Line Testing Symposium
      IEEE (STATI UNITI D'AMERICA)
      15th IEEE International On-Line Testing Symposium (Sesimbra-Lisbon, Portugal) June 24-26, 2009
      (pp.95-100) DOI:10.1109/IOLTS.2009.5195989

  22. Evaluating Alpha-induced Soft Errors in Embedded Microprocessors
      proceeding
      

      Bernardi, Paolo; Grosso, Michelangelo; SONZA REORDA, Matteo; Appello, D.; Rech, P.; Gerardin, S.; Paccagnella, A.
      In: IEEE Internation On-Line Test Symposium (IOLTS'09)
      DOI:10.1109/IOLTS.2009.5195985

  23. An I-IP Based Approach for the Monitoring of NBTI Effects in SoCs
      proceeding
      

      Appello, D; Bernardi, Paolo; Guardiani, C; Shibkov, A; Brambilla, A; STORTI GAJANI, G; Piazza, F.
      In: IEEE Internation On-Line Test Symposium (IOLTS'09)
      DOI:10.1109/IOLTS.2009.5195977

  24. An efficient fault simulation technique for transition faults in non-scan sequential circuits
      proceeding
      

      Bosio, A; Girard, P; Pravossoudovich, S; Bernardi, Paolo; SONZA REORDA, Matteo
      In: Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009
      2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009 (Liberec (Czech Republic)) April 15-17, 2009
      pp.6 (pp.50-55) DOI:10.1109/DDECS.2009.5012098

  25. Recovery scheme for hardening system on programmable chips
      proceeding
      

      Meinhardt, C; Reis, R; Violante, Massimo; SONZA REORDA, Matteo
      In: 10th IEEE Latin American Test Workshop (LATW '09)
      10th IEEE Latin American Test Workshop (LATW '09) (Buzios (Brazil)) 2-5 March 2009
      (pp.1-6) DOI:10.1109/LATW.2009.4813816

  26. An Enhanced FPGA-Based Low-Cost Tester Platform Exploiting Effective Test Data Compression for SoCs
      proceeding
      

      L., Ciganda; Abate, Francesco; Bernardi, Paolo; M., Bruno; SONZA REORDA, Matteo
      In: 12th IEEE Symposium on Design and Diagnostics of Electronic Systems (DDECS)
      12th IEEE Symposium on Design and Diagnostics of Electronic Systems (Liberec, Czech Republic) April 2009
      (pp.258-263) ISBN:9781424433391

  27. Automatic Detection of Software Defects: an Industrial Experience
      proceeding
      

      Gandini, S; Ravotto, Danilo; Ruzzarin, W; SANCHEZ SANCHEZ, EDGAR ERNESTO; Squillero, Giovanni; Tonda, ALBERTO PAOLO
      In: Proceedings GECCO 2009
      GECCO 2009
      ISBN:9781605583259

  28. Introducing Probability in RFID Reader-to-Reader Anti-collision
      proceeding
      

      Gandino, Filippo; Ferrero, Renato; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      In: The 8th IEEE International Symposium on Network Computing and Applications (IEEE NCA09)
      The 8th IEEE International Symposium on Network Computing and Applications (IEEE NCA09) (Cambridge, MA USA) 9 - 11 July 2009
      

  29. On Improving Automation by Integrating RFID in the Traceability Management of the Agri-Food Sector
      articolo
      

      Gandino, Filippo; Montrucchio, Bartolomeo; Rebaudengo, Maurizio; SANCHEZ SANCHEZ, ERWING RICARDO
      IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
      IEEE
      Vol.56(7) pp.9 (pp.2357-2365) ISSN:0278-0046 DOI:10.1109/TIE.2009.2019569

  30. Timing driven placement for fault tolerant circuits implemented on SRAM-based FPGAs
      proceeding
      

      Sterpone, Luca
      LECTURE NOTES IN COMPUTER SCIENCE
      In: Titolo volume non avvalorato
      Springer
      5th International Workshop, ARC 2009 (Karlsruhe (Germany)) March 16-18, 2009
      Vol.5453 pp.12 (pp.85-96) ISSN:0302-9743 DOI:10.1007/978-3-642-00641-8_11

  31. A Deterministic Methodology for Identifying Functionally Untestable Path-Delay Faults in Microprocessor Cores
      proceeding
      

      Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
      In: 9th International Workshop on Microprocessor Test and Verification (MTV'08)
      IEEE (STATI UNITI D'AMERICA)
      9th International Workshop on Microprocessor Test and Verification (MTV'08) (Austin, TX (U.S.A.)) 8-10 Dic., 2008
      (pp.103-108) DOI:10.1109/MTV.2008.9

  32. New techniques for improving the performance of the lockstep architecture for SEEs mitigation in FPGA embedded processors
      articolo
      

      Abate, Francesco; Sterpone, Luca; C. A., Lisboa; L., Carro; Violante, Massimo
      IEEE TRANSACTIONS ON NUCLEAR SCIENCE
      Vol.56 pp.9 (pp.1992-2000) ISSN:0018-9499 DOI:10.1109/TNS.2009.2013237

  33. Opportunity and Constraints for Wide Adoption of RFID in Agri-Food
      articolo
      

      Gandino, Filippo; SANCHEZ SANCHEZ, ERWING RICARDO; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      INTERNATIONAL JOURNAL OF ADVANCED PERVASIVE AND UBIQUITOUS COMPUTING
      Vol.1(2) pp.19 (pp.49-67) ISSN:1937-965X

  34. Improving Preamble Sampling Performance in Wireless Sensor Networks with State Information
      proceeding
      

      SANCHEZ SANCHEZ, ERWING RICARDO; C., Chaudet; Rebaudengo, Maurizio
      In: Titolo volume non avvalorato
      The Sixth International Conference on Wireless On-demand Network Systems and Services (Snowbird, Utah, USA) 2-4 February, 2009
      

  35. A study of the Single Event Effects Impact on Functional Mapping within Flash-based FPGAs
      proceeding
      

      Abate, Francesco; LIMA KASTENSMIDT, F; Sterpone, Luca; Violante, Massimo
      In: DATE'09
      Design, Automation and Test in Europe 20-24 April 2009
      

  36. Test Program Generation for Communication Peripherals in Processor-Based Systems-on-Chip
      articolo
      

      Apostolakis, A; Gizopoulos, D; Psarakis, M; Ravotto, Danilo; SONZA REORDA, Matteo
      IEEE DESIGN & TEST OF COMPUTERS
      IEEE
      Vol.26 pp.12 (pp.52-63) ISSN:0740-7475 DOI:10.1109/MDT.2009.43

  37. Effective Diagnostic Pattern Generation Strategy forTransition-Delay Faults in Full-Scan SOCs
      articolo
      

      Appello, D; Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
      IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
      IEEE
      Vol.17 (11) pp.6 (pp.1654-1659) ISSN:1063-8210 DOI:10.1109/TVLSI.2008.2006177

  38. A Novel Dual Core Architecture for the Analysis of DNA Microarray Images
      articolo
      

      Sterpone, Luca
      IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
      Vol.58 pp.10 (pp.2653-2662) ISSN:0018-9456 DOI:10.1109/TIM.2009.2015695

  39. RFID Technology for Agri-food Traceability Management
      capitolo
      

      Gandino, Filippo; SANCHEZ SANCHEZ, ERWING RICARDO; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      Auto-identification and Ubiquitous Computing Applications: Rfid and Smart Technologies for Information Convergence
      Information Science Publishing (STATI UNITI D'AMERICA)
      pp.20 (pp.54-73) ISBN:9781605662985

  40. Electronics system design techniques for safety critical applications
      monografia
      

      Sterpone, Luca
      LECTURE NOTES IN ELECTRICAL ENGINEERING
      Springer-Business Media (PAESI BASSI)
      Vol.26 pp.165 ISSN:1876-1100 ISBN:9781402089787 DOI:10.1007/978-1-4020-8979-4

  41. Public-key in RFIDs: Appeal for Asymmetry
      capitolo
      

      SANCHEZ SANCHEZ, ERWING RICARDO; Gandino, Filippo; Montrucchio, Bartolomeo; Rebaudengo, Maurizio
      Security in RFID and sensor networks
      CRC Press (STATI UNITI D'AMERICA)
      pp.22 (pp.195-216) ISBN:9781420068405

  42. Test generation and coverage metrics
      capitolo
      

      SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Squillero, Giovanni
      Practical Design Verification
      Cambridge University Press
      pp.32 (pp.122-153) ISBN:9780521859721

  2008

  1. Robustness analysis of soft error accumulation in SRAM-FPGAs using FLIPPER and STAR/RoRA
     proceeding
     

     Alderighi, M.; Casini, F.; D'Angelo, S.; Mancini, M.; Merodio Codinachs, D.; Pastore, S.; Sorrenti, G.; Sterpone, Luca; Weigand, R.; Violante, Massimo
     In: Titolo volume non avvalorato
     Radiation and Its Effects on Components and Systems (RADECS), 2008 European Conference on
     ISBN:9781457704819 DOI:10.1109/RADECS.2008.5782703

  2. On the generation of test programs for chip multithread computer architectures
     proceeding
     

     Ravotto, Danilo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Squillero, Giovanni
     In: IEEE International Test Conference (ITC)
     IEEE
     International Test Conference (Santa Clara, USA) 28-30 Oct. 2008
     ISBN:9781424424030 DOI:10.1109/TEST.2008.4700678

  3. A novel methodology for diversity preservation in evolutionary algorithms
     proceeding
     

     Squillero, Giovanni; Tonda, ALBERTO PAOLO
     In: roceedings of the 2008 GECCO conference companion on Genetic and evolutionary computation
     (pp.2223-2226) DOI:10.1145/1388969.1389049

  4. On the Static Cross Section of SRAM-Based FPGAs
     proceeding
     

     A., Manuzzato; S., Gerardin; A., Paccagnella; Sterpone, Luca; Violante, Massimo
     In: Titolo volume non avvalorato
     IEEE Radiation Effects Data Workshop 14 - 18 July 2008
     (pp.94-97) DOI:10.1109/REDW.2008.24

  5. Differential gene expression graphs: A data structure for classification in DNA microarrays
     proceeding
     

     Benso, Alfredo; DI CARLO, Stefano; Politano, GIANFRANCO MICHELE MARIA; Sterpone, Luca
     In: Proceedings of IEEE 8th International Conference on BioInformatics and BioEngineering (BIBE) 2008
     IEEE Press (STATI UNITI D'AMERICA)
     IEEE 8th International Conference on BioInformatics and BioEngineering (BIBE) (Athens, GR) 8-10 Ott. 2008
     pp.6 (pp.1-6) ISBN:9781424428441 DOI:10.1109/BIBE.2008.4696689

  6. SoC Symbolic Simulation: a case study on delay fault testing
     proceeding
     

     Bosio, A; Girard, P; Pravossoudovich, S; Bernardi, Paolo
     In: Titolo volume non avvalorato
     DOI:10.1109/DDECS.2008.4538810

  7. Exploiting MOEA to Automatically Generate Test Programs for Path-delay Faults in Microprocessors
     proceeding
     

     Bernardi, Paolo; Christou, K; Grosso, Michelangelo; Michael, M; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
     LECTURE NOTES IN COMPUTER SCIENCE
     In: Titolo volume non avvalorato
     European Workshops on the Theory and Applications of Evolutionary Computation, EvoWorkshops 2008: EvoCOMNET, EvoFIN, EvoHOT, EvoIASP, EvoMUSART, EvoNUM, EvoSTOC, and EvoTransLog (Naples (IT)) March 26-28, 2008
     Vol.4974 pp.11 (pp.224-234) ISSN:0302-9743 ISBN:9783540787600 DOI:10.1007/978-3-540-78761-7_23

  8. An Automatic Functional Stress Pattern Generation Technique Suitable for SoC Reliability Characterization
     proceeding
     

     Appello, D; Bernardi, Paolo; Bruno, M; Cagliesi, R; Giancarlini, M; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
     In: Titolo volume non avvalorato
     2nd IEEE International Workshop on Automated Test Equipment: Vision ATE 2020
     

  9. Software-Based Self-Test Strategy for Data Cache Memories Embedded in SoCs
     proceeding
     

     Perez, W. J.; VELASCO MEDINA, J; Ravotto, Danilo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
     In: Titolo volume non avvalorato
     The IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
     (pp.339-344)

  10. A Hybrid Approach to the Test of Cache Memory Controllers Embedded in SoCs
      proceeding
      

      Perez, W. J.; VELASCO MEDINA, J; Ravotto, Danilo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
      In: Proceedings of the 2008 14th IEEE International On-Line Testing Symposium
      IOLTS 2008: IEEE International On-line Testing Symposium
      (pp.143-148) ISBN:9780769532646

  11. An Evolutionary Methodology for Test Generation for Peripheral Cores Via Dynamic FSM Extraction
      proceeding
      

      Ravotto, Danilo; SANCHEZ SANCHEZ, EDGAR ERNESTO; Schillaci, M; Squillero, Giovanni
      LECTURE NOTES IN COMPUTER SCIENCE
      In: Titolo volume non avvalorato
      Springer
      EvoWorkshops 2008: EvoCOMNET, EvoFIN, EvoHOT, EvoIASP, EvoMUSART, EvoNUM, EvoSTOC, and EvoTransLog (Naples (ITA)) March 26-28, 2008
      Vol.4974 pp.10 (pp.214-223) ISSN:0302-9743 ISBN:9783540787600 DOI:10.1007/978-3-540-78761-7_22

  12. RFID for agri-food traceability: methods for authentication, integrity and privacy
      proceeding
      

      Demartini, Claudio Giovanni; Gandino, Filippo; Montrucchio, Bartolomeo; Rebaudengo, Maurizio; SANCHEZ SANCHEZ, ERWING RICARDO
      In: Titolo volume non avvalorato
      Workshop on Emerging Technologies for Radio-frequency Identification (Roma, Italy) 12-14 May, 2008
      (pp.87-93)

  13. An Anti-Counterfeit Mechanism for the Application Layer in Low-Cost RFID Devices
      proceeding
      

      Bernardi, Paolo; Gandino, Filippo; Lamberti, Fabrizio; Montrucchio, Bartolomeo; Rebaudengo, Maurizio; E. R., Sanchez
      In: Proc. 4th European Conference on Circuits and Systems for Communications
      4th European Conference on Circuits and Systems for Communications (Bucharest, Romania) 10-11 July 2008
      Vol.1 pp.5 (pp.227-231)

  14. Experimental Validation of Lockstep, Checkpoint, and Rollback Recovery to Detect and Correct Soft Errors in System-On-Programmable-Chips
      proceeding
      

      Abate, Francesco; Sterpone, Luca; Violante, Massimo
      In: Titolo volume non avvalorato
      Radiation Effects on Components and Systems 10-12 September
      

  15. A Novel Design Flow for the Performance Optimization of Fault Tolerant Circuits on SRAM-based FPGAs
      proceeding
      

      Sterpone, Luca; Battezzati, Niccolo'
      In: NASA/ESA Conference on Adaptive Hardware and Systems, 2008. AHS '08.
      NASA/ESA Conference on Adaptive Hardware and Systems (Noordwijk, The Netherlands) 22-25 June 2008
      (pp.157-163) DOI:10.1109/AHS.2008.59

  16. A new placement algorithm for the optimization of fault tolerant circuits on reconfigurable devices
      proceeding
      

      Sterpone, Luca; Battezzati, Niccolo'; Violante, Massimo
      In: Titolo volume non avvalorato
      ACM (STATI UNITI D'AMERICA)
      WREFT '08 workshop on Radiation effects and fault tolerance in nanometer technologies (ACM International Conference on Computing Frontiers) (Ischia, Italy) May 5-7, 2008
      pp.6 (pp.347-352) ISBN:9781605580920 DOI:10.1145/1366224.1366228

  17. Coping with Obsolescence of Processor Cores in Critical Applications
      proceeding
      

      Abate, Francesco; Violante, Massimo
      In: Titolo volume non avvalorato
      IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems 1-3 Oct. 2008
      

  18. On Automatic Test Block Generation for Peripheral Testing in SoCs via Dynamic FSMs Extraction
      proceeding
      

      Ravotto, Danilo; SANCHEZ SANCHEZ, EDGAR ERNESTO; Schillaci, M; SONZA REORDA, Matteo; Squillero, Giovanni
      In: Titolo volume non avvalorato
      Microprocessor Test and Verification, 2007. MTV '07 (Austin) 5-6 Dec. 2007
      (pp.71-76) ISBN:9780769532417 DOI:10.1109/MTV.2007.14

  19. An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs
      proceeding
      

      Appello, D; Bernardi, Paolo; Cagliesi, R; Giancarlini, M; Grosso, Michelangelo
      In: 13th IEEE European Test Symposium, 2008
      IEEE (STATI UNITI D'AMERICA)
      13th IEEE European Test Symposium, 2008 (Verbania, Italia) may 25 - 29, 2008
      (pp.140-145) ISBN:9780769531502 DOI:10.1109/ETS.2008.27

  20. Monte Carlo Analysis of the Effects of Soft Errors Accumulation in SRAM-based FPGAs
      articolo
      

      Battezzati, Niccolo'; Sterpone, Luca; Violante, Massimo
      IEEE TRANSACTIONS ON NUCLEAR SCIENCE
      Vol.55 (pp.3381-3387) ISSN:0018-9499 DOI:10.1109/TNS.2008.2006839

  21. A graph-based representation of Gene Expression profiles in DNA microarrays
      proceeding
      

      Benso, Alfredo; DI CARLO, Stefano; Politano, GIANFRANCO MICHELE MARIA; Sterpone, Luca
      In: Proceedings of IEEE Symposium on Computational Intelligence in Bioinformatics and Computational Biology (CIBCB) 2008
      IEEE (STATI UNITI D'AMERICA)
      IEEE Symposium on Computational Intelligence in Bioinformatics and Computational Biology (CIBCB) (Sun Valley (ID), USA) 15-17 Sept. 2008
      pp.8 (pp.75-82) DOI:10.1109/CIBCB.2008.4675762

  22. A new Algorithm for the Analysis of the MCUs Sensitiveness of TMR Architectures in SRAM-based FPGAs
      articolo
      

      Sterpone, Luca; Violante, Massimo
      IEEE TRANSACTIONS ON NUCLEAR SCIENCE
      Vol.55 (pp.2019-2027) ISSN:0018-9499 DOI:10.1109/TNS.2008.2001858

  23. Applications of Evolutionary ComputingEvoWorkshops 2008: EvoCOMNET, EvoFIN, EvoHOT, EvoIASP, EvoMUSART, EvoNUM, EvoSTOC, and EvoTransLog, Naples, Italy, March 26-28, 2008. Proceedings
      curatela
      

      M., Giacobini; A., Brabazon; S., Cagnoni; G., DI CARO; R., Drechsler; A., Ekart; A., ESPARCIA ALCAZAR; M., Farooq; A., Fink; J., Mccormack; M., O'Neill; J., Romero; F., Rothlauf; Squillero, Giovanni; S., Uyar; Shengxiang, Yang
      Vol.4974 ISBN:9783540787600

  24. A new low-cost non intrusive platform for injecting soft errors in SRAM-based FPGAs
      proceeding
      

      Battezzati, Niccolo'; Sterpone, Luca; Violante, Massimo
      In: ISIE2008
      ISIE: IEEE International Symposium on Industrial Electronics (Cambridge)
      (pp.2282-2287) DOI:10.1109/ISIE.2008.4677077

  25. On the design of tunable fault tolerant circuits on SRAM-based FPGAs for safety critical applications
      proceeding
      

      Sterpone, Luca; Aguirre, M; Tombs, J; Guzman, H.
      In: IEEE Design, Automation and Test in Europe
      DATE (Munich) 10 - 14 March, 2008
      (pp.336-341)

  26. On the evaluation of radiation-induced transient faults in Flash-based FPGAs
      proceeding
      

      Battezzati, Niccolo'; Gerardin, S; Manuzzato, A; Paccagnella, A; Rezgui, S; Sterpone, Luca; Violante, Massimo
      In: 14th IEEE International On-Line Testing Symposium
      14th IEEE International On-Line Testing Symposium
      (pp.135-140) DOI:10.1109/IOLTS.2008.47

  27. Soft Errors in SRAM-FPGAs: a Comparison of Two Complementary Approaches
      articolo
      

      Alderighi, M; Casini, F; D'Angelo, S; Mancini, M; Pastore, S; Sterpone, Luca; Violante, Massimo
      IEEE TRANSACTIONS ON NUCLEAR SCIENCE
      Vol.55 (pp.2267-2273) ISSN:0018-9499 DOI:10.1109/TNS.2008.2000479

  28. FPGA PAL Design Tools
      capitolo
      

      Sterpone, Luca
      Wiley Encyclopedia of Computer Science and Engineering
      Vol.2 (pp.1316-1326) ISBN:9780471383932

  29. Hardware and Software Transparency in the Protection of Programs Against SEUs and SETs
      articolo
      

      EDUARDO LUIS, Rhod; CARLOS ARTHUR LANG, Lisbôa; Luigi, Carro; SONZA REORDA, Matteo; Violante, Massimo
      JOURNAL OF ELECTRONIC TESTING
      (pp.45-56) ISSN:0923-8174

  30. AN EFFICIENT METHODOLOGY FOR REDUCING SoC TEST DATA VOLUME ON LOW-COST TESTERS
      proceeding
      

      Bernardi, Paolo; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      IEEE Computer Society
      Design, Automation and Test in Europe (DATE2008) (Munich, Germany) March 2008
      (pp.194-199)

  31. An Effective technique for the Automatic Generation of Diagnosis-oriented Programs for Processor Cores
      articolo
      

      Bernardi, Paolo; SANCHEZ SANCHEZ, EDGAR ERNESTO; Schillaci, Massimiliano; Squillero, Giovanni; SONZA REORDA, Matteo
      IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
      IEEE
      Vol.27 pp.5 (pp.570-574) ISSN:0278-0070 DOI:10.1109/TCAD.2008.915541

  32. Effectiveness of TMR-based techniques to mitigate alpha-induced SEU accumulation in commercial SRAM-based FPGAs
      articolo
      

      A., Manuzzato; S., Gerardin; A., Paccagnella; Sterpone, Luca; Violante, Massimo
      IEEE TRANSACTIONS ON NUCLEAR SCIENCE
      Vol.55 (pp.1968-1973) ISSN:0018-9499 DOI:10.1109/TNS.2008.2000850

  33. A New Mitigation Approach For Soft Errors In Embedded Processors
      articolo
      

      Abate, Francesco; Sterpone, Luca; Violante, Massimo
      IEEE TRANSACTIONS ON NUCLEAR SCIENCE
      Vol.55 (pp.2063-2069) ISSN:0018-9499 DOI:10.1109/TNS.2008.2000839

  34. Software and Hardware Techniques for SEU Detection in IP Processors
      articolo
      

      C., Bolchini; A., Miele; Rebaudengo, Maurizio; F., Salice; Sterpone, Luca; Violante, Massimo
      JOURNAL OF ELECTRONIC TESTING
      Vol.24 (pp.35-44) ISSN:0923-8174 DOI:10.1007/s10836-007-5028-0

  35. An novel Methodology for Reducing SoC Test Data Volume on FPGA-based Testers
      proceeding
      

      Bernardi, Paolo; SONZA REORDA, Matteo
      In: Titolo volume non avvalorato
      DOI:10.1109/DATE.2008.4484685

  36. An Effective Technique for Minimizing the Cost of Processor Software-Based Diagnosis in SoCs
      capitolo
      

      Bernardi, Paolo; SANCHEZ SANCHEZ, EDGAR ERNESTO; M., Schillaci; Squillero, Giovanni; SONZA REORDA, Matteo
      Design, Automation, and Test in Europe - The Most Influential Papers of 10 Years DATE
      Springer
      pp.13 (pp.497-509) ISBN:9781402064876 DOI:10.1007/978-1-4020-6488-3_36

  37. A novel SBST generation technique for path-delay faults in microprocessors based on BDD analysis and evolutionary algorithm
      proceeding
      

      Christou, K; Michael, M. K.; Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
      In: 26th IEEE VLSI Test Symposium
      IEEE (STATI UNITI D'AMERICA)
      26th IEEE VLSI Test Symposium (San Diego, CA, USA) apr 27 - may 1
      (pp.389-394) ISBN:9780769531236 DOI:10.1109/VTS.2008.37

  2007

  1. Effectiveness of TMR-based techniques to mitigate alpha-induced SEU accumulation in commercial SRAM-based FPGAs
     proceeding
     

     Manuzzato, A.; Gerardin, S.; Paccagnella, A.; Sterpone, Luca; Violante, Massimo
     In: Titolo volume non avvalorato
     Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
     ISBN:9781424417049 DOI:10.1109/RADECS.2007.5205499

  2. A new mitigation approach for soft errors in embedded processors
     proceeding
     

     Abate, F.; Sterpone, Luca; Violante, Massimo
     In: Titolo volume non avvalorato
     Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
     ISBN:9781424417049 DOI:10.1109/RADECS.2007.5205504

  3. Analytical analysis of the MCUs sensitiveness of TMR architectures in SRAM-based FPGAs
     proceeding
     

     Sterpone, Luca; Violante, Massimo
     In: Titolo volume non avvalorato
     Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
     ISBN:9781424417049 DOI:10.1109/RADECS.2007.5205501

  4. Soft errors in SRAM-FPGAs: A comparison of two complementary approaches
     proceeding
     

     Alderighi, M.; Casini, F.; D'Angelo, S.; Mancini, M.; Pastore, S.; Sterpone, Luca; Violante, Massimo
     In: Titolo volume non avvalorato
     Radiation and Its Effects on Components and Systems, 2007. RADECS 2007. 9th European Conference on
     ISBN:9781424417049 DOI:10.1109/RADECS.2007.5205521

  5. A new hardware/software platform for the soft-error sensitivity evaluation of FPGA devices
     proceeding
     

     Violante, Massimo; SONZA REORDA, Matteo; Sterpone, Luca; Manuzzato, A.; Gerardin, S.; Rech, P.; Bagatin, M.; Paccagnella, A.; Andreani, C.; Gorini, G.; Pietropaolo, A.; Cardarilli, G.; Salsano, A.; Pontarelli, S.; Frost, C.
     In: Titolo volume non avvalorato
     8th IEEE Latin American Test Workshop (Cuzco, Peru)
     pp.6 (pp.1-6)

  6. Automotive Microcontroller End-of-Line Test via Software-Based Methodologies
     proceeding
     

     DI PALMA, W; Ravotto, Danilo; SANCHEZ SANCHEZ, EDGAR ERNESTO; Schillaci, M; SONZA REORDA, Matteo; Squillero, Giovanni
     In: Eighth International Workshop on Microprocessor Test and Verification, 2007. MTV '07.
     Eighth International Workshop on Microprocessor Test and Verification, 2007. MTV '07. (Austin, TX , USA) 5-6 Dec. 2007
     (pp.77-82) ISBN:9780769532417 DOI:10.1109/MTV.2007.15

  7. An Effective Approach for the Diagnosis of Transition-Delay Faults in SoCs, based on SBST and Scan Chains
     proceeding
     

     LAGOS BENITES, J; Appello, D; Bernardi, Paolo; Grosso, Michelangelo; Ravotto, Danilo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
     In: Titolo volume non avvalorato
     DFT2007, 22th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
     (pp.291-299) ISBN:9789780769529

  8. Co-evolution of Test Programs and Stimuli Vectors for Testing of Embedded Peripheral Cores
     proceeding
     

     VEIRAS BOLZANI, Leticia Maria; SANCHEZ SANCHEZ, EDGAR ERNESTO; Schillaci, Massimiliano; Squillero, Giovanni
     In: Titolo volume non avvalorato
     CEC 2007, IEEE Congress on Evolutionary Computation
     (pp.3474-3481)

  9. A Software-based Methodology for the Generation of Peripheral Test Sets Based on High-level Descriptions
     proceeding
     

     VEIRAS BOLZANI, Leticia Maria; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
     In: Proceedings of the 20th annual conference on Integrated circuits and systems design
     SBCCI2007: ACM 20th SYMPOSIUM ON INTEGRATED CIRCUITS AND SYSTEMS DESIGN
     (pp.348-353) ISBN:9781595938169

  10. Validating the Dependability of Embedded Systems through Fault Injection by Means of Loadable Kernel Modules
      proceeding
      

      Murciano, Marco; Violante, Massimo
      In: Proceedings of the 2007 IEEE International High Level Design Validation and Test Workshop
      IEEE Computer Society (STATI UNITI D'AMERICA)
      High Level Design Validation and Test Workshop (HLDVT) (Hyatt Regency Irvine, CA, USA) November 7-9, 2007
      Vol.1 (pp.179-186) ISBN:9781552667415